NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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2nd_order_correction_n: /NXpiezo_config_spm/calibration/2nd_order_correction_N-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/2nd_order_correction_N-field
@angular0_indices: /NXmpes_arpes/ENTRY/data@angular0_indices-attribute
@angular1_indices: /NXmpes_arpes/ENTRY/data@angular1_indices-attribute
@auxiliary_signals: /NXdata@auxiliary_signals-attribute
@axes: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@axes-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@axes-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@axes-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@axes-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@axes-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@axes-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@axes-attribute; /NXcxi_ptycho/DATA@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute; /NXdata/DATA@axes-attribute; /NXdata@axes-attribute; /NXdetector/efficiency@axes-attribute; /NXelectronanalyser/transmission_function@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@axes-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@axes-attribute; /NXem/ENTRY/roiID/ebsd/indexing/roi@axes-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@axes-attribute; /NXem/ENTRY/roiID/eds/indexing/summary@axes-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result@axes-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result@axes-attribute; /NXguide/reflectivity@axes-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@axes-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@axes-attribute; /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function@axes-attribute; /NXmpes_arpes/ENTRY/data@axes-attribute; /NXoptical_spectroscopy/ENTRY/DATA@axes-attribute; /NXprocess_mpes/transmission_correction/transmission_function@axes-attribute; /NXtransmission/ENTRY/data@axes-attribute
@axis: /NXdata/AXISNAME@axis-attribute; /NXdetector/time_of_flight@axis-attribute; /NXdetector/x_pixel_offset@axis-attribute; /NXdetector/y_pixel_offset@axis-attribute; /NXdetector/z_pixel_offset@axis-attribute
@axisname_indices: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@AXISNAME_indices-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@AXISNAME_indices-attribute; /NXdata@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@AXISNAME_indices-attribute; /NXem/ENTRY/roiID/ebsd/indexing/roi@AXISNAME_indices-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@AXISNAME_indices-attribute; /NXem/ENTRY/roiID/eds/indexing/summary@AXISNAME_indices-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result@AXISNAME_indices-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result@AXISNAME_indices-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute
@baseline_reference: /NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute; /NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class: /NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/DATA@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute; /NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute; /NXcanSAS/ENTRY@canSAS_class-attribute
@characteristics_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics@characteristics_type-attribute
@check_sum: /NXdetector/data@check_sum-attribute
@comment: /NXentry/revision@comment-attribute; /NXsubentry/revision@comment-attribute
@components: /NXsample_component_set@components-attribute
@configuration: /NXentry/program_name@configuration-attribute; /NXsubentry/program_name@configuration-attribute
@creator: /NXroot@creator-attribute
@creator_version: /NXroot@creator_version-attribute
@default: /NXactuator@default-attribute; /NXaperture@default-attribute; /NXattenuator@default-attribute; /NXbeam@default-attribute; /NXbeam_stop@default-attribute; /NXbending_magnet@default-attribute; /NXcalibration@default-attribute; /NXcanSAS/ENTRY@default-attribute; /NXcapillary@default-attribute; /NXcite@default-attribute; /NXcollectioncolumn@default-attribute; /NXcollimator@default-attribute; /NXcrystal@default-attribute; /NXcylindrical_geometry@default-attribute; /NXdetector@default-attribute; /NXdetector_group@default-attribute; /NXdetector_module@default-attribute; /NXdisk_chopper@default-attribute; /NXelectron_level@default-attribute; /NXelectronanalyser@default-attribute; /NXenergydispersion@default-attribute; /NXentry@default-attribute; /NXenvironment@default-attribute; /NXevent_data@default-attribute; /NXfermi_chopper@default-attribute; /NXfilter@default-attribute; /NXfit_background@default-attribute; /NXflipper@default-attribute; /NXfresnel_zone_plate@default-attribute; /NXgeometry@default-attribute; /NXgrating@default-attribute; /NXguide@default-attribute; /NXinsertion_device@default-attribute; /NXinstrument@default-attribute; /NXlog@default-attribute; /NXmanipulator@default-attribute; /NXmirror@default-attribute; /NXmoderator@default-attribute; /NXmonitor@default-attribute; /NXmonochromator@default-attribute; /NXnote@default-attribute; /NXoff_geometry@default-attribute; /NXorientation@default-attribute; /NXparameters@default-attribute; /NXpeak@default-attribute; /NXpid@default-attribute; /NXpinhole@default-attribute; /NXpolarizer@default-attribute; /NXpositioner_sts@default-attribute; /NXprocess@default-attribute; /NXprocess_mpes@default-attribute; /NXreflections@default-attribute; /NXresolution@default-attribute; /NXroot@default-attribute; /NXsample@default-attribute; /NXsample_component@default-attribute; /NXsensor@default-attribute; /NXsensor_scan/ENTRY@default-attribute; /NXsensor_sts@default-attribute; /NXshape@default-attribute; /NXslit@default-attribute; /NXsource@default-attribute; /NXsubentry@default-attribute; /NXtransformations@default-attribute; /NXtranslation@default-attribute; /NXuser@default-attribute; /NXvelocity_selector@default-attribute; /NXxraylens@default-attribute
@depends_on: /NXapm_hit_finding/hit_positions@depends_on-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions@depends_on-attribute; /NXapm_reconstruction/reconstructed_positions@depends_on-attribute; /NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute; /NXbeam_path/TRANSFORMATIONS/AXISNAME@depends_on-attribute; /NXcomponent@depends_on-attribute; /NXcrystal_structure/atom_position@depends_on-attribute; /NXdeflector@depends_on-attribute; /NXdetector_module/fast_pixel_direction@depends_on-attribute; /NXdetector_module/module_offset@depends_on-attribute; /NXdetector_module/slow_pixel_direction@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@depends_on-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@depends_on-attribute; /NXtransformations/AXISNAME@depends_on-attribute; /NXunit_cell/atom_positions@depends_on-attribute; /NXunit_cell/base_vector_a@depends_on-attribute; /NXunit_cell/base_vector_b@depends_on-attribute; /NXunit_cell/base_vector_c@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@depends_on-attribute
@description: /NXelectron_level@description-attribute; /NXelectrostatic_kicker/timing@description-attribute; /NXmagnetic_kicker/timing@description-attribute; /NXreflections/background_mean@description-attribute; /NXreflections/bounding_box@description-attribute; /NXreflections/d@description-attribute; /NXreflections/det_module@description-attribute; /NXreflections/entering@description-attribute; /NXreflections/flags@description-attribute; /NXreflections/h@description-attribute; /NXreflections/id@description-attribute; /NXreflections/int_prf@description-attribute; /NXreflections/int_prf_errors@description-attribute; /NXreflections/int_prf_var@description-attribute; /NXreflections/int_sum@description-attribute; /NXreflections/int_sum_errors@description-attribute; /NXreflections/int_sum_var@description-attribute; /NXreflections/k@description-attribute; /NXreflections/l@description-attribute; /NXreflections/lp@description-attribute; /NXreflections/observed_frame@description-attribute; /NXreflections/observed_frame_errors@description-attribute; /NXreflections/observed_frame_var@description-attribute; /NXreflections/observed_phi@description-attribute; /NXreflections/observed_phi_errors@description-attribute; /NXreflections/observed_phi_var@description-attribute; /NXreflections/observed_px_x@description-attribute; /NXreflections/observed_px_x_errors@description-attribute; /NXreflections/observed_px_x_var@description-attribute; /NXreflections/observed_px_y@description-attribute; /NXreflections/observed_px_y_errors@description-attribute; /NXreflections/observed_px_y_var@description-attribute; /NXreflections/observed_x@description-attribute; /NXreflections/observed_x_errors@description-attribute; /NXreflections/observed_x_var@description-attribute; /NXreflections/observed_y@description-attribute; /NXreflections/observed_y_errors@description-attribute; /NXreflections/observed_y_var@description-attribute; /NXreflections/overlaps@description-attribute; /NXreflections/partiality@description-attribute; /NXreflections/polar_angle@description-attribute; /NXreflections/predicted_frame@description-attribute; /NXreflections/predicted_phi@description-attribute; /NXreflections/predicted_px_x@description-attribute; /NXreflections/predicted_px_y@description-attribute; /NXreflections/predicted_x@description-attribute; /NXreflections/predicted_y@description-attribute; /NXreflections/prf_cc@description-attribute; /NXreflections/reflection_id@description-attribute; /NXreflections@description-attribute; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
@device: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE@device-attribute
@direction: /NXsample/electric_field@direction-attribute; /NXsample/magnetic_field@direction-attribute; /NXsample/stress_field@direction-attribute
@distribution: /NXdata/AXISNAME@distribution-attribute
@energy_indices: /NXmpes/ENTRY/data@energy_indices-attribute; /NXmpes_arpes/ENTRY/data@energy_indices-attribute; /NXxps/ENTRY/data@energy_indices-attribute
@entry: /NXarpes/ENTRY@entry-attribute; /NXiqproc/ENTRY@entry-attribute; /NXsastof/ENTRY@entry-attribute; /NXsqom/ENTRY@entry-attribute; /NXxas/ENTRY@entry-attribute; /NXxasproc/ENTRY@entry-attribute
@epoch_start: /NXem_ebsd/measurement/time@epoch_start-attribute
@equipment_component: /NXtransformations/AXISNAME@equipment_component-attribute
@file_name: /NXroot@file_name-attribute
@file_time: /NXroot@file_time-attribute
@file_update_time: /NXroot@file_update_time-attribute
@first_good: /NXdata/AXISNAME@first_good-attribute
@first_point_for_fit: /NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux: /NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency: /NXdetector/raw_time_of_flight@frequency-attribute
@frog_leap_scan: /NXscan_control/linear_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/mesh_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/snake_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/spiral_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/traj_SCAN/stepping_N@frog_leap_scan-attribute
@h5py_version: /NXroot@h5py_version-attribute
@hdf5_version: /NXroot@HDF5_Version-attribute
@hdf_version: /NXroot@HDF_version-attribute
@i_axes: /NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version: /NXentry@IDF_Version-attribute; /NXsubentry@IDF_Version-attribute
@index: /NXarchive/entry@index-attribute
@input: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX@input-attribute
@input_path: /NXcalibration/input_SYMBOL@input_path-attribute; /NXcalibration/original_axis@input_path-attribute
@interpretation: /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good: /NXdata/AXISNAME@last_good-attribute
@local_name: /NXdetector/crate@local_name-attribute; /NXdetector/input@local_name-attribute; /NXdetector/slot@local_name-attribute
@logged_against: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy@logged_against-attribute; /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction@logged_against-attribute; /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency@logged_against-attribute; /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage@logged_against-attribute; /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage@logged_against-attribute; /NXevent_data_apm/instrument/analysis_chamber/pressure@logged_against-attribute; /NXevent_data_apm/instrument/buffer_chamber/pressure@logged_against-attribute; /NXevent_data_apm/instrument/load_lock_chamber/pressure@logged_against-attribute; /NXevent_data_apm/instrument/stage_lab/temperature@logged_against-attribute; /NXpulser_apm/SOURCE/BEAM/incidence_vector@logged_against-attribute; /NXpulser_apm/SOURCE/BEAM/pinhole_position@logged_against-attribute; /NXpulser_apm/SOURCE/BEAM/spot_position@logged_against-attribute; /NXpulser_apm/SOURCE/pulse_energy@logged_against-attribute; /NXpulser_apm/pulse_fraction@logged_against-attribute; /NXpulser_apm/pulse_frequency@logged_against-attribute; /NXpulser_apm/pulse_number@logged_against-attribute; /NXpulser_apm/pulse_voltage@logged_against-attribute; /NXpulser_apm/standing_voltage@logged_against-attribute
@long_name: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i@long_name-attribute; /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j@long_name-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z@long_name-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier@long_name-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance@long_name-attribute; /NXdata/AXISNAME@long_name-attribute; /NXdata/DATA@long_name-attribute; /NXdetector/data@long_name-attribute; /NXdetector/time_of_flight@long_name-attribute; /NXdetector/x_pixel_offset@long_name-attribute; /NXdetector/y_pixel_offset@long_name-attribute; /NXdetector/z_pixel_offset@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/group_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/image_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/group_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/image_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/group_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/imag@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/image_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/real@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/spectrum_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/spectrum_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/spectrum_identifier@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/spectrum_identifier@long_name-attribute; /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_x@long_name-attribute; /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_y@long_name-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i@long_name-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j@long_name-attribute; /NXem/ENTRY/roiID/eds/indexing/summary/axis_energy@long_name-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_pattern_identifier@long_name-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_s@long_name-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result/intensity@long_name-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result/axis_pattern_identifier@long_name-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result/axis_s@long_name-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result/intensity@long_name-attribute; /NXem_correlation/indexing/roi/axis_x@long_name-attribute; /NXem_correlation/indexing/roi/axis_y@long_name-attribute; /NXem_correlation/indexing/roi/axis_z@long_name-attribute; /NXem_correlation/indexing/roi/data@long_name-attribute; /NXem_ebsd/indexing/roi/axis_x@long_name-attribute; /NXem_ebsd/indexing/roi/axis_y@long_name-attribute; /NXem_ebsd/indexing/roi/data@long_name-attribute; /NXem_eds/indexing/summary/axis_energy@long_name-attribute; /NXem_eds/indexing/summary/intensity@long_name-attribute; /NXimage_set/image_1d/axis_i@long_name-attribute; /NXimage_set/image_2d/axis_i@long_name-attribute; /NXimage_set/image_2d/axis_j@long_name-attribute; /NXimage_set/image_3d/axis_i@long_name-attribute; /NXimage_set/image_3d/axis_j@long_name-attribute; /NXimage_set/image_3d/axis_k@long_name-attribute; /NXimage_set/stack_1d/axis_i@long_name-attribute; /NXimage_set/stack_1d/group_identifier@long_name-attribute; /NXimage_set/stack_1d/image_identifier@long_name-attribute; /NXimage_set/stack_2d/axis_i@long_name-attribute; /NXimage_set/stack_2d/axis_j@long_name-attribute; /NXimage_set/stack_2d/group_identifier@long_name-attribute; /NXimage_set/stack_2d/image_identifier@long_name-attribute; /NXimage_set/stack_3d/axis_i@long_name-attribute; /NXimage_set/stack_3d/axis_j@long_name-attribute; /NXimage_set/stack_3d/axis_k@long_name-attribute; /NXimage_set/stack_3d/group_identifier@long_name-attribute; /NXimage_set/stack_3d/image_identifier@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/x@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/y@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/z@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/x@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/y@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/z@long_name-attribute; /NXspectrum_set/spectrum_0d/axis_energy@long_name-attribute; /NXspectrum_set/spectrum_0d/intensity@long_name-attribute; /NXspectrum_set/spectrum_1d/axis_energy@long_name-attribute; /NXspectrum_set/spectrum_1d/axis_i@long_name-attribute; /NXspectrum_set/spectrum_1d/intensity@long_name-attribute; /NXspectrum_set/spectrum_2d/axis_energy@long_name-attribute; /NXspectrum_set/spectrum_2d/axis_i@long_name-attribute; /NXspectrum_set/spectrum_2d/axis_j@long_name-attribute; /NXspectrum_set/spectrum_2d/intensity@long_name-attribute; /NXspectrum_set/spectrum_3d/axis_energy@long_name-attribute; /NXspectrum_set/spectrum_3d/axis_i@long_name-attribute; /NXspectrum_set/spectrum_3d/axis_j@long_name-attribute; /NXspectrum_set/spectrum_3d/axis_k@long_name-attribute; /NXspectrum_set/spectrum_3d/intensity@long_name-attribute; /NXspectrum_set/stack_0d/axis_energy@long_name-attribute; /NXspectrum_set/stack_0d/group_identifier@long_name-attribute; /NXspectrum_set/stack_0d/intensity@long_name-attribute; /NXspectrum_set/stack_0d/spectrum_identifier@long_name-attribute; /NXspectrum_set/stack_2d/axis_energy@long_name-attribute; /NXspectrum_set/stack_2d/axis_i@long_name-attribute; /NXspectrum_set/stack_2d/axis_j@long_name-attribute; /NXspectrum_set/stack_2d/group_identifier@long_name-attribute; /NXspectrum_set/stack_2d/intensity@long_name-attribute; /NXspectrum_set/stack_2d/spectrum_identifier@long_name-attribute; /NXspectrum_set/stack_3d/axis_energy@long_name-attribute; /NXspectrum_set/stack_3d/axis_i@long_name-attribute; /NXspectrum_set/stack_3d/axis_j@long_name-attribute; /NXspectrum_set/stack_3d/axis_k@long_name-attribute; /NXspectrum_set/stack_3d/group_identifier@long_name-attribute; /NXspectrum_set/stack_3d/intensity@long_name-attribute; /NXspectrum_set/stack_3d/spectrum_identifier@long_name-attribute
@mask: /NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices: /NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@metric: /NXfit/figure_of_meritMETRIC@metric-attribute; /NXxps/ENTRY/FIT/figure_of_meritMETRIC@metric-attribute
@mime_type: /NXsubentry/thumbnail@mime_type-attribute
@name: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute; /NXcanSAS/ENTRY/run@name-attribute
@nexus_repository: /NXroot@NeXus_repository-attribute
@nexus_version: /NXroot@NeXus_version-attribute
@nx_class: /NXroot@NX_class-attribute
@offset: /NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute; /NXdetector_module/fast_pixel_direction@offset-attribute; /NXdetector_module/module_offset@offset-attribute; /NXdetector_module/slow_pixel_direction@offset-attribute; /NXevent_data/event_time_zero@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute; /NXtomoproc/entry/data/data@offset-attribute; /NXtransformations/AXISNAME@offset-attribute
@offset_units: /NXdetector_module/fast_pixel_direction@offset_units-attribute; /NXdetector_module/module_offset@offset_units-attribute; /NXdetector_module/slow_pixel_direction@offset_units-attribute; /NXtransformations/AXISNAME@offset_units-attribute
@output: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX@output-attribute
@output_path: /NXcalibration/calibrated_AXIS@output_path-attribute
@partial: /NXroot@partial-attribute
@populated_elements: /NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
@porto_notation_vectors: /NXraman/ENTRY/INSTRUMENT/scattering_configuration@porto_notation_vectors-attribute
@primary: /NXdetector/time_of_flight@primary-attribute; /NXdetector/x_pixel_offset@primary-attribute; /NXdetector/y_pixel_offset@primary-attribute; /NXdetector/z_pixel_offset@primary-attribute
@program_url: /NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
@q_indices: /NXcanSAS/ENTRY/DATA@Q_indices-attribute
@reference: /NXdata/AXISNAME@reference-attribute; /NXdata/DATA@reference-attribute; /NXdata@reference-attribute; /NXdata_mpes/energy@reference-attribute; /NXmpes/ENTRY/data/energy@reference-attribute; /NXmpes_arpes/ENTRY/data/angular0@reference-attribute; /NXmpes_arpes/ENTRY/data/angular1@reference-attribute; /NXmpes_arpes/ENTRY/data/energy@reference-attribute; /NXxps/ENTRY/data/energy@reference-attribute
@reference_beam: /NXbeam/pulse_delay@reference_beam-attribute
@region_type: /NXregion@region_type-attribute
@resolutions: /NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
@resolutions_description: /NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
@scaling: /NXtomoproc/entry/data/data@scaling-attribute
@scaling_factor: /NXcanSAS/ENTRY/DATA/I@scaling_factor-attribute; /NXlog/cue_timestamp_zero@scaling_factor-attribute; /NXlog/time@scaling_factor-attribute
@short_name: /NXelectronanalyser/name@short_name-attribute; /NXinstrument/name@short_name-attribute; /NXmx/ENTRY/INSTRUMENT/name@short_name-attribute; /NXmx/ENTRY/SOURCE/name@short_name-attribute; /NXsource/name@short_name-attribute
@signal: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@signal-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@signal-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@signal-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@signal-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@signal-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@signal-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@signal-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@signal-attribute; /NXcanSAS/ENTRY/DATA@signal-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@signal-attribute; /NXcxi_ptycho/DATA@signal-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@signal-attribute; /NXdata/DATA@signal-attribute; /NXdata@signal-attribute; /NXdetector/efficiency@signal-attribute; /NXelectronanalyser/transmission_function@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@signal-attribute; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@signal-attribute; /NXem/ENTRY/roiID/ebsd/indexing/roi@signal-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@signal-attribute; /NXem/ENTRY/roiID/eds/indexing/summary@signal-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/result@signal-attribute; /NXem_calorimetry/ENTRY/background_subtraction/result@signal-attribute; /NXguide/reflectivity@signal-attribute; /NXlauetof/entry/instrument/detector/data@signal-attribute; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@signal-attribute; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@signal-attribute; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data@signal-attribute; /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function@signal-attribute; /NXmpes/ENTRY/data@signal-attribute; /NXmpes_arpes/ENTRY/data@signal-attribute; /NXoptical_spectroscopy/ENTRY/DATA@signal-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data@signal-attribute; /NXprocess_mpes/transmission_correction/transmission_function@signal-attribute; /NXsas/ENTRY/DATA@signal-attribute; /NXxbase/entry/instrument/detector/data@signal-attribute
@spiral_direction: /NXscan_control/spiral_SCAN/scan_speed_N@spiral_direction-attribute
@start: /NXdetector/start_time@start-attribute; /NXdetector/stop_time@start-attribute; /NXdisk_chopper/top_dead_center@start-attribute; /NXevent_data/cue_timestamp_zero@start-attribute; /NXlog/cue_timestamp_zero@start-attribute; /NXlog/time@start-attribute
@storage_mode: /NXxpcs/entry/data/G2_unnormalized@storage_mode-attribute; /NXxpcs/entry/data/delay_difference@storage_mode-attribute; /NXxpcs/entry/data/g2@storage_mode-attribute; /NXxpcs/entry/data/g2_derr@storage_mode-attribute; /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute; /NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
@surface_indices: /NXguide/reflectivity@surface_indices-attribute
@symbol: /NXcalibration/original_axis@symbol-attribute
@t_axes: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
@time: /NXattenuator/status@time-attribute; /NXsource/last_fill@time-attribute
@time_origin_location: /NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
@timestamp: /NXcanSAS/ENTRY/DATA@timestamp-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
@transform: /NXtomoproc/entry/data/data@transform-attribute
@transformation_type: /NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute; /NXdetector_module/fast_pixel_direction@transformation_type-attribute; /NXdetector_module/module_offset@transformation_type-attribute; /NXdetector_module/slow_pixel_direction@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@transformation_type-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@transformation_type-attribute; /NXtransformations/AXISNAME@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@transformation_type-attribute
@type: /NXdata_mpes/energy@type-attribute; /NXdata_mpes_detector/energy@type-attribute; /NXentry/thumbnail@type-attribute; /NXmpes/ENTRY/data/energy@type-attribute
@uncertainties: /NXcanSAS/ENTRY/DATA/I@uncertainties-attribute; /NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
@units: /NXbeam/final_polarization@units-attribute; /NXbeam/fluence@units-attribute; /NXbeam/incident_polarization@units-attribute; /NXbeam_path/ATTENUATOR/attenuation@units-attribute; /NXbeam_path/GRATING/spectrum@units-attribute; /NXbeam_path/MONOCHROMATOR/spectrum@units-attribute; /NXbeam_path/SOURCE/excitation_wavelength@units-attribute; /NXcanSAS/ENTRY/DATA/I@units-attribute; /NXcanSAS/ENTRY/DATA/Idev@units-attribute; /NXcanSAS/ENTRY/DATA/Q@units-attribute; /NXcanSAS/ENTRY/DATA/Qdev@units-attribute; /NXcanSAS/ENTRY/DATA/Qmean@units-attribute; /NXcanSAS/ENTRY/DATA/dQl@units-attribute; /NXcanSAS/ENTRY/DATA/dQw@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute; /NXellipsometry/ENTRY/data_collection/NAME_spectrum@units-attribute; /NXellipsometry/ENTRY/data_collection/measured_data@units-attribute; /NXellipsometry/ENTRY/data_collection/measured_data_errors@units-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i@units-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j@units-attribute; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity@units-attribute; /NXfiber/attenuation@units-attribute; /NXfiber/spectral_range@units-attribute; /NXfiber/transfer_rate@units-attribute; /NXparameters/term@units-attribute; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta@units-attribute
@url: /NXapm_compositionspace_results/ENTRY/programID/program@url-attribute; /NXdispersive_material/ENTRY/definition@url-attribute; /NXellipsometry/ENTRY/data_collection/data_software@URL-attribute; /NXellipsometry/ENTRY/definition@URL-attribute; /NXentry/definition@URL-attribute; /NXentry/definition_local@URL-attribute; /NXmicrostructure_gragles_config/ENTRY/program1/program_name@url-attribute; /NXmicrostructure_gragles_results/ENTRY/program1/program_name@url-attribute; /NXmicrostructure_imm_results/ENTRY/program1/program@url-attribute; /NXmicrostructure_kanapy_results/ENTRY/program1/program@url-attribute; /NXmicrostructure_kanapy_results/ENTRY/program2/program@url-attribute; /NXmicrostructure_score_config/ENTRY/program1/program_name@url-attribute; /NXmicrostructure_score_results/ENTRY/program1/program_name@url-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@URL-attribute; /NXoptical_spectroscopy/ENTRY/definition@URL-attribute; /NXprogram/program@url-attribute; /NXraman/ENTRY/definition@URL-attribute; /NXsubentry/definition@URL-attribute; /NXsubentry/definition_local@URL-attribute; /NXtransmission/ENTRY/acquisition_program@url-attribute; /NXtransmission/ENTRY/definition@url-attribute
@use_these: /NXmicrostructure/interface/crystal_identifier@use_these-attribute; /NXmicrostructure/interface/phase_identifier@use_these-attribute; /NXmicrostructure/interface/triple_junction_identifier@use_these-attribute; /NXmicrostructure/quadruple_junction/crystal_identifier@use_these-attribute; /NXmicrostructure/quadruple_junction/interface_identifier@use_these-attribute; /NXmicrostructure/quadruple_junction/location@use_these-attribute; /NXmicrostructure/quadruple_junction/phase_identifier@use_these-attribute; /NXmicrostructure/quadruple_junction/triple_junction_identifier@use_these-attribute; /NXmicrostructure/triple_junction/interface_identifier@use_these-attribute; /NXmicrostructure/triple_junction/location@use_these-attribute; /NXmicrostructure/triple_junction/polyline_identifier@use_these-attribute; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/crystal_identifier@use_these-attribute
@varied_variable: /NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
@vector: /NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute; /NXcxi_ptycho/sample_1/transformations@vector-attribute; /NXdetector_module/fast_pixel_direction@vector-attribute; /NXdetector_module/module_offset@vector-attribute; /NXdetector_module/slow_pixel_direction@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@vector-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@vector-attribute; /NXtransformations/AXISNAME@vector-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@vector-attribute
@version: /NXapm/ENTRY/atom_probe/hit_finding/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/raw_data/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/programID/program@version-attribute; /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program@version-attribute; /NXapm/ENTRY/definition@version-attribute; /NXapm/ENTRY/profiling/programID/program@version-attribute; /NXapm_compositionspace_config/ENTRY/definition@version-attribute; /NXapm_compositionspace_results/ENTRY/definition@version-attribute; /NXapm_compositionspace_results/ENTRY/programID/program@version-attribute; /NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_clusterer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_clusterer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_distancer_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_distancer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_distancer_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_distancer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_intersector_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_intersector_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_intersector_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_intersector_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_nanochem_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_ranger_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_ranger_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_ranger_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_ranger_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_selector_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_selector_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_selector_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_selector_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_spatstat_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_spatstat_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_surfacer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_surfacer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_tessellator_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_tessellator_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_transcoder_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program@version-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/definition@version-attribute; /NXarchive/entry/program@version-attribute; /NXcalibration/calibration_software@version-attribute; /NXcanSAS/ENTRY@version-attribute; /NXcs_computer/operating_system@version-attribute; /NXdispersive_material/ENTRY/definition@version-attribute; /NXellipsometry/ENTRY/definition@version-attribute; /NXem/ENTRY/definition@version-attribute; /NXem/ENTRY/measurement/em_lab/control_programID/program@version-attribute; /NXem/ENTRY/profiling/programID/program@version-attribute; /NXem_calorimetry/ENTRY/azimuthal_integration/programID/program@version-attribute; /NXem_calorimetry/ENTRY/background_subtraction/programID/program@version-attribute; /NXem_calorimetry/ENTRY/definition@version-attribute; /NXem_calorimetry/ENTRY/distortion_correction/programID/program@version-attribute; /NXentry/definition@version-attribute; /NXentry/definition_local@version-attribute; /NXentry/entry_identifier_uuid@version-attribute; /NXentry/program_name@version-attribute; /NXfabrication/model@version-attribute; /NXlab_electro_chemo_mechanical_preparation/ENTRY@version-attribute; /NXlab_sample_mounting/ENTRY@version-attribute; /NXmicrostructure_gragles_config/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_gragles_config/ENTRY/program1/program_name@version-attribute; /NXmicrostructure_gragles_results/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_gragles_results/ENTRY/program1/program_name@version-attribute; /NXmicrostructure_imm_results/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_imm_results/ENTRY/program1/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/program1/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/program2/program@version-attribute; /NXmicrostructure_score_config/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_score_config/ENTRY/program1/program_name@version-attribute; /NXmicrostructure_score_results/ENTRY/environment/programID/program@version-attribute; /NXmicrostructure_score_results/ENTRY/program1/program_name@version-attribute; /NXmpes/ENTRY/definition@version-attribute; /NXmpes_arpes/ENTRY/definition@version-attribute; /NXmx/ENTRY@version-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@version-attribute; /NXoptical_spectroscopy/ENTRY/definition@version-attribute; /NXprogram/program@version-attribute; /NXraman/ENTRY/definition@version-attribute; /NXsensor_scan/ENTRY/PROCESS/program@version-attribute; /NXsensor_scan/ENTRY/definition@version-attribute; /NXspe/ENTRY/definition@version-attribute; /NXspm/ENTRY/experiment_instrument/hardware/model@version-attribute; /NXspm/ENTRY/experiment_instrument/software/model@version-attribute; /NXsubentry/definition@version-attribute; /NXsubentry/definition_local@version-attribute; /NXsubentry/program_name@version-attribute; /NXtransmission/ENTRY/definition@version-attribute
@wavelength_indices: /NXdetector/efficiency@wavelength_indices-attribute; /NXguide/reflectivity@wavelength_indices-attribute
@xml_version: /NXroot@XML_version-attribute
@xpos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@xpos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@xpos_indices-attribute
@ypos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@ypos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@ypos_indices-attribute
@zpos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@zpos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@zpos_indices-attribute
a: /NXcsg/a-group
a_1: /NXcorrector_cs/tableauID/a_1-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1-group
a_2: /NXcorrector_cs/tableauID/a_2-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2-group
a_3: /NXcorrector_cs/tableauID/a_3-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3-group
a_4: /NXcorrector_cs/tableauID/a_4-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4-group
a_6: /NXcorrector_cs/tableauID/a_6-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6-group
a_axis_direction: /NXmicrostructure_mtex_config/conventions/a_axis_direction-field
a_b_c: /NXcrystal_structure/a_b_c-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/a_b_c-field; /NXunit_cell/a_b_c-field
abbe_number: /NXlens_opt/Abbe_number-field
abrasive_medium: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
abrasive_medium_carrier: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
absolute_path: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/absolute_path-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/absolute_path-field; /NXimage_set/PROCESS/source/absolute_path-field; /NXspectrum_set/PROCESS/source/absolute_path-field
absorbed_beam: /NXxas/ENTRY/DATA/absorbed_beam-link; /NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material: /NXcollimator/absorbing_material-field; /NXfermi_chopper/absorbing_material-field
absorption_cross_section: /NXattenuator/absorption_cross_section-field
ac_line_sync: /NXscanbox_em/ac_line_sync-field
acceleration_time: /NXpositioner/acceleration_time-field; /NXpositioner_sts/acceleration_time-field
acceptance_angle: /NXfiber/acceptance_angle-field; /NXpolarizer_opt/acceptance_angle-field
accepted_photon_beam_divergence: /NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture: /NXcapillary/accepting_aperture-field
accuracy_n: /NXscan_control/accuracy_N-field
acoustic_impedance: /NXpiezoelectric_material/acoustic_impedance-field
acquisition_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field; /NXdetector/acquisition_mode-field
acquisition_program: /NXtransmission/ENTRY/acquisition_program-group
acquisition_time: /NXbias_spectroscopy/CIRCUIT/acquisition_time-field; /NXcircuit/acquisition_time-field
active_calib: /NXpositioner_sts/active_calib-field
active_channels: /NXamplifier/active_channels-field
active_frequency: /NXcantilever_spm/cantilever_oscillator/active_frequency-field
activity: /NXhistory/ACTIVITY-group
actuator: /NXebeam_column/ACTUATOR-group; /NXem/ENTRY/measurement/em_lab/ACTUATOR-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ACTUATOR-group; /NXem_calorimetry/ENTRY/actuator-group; /NXenvironment/ACTUATOR-group; /NXibeam_column/ACTUATOR-group; /NXinstrument/ACTUATOR-group; /NXmanipulator/ACTUATOR-group; /NXpositioner/actuator-group
actuatorid: /NXem/ENTRY/measurement/em_lab/ebeam_column/actuatorID-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/actuatorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/actuatorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/actuatorID-group
additional_detector_hardware: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/additional_detector_hardware-field
additional_phase_information: /NXdispersive_material/ENTRY/sample/additional_phase_information-field
address: /NXem/ENTRY/userID/address-field; /NXsensor_scan/ENTRY/USER/address-field; /NXtransmission/ENTRY/operator/address-field; /NXuser/address-field
aequatorial_angle: /NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field; /NXsas/ENTRY/SAMPLE/aequatorial_angle-field; /NXsastof/ENTRY/instrument/detector/aequatorial_angle-field; /NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation: /NXem/ENTRY/userID/affiliation-field; /NXmpes/ENTRY/USER/affiliation-field; /NXsensor_scan/ENTRY/USER/affiliation-field; /NXtransmission/ENTRY/operator/affiliation-field; /NXuser/affiliation-field
algorithm: /NXapm/ENTRY/atom_probe/hit_finding/serialized/algorithm-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/algorithm-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/algorithm-field; /NXapm/ENTRY/atom_probe/ranging/definitions/algorithm-field; /NXapm/ENTRY/atom_probe/raw_data/serialized/algorithm-field; /NXapm/ENTRY/atom_probe/reconstruction/config/algorithm-field; /NXapm/ENTRY/atom_probe/reconstruction/results/algorithm-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/algorithm-field; /NXapm/ENTRY/serializedID/algorithm-field; /NXapm_compositionspace_config/ENTRY/config/ranging/algorithm-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/algorithm-field; /NXapm_compositionspace_results/ENTRY/config/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/algorithm-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/algorithm-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/algorithm-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/algorithm-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/algorithm-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/algorithm-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/algorithm-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/algorithm-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/algorithm-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/algorithm-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/algorithm-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/algorithm-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/algorithm-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/algorithm-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/algorithm-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/algorithm-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/algorithm-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/algorithm-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/algorithm-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/algorithm-field; /NXem/ENTRY/roiID/ebsd/indexing/source/algorithm-field; /NXem/ENTRY/roiID/ebsd/measurement/source/algorithm-field; /NXem/ENTRY/roiID/ebsd/simulation/source/algorithm-field; /NXem/ENTRY/serializedID/algorithm-field; /NXem_calorimetry/ENTRY/actuator/algorithm-field; /NXem_calorimetry/ENTRY/diffraction/algorithm-field; /NXmicrostructure/configuration/algorithm-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/algorithm-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/algorithm-field; /NXserialized/algorithm-field
alias: /NXaberration/alias-field; /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/alias-field; /NXapm/ENTRY/sample/alias-field; /NXapm/ENTRY/specimen/alias-field; /NXcoordinate_system/alias-field; /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/alias-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/alias-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/alias-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/alias-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/alias-field; /NXstage_lab/alias-field
alpha: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/alpha-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/alpha-field; /NXcg_alpha_complex/alpha-field; /NXxkappa/entry/sample/alpha-field
alpha_beta_gamma: /NXcrystal_structure/alpha_beta_gamma-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/alpha_beta_gamma-field; /NXunit_cell/alpha_beta_gamma-field
alpha_complexid: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID-group
alpha_value_choice: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_value_choice-field
alpha_values: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_values-field
amperemeter: /NXmpes/ENTRY/SAMPLE/drain_current_env/amperemeter-group
amplifier: /NXlockin/AMPLIFIER-group; /NXsensor_sts/amplifier-group; /NXspm/ENTRY/experiment_instrument/current_sensor/AMPLIFIER-group; /NXspm/ENTRY/experiment_instrument/voltage_sensor/AMPLIFIER-group; /NXstm/ENTRY/experiment_instrument/current_sensor/AMPLIFIER-group
amplifier_bias: /NXdetector/amplifier_bias-field
amplifier_type: /NXdetector/amplifier_type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
amplifier_voltage: /NXdetector/amplifier_voltage-field
amplitude_excitation: /NXafm/ENTRY/experiment_instrument/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop/amplitude_excitation-field
analyser: /NXarpes/ENTRY/INSTRUMENT/analyser-group; /NXindirecttof/entry/INSTRUMENT/analyser-group; /NXtas/entry/INSTRUMENT/analyser-group
analyser_take_off_azimuth_angle: /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle-field
analyser_take_off_polar_angle: /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle-field
analysis_chamber: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/analysis_chamber-group; /NXapm/ENTRY/measurement/instrument/analysis_chamber-group; /NXapm_msr/instrument/analysis_chamber-group; /NXevent_data_apm/instrument/analysis_chamber-group
analysis_identifier: /NXapm_compositionspace_config/ENTRY/config/analysis_identifier-field; /NXapm_compositionspace_results/ENTRY/analysis_identifier-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/analysis_identifier-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/analysis_identifier-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/analysis_identifier-field; /NXapm_paraprobe_intersector_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/analysis_identifier-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/analysis_identifier-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/analysis_identifier-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_ranger_config/ENTRY/range/analysis_identifier-field; /NXapm_paraprobe_ranger_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_selector_config/ENTRY/select/analysis_identifier-field; /NXapm_paraprobe_selector_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/analysis_identifier-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/analysis_identifier-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/analysis_identifier-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/analysis_identifier-field; /NXapm_paraprobe_tool_common/analysis_identifier-field; /NXapm_paraprobe_tool_config/analysis_identifier-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/analysis_identifier-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/analysis_identifier-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/analysis_identifier-field
analysis_program: /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program-group
analyze_coprecipitation: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_coprecipitation-field
analyze_intersection: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_intersection-field
analyze_proximity: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_proximity-field
analyzer_dispersion: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion-field
analyzer_elevation: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation-field
analyzer_rotation: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation-field
angle: /NXaberration/angle-field
angle_of_detection: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_detection-field
angle_of_in_plane_sample_rotation: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_in_plane_sample_rotation-field
angle_of_incidence: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incidence-field
angle_of_incident_and_detection_beam: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incident_and_detection_beam-field
angle_reference_frame: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_reference_frame-field
angles: /NXarpes/ENTRY/INSTRUMENT/analyser/angles-field; /NXgrating/angles-field
angular0: /NXmpes_arpes/ENTRY/data/angular0-field
angular1: /NXmpes_arpes/ENTRY/data/angular1-field
angular_acceptance: /NXcollectioncolumn/angular_acceptance-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/angular_acceptance-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/angular_acceptance-field
angular_calibration: /NXdetector/angular_calibration-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied: /NXdetector/angular_calibration_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion: /NXbeam_path/GRATING/angular_dispersion-field; /NXbeam_path/MONOCHROMATOR/GRATING/angular_dispersion-field; /NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
angular_resolution: /NXelectronanalyser/angular_resolution-group
angular_spread: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/angular_spread-field
angularn: /NXdata_mpes/angularN-field; /NXdata_mpes_detector/angularN-field
angularn_calibration: /NXmpes/ENTRY/PROCESS_MPES/angularN_calibration-group; /NXprocess_mpes/angularN_calibration-group
angularn_resolution: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution-group; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution-group
animation_time: /NXbias_spectroscopy/CIRCUIT/animation_time-field
anode_material: /NXsource/anode_material-field
aoi_range: /NXbeam_splitter/AOI_range-field
aperture: /NXbeam_path/ATTENUATOR/APERTURE-group; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group; /NXcollectioncolumn/APERTURE-group; /NXcorrector_cs/APERTURE-group; /NXebeam_column/APERTURE-group; /NXenergydispersion/APERTURE-group; /NXibeam_column/APERTURE-group; /NXinstrument/APERTURE-group; /NXsnsevent/ENTRY/instrument/APERTURE-group; /NXsnshisto/ENTRY/instrument/APERTURE-group; /NXsource/APERTURE-group; /NXxraylens/aperture-field
aperture_number: /NXbeam_path/aperture_NUMBER-group
apertureid: /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID-group
applied: /NXcalibration/applied-field; /NXcomponent/applied-field; /NXcorrector_cs/applied-field; /NXdistortion/applied-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/applied-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/applied-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/applied-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID/applied-field; /NXregistration/applied-field
apply: /NXmicrostructure_score_config/ENTRY/solitary_unit/apply-field
area: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/area-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/area-field; /NXcg_hexahedron_set/area-field; /NXcg_primitive_set/area-field; /NXcrystal_structure/area-field; /NXmicrostructure/crystal/area-field; /NXmicrostructure/interface/area-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/area-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/area-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/area-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/area-field; /NXxps/ENTRY/FIT/peakPEAK/function/area-group
arpes_geometry: /NXmpes_arpes/ENTRY/geometries/arpes_geometry-group
arrival_time_pairs: /NXapm/ENTRY/atom_probe/hit_finding/arrival_time_pairs-field; /NXapm_hit_finding/arrival_time_pairs-field
arrow_char: /NXmicrostructure_mtex_config/plotting/arrow_char-field
aspect: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/aspect-field
associated_beam: /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/associated_beam-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/associated_beam-field
associated_source: /NXmpes/ENTRY/INSTRUMENT/beamTYPE/associated_source-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/associated_source-field
atom: /NXunit_cell/atom-field
atom_identifier: /NXcrystal_structure/atom_identifier-field; /NXunit_cell/atom_identifier-field
atom_occupancy: /NXcrystal_structure/atom_occupancy-field; /NXunit_cell/atom_occupancy-field
atom_position: /NXcrystal_structure/atom_position-field
atom_positions: /NXunit_cell/atom_positions-field
atom_probe: /NXapm/ENTRY/atom_probe-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe-group
atom_type: /NXcrystal_structure/atom_type-field
atom_types: /NXapm/ENTRY/specimen/atom_types-field; /NXdispersive_material/ENTRY/sample/atom_types-field; /NXem/ENTRY/roiID/eds/indexing/atom_types-field; /NXem/ENTRY/sample/atom_types-field; /NXem_eds/indexing/atom_types-field; /NXiv_temp/ENTRY/SAMPLE/atom_types-field; /NXmpes/ENTRY/SAMPLE/atom_types-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/atom_types-field
attached_to: /NXactuator/attached_to-field; /NXsensor/attached_to-field; /NXsensor_sts/attached_to-field
attenuation: /NXbeam_path/ATTENUATOR/attenuation-field; /NXfiber/attenuation-field
attenuator: /NXbeam_path/ATTENUATOR-group; /NXinstrument/ATTENUATOR-group; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group; /NXsnsevent/ENTRY/instrument/ATTENUATOR-group; /NXsnshisto/ENTRY/instrument/ATTENUATOR-group; /NXxrot/entry/instrument/attenuator-group
attenuator_transmission: /NXattenuator/attenuator_transmission-field; /NXbeam_path/ATTENUATOR/attenuator_transmission-field; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field; /NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field; /NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field; /NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author: /NXnote/author-field; /NXsnsevent/ENTRY/SNSHistoTool/author-field; /NXsnshisto/ENTRY/SNSHistoTool/author-field
autophase: /NXapm_compositionspace_config/ENTRY/config/autophase-group; /NXapm_compositionspace_results/ENTRY/autophase-group
average_power: /NXbeam/average_power-field
average_value: /NXlog/average_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error: /NXlog/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors: /NXlog/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axis_aic: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_aic-field
axis_angle_convention: /NXcoordinate_system_set/axis_angle_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/axis_angle_convention-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/axis_angle_convention-field
axis_bic: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_bic-field
axis_dimension: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_dimension-field
axis_energy: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_energy-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_energy-field; /NXem/ENTRY/roiID/eds/indexing/summary/axis_energy-field; /NXem_eds/indexing/summary/axis_energy-field; /NXspectrum_set/spectrum_0d/axis_energy-field; /NXspectrum_set/spectrum_1d/axis_energy-field; /NXspectrum_set/spectrum_2d/axis_energy-field; /NXspectrum_set/spectrum_3d/axis_energy-field; /NXspectrum_set/stack_0d/axis_energy-field; /NXspectrum_set/stack_2d/axis_energy-field; /NXspectrum_set/stack_3d/axis_energy-field
axis_explained_variance: /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_explained_variance-field
axis_feature_identifier: /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier-field
axis_feature_importance: /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance-field
axis_i: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_i-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_i-field; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i-field; /NXimage_set/image_1d/axis_i-field; /NXimage_set/image_2d/axis_i-field; /NXimage_set/image_3d/axis_i-field; /NXimage_set/stack_1d/axis_i-field; /NXimage_set/stack_2d/axis_i-field; /NXimage_set/stack_3d/axis_i-field; /NXspectrum_set/spectrum_1d/axis_i-field; /NXspectrum_set/spectrum_2d/axis_i-field; /NXspectrum_set/spectrum_3d/axis_i-field; /NXspectrum_set/stack_2d/axis_i-field; /NXspectrum_set/stack_3d/axis_i-field
axis_j: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_j-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_j-field; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j-field; /NXimage_set/image_2d/axis_j-field; /NXimage_set/image_3d/axis_j-field; /NXimage_set/stack_2d/axis_j-field; /NXimage_set/stack_3d/axis_j-field; /NXspectrum_set/spectrum_2d/axis_j-field; /NXspectrum_set/spectrum_3d/axis_j-field; /NXspectrum_set/stack_2d/axis_j-field; /NXspectrum_set/stack_3d/axis_j-field
axis_k: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_k-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_k-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_k-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_k-field; /NXimage_set/image_3d/axis_k-field; /NXimage_set/stack_3d/axis_k-field; /NXspectrum_set/spectrum_3d/axis_k-field; /NXspectrum_set/stack_3d/axis_k-field
axis_mass_to_charge: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge-field
axis_pattern_identifier: /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_pattern_identifier-field; /NXem_calorimetry/ENTRY/background_subtraction/result/axis_pattern_identifier-field
axis_pca_dimension: /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_pca_dimension-field
axis_s: /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_s-field; /NXem_calorimetry/ENTRY/background_subtraction/result/axis_s-field
axis_time: /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_time-field; /NXem_calorimetry/ENTRY/background_subtraction/result/axis_time-field
axis_x: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x-field; /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_x-field; /NXem_correlation/indexing/roi/axis_x-field; /NXem_ebsd/indexing/roi/axis_x-field; /NXmicrostructure_ipf/legend/axis_x-field; /NXmicrostructure_ipf/map/axis_x-field; /NXmicrostructure_pf/pf/axis_x-field
axis_y: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y-field; /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_y-field; /NXem_correlation/indexing/roi/axis_y-field; /NXem_ebsd/indexing/roi/axis_y-field; /NXmicrostructure_ipf/legend/axis_y-field; /NXmicrostructure_ipf/map/axis_y-field; /NXmicrostructure_pf/pf/axis_y-field
axis_z: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z-field; /NXem_correlation/indexing/roi/axis_z-field; /NXmicrostructure_ipf/map/axis_z-field
axisname: /NXbeam_path/TRANSFORMATIONS/AXISNAME-field; /NXdata/AXISNAME-field; /NXtransformations/AXISNAME-field
axisname_end: /NXtransformations/AXISNAME_end-field
axisname_increment_set: /NXtransformations/AXISNAME_increment_set-field
azimuth: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth-field
azimuthal: /NXspe/ENTRY/data/azimuthal-field
azimuthal_angle: /NXcrystal/azimuthal_angle-field; /NXdetector/azimuthal_angle-field; /NXlauetof/entry/instrument/detector/azimuthal_angle-field; /NXreflections/azimuthal_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field; /NXsastof/ENTRY/instrument/detector/azimuthal_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field; /NXtofraw/entry/instrument/detector/azimuthal_angle-field; /NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_integration: /NXem_calorimetry/ENTRY/azimuthal_integration-group
azimuthal_width: /NXspe/ENTRY/data/azimuthal_width-field
b: /NXcsg/b-group
b_2: /NXcorrector_cs/tableauID/b_2-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_2-group
b_4: /NXcorrector_cs/tableauID/b_4-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_4-group
b_axis_direction: /NXmicrostructure_mtex_config/conventions/b_axis_direction-field
background: /NXapm/ENTRY/atom_probe/ranging/background_quantification/background-field; /NXem_calorimetry/ENTRY/background_subtraction/background-group
background_correction: /NXem_ebsd/indexing/background_correction-group
background_mean: /NXreflections/background_mean-field
background_quantification: /NXapm/ENTRY/atom_probe/ranging/background_quantification-group; /NXapm_ranging/background_quantification-group
background_subtraction: /NXem_calorimetry/ENTRY/background_subtraction-group
backgroundbackground: /NXfit/backgroundBACKGROUND-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND-group
backside_roughness: /NXellipsometry/ENTRY/SAMPLE/backside_roughness-field
backward_speed: /NXscan_control/linear_SCAN/backward_speed-field; /NXscan_control/snake_SCAN/backward_speed-field; /NXscan_control/traj_SCAN/backward_speed-field
backward_speed_bias: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep/backward_speed_bias-field
backward_speed_n: /NXscan_control/mesh_SCAN/backward_speed_N-field; /NXscan_control/spiral_SCAN/backward_speed_N-field
backward_sweep: /NXbias_sweep/linear_sweep/backward_sweep-field; /NXiv_bias/backward_sweep-field
bandwidth: /NXamplifier/bandwidth-field; /NXbeam_path/SOURCE/bandwidth-field; /NXcircuit/bandwidth-field; /NXinsertion_device/bandwidth-field
base_temperature: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/stage_lab/base_temperature-field; /NXevent_data_apm/instrument/stage_lab/base_temperature-field
base_vector_a: /NXunit_cell/base_vector_a-field
base_vector_b: /NXunit_cell/base_vector_b-field
base_vector_c: /NXunit_cell/base_vector_c-field
beam: /NXcontainer/beam-group; /NXebeam_column/BEAM-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/BEAM-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/BEAM-group; /NXibeam_column/BEAM-group; /NXinstrument/BEAM-group; /NXmx/ENTRY/INSTRUMENT/BEAM-group; /NXpulser_apm/SOURCE/BEAM-group; /NXsample/BEAM-group; /NXxrd/ENTRY/INSTRUMENT/BEAM-group
beam_1: /NXcxi_ptycho/entry_1/instrument_1/beam_1-group
beam_attenuation_factors: /NXxrd_pan/ENTRY/experiment_config/beam_attenuation_factors-field
beam_azimuth_angle: /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle-field
beam_center_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field; /NXdetector/beam_center_x-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsastof/ENTRY/instrument/detector/beam_center_x-field; /NXxpcs/entry/instrument/DETECTOR/beam_center_x-field; /NXxrot/entry/instrument/detector/beam_center_x-field
beam_center_y: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field; /NXdetector/beam_center_y-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsastof/ENTRY/instrument/detector/beam_center_y-field; /NXxpcs/entry/instrument/DETECTOR/beam_center_y-field; /NXxrot/entry/instrument/detector/beam_center_y-field
beam_device: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE-group
beam_incident: /NXraman/ENTRY/INSTRUMENT/beam_incident-group
beam_polar_angle_of_incidence: /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence-field
beam_polarization_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/beam_polarization_type-field
beam_position: /NXdisk_chopper/beam_position-field
beam_profile: /NXbeam_path/SOURCE/beam_profile-field
beam_ref_frame: /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame-group
beam_sample_relation: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/beam_sample_relation-field
beam_shape: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_splitter: /NXbeam_path/BEAM_SPLITTER-group
beam_stop: /NXinstrument/BEAM_STOP-group
beam_transfer_matrix_table: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_TRANSFER_MATRIX_TABLE-group
beam_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE-group
beamline: /NXsnsevent/ENTRY/instrument/beamline-field; /NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance: /NXelectrostatic_kicker/beamline_distance-field; /NXmagnetic_kicker/beamline_distance-field; /NXquadrupole_magnet/beamline_distance-field; /NXseparator/beamline_distance-field; /NXsolenoid_magnet/beamline_distance-field; /NXspin_rotator/beamline_distance-field
beamtype: /NXmpes/ENTRY/INSTRUMENT/beamTYPE-group; /NXxps/ENTRY/INSTRUMENT/beamTYPE-group
bend_angle_x: /NXguide/bend_angle_x-field; /NXmirror/bend_angle_x-field
bend_angle_y: /NXguide/bend_angle_y-field; /NXmirror/bend_angle_y-field
bending_magnet: /NXinstrument/BENDING_MAGNET-group
bending_radius: /NXbending_magnet/bending_radius-field
bias: /NXiv_bias/bias-field
bias_calibration: /NXspm/ENTRY/experiment_instrument/sample_bias_votage/bias_calibration-group
bias_divider: /NXlockin/bias_divider-field
bias_env: /NXmpes/ENTRY/SAMPLE/bias_env-group
bias_offset: /NXspm/ENTRY/experiment_instrument/sample_bias_votage/bias_offset-field
bias_spectroscopy: /NXiv_bias/BIAS_SPECTROSCOPY-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group; /NXstm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group
bias_spectroscopy_environment: /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment-group; /NXstm/ENTRY/experiment_instrument/bias_spectroscopy_environment-group
bias_sweep: /NXbias_spectroscopy/BIAS_SWEEP-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep-group; /NXstm/ENTRY/reproducibility_indicators/bias_sweep-group; /NXstm/ENTRY/resolution_indicators/bias_sweep-group
bias_voltage: /NXspm/ENTRY/experiment_instrument/sample_bias_votage/bias_voltage-field; /NXstage_lab/bias_voltage-field
bibtex: /NXcite/bibtex-field
binding_energy: /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/binding_energy-field; /NXprocess_mpes/energy_referencing/binding_energy-field
binning: /NXem_ebsd/indexing/binning-group
biprism: /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/biprism-group
bit_depth_readout: /NXdetector/bit_depth_readout-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
bitdepth: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/bitdepth-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/bitdepth-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/bitdepth-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/bitdepth-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/bitdepth-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/bitdepth-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/bitdepth-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/bitdepth-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/bitdepth-field; /NXapm_paraprobe_tool_results/window/bitdepth-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/bitdepth-field; /NXcs_filter_boolean_mask/bitdepth-field
bitmask: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask-group
blade_geometry: /NXaperture/BLADE_GEOMETRY-group
blade_spacing: /NXcollimator/blade_spacing-field
blade_thickness: /NXcollimator/blade_thickness-field
blaze_wavelength: /NXbeam_path/GRATING/blaze_wavelength-field; /NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
block: /NXregion/block-field
boundaries: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/boundaries-field; /NXcg_grid/boundaries-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundaries-field
boundary: /NXmicrostructure_score_results/ENTRY/discretization/boundary-group
boundary_conditions: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/boundary_conditions-field; /NXcg_grid/boundary_conditions-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundary_conditions-field
boundary_contact: /NXmicrostructure/crystal/boundary_contact-field; /NXmicrostructure/interface/boundary_contact-field; /NXmicrostructure/quadruple_junction/boundary_contact-field; /NXmicrostructure/triple_junction/boundary_contact-field
bounding_box: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box-group; /NXcg_grid/bounding_box-group; /NXreflections/bounding_box-field
bragg_angle: /NXcrystal/bragg_angle-field
bright_field: /NXtomophase/entry/instrument/bright_field-group
brightness: /NXibeam_column/ion_source/brightness-field
buffer_chamber: /NXapm_msr/instrument/buffer_chamber-group; /NXevent_data_apm/instrument/buffer_chamber-group
bunch_distance: /NXsource/bunch_distance-field
bunch_length: /NXsource/bunch_length-field
bunch_pattern: /NXsource/bunch_pattern-group
bunge_euler: /NXmicrostructure_imm_config/ENTRY/component_analysis/bunge_euler-field; /NXmicrostructure_imm_config/ENTRY/orientation_distribution/bunge_euler-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/bunge_euler-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/bunge_euler-field; /NXmicrostructure_score_config/ENTRY/deformation/bunge_euler-field; /NXmicrostructure_score_config/ENTRY/nucleation/bunge_euler-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/bunge_euler-field
c_1: /NXcorrector_cs/tableauID/c_1-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1-group
c_1_0: /NXcorrector_cs/tableauID/c_1_0-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_0-group
c_1_2_a: /NXcorrector_cs/tableauID/c_1_2_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_a-group
c_1_2_b: /NXcorrector_cs/tableauID/c_1_2_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_b-group
c_2_1_a: /NXcorrector_cs/tableauID/c_2_1_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_a-group
c_2_1_b: /NXcorrector_cs/tableauID/c_2_1_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_b-group
c_2_3_a: /NXcorrector_cs/tableauID/c_2_3_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_a-group
c_2_3_b: /NXcorrector_cs/tableauID/c_2_3_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_b-group
c_3: /NXcorrector_cs/tableauID/c_3-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3-group
c_3_0: /NXcorrector_cs/tableauID/c_3_0-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_0-group
c_3_2_a: /NXcorrector_cs/tableauID/c_3_2_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_a-group
c_3_2_b: /NXcorrector_cs/tableauID/c_3_2_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_b-group
c_3_4_a: /NXcorrector_cs/tableauID/c_3_4_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a-group
c_3_4_b: /NXcorrector_cs/tableauID/c_3_4_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_b-group
c_4_1_a: /NXcorrector_cs/tableauID/c_4_1_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_a-group
c_4_1_b: /NXcorrector_cs/tableauID/c_4_1_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_b-group
c_4_3_a: /NXcorrector_cs/tableauID/c_4_3_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_a-group
c_4_3_b: /NXcorrector_cs/tableauID/c_4_3_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_b-group
c_4_5_a: /NXcorrector_cs/tableauID/c_4_5_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_a-group
c_4_5_b: /NXcorrector_cs/tableauID/c_4_5_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_b-group
c_5: /NXcorrector_cs/tableauID/c_5-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5-group
c_5_0: /NXcorrector_cs/tableauID/c_5_0-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_0-group
c_5_2_a: /NXcorrector_cs/tableauID/c_5_2_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_a-group
c_5_2_b: /NXcorrector_cs/tableauID/c_5_2_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_b-group
c_5_4_a: /NXcorrector_cs/tableauID/c_5_4_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_a-group
c_5_4_b: /NXcorrector_cs/tableauID/c_5_4_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_b-group
c_5_6_a: /NXcorrector_cs/tableauID/c_5_6_a-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_a-group
c_5_6_b: /NXcorrector_cs/tableauID/c_5_6_b-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_b-group
c_one: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_one-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_one-field
c_three: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_three-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_three-field
c_two: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_two-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_two-field
calib_n: /NXpositioner_sts/calib_N-field
calibrated_axis: /NXcalibration/calibrated_AXIS-field; /NXmpes/ENTRY/PROCESS_MPES/angularN_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/delay_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/ellipticity_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/energy_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/kN_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/polarization_angle_calibration/calibrated_axis-field; /NXmpes/ENTRY/PROCESS_MPES/spatialN_calibration/calibrated_axis-field; /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration/calibrated_axis-field; /NXpiezo_config_spm/calibration/calibrated_AXIS-field; /NXprocess_mpes/angularN_calibration/calibrated_axis-field; /NXprocess_mpes/delay_calibration/calibrated_axis-field; /NXprocess_mpes/ellipticity_calibration/calibrated_axis-field; /NXprocess_mpes/energy_calibration/calibrated_axis-field; /NXprocess_mpes/energy_referencing/calibrated_axis-field; /NXprocess_mpes/kN_calibration/calibrated_axis-field; /NXprocess_mpes/polarization_angle_calibration/calibrated_axis-field; /NXprocess_mpes/spatialN_calibration/calibrated_axis-field
calibrated_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl/calibrated_tof-field; /NXapm_volt_and_bowl/calibrated_tof-field
calibration: /NXcantilever_spm/cantilever_config/CALIBRATION-group; /NXcircuit/calibration-group; /NXem_ebsd/calibration-group; /NXiv_bias/calibration-field; /NXpiezo_config_spm/calibration-group; /NXprocess/CALIBRATION-group; /NXprocess_mpes/CALIBRATION-group; /NXresolution/CALIBRATION-group; /NXspm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration-group; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration-group
calibration_accuracy: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_accuracy-group
calibration_coefficient_n: /NXpiezo_config_spm/calibration/calibration_coefficient_N-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/calibration_coefficient_N-field
calibration_date: /NXdetector/calibration_date-field; /NXpiezo_config_spm/calibration/calibration_date-field
calibration_interval: /NXcalibration/calibration_interval-field
calibration_method: /NXcalibration/calibration_method-group; /NXdetector/calibration_method-group
calibration_name: /NXpiezo_config_spm/calibration/calibration_name-field
calibration_object: /NXcalibration/calibration_object-group
calibration_reference: /NXcalibration/calibration_reference-group
calibration_software: /NXcalibration/calibration_software-field
calibration_status: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_status-field
calibration_style: /NXscanbox_em/calibration_style-field
calibration_time: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_time-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
calibration_type: /NXcalibration/calibration_type-field; /NXpiezo_config_spm/calibration/calibration_type-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/calibration_type-field
cameca_to_nexus: /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus-group; /NXapm_paraprobe_clusterer_results/ENTRY/cameca_to_nexus-group
camera_length: /NXoptical_system_em/camera_length-field
canonical_smile: /NXsubstance/canonical_smile-field
cantilever_amplitude_positioner: /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_amplitude_positioner-group
cantilever_coating: /NXcantilever_spm/cantilever_config/cantilever_coating-field
cantilever_config: /NXcantilever_spm/cantilever_config-group
cantilever_frequency_positioner: /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_frequency_positioner-group
cantilever_length: /NXcantilever_spm/cantilever_config/cantilever_length-field
cantilever_oscillator: /NXafm/ENTRY/experiment_instrument/CANTILEVER_SPM/cantilever_oscillator-group; /NXcantilever_spm/cantilever_oscillator-group
cantilever_phase_positioner: /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_phase_positioner-group
cantilever_resonance_frequency: /NXcantilever_spm/cantilever_config/cantilever_resonance_frequency-field
cantilever_spm: /NXafm/ENTRY/experiment_instrument/CANTILEVER_SPM-group
cantilever_thickness: /NXcantilever_spm/cantilever_config/cantilever_thickness-field
cantilever_type: /NXcantilever_spm/cantilever_config/cantilever_type-field
cantilever_width: /NXcantilever_spm/cantilever_config/cantilever_width-field
capability: /NXfabrication/capability-field
capillary: /NXinstrument/CAPILLARY-group
capital_phi: /NXmicrostructure_odf/phi_two_plot/capital_phi-field
cardinality: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/cardinality-field; /NXcg_primitive_set/cardinality-field; /NXgraph_node_set/cardinality-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/cardinality-field; /NXsimilarity_grouping/cardinality-field
cas_image: /NXsubstance/cas_image-group
cas_name: /NXsubstance/cas_name-field
cas_number: /NXsubstance/cas_number-field
cas_synonyms: /NXsubstance/cas_synonyms-field
cas_uri: /NXsubstance/cas_uri-field
categorical_label: /NXsimilarity_grouping/categorical_label-field
categorical_labels: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/categorical_labels-field
category: /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/category-field
cdeform_field: /NXdistortion/cdeform_field-field
cell_dimensions: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cell_dimensions-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/cell_dimensions-field; /NXcg_grid/cell_dimensions-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/cell_dimensions-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/cell_dimensions-field; /NXmicrostructure_score_config/ENTRY/discretization/grid/cell_dimensions-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/cell_dimensions-field
center: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/center-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/center-field; /NXcg_primitive_set/center-field; /NXem_calorimetry/ENTRY/distortion_correction/result/center-field; /NXscanbox_em/center-field
center_energy: /NXenergydispersion/center_energy-field
central_stop_diameter: /NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material: /NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness: /NXfresnel_zone_plate/central_stop_thickness-field
cg_cylinder_set: /NXcg_roi_set/CG_CYLINDER_SET-group; /NXspatial_filter/CG_CYLINDER_SET-group
cg_ellipsoid_set: /NXcg_roi_set/CG_ELLIPSOID_SET-group; /NXspatial_filter/CG_ELLIPSOID_SET-group
cg_geodesic_mesh: /NXem_sim/simulation/CG_GEODESIC_MESH-group
cg_grid: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid-group; /NXmicrostructure/CG_GRID-group
cg_half_edge_data_structure: /NXcg_triangulated_surface_mesh/CG_HALF_EDGE_DATA_STRUCTURE-group
cg_hexahedron_set: /NXcg_roi_set/CG_HEXAHEDRON_SET-group; /NXspatial_filter/CG_HEXAHEDRON_SET-group
cg_parallelogram_set: /NXcg_roi_set/CG_PARALLELOGRAM_SET-group
cg_point_set: /NXmicrostructure/CG_POINT_SET-group
cg_polygon_set: /NXmicrostructure/CG_POLYGON_SET-group
cg_polyhedron_set: /NXcg_roi_set/CG_POLYHEDRON_SET-group; /NXmicrostructure/CG_POLYHEDRON_SET-group; /NXspatial_filter/CG_POLYHEDRON_SET-group
cg_polyline_set: /NXmicrostructure/CG_POLYLINE_SET-group
cg_sphere_set: /NXcg_roi_set/CG_SPHERE_SET-group
cg_triangle_set: /NXmicrostructure/CG_TRIANGLE_SET-group
cg_triangulated_surface_mesh: /NXcg_geodesic_mesh/CG_TRIANGULATED_SURFACE_MESH-group
chamber: /NXebeam_column/CHAMBER-group; /NXem/ENTRY/measurement/em_lab/CHAMBER-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/chamber-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/chamber-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/CHAMBER-group; /NXem_msr/em_lab/CHAMBER-group; /NXevent_data_em/em_lab/CHAMBER-group; /NXibeam_column/CHAMBER-group
chamber_pressure: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/analysis_chamber/chamber_pressure-field; /NXevent_data_apm/instrument/analysis_chamber/chamber_pressure-field
changer_position: /NXsample/changer_position-field; /NXsnsevent/ENTRY/sample/changer_position-field; /NXsnshisto/ENTRY/sample/changer_position-field
channel_name: /NXscan_control/linear_SCAN/channel_NAME-field
channel_name_n: /NXscan_control/mesh_SCAN/channel_NAME_N-field; /NXscan_control/snake_SCAN/channel_NAME_N-field; /NXscan_control/traj_SCAN/channel_NAME_N-field
channel_temp: /NXspm/ENTRY/experiment_instrument/TEMPERATURE/CHANNEL_temp-field
channels: /NXiv_bias/channels-field
charge: /NXatom_set/charge-field; /NXion/charge-field
charge_state: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/charge_state-field; /NXapm_charge_state_analysis/charge_state-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/charge_state-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/charge_state-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field; /NXatom_set/charge_state-field; /NXion/charge_state-field
charge_state_analysis: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis-group
checksum: /NXapm/ENTRY/atom_probe/hit_finding/serialized/checksum-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/checksum-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/checksum-field; /NXapm/ENTRY/atom_probe/ranging/definitions/checksum-field; /NXapm/ENTRY/atom_probe/raw_data/serialized/checksum-field; /NXapm/ENTRY/atom_probe/reconstruction/config/checksum-field; /NXapm/ENTRY/atom_probe/reconstruction/results/checksum-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/checksum-field; /NXapm/ENTRY/serializedID/checksum-field; /NXapm_compositionspace_config/ENTRY/config/ranging/checksum-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/checksum-field; /NXapm_compositionspace_results/ENTRY/config/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/checksum-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/checksum-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/checksum-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/checksum-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/checksum-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/checksum-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/checksum-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/checksum-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/checksum-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/checksum-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/checksum-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/checksum-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/checksum-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/checksum-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/checksum-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/checksum-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/checksum-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/checksum-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/checksum-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/checksum-field; /NXem/ENTRY/roiID/ebsd/indexing/source/checksum-field; /NXem/ENTRY/roiID/ebsd/measurement/source/checksum-field; /NXem/ENTRY/roiID/ebsd/simulation/source/checksum-field; /NXem/ENTRY/serializedID/checksum-field; /NXem_calorimetry/ENTRY/actuator/checksum-field; /NXem_calorimetry/ENTRY/diffraction/checksum-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/checksum-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/checksum-field; /NXserialized/checksum-field
chemical_composition: /NXapm/ENTRY/sample/chemical_composition-group
chemical_description: /NXpiezoelectric_material/chemical_description-group
chemical_formula: /NXarchive/entry/sample/chemical_formula-field; /NXcontainer/chemical_formula-field; /NXcrystal/chemical_formula-field; /NXdispersive_material/ENTRY/sample/chemical_formula-field; /NXfilter/chemical_formula-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/chemical_formula-field; /NXsample/chemical_formula-field; /NXsample_component/chemical_formula-field
chemical_process: /NXhistory/CHEMICAL_PROCESS-group
chemical_symbol: /NXapm/ENTRY/sample/chemical_composition/ionID/chemical_symbol-field
chi: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/chi-field; /NXxeuler/entry/name/chi-link; /NXxeuler/entry/sample/chi-field; /NXxrd_pan/ENTRY/experiment_result/chi-field
chirp_gdd: /NXbeam/chirp_GDD-field
chirp_type: /NXbeam/chirp_type-field
chopper: /NXreftof/entry/instrument/chopper-group
chromatic: /NXlens_opt/chromatic-field
cif: /NXmicrostructure_mtex_config/path/cif-field
circuit: /NXbias_spectroscopy/CIRCUIT-group; /NXcomponent/CIRCUIT-group; /NXcs_computer/memory/CIRCUIT-group; /NXcs_computer/processing/CIRCUIT-group; /NXcs_computer/storage/CIRCUIT-group; /NXscanbox_em/CIRCUIT-group
cite: /NXapm/ENTRY/CITE-group; /NXem_calorimetry/ENTRY/CITE-group
citeid: /NXem/ENTRY/citeID-group
clad_diameter: /NXfiber/cladding/clad_diameter-field
clad_index_of_refraction: /NXfiber/cladding/clad_index_of_refraction-field
clad_material: /NXfiber/cladding/clad_material-field
cladding: /NXfiber/cladding-group
cleaning_step: /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP-group
clear_aperture: /NXbeam_splitter/clear_aperture-field; /NXwaveplate/clear_aperture-field
closest_corner: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/closest_corner-field
cluster_analysisid: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID-group; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID-group; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID-group
cluster_composition: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_composition-field
cluster_identifier: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_identifier-field
cluster_selection_epsilon: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/cluster_selection_epsilon-field
cluster_statistics: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_statistics-field
clustering: /NXapm_compositionspace_config/ENTRY/config/clustering-group; /NXapm_compositionspace_results/ENTRY/clustering-group
coating: /NXbeam_splitter/coating-group; /NXfiber/coating-group; /NXlens_opt/COATING-group; /NXpolarizer_opt/COATING-group; /NXwaveplate/coating-group
coating_diameter: /NXfiber/coating/coating_diameter-field
coating_material: /NXbeam_splitter/coating/coating_material-field; /NXfiber/coating/coating_material-field; /NXfilter/coating_material-field; /NXgrating/coating_material-field; /NXguide/coating_material-field; /NXlens_opt/COATING/coating_material-field; /NXmirror/coating_material-field; /NXpolarizer_opt/COATING/coating_material-field; /NXwaveplate/coating/coating_material-field
coating_roughness: /NXfilter/coating_roughness-field; /NXgrating/coating_roughness-field; /NXguide/coating_roughness-field; /NXmirror/coating_roughness-field
coating_thickness: /NXbeam_splitter/coating/coating_thickness-field; /NXlens_opt/COATING/coating_thickness-field; /NXpolarizer_opt/COATING/coating_thickness-field; /NXwaveplate/coating/coating_thickness-field
coating_type: /NXbeam_splitter/coating/coating_type-field; /NXlens_opt/COATING/coating_type-field; /NXpolarizer_opt/COATING/coating_type-field; /NXwaveplate/coating/coating_type-field
coefficients: /NXcalibration/coefficients-field; /NXspm/ENTRY/experiment_instrument/TEMPERATURE/temperature_calibration/coefficients-field; /NXspm/ENTRY/experiment_instrument/sample_bias_votage/bias_calibration/coefficients-field; /NXstm/ENTRY/experiment_instrument/current_sensor/current_calibration/coefficients-field
coherence_length: /NXbeam_path/SOURCE/coherence_length-field
collection: /NXcanSAS/ENTRY/COLLECTION-group; /NXcanSAS/ENTRY/PROCESS/COLLECTION-group; /NXdetector/COLLECTION-group; /NXentry/COLLECTION-group; /NXinstrument/COLLECTION-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group; /NXsubentry/COLLECTION-group
collection_description: /NXarchive/entry/collection_description-field; /NXentry/collection_description-field; /NXsubentry/collection_description-field
collection_identifier: /NXarchive/entry/collection_identifier-field; /NXentry/collection_identifier-group; /NXsensor_scan/ENTRY/collection_identifier-group; /NXsnsevent/ENTRY/collection_identifier-field; /NXsnshisto/ENTRY/collection_identifier-field; /NXsubentry/collection_identifier-group
collection_time: /NXarchive/entry/collection_time-field; /NXentry/collection_time-field; /NXsubentry/collection_time-field
collection_title: /NXsnsevent/ENTRY/collection_title-field; /NXsnshisto/ENTRY/collection_title-field
collectioncolumn: /NXelectronanalyser/COLLECTIONCOLUMN-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
collimator: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXinstrument/COLLIMATOR-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXsastof/ENTRY/instrument/collimator-group
colloquial_name: /NXdispersive_material/ENTRY/sample/colloquial_name-field
color_map: /NXmicrostructure_mtex_config/plotting/color_map-field
color_palette: /NXmicrostructure_mtex_config/plotting/color_palette-field
command1: /NXsnsevent/ENTRY/SNSHistoTool/command1-field; /NXsnshisto/ENTRY/SNSHistoTool/command1-field
command_line_call: /NXcs_profiling/command_line_call-field
comment: /NXmicrostructure/comment-field
common: /NXapm_paraprobe_clusterer_config/ENTRY/common-group; /NXapm_paraprobe_clusterer_results/ENTRY/common-group; /NXapm_paraprobe_distancer_config/ENTRY/common-group; /NXapm_paraprobe_distancer_results/ENTRY/common-group; /NXapm_paraprobe_intersector_config/ENTRY/common-group; /NXapm_paraprobe_intersector_results/ENTRY/common-group; /NXapm_paraprobe_nanochem_config/ENTRY/common-group; /NXapm_paraprobe_nanochem_results/ENTRY/common-group; /NXapm_paraprobe_ranger_config/ENTRY/common-group; /NXapm_paraprobe_ranger_results/ENTRY/common-group; /NXapm_paraprobe_selector_config/ENTRY/common-group; /NXapm_paraprobe_selector_results/ENTRY/common-group; /NXapm_paraprobe_spatstat_config/ENTRY/common-group; /NXapm_paraprobe_spatstat_results/ENTRY/common-group; /NXapm_paraprobe_surfacer_config/ENTRY/common-group; /NXapm_paraprobe_surfacer_results/ENTRY/common-group; /NXapm_paraprobe_tessellator_config/ENTRY/common-group; /NXapm_paraprobe_tessellator_results/ENTRY/common-group; /NXapm_paraprobe_transcoder_config/ENTRY/common-group; /NXapm_paraprobe_transcoder_results/ENTRY/common-group
common_beam_depolarizer: /NXtransmission/ENTRY/instrument/common_beam_depolarizer-field
common_beam_mask: /NXtransmission/ENTRY/instrument/common_beam_mask-group
comp_current: /NXflipper/comp_current-field
comp_turns: /NXflipper/comp_turns-field
complex: /NXimage_set/image_1d/complex-field; /NXimage_set/image_2d/complex-field; /NXimage_set/image_3d/complex-field; /NXimage_set/stack_1d/complex-field; /NXimage_set/stack_2d/complex-field; /NXimage_set/stack_3d/complex-field
component: /NXebeam_column/COMPONENT-group; /NXibeam_column/COMPONENT-group; /NXsample/component-field
component_analysis: /NXmicrostructure_imm_config/ENTRY/component_analysis-group
component_index: /NXgeometry/component_index-field
component_name: /NXmicrostructure_imm_config/ENTRY/component_analysis/component_name-field
components: /NXcircuit/components-field
composition: /NXapm/ENTRY/sample/chemical_composition/ionID/composition-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition-group; /NXchemical_composition/ION/composition-field; /NXpolarizer/composition-field
composition_error: /NXapm/ENTRY/sample/chemical_composition/ionID/composition_error-field
concentration: /NXsample/concentration-field; /NXsample_component_set/concentration-field
config: /NXapm/ENTRY/atom_probe/reconstruction/config-group; /NXapm_compositionspace_config/ENTRY/config-group; /NXapm_compositionspace_results/ENTRY/config-group; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config-group; /NXapm_paraprobe_intersector_results/ENTRY/common/config-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/config-group; /NXapm_paraprobe_ranger_results/ENTRY/common/config-group; /NXapm_paraprobe_selector_results/ENTRY/common/config-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/config-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/config-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/config-group; /NXapm_paraprobe_tool_common/config-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/config-group; /NXem_calorimetry/ENTRY/azimuthal_integration/config-group; /NXem_calorimetry/ENTRY/background_subtraction/config-group; /NXem_calorimetry/ENTRY/distortion_correction/config-group; /NXem_calorimetry/ENTRY/pattern_center/config-group
configuration: /NXmicrostructure/configuration-group; /NXmicrostructure_odf/configuration-group; /NXmicrostructure_pf/configuration-group
connections: /NXcircuit/connections-field
construction_date: /NXfabrication/construction_date-field
construction_year: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/construction_year-field
continuous: /NXscan_control/traj_SCAN/continuous-field
continuous_n: /NXscan_control/linear_SCAN/continuous_N-field; /NXscan_control/mesh_SCAN/continuous_N-field; /NXscan_control/snake_SCAN/continuous_N-field; /NXscan_control/spiral_SCAN/continuous_N-field
contrast_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
control: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control-group; /NXevent_data_apm/instrument/control-group; /NXlauetof/entry/control-group; /NXrefscan/entry/control-group; /NXreftof/entry/control-group; /NXsastof/ENTRY/control-group; /NXstxm/ENTRY/control-group; /NXtomo/entry/control-group; /NXtomophase/entry/control-group; /NXxbase/entry/control-group
control_point: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point-group
control_points: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/control_points-field
control_programid: /NXem/ENTRY/measurement/em_lab/control_programID-group
controller_name: /NXpositioner_spm/controller_name-field; /NXpositioner_sts/controller_name-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/controller_name-field
controller_record: /NXpositioner/controller_record-field; /NXpositioner_sts/controller_record-field
controller_status: /NXspm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/controller_status-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/controller_status-field
convention: /NXdispersion_function/convention-field; /NXdispersion_table/convention-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/convention-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/convention-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/convention-field
conventions: /NXmicrostructure_mtex_config/conventions-group
convolution_mode: /NXmicrostructure_gragles_config/ENTRY/numerics/convolution_mode-field
cooler_or_heater: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/cooler_or_heater-field
coordinate: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/coordinate-field; /NXcg_grid/coordinate-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/coordinate-field
coordinate_system: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM-group; /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM-group; /NXcoordinate_system_set/COORDINATE_SYSTEM-group; /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM-group; /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM-group
coordinate_system_set: /NXapm/ENTRY/coordinate_system_set-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set-group; /NXem/ENTRY/coordinate_system_set-group; /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET-group; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set-group; /NXmicrostructure_score_results/ENTRY/coordinate_system_set-group
coordinate_system_transformations: /NXxps/ENTRY/geometries/xps_coordinate_system/coordinate_system_transformations-group
coprecipitation_analysis: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis-group
core: /NXfiber/core-group
core_diameter: /NXfiber/core/core_diameter-field
core_index_of_refraction: /NXfiber/core/core_index_of_refraction-field
core_material: /NXfiber/core/core_material-field
core_sample_indices: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/core_sample_indices-field
corrector_ax: /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax-group
corrector_cs: /NXebeam_column/CORRECTOR_CS-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs-group
correlation: /NXem/ENTRY/roiID/correlation-group
count: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/count-field; /NXchemical_composition/ION/count-field; /NXregion/count-field
count_time: /NXdetector/count_time-field; /NXmonitor/count_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field; /NXxpcs/entry/instrument/DETECTOR/count_time-field; /NXxrd_pan/ENTRY/experiment_config/count_time-field
countrate_correction_applied: /NXdetector/countrate_correction_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
countrate_correction_lookup_table: /NXdetector/countrate_correction_lookup_table-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_lookup_table-field
coupled: /NXmoderator/coupled-field
coupling_material: /NXmoderator/coupling_material-field; /NXsnsevent/ENTRY/instrument/moderator/coupling_material-field; /NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
crate: /NXdetector/crate-field
critical_energy: /NXbending_magnet/critical_energy-field
crosstalk_compensation: /NXamplifier/crosstalk_compensation-field
crosstalk_factor: /NXamplifier/crosstalk_factor-field
cryo_bottom_temp: /NXspm/ENTRY/experiment_instrument/scan_environment/cryo_bottom_temp-field; /NXstm/ENTRY/resolution_indicators/cryo_bottom_temp-group
cryo_shield_temp: /NXspm/ENTRY/experiment_instrument/scan_environment/cryo_shield_temp-field; /NXstm/ENTRY/resolution_indicators/cryo_shield_temp-group
cryo_shield_temp_sensor: /NXstm/ENTRY/experiment_instrument/cryo_shield_temp_sensor-group; /NXstm/ENTRY/experiment_instrument/scan_environment/cryo_shield_temp_sensor-group
cryo_temp_sensor: /NXstm/ENTRY/experiment_instrument/cryo_temp_sensor-group; /NXstm/ENTRY/experiment_instrument/scan_environment/cryo_temp_sensor-group
cryostat: /NXmanipulator/cryostat-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat-group; /NXmpes/ENTRY/SAMPLE/temperature_env/cryostat-group
crystal: /NXinstrument/CRYSTAL-group; /NXmicrostructure/crystal-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal-group; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal-group; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal-group; /NXmonochromator/CRYSTAL-group; /NXmonopd/entry/INSTRUMENT/CRYSTAL-group; /NXsnsevent/ENTRY/instrument/CRYSTAL-group; /NXsnshisto/ENTRY/instrument/CRYSTAL-group
crystal_identifier: /NXmicrostructure/crystal/crystal_identifier-field; /NXmicrostructure/interface/crystal_identifier-field; /NXmicrostructure/quadruple_junction/crystal_identifier-field; /NXmicrostructure/triple_junction/crystal_identifier-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/crystal_identifier-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/crystal_identifier-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/crystal_identifier-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/crystal_identifier-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/crystal_identifier-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier-field
crystal_identifier_offset: /NXmicrostructure/crystal/crystal_identifier_offset-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier_offset-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier_offset-field
crystal_structure: /NXem_correlation/indexing/CRYSTAL_STRUCTURE-group
crystal_symmetry: /NXmicrostructure_imm_config/ENTRY/roi/crystal_symmetry-field; /NXrotation_set/crystal_symmetry-field
crystal_symmetry_point_group: /NXmicrostructure_odf/configuration/crystal_symmetry_point_group-field; /NXmicrostructure_pf/configuration/crystal_symmetry_point_group-field
crystal_system: /NXcrystal_structure/crystal_system-field
crystallographic_calibration: /NXapm/ENTRY/atom_probe/reconstruction/crystallographic_calibration-field; /NXapm_reconstruction/crystallographic_calibration-field
crystallographic_database: /NXunit_cell/crystallographic_database-field
crystallographic_database_identifier: /NXunit_cell/crystallographic_database_identifier-field
cs_computer: /NXcs_profiling/CS_COMPUTER-group
cs_filter_boolean_mask: /NXspatial_filter/CS_FILTER_BOOLEAN_MASK-group
cs_profiling_event: /NXcs_profiling/CS_PROFILING_EVENT-group
csg: /NXsolid_geometry/CSG-group
cue_index: /NXevent_data/cue_index-field; /NXlog/cue_index-field
cue_timestamp_zero: /NXevent_data/cue_timestamp_zero-field; /NXlog/cue_timestamp_zero-field
cumulated: /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/cumulated-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/cumulated-field
cumulated_normalized: /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/cumulated_normalized-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/cumulated_normalized-field
current: /NXdeflector/current-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/current-field; /NXibeam_column/ion_source/current-field; /NXiv_temp/ENTRY/DATA/current-field; /NXlens_em/current-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/current-field; /NXsource/current-field; /NXstm/ENTRY/experiment_instrument/current_sensor/current-field; /NXstm/ENTRY/reproducibility_indicators/current-field
current_calibration: /NXstm/ENTRY/experiment_instrument/current_sensor/current_calibration-group
current_gain: /NXstm/ENTRY/experiment_instrument/current_sensor/AMPLIFIER/current_gain-field; /NXstm/ENTRY/reproducibility_indicators/current_gain-field
current_log: /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log-group
current_offset: /NXstm/ENTRY/experiment_instrument/current_sensor/current_offset-field; /NXstm/ENTRY/reproducibility_indicators/current_offset-field
current_sensor: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group; /NXspm/ENTRY/experiment_instrument/current_sensor-group; /NXspm/ENTRY/experiment_instrument/scan_environment/current_sensor-group; /NXstm/ENTRY/experiment_instrument/current_sensor-group
current_set: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set-group
current_set_feature_to_cluster: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/current_set_feature_to_cluster-field
current_to_next_link: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link-field
current_to_next_link_type: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link_type-field
current_working_directory: /NXapm_compositionspace_results/ENTRY/profiling/current_working_directory-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/current_working_directory-field; /NXcs_profiling/current_working_directory-field; /NXem_calorimetry/ENTRY/profiling/current_working_directory-field
curvature: /NXxraylens/curvature-field
curvature_driving_force: /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force-group
curvature_horizontal: /NXcrystal/curvature_horizontal-field
curvature_radius_face: /NXlens_opt/curvature_radius_FACE-field
curvature_radius_n: /NXcantilever_spm/cantilever_config/curvature_radius_N-field; /NXpiezo_config_spm/piezo_material/curvature_radius_N-field
curvature_vertical: /NXcrystal/curvature_vertical-field
cut_angle: /NXcrystal/cut_angle-field
cw: /NXbeam_path/SOURCE/cw-field
cw_power: /NXbeam_path/SOURCE/cw_power-field
cylinder_orientation: /NXxraylens/cylinder_orientation-group
cylinder_set: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set-group
cylinders: /NXcylindrical_geometry/cylinders-field
cylindrical: /NXxraylens/cylindrical-field
cylindrical_geometry: /NXbeam_stop/CYLINDRICAL_GEOMETRY-group
cylindrical_orientation_angle: /NXcrystal/cylindrical_orientation_angle-field
d: /NXreflections/d-field
d_4: /NXcorrector_cs/tableauID/d_4-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4-group
d_piezoelectric_constant: /NXpiezoelectric_material/D_piezoelectric_constant-field
d_spacing: /NXcrystal/d_spacing-field
dark_field: /NXtomophase/entry/instrument/dark_field-group
daslogs: /NXsnsevent/ENTRY/DASlogs-group; /NXsnshisto/ENTRY/DASlogs-group
data: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA-group; /NXapm_reconstruction/naive_discretization/DATA-group; /NXarpes/ENTRY/DATA-group; /NXarpes/ENTRY/INSTRUMENT/analyser/data-field; /NXbeam/DATA-group; /NXcalibration/DATA-group; /NXcanSAS/ENTRY/DATA-group; /NXcxi_ptycho/DATA-group; /NXcxi_ptycho/DATA/data-link; /NXcxi_ptycho/data_1/data-link; /NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field; /NXdata/DATA-field; /NXdetector/DATA-group; /NXdetector/data-field; /NXem/ENTRY/roiID/ebsd/indexing/roi/data-field; /NXem_correlation/indexing/roi/data-field; /NXem_ebsd/indexing/roi/data-field; /NXentry/DATA-group; /NXfit/data-group; /NXfit_background/data-group; /NXfluo/entry/INSTRUMENT/fluorescence/data-field; /NXfluo/entry/MONITOR/data-field; /NXfluo/entry/data-group; /NXfluo/entry/data/data-link; /NXguide/reflectivity/data-field; /NXinteraction_vol_em/DATA-group; /NXiqproc/ENTRY/DATA-group; /NXiqproc/ENTRY/DATA/data-field; /NXiv_temp/ENTRY/DATA-group; /NXlauetof/entry/control/data-field; /NXlauetof/entry/instrument/detector/data-field; /NXlauetof/entry/name/data-link; /NXmicrostructure_ipf/legend/data-field; /NXmicrostructure_ipf/map/data-field; /NXmicrostructure_mtex_config/path/data-field; /NXmonitor/data-field; /NXmonopd/entry/DATA-group; /NXmonopd/entry/DATA/data-link; /NXmonopd/entry/INSTRUMENT/DETECTOR/data-field; /NXmpes/ENTRY/data-group; /NXmpes/ENTRY/data/data-field; /NXmpes_arpes/ENTRY/data-group; /NXmpes_arpes/ENTRY/data/data-field; /NXmx/ENTRY/DATA-group; /NXmx/ENTRY/DATA/data-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXnote/data-field; /NXoptical_spectroscopy/ENTRY/DATA-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/DATA-group; /NXpeak/data-group; /NXrefscan/entry/control/data-field; /NXrefscan/entry/data-group; /NXrefscan/entry/data/data-link; /NXrefscan/entry/instrument/DETECTOR/data-field; /NXreftof/entry/control/data-field; /NXreftof/entry/data-group; /NXreftof/entry/data/data-link; /NXreftof/entry/instrument/detector/data-field; /NXsas/ENTRY/DATA-group; /NXsas/ENTRY/DATA/data-link; /NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXsastof/ENTRY/control/data-field; /NXsastof/ENTRY/data-group; /NXsastof/ENTRY/data/data-link; /NXsastof/ENTRY/instrument/detector/data-field; /NXscan/ENTRY/DATA-group; /NXscan/ENTRY/DATA/data-link; /NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXscan/ENTRY/MONITOR/data-field; /NXscan_control/mesh_SCAN/SCAN_data/data-field; /NXsensor_scan/ENTRY/DATA-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group; /NXsnsevent/ENTRY/DATA-group; /NXsnsevent/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/DATA-group; /NXsnshisto/ENTRY/DATA/data-link; /NXsnshisto/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/instrument/DETECTOR/data-field; /NXspe/ENTRY/data-group; /NXspe/ENTRY/data/data-field; /NXsqom/ENTRY/DATA-group; /NXsqom/ENTRY/DATA/data-field; /NXstxm/ENTRY/DATA-group; /NXstxm/ENTRY/DATA/data-field; /NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_x/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_y/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_z/data-field; /NXstxm/ENTRY/control/data-field; /NXsubentry/DATA-group; /NXtas/entry/DATA-group; /NXtas/entry/DATA/data-link; /NXtas/entry/INSTRUMENT/DETECTOR/data-field; /NXtas/entry/MONITOR/data-field; /NXtofnpd/entry/INSTRUMENT/detector/data-field; /NXtofnpd/entry/MONITOR/data-field; /NXtofnpd/entry/data-group; /NXtofnpd/entry/data/data-link; /NXtofraw/entry/MONITOR/data-field; /NXtofraw/entry/data-group; /NXtofraw/entry/data/data-link; /NXtofraw/entry/instrument/detector/data-field; /NXtofsingle/entry/INSTRUMENT/detector/data-field; /NXtofsingle/entry/MONITOR/data-field; /NXtofsingle/entry/data-group; /NXtofsingle/entry/data/data-link; /NXtomo/entry/control/data-field; /NXtomo/entry/data-group; /NXtomo/entry/data/data-link; /NXtomo/entry/instrument/detector/data-field; /NXtomophase/entry/data-group; /NXtomophase/entry/data/data-link; /NXtomophase/entry/instrument/bright_field/data-field; /NXtomophase/entry/instrument/dark_field/data-field; /NXtomophase/entry/instrument/sample/data-field; /NXtomoproc/entry/data-group; /NXtomoproc/entry/data/data-field; /NXtransmission/ENTRY/data-group; /NXxas/ENTRY/DATA-group; /NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field; /NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field; /NXxas/ENTRY/MONITOR/data-field; /NXxasproc/ENTRY/DATA-group; /NXxasproc/ENTRY/DATA/data-field; /NXxbase/entry/DATA-group; /NXxbase/entry/DATA/data-link; /NXxbase/entry/instrument/detector/data-field; /NXxlaue/entry/instrument/source/distribution/data-field; /NXxpcs/entry/data-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data-group; /NXxps/ENTRY/FIT/data-group; /NXxps/ENTRY/FIT/peakPEAK/data-group; /NXxps/ENTRY/data-group; /NXxrd/ENTRY/DATA-group; /NXxrd/ENTRY/DATA/data-field
data_1: /NXcxi_ptycho/data_1-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
data_collection: /NXellipsometry/ENTRY/data_collection-group
data_correction: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/data_correction-field
data_errors: /NXdetector/data_errors-field
data_file: /NXdetector/data_file-group; /NXxrd_pan/ENTRY/data_file-field
data_identifier: /NXellipsometry/ENTRY/data_collection/data_identifier-field
data_origin: /NXdetector_module/data_origin-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
data_size: /NXdetector_module/data_size-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
data_software: /NXellipsometry/ENTRY/data_collection/data_software-group
data_stride: /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
data_type: /NXellipsometry/ENTRY/data_collection/data_type-field
data_x_time_of_flight: /NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
data_x_y: /NXsnsevent/ENTRY/DATA/data_x_y-link; /NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field; /NXsnshisto/ENTRY/DATA/data_x_y-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
data_y_time_of_flight: /NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
datatype_n: /NXbeam_transfer_matrix_table/datatype_N-field
date: /NXcanSAS/ENTRY/PROCESS/date-field; /NXmicrostructure/date-field; /NXnote/date-field; /NXprocess/date-field; /NXprocess_mpes/date-field; /NXsnsevent/ENTRY/SNSHistoTool/date-field; /NXsnshisto/ENTRY/SNSHistoTool/date-field; /NXtomoproc/entry/reconstruction/date-field; /NXxasproc/ENTRY/XAS_data_reduction/date-field
dbscan: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan-group; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan-group
dbscanid: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID-group; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID-group
dead_time: /NXdetector/dead_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
decelerate_electrode: /NXapm_msr/instrument/decelerate_electrode-group
decoration_filter: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter-group
decorator_multiplicity: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/decorator_multiplicity-field
default_color_map: /NXmicrostructure_mtex_config/plotting/default_color_map-field
definition: /NXafm/ENTRY/definition-field; /NXapm/ENTRY/definition-field; /NXapm_compositionspace_config/ENTRY/definition-field; /NXapm_compositionspace_results/ENTRY/definition-field; /NXapm_paraprobe_clusterer_config/ENTRY/definition-field; /NXapm_paraprobe_clusterer_results/ENTRY/definition-field; /NXapm_paraprobe_distancer_config/ENTRY/definition-field; /NXapm_paraprobe_distancer_results/ENTRY/definition-field; /NXapm_paraprobe_intersector_config/ENTRY/definition-field; /NXapm_paraprobe_intersector_results/ENTRY/definition-field; /NXapm_paraprobe_nanochem_config/ENTRY/definition-field; /NXapm_paraprobe_nanochem_results/ENTRY/definition-field; /NXapm_paraprobe_ranger_config/ENTRY/definition-field; /NXapm_paraprobe_ranger_results/ENTRY/definition-field; /NXapm_paraprobe_selector_config/ENTRY/definition-field; /NXapm_paraprobe_selector_results/ENTRY/definition-field; /NXapm_paraprobe_spatstat_config/ENTRY/definition-field; /NXapm_paraprobe_spatstat_results/ENTRY/definition-field; /NXapm_paraprobe_surfacer_config/ENTRY/definition-field; /NXapm_paraprobe_surfacer_results/ENTRY/definition-field; /NXapm_paraprobe_tessellator_config/ENTRY/definition-field; /NXapm_paraprobe_tessellator_results/ENTRY/definition-field; /NXapm_paraprobe_transcoder_config/ENTRY/definition-field; /NXapm_paraprobe_transcoder_results/ENTRY/definition-field; /NXarchive/entry/definition-field; /NXarpes/ENTRY/definition-field; /NXcanSAS/ENTRY/definition-field; /NXcxi_ptycho/entry_1/definition-field; /NXdirecttof/entry/definition-field; /NXdispersive_material/ENTRY/definition-field; /NXellipsometry/ENTRY/definition-field; /NXem/ENTRY/definition-field; /NXem_calorimetry/ENTRY/definition-field; /NXentry/definition-field; /NXfluo/entry/definition-field; /NXindirecttof/entry/definition-field; /NXiqproc/ENTRY/definition-field; /NXiv_temp/ENTRY/definition-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field; /NXlab_sample_mounting/ENTRY/definition-field; /NXlauetof/entry/definition-field; /NXmicrostructure_gragles_config/ENTRY/definition-field; /NXmicrostructure_gragles_results/ENTRY/definition-field; /NXmicrostructure_imm_config/ENTRY/definition-field; /NXmicrostructure_imm_results/ENTRY/definition-field; /NXmicrostructure_kanapy_results/ENTRY/definition-field; /NXmicrostructure_score_config/ENTRY/definition-field; /NXmicrostructure_score_results/ENTRY/definition-field; /NXmonopd/entry/definition-field; /NXmpes/ENTRY/definition-field; /NXmpes_arpes/ENTRY/definition-field; /NXmx/ENTRY/definition-field; /NXoptical_spectroscopy/ENTRY/definition-field; /NXraman/ENTRY/definition-field; /NXrefscan/entry/definition-field; /NXreftof/entry/definition-field; /NXsas/ENTRY/definition-field; /NXsastof/ENTRY/definition-field; /NXscan/ENTRY/definition-field; /NXsensor_scan/ENTRY/definition-field; /NXsnsevent/ENTRY/definition-field; /NXsnshisto/ENTRY/definition-field; /NXspe/ENTRY/definition-field; /NXspm/ENTRY/definition-field; /NXsqom/ENTRY/definition-field; /NXstm/ENTRY/definition-field; /NXsts/ENTRY/definition-field; /NXstxm/ENTRY/definition-field; /NXsubentry/definition-field; /NXtas/entry/definition-field; /NXtofnpd/entry/definition-field; /NXtofraw/entry/definition-field; /NXtofsingle/entry/definition-field; /NXtomo/entry/definition-field; /NXtomophase/entry/definition-field; /NXtomoproc/entry/definition-field; /NXtransmission/ENTRY/definition-field; /NXxas/ENTRY/definition-field; /NXxasproc/ENTRY/definition-field; /NXxbase/entry/definition-field; /NXxeuler/entry/definition-field; /NXxkappa/entry/definition-field; /NXxlaue/entry/definition-field; /NXxlaueplate/entry/definition-field; /NXxnb/entry/definition-field; /NXxpcs/entry/definition-field; /NXxps/ENTRY/definition-field; /NXxrd/ENTRY/definition-field; /NXxrd_pan/ENTRY/definition-field; /NXxrot/entry/definition-field
definition_local: /NXentry/definition_local-field; /NXsubentry/definition_local-field
definitions: /NXapm/ENTRY/atom_probe/ranging/definitions-group
deflection_angle: /NXbeam_splitter/deflection_angle-field; /NXgrating/deflection_angle-field
deflector: /NXcollectioncolumn/DEFLECTOR-group; /NXebeam_column/DEFLECTOR-group; /NXelectronanalyser/DEFLECTOR-group; /NXenergydispersion/DEFLECTOR-group; /NXibeam_column/DEFLECTOR-group; /NXscanbox_em/DEFLECTOR-group; /NXsource/DEFLECTOR-group; /NXspindispersion/DEFLECTOR-group
defocus: /NXoptical_system_em/defocus-field
deformation: /NXmicrostructure_score_config/ENTRY/deformation-group
deformation_gradient: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group
deformed_grain_identifier: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/deformed_grain_identifier-field
defragment_cell_cache: /NXmicrostructure_score_config/ENTRY/numerics/defragment_cell_cache-field
defragment_x: /NXmicrostructure_score_config/ENTRY/numerics/defragment_x-field
degree_char: /NXmicrostructure_mtex_config/plotting/degree_char-field
delay: /NXdata_mpes/delay-field; /NXdata_mpes_detector/delay-field; /NXdisk_chopper/delay-field
delay_calibration: /NXmpes/ENTRY/PROCESS_MPES/delay_calibration-group; /NXprocess_mpes/delay_calibration-group
delay_difference: /NXxpcs/entry/data/delay_difference-field
delocalization: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization-group
delocalizationid: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID-group
delta_time: /NXaberration/delta_time-field; /NXevent_data_apm/delta_time-field
demodulated_amplitude: /NXlockin/demodulated_amplitude-field
demodulated_frequency: /NXlockin/demodulated_frequency-field
demodulated_phase: /NXlockin/demodulated_phase-field
demodulated_signal: /NXlockin/demodulated_signal-field
demodulator_channels: /NXlockin/demodulator_channels-field
density: /NXcontainer/density-field; /NXcrystal/density-field; /NXem/ENTRY/sample/density-field; /NXfilter/density-field; /NXpiezoelectric_material/density-field; /NXsample/density-field; /NXsample_component/density-field
depends_on: /NXactuator/depends_on-field; /NXaperture/depends_on-field; /NXattenuator/depends_on-field; /NXbeam/depends_on-field; /NXbeam_path/SOURCE/depends_on-field; /NXbeam_path/depends_on-field; /NXbeam_path/window_NUMBER/depends_on-field; /NXbeam_stop/depends_on-field; /NXbending_magnet/depends_on-field; /NXcapillary/depends_on-field; /NXcg_primitive_set/depends_on-field; /NXcollectioncolumn/depends_on-field; /NXcollimator/depends_on-field; /NXcoordinate_system/depends_on-field; /NXcrystal/depends_on-field; /NXcrystal_structure/depends_on-field; /NXcs_filter_boolean_mask/depends_on-field; /NXdetector/depends_on-field; /NXdetector_module/depends_on-field; /NXdisk_chopper/depends_on-field; /NXelectronanalyser/depends_on-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/depends_on-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/depends_on-field; /NXem/ENTRY/roiID/ebsd/measurement/depends_on-field; /NXem/ENTRY/roiID/ebsd/simulation/depends_on-field; /NXem_ebsd/calibration/depends_on-field; /NXem_ebsd/measurement/depends_on-field; /NXem_ebsd/simulation/depends_on-field; /NXenergydispersion/depends_on-field; /NXenvironment/depends_on-field; /NXfermi_chopper/depends_on-field; /NXfilter/depends_on-field; /NXflipper/depends_on-field; /NXfresnel_zone_plate/depends_on-field; /NXgraph_edge_set/depends_on-field; /NXgraph_node_set/depends_on-field; /NXgrating/depends_on-field; /NXguide/depends_on-field; /NXinsertion_device/depends_on-field; /NXmanipulator/depends_on-field; /NXmicrostructure_ipf/depends_on-field; /NXmirror/depends_on-field; /NXmoderator/depends_on-field; /NXmonitor/depends_on-field; /NXmonochromator/depends_on-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field; /NXmpes_arpes/ENTRY/SAMPLE/depends_on-field; /NXmpes_arpes/ENTRY/geometries/arpes_geometry/depends_on-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field; /NXmx/ENTRY/SAMPLE/depends_on-field; /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/depends_on-field; /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/depends_on-field; /NXpinhole/depends_on-field; /NXpolarizer/depends_on-field; /NXpositioner/depends_on-field; /NXpositioner_sts/depends_on-field; /NXquadric/depends_on-field; /NXregistration/depends_on-field; /NXrotation_set/depends_on-field; /NXsample/depends_on-field; /NXsample_component/depends_on-field; /NXsensor/depends_on-field; /NXsensor_sts/depends_on-field; /NXslit/depends_on-field; /NXsource/depends_on-field; /NXspindispersion/depends_on-field; /NXunit_cell/depends_on-field; /NXvelocity_selector/depends_on-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field; /NXxps/ENTRY/INSTRUMENT/beamTYPE/depends_on-field; /NXxps/ENTRY/SAMPLE/depends_on-field; /NXxps/ENTRY/geometries/xps_coordinate_system/depends_on-field; /NXxraylens/depends_on-field
depolarization: /NXoptical_spectroscopy/ENTRY/derived_parameters/depolarization-field
depth: /NXgrating/depth-field
derived_parameters: /NXoptical_spectroscopy/ENTRY/derived_parameters-group
description: /NXactivity/description-field; /NXaperture/description-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/description-field; /NXapm/ENTRY/sample/description-field; /NXapm/ENTRY/specimen/description-field; /NXapm_paraprobe_tool_config/description-field; /NXapm_paraprobe_tool_results/description-field; /NXapm_ranging/background_quantification/description-field; /NXarchive/entry/instrument/description-field; /NXarchive/entry/sample/description-field; /NXbeam_stop/description-field; /NXcalibration/description-field; /NXcanSAS/ENTRY/PROCESS/description-field; /NXcg_marching_cubes/description-field; /NXchamber/description-field; /NXchemical_process/description-field; /NXcite/description-field; /NXcomponent/description-field; /NXcontainer/description-field; /NXcorrector_cs/tableauID/description-field; /NXcs_profiling_event/description-field; /NXdeflector/description-field; /NXdetector/description-field; /NXdispersion_repeated_parameter/description-field; /NXdispersion_single_parameter/description-field; /NXdistortion/description-field; /NXebeam_column/electron_source/description-field; /NXelectronanalyser/description-field; /NXelectrostatic_kicker/description-field; /NXem/ENTRY/sample/description-field; /NXem_eds/indexing/IMAGE_SET/description-field; /NXenvironment/description-field; /NXfiber/description-field; /NXfilter/description-field; /NXfit/error_function/description-field; /NXfit_function/description-field; /NXfit_parameter/description-field; /NXgeometry/description-field; /NXguide/description-field; /NXibeam_column/ion_source/description-field; /NXlog/description-field; /NXmagnetic_kicker/description-field; /NXmanipulator/description-field; /NXmicrostructure_gragles_config/ENTRY/description-field; /NXmicrostructure_gragles_results/ENTRY/description-field; /NXmicrostructure_imm_results/ENTRY/description-field; /NXmicrostructure_kanapy_results/ENTRY/description-field; /NXmicrostructure_score_config/ENTRY/description-field; /NXmicrostructure_score_results/ENTRY/description-field; /NXmirror/description-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field; /NXnote/description-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/description-field; /NXphysical_process/description-field; /NXpid/description-field; /NXpositioner/description-field; /NXpositioner_sts/description-field; /NXquadrupole_magnet/description-field; /NXreflectron/description-field; /NXregistration/description-field; /NXsample/description-field; /NXsample_component/description-field; /NXseparator/description-field; /NXsnsevent/ENTRY/DASlogs/LOG/description-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field; /NXsnsevent/ENTRY/SNSHistoTool/description-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsnshisto/ENTRY/DASlogs/LOG/description-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field; /NXsnshisto/ENTRY/SNSHistoTool/description-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsolenoid_magnet/description-field; /NXspin_rotator/description-field; /NXxpcs/entry/instrument/DETECTOR/description-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/description-field; /NXxps/ENTRY/FIT/error_function/description-field; /NXxps/ENTRY/FIT/global_fit_function/description-field; /NXxps/ENTRY/FIT/peakPEAK/function/description-field
descriptor: /NXem/ENTRY/roiID/ebsd/indexing/roi/descriptor-field; /NXem_correlation/indexing/roi/descriptor-field; /NXem_ebsd/indexing/roi/descriptor-field
design: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB/design-field; /NXpump/design-field; /NXstage_lab/design-field
det_module: /NXreflections/det_module-field
details: /NXcanSAS/ENTRY/SAMPLE/details-field
detection_gas_path: /NXdetector/detection_gas_path-field
detector: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group; /NXelectronanalyser/DETECTOR-group; /NXem_msr/em_lab/DETECTOR-group; /NXevent_data_em/em_lab/DETECTOR-group; /NXinstrument/DETECTOR-group; /NXlauetof/entry/instrument/detector-group; /NXmonopd/entry/INSTRUMENT/DETECTOR-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR-group; /NXrefscan/entry/instrument/DETECTOR-group; /NXreftof/entry/instrument/detector-group; /NXsas/ENTRY/INSTRUMENT/DETECTOR-group; /NXsastof/ENTRY/instrument/detector-group; /NXscan/ENTRY/INSTRUMENT/DETECTOR-group; /NXsnsevent/ENTRY/instrument/DETECTOR-group; /NXsnshisto/ENTRY/instrument/DETECTOR-group; /NXstxm/ENTRY/INSTRUMENT/DETECTOR-group; /NXtas/entry/INSTRUMENT/DETECTOR-group; /NXtofnpd/entry/INSTRUMENT/detector-group; /NXtofraw/entry/instrument/detector-group; /NXtofsingle/entry/INSTRUMENT/detector-group; /NXtomo/entry/instrument/detector-group; /NXtransmission/ENTRY/instrument/DETECTOR-group; /NXxbase/entry/instrument/detector-group; /NXxeuler/entry/instrument/detector-group; /NXxkappa/entry/instrument/detector-group; /NXxlaueplate/entry/instrument/detector-group; /NXxnb/entry/instrument/detector-group; /NXxpcs/entry/instrument/DETECTOR-group; /NXxrd/ENTRY/INSTRUMENT/DETECTOR-group; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR-group; /NXxrot/entry/instrument/detector-group
detector_1: /NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_channel_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_channel_type-field
detector_faces: /NXoff_geometry/detector_faces-field
detector_group: /NXinstrument/DETECTOR_GROUP-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/detector_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/detector_identifier-field; /NXimage_set/PROCESS/detector_identifier-field; /NXspectrum_set/PROCESS/detector_identifier-field
detector_module: /NXdetector/DETECTOR_MODULE-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number: /NXcylindrical_geometry/detector_number-field; /NXdetector/detector_number-field; /NXtofnpd/entry/INSTRUMENT/detector/detector_number-field; /NXtofnpd/entry/data/detector_number-link; /NXtofraw/entry/data/detector_number-link; /NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time: /NXdetector/detector_readout_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_reference_frameid: /NXcoordinate_system_set/detector_reference_frameID-group; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID-group
detector_type: /NXdetector/detector_type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type-field
detector_type_other: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type_other-field
detector_voltage: /NXdetector/detector_voltage-field
detectorid: /NXem/ENTRY/measurement/em_lab/detectorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID-group
device_information: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information-group; /NXmpes/ENTRY/INSTRUMENT/device_information-group; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/device_information-group
device_path: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/device_path-field
diameter: /NXdetector/diameter-field; /NXenergydispersion/diameter-field; /NXmicrostructure_score_config/ENTRY/deformation/diameter-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/diameter-field; /NXpinhole/diameter-field; /NXwaveplate/diameter-field; /NXxlaueplate/entry/instrument/detector/diameter-field
dielectric_function: /NXdispersion_table/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
diffraction: /NXem_calorimetry/ENTRY/diffraction-group
diffraction_order: /NXgrating/diffraction_order-field
diffraction_space: /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET/diffraction_space-group
diffractometer: /NXinstrument/DIFFRACTOMETER-group
dimensionality: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/dimensionality-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/dimensionality-field; /NXcg_primitive_set/dimensionality-field; /NXcrystal_structure/dimensionality-field; /NXgraph_node_set/dimensionality-field; /NXisocontour/dimensionality-field; /NXmicrostructure/configuration/dimensionality-field; /NXmicrostructure_imm_config/ENTRY/roi/dimensionality-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/dimensionality-field
direction: /NXbeam/TRANSFORMATIONS/DIRECTION-field; /NXshape/direction-field
directionality: /NXgraph_edge_set/directionality-field
discretization: /NXmicrostructure_gragles_config/ENTRY/discretization-group; /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/discretization-field; /NXmicrostructure_imm_config/ENTRY/roi/discretization-field; /NXmicrostructure_score_config/ENTRY/discretization-group; /NXmicrostructure_score_results/ENTRY/discretization-group
disk_chopper: /NXbeam_path/DISK_CHOPPER-group; /NXdirecttof/entry/INSTRUMENT/disk_chopper-group; /NXinstrument/DISK_CHOPPER-group; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
dislocation_density: /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/dislocation_density-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/dislocation_density-field
dislocation_distribution: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution-group
disorientation_angle: /NXrotation_set/disorientation_angle-field
disorientation_axis: /NXrotation_set/disorientation_axis-field
disorientation_quaternion: /NXrotation_set/disorientation_quaternion-field
disorientation_threshold: /NXmicrostructure/configuration/disorientation_threshold-field
dispersion: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/dispersion-field; /NXfiber/dispersion-field
dispersion_function: /NXdispersion/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
dispersion_repeated_parameter: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
dispersion_single_parameter: /NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
dispersion_table: /NXdispersion/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
dispersion_type: /NXdispersive_material/ENTRY/dispersion_type-field; /NXfiber/dispersion_type-field
dispersion_x: /NXdispersive_material/ENTRY/dispersion_x-group
dispersion_y: /NXdispersive_material/ENTRY/dispersion_y-group
dispersion_z: /NXdispersive_material/ENTRY/dispersion_z-group
dispersoid_drag: /NXmicrostructure_score_config/ENTRY/dispersoid_drag-group
distance: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/distance-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/distance-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/distance-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/distance-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/distance-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/distance-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/distance-field; /NXapm_paraprobe_tool_config/surface_distance/distance-field; /NXattenuator/distance-field; /NXbeam/distance-field; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field; /NXdetector/distance-field; /NXdisk_chopper/distance-field; /NXfermi_chopper/distance-field; /NXindirecttof/entry/INSTRUMENT/analyser/distance-field; /NXlauetof/entry/instrument/detector/distance-field; /NXmoderator/distance-field; /NXmonitor/distance-field; /NXmpes/ENTRY/INSTRUMENT/beamTYPE/distance-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXreftof/entry/instrument/chopper/distance-field; /NXreftof/entry/instrument/detector/distance-field; /NXsample/distance-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXsastof/ENTRY/instrument/detector/distance-field; /NXsnsevent/ENTRY/MONITOR/distance-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnsevent/ENTRY/instrument/moderator/distance-field; /NXsnshisto/ENTRY/MONITOR/distance-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/moderator/distance-field; /NXsource/distance-field; /NXspe/ENTRY/data/distance-field; /NXtofnpd/entry/INSTRUMENT/detector/distance-field; /NXtofnpd/entry/MONITOR/distance-field; /NXtofraw/entry/MONITOR/distance-field; /NXtofraw/entry/instrument/detector/distance-field; /NXtofsingle/entry/INSTRUMENT/detector/distance-field; /NXtofsingle/entry/MONITOR/distance-field; /NXtomo/entry/instrument/detector/distance-field; /NXtomophase/entry/instrument/sample/distance-field; /NXxbase/entry/instrument/detector/distance-field; /NXxbase/entry/sample/distance-field; /NXxpcs/entry/instrument/DETECTOR/distance-field
distance_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector: /NXbeam_stop/distance_to_detector-field
distances: /NXtranslation/distances-field
distancing_model: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/distancing_model-field
distortion: /NXprocess/DISTORTION-group; /NXprocess_mpes/DISTORTION-group
distortion_correction: /NXem_calorimetry/ENTRY/distortion_correction-group
distribution: /NXmonochromator/distribution-group; /NXsource/distribution-group; /NXxlaue/entry/instrument/source/distribution-group
divergence: /NXbeam_path/SOURCE/divergence-field
divergence_x: /NXcollimator/divergence_x-field
divergence_x_minus: /NXbending_magnet/divergence_x_minus-field
divergence_x_plus: /NXbending_magnet/divergence_x_plus-field
divergence_y: /NXcollimator/divergence_y-field
divergence_y_minus: /NXbending_magnet/divergence_y_minus-field
divergence_y_plus: /NXbending_magnet/divergence_y_plus-field
dld_wire_names: /NXapm_hit_finding/dld_wire_names-field
doi: /NXapm/ENTRY/CITE/doi-field; /NXcite/doi-field; /NXdispersive_material/ENTRY/REFERENCES/doi-field
domain_identifier: /NXmicrostructure_score_config/ENTRY/solitary_unit/domain_identifier-field
dose_management: /NXoptical_system_em/dose_management-field
downsampled: /NXregion/downsampled-group
dql: /NXcanSAS/ENTRY/DATA/dQl-field
dqw: /NXcanSAS/ENTRY/DATA/dQw-field
drag: /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility/drag-field
drain_current_amperemeter: /NXmanipulator/drain_current_amperemeter-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter-group
drain_current_env: /NXmpes/ENTRY/SAMPLE/drain_current_env-group
drift: /NXpositioner_sts/drift-field
drift_correction_status: /NXpiezo_config_spm/calibration/drift_correction_status-field; /NXpositioner_sts/drift_correction_status-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/drift_correction_status-field
drift_energy: /NXenergydispersion/drift_energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/drift_energy-field
drift_n: /NXpiezo_config_spm/calibration/drift_N-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/drift_N-field
dspacing: /NXcrystal_structure/dspacing-field
duration: /NXarchive/entry/duration-field; /NXentry/duration-field; /NXlog/duration-field; /NXsnsevent/ENTRY/DASlogs/LOG/duration-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnsevent/ENTRY/duration-field; /NXsnshisto/ENTRY/DASlogs/LOG/duration-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnshisto/ENTRY/duration-field; /NXsubentry/duration-field; /NXtofraw/entry/duration-field; /NXtofsingle/entry/duration-field
duty_cycle: /NXgrating/duty_cycle-field
dwell_time: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller/dwell_time-field; /NXscanbox_em/dwell_time-field
dynamic_focus_correction: /NXoptical_system_em/dynamic_focus_correction-field
dynamic_phi_list: /NXxpcs/entry/instrument/masks/dynamic_phi_list-field
dynamic_q_list: /NXxpcs/entry/instrument/masks/dynamic_q_list-field
dynamic_refocusing: /NXoptical_system_em/dynamic_refocusing-field
dynamic_roi_map: /NXxpcs/entry/instrument/masks/dynamic_roi_map-field
ebeam_column: /NXem/ENTRY/measurement/em_lab/ebeam_column-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column-group; /NXem_msr/em_lab/EBEAM_COLUMN-group; /NXevent_data_em/em_lab/EBEAM_COLUMN-group
ebsd: /NXem/ENTRY/roiID/ebsd-group; /NXmicrostructure_mtex_config/path/ebsd-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd-group
ebsd_extensions: /NXmicrostructure_mtex_config/path/ebsd_extensions-field
edge_contact: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/edge_contact-field
edge_distance: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/edge_distance-field
edge_identifier: /NXcg_face_list_data_structure/edge_identifier-field
edge_identifier_offset: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/edge_identifier_offset-field; /NXcg_face_list_data_structure/edge_identifier_offset-field; /NXcg_half_edge_data_structure/edge_identifier_offset-field
edge_length: /NXapm_compositionspace_config/ENTRY/config/voxelization/edge_length-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/edge_length-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/edge_length-field; /NXcg_polygon_set/edge_length-field; /NXcg_polyhedron_set/edge_length-field; /NXcg_tetrahedron_set/edge_length-field; /NXcg_triangle_set/edge_length-field; /NXmicrostructure_gragles_config/ENTRY/discretization/edge_length-field
edge_method: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_method-field
edge_normal: /NXcg_hexahedron_set/edge_normal-group; /NXcg_primitive_set/edge_normal-group
edge_threshold: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_threshold-field
edges: /NXcg_face_list_data_structure/edges-field
edges_are_unique: /NXcg_face_list_data_structure/edges_are_unique-field
eds: /NXem/ENTRY/roiID/eds-group
eels: /NXem/ENTRY/roiID/eels-group
ef: /NXtas/entry/DATA/ef-link; /NXtas/entry/INSTRUMENT/analyser/ef-field
efficiency: /NXbeam_path/GRATING/efficiency-field; /NXdetector/efficiency-group; /NXdetector/efficiency/efficiency-field; /NXmonitor/efficiency-field; /NXpolarizer/efficiency-field
ei: /NXtas/entry/DATA/ei-link; /NXtas/entry/INSTRUMENT/monochromator/ei-field
elapsed_time: /NXcs_profiling_event/elapsed_time-field
electric_field: /NXarchive/entry/sample/electric_field-field; /NXsample/electric_field-field
electrical_conductivity: /NXlab_sample_mounting/ENTRY/electrical_conductivity-field
electrical_field: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field-group
electron_source: /NXebeam_column/electron_source-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source-group
electronanalyser: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
element: /NXelectron_level/element-field
elementid: /NXapm_compositionspace_results/ENTRY/voxelization/elementID-group
ellipsoid_set: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set-group
ellipsometer_type: /NXellipsometry/ENTRY/INSTRUMENT/ellipsometer_type-field
ellipsometer_type_other: /NXellipsometry/ENTRY/INSTRUMENT/ellipsometer_type_other-field
ellipsometry_experiment_type: /NXellipsometry/ENTRY/ellipsometry_experiment_type-field
ellipsometry_experiment_type_other: /NXellipsometry/ENTRY/ellipsometry_experiment_type_other-field
ellipticity: /NXdata_mpes/ellipticity-field; /NXdata_mpes_detector/ellipticity-field
ellipticity_calibration: /NXmpes/ENTRY/PROCESS_MPES/ellipticity_calibration-group; /NXprocess_mpes/ellipticity_calibration-group
em_lab: /NXem/ENTRY/measurement/em_lab-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab-group; /NXem_msr/em_lab-group; /NXevent_data_em/em_lab-group
email: /NXem/ENTRY/userID/email-field; /NXsensor_scan/ENTRY/USER/email-field; /NXtransmission/ENTRY/operator/email-field; /NXuser/email-field
embedding_medium: /NXlab_sample_mounting/ENTRY/embedding_medium-field
emission_current: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/emission_current-field; /NXsource/emission_current-field
emittance_x: /NXsource/emittance_x-field
emittance_y: /NXsource/emittance_y-field
emitter_material: /NXebeam_column/electron_source/emitter_material-field
emitter_type: /NXebeam_column/electron_source/emitter_type-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/emitter_type-field; /NXibeam_column/ion_source/emitter_type-field
en: /NXsqom/ENTRY/DATA/en-field; /NXtas/entry/DATA/en-link; /NXtas/entry/SAMPLE/en-field
end: /NXxrd_pan/ENTRY/experiment_config/omega/end-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/end-field
end_settling_time: /NXbias_spectroscopy/BIAS_SWEEP/end_settling_time-field; /NXiv_bias/end_settling_time-field
end_time: /NXactivity/end_time-field; /NXapm/ENTRY/end_time-field; /NXapm_compositionspace_results/ENTRY/profiling/end_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tool_common/profiling/end_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/end_time-field; /NXarchive/entry/end_time-field; /NXcalibration/end_time-field; /NXchemical_process/end_time-field; /NXcs_profiling/end_time-field; /NXcs_profiling_event/end_time-field; /NXcxi_ptycho/entry_1/end_time-field; /NXem/ENTRY/end_time-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/end_time-field; /NXem_calorimetry/ENTRY/profiling/end_time-field; /NXem_calorimetry/ENTRY/time_synchronization/end_time-field; /NXentry/end_time-field; /NXevent_data_apm/end_time-field; /NXevent_data_em/end_time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/end_time-field; /NXlab_sample_mounting/ENTRY/end_time-field; /NXmicrostructure_gragles_config/ENTRY/end_time-field; /NXmicrostructure_gragles_results/ENTRY/end_time-field; /NXmicrostructure_imm_results/ENTRY/end_time-field; /NXmicrostructure_kanapy_results/ENTRY/end_time-field; /NXmicrostructure_score_config/ENTRY/end_time-field; /NXmicrostructure_score_results/ENTRY/end_time-field; /NXmonitor/end_time-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/end_time-field; /NXmpes/ENTRY/end_time-field; /NXmx/ENTRY/end_time-field; /NXoptical_spectroscopy/ENTRY/end_time-field; /NXphysical_process/end_time-field; /NXrefscan/entry/end_time-field; /NXreftof/entry/end_time-field; /NXsas/ENTRY/end_time-field; /NXscan/ENTRY/end_time-field; /NXsensor_scan/ENTRY/end_time-field; /NXsnsevent/ENTRY/end_time-field; /NXsnshisto/ENTRY/end_time-field; /NXstxm/ENTRY/end_time-field; /NXsubentry/end_time-field; /NXtomo/entry/end_time-field; /NXtomophase/entry/end_time-field; /NXxpcs/entry/end_time-field
end_time_estimated: /NXmx/ENTRY/end_time_estimated-field
endnote: /NXcite/endnote-field
energies: /NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
energy: /NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field; /NXdata_mpes/energy-field; /NXdata_mpes_detector/energy-field; /NXdirecttof/entry/INSTRUMENT/disk_chopper/energy-field; /NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field; /NXdispersion_table/energy-field; /NXem_eds/indexing/PEAK/ION/energy-field; /NXfermi_chopper/energy-field; /NXfluo/entry/INSTRUMENT/fluorescence/energy-field; /NXfluo/entry/data/energy-link; /NXindirecttof/entry/INSTRUMENT/analyser/energy-field; /NXinsertion_device/energy-field; /NXmicrostructure/quadruple_junction/energy-field; /NXmonochromator/energy-field; /NXmpes/ENTRY/data/energy-field; /NXmpes_arpes/ENTRY/data/energy-field; /NXsource/energy-field; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field; /NXspe/ENTRY/data/energy-field; /NXstxm/ENTRY/DATA/energy-field; /NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxas/ENTRY/DATA/energy-link; /NXxas/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxasproc/ENTRY/DATA/energy-field; /NXxps/ENTRY/data/energy-field
energy_calibration: /NXmpes/ENTRY/PROCESS_MPES/energy_calibration-group; /NXprocess_mpes/energy_calibration-group
energy_dispersion: /NXmonochromator/energy_dispersion-field
energy_error: /NXmonochromator/energy_error-field
energy_errors: /NXmonochromator/energy_errors-field
energy_identifier: /NXdispersion_function/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_identifier-field
energy_interval: /NXenergydispersion/energy_interval-field
energy_max: /NXdispersion_function/energy_max-field
energy_min: /NXdispersion_function/energy_min-field
energy_range: /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/energy_range-field; /NXem_eds/indexing/IMAGE_SET/energy_range-field; /NXem_eds/indexing/PEAK/ION/energy_range-field
energy_referencing: /NXmpes/ENTRY/PROCESS_MPES/energy_referencing-group; /NXprocess_mpes/energy_referencing-group; /NXxps/ENTRY/PROCESS_MPES/energy_referencing-group
energy_resolution: /NXelectronanalyser/energy_resolution-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-group; /NXmpes/ENTRY/INSTRUMENT/energy_resolution-group
energy_scan_mode: /NXenergydispersion/energy_scan_mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
energy_transfer: /NXbeam/energy_transfer-field
energy_unit: /NXdispersion_function/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_unit-field
energydispersion: /NXelectronanalyser/ENERGYDISPERSION-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
entering: /NXreflections/entering-field
entrance_slit: /NXmonochromator/entrance_slit-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
entrance_slit_setting: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
entrance_slit_shape: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
entrance_slit_size: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
entry: /NXafm/ENTRY-group; /NXapm/ENTRY-group; /NXapm_compositionspace_config/ENTRY-group; /NXapm_compositionspace_results/ENTRY-group; /NXapm_paraprobe_clusterer_config/ENTRY-group; /NXapm_paraprobe_clusterer_results/ENTRY-group; /NXapm_paraprobe_distancer_config/ENTRY-group; /NXapm_paraprobe_distancer_results/ENTRY-group; /NXapm_paraprobe_intersector_config/ENTRY-group; /NXapm_paraprobe_intersector_results/ENTRY-group; /NXapm_paraprobe_nanochem_config/ENTRY-group; /NXapm_paraprobe_nanochem_results/ENTRY-group; /NXapm_paraprobe_ranger_config/ENTRY-group; /NXapm_paraprobe_ranger_results/ENTRY-group; /NXapm_paraprobe_selector_config/ENTRY-group; /NXapm_paraprobe_selector_results/ENTRY-group; /NXapm_paraprobe_spatstat_config/ENTRY-group; /NXapm_paraprobe_spatstat_results/ENTRY-group; /NXapm_paraprobe_surfacer_config/ENTRY-group; /NXapm_paraprobe_surfacer_results/ENTRY-group; /NXapm_paraprobe_tessellator_config/ENTRY-group; /NXapm_paraprobe_tessellator_results/ENTRY-group; /NXapm_paraprobe_transcoder_config/ENTRY-group; /NXapm_paraprobe_transcoder_results/ENTRY-group; /NXarchive/entry-group; /NXarpes/ENTRY-group; /NXcanSAS/ENTRY-group; /NXdirecttof/entry-group; /NXdispersive_material/ENTRY-group; /NXellipsometry/ENTRY-group; /NXem/ENTRY-group; /NXem_calorimetry/ENTRY-group; /NXfluo/entry-group; /NXindirecttof/entry-group; /NXiqproc/ENTRY-group; /NXiv_temp/ENTRY-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY-group; /NXlab_sample_mounting/ENTRY-group; /NXlauetof/entry-group; /NXmicrostructure_gragles_config/ENTRY-group; /NXmicrostructure_gragles_results/ENTRY-group; /NXmicrostructure_imm_config/ENTRY-group; /NXmicrostructure_imm_results/ENTRY-group; /NXmicrostructure_kanapy_results/ENTRY-group; /NXmicrostructure_score_config/ENTRY-group; /NXmicrostructure_score_results/ENTRY-group; /NXmonopd/entry-group; /NXmpes/ENTRY-group; /NXmpes_arpes/ENTRY-group; /NXmx/ENTRY-group; /NXopt_window/ENTRY-group; /NXoptical_spectroscopy/ENTRY-group; /NXraman/ENTRY-group; /NXrefscan/entry-group; /NXreftof/entry-group; /NXroot/ENTRY-group; /NXsas/ENTRY-group; /NXsastof/ENTRY-group; /NXscan/ENTRY-group; /NXsensor_scan/ENTRY-group; /NXsnsevent/ENTRY-group; /NXsnshisto/ENTRY-group; /NXspe/ENTRY-group; /NXspm/ENTRY-group; /NXsqom/ENTRY-group; /NXstm/ENTRY-group; /NXsts/ENTRY-group; /NXstxm/ENTRY-group; /NXtas/entry-group; /NXtofnpd/entry-group; /NXtofraw/entry-group; /NXtofsingle/entry-group; /NXtomo/entry-group; /NXtomophase/entry-group; /NXtomoproc/entry-group; /NXtransmission/ENTRY-group; /NXxas/ENTRY-group; /NXxasproc/ENTRY-group; /NXxbase/entry-group; /NXxeuler/entry-group; /NXxkappa/entry-group; /NXxlaue/entry-group; /NXxlaueplate/entry-group; /NXxnb/entry-group; /NXxpcs/entry-group; /NXxps/ENTRY-group; /NXxrd/ENTRY-group; /NXxrd_pan/ENTRY-group; /NXxrot/entry-group
entry_1: /NXcxi_ptycho/entry_1-group
entry_identifier: /NXarchive/entry/entry_identifier-field; /NXentry/entry_identifier-group; /NXsnsevent/ENTRY/entry_identifier-field; /NXsnshisto/ENTRY/entry_identifier-field; /NXsubentry/entry_identifier-group; /NXxpcs/entry/entry_identifier-field
entry_identifier_uuid: /NXentry/entry_identifier_uuid-group; /NXxpcs/entry/entry_identifier_uuid-field
envelope: /NXfit/data/envelope-field; /NXxps/ENTRY/FIT/data/envelope-field
environment: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group; /NXmicrostructure_gragles_config/ENTRY/environment-group; /NXmicrostructure_gragles_results/ENTRY/environment-group; /NXmicrostructure_imm_results/ENTRY/environment-group; /NXmicrostructure_kanapy_results/ENTRY/environment-group; /NXmicrostructure_score_config/ENTRY/environment-group; /NXmicrostructure_score_results/ENTRY/environment-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT-group; /NXsample/ENVIRONMENT-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
eps: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/eps-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/eps-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/eps-field; /NXmicrostructure_mtex_config/numerics/eps-field
epsilon: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/epsilon-field
error: /NXspe/ENTRY/data/error-field
error_function: /NXfit/error_function-group; /NXxps/ENTRY/FIT/error_function-group
errors: /NXdata/errors-field
euler: /NXmicrostructure_odf/sampling/euler-field
euler_angle: /NXmicrostructure_mtex_config/conventions/euler_angle-field
euler_angle_convention: /NXcoordinate_system_set/euler_angle_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/euler_angle_convention-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/euler_angle_convention-field
evaporation_control: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control/evaporation_control-field; /NXevent_data_apm/instrument/control/evaporation_control-field
evaporation_id_filter: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter-group
evaporation_identifier: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier-field
evaporation_identifier_offset: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier_offset-field
even_layer_density: /NXmirror/even_layer_density-field
even_layer_material: /NXmirror/even_layer_material-field
event_data: /NXinstrument/EVENT_DATA-group; /NXsnsevent/ENTRY/EVENT_DATA-group
event_data_apm: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm-group; /NXevent_data_apm_set/EVENT_DATA_APM-group
event_data_apm_set: /NXapm/ENTRY/measurement/event_data_apm_set-group; /NXapm_msr/instrument/EVENT_DATA_APM_SET-group
event_data_em: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM-group; /NXevent_data_em_set/EVENT_DATA_EM-group
event_data_em_set: /NXem/ENTRY/measurement/event_data_em_set-group; /NXem_msr/EVENT_DATA_EM_SET-group
event_id: /NXevent_data/event_id-field
event_identifier: /NXevent_data_em/event_identifier-field
event_index: /NXevent_data/event_index-field; /NXsnsevent/ENTRY/EVENT_DATA/event_index-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id: /NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight: /NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset: /NXevent_data/event_time_offset-field
event_time_zero: /NXevent_data/event_time_zero-field
event_type: /NXevent_data_em/event_type-field
example: /NXmicrostructure_mtex_config/path/example-field
excitation_wavelength: /NXbeam_path/SOURCE/excitation_wavelength-field
exit_slit: /NXmonochromator/exit_slit-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment_alias: /NXapm/ENTRY/experiment_alias-field; /NXem/ENTRY/experiment_alias-field
experiment_config: /NXxrd_pan/ENTRY/experiment_config-group
experiment_description: /NXapm/ENTRY/experiment_description-field; /NXarchive/entry/experiment_description-field; /NXem/ENTRY/experiment_description-field; /NXentry/experiment_description-field; /NXoptical_spectroscopy/ENTRY/experiment_description-field; /NXsensor_scan/ENTRY/experiment_description-field; /NXspm/ENTRY/experiment_description-field; /NXsubentry/experiment_description-field; /NXtransmission/ENTRY/experiment_description-field
experiment_documentation: /NXentry/experiment_documentation-group; /NXsubentry/experiment_documentation-group
experiment_end_date: /NXentry/experiment_end_date-field
experiment_facility: /NXentry/experiment_facility-field
experiment_identifier: /NXapm/ENTRY/experiment_identifier-group; /NXarchive/entry/experiment_identifier-field; /NXem/ENTRY/experiment_identifier-group; /NXentry/experiment_identifier-group; /NXoptical_spectroscopy/ENTRY/experiment_identifier-group; /NXsensor_scan/ENTRY/experiment_identifier-group; /NXsnsevent/ENTRY/experiment_identifier-field; /NXsnshisto/ENTRY/experiment_identifier-field; /NXspm/ENTRY/experiment_identifier-group; /NXsubentry/experiment_identifier-group; /NXtransmission/ENTRY/experiment_identifier-group
experiment_institution: /NXentry/experiment_institution-field
experiment_instrument: /NXafm/ENTRY/experiment_instrument-group; /NXspm/ENTRY/experiment_instrument-group; /NXstm/ENTRY/experiment_instrument-group
experiment_laboratory: /NXentry/experiment_laboratory-field
experiment_location: /NXentry/experiment_location-field
experiment_result: /NXxrd_pan/ENTRY/experiment_result-group
experiment_start_date: /NXentry/experiment_start_date-field
experiment_sub_type: /NXoptical_spectroscopy/ENTRY/experiment_sub_type-field
experiment_technique: /NXspm/ENTRY/experiment_technique-field
experiment_type: /NXellipsometry/ENTRY/experiment_type-field; /NXoptical_spectroscopy/ENTRY/experiment_type-field; /NXraman/ENTRY/experiment_type-field
experiment_type_other: /NXoptical_spectroscopy/ENTRY/experiment_type_other-field
experiments: /NXreflections/experiments-field
exposure_time: /NXcorrector_cs/tableauID/exposure_time-field
extent: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/extent-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/extent-field; /NXbeam/extent-field; /NXcg_grid/extent-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/extent-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/extent-field; /NXmicrostructure_score_config/ENTRY/deformation/extent-field; /NXmicrostructure_score_config/ENTRY/discretization/grid/extent-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/extent-field; /NXmpes/ENTRY/INSTRUMENT/beamTYPE/extent-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/extent-field; /NXxpcs/entry/instrument/incident_beam/extent-field
external_adc: /NXsample/external_ADC-group
external_axis: /NXdata_mpes_detector/external_AXIS-field
external_dac: /NXsample/external_DAC-field
external_field_brief: /NXsensor/external_field_brief-field; /NXsensor_sts/external_field_brief-field
external_field_full: /NXsensor/external_field_full-group; /NXsensor_sts/external_field_full-group
external_material: /NXguide/external_material-field; /NXmirror/external_material-field
extinction_ratio: /NXpolarizer_opt/extinction_ratio-field
extraction_voltage: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/extraction_voltage-field
extractor_current: /NXcollectioncolumn/extractor_current-field
extractor_voltage: /NXcollectioncolumn/extractor_voltage-field
extrema: /NXmicrostructure_odf/kth_extrema/extrema-field
fabrication: /NXactuator/FABRICATION-group; /NXapm/ENTRY/measurement/instrument/fabrication-group; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication-group; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication-group; /NXapm/ENTRY/measurement/instrument/pulser/fabrication-group; /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication-group; /NXapm/ENTRY/measurement/instrument/reflectron/fabrication-group; /NXapm_msr/instrument/FABRICATION-group; /NXchamber/FABRICATION-group; /NXcollectioncolumn/FABRICATION-group; /NXcomponent/FABRICATION-group; /NXdeflector/FABRICATION-group; /NXdetector/FABRICATION-group; /NXebeam_column/FABRICATION-group; /NXebeam_column/electron_source/FABRICATION-group; /NXelectronanalyser/FABRICATION-group; /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication-group; /NXem/ENTRY/measurement/em_lab/detectorID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication-group; /NXem/ENTRY/measurement/em_lab/fabrication-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication-group; /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication-group; /NXem_msr/em_lab/FABRICATION-group; /NXenergydispersion/FABRICATION-group; /NXfresnel_zone_plate/fabrication-field; /NXinstrument/FABRICATION-group; /NXmanipulator/FABRICATION-group; /NXpulser_apm/FABRICATION-group; /NXpulser_apm/SOURCE/FABRICATION-group; /NXpump/FABRICATION-group; /NXreflectron/FABRICATION-group; /NXsample/FABRICATION-group; /NXsample_component/FABRICATION-group; /NXsensor/FABRICATION-group; /NXsource/FABRICATION-group
face_area: /NXcg_hexahedron_set/face_area-field; /NXcg_polyhedron_set/face_area-field; /NXcg_tetrahedron_set/face_area-field
face_half_edge: /NXcg_half_edge_data_structure/face_half_edge-field
face_identifier: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier-field; /NXcg_face_list_data_structure/face_identifier-field
face_identifier_offset: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/face_identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/face_identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/face_identifier_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/face_identifier_offset-field; /NXcg_face_list_data_structure/face_identifier_offset-field; /NXcg_half_edge_data_structure/face_identifier_offset-field
face_normal: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal-field; /NXcg_hexahedron_set/face_normal-group; /NXcg_primitive_set/face_normal-group
face_normal_orientation: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal_orientation-field
face_normals: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/face_normals-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/face_normals-field
faces: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/faces-field; /NXcg_face_list_data_structure/faces-field; /NXoff_geometry/faces-field
faces_are_unique: /NXcg_face_list_data_structure/faces_are_unique-field
facet_normals: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/facet_normals-field
facility_user_id: /NXarchive/entry/user/facility_user_id-field; /NXsnsevent/ENTRY/USER/facility_user_id-field; /NXsnshisto/ENTRY/USER/facility_user_id-field; /NXuser/facility_user_id-field
farthest_corner: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/farthest_corner-field
fast_axes: /NXelectronanalyser/fast_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction: /NXdetector_module/fast_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number: /NXuser/fax_number-field
feature: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature-group; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE-group
feature_distance: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/feature_distance-field
feature_identifier: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_identifier-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_identifier-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_identifier-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/feature_identifier-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_identifier-field
feature_member_count: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_member_count-field
feature_type: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_type-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_type-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type-field
feature_type_dict_keyword: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_keyword-field
feature_type_dict_value: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_value-field
featureid: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID-group; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID-group
features: /NXentry/features-field
feedback: /NXpositioner/actuator/feedback-group
fermi_chopper: /NXdirecttof/entry/INSTRUMENT/fermi_chopper-group; /NXinstrument/FERMI_CHOPPER-group; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
fft_accuracy: /NXmicrostructure_mtex_config/numerics/fft_accuracy-field
fiber: /NXbeam_path/FIBER-group
field_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view: /NXapm/ENTRY/atom_probe/reconstruction/field_of_view-field; /NXapm_reconstruction/field_of_view-field; /NXoptical_system_em/field_of_view-field
fieldname_errors: /NXdata/FIELDNAME_errors-field
figure_data: /NXgrating/figure_data-group; /NXmirror/figure_data-group
figure_of_merit: /NXspindispersion/figure_of_merit-field
figure_of_meritmetric: /NXfit/figure_of_meritMETRIC-field; /NXxps/ENTRY/FIT/figure_of_meritMETRIC-field
figure_size: /NXmicrostructure_mtex_config/plotting/figure_size-field
filament_current: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/filament_current-field; /NXsource/filament_current-field
file: /NXserialized/file-group
file_name: /NXnote/file_name-field
filenames: /NXiqproc/ENTRY/reduction/input/filenames-field; /NXsqom/ENTRY/reduction/input/filenames-field
filter: /NXinstrument/FILTER-group
filter_characteristics: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics-group
filter_mechanism: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/filter_mechanism-field
filter_number: /NXbeam_path/filter_NUMBER-group
filter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_type-field
final_beam_divergence: /NXbeam/final_beam_divergence-field
final_energy: /NXbeam/final_energy-field
final_polarization: /NXbeam/final_polarization-field
final_polarization_stokes: /NXbeam/final_polarization_stokes-field
final_wavelength: /NXbeam/final_wavelength-field
final_wavelength_spread: /NXbeam/final_wavelength_spread-field
final_z: /NXbias_spectroscopy/BIAS_SWEEP/final_z-field; /NXpositioner_sts/final_z-field
first_settling_time: /NXbias_spectroscopy/BIAS_SWEEP/first_settling_time-field
fit: /NXxps/ENTRY/FIT-group
fit_function: /NXcalibration/fit_function-field
fit_parameter: /NXfit_function/FIT_PARAMETER-group
fixed_energy: /NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/fixed_revolutions-field
fixed_slit: /NXbeam_path/MONOCHROMATOR/SLIT/fixed_slit-field
flags: /NXreflections/flags-field
flatfield: /NXdetector/flatfield-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied: /NXdetector/flatfield_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error: /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors: /NXdetector/flatfield_errors-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path: /NXapm/ENTRY/measurement/instrument/analysis_chamber/flight_path-field
flip_current: /NXflipper/flip_current-field
flip_turns: /NXflipper/flip_turns-field
flipper: /NXinstrument/FLIPPER-group
flood_gun: /NXmpes/ENTRY/INSTRUMENT/flood_gun-group; /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun-group
flood_gun_current_env: /NXmpes/ENTRY/SAMPLE/flood_gun_current_env-group
fluence: /NXbeam/fluence-field
fluorescence: /NXfluo/entry/INSTRUMENT/fluorescence-group
flux: /NXbeam/flux-field; /NXibeam_column/ion_source/flux-field; /NXmx/ENTRY/INSTRUMENT/BEAM/flux-field; /NXsource/flux-field
flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time: /NXscanbox_em/flyback_time-field
focal_length: /NXlens_opt/focal_length-field; /NXoptical_system_em/focal_length-field
focal_size: /NXcapillary/focal_size-field
focus_parameters: /NXfresnel_zone_plate/focus_parameters-field
focus_type: /NXxraylens/focus_type-field
focussing_probes: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-group
font_size: /NXmicrostructure_mtex_config/plotting/font_size-field
force: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
force_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
formula: /NXdispersion_function/formula-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field; /NXfit/error_function/formula-field; /NXfit/global_fit_function/formula-field; /NXfit_function/formula-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/formula-field; /NXxps/ENTRY/FIT/error_function/formula-field; /NXxps/ENTRY/FIT/global_fit_function/formula-field; /NXxps/ENTRY/FIT/peakPEAK/function/formula-field
formula_symbol: /NXresolution/formula_SYMBOL-field
forward_speed: /NXscan_control/linear_SCAN/forward_speed-field; /NXscan_control/snake_SCAN/forward_speed-field; /NXscan_control/traj_SCAN/forward_speed-field
forward_speed_bias: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep/forward_speed_bias-field
forward_speed_n: /NXscan_control/mesh_SCAN/forward_speed_N-field; /NXscan_control/spiral_SCAN/forward_speed_N-field
frame_average: /NXxpcs/entry/data/frame_average-field
frame_start_number: /NXdetector/frame_start_number-field; /NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum: /NXxpcs/entry/data/frame_sum-field
frame_time: /NXdetector/frame_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field; /NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency: /NXcollimator/frequency-field; /NXsnsevent/ENTRY/instrument/SNS/frequency-field; /NXsnshisto/ENTRY/instrument/SNS/frequency-field; /NXsource/frequency-field
frequency_bandwidth: /NXcantilever_spm/cantilever_oscillator/frequency_bandwidth-field
frequency_cutoff: /NXcantilever_spm/cantilever_oscillator/frequency_cutoff-field
frequency_demodulation_bandwidth: /NXlockin/frequency_demodulation_bandwidth-field
frequency_harmonic: /NXcantilever_spm/cantilever_oscillator/frequency_harmonic-field
frequency_log: /NXcollimator/frequency_log-group
frequency_resolution: /NXbeam_path/DISK_CHOPPER/frequency_resolution-field
frequency_shift: /NXcantilever_spm/cantilever_oscillator/frequency_shift-field
frog_delays: /NXbeam/frog_delays-field
frog_frequencies: /NXbeam/frog_frequencies-field
frog_trace: /NXbeam/frog_trace-field
function: /NXfit_background/function-group; /NXpeak/function-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function-group; /NXxps/ENTRY/FIT/peakPEAK/function-group
g2: /NXxpcs/entry/data/g2-field
g2_derr: /NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func: /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials: /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func: /NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials: /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized: /NXxpcs/entry/data/G2_unnormalized-field
g_voltage_constant: /NXpiezoelectric_material/G_voltage_constant-field
gain: /NXcapillary/gain-group; /NXcircuit/gain-field; /NXtransmission/ENTRY/instrument/DETECTOR/gain-field
gain_setting: /NXdetector/gain_setting-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gamma: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/gamma-field
gap: /NXinsertion_device/gap-field
gas: /NXxraylens/gas-field
gas_pressure: /NXdetector/gas_pressure-field; /NXsource/gas_pressure-field; /NXxraylens/gas_pressure-field
gas_pressure_env: /NXmpes/ENTRY/SAMPLE/gas_pressure_env-group
gaussian_mixture: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/gaussian_mixture-group
generating_help_mode: /NXmicrostructure_mtex_config/miscellaneous/generating_help_mode-field
generic_beam_sample_angle_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE-group
geometries: /NXmpes/ENTRY/geometries-group; /NXmpes_arpes/ENTRY/geometries-group; /NXxps/ENTRY/geometries-group
geometry: /NXaperture/GEOMETRY-group; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/geometry-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/geometry-field; /NXbeam_path/ATTENUATOR/GEOMETRY-group; /NXbeam_stop/GEOMETRY-group; /NXbending_magnet/GEOMETRY-group; /NXcollimator/GEOMETRY-group; /NXcrystal/GEOMETRY-group; /NXcsg/geometry-field; /NXdetector/GEOMETRY-group; /NXdisk_chopper/GEOMETRY-group; /NXfermi_chopper/GEOMETRY-group; /NXfilter/GEOMETRY-group; /NXguide/GEOMETRY-group; /NXinsertion_device/GEOMETRY-group; /NXmicrostructure_gragles_config/ENTRY/sampling/geometry-field; /NXmirror/GEOMETRY-group; /NXmoderator/GEOMETRY-group; /NXmonitor/GEOMETRY-group; /NXmonochromator/geometry-group; /NXorientation/GEOMETRY-group; /NXsample/geometry-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group; /NXsastof/ENTRY/instrument/collimator/geometry-group; /NXsensor/geometry-group; /NXsensor_sts/geometry-group; /NXsource/geometry-group; /NXtranslation/geometry-group; /NXvelocity_selector/geometry-group
geometry_1: /NXcxi_ptycho/sample_1/geometry_1-group
getter_pump: /NXapm_msr/instrument/getter_pump-group
glass_transition_temperature: /NXpiezoelectric_material/glass_transition_temperature-field
global_fit_function: /NXfit/global_fit_function-group; /NXxps/ENTRY/FIT/global_fit_function-group
gnomonic_reference_frame: /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame-group; /NXem_ebsd/gnomonic_reference_frame-group
goniometer_x: /NXxrd_pan/ENTRY/experiment_config/goniometer_x-field
goniometer_y: /NXxrd_pan/ENTRY/experiment_config/goniometer_y-field
goniometer_z: /NXxrd_pan/ENTRY/experiment_config/goniometer_z-field
gradient: /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/gradient-field
gradient_guide_magnitude: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
gradient_guide_projection: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_projection-field
grain_boundary_energy: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy-group
grain_boundary_mobility: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility-group; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility-group
grain_diameter: /NXapm/ENTRY/sample/grain_diameter-field
grain_diameter_error: /NXapm/ENTRY/sample/grain_diameter_error-field
grain_identifier: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/grain_identifier-field
grain_shape: /NXmicrostructure_imm_config/ENTRY/roi/grain_shape-field
grating: /NXbeam_path/GRATING-group; /NXbeam_path/MONOCHROMATOR/GRATING-group; /NXmonochromator/GRATING-group; /NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
grating_wavelength_max: /NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_max-field
grating_wavelength_min: /NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_min-field
grid: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid-group; /NXcg_marching_cubes/grid-group; /NXdelocalization/grid-group; /NXisocontour/grid-group; /NXmicrostructure_gragles_config/ENTRY/discretization/grid-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/grid-group; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid-group; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid-group; /NXmicrostructure_score_config/ENTRY/discretization/grid-group; /NXmicrostructure_score_results/ENTRY/discretization/grid-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid-group
grid_coarsement: /NXmicrostructure_gragles_config/ENTRY/grid_coarsement-group
grid_resolution: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/grid_resolution-field
grinding_machine: /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
grinding_step: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
grooves: /NXbeam_path/GRATING/grooves-field
group: /NXbeam_device/group-field
group_identifier: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/group_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/group_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/group_identifier-field; /NXimage_set/stack_1d/group_identifier-field; /NXimage_set/stack_2d/group_identifier-field; /NXimage_set/stack_3d/group_identifier-field; /NXspectrum_set/stack_0d/group_identifier-field; /NXspectrum_set/stack_2d/group_identifier-field; /NXspectrum_set/stack_3d/group_identifier-field
group_index: /NXdetector_group/group_index-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_names: /NXdetector_group/group_names-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent: /NXdetector_group/group_parent-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type: /NXdetector_group/group_type-field
guide: /NXinstrument/GUIDE-group
guide_current: /NXflipper/guide_current-field
guide_turns: /NXflipper/guide_turns-field
h: /NXreflections/h-field
hagb_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_enthalpy-field
hagb_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_pre_factor-field
half_angle_interval: /NXem/ENTRY/roiID/imaging/IMAGE_SET/half_angle_interval-field; /NXem_img/IMAGE_SET/half_angle_interval-field
half_axes_radii: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXcg_ellipsoid_set/half_axes_radii-field
half_axes_radius: /NXcg_ellipsoid_set/half_axes_radius-field
half_edge_incident_face: /NXcg_half_edge_data_structure/half_edge_incident_face-field
half_edge_next: /NXcg_half_edge_data_structure/half_edge_next-field
half_edge_prev: /NXcg_half_edge_data_structure/half_edge_prev-field
half_edge_twin: /NXcg_half_edge_data_structure/half_edge_twin-field
half_edge_vertex_origin: /NXcg_half_edge_data_structure/half_edge_vertex_origin-field
halfwidth: /NXmicrostructure_pf/configuration/halfwidth-field
halo_region: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/halo_region-field
handedness: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXcoordinate_system/handedness-field; /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/handedness-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/handedness-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/handedness-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field; /NXxps/ENTRY/geometries/xps_coordinate_system/handedness-field
hardware: /NXamplifier/hardware-group; /NXcircuit/hardware-group; /NXlockin/hardware-group; /NXspm/ENTRY/experiment_instrument/hardware-group
harmonic: /NXinsertion_device/harmonic-field
harmonic_order_n: /NXlockin/harmonic_order_N-field
has_cell_edge_detection: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_edge_detection-field
has_cell_geometry: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_geometry-field
has_cell_neighbors: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_neighbors-field
has_cell_volume: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_volume-field
has_closure: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_closure-field
has_current_to_next_links: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_current_to_next_links-field
has_exterior_facets: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_exterior_facets-field
has_interior_tetrahedra: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_interior_tetrahedra-field
has_next_to_current_links: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_next_to_current_links-field
has_object: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object-field
has_object_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_edge_contact-field
has_object_geometry: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_geometry-field
has_object_ions: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_ions-field
has_object_obb: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_obb-field
has_object_properties: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_properties-field
has_object_proxigram: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram-field
has_object_proxigram_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram_edge_contact-field
has_proxy: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy-field
has_proxy_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_edge_contact-field
has_proxy_geometry: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_geometry-field
has_proxy_ions: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_ions-field
has_proxy_obb: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_obb-field
has_proxy_properties: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_properties-field
has_scalar_fields: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/has_scalar_fields-field
has_triangle_soup: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_triangle_soup-field
hdbscan: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan-group
heat_treatment_quenching_rate: /NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
heat_treatment_quenching_rate_error: /NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
heat_treatment_temperature: /NXapm/ENTRY/sample/heat_treatment_temperature-field
heat_treatment_temperature_error: /NXapm/ENTRY/sample/heat_treatment_temperature_error-field
heater: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater-group
heater_power: /NXmanipulator/sample_heater/heater_power-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/heater_power-field
heater_power_log: /NXmanipulator/sample_heater/heater_power_log-group
height: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/height-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/height-field; /NXcg_cylinder_set/height-field; /NXcg_hexahedron_set/height-field; /NXfermi_chopper/height-field; /NXvelocity_selector/height-field
height_piezo_sensor: /NXafm/ENTRY/experiment_instrument/height_piezo_sensor-group; /NXafm/ENTRY/experiment_instrument/scan_environment/height_piezo_sensor-group
hexahedra: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra-group; /NXcg_hexahedron_set/hexahedra-group
hexahedron: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron-group
hexahedron_half_edgeid: /NXcg_hexahedron_set/hexahedron_half_edgeID-group
hexahedron_set: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set-group
hexahedronid: /NXcg_hexahedron_set/hexahedronID-group
hi_pass: /NXamplifier/hi_pass-field
hi_pass_n: /NXlockin/hi_pass_N-field
high_throughput_method: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/high_throughput_method-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/high_throughput_method-field
high_trip_value: /NXsensor/high_trip_value-field; /NXsensor_sts/high_trip_value-field
history: /NXinstrument/HISTORY-group; /NXmpes/ENTRY/INSTRUMENT/history-group; /NXmpes/ENTRY/SAMPLE/history-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/history-group; /NXsample/history-group; /NXsample_component/history-group; /NXsensor_scan/ENTRY/SAMPLE/HISTORY-group; /NXspm/ENTRY/SAMPLE/history-group
hit_filter: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter-group
hit_finding: /NXapm/ENTRY/atom_probe/hit_finding-group
hit_multiplicity: /NXapm/ENTRY/atom_probe/hit_finding/hit_multiplicity-field; /NXapm_hit_finding/hit_multiplicity-field
hit_multiplicity_filter: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter-group
hit_positions: /NXapm/ENTRY/atom_probe/hit_finding/hit_positions-field; /NXapm_hit_finding/hit_positions-field
hit_quality: /NXapm/ENTRY/atom_probe/hit_finding/hit_quality-field; /NXapm_hit_finding/hit_quality-field
hit_quality_identifier: /NXapm/ENTRY/atom_probe/hit_finding/hit_quality_identifier-field; /NXapm_hit_finding/hit_quality_identifier-field
hit_quality_types: /NXapm/ENTRY/atom_probe/hit_finding/hit_quality_types-field; /NXapm_hit_finding/hit_quality_types-field
hit_spatial_filtering: /NXapm/ENTRY/atom_probe/hit_spatial_filtering-group
hit_test: /NXmicrostructure_mtex_config/plotting/hit_test-field
holder: /NXsnsevent/ENTRY/sample/holder-field; /NXsnshisto/ENTRY/sample/holder-field
hp_filter_order_n: /NXlockin/hp_filter_order_N-field
hv_gain_n: /NXpiezo_config_spm/calibration/hv_gain_N-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/hv_gain_N-field
i: /NXcanSAS/ENTRY/DATA/I-field
i_gain: /NXpositioner_sts/i_gain-field
ibeam_column: /NXem/ENTRY/measurement/em_lab/ibeam_column-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column-group; /NXem_msr/em_lab/IBEAM_COLUMN-group; /NXevent_data_em/em_lab/IBEAM_COLUMN-group
ic_opt: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt-group; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt-group
id: /NXreflections/id-field
identifier: /NXapm/ENTRY/USER/identifier-group; /NXapm/ENTRY/USER/identifier/identifier-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/identifier-field; /NXapm/ENTRY/experiment_identifier/identifier-field; /NXapm/ENTRY/measurement/instrument/fabrication/identifier-group; /NXapm/ENTRY/sample/identifier-group; /NXapm/ENTRY/sample/identifier/identifier-field; /NXapm/ENTRY/specimen/identifier-group; /NXapm/ENTRY/specimen/identifier/identifier-field; /NXapm/ENTRY/specimen/parent_identifier/identifier-field; /NXapm_compositionspace_config/ENTRY/config/IDENTIFIER-group; /NXapm_compositionspace_results/ENTRY/IDENTIFIER-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/IDENTIFIER-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/IDENTIFIER-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/IDENTIFIER-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/IDENTIFIER-group; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/identifier-field; /NXapm_paraprobe_ranger_config/ENTRY/range/IDENTIFIER-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_selector_config/ENTRY/select/IDENTIFIER-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/IDENTIFIER-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/IDENTIFIER-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/IDENTIFIER-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_tool_common/IDENTIFIER-group; /NXapm_paraprobe_tool_config/IDENTIFIER-group; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/IDENTIFIER-group; /NXatom_set/identifier-field; /NXcg_marching_cubes/IDENTIFIER-group; /NXcg_primitive_set/identifier-field; /NXcomponent/IDENTIFIER-group; /NXcs_filter_boolean_mask/identifier-field; /NXem/ENTRY/experiment_identifier/identifier-field; /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/identifier-group; /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/identifier-group; /NXem/ENTRY/sample/identifier-group; /NXem/ENTRY/sample/identifier/identifier-field; /NXem/ENTRY/sample/parent_identifier/identifier-field; /NXem/ENTRY/userID/identifier-group; /NXem/ENTRY/userID/identifier/identifier-field; /NXem_calorimetry/ENTRY/identifier-group; /NXfabrication/identifier-group; /NXgraph_edge_set/identifier-field; /NXgraph_node_set/identifier-field; /NXhistory/IDENTIFIER-group; /NXidentifier/identifier-field; /NXion/identifier-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-group; /NXlab_sample_mounting/ENTRY/mounting_machine/identifier-group; /NXmicrostructure/interface/identifier-field; /NXmicrostructure/quadruple_junction/identifier-field; /NXmicrostructure/triple_junction/identifier-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/device_information/identifier-group; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/identifier-group; /NXmpes/ENTRY/SAMPLE/identifier-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/identifier-group; /NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier-field; /NXpiezoelectric_material/piezo_material_identifier/identifier-field; /NXsample/identifier-group; /NXsimilarity_grouping/statistics/identifier-field; /NXsnsevent/ENTRY/sample/identifier-field; /NXsnshisto/ENTRY/sample/identifier-field; /NXtransmission/ENTRY/acquisition_program/identifier-group; /NXuser/IDENTIFIER-group
identifier_offset: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_offset-field; /NXcg_primitive_set/identifier_offset-field; /NXgraph_edge_set/identifier_offset-field; /NXgraph_node_set/identifier_offset-field; /NXmicrostructure/interface/identifier_offset-field; /NXmicrostructure/quadruple_junction/identifier_offset-field; /NXmicrostructure/triple_junction/identifier_offset-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/identifier_offset-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/identifier_offset-field; /NXsimilarity_grouping/identifier_offset-field
identifier_type: /NXatom_set/identifier_type-field; /NXion/identifier_type-field; /NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier_type-field
idev: /NXcanSAS/ENTRY/DATA/Idev-field
imag: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/imag-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/imag-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/imag-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/imag-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/imag-field; /NXimage_set/image_1d/imag-field; /NXimage_set/image_2d/imag-field; /NXimage_set/image_3d/imag-field; /NXimage_set/stack_1d/imag-field; /NXimage_set/stack_2d/imag-field; /NXimage_set/stack_3d/imag-field
image_1d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d-group; /NXimage_set/image_1d-group
image_2d: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d-group; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d-group; /NXimage_set/image_2d-group
image_3d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d-group; /NXimage_set/image_3d-group
image_identifier: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/image_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/image_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/image_identifier-field; /NXimage_set/stack_1d/image_identifier-field; /NXimage_set/stack_2d/image_identifier-field; /NXimage_set/stack_3d/image_identifier-field
image_key: /NXdetector/image_key-field; /NXtomo/entry/data/image_key-link; /NXtomo/entry/instrument/detector/image_key-field
image_set: /NXcorrector_cs/tableauID/IMAGE_SET-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET-group; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET-group; /NXem/ENTRY/roiID/imaging/IMAGE_SET-group; /NXem_eds/indexing/IMAGE_SET-group; /NXem_img/IMAGE_SET-group; /NXem_method/IMAGE_SET-group; /NXevent_data_em/IMAGE_SET-group
imaging: /NXem/ENTRY/roiID/imaging-group
imaging_mode: /NXem/ENTRY/roiID/imaging/imaging_mode-field; /NXem_img/imaging_mode-field
implementation: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes/implementation-field
import_wizard: /NXmicrostructure_mtex_config/path/import_wizard-field
inchi_key: /NXsubstance/inchi_key-field
inchi_str: /NXsubstance/inchi_str-field
incidence_vector: /NXpulser_apm/SOURCE/BEAM/incidence_vector-field
incident_angle: /NXbeam_splitter/incident_angle-field; /NXguide/incident_angle-field; /NXmirror/incident_angle-field
incident_beam: /NXxpcs/entry/instrument/incident_beam-group
incident_beam_divergence: /NXbeam/incident_beam_divergence-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy: /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy: /NXbeam/incident_energy-field; /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy-field; /NXxpcs/entry/instrument/incident_beam/incident_energy-field; /NXxrd/ENTRY/INSTRUMENT/BEAM/incident_energy-field
incident_energy_spread: /NXbeam/incident_energy_spread-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field; /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy_spread-field; /NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
incident_energy_weights: /NXbeam/incident_energy_weights-field
incident_polarisation_stokes: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization: /NXbeam/incident_polarization-field; /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_polarization-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_polarization-field
incident_polarization_stokes: /NXbeam/incident_polarization_stokes-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type: /NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
incident_wavelength: /NXbeam/incident_wavelength-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength-field
incident_wavelength_spectrum: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread: /NXbeam/incident_wavelength_spread-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength_spread-field
incident_wavelength_weight: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights: /NXbeam/incident_wavelength_weights-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam: /NXxas/ENTRY/INSTRUMENT/incoming_beam-group
incubation_time: /NXmicrostructure_score_config/ENTRY/nucleation/incubation_time-field
independent_controllers: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
independent_scan_axes: /NXscan_control/independent_scan_axes-field
index_of_refraction: /NXlens_opt/substrate/index_of_refraction-field; /NXpolarizer_opt/substrate/index_of_refraction-field
index_of_refraction_coating: /NXbeam_splitter/coating/index_of_refraction_coating-field; /NXlens_opt/COATING/index_of_refraction_coating-field; /NXpolarizer_opt/COATING/index_of_refraction_coating-field; /NXwaveplate/coating/index_of_refraction_coating-field
index_of_refration_substrate: /NXbeam_splitter/substrate/index_of_refration_substrate-field; /NXwaveplate/substrate/index_of_refration_substrate-field
indexing: /NXem/ENTRY/roiID/ebsd/indexing-group; /NXem/ENTRY/roiID/eds/indexing-group; /NXem_correlation/indexing-group; /NXem_ebsd/indexing-group; /NXem_eds/indexing-group; /NXem_eels/indexing-group
indexing_rate: /NXem/ENTRY/roiID/ebsd/indexing/indexing_rate-field; /NXem_ebsd/indexing/indexing_rate-field
indicators_period: /NXbias_spectroscopy/CIRCUIT/indicators_period-field
indices: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/indices-field
infection_direction: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/infection_direction-field
initial_cell_cache: /NXmicrostructure_score_config/ENTRY/numerics/initial_cell_cache-field
initial_guess: /NXapm_compositionspace_config/ENTRY/config/autophase/initial_guess-field
initial_interface: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface-group
initial_radius: /NXapm/ENTRY/specimen/initial_radius-field
initial_specimen: /NXapm/ENTRY/atom_probe/initial_specimen-group
initialization: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/initialization-field
inner_plot_spacing: /NXmicrostructure_mtex_config/plotting/inner_plot_spacing-field
input: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input-group; /NXdetector/input-field; /NXiqproc/ENTRY/reduction/input-group; /NXresolution/response_function/input-field; /NXsqom/ENTRY/reduction/input-group
input_dependent: /NXfit/data/input_dependent-field; /NXxps/ENTRY/FIT/data/input_dependent-field
input_grid: /NXmicrostructure_ipf/input_grid-group
input_impedance: /NXcircuit/input_impedance-field
input_independent: /NXfit/data/input_independent-field; /NXxps/ENTRY/FIT/data/input_independent-field
input_symbol: /NXcalibration/input_SYMBOL-field
insertion_device: /NXinstrument/INSERTION_DEVICE-group
inside_poly: /NXmicrostructure_mtex_config/miscellaneous/inside_poly-field
instrument: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument-group; /NXapm/ENTRY/measurement/instrument-group; /NXapm_msr/instrument-group; /NXarchive/entry/instrument-group; /NXarpes/ENTRY/INSTRUMENT-group; /NXcanSAS/ENTRY/INSTRUMENT-group; /NXdirecttof/entry/INSTRUMENT-group; /NXellipsometry/ENTRY/INSTRUMENT-group; /NXentry/INSTRUMENT-group; /NXevent_data_apm/instrument-group; /NXfluo/entry/INSTRUMENT-group; /NXindirecttof/entry/INSTRUMENT-group; /NXiqproc/ENTRY/instrument-group; /NXiv_temp/ENTRY/INSTRUMENT-group; /NXlauetof/entry/instrument-group; /NXmonopd/entry/INSTRUMENT-group; /NXmpes/ENTRY/INSTRUMENT-group; /NXmpes_arpes/ENTRY/INSTRUMENT-group; /NXmx/ENTRY/INSTRUMENT-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT-group; /NXraman/ENTRY/INSTRUMENT-group; /NXrefscan/entry/instrument-group; /NXreftof/entry/instrument-group; /NXsas/ENTRY/INSTRUMENT-group; /NXsastof/ENTRY/instrument-group; /NXscan/ENTRY/INSTRUMENT-group; /NXsensor_scan/ENTRY/INSTRUMENT-group; /NXsnsevent/ENTRY/instrument-group; /NXsnshisto/ENTRY/instrument-group; /NXspe/ENTRY/INSTRUMENT-group; /NXsqom/ENTRY/instrument-group; /NXstxm/ENTRY/INSTRUMENT-group; /NXsubentry/INSTRUMENT-group; /NXtas/entry/INSTRUMENT-group; /NXtofnpd/entry/INSTRUMENT-group; /NXtofraw/entry/instrument-group; /NXtofsingle/entry/INSTRUMENT-group; /NXtomo/entry/instrument-group; /NXtomophase/entry/instrument-group; /NXtomoproc/entry/INSTRUMENT-group; /NXtransmission/ENTRY/instrument-group; /NXxas/ENTRY/INSTRUMENT-group; /NXxbase/entry/instrument-group; /NXxeuler/entry/instrument-group; /NXxkappa/entry/instrument-group; /NXxlaue/entry/instrument-group; /NXxlaueplate/entry/instrument-group; /NXxnb/entry/instrument-group; /NXxpcs/entry/instrument-group; /NXxps/ENTRY/INSTRUMENT-group; /NXxrd/ENTRY/INSTRUMENT-group; /NXxrd_pan/ENTRY/INSTRUMENT-group; /NXxrot/entry/instrument-group
instrument_1: /NXcxi_ptycho/entry_1/instrument_1-group
instrument_calibration_device: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE-group
instrument_name: /NXapm/ENTRY/measurement/instrument/instrument_name-field; /NXapm_msr/instrument/instrument_name-field; /NXem/ENTRY/measurement/em_lab/instrument_name-field; /NXem_msr/em_lab/instrument_name-field
int_prf: /NXreflections/int_prf-field
int_prf_errors: /NXreflections/int_prf_errors-field
int_prf_var: /NXreflections/int_prf_var-field
int_sum: /NXreflections/int_sum-field
int_sum_errors: /NXreflections/int_sum_errors-field
int_sum_var: /NXreflections/int_sum_var-field
integral: /NXmonitor/integral-field; /NXmonopd/entry/MONITOR/integral-field; /NXreftof/entry/control/integral-field; /NXsas/ENTRY/MONITOR/integral-field; /NXtomophase/entry/control/integral-field; /NXxbase/entry/control/integral-field
integral_counts: /NXtofraw/entry/MONITOR/integral_counts-field
integral_log: /NXmonitor/integral_log-group
integration_time: /NXiv_bias/integration_time-field; /NXlockin/integration_time-field; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/integration_time-field
intended_use: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/intended_use-field
intensity: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/intensity-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/intensity-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/intensity-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/intensity-field; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity-field; /NXem/ENTRY/roiID/eds/indexing/summary/intensity-field; /NXem_calorimetry/ENTRY/azimuthal_integration/result/intensity-field; /NXem_calorimetry/ENTRY/background_subtraction/result/intensity-field; /NXem_eds/indexing/summary/intensity-field; /NXfit_background/data/intensity-field; /NXimage_set/image_1d/intensity-field; /NXimage_set/image_2d/intensity-field; /NXimage_set/image_3d/intensity-field; /NXimage_set/stack_1d/intensity-field; /NXimage_set/stack_2d/intensity-field; /NXimage_set/stack_3d/intensity-field; /NXmicrostructure_odf/phi_two_plot/intensity-field; /NXmicrostructure_pf/pf/intensity-field; /NXpeak/data/intensity-field; /NXspectrum_set/spectrum_0d/intensity-field; /NXspectrum_set/spectrum_1d/intensity-field; /NXspectrum_set/spectrum_2d/intensity-field; /NXspectrum_set/spectrum_3d/intensity-field; /NXspectrum_set/stack_0d/intensity-field; /NXspectrum_set/stack_2d/intensity-field; /NXspectrum_set/stack_3d/intensity-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/intensity-field; /NXxps/ENTRY/FIT/peakPEAK/data/intensity-field; /NXxrd_pan/ENTRY/experiment_result/intensity-field; /NXxrd_pan/ENTRY/q_data/intensity-field
interaction_vol_em: /NXevent_data_em/INTERACTION_VOL_EM-group
interface: /NXmicrostructure/interface-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface-group
interface_identifier: /NXmicrostructure/quadruple_junction/interface_identifier-field; /NXmicrostructure/triple_junction/interface_identifier-field
interface_meshing: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing-group
interior_angle: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/interior_angle-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/interior_angle-field; /NXcg_polygon_set/interior_angle-field; /NXcg_triangle_set/interior_angle-field
interior_atmosphere: /NXgrating/interior_atmosphere-field; /NXguide/interior_atmosphere-field; /NXmirror/interior_atmosphere-field
interior_cellsid: /NXcg_alpha_complex/interior_cellsID-group
interior_tetrahedra: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra-group
interpolation: /NXmicrostructure_ipf/interpolation-field
intersection_detection_method: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/intersection_detection_method-field
intersection_volume: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/intersection_volume-field
ion: /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION-group; /NXapm_ranging/peak_identification/ION-group; /NXchemical_composition/ION-group; /NXem_eds/indexing/PEAK/ION-group
ion_detector: /NXapm/ENTRY/measurement/instrument/ion_detector-group; /NXapm_msr/instrument/ion_detector-group; /NXevent_data_apm/instrument/ion_detector-group
ion_energy_profile: /NXibeam_column/ion_source/ion_energy_profile-field
ion_identifier: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/ion_identifier-field
ion_multiplicity: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/ion_multiplicity-field
ion_query_nuclide_source: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_source-field
ion_query_nuclide_target: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_target-field
ion_query_nuclide_vector: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_query_nuclide_vector-field
ion_query_type_source: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_source-field
ion_query_type_target: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_target-field
ion_source: /NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source-group; /NXibeam_column/ion_source-group
ion_type: /NXatom_set/ion_type-field; /NXion/ion_type-field
ion_type_filter: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_type_filter-field
ionid: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID-group; /NXapm/ENTRY/sample/chemical_composition/ionID-group; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID-group
iontype_filter: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter-group
iontypes: /NXapm_paraprobe_ranger_results/ENTRY/iontypes-group; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/iontypes-field
iontypes_randomized: /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/iontypes_randomized-field
iris: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/iris-group
is_a: /NXgraph_edge_set/is_a-field; /NXgraph_node_set/is_a-field
is_active: /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force/is_active-field; /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/is_active-field; /NXmicrostructure_gragles_config/ENTRY/magnetic_field/is_active-field; /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/is_active-field
is_amorphous: /NXapm/ENTRY/specimen/is_amorphous-field
is_antipodal: /NXrotation_set/is_antipodal-field
is_axis_aligned: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/is_axis_aligned-field; /NXcg_hexahedron_set/is_axis_aligned-field; /NXcg_parallelogram_set/is_axis_aligned-field
is_box: /NXcg_hexahedron_set/is_box-field
is_center_of_mass: /NXcg_primitive_set/is_center_of_mass-field
is_centrosymmetric: /NXcrystal_structure/is_centrosymmetric-field; /NXunit_cell/is_centrosymmetric-field
is_chiral: /NXcrystal_structure/is_chiral-field; /NXunit_cell/is_chiral-field
is_closed: /NXcg_primitive_set/is_closed-field
is_core: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_core-field
is_cylindrical: /NXcrystal/is_cylindrical-field
is_deformed: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_deformed-field
is_noise: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_noise-field
is_persistent: /NXapm/ENTRY/USER/identifier/is_persistent-field; /NXapm/ENTRY/experiment_identifier/is_persistent-field; /NXapm/ENTRY/sample/identifier/is_persistent-field; /NXapm/ENTRY/specimen/identifier/is_persistent-field; /NXapm/ENTRY/specimen/parent_identifier/is_persistent-field; /NXem/ENTRY/experiment_identifier/is_persistent-field; /NXem/ENTRY/sample/identifier/is_persistent-field; /NXem/ENTRY/sample/parent_identifier/is_persistent-field; /NXem/ENTRY/userID/identifier/is_persistent-field; /NXidentifier/is_persistent-field; /NXoptical_spectroscopy/ENTRY/experiment_identifier/is_persistent-field
is_polycrystalline: /NXapm/ENTRY/specimen/is_polycrystalline-field
is_recrystallized: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_recrystallized-field
is_rectangle: /NXcg_parallelogram_set/is_rectangle-field
is_specific: /NXmicrostructure_slip_system/is_specific-field
is_subgrain: /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/is_subgrain-field
is_watertight: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/is_watertight-field
iso_surfaceid: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID-group
isosurfacing: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing-group
isovalue: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/isovalue-field; /NXisocontour/isovalue-field
iteration: /NXmicrostructure/iteration-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/iteration-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/iteration-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field
iupac_line_candidates: /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/iupac_line_candidates-field; /NXem_eds/indexing/IMAGE_SET/iupac_line_candidates-field
iupac_line_names: /NXem_eds/indexing/PEAK/ION/iupac_line_names-field
iupac_name: /NXsubstance/iupac_name-field
jones_quality_factor: /NXoptical_spectroscopy/ENTRY/derived_parameters/jones_quality_factor-field
k: /NXinsertion_device/k-field; /NXreflections/k-field
k_alpha_one: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one-field
k_alpha_two: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two-field
k_d_value: /NXpid/K_d_value-field
k_electromechanical_constant: /NXpiezoelectric_material/K_electromechanical_constant-field
k_i_value: /NXpid/K_i_value-field
k_p_value: /NXpid/K_p_value-field
k_t_const: /NXpid/K_t_const-field
kappa: /NXxkappa/entry/name/kappa-link; /NXxkappa/entry/sample/kappa-field
kbeta: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta-field
kernel_halfwidth: /NXmicrostructure_odf/configuration/kernel_halfwidth-field
kernel_mu: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_mu-field
kernel_name: /NXmicrostructure_odf/configuration/kernel_name-field
kernel_sigma: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_sigma-field
kernel_size: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_size-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_size-field
kernel_type: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_type-field
kernel_variance: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_variance-field
kernel_width: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/kernel_width-field
ki_over_kf_scaling: /NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
kinetic_energy: /NXelectronanalyser/transmission_function/kinetic_energy-field; /NXenergydispersion/kinetic_energy-field; /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/kinetic_energy-field; /NXprocess_mpes/transmission_correction/transmission_function/kinetic_energy-field
kinetics: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group
kn: /NXdata_mpes/kN-field; /NXdata_mpes_detector/kN-field
kn_calibration: /NXmpes/ENTRY/PROCESS_MPES/kN_calibration-group; /NXprocess_mpes/kN_calibration-group
knn: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn-group; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn-group
kth: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/kth-field; /NXmicrostructure_odf/kth_extrema/kth-field
kth_extrema: /NXmicrostructure_odf/kth_extrema-group
l: /NXreflections/l-field
label: /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/label-field; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/label-field; /NXfit/label-field; /NXfit_background/label-field; /NXgraph_edge_set/label-field; /NXgraph_node_set/label-field; /NXpeak/label-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/label-field; /NXxps/ENTRY/FIT/label-field; /NXxps/ENTRY/FIT/peakPEAK/label-field
lagb_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_enthalpy-field
lagb_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_pre_factor-field
lagb_to_hagb_cut: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_to_hagb_cut-field
lambda: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
last_fill: /NXsource/last_fill-field
last_process: /NXcalibration/last_process-field; /NXdistortion/last_process-field; /NXregistration/last_process-field
lateral_focal_point_offset: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/lateral_focal_point_offset-field
lateral_surface_area: /NXcg_cylinder_set/lateral_surface_area-field
lattice_system: /NXunit_cell/lattice_system-field
lattice_type: /NXmicrostructure_slip_system/lattice_type-field
laue_group: /NXcrystal_structure/laue_group-field; /NXunit_cell/laue_group-field
layer_structure: /NXoptical_spectroscopy/ENTRY/SAMPLE/layer_structure-field
layer_thickness: /NXgrating/layer_thickness-field; /NXmirror/layer_thickness-field
layout: /NXdetector/layout-field
legend: /NXmicrostructure_ipf/legend-group
length: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field; /NXcg_hexahedron_set/length-field; /NXcg_primitive_set/length-field; /NXfiber/length-field; /NXinsertion_device/length-field; /NXmicrostructure/crystal/length-field; /NXmicrostructure/interface/length-field; /NXmicrostructure/triple_junction/length-field; /NXvelocity_selector/length-field
lens_diameter: /NXlens_opt/lens_diameter-field
lens_em: /NXcollectioncolumn/LENS_EM-group; /NXcorrector_cs/LENS_EM-group; /NXebeam_column/LENS_EM-group; /NXelectronanalyser/LENS_EM-group; /NXenergydispersion/LENS_EM-group; /NXibeam_column/LENS_EM-group; /NXsource/LENS_EM-group; /NXspindispersion/LENS_EM-group
lens_geometry: /NXxraylens/lens_geometry-field
lens_length: /NXxraylens/lens_length-field
lens_material: /NXxraylens/lens_material-field
lens_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field; /NXcollectioncolumn/lens_mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/lens_mode-field
lens_opt: /NXbeam_path/LENS_OPT-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT-group
lens_thickness: /NXxraylens/lens_thickness-field
lensid: /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID-group
level: /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/level-group; /NXprocess_mpes/energy_referencing/level-group
level_electron_config: /NXelectron_level/level_electron_config-field
level_iupac: /NXelectron_level/level_iupac-field
lifespan: /NXbeam_path/SOURCE/lifespan-field
line_energy: /NXmicrostructure/triple_junction/line_energy-field; /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/line_energy-field
line_time: /NXscanbox_em/line_time-field
linear_beam_sample_polarization: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/linear_beam_sample_polarization-field
linear_scan: /NXscan_control/linear_SCAN-group
linear_sweep: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep-group; /NXbias_sweep/linear_sweep-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep-group
lines: /NXpositioner_sts/lines-field
load_lock_chamber: /NXapm_msr/instrument/load_lock_chamber-group; /NXevent_data_apm/instrument/load_lock_chamber-group
local_electrode: /NXapm/ENTRY/measurement/instrument/local_electrode-group; /NXapm_msr/instrument/local_electrode-group; /NXevent_data_apm/instrument/local_electrode-group
local_name: /NXdetector/local_name-field; /NXem_msr/em_lab/DETECTOR/local_name-field
location: /NXapm_msr/instrument/location-field; /NXem/ENTRY/measurement/em_lab/location-field; /NXem_msr/em_lab/location-field; /NXmicrostructure/quadruple_junction/location-field; /NXmicrostructure/triple_junction/location-field; /NXmicrostructure_odf/kth_extrema/location-field
lock_in_run: /NXiv_bias/lock_in_run-field
lockin_amplifier: /NXspm/ENTRY/experiment_instrument/lockin_amplifier-group; /NXstm/ENTRY/experiment_instrument/lockin_amplifier-group
lockin_current_flip_sign: /NXlockin/lockin_current_flip_sign-field
log: /NXsnsevent/ENTRY/DASlogs/LOG-group; /NXsnshisto/ENTRY/DASlogs/LOG-group
low_pass: /NXamplifier/low_pass-field
low_pass_n: /NXlockin/low_pass_N-field
low_trip_value: /NXsensor/low_trip_value-field; /NXsensor_sts/low_trip_value-field
lower_cap_radii: /NXcg_cylinder_set/lower_cap_radii-field
lower_cap_surface_area: /NXcg_cylinder_set/lower_cap_surface_area-field
lp: /NXreflections/lp-field
lp_filter_order_n: /NXlockin/lp_filter_order_N-field
lubricant: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
m_null: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/m_null-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/m_null-field
m_value: /NXfilter/m_value-field; /NXguide/m_value-field; /NXmirror/m_value-field
magnetic_field: /NXarchive/entry/sample/magnetic_field-field; /NXbending_magnet/magnetic_field-field; /NXmicrostructure_gragles_config/ENTRY/magnetic_field-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group; /NXsample/magnetic_field-field; /NXsample/magnetic_field-group
magnetic_field_env: /NXsample/magnetic_field_env-group
magnetic_field_log: /NXsample/magnetic_field_log-group
magnetic_wavelength: /NXinsertion_device/magnetic_wavelength-field
magnification: /NXcollectioncolumn/magnification-field; /NXcorrector_cs/tableauID/magnification-field; /NXlens_opt/magnification-field; /NXoptical_system_em/magnification-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/magnification-field
magnitude: /NXaberration/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_2/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_4/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_0/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_0/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_0/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_a/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_b/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3/magnitude-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5/magnitude-field; /NXresolution/response_function/magnitude-field
manipulator: /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
manufacturer: /NXcapillary/manufacturer-field; /NXtransmission/ENTRY/instrument/manufacturer-group
map: /NXmicrostructure_ipf/map-group
mapping_mapping: /NXcalibration/mapping_MAPPING-field
marching_cubes: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes-group
mark: /NXdelocalization/weighting_model/mark-field
marker: /NXmicrostructure_mtex_config/plotting/marker-field
marker_edge_color: /NXmicrostructure_mtex_config/plotting/marker_edge_color-field
marker_face_color: /NXmicrostructure_mtex_config/plotting/marker_face_color-field
marker_size: /NXmicrostructure_mtex_config/plotting/marker_size-field
mask: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/mask-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/mask-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/mask-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/mask-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/mask-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/mask-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/mask-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/mask-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/mask-field; /NXapm_paraprobe_tool_results/window/mask-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/mask-field; /NXcs_filter_boolean_mask/mask-field
mask_material: /NXfresnel_zone_plate/mask_material-field
mask_thickness: /NXfresnel_zone_plate/mask_thickness-field
masks: /NXxpcs/entry/instrument/masks-group
mass: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass-field; /NXapm_charge_state_analysis/mass-field; /NXsample/mass-field; /NXsample_component/mass-field
mass_spectrum: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group; /NXapm_ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/mass_to_charge-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/mass_to_charge-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/mass_to_charge-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/mass_to_charge-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/mass_to_charge-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/mass_to_charge-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/mass_to_charge-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/mass_to_charge-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/mass_to_charge-field; /NXapm_paraprobe_tool_config/reconstruction/mass_to_charge-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/mass_to_charge-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group; /NXapm_ranging/mass_to_charge_distribution-group
mass_to_charge_range: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass_to_charge_range-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/mass_to_charge_range-field; /NXapm_charge_state_analysis/mass_to_charge_range-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/mass_to_charge_range-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field; /NXatom_set/mass_to_charge_range-field; /NXion/mass_to_charge_range-field
match: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/match-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/match-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/match-field; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/match-field; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/match-field; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/match-field; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/match-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/match-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/match-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/match-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/match-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/match-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/match-field; /NXdelocalization/weighting_model/match-field; /NXmatch_filter/match-field
match_filter: /NXapm_paraprobe_tool_config/MATCH_FILTER-group
material: /NXaperture/material-field; /NXbeam_path/window_NUMBER/material-field; /NXopt_window/ENTRY/material-field
material_other: /NXopt_window/ENTRY/material_other-field
material_phase: /NXdispersive_material/ENTRY/sample/material_phase-field
material_phase_comment: /NXdispersive_material/ENTRY/sample/material_phase_comment-field
material_properties: /NXmicrostructure_score_config/ENTRY/material_properties-group
matrix_elements: /NXbeam_transfer_matrix_table/matrix_elements-field
max_delta_x: /NXmicrostructure_score_config/ENTRY/numerics/max_delta_x-field
max_frequency: /NXbeam_path/DISK_CHOPPER/max_frequency-field
max_gap: /NXbeam_path/MONOCHROMATOR/SLIT/max_gap-field
max_iteration: /NXmicrostructure_score_config/ENTRY/simulation_control/max_iteration-field
max_physical_capacity: /NXcs_computer/memory/CIRCUIT/max_physical_capacity-field; /NXcs_computer/storage/CIRCUIT/max_physical_capacity-field
max_resident_memory_snapshot: /NXcs_profiling_event/max_resident_memory_snapshot-field
max_revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/max_revolutions-field
max_sew_rate: /NXiv_bias/max_sew_rate-field
max_slew_rate: /NXbias_spectroscopy/BIAS_SWEEP/max_slew_rate-field
max_sothree_bandwidth: /NXmicrostructure_mtex_config/numerics/max_sothree_bandwidth-field
max_stwo_bandwidth: /NXmicrostructure_mtex_config/numerics/max_stwo_bandwidth-field
max_time: /NXmicrostructure_score_config/ENTRY/simulation_control/max_time-field
max_value: /NXfit_parameter/max_value-field
max_virtual_memory_snapshot: /NXcs_profiling_event/max_virtual_memory_snapshot-field
max_x: /NXmicrostructure_score_config/ENTRY/simulation_control/max_x-field
maximum_incident_angle: /NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion: /NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field; /NXapm_ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_value: /NXlog/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
measure_time: /NXbeam_path/SOURCE/measure_time-field
measured_data: /NXellipsometry/ENTRY/data_collection/measured_data-field; /NXtransmission/ENTRY/instrument/measured_data-field
measured_data_errors: /NXellipsometry/ENTRY/data_collection/measured_data_errors-field
measurement: /NXapm/ENTRY/measurement-group; /NXem/ENTRY/measurement-group; /NXem/ENTRY/roiID/ebsd/measurement-group; /NXem_ebsd/measurement-group; /NXmanipulator/drain_current_amperemeter/measurement-field; /NXmanipulator/sample_bias_voltmeter/measurement-field; /NXmanipulator/temperature_sensor/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/measurement-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/measurement-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/measurement-field; /NXsensor/measurement-field; /NXsensor_sts/measurement-field
measurement_data_calibration_type: /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE-group
measurement_sensors: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
measurement_time: /NXbias_spectroscopy/CIRCUIT/measurement_time-field
measurement_type: /NXbias_spectroscopy/measurement_type-field; /NXxrd_pan/ENTRY/measurement_type-field
melting_temperature: /NXmicrostructure_score_config/ENTRY/material_properties/melting_temperature-field
member_count: /NXsimilarity_grouping/statistics/member_count-field
memory: /NXcs_computer/memory-group; /NXmicrostructure_mtex_config/system/memory-field
mesh_scan: /NXscan_control/mesh_SCAN-group
mesh_stateid: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID-group
method: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/method-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/method-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/method-field; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/method-field; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/method-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/method-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/method-field; /NXchemical_process/method-field; /NXdelocalization/weighting_model/method-field; /NXem_ebsd/indexing/method-field; /NXmatch_filter/method-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/method-field; /NXmpes/ENTRY/method-field; /NXphysical_process/method-field; /NXxps/ENTRY/method-field; /NXxrd_pan/ENTRY/method-field
methods_advise: /NXmicrostructure_mtex_config/miscellaneous/methods_advise-field
microstructureid: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID-group; /NXmicrostructure_imm_results/ENTRY/microstructureID-group; /NXmicrostructure_kanapy_results/ENTRY/microstructureID-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID-group
miller: /NXcrystal_structure/miller-field
miller_direction: /NXmicrostructure_slip_system/miller_direction-field
miller_indices: /NXmicrostructure_pf/configuration/miller_indices-field
miller_plane: /NXmicrostructure_slip_system/miller_plane-field
min_abundance: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance-field; /NXapm_charge_state_analysis/min_abundance-field
min_abundance_product: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance_product-field
min_cluster_size: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_cluster_size-field
min_frequency: /NXbeam_path/DISK_CHOPPER/min_frequency-field
min_half_life: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_half_life-field; /NXapm_charge_state_analysis/min_half_life-field
min_incr_max: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/min_incr_max-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf/min_incr_max-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter/min_incr_max-field; /NXapm_ranging/mass_to_charge_distribution/min_incr_max-field; /NXsubsampling_filter/min_incr_max-field
min_max_grain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_grain-field
min_max_subgrain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_subgrain-field
min_pts: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/min_pts-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/min_pts-field
min_samples: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/min_samples-field; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/min_samples-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_samples-field
min_value: /NXfit_parameter/min_value-field
minimum_value: /NXlog/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror: /NXbeam_path/MIRROR-group; /NXinstrument/MIRROR-group
miscellaneous: /NXmicrostructure_mtex_config/miscellaneous-group
misorientation_angle: /NXrotation_set/misorientation_angle-field
misorientation_axis: /NXrotation_set/misorientation_axis-field
misorientation_quaternion: /NXrotation_set/misorientation_quaternion-field
mobility: /NXmicrostructure/interface/mobility-field; /NXmicrostructure/quadruple_junction/mobility-field; /NXmicrostructure/triple_junction/mobility-field
mobility_weight: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/mobility_weight-field
mode: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/mode-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID/mode-field; /NXfluo/entry/MONITOR/mode-field; /NXlauetof/entry/control/mode-field; /NXlens_em/mode-field; /NXmonitor/mode-field; /NXmonopd/entry/MONITOR/mode-field; /NXrefscan/entry/control/mode-field; /NXreftof/entry/control/mode-field; /NXsas/ENTRY/MONITOR/mode-field; /NXsastof/ENTRY/control/mode-field; /NXsnsevent/ENTRY/MONITOR/mode-field; /NXsnshisto/ENTRY/MONITOR/mode-field; /NXsource/mode-field; /NXspectrum_set/PROCESS/mode-field; /NXtas/entry/MONITOR/mode-field; /NXtofnpd/entry/MONITOR/mode-field; /NXtofraw/entry/MONITOR/mode-field; /NXtofsingle/entry/MONITOR/mode-field; /NXxas/ENTRY/DATA/mode-field; /NXxas/ENTRY/MONITOR/mode-field; /NXxbase/entry/control/mode-field
model: /NXactuator/model-field; /NXapm/ENTRY/measurement/instrument/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/pulser/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/reflectron/fabrication/model-field; /NXcorrector_cs/tableauID/model-field; /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/detectorID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/model-field; /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/model-field; /NXfabrication/model-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/model-field; /NXlab_sample_mounting/ENTRY/mounting_machine/model-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/model-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/model-field; /NXmicrostructure_score_config/ENTRY/deformation/model-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/model-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/model-field; /NXmicrostructure_score_config/ENTRY/stored_energy_recovery/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/model-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/model-field; /NXsensor/model-field; /NXsensor_sts/model-field; /NXspm/ENTRY/experiment_instrument/hardware/model-field; /NXspm/ENTRY/experiment_instrument/software/model-field; /NXtransmission/ENTRY/acquisition_program/model-field
model_labels: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/model_labels-field
model_name: /NXdispersion/model_name-field; /NXdispersion_function/model_name-field; /NXdispersion_table/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/model_name-field
moderator: /NXinstrument/MODERATOR-group; /NXsnsevent/ENTRY/instrument/moderator-group; /NXsnshisto/ENTRY/instrument/moderator-group
modulated_signal_bias: /NXiv_bias/modulated_signal_bias-field
modulation_frequency: /NXstm/ENTRY/experiment_instrument/lockin_amplifier/modulation_frequency-field; /NXstm/ENTRY/reproducibility_indicators/modulation_frequency-field; /NXstm/ENTRY/resolution_indicators/modulation_frequency-field
modulation_signal: /NXlockin/modulation_signal-field
modulation_signal_type: /NXstm/ENTRY/experiment_instrument/lockin_amplifier/modulation_signal_type-field; /NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field; /NXstm/ENTRY/resolution_indicators/modulation_signal_type-field
modulation_status: /NXlockin/modulation_status-field
module_offset: /NXdetector_module/module_offset-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
molecular_formula_hill: /NXmpes/ENTRY/SAMPLE/SUBSTANCE/molecular_formula_hill-field; /NXsubstance/molecular_formula_hill-field
molecular_mass: /NXsubstance/molecular_mass-field
momentum_resolution: /NXelectronanalyser/momentum_resolution-group
monitor: /NXcxi_ptycho/entry_1/instrument_1/MONITOR-group; /NXentry/MONITOR-group; /NXfluo/entry/MONITOR-group; /NXmonopd/entry/MONITOR-group; /NXsas/ENTRY/MONITOR-group; /NXscan/ENTRY/MONITOR-group; /NXsnsevent/ENTRY/MONITOR-group; /NXsnshisto/ENTRY/MONITOR-group; /NXsubentry/MONITOR-group; /NXtas/entry/MONITOR-group; /NXtofnpd/entry/MONITOR-group; /NXtofraw/entry/MONITOR-group; /NXtofsingle/entry/MONITOR-group; /NXxas/ENTRY/MONITOR-group
monochromator: /NXarpes/ENTRY/INSTRUMENT/monochromator-group; /NXbeam_path/MONOCHROMATOR-group; /NXebeam_column/MONOCHROMATOR-group; /NXfluo/entry/INSTRUMENT/monochromator-group; /NXibeam_column/MONOCHROMATOR-group; /NXinstrument/MONOCHROMATOR-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR-group; /NXrefscan/entry/instrument/monochromator-group; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group; /NXstxm/ENTRY/INSTRUMENT/monochromator-group; /NXtas/entry/INSTRUMENT/monochromator-group; /NXxas/ENTRY/INSTRUMENT/monochromator-group; /NXxbase/entry/instrument/monochromator-group
monochromatorid: /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID-group
mosaic_horizontal: /NXcrystal/mosaic_horizontal-field
mosaic_vertical: /NXcrystal/mosaic_vertical-field
mosek: /NXmicrostructure_mtex_config/miscellaneous/mosek-field
mounting_machine: /NXlab_sample_mounting/ENTRY/mounting_machine-group
mounting_method: /NXlab_sample_mounting/ENTRY/mounting_method-field
mrp_mass_to_charge: /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_mass_to_charge-field
mrp_value: /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_value-field
mtex: /NXmicrostructure_mtex_config/path/mtex-field
multiple_outputs: /NXbeam_splitter/multiple_outputs-field
n_ic_cluster: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/n_ic_cluster-field
n_max_ic_cluster: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/n_max_ic_cluster-field
n_phases_per_scan_point: /NXem_ebsd/indexing/n_phases_per_scan_point-field
naive_discretization: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization-group; /NXapm_reconstruction/naive_discretization-group
name: /NXaberration/name-field; /NXactuator/name-field; /NXapm/ENTRY/USER/name-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/name-field; /NXapm/ENTRY/measurement/instrument/local_electrode/name-field; /NXapm_compositionspace_results/ENTRY/voxelization/elementID/name-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_distancer_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_intersector_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_ranger_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/name-field; /NXapm_paraprobe_selector_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/userID/name-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/userID/name-field; /NXarchive/entry/instrument/SOURCE/name-field; /NXarchive/entry/instrument/name-field; /NXarchive/entry/sample/name-field; /NXarchive/entry/user/name-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field; /NXarpes/ENTRY/SAMPLE/name-field; /NXatom_set/name-field; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field; /NXcanSAS/ENTRY/PROCESS/name-field; /NXcanSAS/ENTRY/SAMPLE/name-field; /NXchamber/name-field; /NXcomponent/name-field; /NXcontainer/name-field; /NXcs_computer/memory/CIRCUIT/name-field; /NXcs_computer/name-field; /NXcs_computer/processing/CIRCUIT/name-field; /NXcs_computer/storage/CIRCUIT/name-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/name-field; /NXcxi_ptycho/sample_1/name-field; /NXdeflector/name-field; /NXdispersion_repeated_parameter/name-field; /NXdispersion_single_parameter/name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXebeam_column/electron_source/name-field; /NXelectronanalyser/name-field; /NXem/ENTRY/sample/name-field; /NXem/ENTRY/userID/name-field; /NXenvironment/name-field; /NXfit_parameter/name-field; /NXfluo/entry/INSTRUMENT/SOURCE/name-field; /NXfluo/entry/SAMPLE/name-field; /NXibeam_column/ion_source/name-field; /NXinstrument/name-field; /NXion/name-field; /NXiqproc/ENTRY/SAMPLE/name-field; /NXiqproc/ENTRY/instrument/SOURCE/name-field; /NXiqproc/ENTRY/instrument/name-field; /NXiv_temp/ENTRY/SAMPLE/name-field; /NXlauetof/entry/name-group; /NXlauetof/entry/sample/name-field; /NXmanipulator/name-field; /NXmonopd/entry/INSTRUMENT/SOURCE/name-field; /NXmonopd/entry/SAMPLE/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/name-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/name-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/name-field; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/name-field; /NXmpes/ENTRY/SAMPLE/name-field; /NXmpes/ENTRY/USER/name-field; /NXmx/ENTRY/INSTRUMENT/name-field; /NXmx/ENTRY/SAMPLE/name-field; /NXmx/ENTRY/SOURCE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/name-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/name-field; /NXpiezoelectric_material/name-field; /NXpositioner/name-field; /NXpositioner_sts/name-field; /NXpulser_apm/SOURCE/name-field; /NXreflectron/name-field; /NXrefscan/entry/instrument/SOURCE/name-field; /NXrefscan/entry/sample/name-field; /NXreftof/entry/instrument/name-field; /NXreftof/entry/sample/name-field; /NXsample/name-field; /NXsample_component/name-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXsas/ENTRY/INSTRUMENT/name-field; /NXsas/ENTRY/SAMPLE/name-field; /NXsastof/ENTRY/instrument/name-field; /NXsastof/ENTRY/instrument/source/name-field; /NXsastof/ENTRY/sample/name-field; /NXsensor/name-field; /NXsensor_scan/ENTRY/SAMPLE/name-field; /NXsensor_scan/ENTRY/USER/name-field; /NXsensor_sts/name-field; /NXsnsevent/ENTRY/USER/name-field; /NXsnsevent/ENTRY/instrument/SNS/name-field; /NXsnsevent/ENTRY/instrument/name-field; /NXsnsevent/ENTRY/sample/name-field; /NXsnshisto/ENTRY/USER/name-field; /NXsnshisto/ENTRY/instrument/SNS/name-field; /NXsnshisto/ENTRY/instrument/name-field; /NXsnshisto/ENTRY/sample/name-field; /NXsource/name-field; /NXspe/ENTRY/INSTRUMENT/name-field; /NXsqom/ENTRY/SAMPLE/name-field; /NXsqom/ENTRY/instrument/SOURCE/name-field; /NXsqom/ENTRY/instrument/name-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field; /NXsubstance/name-field; /NXtas/entry/INSTRUMENT/SOURCE/name-field; /NXtas/entry/SAMPLE/name-field; /NXtofnpd/entry/SAMPLE/name-field; /NXtofnpd/entry/user/name-field; /NXtofraw/entry/SAMPLE/name-field; /NXtofraw/entry/user/name-field; /NXtofsingle/entry/SAMPLE/name-field; /NXtofsingle/entry/user/name-field; /NXtomo/entry/instrument/SOURCE/name-field; /NXtomo/entry/sample/name-field; /NXtomophase/entry/instrument/SOURCE/name-field; /NXtomophase/entry/sample/name-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/name-field; /NXtomoproc/entry/SAMPLE/name-field; /NXtransmission/ENTRY/SAMPLE/name-field; /NXtransmission/ENTRY/operator/name-field; /NXuser/name-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXxas/ENTRY/SAMPLE/name-field; /NXxasproc/ENTRY/SAMPLE/name-field; /NXxbase/entry/instrument/source/name-field; /NXxbase/entry/sample/name-field; /NXxeuler/entry/name-group; /NXxkappa/entry/name-group; /NXxnb/entry/name-group; /NXxrot/entry/name-group
name_spectrum: /NXellipsometry/ENTRY/data_collection/NAME_spectrum-field
natural_abundance_product: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/natural_abundance_product-field; /NXapm_charge_state_analysis/natural_abundance_product-field
nature: /NXsnsevent/ENTRY/sample/nature-field; /NXsnshisto/ENTRY/sample/nature-field; /NXtofraw/entry/SAMPLE/nature-field; /NXtofsingle/entry/SAMPLE/nature-field
next_device: /NXbeam/next_device-field
next_set: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set-group
next_set_feature_to_cluster: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/next_set_feature_to_cluster-field
next_to_current_link: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link-field
next_to_current_link_type: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link_type-field
node_pair: /NXgraph_edge_set/node_pair-field
nodes: /NXgraph_root/nodes-group
noise: /NXsimilarity_grouping/statistics/noise-field
noise_level: /NXcircuit/noise_level-field
nominal: /NXmonitor/nominal-field
normalization: /NXapm/ENTRY/sample/chemical_composition/normalization-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/normalization-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/normalization-field
normals: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/normals-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/normals-field; /NXcg_unit_normal_set/normals-field
note: /NXaperture/NOTE-group; /NXcanSAS/ENTRY/PROCESS/NOTE-group; /NXenvironment/NOTE-group; /NXprocess/NOTE-group; /NXprocess_mpes/NOTE-group; /NXresolution/note-group; /NXsensor_scan/ENTRY/NOTE-group; /NXxpcs/entry/NOTE-group
notes: /NXactivity/notes-group; /NXchemical_process/notes-group; /NXentry/notes-group; /NXhistory/notes-group; /NXphysical_process/notes-group; /NXsnsevent/ENTRY/notes-field; /NXsnshisto/ENTRY/notes-field; /NXsource/notes-group; /NXsubentry/notes-group
nucleation: /NXmicrostructure_score_config/ENTRY/nucleation-group
nuclide_hash: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclide_hash-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_hash-field; /NXapm_charge_state_analysis/nuclide_hash-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_hash-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/nuclide_hash-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_hash-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_hash-field; /NXatom_set/nuclide_hash-field; /NXion/nuclide_hash-field
nuclide_list: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_list-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_list-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_list-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_list-field; /NXatom_set/nuclide_list-field; /NXion/nuclide_list-field
nuclide_whitelist: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/nuclide_whitelist-field
nuclides: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclides-field; /NXapm_charge_state_analysis/nuclides-field
num: /NXvelocity_selector/num-field
num_of_channels: /NXamplifier/num_of_channels-field
num_pixel: /NXiv_bias/num_pixel-field
number: /NXfermi_chopper/number-field
number_of_atoms: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_atoms-field
number_of_boundaries: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/number_of_boundaries-field; /NXcg_grid/number_of_boundaries-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/number_of_boundaries-field
number_of_bunches: /NXsource/number_of_bunches-field
number_of_categorical_labels: /NXsimilarity_grouping/number_of_categorical_labels-field
number_of_core: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_core-field
number_of_crystals: /NXmicrostructure/crystal/number_of_crystals-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/number_of_crystals-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/number_of_crystals-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_crystals-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field
number_of_cycles: /NXdetector/number_of_cycles-field
number_of_dld_wires: /NXapm/ENTRY/atom_probe/hit_finding/number_of_dld_wires-field; /NXapm_hit_finding/number_of_dld_wires-field
number_of_domains: /NXmicrostructure_score_config/ENTRY/solitary_unit/number_of_domains-field
number_of_edges: /NXcg_face_list_data_structure/number_of_edges-field; /NXcg_half_edge_data_structure/number_of_edges-field; /NXcg_polyhedron_set/number_of_edges-field; /NXgraph_edge_set/number_of_edges-field
number_of_faces: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_faces-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/number_of_faces-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_faces-field; /NXcg_face_list_data_structure/number_of_faces-field; /NXcg_half_edge_data_structure/number_of_faces-field; /NXcg_polyhedron_set/number_of_faces-field
number_of_feature_types: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/number_of_feature_types-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/number_of_feature_types-field
number_of_features: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_features-field
number_of_gpus: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_gpus-field; /NXcs_profiling/number_of_gpus-field; /NXcs_profiling_event/number_of_gpus-field
number_of_grains: /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_grains-field; /NXmicrostructure_imm_config/ENTRY/roi/number_of_grains-field
number_of_interfaces: /NXmicrostructure/interface/number_of_interfaces-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/number_of_interfaces-field
number_of_ion_types: /NXapm_ranging/number_of_ion_types-field
number_of_ions: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/number_of_ions-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_ions-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/number_of_ions-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/number_of_ions-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/number_of_ions-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/number_of_ions-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/number_of_ions-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/number_of_ions-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/number_of_ions-field; /NXapm_paraprobe_tool_results/window/number_of_ions-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/number_of_ions-field
number_of_iterations: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/number_of_iterations-field; /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_iterations-field
number_of_junctions: /NXmicrostructure/quadruple_junction/number_of_junctions-field; /NXmicrostructure/triple_junction/number_of_junctions-field
number_of_lenses: /NXxraylens/number_of_lenses-field
number_of_noise: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_noise-field
number_of_numeric_labels: /NXsimilarity_grouping/number_of_numeric_labels-field
number_of_objects: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/number_of_objects-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/number_of_objects-field; /NXcs_filter_boolean_mask/number_of_objects-field
number_of_phases: /NXmicrostructure/crystal/number_of_phases-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_phases-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field
number_of_planes: /NXcrystal_structure/number_of_planes-field
number_of_processes: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_processes-field; /NXcs_profiling/number_of_processes-field; /NXcs_profiling_event/number_of_processes-field
number_of_scan_points: /NXcrystal_structure/number_of_scan_points-field; /NXem/ENTRY/roiID/ebsd/indexing/number_of_scan_points-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/number_of_scan_points-field; /NXem_ebsd/indexing/number_of_scan_points-field
number_of_solutions: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/number_of_solutions-field
number_of_subgrains: /NXmicrostructure_imm_config/ENTRY/roi/number_of_subgrains-field
number_of_sweeps: /NXiv_bias/number_of_sweeps-field
number_of_targets: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_targets-field
number_of_tasks: /NXapm_paraprobe_clusterer_config/ENTRY/number_of_tasks-field; /NXapm_paraprobe_intersector_config/ENTRY/number_of_tasks-field; /NXapm_paraprobe_spatstat_config/ENTRY/number_of_tasks-field
number_of_threads: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_threads-field; /NXcs_profiling/number_of_threads-field; /NXcs_profiling_event/number_of_threads-field
number_of_total_vertices: /NXcg_polygon_set/number_of_total_vertices-field; /NXcg_polyline_set/number_of_total_vertices-field
number_of_trajectory_points: /NXscan_control/traj_SCAN/number_of_trajectory_points-field
number_of_triangle_sets: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/number_of_triangle_sets-field
number_of_triangles: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/number_of_triangles-field
number_of_unique_vertices: /NXcg_polyline_set/number_of_unique_vertices-field; /NXcg_triangle_set/number_of_unique_vertices-field
number_of_vertices: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_vertices-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_vertices-field; /NXcg_face_list_data_structure/number_of_vertices-field; /NXcg_half_edge_data_structure/number_of_vertices-field; /NXcg_polyline_set/number_of_vertices-field
number_sections: /NXguide/number_sections-field
numerical_aperture: /NXfiber/numerical_aperture-field; /NXlens_opt/numerical_aperture-field
numerical_label: /NXsimilarity_grouping/numerical_label-field
numerical_labels: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/numerical_labels-field
numerics: /NXmicrostructure_gragles_config/ENTRY/numerics-group; /NXmicrostructure_mtex_config/numerics-group; /NXmicrostructure_score_config/ENTRY/numerics-group
nxspe_info: /NXspe/ENTRY/NXSPE_info-group
obb: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb-group
objectid: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID-group
observed_frame: /NXreflections/observed_frame-field
observed_frame_errors: /NXreflections/observed_frame_errors-field
observed_frame_var: /NXreflections/observed_frame_var-field
observed_phi: /NXreflections/observed_phi-field
observed_phi_errors: /NXreflections/observed_phi_errors-field
observed_phi_var: /NXreflections/observed_phi_var-field
observed_px_x: /NXreflections/observed_px_x-field
observed_px_x_errors: /NXreflections/observed_px_x_errors-field
observed_px_x_var: /NXreflections/observed_px_x_var-field
observed_px_y: /NXreflections/observed_px_y-field
observed_px_y_errors: /NXreflections/observed_px_y_errors-field
observed_px_y_var: /NXreflections/observed_px_y_var-field
observed_x: /NXreflections/observed_x-field
observed_x_errors: /NXreflections/observed_x_errors-field
observed_x_var: /NXreflections/observed_x_var-field
observed_y: /NXreflections/observed_y-field
observed_y_errors: /NXreflections/observed_y_errors-field
observed_y_var: /NXreflections/observed_y_var-field
odd_layer_density: /NXmirror/odd_layer_density-field
odd_layer_material: /NXmirror/odd_layer_material-field
odf: /NXmicrostructure_mtex_config/path/odf-field
off_geometry: /NXbeam_stop/OFF_GEOMETRY-group; /NXbending_magnet/OFF_GEOMETRY-group; /NXcollimator/OFF_GEOMETRY-group; /NXcrystal/OFF_GEOMETRY-group; /NXdisk_chopper/OFF_GEOMETRY-group; /NXfermi_chopper/OFF_GEOMETRY-group; /NXfilter/OFF_GEOMETRY-group; /NXgrating/OFF_GEOMETRY-group; /NXguide/OFF_GEOMETRY-group; /NXinsertion_device/OFF_GEOMETRY-group; /NXmirror/OFF_GEOMETRY-group; /NXmoderator/OFF_GEOMETRY-group; /NXmonitor/OFF_GEOMETRY-group; /NXmonochromator/OFF_GEOMETRY-group; /NXsample/OFF_GEOMETRY-group; /NXsensor/OFF_GEOMETRY-group; /NXsensor_sts/OFF_GEOMETRY-group; /NXsolid_geometry/OFF_GEOMETRY-group; /NXsource/OFF_GEOMETRY-group; /NXvelocity_selector/OFF_GEOMETRY-group; /NXxraylens/OFF_GEOMETRY-group
offset: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/offset-field; /NXcalibration/offset-field; /NXcg_alpha_complex/offset-field; /NXcircuit/offset-field; /NXdata/offset-field; /NXiv_bias/offset-field; /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/offset-field; /NXprocess_mpes/energy_referencing/offset-field
offset_azimuth: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth-field
offset_polar: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar-field
offset_tilt: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt-field
offset_values: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/offset_values-field
offset_x: /NXdeflector/offset_x-field
offset_y: /NXdeflector/offset_y-field
omega: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/omega-field; /NXxrd_pan/ENTRY/experiment_config/omega-group; /NXxrd_pan/ENTRY/experiment_result/omega-field
oned_profile: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile-group; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile-group
open_gl_bug: /NXmicrostructure_mtex_config/system/open_gl_bug-field
openloop_amplification: /NXamplifier/openloop_amplification-field
operating_frequency: /NXcircuit/operating_frequency-field
operating_system: /NXcs_computer/operating_system-field
operation: /NXcsg/operation-field
operation_mode: /NXapm/ENTRY/operation_mode-field; /NXebeam_column/operation_mode-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/operation_mode-field
operator: /NXtransmission/ENTRY/operator-group
opt_window: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/OPT_WINDOW-group
optical_loss: /NXbeam_splitter/optical_loss-field
optical_system_em: /NXem_msr/em_lab/OPTICAL_SYSTEM_EM-group; /NXevent_data_em/em_lab/OPTICAL_SYSTEM_EM-group
orcid: /NXsensor_scan/ENTRY/USER/orcid-field
order_no: /NXcrystal/order_no-field
orientation: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/orientation-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/orientation-field; /NXcg_primitive_set/orientation-field; /NXcg_unit_normal_set/orientation-field; /NXcontainer/orientation-group; /NXgeometry/ORIENTATION-group; /NXmicrostructure_score_config/ENTRY/nucleation/orientation-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle: /NXbeam_path/window_NUMBER/orientation_angle-field; /NXopt_window/ENTRY/orientation_angle-field
orientation_distribution: /NXmicrostructure_imm_config/ENTRY/orientation_distribution-group
orientation_euler: /NXrotation_set/orientation_euler-field
orientation_matrix: /NXcrystal/orientation_matrix-field; /NXfilter/orientation_matrix-field; /NXlauetof/entry/sample/orientation_matrix-field; /NXsample/orientation_matrix-field; /NXsample_component/orientation_matrix-field; /NXsingle_crystal/orientation_matrix-field; /NXtas/entry/SAMPLE/orientation_matrix-field; /NXxbase/entry/sample/orientation_matrix-field
orientation_quaternion: /NXrotation_set/orientation_quaternion-field
orientation_spread: /NXmicrostructure/crystal/orientation_spread-field
origin: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field; /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/origin-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/origin-field; /NXcg_grid/origin-field; /NXcoordinate_system/origin-field; /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/origin-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/origin-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/origin-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/origin-field; /NXem_ebsd/gnomonic_reference_frame/origin-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/origin-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/origin-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin-group; /NXxps/ENTRY/geometries/xps_coordinate_system/origin-field
original_axis: /NXcalibration/original_axis-field
original_centre: /NXdistortion/original_centre-field
original_points: /NXdistortion/original_points-field
oscillating_n: /NXscan_control/linear_SCAN/oscillating_N-field; /NXscan_control/mesh_SCAN/oscillating_N-field; /NXscan_control/snake_SCAN/oscillating_N-field; /NXscan_control/spiral_SCAN/oscillating_N-field; /NXscan_control/traj_SCAN/oscillating_N-field
oscillation_frequency: /NXscan_control/linear_SCAN/oscillation_frequency-field; /NXscan_control/mesh_SCAN/oscillation_frequency-field; /NXscan_control/snake_SCAN/oscillation_frequency-field; /NXscan_control/spiral_SCAN/oscillation_frequency-field; /NXscan_control/traj_SCAN/oscillation_frequency-field
oscillator_excitation: /NXafm/ENTRY/experiment_instrument/CANTILEVER_SPM/cantilever_oscillator/oscillator_excitation-field
other_material: /NXbeam_path/window_NUMBER/other_material-field
other_shape: /NXbeam_splitter/SHAPE/other_shape-field; /NXpolarizer_opt/SHAPE/other_shape-field
other_type: /NXbeam_splitter/other_type-field; /NXlens_opt/other_type-field; /NXwaveplate/other_type-field
outer_diameter: /NXfresnel_zone_plate/outer_diameter-field
outer_plot_spacing: /NXmicrostructure_mtex_config/plotting/outer_plot_spacing-field
outermost_zone_width: /NXfresnel_zone_plate/outermost_zone_width-field
output: /NXactuator/OUTPUT-field; /NXiqproc/ENTRY/reduction/output-group; /NXsqom/ENTRY/reduction/output-group
output_channels: /NXcircuit/output_channels-field
output_grid: /NXmicrostructure_ipf/output_grid-group
output_impedance: /NXcircuit/output_impedance-field
output_log: /NXactuator/OUTPUT_log-group
output_signal: /NXcircuit/output_signal-field
output_slew_rate: /NXcircuit/output_slew_rate-field
overlaps: /NXreflections/overlaps-field
p_gain: /NXpositioner_sts/p_gain-field
p_pyroelectric_constant: /NXpiezoelectric_material/P_pyroelectric_constant-field
packing_fraction: /NXcontainer/packing_fraction-field
pair_separation: /NXdisk_chopper/pair_separation-field
parallelogramid: /NXcg_parallelogram_set/parallelogramID-group
parallelograms: /NXcg_parallelogram_set/parallelograms-group
parameter: /NXapm/ENTRY/atom_probe/reconstruction/parameter-field; /NXapm_reconstruction/parameter-field; /NXem_ebsd/indexing/parameter-group
parameter_reliability: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/parameter_reliability-field
parameter_units: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/parameter_units-field; /NXdispersion_repeated_parameter/parameter_units-field
parameters: /NXentry/PARAMETERS-group; /NXquadric/parameters-field; /NXsubentry/PARAMETERS-group; /NXtomoproc/entry/reconstruction/parameters-group; /NXxasproc/ENTRY/XAS_data_reduction/parameters-group
paraprobe: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe-group
parent: /NXregion/parent-field
parent_identifier: /NXapm/ENTRY/specimen/parent_identifier-group; /NXem/ENTRY/sample/parent_identifier-group
parent_mask: /NXregion/parent_mask-field
partiality: /NXreflections/partiality-field
pass_energy: /NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field; /NXenergydispersion/pass_energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
patch_filter: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter-group
patch_identifier: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_identifier-field
path: /NXapm/ENTRY/atom_probe/hit_finding/serialized/path-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/path-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/path-field; /NXapm/ENTRY/atom_probe/ranging/definitions/path-field; /NXapm/ENTRY/atom_probe/raw_data/serialized/path-field; /NXapm/ENTRY/atom_probe/reconstruction/config/path-field; /NXapm/ENTRY/atom_probe/reconstruction/results/path-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/path-field; /NXapm/ENTRY/serializedID/path-field; /NXapm_compositionspace_config/ENTRY/config/ranging/path-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/path-field; /NXapm_compositionspace_results/ENTRY/config/path-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/path-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/path-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/path-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/path-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/path-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/path-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/path-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/path-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/path-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/path-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/path-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/path-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/path-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/path-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/path-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/path-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/path-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/path-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/path-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/path-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/path-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/path-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/path-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/path-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/path-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/path-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/path-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/path-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/path-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/path-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/path-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/path-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/path-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/path-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/path-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/path-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/path-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/path-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/path-field; /NXem/ENTRY/roiID/ebsd/indexing/source/path-field; /NXem/ENTRY/roiID/ebsd/measurement/source/path-field; /NXem/ENTRY/roiID/ebsd/simulation/source/path-field; /NXem/ENTRY/serializedID/path-field; /NXem_calorimetry/ENTRY/actuator/path-field; /NXem_calorimetry/ENTRY/diffraction/path-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/path-field; /NXmicrostructure_mtex_config/path-group; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/path-field; /NXserialized/path-field
path_length: /NXsample/path_length-field
path_length_window: /NXsample/path_length_window-field
pattern_center: /NXem_calorimetry/ENTRY/pattern_center-group
pattern_centre: /NXem/ENTRY/roiID/ebsd/pattern_centre-group; /NXem_ebsd/pattern_centre-group
pattern_identifier: /NXem_calorimetry/ENTRY/time_synchronization/pattern_identifier-field
pca: /NXapm_compositionspace_config/ENTRY/config/segmentation/pca-group; /NXapm_compositionspace_results/ENTRY/segmentation/pca-group
peak: /NXapm_ranging/peak_search_and_deconvolution/PEAK-group; /NXem_eds/indexing/PEAK-group; /NXem_eels/indexing/PEAK-group
peak_identification: /NXapm/ENTRY/atom_probe/ranging/peak_identification-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification-group; /NXapm_ranging/peak_identification-group
peak_power: /NXbeam_path/SOURCE/peak_power-field; /NXsource/peak_power-field
peak_search: /NXapm/ENTRY/atom_probe/ranging/peak_search-group
peak_search_and_deconvolution: /NXapm_ranging/peak_search_and_deconvolution-group
peakid: /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID-group
peakpeak: /NXfit/peakPEAK-group; /NXxps/ENTRY/FIT/peakPEAK-group
peaks: /NXem_eds/indexing/IMAGE_SET/PROCESS/peaks-field
period: /NXgrating/period-field; /NXsource/period-field
pf: /NXmicrostructure_mtex_config/path/pf-field; /NXmicrostructure_pf/pf-group
pf_anno_fun_hdl: /NXmicrostructure_mtex_config/plotting/pf_anno_fun_hdl-field
pf_extensions: /NXmicrostructure_mtex_config/path/pf_extensions-field
phase: /NXdisk_chopper/phase-field; /NXinsertion_device/phase-field
phase_identifier: /NXcrystal_structure/phase_identifier-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_identifier-field; /NXem_ebsd/indexing/phase_identifier-field; /NXmicrostructure/crystal/phase_identifier-field; /NXmicrostructure/interface/phase_identifier-field; /NXmicrostructure/quadruple_junction/phase_identifier-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/phase_identifier-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field; /NXunit_cell/phase_identifier-field
phase_identifier_offset: /NXmicrostructure/crystal/phase_identifier_offset-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field
phase_lock_loop: /NXafm/ENTRY/experiment_instrument/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop-group; /NXcantilever_spm/cantilever_oscillator/phase_lock_loop-group
phase_matching: /NXem_ebsd/indexing/phase_matching-field
phase_matching_descriptor: /NXem_ebsd/indexing/phase_matching_descriptor-field
phase_name: /NXcrystal_structure/phase_name-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_name-field; /NXunit_cell/phase_name-field
phase_shift: /NXcantilever_spm/cantilever_oscillator/phase_shift-field
phaseid: /NXem/ENTRY/roiID/ebsd/indexing/phaseID-group; /NXem_ebsd/indexing/phaseID-group
phaseplateid: /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/phaseplateID-group
phi: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/phi-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/phi-field; /NXxeuler/entry/name/phi-link; /NXxeuler/entry/sample/phi-field; /NXxkappa/entry/name/phi-link; /NXxkappa/entry/sample/phi-field; /NXxrd_pan/ENTRY/experiment_result/phi-field
phi_two_plot: /NXmicrostructure_odf/phi_two_plot-group
photo_detector: /NXafm/ENTRY/experiment_instrument/photo_detector-group
physical_form: /NXmpes/ENTRY/SAMPLE/physical_form-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/physical_form-field; /NXsample/physical_form-field
physical_process: /NXhistory/PHYSICAL_PROCESS-group
physical_quantity: /NXactuator/physical_quantity-field; /NXcalibration/physical_quantity-field; /NXelectronanalyser/angular_resolution/physical_quantity-field; /NXelectronanalyser/energy_resolution/physical_quantity-field; /NXelectronanalyser/momentum_resolution/physical_quantity-field; /NXelectronanalyser/spatial_resolution/physical_quantity-field; /NXmanipulator/cryostat/physical_quantity-field; /NXmanipulator/sample_bias_potentiostat/physical_quantity-field; /NXmanipulator/sample_heater/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/physical_quantity-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/physical_quantity-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/physical_quantity-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/physical_quantity-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/physical_quantity-field; /NXprocess_mpes/angularN_calibration/physical_quantity-field; /NXprocess_mpes/delay_calibration/physical_quantity-field; /NXprocess_mpes/ellipticity_calibration/physical_quantity-field; /NXprocess_mpes/energy_calibration/physical_quantity-field; /NXprocess_mpes/energy_referencing/physical_quantity-field; /NXprocess_mpes/kN_calibration/physical_quantity-field; /NXprocess_mpes/polarization_angle_calibration/physical_quantity-field; /NXprocess_mpes/spatialN_calibration/physical_quantity-field; /NXresolution/physical_quantity-field
pid: /NXactuator/PID-group; /NXmanipulator/cryostat/PID-group; /NXmanipulator/sample_bias_potentiostat/PID-group; /NXmanipulator/sample_heater/PID-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
piezo_calibration: /NXpositioner_sts/piezo_calibration-field
piezo_configuration: /NXafm/ENTRY/experiment_instrument/XY_piezo_sensor/piezo_configuration-group; /NXafm/ENTRY/experiment_instrument/height_piezo_sensor/piezo_configuration-group; /NXspm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration-group; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration-group
piezo_material: /NXafm/ENTRY/experiment_instrument/XY_piezo_sensor/piezo_configuration/piezo_material-group; /NXafm/ENTRY/experiment_instrument/height_piezo_sensor/piezo_configuration/piezo_material-group; /NXpiezo_config_spm/piezo_material-group; /NXspm/ENTRY/experiment_instrument/piezo_sensor/piezo_material-group
piezo_material_identifier: /NXpiezoelectric_material/piezo_material_identifier-group
piezo_sensor: /NXspm/ENTRY/experiment_instrument/piezo_sensor-group; /NXspm/ENTRY/experiment_instrument/scan_environment/piezo_sensor-group; /NXstm/ENTRY/experiment_instrument/piezo_sensor-group
pinhole: /NXbeam_path/PINHOLE-group
pinhole_position: /NXpulser_apm/SOURCE/BEAM/pinhole_position-field
pitch: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field; /NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id: /NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field; /NXsnshisto/ENTRY/DATA/pixel_id-link; /NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask: /NXdetector/pixel_mask-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied: /NXdetector/pixel_mask_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_time: /NXscanbox_em/pixel_time-field
pixel_x: /NXdata_mpes_detector/pixel_x-field
pixel_y: /NXdata_mpes_detector/pixel_y-field
pixels_line: /NXpositioner_sts/pixels_line-field
plot: /NXdispersive_material/ENTRY/dispersion_x/plot-group; /NXdispersive_material/ENTRY/dispersion_y/plot-group; /NXdispersive_material/ENTRY/dispersion_z/plot-group
plotting: /NXmicrostructure_mtex_config/plotting-group
point_group: /NXcrystal_structure/point_group-field; /NXsample/point_group-field; /NXsample_component/point_group-field; /NXunit_cell/point_group-field
point_identifier: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/point_identifier-field
point_normal_form: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface/point_normal_form-field
point_set_wrapping: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping-group
point_setid: /NXcg_alpha_complex/point_setID-group
point_to_triangle: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle-group
poison_depth: /NXmoderator/poison_depth-field
poison_material: /NXmoderator/poison_material-field
polar: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar-field; /NXspe/ENTRY/data/polar-field
polar_angle: /NXcrystal/polar_angle-field; /NXdetector/polar_angle-field; /NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field; /NXlauetof/entry/instrument/detector/polar_angle-field; /NXmonopd/entry/DATA/polar_angle-link; /NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field; /NXreflections/polar_angle-field; /NXrefscan/entry/data/polar_angle-link; /NXrefscan/entry/instrument/DETECTOR/polar_angle-field; /NXreftof/entry/instrument/detector/polar_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXsastof/ENTRY/instrument/detector/polar_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field; /NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field; /NXtas/entry/INSTRUMENT/analyser/polar_angle-field; /NXtas/entry/SAMPLE/polar_angle-field; /NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field; /NXtofraw/entry/instrument/detector/polar_angle-field; /NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field; /NXxeuler/entry/instrument/detector/polar_angle-field; /NXxeuler/entry/name/polar_angle-link; /NXxkappa/entry/instrument/detector/polar_angle-field; /NXxkappa/entry/name/polar_angle-link; /NXxnb/entry/instrument/detector/polar_angle-field; /NXxnb/entry/name/polar_angle-link; /NXxrd/ENTRY/DATA/polar_angle-field; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXxrot/entry/instrument/detector/polar_angle-field
polar_width: /NXspe/ENTRY/data/polar_width-field
polarization_angle: /NXdata_mpes/polarization_angle-field; /NXdata_mpes_detector/polarization_angle-field
polarization_angle_calibration: /NXmpes/ENTRY/PROCESS_MPES/polarization_angle_calibration-group; /NXprocess_mpes/polarization_angle_calibration-group
polarizer: /NXinstrument/POLARIZER-group; /NXsnsevent/ENTRY/instrument/POLARIZER-group; /NXsnshisto/ENTRY/instrument/POLARIZER-group; /NXtransmission/ENTRY/instrument/polarizer-field
polarizer_angle: /NXpolarizer_opt/polarizer_angle-field
polarizer_opt: /NXbeam_path/POLARIZER_OPT-group
polarizing: /NXbeam_splitter/polarizing-field
poles: /NXinsertion_device/poles-field
polfilter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE-group
polygon_half_edgeid: /NXcg_polygon_set/polygon_half_edgeID-group
polygonid: /NXcg_polygon_set/polygonID-group
polygons: /NXcg_polygon_set/polygons-group
polyhedra: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra-group; /NXcg_polyhedron_set/polyhedra-group
polyhedron: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron-group
polyhedron_half_edgeid: /NXcg_polyhedron_set/polyhedron_half_edgeID-group
polyhedron_set: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/polyhedron_set-group
polyhedronid: /NXcg_polyhedron_set/polyhedronID-group
polyline_identifier: /NXmicrostructure/triple_junction/polyline_identifier-field
polylines: /NXcg_polyline_set/polylines-field
position: /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/position-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/position-field; /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/position-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/position-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/position-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/position-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/position-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/position-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/position-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/position-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/position-field; /NXapm_paraprobe_tool_config/reconstruction/position-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/position-field; /NXcg_grid/position-field; /NXcg_half_edge_data_structure/position-field; /NXcg_point_set/position-field; /NXem_calorimetry/ENTRY/pattern_center/result/position-field; /NXenvironment/position-group; /NXfit_background/data/position-field; /NXmicrostructure/quadruple_junction/position-field; /NXmicrostructure/triple_junction/position-field; /NXpeak/data/position-field; /NXpositioner_sts/position-group; /NXstage_lab/position-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/position-field; /NXxps/ENTRY/FIT/peakPEAK/data/position-field; /NXxps/ENTRY/FIT/peakPEAK/function/position-group
position_x: /NXxpcs/entry/sample/position_x-group
position_y: /NXxpcs/entry/sample/position_y-group
position_z: /NXxpcs/entry/sample/position_z-group
positioner: /NXaperture/POSITIONER-group; /NXinstrument/POSITIONER-group; /NXmanipulator/POSITIONER-group; /NXsample/POSITIONER-group; /NXsnsevent/ENTRY/DASlogs/POSITIONER-group; /NXsnshisto/ENTRY/DASlogs/POSITIONER-group; /NXstage_lab/POSITIONER-group
positioner_spm: /NXafm/ENTRY/experiment_instrument/XY_piezo_sensor/POSITIONER_SPM-group; /NXafm/ENTRY/experiment_instrument/height_piezo_sensor/POSITIONER_SPM-group; /NXbias_spectroscopy/POSITIONER_SPM-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM-group; /NXspm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM-group; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM-group
potentiostat: /NXmpes/ENTRY/SAMPLE/bias_env/potentiostat-group
power: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/power-field; /NXinsertion_device/power-field; /NXpulser_apm/SOURCE/power-field; /NXsource/power-field; /NXxps/ENTRY/INSTRUMENT/sourceTYPE/power-field
power_consumption: /NXcircuit/power_consumption-field
power_loss: /NXfiber/power_loss-field
power_source: /NXcircuit/power_source-field
power_spectral_density: /NXsensor_sts/power_spectral_density-field
pre_factor: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/pre_factor-field
pre_sample_flightpath: /NXentry/pre_sample_flightpath-field; /NXsubentry/pre_sample_flightpath-field; /NXtofnpd/entry/pre_sample_flightpath-field; /NXtofraw/entry/pre_sample_flightpath-field; /NXtofsingle/entry/pre_sample_flightpath-field
predicted_frame: /NXreflections/predicted_frame-field
predicted_phi: /NXreflections/predicted_phi-field
predicted_px_x: /NXreflections/predicted_px_x-field
predicted_px_y: /NXreflections/predicted_px_y-field
predicted_x: /NXreflections/predicted_x-field
predicted_y: /NXreflections/predicted_y-field
preparation_date: /NXapm/ENTRY/specimen/preparation_date-field; /NXarchive/entry/sample/preparation_date-field; /NXem/ENTRY/sample/preparation_date-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/preparation_date-field; /NXsample/preparation_date-field
preprocessing: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing-group
preset: /NXfluo/entry/MONITOR/preset-field; /NXlauetof/entry/control/preset-field; /NXmonitor/preset-field; /NXmonopd/entry/MONITOR/preset-field; /NXrefscan/entry/control/preset-field; /NXreftof/entry/control/preset-field; /NXsas/ENTRY/MONITOR/preset-field; /NXsastof/ENTRY/control/preset-field; /NXtas/entry/MONITOR/preset-field; /NXtofnpd/entry/MONITOR/preset-field; /NXtofraw/entry/MONITOR/preset-field; /NXtofsingle/entry/MONITOR/preset-field; /NXxas/ENTRY/MONITOR/preset-field; /NXxbase/entry/control/preset-field
pressure: /NXarchive/entry/sample/pressure-field; /NXevent_data_apm/instrument/analysis_chamber/pressure-field; /NXevent_data_apm/instrument/buffer_chamber/pressure-field; /NXevent_data_apm/instrument/load_lock_chamber/pressure-field; /NXsample/pressure-field; /NXsensor_sts/pressure-field
pressure_gauge: /NXmpes/ENTRY/INSTRUMENT/pressure_gauge-group; /NXmpes/ENTRY/SAMPLE/gas_pressure_env/pressure_gauge-group
previous_device: /NXbeam/previous_device-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE/previous_device-field
previous_devices: /NXbeam_device/previous_devices-field
previous_source: /NXsource/previous_source-field
prf_cc: /NXreflections/prf_cc-field
probability_mass: /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/probability_mass-field; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/probability_mass-field
probe: /NXarchive/entry/instrument/SOURCE/probe-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field; /NXebeam_column/electron_source/probe-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/probe-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source/probe-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/probe-group; /NXfluo/entry/INSTRUMENT/SOURCE/probe-field; /NXibeam_column/ion_source/probe-group; /NXiqproc/ENTRY/instrument/SOURCE/probe-field; /NXmonopd/entry/INSTRUMENT/SOURCE/probe-field; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/probe-field; /NXoptical_system_em/probe-group; /NXrefscan/entry/instrument/SOURCE/probe-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXsastof/ENTRY/instrument/source/probe-field; /NXsnsevent/ENTRY/instrument/SNS/probe-field; /NXsnshisto/ENTRY/instrument/SNS/probe-field; /NXsource/probe-field; /NXsqom/ENTRY/instrument/SOURCE/probe-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXtas/entry/INSTRUMENT/SOURCE/probe-field; /NXtomo/entry/instrument/SOURCE/probe-field; /NXtomophase/entry/instrument/SOURCE/probe-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXxbase/entry/instrument/source/probe-field
probe_current: /NXoptical_system_em/probe_current-field
procedure: /NXopt_window/ENTRY/window_correction/procedure-field
process: /NXcanSAS/ENTRY/PROCESS-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS-group; /NXem_correlation/PROCESS-group; /NXem_eds/indexing/IMAGE_SET/PROCESS-group; /NXem_method/PROCESS-group; /NXentry/PROCESS-group; /NXimage_set/PROCESS-group; /NXinteraction_vol_em/PROCESS-group; /NXroi/PROCESS-group; /NXsensor_scan/ENTRY/PROCESS-group; /NXspectrum_set/PROCESS-group; /NXsubentry/PROCESS-group; /NXxpcs/PROCESS-group; /NXxrd/ENTRY/PROCESS-group
process_identifier: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/process_identifier-field
process_mpes: /NXmpes/ENTRY/PROCESS_MPES-group; /NXxps/ENTRY/PROCESS_MPES-group
processing: /NXcs_computer/processing-group
processing_reference_frame: /NXcoordinate_system_set/processing_reference_frame-group; /NXem/ENTRY/coordinate_system_set/processing_reference_frame-group
profile: /NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
profiling: /NXapm/ENTRY/profiling-group; /NXapm_compositionspace_results/ENTRY/profiling-group; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling-group; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling-group; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling-group; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling-group; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling-group; /NXapm_paraprobe_selector_config/ENTRY/common/profiling-group; /NXapm_paraprobe_selector_results/ENTRY/common/profiling-group; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling-group; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling-group; /NXapm_paraprobe_tool_common/profiling-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling-group; /NXem/ENTRY/profiling-group; /NXem_calorimetry/ENTRY/profiling-group; /NXmicrostructure_gragles_config/ENTRY/profiling-group; /NXmicrostructure_imm_results/ENTRY/profiling-group; /NXmicrostructure_kanapy_results/ENTRY/profiling-group; /NXmicrostructure_score_config/ENTRY/profiling-group
program: /NXapm/ENTRY/atom_probe/hit_finding/programID/program-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program-field; /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program-field; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program-field; /NXapm/ENTRY/atom_probe/ranging/programID/program-field; /NXapm/ENTRY/atom_probe/raw_data/programID/program-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program-field; /NXapm/ENTRY/atom_probe/reconstruction/programID/program-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program-field; /NXapm/ENTRY/profiling/programID/program-field; /NXapm_compositionspace_results/ENTRY/programID/program-field; /NXapm_hit_finding/PROGRAM-group; /NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_distancer_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_distancer_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_intersector_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_intersector_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_ranger_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_ranger_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_selector_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_selector_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program-field; /NXapm_paraprobe_tool_common/PROGRAM-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program-field; /NXapm_ranging/PROGRAM-group; /NXapm_ranging/background_quantification/PROGRAM-group; /NXapm_ranging/mass_to_charge_distribution/PROGRAM-group; /NXapm_ranging/peak_identification/PROGRAM-group; /NXapm_ranging/peak_search_and_deconvolution/PROGRAM-group; /NXapm_reconstruction/PROGRAM-group; /NXapm_reconstruction/naive_discretization/PROGRAM-group; /NXapm_sim/PROGRAM-group; /NXapm_volt_and_bowl/PROGRAM-group; /NXarchive/entry/program-field; /NXcg_marching_cubes/PROGRAM-group; /NXcomponent/PROGRAM-group; /NXcs_prng/PROGRAM-group; /NXellipsometry/ENTRY/data_collection/data_software/program-field; /NXem/ENTRY/measurement/em_lab/control_programID/program-field; /NXem/ENTRY/profiling/programID/program-field; /NXem_calorimetry/ENTRY/azimuthal_integration/programID/program-field; /NXem_calorimetry/ENTRY/background_subtraction/programID/program-field; /NXem_calorimetry/ENTRY/distortion_correction/programID/program-field; /NXem_eds/indexing/PROGRAM-group; /NXem_eels/indexing/PROGRAM-group; /NXem_eels/zlp_correction/PROGRAM-group; /NXem_sim/simulation/PROGRAM-group; /NXenvironment/program-field; /NXimage_set/PROCESS/PROGRAM-group; /NXiqproc/ENTRY/reduction/program-field; /NXmicrostructure/configuration/PROGRAM-group; /NXmicrostructure_gragles_config/ENTRY/environment/programID/program-field; /NXmicrostructure_gragles_results/ENTRY/environment/programID/program-field; /NXmicrostructure_imm_results/ENTRY/environment/programID/program-field; /NXmicrostructure_imm_results/ENTRY/program1/program-field; /NXmicrostructure_kanapy_results/ENTRY/environment/programID/program-field; /NXmicrostructure_kanapy_results/ENTRY/program1/program-field; /NXmicrostructure_kanapy_results/ENTRY/program2/program-field; /NXmicrostructure_score_config/ENTRY/environment/programID/program-field; /NXmicrostructure_score_results/ENTRY/environment/programID/program-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program-field; /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/program-field; /NXprocess/program-field; /NXprocess_mpes/program-field; /NXprogram/program-field; /NXsensor_scan/ENTRY/PROCESS/program-field; /NXspectrum_set/PROCESS/PROGRAM-group; /NXsqom/ENTRY/reduction/program-field; /NXtomoproc/entry/reconstruction/program-field; /NXxasproc/ENTRY/XAS_data_reduction/program-field
program1: /NXmicrostructure_gragles_config/ENTRY/program1-group; /NXmicrostructure_gragles_results/ENTRY/program1-group; /NXmicrostructure_imm_results/ENTRY/program1-group; /NXmicrostructure_kanapy_results/ENTRY/program1-group; /NXmicrostructure_score_config/ENTRY/program1-group; /NXmicrostructure_score_results/ENTRY/program1-group
program2: /NXmicrostructure_kanapy_results/ENTRY/program2-group
program_name: /NXentry/program_name-field; /NXmicrostructure_gragles_config/ENTRY/program1/program_name-field; /NXmicrostructure_gragles_results/ENTRY/program1/program_name-field; /NXmicrostructure_score_config/ENTRY/program1/program_name-field; /NXmicrostructure_score_results/ENTRY/program1/program_name-field; /NXspe/ENTRY/program_name-field; /NXsubentry/program_name-field
programid: /NXapm/ENTRY/atom_probe/hit_finding/programID-group; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID-group; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID-group; /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID-group; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID-group; /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID-group; /NXapm/ENTRY/atom_probe/ranging/peak_search/programID-group; /NXapm/ENTRY/atom_probe/ranging/programID-group; /NXapm/ENTRY/atom_probe/raw_data/programID-group; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID-group; /NXapm/ENTRY/atom_probe/reconstruction/programID-group; /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID-group; /NXapm/ENTRY/profiling/programID-group; /NXapm_compositionspace_results/ENTRY/programID-group; /NXapm_paraprobe_clusterer_config/ENTRY/common/programID-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/programID-group; /NXapm_paraprobe_distancer_config/ENTRY/common/programID-group; /NXapm_paraprobe_distancer_results/ENTRY/common/programID-group; /NXapm_paraprobe_intersector_config/ENTRY/common/programID-group; /NXapm_paraprobe_intersector_results/ENTRY/common/programID-group; /NXapm_paraprobe_nanochem_config/ENTRY/common/programID-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/programID-group; /NXapm_paraprobe_ranger_config/ENTRY/common/programID-group; /NXapm_paraprobe_ranger_results/ENTRY/common/programID-group; /NXapm_paraprobe_selector_config/ENTRY/common/programID-group; /NXapm_paraprobe_selector_results/ENTRY/common/programID-group; /NXapm_paraprobe_spatstat_config/ENTRY/common/programID-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/programID-group; /NXapm_paraprobe_surfacer_config/ENTRY/common/programID-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/programID-group; /NXapm_paraprobe_tessellator_config/ENTRY/common/programID-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/programID-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/programID-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/programID-group; /NXem/ENTRY/profiling/programID-group; /NXem_calorimetry/ENTRY/azimuthal_integration/programID-group; /NXem_calorimetry/ENTRY/background_subtraction/programID-group; /NXem_calorimetry/ENTRY/distortion_correction/programID-group; /NXmicrostructure_gragles_config/ENTRY/environment/programID-group; /NXmicrostructure_gragles_results/ENTRY/environment/programID-group; /NXmicrostructure_imm_results/ENTRY/environment/programID-group; /NXmicrostructure_kanapy_results/ENTRY/environment/programID-group; /NXmicrostructure_score_config/ENTRY/environment/programID-group; /NXmicrostructure_score_results/ENTRY/environment/programID-group
projection: /NXcollectioncolumn/projection-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
projection_direction: /NXmicrostructure_ipf/projection_direction-field
protection_features: /NXcircuit/protection_features-field
protocol_name: /NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field; /NXapm_reconstruction/protocol_name-field
proton_charge: /NXsnsevent/ENTRY/proton_charge-field; /NXsnshisto/ENTRY/proton_charge-field
psi: /NXspe/ENTRY/NXSPE_info/psi-field
pulse_delay: /NXbeam/pulse_delay-field
pulse_duration: /NXbeam/pulse_duration-field
pulse_energy: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy-field; /NXbeam/pulse_energy-field; /NXpulser_apm/SOURCE/pulse_energy-field; /NXsource/pulse_energy-field
pulse_fraction: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction-field; /NXpulser_apm/pulse_fraction-field
pulse_frequency: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency-field; /NXpulser_apm/pulse_frequency-field
pulse_height: /NXevent_data/pulse_height-field
pulse_identifier: /NXevent_data_apm/pulse_identifier-field
pulse_identifier_offset: /NXevent_data_apm/pulse_identifier_offset-field
pulse_mode: /NXapm/ENTRY/measurement/instrument/pulser/pulse_mode-field; /NXpulser_apm/pulse_mode-field
pulse_number: /NXpulser_apm/pulse_number-field
pulse_shape: /NXmoderator/pulse_shape-group; /NXsource/pulse_shape-group
pulse_time: /NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link; /NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_voltage: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage-field; /NXpulser_apm/pulse_voltage-field
pulse_width: /NXsource/pulse_width-field
pulser: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser-group; /NXapm/ENTRY/measurement/instrument/pulser-group; /NXapm_msr/instrument/pulser-group; /NXevent_data_apm/instrument/pulser-group
pump: /NXem/ENTRY/measurement/em_lab/PUMP-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/PUMP-group; /NXem_msr/em_lab/PUMP-group; /NXevent_data_em/em_lab/PUMP-group
purpose: /NXbeam_device/purpose-field
pv_sensor: /NXpid/pv_sensor-group; /NXpositioner/actuator/feedback/pv_sensor-group
q: /NXcanSAS/ENTRY/DATA/Q-field; /NXxrd_pan/ENTRY/q_data/q-field
q_data: /NXxrd_pan/ENTRY/q_data-group
q_norm: /NXxrd_pan/ENTRY/experiment_result/q_norm-field
q_parallel: /NXxrd_pan/ENTRY/experiment_result/q_parallel-field; /NXxrd_pan/ENTRY/q_data/q_parallel-field
q_perpendicular: /NXxrd_pan/ENTRY/experiment_result/q_perpendicular-field; /NXxrd_pan/ENTRY/q_data/q_perpendicular-field
qdev: /NXcanSAS/ENTRY/DATA/Qdev-field
qh: /NXtas/entry/DATA/qh-link; /NXtas/entry/SAMPLE/qh-field
qk: /NXtas/entry/DATA/qk-link; /NXtas/entry/SAMPLE/qk-field
ql: /NXtas/entry/DATA/ql-link; /NXtas/entry/SAMPLE/ql-field
qmean: /NXcanSAS/ENTRY/DATA/Qmean-field
quadric: /NXsolid_geometry/QUADRIC-group
quadruple_junction: /NXmicrostructure/quadruple_junction-group
qx: /NXiqproc/ENTRY/DATA/qx-field; /NXsqom/ENTRY/DATA/qx-field
qy: /NXiqproc/ENTRY/DATA/qy-field; /NXsqom/ENTRY/DATA/qy-field
qz: /NXsqom/ENTRY/DATA/qz-field
r_5: /NXcorrector_cs/tableauID/r_5-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5-group
r_slit: /NXfermi_chopper/r_slit-field
radiation: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radii: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/radii-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/radii-field; /NXcg_cylinder_set/radii-field; /NXcg_sphere_set/radii-field
radius: /NXcg_cylinder_set/radius-field; /NXcg_sphere_set/radius-field; /NXdisk_chopper/radius-field; /NXenergydispersion/radius-field; /NXfermi_chopper/radius-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius-field; /NXvelocity_selector/radius-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/radius-field
raman_experiment_type: /NXraman/ENTRY/raman_experiment_type-field
raman_experiment_type_other: /NXraman/ENTRY/raman_experiment_type_other-field
random_forest_classifier: /NXapm_compositionspace_config/ENTRY/config/autophase/random_forest_classifier-group
random_number_generator: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator-group
randomize_iontypes: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/randomize_iontypes-field
range: /NXapm_paraprobe_ranger_config/ENTRY/range-group; /NXmonitor/range-field
range_n: /NXpiezo_config_spm/calibration/range_N-field
ranging: /NXapm/ENTRY/atom_probe/ranging-group; /NXapm_compositionspace_config/ENTRY/config/ranging-group; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging-group; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging-group; /NXapm_paraprobe_selector_config/ENTRY/select/ranging-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging-group; /NXapm_paraprobe_tool_config/ranging-group; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging-group
ranging_definitions: /NXapm_compositionspace_config/ENTRY/config/ranging/ranging_definitions-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/ranging_definitions-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/ranging_definitions-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/ranging_definitions-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/ranging_definitions-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/ranging_definitions-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/ranging_definitions-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/ranging_definitions-field; /NXapm_paraprobe_tool_config/ranging/ranging_definitions-field
ratio: /NXdisk_chopper/ratio-field
ratio_k_alphatwo_k_alphaone: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/ratio_k_alphatwo_k_alphaone-field
raw: /NXdata_mpes_detector/raw-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data/raw-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data/raw-field
raw_data: /NXapm/ENTRY/atom_probe/raw_data-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data-group; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/raw_data-group
raw_file: /NXtomoproc/entry/reconstruction/parameters/raw_file-field; /NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames: /NXsnsevent/ENTRY/raw_frames-field; /NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight: /NXdetector/raw_time_of_flight-field
raw_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl/raw_tof-field; /NXapm_volt_and_bowl/raw_tof-field
raw_value: /NXlog/raw_value-field; /NXpositioner/raw_value-field; /NXpositioner_sts/raw_value-field
rcs_description: /NXrcs/rcs_description-field
rcs_fabrication: /NXrcs/rcs_fabrication-group
rcs_frequency: /NXrcs/rcs_frequency-field; /NXspm/ENTRY/experiment_instrument/real_time_controller/rcs_frequency-field
rcs_manufacturer: /NXrcs/rcs_manufacturer-field
rcs_name: /NXrcs/rcs_name-field
rcs_serial_number: /NXrcs/rcs_serial_number-field
rcs_type: /NXrcs/rcs_type-field
rdeform_field: /NXdistortion/rdeform_field-field
rdf: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf-group; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf-group
read_bfield_current: /NXseparator/read_Bfield_current-group; /NXspin_rotator/read_Bfield_current-group
read_bfield_voltage: /NXseparator/read_Bfield_voltage-group; /NXspin_rotator/read_Bfield_voltage-group
read_current: /NXelectrostatic_kicker/read_current-group; /NXmagnetic_kicker/read_current-group; /NXquadrupole_magnet/read_current-group; /NXsolenoid_magnet/read_current-group
read_efield_current: /NXseparator/read_Efield_current-group; /NXspin_rotator/read_Efield_current-group
read_efield_voltage: /NXseparator/read_Efield_voltage-group; /NXspin_rotator/read_Efield_voltage-group
read_voltage: /NXelectrostatic_kicker/read_voltage-group; /NXmagnetic_kicker/read_voltage-group; /NXquadrupole_magnet/read_voltage-group; /NXsolenoid_magnet/read_voltage-group
real: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/real-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/real-field; /NXimage_set/image_1d/real-field; /NXimage_set/image_2d/real-field; /NXimage_set/image_3d/real-field; /NXimage_set/stack_1d/real-field; /NXimage_set/stack_2d/real-field; /NXimage_set/stack_3d/real-field
real_time: /NXdetector/real_time-field
real_time_controller: /NXspm/ENTRY/experiment_instrument/real_time_controller-group
realloc_cell_cache: /NXmicrostructure_score_config/ENTRY/numerics/realloc_cell_cache-field
reconstructed_positions: /NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions-field; /NXapm_reconstruction/reconstructed_positions-field
reconstruction: /NXapm/ENTRY/atom_probe/reconstruction-group; /NXapm_compositionspace_config/ENTRY/config/reconstruction-group; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction-group; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction-group; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction-group; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction-group; /NXapm_paraprobe_tool_config/reconstruction-group; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction-group; /NXtomoproc/entry/reconstruction-group
record_final_z: /NXiv_bias/record_final_z-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/record_final_z-field
recover_evaporation_id: /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/recover_evaporation_id-field
recrystallization_front: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front-group
recrystallized_grain_identifier: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/recrystallized_grain_identifier-field
recrystallized_volume_fraction: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/recrystallized_volume_fraction-field
rediscretization: /NXmicrostructure_score_config/ENTRY/solitary_unit/rediscretization-field
reduction: /NXiqproc/ENTRY/reduction-group; /NXsqom/ENTRY/reduction-group
ref_attenuator: /NXtransmission/ENTRY/instrument/ref_attenuator-group
ref_phase_n: /NXlockin/ref_phase_N-field
reference: /NXcrystal_structure/reference-group; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/reference-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/reference-field
reference_amplitude: /NXcantilever_spm/cantilever_oscillator/reference_amplitude-field; /NXlockin/reference_amplitude-field
reference_burgers_magnitude: /NXmicrostructure_score_config/ENTRY/material_properties/reference_burgers_magnitude-field
reference_data_link: /NXbeam_path/window_NUMBER/reference_data_link-field; /NXellipsometry/ENTRY/data_collection/reference_data_link-field; /NXopt_window/ENTRY/window_correction/reference_data_link-field
reference_frames: /NXoptical_spectroscopy/ENTRY/reference_frames-group
reference_frequency: /NXcantilever_spm/cantilever_oscillator/reference_frequency-field; /NXlockin/reference_frequency-field
reference_measurement: /NXcontainer/reference_measurement-link
reference_peak: /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/reference_peak-field; /NXprocess_mpes/energy_referencing/reference_peak-field
reference_phase: /NXcantilever_spm/cantilever_oscillator/reference_phase-field; /NXlockin/reference_phase-field
reference_plane: /NXbeam/TRANSFORMATIONS/reference_plane-field
reference_shear_modulus: /NXmicrostructure_score_config/ENTRY/material_properties/reference_shear_modulus-field
references: /NXdispersive_material/ENTRY/REFERENCES-group
reflectance: /NXbeam_splitter/reflectance-field; /NXlens_opt/reflectance-field; /NXwaveplate/reflectance-field
reflection: /NXcrystal/reflection-field; /NXpolarizer/reflection-field; /NXpolarizer_opt/reflection-field
reflection_id: /NXreflections/reflection_id-field
reflectivity: /NXcrystal/reflectivity-group; /NXguide/reflectivity-group; /NXmirror/reflectivity-group; /NXoptical_spectroscopy/ENTRY/derived_parameters/reflectivity-field
reflectron: /NXapm/ENTRY/measurement/instrument/reflectron-group; /NXapm_msr/instrument/REFLECTRON-group; /NXevent_data_apm/instrument/REFLECTRON-group
refractive_index: /NXdispersion_table/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/refractive_index-field
region_origin: /NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size: /NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
registration: /NXprocess/REGISTRATION-group; /NXprocess_mpes/REGISTRATION-group
regularize_alpha_complex: /NXcg_alpha_complex/regularize_alpha_complex-field
relation: /NXgraph_root/relation-group
relative_area: /NXfit/peakPEAK/relative_area-field
relative_atomic_concentration: /NXxps/ENTRY/FIT/peakPEAK/relative_atomic_concentration-field
relative_intensity: /NXcrystal_structure/relative_intensity-field; /NXelectronanalyser/transmission_function/relative_intensity-field; /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/relative_intensity-field; /NXprocess_mpes/transmission_correction/transmission_function/relative_intensity-field
relative_mobility: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/relative_mobility-field
relative_molecular_mass: /NXcontainer/relative_molecular_mass-field; /NXsample/relative_molecular_mass-field; /NXsample_component/relative_molecular_mass-field
relative_permittivity: /NXpiezoelectric_material/relative_permittivity-field
relative_resolution: /NXelectronanalyser/energy_resolution/relative_resolution-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/relative_resolution-field; /NXresolution/relative_resolution-field
relative_resolution_errors: /NXresolution/relative_resolution_errors-field
relative_sensitivity_factor: /NXfit/peakPEAK/relative_sensitivity_factor-field
release_date: /NXarchive/entry/release_date-field
removal: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
representation: /NXdispersion_function/representation-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/representation-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/representation-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/representation-field; /NXmicrostructure/crystal/representation-field; /NXmicrostructure/interface/representation-field; /NXmicrostructure/quadruple_junction/representation-field; /NXmicrostructure/triple_junction/representation-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/representation-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field
reproducibility_indicators: /NXspm/ENTRY/reproducibility_indicators-group; /NXstm/ENTRY/reproducibility_indicators-group
requested_pixel_time: /NXscanbox_em/requested_pixel_time-field
reset_bias: /NXbias_sweep/linear_sweep/reset_bias-field; /NXiv_bias/reset_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep/reset_bias-field
residual: /NXfit/data/residual-field; /NXxps/ENTRY/FIT/data/residual-field
resolution: /NXelectronanalyser/RESOLUTION-group; /NXelectronanalyser/angular_resolution/resolution-field; /NXelectronanalyser/energy_resolution/resolution-field; /NXelectronanalyser/momentum_resolution/resolution-field; /NXelectronanalyser/spatial_resolution/resolution-field; /NXinstrument/RESOLUTION-group; /NXmicrostructure_odf/configuration/resolution-field; /NXmicrostructure_odf/sampling/resolution-field; /NXmicrostructure_pf/configuration/resolution-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/resolution-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/resolution-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/resolution-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/resolution-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/resolution-field; /NXresolution/resolution-field
resolution_errors: /NXelectronanalyser/angular_resolution/resolution_errors-field; /NXelectronanalyser/energy_resolution/resolution_errors-field; /NXelectronanalyser/momentum_resolution/resolution_errors-field; /NXelectronanalyser/spatial_resolution/resolution_errors-field; /NXresolution/resolution_errors-field
resolution_formula: /NXresolution/resolution_formula-field
resolution_indicators: /NXspm/ENTRY/resolution_indicators-group; /NXstm/ENTRY/resolution_indicators-group
response_function: /NXresolution/response_function-group
response_time: /NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
result: /NXapm_compositionspace_results/ENTRY/autophase/result-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result-group; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result-group; /NXem_calorimetry/ENTRY/azimuthal_integration/result-group; /NXem_calorimetry/ENTRY/background_subtraction/result-group; /NXem_calorimetry/ENTRY/distortion_correction/result-group; /NXem_calorimetry/ENTRY/pattern_center/result-group
results: /NXapm/ENTRY/atom_probe/reconstruction/results-group; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/results-field
retardance: /NXwaveplate/retardance-field
retardance_distribution: /NXwaveplate/retardance_distribution-group
revision: /NXarchive/entry/revision-field; /NXentry/revision-field; /NXsubentry/revision-field
revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/revolutions-field
roi: /NXapm_paraprobe_selector_results/ENTRY/roi-group; /NXem/ENTRY/roiID/ebsd/indexing/roi-group; /NXem_correlation/indexing/roi-group; /NXem_ebsd/indexing/roi-group; /NXmicrostructure_imm_config/ENTRY/roi-group
roi_cylinder_height: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_height-field
roi_cylinder_radius: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_radius-field
roi_orientation: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_orientation-field
roiid: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID-group; /NXem/ENTRY/roiID-group
rois_far_from_edge: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge-group
role: /NXarchive/entry/user/role-field; /NXem/ENTRY/userID/role-field; /NXsnsevent/ENTRY/USER/role-field; /NXsnshisto/ENTRY/USER/role-field; /NXuser/role-field
roll: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field; /NXcanSAS/ENTRY/SAMPLE/roll-field
rollett_holm: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm-group
rotating_element: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element-group
rotating_element_type: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element_type-field
rotation: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field; /NXscanbox_em/rotation-field; /NXstage_lab/rotation-field
rotation_angle: /NXmonopd/entry/SAMPLE/rotation_angle-field; /NXrefscan/entry/data/rotation_angle-link; /NXrefscan/entry/sample/rotation_angle-field; /NXreftof/entry/sample/rotation_angle-field; /NXsample/rotation_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field; /NXsastof/ENTRY/instrument/detector/rotation_angle-field; /NXscan/ENTRY/DATA/rotation_angle-link; /NXscan/ENTRY/SAMPLE/rotation_angle-field; /NXspe/ENTRY/SAMPLE/rotation_angle-field; /NXstxm/ENTRY/SAMPLE/rotation_angle-field; /NXtas/entry/INSTRUMENT/analyser/rotation_angle-field; /NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field; /NXtas/entry/SAMPLE/rotation_angle-field; /NXtomo/entry/data/rotation_angle-link; /NXtomo/entry/sample/rotation_angle-field; /NXtomophase/entry/data/rotation_angle-link; /NXtomophase/entry/sample/rotation_angle-field; /NXxeuler/entry/name/rotation_angle-link; /NXxeuler/entry/sample/rotation_angle-field; /NXxkappa/entry/name/rotation_angle-link; /NXxkappa/entry/sample/rotation_angle-field; /NXxnb/entry/name/rotation_angle-link; /NXxnb/entry/sample/rotation_angle-field; /NXxrot/entry/name/rotation_angle-link; /NXxrot/entry/sample/rotation_angle-field
rotation_angle_step: /NXxrot/entry/sample/rotation_angle_step-field
rotation_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
rotation_convention: /NXcoordinate_system_set/rotation_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_convention-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_convention-field
rotation_euler: /NXrotation_set/rotation_euler-field
rotation_handedness: /NXcoordinate_system_set/rotation_handedness-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_handedness-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_handedness-field
rotation_quaternion: /NXrotation_set/rotation_quaternion-field
rotation_set: /NXem_ebsd/indexing/rotation_set-group; /NXsingle_crystal/rotation_set-group
rotation_speed: /NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field; /NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field; /NXdisk_chopper/rotation_speed-field; /NXfermi_chopper/rotation_speed-field; /NXvelocity_selector/rotation_speed-field
roughening_pump: /NXapm_msr/instrument/roughening_pump-group
run: /NXcanSAS/ENTRY/run-field
run_control: /NXsensor/run_control-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field; /NXsensor_sts/run_control-field
run_cycle: /NXarchive/entry/run_cycle-field; /NXentry/run_cycle-field; /NXsubentry/run_cycle-field
run_number: /NXapm/ENTRY/run_number-field; /NXsnsevent/ENTRY/run_number-field; /NXsnshisto/ENTRY/run_number-field; /NXtofraw/entry/run_number-field
s_3: /NXcorrector_cs/tableauID/s_3-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3-group
s_5: /NXcorrector_cs/tableauID/s_5-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5-group
sacrifice_isotopic_uniqueness: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/sacrifice_isotopic_uniqueness-field; /NXapm_charge_state_analysis/sacrifice_isotopic_uniqueness-field
sample: /NXapm/ENTRY/sample-group; /NXarchive/entry/sample-group; /NXarpes/ENTRY/SAMPLE-group; /NXcanSAS/ENTRY/SAMPLE-group; /NXdispersive_material/ENTRY/sample-group; /NXellipsometry/ENTRY/SAMPLE-group; /NXem/ENTRY/sample-group; /NXem_calorimetry/ENTRY/SAMPLE-group; /NXentry/SAMPLE-group; /NXfluo/entry/SAMPLE-group; /NXiqproc/ENTRY/SAMPLE-group; /NXiv_temp/ENTRY/SAMPLE-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group; /NXlab_sample_mounting/ENTRY/SAMPLE-group; /NXlauetof/entry/sample-group; /NXmonopd/entry/SAMPLE-group; /NXmpes/ENTRY/SAMPLE-group; /NXmpes_arpes/ENTRY/SAMPLE-group; /NXmx/ENTRY/SAMPLE-group; /NXoptical_spectroscopy/ENTRY/SAMPLE-group; /NXrefscan/entry/sample-group; /NXreftof/entry/sample-group; /NXsas/ENTRY/SAMPLE-group; /NXsastof/ENTRY/sample-group; /NXscan/ENTRY/SAMPLE-group; /NXsensor_scan/ENTRY/SAMPLE-group; /NXsnsevent/ENTRY/sample-group; /NXsnshisto/ENTRY/sample-group; /NXspe/ENTRY/SAMPLE-group; /NXspm/ENTRY/SAMPLE-group; /NXsqom/ENTRY/SAMPLE-group; /NXstxm/ENTRY/SAMPLE-group; /NXsubentry/SAMPLE-group; /NXtas/entry/SAMPLE-group; /NXtofnpd/entry/SAMPLE-group; /NXtofraw/entry/SAMPLE-group; /NXtofsingle/entry/SAMPLE-group; /NXtomo/entry/sample-group; /NXtomophase/entry/instrument/sample-group; /NXtomophase/entry/sample-group; /NXtomoproc/entry/SAMPLE-group; /NXtransmission/ENTRY/SAMPLE-group; /NXxas/ENTRY/SAMPLE-group; /NXxasproc/ENTRY/SAMPLE-group; /NXxbase/entry/sample-group; /NXxeuler/entry/sample-group; /NXxkappa/entry/sample-group; /NXxnb/entry/sample-group; /NXxpcs/entry/sample-group; /NXxps/ENTRY/SAMPLE-group; /NXxrd_pan/ENTRY/SAMPLE-group; /NXxrot/entry/sample-group
sample_1: /NXcxi_ptycho/sample_1-group
sample_attenuator: /NXtransmission/ENTRY/instrument/sample_attenuator-group
sample_azimuth: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth-field
sample_bias_potentiostat: /NXmanipulator/sample_bias_potentiostat-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat-group
sample_bias_voltage: /NXspm/ENTRY/SAMPLE/sample_environment/sample_bias_voltage-group
sample_bias_voltmeter: /NXmanipulator/sample_bias_voltmeter-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter-group
sample_bias_votage: /NXspm/ENTRY/experiment_instrument/sample_bias_votage-group
sample_component: /NXsample/SAMPLE_COMPONENT-group; /NXsample/sample_component-field; /NXsample_component_set/SAMPLE_COMPONENT-group
sample_component_set: /NXsample/SAMPLE_COMPONENT_SET-group; /NXsample_component/SAMPLE_COMPONENT_SET-group; /NXsample_component_set/SAMPLE_COMPONENT_SET-group
sample_cooler: /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_cooler-group
sample_environment: /NXspm/ENTRY/SAMPLE/sample_environment-group
sample_heater: /NXmanipulator/sample_heater-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater-group; /NXmpes/ENTRY/SAMPLE/temperature_env/sample_heater-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_heater-group
sample_id: /NXarchive/entry/sample/sample_id-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_id-field; /NXsample/sample_id-field; /NXsample_component/sample_id-field; /NXxrd_pan/ENTRY/SAMPLE/sample_id-field
sample_medium: /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT/sample_medium-field
sample_medium_refractive_indices: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_medium_refractive_indices-field
sample_mode: /NXxrd_pan/ENTRY/SAMPLE/sample_mode-field
sample_name: /NXxrd_pan/ENTRY/SAMPLE/sample_name-field
sample_normal_polar_angle_of_tilt: /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt-field
sample_normal_ref_frame: /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame-group
sample_normal_tilt_azimuth_angle: /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle-field
sample_orientation: /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_orientation-field; /NXsample/sample_orientation-field; /NXsample_component/sample_orientation-field; /NXsingle_crystal/sample_orientation-field
sample_polar: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar-field
sample_preparation: /NXmpes/ENTRY/SAMPLE/history/sample_preparation-group
sample_reference_frame: /NXcoordinate_system_set/sample_reference_frame-group; /NXem/ENTRY/coordinate_system_set/sample_reference_frame-group; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame-group; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame-group
sample_rotation_angle: /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle-field
sample_stage: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage-group
sample_symmetry: /NXrotation_set/sample_symmetry-field
sample_tilt: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt-field
sample_x: /NXstxm/ENTRY/DATA/sample_x-field; /NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y: /NXstxm/ENTRY/DATA/sample_y-field; /NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z: /NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction: /NXmonitor/sampled_fraction-field
sampling: /NXmicrostructure_gragles_config/ENTRY/sampling-group; /NXmicrostructure_odf/sampling-group; /NXmicrostructure_score_config/ENTRY/sampling-group
saturation_value: /NXdetector/saturation_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
save_to_file: /NXmicrostructure_mtex_config/system/save_to_file-field
scalar_field_grad_suffix: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX-group
scalar_field_magn_suffix: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX-group
scale: /NXregion/scale-field
scaling: /NXcalibration/scaling-field
scaling_factor: /NXdata/scaling_factor-field
scan_angle_n: /NXbias_spectroscopy/BIAS_SWEEP/scan_region/scan_angle_N-field; /NXscan_control/scan_region/scan_angle_N-field
scan_axis: /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_axis-field
scan_control: /NXspm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL-group; /NXstm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL-group
scan_control_type: /NXscan_control/scan_control_type-field
scan_controller: /NXem/ENTRY/measurement/em_lab/scan_controller-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller-group
scan_contronller: /NXpositioner_sts/scan_contronller-field
scan_data: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep/SCAN_data-group; /NXbias_sweep/linear_sweep/SCAN_data-group; /NXscan_control/linear_SCAN/SCAN_data-group; /NXscan_control/mesh_SCAN/SCAN_data-group; /NXscan_control/snake_SCAN/SCAN_data-group; /NXscan_control/spiral_SCAN/SCAN_data-group; /NXscan_control/traj_SCAN/SCAN_data-group
scan_end_bias: /NXbias_sweep/scan_region/scan_end_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_end_bias-field
scan_end_n: /NXscan_control/scan_region/scan_end_N-field
scan_environment: /NXafm/ENTRY/experiment_instrument/scan_environment-group; /NXspm/ENTRY/experiment_instrument/scan_environment-group; /NXstm/ENTRY/experiment_instrument/scan_environment-group
scan_mode: /NXafm/ENTRY/scan_mode-field; /NXspm/ENTRY/scan_mode-field; /NXstm/ENTRY/scan_mode-field; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_mode-field
scan_name: /NXspm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL/scan_name-field; /NXspm/ENTRY/experiment_instrument/scan_environment/scan_name-field
scan_number: /NXxpcs/entry/scan_number-field
scan_offset: /NXbias_spectroscopy/BIAS_SWEEP/scan_region/scan_offset-field
scan_offset_bias: /NXbias_sweep/scan_region/scan_offset_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_offset_bias-field
scan_offset_n: /NXscan_control/scan_region/scan_offset_N-field
scan_point_positions: /NXem_ebsd/indexing/scan_point_positions-field
scan_points_bias: /NXbias_sweep/linear_sweep/scan_points_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep/scan_points_bias-field
scan_points_n: /NXscan_control/linear_SCAN/scan_points_N-field; /NXscan_control/mesh_SCAN/scan_points_N-field; /NXscan_control/snake_SCAN/scan_points_N-field; /NXscan_control/spiral_SCAN/scan_points_N-field; /NXscan_control/traj_SCAN/scan_points_N-field
scan_range: /NXbias_spectroscopy/BIAS_SWEEP/scan_region/scan_range-field
scan_range_bias: /NXbias_sweep/scan_region/scan_range_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_range_bias-field
scan_range_n: /NXscan_control/scan_region/scan_range_N-field
scan_region: /NXbias_spectroscopy/BIAS_SWEEP/scan_region-group; /NXbias_sweep/scan_region-group; /NXscan_control/scan_region-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region-group
scan_resolution_n: /NXscan_control/scan_resolution_N-field
scan_schema: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller/scan_schema-field; /NXscanbox_em/scan_schema-field
scan_speed: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep/scan_speed-field; /NXscan_control/linear_SCAN/scan_speed-field; /NXscan_control/traj_SCAN/scan_speed-field
scan_speed_n: /NXscan_control/mesh_SCAN/scan_speed_N-field; /NXscan_control/snake_SCAN/scan_speed_N-field; /NXscan_control/spiral_SCAN/scan_speed_N-field
scan_start_bias: /NXbias_sweep/scan_region/scan_start_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_start_bias-field
scan_start_n: /NXscan_control/scan_region/scan_start_N-field
scan_time: /NXbias_spectroscopy/BIAS_SWEEP/linear_sweep/scan_time-field
scan_time_end: /NXscan_control/scan_time_end-field
scan_time_start: /NXscan_control/scan_time_start-field
scan_type: /NXbias_spectroscopy/BIAS_SWEEP/scan_type-field; /NXscan_control/scan_type-field; /NXspm/ENTRY/scan_type-field; /NXstm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL/scan_type-field
scanbox_em: /NXem_msr/em_lab/SCANBOX_EM-group
scanfield: /NXpositioner_sts/scanfield-field
scattering_angle: /NXspindispersion/scattering_angle-field
scattering_configuration: /NXraman/ENTRY/INSTRUMENT/scattering_configuration-field
scattering_cross_section: /NXattenuator/scattering_cross_section-field
scattering_energy: /NXspindispersion/scattering_energy-field
scattering_length_density: /NXsample/scattering_length_density-field; /NXsample_component/scattering_length_density-field; /NXsample_component_set/scattering_length_density-field
scattering_vector: /NXcrystal/scattering_vector-field
scheme: /NXcollectioncolumn/scheme-field; /NXenergydispersion/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
sdd: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
sebald_gottstein: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein-group
seblock: /NXspe/ENTRY/SAMPLE/seblock-field
second_amplifier: /NXsensor_sts/second_amplifier-group
seed: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/seed-field; /NXcs_prng/seed-field
segment_columns: /NXcrystal/segment_columns-field
segment_gap: /NXcrystal/segment_gap-field
segment_height: /NXcrystal/segment_height-field
segment_rows: /NXcrystal/segment_rows-field
segment_thickness: /NXcrystal/segment_thickness-field
segment_width: /NXcrystal/segment_width-field
segmentation: /NXapm_compositionspace_config/ENTRY/config/segmentation-group; /NXapm_compositionspace_results/ENTRY/segmentation-group
select: /NXapm_paraprobe_selector_config/ENTRY/select-group
semi_convergence_angle: /NXoptical_system_em/semi_convergence_angle-field
sensitivity: /NXcantilever_spm/cantilever_config/CALIBRATION/sensitivity-field
sensitivity_factor: /NXlockin/sensitivity_factor-field
sensor: /NXebeam_column/SENSOR-group; /NXem/ENTRY/measurement/em_lab/SENSOR-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/SENSOR-group; /NXenvironment/SENSOR-group; /NXibeam_column/SENSOR-group; /NXinstrument/SENSOR-group; /NXmanipulator/SENSOR-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group; /NXstage_lab/SENSOR-group
sensor_count: /NXdetector/sensor_count-field
sensor_material: /NXdetector/sensor_material-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_pixel_size: /NXdetector/sensor_pixel_size-field
sensor_pixels: /NXdetector/sensor_pixels-field
sensor_size: /NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field; /NXdetector/sensor_size-field
sensor_thickness: /NXdetector/sensor_thickness-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type: /NXfilter/sensor_type-group
sensorid: /NXem/ENTRY/measurement/em_lab/ebeam_column/sensorID-group; /NXem/ENTRY/measurement/em_lab/ibeam_column/sensorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/sensorID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/sensorID-group
sequence_index: /NXapm/ENTRY/atom_probe/hit_finding/sequence_index-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/sequence_index-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/background_quantification/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/sequence_index-field; /NXapm/ENTRY/atom_probe/raw_data/sequence_index-field; /NXapm/ENTRY/atom_probe/reconstruction/sequence_index-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/sequence_index-field; /NXapm_compositionspace_results/ENTRY/autophase/sequence_index-field; /NXapm_compositionspace_results/ENTRY/clustering/sequence_index-field; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/sequence_index-field; /NXapm_compositionspace_results/ENTRY/segmentation/pca/sequence_index-field; /NXapm_compositionspace_results/ENTRY/voxelization/sequence_index-field; /NXem_calorimetry/ENTRY/azimuthal_integration/sequence_index-field; /NXem_calorimetry/ENTRY/background_subtraction/sequence_index-field; /NXem_calorimetry/ENTRY/distortion_correction/sequence_index-field; /NXem_calorimetry/ENTRY/pattern_center/sequence_index-field; /NXem_calorimetry/ENTRY/time_synchronization/sequence_index-field; /NXem_correlation/PROCESS/sequence_index-field; /NXem_method/PROCESS/sequence_index-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field; /NXnote/sequence_index-field; /NXprocess/sequence_index-field; /NXprocess_mpes/sequence_index-field; /NXroi/PROCESS/sequence_index-field
sequence_number: /NXdetector/sequence_number-field; /NXtomophase/entry/instrument/bright_field/sequence_number-field; /NXtomophase/entry/instrument/dark_field/sequence_number-field; /NXtomophase/entry/instrument/sample/sequence_number-field
serial_number: /NXdetector/serial_number-field
serialized: /NXapm/ENTRY/atom_probe/hit_finding/serialized-group; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized-group; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized-group; /NXapm/ENTRY/atom_probe/raw_data/serialized-group; /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized-group; /NXapm_hit_finding/SERIALIZED-group; /NXapm_ranging/SERIALIZED-group; /NXapm_reconstruction/SERIALIZED-group; /NXapm_volt_and_bowl/SERIALIZED-group
serializedid: /NXapm/ENTRY/serializedID-group; /NXem/ENTRY/serializedID-group
service: /NXapm/ENTRY/USER/identifier/service-field; /NXapm/ENTRY/experiment_identifier/service-field; /NXapm/ENTRY/sample/identifier/service-field; /NXapm/ENTRY/specimen/identifier/service-field; /NXapm/ENTRY/specimen/parent_identifier/service-field; /NXem/ENTRY/experiment_identifier/service-field; /NXem/ENTRY/sample/identifier/service-field; /NXem/ENTRY/sample/parent_identifier/service-field; /NXem/ENTRY/userID/identifier/service-field; /NXidentifier/service-field; /NXoptical_spectroscopy/ENTRY/experiment_identifier/service-field
set_bfield_current: /NXseparator/set_Bfield_current-field; /NXspin_rotator/set_Bfield_current-field
set_current: /NXelectrostatic_kicker/set_current-field; /NXmagnetic_kicker/set_current-field; /NXquadrupole_magnet/set_current-field; /NXsolenoid_magnet/set_current-field
set_efield_voltage: /NXseparator/set_Efield_voltage-field; /NXspin_rotator/set_Efield_voltage-field
set_identifier: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/set_identifier-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/set_identifier-field
set_point: /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/set_point-field
set_voltage: /NXelectrostatic_kicker/set_voltage-field; /NXmagnetic_kicker/set_voltage-field
setpoint: /NXactuator/PID/setpoint-field; /NXmanipulator/cryostat/PID/setpoint-field; /NXmanipulator/sample_bias_potentiostat/PID/setpoint-field; /NXmanipulator/sample_heater/PID/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID/setpoint-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID/setpoint-field; /NXpid/setpoint-field; /NXpositioner_sts/setpoint-field
setpoint_log: /NXactuator/PID/setpoint_log-group; /NXmanipulator/cryostat/PID/setpoint_log-group; /NXmanipulator/sample_bias_potentiostat/PID/setpoint_log-group; /NXmanipulator/sample_heater/PID/setpoint_log-group; /NXpid/setpoint_log-group
setpoint_temperature: /NXevent_data_apm/instrument/stage_lab/setpoint_temperature-field
settling_time: /NXiv_bias/settling_time-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/settling_time-field
sgl: /NXtas/entry/SAMPLE/sgl-field
sgu: /NXtas/entry/SAMPLE/sgu-field
shadowfactor: /NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle: /NXapm/ENTRY/specimen/shank_angle-field
shape: /NXaperture/shape-field; /NXattenuator/shape-group; /NXbeam_splitter/SHAPE-group; /NXbeam_splitter/SHAPE/shape-field; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field; /NXcg_hexahedron_set/shape-field; /NXcg_polygon_set/shape-field; /NXcg_primitive_set/shape-field; /NXcontainer/shape-group; /NXcrystal/shape-group; /NXgeometry/SHAPE-group; /NXgrating/shape-group; /NXmirror/shape-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit/shape-field; /NXpolarizer_opt/SHAPE-group; /NXpolarizer_opt/SHAPE/shape-field; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape-group; /NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field; /NXshape/shape-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shermann_function: /NXspindispersion/shermann_function-field
short_name: /NXactuator/short_name-field; /NXenvironment/short_name-field; /NXsensor/short_name-field; /NXsensor_sts/short_name-field
short_title: /NXsample/short_title-field
shortest_half_life: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/shortest_half_life-field; /NXapm_charge_state_analysis/shortest_half_life-field
show_coordinates: /NXmicrostructure_mtex_config/plotting/show_coordinates-field
show_micron_bar: /NXmicrostructure_mtex_config/plotting/show_micron_bar-field
sigma_x: /NXsource/sigma_x-field
sigma_y: /NXsource/sigma_y-field
sign_convention: /NXcoordinate_system_set/sign_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sign_convention-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sign_convention-field
sign_valid: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid-group
signal_amplitude: /NXevent_data_apm/instrument/ion_detector/signal_amplitude-field
signal_over_noise: /NXamplifier/signal_over_noise-field
signal_type: /NXcircuit/signal_type-field
signed_distance: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/signed_distance-field
simulation: /NXapm/ENTRY/simulation-group; /NXem/ENTRY/roiID/ebsd/simulation-group; /NXem/ENTRY/simulation-group; /NXem_ebsd/simulation-group; /NXem_sim/simulation-group
simulation_control: /NXmicrostructure_gragles_config/ENTRY/simulation_control-group; /NXmicrostructure_score_config/ENTRY/simulation_control-group
simulation_identifier: /NXmicrostructure_gragles_config/ENTRY/simulation_identifier-field; /NXmicrostructure_gragles_results/ENTRY/simulation_identifier-field; /NXmicrostructure_score_config/ENTRY/simulation_identifier-field; /NXmicrostructure_score_results/ENTRY/simulation_identifier-field
single_crystal: /NXsample/SINGLE_CRYSTAL-group; /NXsample_component/SINGLE_CRYSTAL-group
situation: /NXarchive/entry/sample/situation-field; /NXmpes/ENTRY/SAMPLE/situation-field; /NXmpes_arpes/ENTRY/SAMPLE/situation-field; /NXsample/situation-field
size: /NXaperture/size-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/size-field; /NXbeam_splitter/SHAPE/size-field; /NXbeam_stop/size-field; /NXpolarizer_opt/SHAPE/size-field; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field; /NXshape/size-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
sketch: /NXbeam_splitter/SHAPE/sketch-group; /NXpolarizer_opt/SHAPE/sketch-group
slit: /NXbeam_path/MONOCHROMATOR/SLIT-group; /NXbeam_path/SLIT-group; /NXfermi_chopper/slit-field; /NXtransmission/ENTRY/instrument/DETECTOR/slit-group
slit_angle: /NXdisk_chopper/slit_angle-field
slit_edges: /NXdisk_chopper/slit_edges-field
slit_height: /NXdisk_chopper/slit_height-field
slit_length: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits: /NXdisk_chopper/slits-field
slot: /NXdetector/slot-field
slow_axes: /NXelectronanalyser/slow_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
slow_pixel_direction: /NXdetector_module/slow_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
smile: /NXsubstance/smile-field
snake_scan: /NXscan_control/snake_SCAN-group
sns: /NXsnsevent/ENTRY/instrument/SNS-group; /NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id: /NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field; /NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name: /NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field; /NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool: /NXsnsevent/ENTRY/SNSHistoTool-group; /NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service: /NXsnsevent/ENTRY/instrument/SNStranslation_service-field; /NXsnshisto/ENTRY/instrument/SNStranslation_service-field
soft_limit_max: /NXpositioner/soft_limit_max-field; /NXpositioner_sts/soft_limit_max-field
soft_limit_min: /NXpositioner/soft_limit_min-field; /NXpositioner_sts/soft_limit_min-field
software: /NXspm/ENTRY/experiment_instrument/software-group
software_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE-group
solid_angle: /NXdetector/solid_angle-field
solitary_unit: /NXmicrostructure_score_config/ENTRY/solitary_unit-group
soller_angle: /NXcollimator/soller_angle-field
source: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE-group; /NXarchive/entry/instrument/SOURCE-group; /NXarpes/ENTRY/INSTRUMENT/SOURCE-group; /NXbeam_path/SOURCE-group; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source-group; /NXem/ENTRY/roiID/ebsd/indexing/source-group; /NXem/ENTRY/roiID/ebsd/measurement/source-group; /NXem/ENTRY/roiID/ebsd/simulation/source-group; /NXem_ebsd/calibration/source-group; /NXem_ebsd/indexing/source-group; /NXem_ebsd/measurement/source-group; /NXem_ebsd/simulation/source-group; /NXfluo/entry/INSTRUMENT/SOURCE-group; /NXimage_set/PROCESS/source-group; /NXinstrument/SOURCE-group; /NXiqproc/ENTRY/instrument/SOURCE-group; /NXmonopd/entry/INSTRUMENT/SOURCE-group; /NXmx/ENTRY/SOURCE-group; /NXpulser_apm/SOURCE-group; /NXrefscan/entry/instrument/SOURCE-group; /NXsas/ENTRY/INSTRUMENT/SOURCE-group; /NXsastof/ENTRY/instrument/source-group; /NXspectrum_set/PROCESS/source-group; /NXsqom/ENTRY/instrument/SOURCE-group; /NXstxm/ENTRY/INSTRUMENT/SOURCE-group; /NXtas/entry/INSTRUMENT/SOURCE-group; /NXtomo/entry/instrument/SOURCE-group; /NXtomophase/entry/instrument/SOURCE-group; /NXtomoproc/entry/INSTRUMENT/SOURCE-group; /NXtransmission/ENTRY/instrument/SOURCE-group; /NXxas/ENTRY/INSTRUMENT/SOURCE-group; /NXxbase/entry/instrument/source-group; /NXxlaue/entry/instrument/source-group; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE-group
source_1: /NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x: /NXbending_magnet/source_distance_x-field
source_distance_y: /NXbending_magnet/source_distance_y-field
source_peak_wavelength: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/source_peak_wavelength-field
source_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE-group
sourceid: /NXapm/ENTRY/measurement/instrument/pulser/sourceID-group
sourcetype: /NXmpes/ENTRY/INSTRUMENT/sourceTYPE-group; /NXxps/ENTRY/INSTRUMENT/sourceTYPE-group
space: /NXgraph_node_set/space-field
space_group: /NXcrystal/space_group-field; /NXcrystal_structure/space_group-field; /NXem/ENTRY/roiID/ebsd/indexing/phaseID/space_group-field; /NXsample/space_group-field; /NXsample_component/space_group-field; /NXunit_cell/space_group-field
spatial_acceptance: /NXcollectioncolumn/spatial_acceptance-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/spatial_acceptance-field
spatial_distribution: /NXmicrostructure_score_config/ENTRY/nucleation/spatial_distribution-field
spatial_filter: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter-group; /NXapm_paraprobe_tool_config/SPATIAL_FILTER-group
spatial_resolution: /NXelectronanalyser/spatial_resolution-group
spatial_statisticsid: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID-group; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID-group
spatialn: /NXdata_mpes/spatialN-field; /NXdata_mpes_detector/spatialN-field
spatialn_calibration: /NXmpes/ENTRY/PROCESS_MPES/spatialN_calibration-group; /NXprocess_mpes/spatialN_calibration-group
spatiotemporalid: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID-group
special_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_enthalpy-field
special_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_pre_factor-field
specific_polarization_filter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/specific_polarization_filter_type-field
specimen: /NXapm/ENTRY/specimen-group
specimen_symmetry_point_group: /NXmicrostructure_odf/configuration/specimen_symmetry_point_group-field; /NXmicrostructure_pf/configuration/specimen_symmetry_point_group-field
spectral_range: /NXfiber/spectral_range-field
spectral_resolution: /NXbeam_path/MONOCHROMATOR/spectral_resolution-field; /NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field; /NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
spectralfilter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE-group
spectrometer: /NXtransmission/ENTRY/instrument/spectrometer-group
spectrum: /NXbeam_path/GRATING/spectrum-field; /NXbeam_path/MONOCHROMATOR/spectrum-field; /NXbending_magnet/spectrum-group; /NXinsertion_device/spectrum-group; /NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
spectrum_0d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d-group; /NXspectrum_set/spectrum_0d-group
spectrum_1d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d-group; /NXspectrum_set/spectrum_1d-group
spectrum_2d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d-group; /NXspectrum_set/spectrum_2d-group
spectrum_3d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d-group; /NXspectrum_set/spectrum_3d-group
spectrum_identifier: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/spectrum_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/spectrum_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/spectrum_identifier-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/spectrum_identifier-field; /NXspectrum_set/stack_0d/spectrum_identifier-field; /NXspectrum_set/stack_2d/spectrum_identifier-field; /NXspectrum_set/stack_3d/spectrum_identifier-field
spectrum_set: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET-group; /NXem_eels/indexing/SPECTRUM_SET-group; /NXem_method/SPECTRUM_SET-group; /NXevent_data_em/SPECTRUM_SET-group
speed_backw: /NXpositioner_sts/speed_backw-field
speed_forw: /NXpositioner_sts/speed_forw-field
spindispersion: /NXelectronanalyser/SPINDISPERSION-group
spiral_radius_n: /NXscan_control/spiral_SCAN/spiral_radius_N-field
spiral_scan: /NXscan_control/spiral_SCAN-group
splitting_ratio: /NXbeam_splitter/splitting_ratio-field
spot_position: /NXpulser_apm/SOURCE/BEAM/spot_position-field
spring_constant: /NXcantilever_spm/cantilever_config/CALIBRATION/spring_constant-field
spwidth: /NXvelocity_selector/spwidth-field
stack_0d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d-group; /NXspectrum_set/stack_0d-group
stack_1d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d-group; /NXimage_set/stack_1d-group
stack_2d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d-group; /NXimage_set/stack_2d-group; /NXspectrum_set/stack_2d-group
stack_3d: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d-group; /NXimage_set/stack_3d-group; /NXspectrum_set/stack_3d-group
stage_lab: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/stage_lab-group; /NXapm_msr/instrument/stage_lab-group; /NXem/ENTRY/measurement/em_lab/STAGE_LAB-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB-group; /NXem_msr/em_lab/STAGE_LAB-group; /NXevent_data_apm/instrument/stage_lab-group; /NXevent_data_em/em_lab/STAGE_LAB-group
stage_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type-field
stage_type_other: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type_other-field
standard: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/standard-field
standing_voltage: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage-field; /NXpulser_apm/standing_voltage-field
start: /NXregion/start-field; /NXxrd_pan/ENTRY/experiment_config/omega/start-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/start-field
start_time: /NXactivity/start_time-field; /NXapm/ENTRY/start_time-field; /NXapm_compositionspace_results/ENTRY/profiling/start_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tool_common/profiling/start_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/start_time-field; /NXarchive/entry/start_time-field; /NXarpes/ENTRY/start_time-field; /NXcalibration/start_time-field; /NXchemical_process/start_time-field; /NXcs_profiling/start_time-field; /NXcs_profiling_event/start_time-field; /NXcxi_ptycho/entry_1/start_time-field; /NXdetector/start_time-field; /NXdirecttof/entry/start_time-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/start_time-field; /NXem/ENTRY/start_time-field; /NXem_calorimetry/ENTRY/profiling/start_time-field; /NXem_calorimetry/ENTRY/time_synchronization/start_time-field; /NXentry/start_time-field; /NXevent_data_apm/start_time-field; /NXevent_data_em/start_time-field; /NXfluo/entry/start_time-field; /NXindirecttof/entry/start_time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field; /NXlab_sample_mounting/ENTRY/start_time-field; /NXmicrostructure_gragles_config/ENTRY/start_time-field; /NXmicrostructure_gragles_results/ENTRY/start_time-field; /NXmicrostructure_imm_results/ENTRY/start_time-field; /NXmicrostructure_kanapy_results/ENTRY/start_time-field; /NXmicrostructure_score_config/ENTRY/start_time-field; /NXmicrostructure_score_results/ENTRY/start_time-field; /NXmonitor/start_time-field; /NXmonopd/entry/start_time-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/start_time-field; /NXmpes/ENTRY/start_time-field; /NXmx/ENTRY/start_time-field; /NXoptical_spectroscopy/ENTRY/start_time-field; /NXphysical_process/start_time-field; /NXrefscan/entry/start_time-field; /NXreftof/entry/start_time-field; /NXsas/ENTRY/start_time-field; /NXsastof/ENTRY/start_time-field; /NXscan/ENTRY/start_time-field; /NXsensor_scan/ENTRY/start_time-field; /NXsnsevent/ENTRY/start_time-field; /NXsnshisto/ENTRY/start_time-field; /NXstxm/ENTRY/start_time-field; /NXsubentry/start_time-field; /NXtas/entry/start_time-field; /NXtofnpd/entry/start_time-field; /NXtofraw/entry/start_time-field; /NXtofsingle/entry/start_time-field; /NXtomo/entry/start_time-field; /NXtomophase/entry/start_time-field; /NXtransmission/ENTRY/start_time-field; /NXxas/ENTRY/start_time-field; /NXxbase/entry/start_time-field; /NXxpcs/entry/start_time-field
state: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/state-field
static_q_list: /NXxpcs/entry/instrument/masks/static_q_list-field
static_roi_map: /NXxpcs/entry/instrument/masks/static_roi_map-field
statistics: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics-group; /NXregion/statistics-group; /NXsimilarity_grouping/statistics-group
status: /NXapm/ENTRY/measurement/instrument/reflectron/status-field; /NXapm/ENTRY/measurement/instrument/status-field; /NXapm_msr/instrument/status-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/status-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/status-field; /NXapm_paraprobe_distancer_config/ENTRY/common/status-field; /NXapm_paraprobe_distancer_results/ENTRY/common/status-field; /NXapm_paraprobe_intersector_config/ENTRY/common/status-field; /NXapm_paraprobe_intersector_results/ENTRY/common/status-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/status-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/status-field; /NXapm_paraprobe_ranger_config/ENTRY/common/status-field; /NXapm_paraprobe_ranger_results/ENTRY/common/status-field; /NXapm_paraprobe_selector_config/ENTRY/common/status-field; /NXapm_paraprobe_selector_results/ENTRY/common/status-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/status-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/status-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/status-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/status-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/status-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/status-field; /NXapm_paraprobe_tool_common/status-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/status-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/status-field; /NXattenuator/status-field; /NXbeam_stop/status-field; /NXem_ebsd/indexing/status-field; /NXfilter/status-field; /NXreflectron/status-field
status_indicators: /NXcircuit/status_indicators-field
step: /NXxrd_pan/ENTRY/experiment_config/omega/step-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/step-field
step_size: /NXscan_control/traj_SCAN/step_size-field
step_size_bias: /NXbias_sweep/linear_sweep/step_size_bias-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep/step_size_bias-field
step_size_n: /NXscan_control/linear_SCAN/step_size_N-field; /NXscan_control/mesh_SCAN/step_size_N-field; /NXscan_control/snake_SCAN/step_size_N-field; /NXscan_control/spiral_SCAN/step_size_N-field
stepping_n: /NXscan_control/linear_SCAN/stepping_N-field; /NXscan_control/mesh_SCAN/stepping_N-field; /NXscan_control/snake_SCAN/stepping_N-field; /NXscan_control/spiral_SCAN/stepping_N-field; /NXscan_control/traj_SCAN/stepping_N-field
stepsize: /NXmicrostructure_score_config/ENTRY/deformation/ebsd/stepsize-field
stm_head_temp: /NXstm/ENTRY/resolution_indicators/stm_head_temp-group
stop_on_symmetry_mismatch: /NXmicrostructure_mtex_config/miscellaneous/stop_on_symmetry_mismatch-field
stop_time: /NXdetector/stop_time-field
storage: /NXcs_computer/storage-group
stored_elastic_energy: /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy-group
stored_energy_recovery: /NXmicrostructure_score_config/ENTRY/stored_energy_recovery-group
strain: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field
strength: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field/strength-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field/strength-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field
stress: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress-group; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress/stress-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/stress-field
stress_field: /NXarchive/entry/sample/stress_field-field; /NXsample/stress_field-field
stride: /NXregion/stride-field
structure: /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure-group; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure-group
stxm_scan_type: /NXstxm/ENTRY/DATA/stxm_scan_type-field
subentry: /NXentry/SUBENTRY-group
subsampling_filter: /NXapm_paraprobe_tool_config/SUBSAMPLING_FILTER-group
substance: /NXmpes/ENTRY/SAMPLE/SUBSTANCE-group; /NXsample/SUBSTANCE-group; /NXsample_component/SUBSTANCE-group
substrate: /NXbeam_splitter/substrate-group; /NXlens_opt/substrate-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/substrate-field; /NXpolarizer_opt/substrate-group; /NXwaveplate/substrate-group
substrate_density: /NXgrating/substrate_density-field; /NXmirror/substrate_density-field
substrate_material: /NXbeam_splitter/substrate/substrate_material-field; /NXfilter/substrate_material-field; /NXgrating/substrate_material-field; /NXguide/substrate_material-field; /NXlens_opt/substrate/substrate_material-field; /NXmirror/substrate_material-field; /NXpolarizer_opt/substrate/substrate_material-field; /NXwaveplate/substrate/substrate_material-field
substrate_roughness: /NXfilter/substrate_roughness-field; /NXgrating/substrate_roughness-field; /NXguide/substrate_roughness-field; /NXmirror/substrate_roughness-field
substrate_thickness: /NXbeam_splitter/substrate/substrate_thickness-field; /NXfilter/substrate_thickness-field; /NXgrating/substrate_thickness-field; /NXguide/substrate_thickness-field; /NXlens_opt/substrate/substrate_thickness-field; /NXmirror/substrate_thickness-field; /NXpolarizer_opt/substrate/substrate_thickness-field; /NXwaveplate/substrate/substrate_thickness-field
summary: /NXem/ENTRY/roiID/eds/indexing/summary-group; /NXem_eds/indexing/summary-group
summary_statistics: /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics-group; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics-group
support_membrane_material: /NXfresnel_zone_plate/support_membrane_material-field
support_membrane_thickness: /NXfresnel_zone_plate/support_membrane_thickness-field
surface: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface-group; /NXapm_paraprobe_tool_config/surface-group; /NXguide/reflectivity/surface-field
surface_distance: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance-group; /NXapm_paraprobe_tool_config/surface_distance-group
surface_energy: /NXmicrostructure/interface/surface_energy-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/surface_energy-field
surface_meshing: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing-group
surface_resistivity: /NXpiezoelectric_material/surface_resistivity-field
surface_type: /NXquadric/surface_type-field
sw_filter_cutoff_frq: /NXiv_bias/sw_filter_cutoff_frq-field
sw_filter_type: /NXiv_bias/sw_filter_type-field
sw_ilter_order: /NXiv_bias/sw_ilter_order-field
sweep_end: /NXiv_bias/sweep_end-field
sweep_number: /NXbias_spectroscopy/BIAS_SWEEP/sweep_number-field
sweep_start: /NXiv_bias/sweep_start-field
switch_off_delay: /NXpositioner_sts/switch_off_delay-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/switch_off_delay-field
symmetric: /NXxraylens/symmetric-field
symmetry: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/symmetry-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/symmetry-field; /NXcg_grid/symmetry-field; /NXdistortion/symmetry-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/symmetry-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/symmetry-field
system: /NXmicrostructure_gragles_config/ENTRY/sampling/system-field; /NXmicrostructure_mtex_config/system-group
t: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table: /NXvelocity_selector/table-field
tableauid: /NXcorrector_cs/tableauID-group; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID-group
taper: /NXinsertion_device/taper-field
target: /NXspindispersion/target-field
target_amplitude: /NXcantilever_spm/cantilever_oscillator/target_amplitude-field
target_dcom_radius: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_dcom_radius-field
target_detection_rate: /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control/target_detection_rate-field; /NXevent_data_apm/instrument/control/target_detection_rate-field
target_edge_length: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_edge_length-field
target_material: /NXsource/target_material-field
target_preparation: /NXspindispersion/target_preparation-field
target_preparation_date: /NXspindispersion/target_preparation_date-field
target_smoothing_step: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_smoothing_step-field
target_value: /NXpositioner/target_value-field; /NXpositioner_sts/target_value-field
targets: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/targets-field
tdev: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
telephone_number: /NXem/ENTRY/userID/telephone_number-field; /NXsensor_scan/ENTRY/USER/telephone_number-field; /NXtransmission/ENTRY/operator/telephone_number-field; /NXuser/telephone_number-field
temp_control_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE-group
temperature: /NXarchive/entry/sample/temperature-field; /NXarpes/ENTRY/SAMPLE/temperature-field; /NXcanSAS/ENTRY/SAMPLE/temperature-field; /NXcrystal/temperature-field; /NXevent_data_apm/instrument/stage_lab/temperature-field; /NXfilter/temperature-field; /NXiv_temp/ENTRY/DATA/temperature-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/temperature-field; /NXmicrostructure_score_config/ENTRY/time_temperature/temperature-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/temperature-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/temperature-field; /NXmoderator/temperature-field; /NXmx/ENTRY/SAMPLE/temperature-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature-group; /NXsample/temperature-field; /NXsensor_sts/temperature-field; /NXsnsevent/ENTRY/instrument/moderator/temperature-field; /NXsnshisto/ENTRY/instrument/moderator/temperature-field; /NXspe/ENTRY/SAMPLE/temperature-field; /NXspm/ENTRY/experiment_instrument/TEMPERATURE-group; /NXspm/ENTRY/experiment_instrument/TEMPERATURE/temperature-field; /NXxbase/entry/sample/temperature-field; /NXxpcs/entry/sample/temperature-field
temperature_calibration: /NXspm/ENTRY/experiment_instrument/TEMPERATURE/temperature_calibration-group
temperature_coefficient: /NXcrystal/temperature_coefficient-field
temperature_controller: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
temperature_data: /NXspm/ENTRY/experiment_instrument/TEMPERATURE/TEMPERATURE_DATA-group
temperature_env: /NXmpes/ENTRY/SAMPLE/temperature_env-group; /NXsample/temperature_env-group
temperature_log: /NXcrystal/temperature_log-group; /NXfilter/temperature_log-group; /NXmoderator/temperature_log-group; /NXsample/temperature_log-group
temperature_nominal: /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_nominal-field
temperature_nominal_other: /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_nominal_other-field
temperature_range: /NXcircuit/temperature_range-field; /NXpiezoelectric_material/temperature_range-field
temperature_sensor: /NXmanipulator/temperature_sensor-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor-group; /NXmpes/ENTRY/SAMPLE/temperature_env/temperature_sensor-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_sensor-group
temperature_set: /NXxpcs/entry/sample/temperature_set-field
tensor: /NXmicrostructure_mtex_config/path/tensor-field
term: /NXcanSAS/ENTRY/PROCESS/term-field; /NXparameters/term-field
tessellate: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate-group
tessellation: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation-group
tetrahedra: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra-group; /NXcg_tetrahedron_set/tetrahedra-group
tetrahedron_half_edgeid: /NXcg_tetrahedron_set/tetrahedron_half_edgeID-group
tetrahedronid: /NXcg_tetrahedron_set/tetrahedronID-group
text: /NXdispersive_material/ENTRY/REFERENCES/text-field
text_interpreter: /NXmicrostructure_mtex_config/miscellaneous/text_interpreter-field
theta: /NXmicrostructure_imm_config/ENTRY/component_analysis/theta-field; /NXmicrostructure_odf/kth_extrema/theta-field
thickness: /NXattenuator/thickness-field; /NXbeam_path/window_NUMBER/thickness-field; /NXcanSAS/ENTRY/SAMPLE/thickness-field; /NXcrystal/thickness-field; /NXem/ENTRY/sample/thickness-field; /NXfilter/thickness-field; /NXflipper/thickness-field; /NXopt_window/ENTRY/thickness-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness-field; /NXsample/thickness-field
thickness_determination: /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness_determination-field
thickness_reduction: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
thread_identifier: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/thread_identifier-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/thread_identifier-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/thread_identifier-field
threshold_distance: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/threshold_distance-field
threshold_energy: /NXdetector/threshold_energy-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
threshold_proximity: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/threshold_proximity-field
thumbnail: /NXentry/thumbnail-group; /NXsubentry/thumbnail-group
tilt: /NXxnb/entry/name/tilt-link
tilt_1: /NXstage_lab/tilt_1-field
tilt_2: /NXstage_lab/tilt_2-field
tilt_angle: /NXcorrector_cs/tableauID/tilt_angle-field; /NXxnb/entry/instrument/detector/tilt_angle-field
tilt_correction: /NXoptical_system_em/tilt_correction-field
tilt_n: /NXpiezo_config_spm/calibration/tilt_N-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/tilt_N-field
time: /NXcg_point_set/time-field; /NXem_ebsd/measurement/time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field; /NXlog/time-field; /NXmicrostructure/time-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/time-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/time-field; /NXmicrostructure_score_config/ENTRY/time_temperature/time-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/time-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field; /NXsnsevent/ENTRY/DASlogs/LOG/time-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field; /NXsnshisto/ENTRY/DASlogs/LOG/time-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_const: /NXpositioner_sts/time_const-field
time_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time_control-field
time_of_flight: /NXdata_mpes_detector/time_of_flight-field; /NXdetector/time_of_flight-field; /NXlauetof/entry/control/time_of_flight-field; /NXlauetof/entry/instrument/detector/time_of_flight-field; /NXlauetof/entry/name/time_of_flight-link; /NXmonitor/time_of_flight-field; /NXreftof/entry/control/time_of_flight-field; /NXreftof/entry/data/time_of_flight-link; /NXreftof/entry/instrument/detector/time_of_flight-field; /NXsastof/ENTRY/control/time_of_flight-field; /NXsastof/ENTRY/data/time_of_flight-link; /NXsastof/ENTRY/instrument/detector/time_of_flight-field; /NXsnsevent/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/DATA/time_of_flight-link; /NXsnshisto/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field; /NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field; /NXtofnpd/entry/MONITOR/time_of_flight-field; /NXtofnpd/entry/data/time_of_flight-link; /NXtofraw/entry/MONITOR/time_of_flight-field; /NXtofraw/entry/data/time_of_flight-link; /NXtofraw/entry/instrument/detector/time_of_flight-field; /NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field; /NXtofsingle/entry/MONITOR/time_of_flight-field; /NXtofsingle/entry/data/time_of_flight-link
time_of_flight_adc: /NXdata_mpes_detector/time_of_flight_adc-field
time_offset: /NXcg_point_set/time_offset-field
time_per_channel: /NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points: /NXtransmission/ENTRY/instrument/time_points-field
time_slope: /NXmicrostructure_gragles_config/ENTRY/numerics/time_slope-field
time_synchronization: /NXem_calorimetry/ENTRY/time_synchronization-group
time_temperature: /NXmicrostructure_score_config/ENTRY/time_temperature-group
time_zone: /NXmx/ENTRY/INSTRUMENT/time_zone-field
timestamp: /NXcg_point_set/timestamp-field
timing: /NXelectrostatic_kicker/timing-field; /NXmagnetic_kicker/timing-field
tip_lift: /NXpositioner_sts/tip_lift-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/tip_lift-field
tip_position_z: /NXpositioner_spm/tip_position_z-field; /NXpositioner_sts/tip_position_z-field
tip_temp: /NXspm/ENTRY/experiment_instrument/scan_environment/tip_temp-field
tip_temp_sensor: /NXafm/ENTRY/experiment_instrument/scan_environment/tip_temp_sensor-group; /NXafm/ENTRY/experiment_instrument/tip_temp_sensor-group; /NXstm/ENTRY/experiment_instrument/scan_environment/tip_temp_sensor-group; /NXstm/ENTRY/experiment_instrument/tip_temp_sensor-group
title: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/title-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/title-field; /NXapm_compositionspace_results/ENTRY/autophase/result/title-field; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/title-field; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/title-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/title-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/title-field; /NXarchive/entry/title-field; /NXarpes/ENTRY/title-field; /NXcanSAS/ENTRY/title-field; /NXcxi_ptycho/entry_1/title-field; /NXdata/title-field; /NXdirecttof/entry/title-field; /NXellipsometry/ENTRY/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/title-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/title-field; /NXem/ENTRY/roiID/ebsd/indexing/roi/title-field; /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/title-field; /NXem/ENTRY/roiID/eds/indexing/summary/title-field; /NXem_calorimetry/ENTRY/azimuthal_integration/result/title-field; /NXem_calorimetry/ENTRY/background_subtraction/result/title-field; /NXem_correlation/indexing/roi/title-field; /NXem_ebsd/indexing/roi/title-field; /NXentry/title-field; /NXfluo/entry/title-field; /NXindirecttof/entry/title-field; /NXiqproc/ENTRY/title-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/title-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/title-field; /NXmonopd/entry/title-field; /NXmpes/ENTRY/title-field; /NXmx/ENTRY/title-field; /NXoptical_spectroscopy/ENTRY/title-field; /NXraman/ENTRY/title-field; /NXrefscan/entry/title-field; /NXreftof/entry/title-field; /NXsas/ENTRY/title-field; /NXsastof/ENTRY/title-field; /NXscan/ENTRY/title-field; /NXsnsevent/ENTRY/title-field; /NXsnshisto/ENTRY/title-field; /NXsource/bunch_pattern/title-field; /NXsqom/ENTRY/title-field; /NXstxm/ENTRY/title-field; /NXsubentry/title-field; /NXtas/entry/title-field; /NXtofnpd/entry/title-field; /NXtofraw/entry/title-field; /NXtofsingle/entry/title-field; /NXtomo/entry/title-field; /NXtomophase/entry/title-field; /NXtomoproc/entry/title-field; /NXxas/ENTRY/title-field; /NXxasproc/ENTRY/title-field; /NXxbase/entry/title-field
tof_distance: /NXenergydispersion/tof_distance-field
tolerance: /NXpositioner/tolerance-field; /NXpositioner_sts/tolerance-field
top_dead_center: /NXdisk_chopper/top_dead_center-field
top_up: /NXsource/top_up-field
total: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/total-field; /NXchemical_composition/total-field; /NXsimilarity_grouping/statistics/total-field
total_area: /NXfit/peakPEAK/total_area-field; /NXpeak/total_area-field; /NXxps/ENTRY/FIT/peakPEAK/total_area-field
total_counts: /NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnsevent/ENTRY/total_counts-field; /NXsnshisto/ENTRY/DATA/total_counts-link; /NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnshisto/ENTRY/total_counts-field
total_elapsed_time: /NXapm_compositionspace_results/ENTRY/profiling/total_elapsed_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tool_common/profiling/total_elapsed_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/total_elapsed_time-field; /NXcs_profiling/total_elapsed_time-field; /NXem_calorimetry/ENTRY/profiling/total_elapsed_time-field
total_flux: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
total_flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
total_spectroscopy_time: /NXbias_spectroscopy/BIAS_SWEEP/total_spectroscopy_time-field
total_surface_area: /NXcg_cylinder_set/total_surface_area-field
total_uncounted_counts: /NXsnsevent/ENTRY/total_uncounted_counts-field; /NXsnshisto/ENTRY/total_uncounted_counts-field
traj_scan: /NXscan_control/traj_SCAN-group
trajectory_points: /NXscan_control/traj_SCAN/trajectory_points-field
transcode: /NXapm_paraprobe_transcoder_config/ENTRY/transcode-group
transfer_matrix: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX-field
transfer_rate: /NXfiber/transfer_rate-field
transformations: /NXactuator/TRANSFORMATIONS-group; /NXaperture/TRANSFORMATIONS-group; /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM/TRANSFORMATIONS-group; /NXattenuator/TRANSFORMATIONS-group; /NXbeam/TRANSFORMATIONS-group; /NXbeam_device/TRANSFORMATIONS-group; /NXbeam_path/TRANSFORMATIONS-group; /NXbeam_stop/TRANSFORMATIONS-group; /NXbending_magnet/TRANSFORMATIONS-group; /NXcapillary/TRANSFORMATIONS-group; /NXcollectioncolumn/TRANSFORMATIONS-group; /NXcollimator/TRANSFORMATIONS-group; /NXcomponent/TRANSFORMATIONS-group; /NXcoordinate_system/TRANSFORMATIONS-group; /NXcrystal/TRANSFORMATIONS-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group; /NXcxi_ptycho/sample_1/transformations-group; /NXdeflector/TRANSFORMATIONS-group; /NXdetector/TRANSFORMATIONS-group; /NXdisk_chopper/TRANSFORMATIONS-group; /NXebeam_column/electron_source/TRANSFORMATIONS-group; /NXelectronanalyser/TRANSFORMATIONS-group; /NXenergydispersion/TRANSFORMATIONS-group; /NXenvironment/TRANSFORMATIONS-group; /NXfermi_chopper/TRANSFORMATIONS-group; /NXfilter/TRANSFORMATIONS-group; /NXflipper/TRANSFORMATIONS-group; /NXfresnel_zone_plate/TRANSFORMATIONS-group; /NXgrating/TRANSFORMATIONS-group; /NXguide/TRANSFORMATIONS-group; /NXinsertion_device/TRANSFORMATIONS-group; /NXmanipulator/TRANSFORMATIONS-group; /NXmirror/TRANSFORMATIONS-group; /NXmoderator/TRANSFORMATIONS-group; /NXmonitor/TRANSFORMATIONS-group; /NXmonochromator/TRANSFORMATIONS-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group; /NXmpes_arpes/ENTRY/SAMPLE/transformations-group; /NXmpes_arpes/ENTRY/geometries/arpes_geometry/TRANSFORMATIONS-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group; /NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/transformations-group; /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/TRANSFORMATIONS-group; /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/TRANSFORMATIONS-group; /NXpinhole/TRANSFORMATIONS-group; /NXpolarizer/TRANSFORMATIONS-group; /NXpositioner/TRANSFORMATIONS-group; /NXpositioner_sts/TRANSFORMATIONS-group; /NXpulser_apm/SOURCE/TRANSFORMATIONS-group; /NXreflectron/TRANSFORMATIONS-group; /NXregistration/TRANSFORMATIONS-group; /NXsample/TRANSFORMATIONS-group; /NXsensor/TRANSFORMATIONS-group; /NXsensor_sts/TRANSFORMATIONS-group; /NXslit/TRANSFORMATIONS-group; /NXsource/TRANSFORMATIONS-group; /NXspindispersion/TRANSFORMATIONS-group; /NXvelocity_selector/TRANSFORMATIONS-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group; /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations-group; /NXxps/ENTRY/SAMPLE/transformations-group; /NXxraylens/TRANSFORMATIONS-group
translation: /NXcxi_ptycho/data_1/translation-link; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field; /NXcxi_ptycho/sample_1/geometry_1/translation-link; /NXgeometry/TRANSLATION-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission: /NXbeam_splitter/transmission-field; /NXcanSAS/ENTRY/SAMPLE/transmission-field; /NXcapillary/transmission-group; /NXcrystal/transmission-group; /NXfilter/transmission-group; /NXlens_opt/transmission-field; /NXpolarizer_opt/transmission-field; /NXsample/transmission-group; /NXsample_component/transmission-group
transmission_correction: /NXmpes/ENTRY/PROCESS_MPES/transmission_correction-group; /NXprocess_mpes/transmission_correction-group; /NXxps/ENTRY/PROCESS_MPES/transmission_correction-group
transmission_function: /NXelectronanalyser/transmission_function-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group; /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function-group; /NXprocess_mpes/transmission_correction/transmission_function-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group
transmission_spectrum: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmittance: /NXoptical_spectroscopy/ENTRY/derived_parameters/transmittance-field
transmitting_material: /NXcollimator/transmitting_material-field; /NXfermi_chopper/transmitting_material-field
triangle_cluster_identifier: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/triangle_cluster_identifier-field
triangle_identifier: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/triangle_identifier-field
triangle_meshid: /NXcg_alpha_complex/triangle_meshID-group
triangle_set: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set-group
triangle_setid: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID-group; /NXcg_alpha_complex/triangle_setID-group
triangle_soup: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup-group
triangleid: /NXcg_triangle_set/triangleID-group
triangles: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles-group; /NXcg_triangle_set/triangles-group
trigger_dead_time: /NXdetector/trigger_dead_time-field
trigger_delay_time: /NXdetector/trigger_delay_time-field
trigger_delay_time_set: /NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time: /NXdetector/trigger_internal_delay_time-field
triple_junction: /NXmicrostructure/triple_junction-group
triple_junction_identifier: /NXmicrostructure/interface/triple_junction_identifier-field; /NXmicrostructure/quadruple_junction/triple_junction_identifier-field
triple_line_mobility: /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility-group
trunc_species: /NXapm_compositionspace_config/ENTRY/config/autophase/trunc_species-field
tunneling_resistor: /NXiv_bias/tunneling_resistor-field
turbomolecular_pump: /NXapm_msr/instrument/turbomolecular_pump-group
twist: /NXvelocity_selector/twist-field
two_theta: /NXxrd_pan/ENTRY/experiment_config/two_theta-group; /NXxrd_pan/ENTRY/experiment_result/two_theta-field
two_time_corr_func: /NXxpcs/entry/twotime/two_time_corr_func-field
twotheta: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/twotheta-field
twotime: /NXxpcs/entry/twotime-group
type: /NXactuator/type-field; /NXapm/ENTRY/atom_probe/hit_finding/serialized/type-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/type-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/type-field; /NXapm/ENTRY/atom_probe/ranging/definitions/type-field; /NXapm/ENTRY/atom_probe/raw_data/serialized/type-field; /NXapm/ENTRY/atom_probe/reconstruction/config/type-field; /NXapm/ENTRY/atom_probe/reconstruction/results/type-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/type-field; /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field; /NXapm/ENTRY/sample/type-field; /NXapm/ENTRY/serializedID/type-field; /NXapm/ENTRY/specimen/type-field; /NXapm_compositionspace_config/ENTRY/config/ranging/type-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/type-field; /NXapm_compositionspace_results/ENTRY/config/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/type-field; /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/type-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/type-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/type-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/type-field; /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/type-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/type-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/type-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/type-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/type-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/type-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/type-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/type-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/type-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/type-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/type-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/type-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/type-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/type-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/type-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/type-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXarchive/entry/instrument/SOURCE/type-field; /NXarchive/entry/sample/type-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field; /NXattenuator/type-field; /NXbeam_path/GRATING/type-field; /NXbeam_path/SOURCE/type-field; /NXbeam_splitter/type-field; /NXcapillary/type-field; /NXcg_alpha_complex/type-field; /NXcollimator/type-field; /NXcoordinate_system/type-field; /NXcrystal/type-field; /NXcs_computer/memory/CIRCUIT/type-field; /NXcs_computer/processing/CIRCUIT/type-field; /NXcs_computer/storage/CIRCUIT/type-field; /NXcs_prng/type-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/type-field; /NXdeflector/type-field; /NXdetector/type-field; /NXdisk_chopper/type-field; /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/type-field; /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/type-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/type-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/type-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/type-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/type-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/type-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/type-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/type-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/type-field; /NXem/ENTRY/roiID/ebsd/indexing/source/type-field; /NXem/ENTRY/roiID/ebsd/measurement/source/type-field; /NXem/ENTRY/roiID/ebsd/simulation/source/type-field; /NXem/ENTRY/sample/type-field; /NXem/ENTRY/serializedID/type-field; /NXem_calorimetry/ENTRY/actuator/type-field; /NXem_calorimetry/ENTRY/diffraction/type-field; /NXenvironment/type-field; /NXfermi_chopper/type-field; /NXfiber/type-field; /NXflipper/type-field; /NXfluo/entry/INSTRUMENT/SOURCE/type-field; /NXinsertion_device/type-field; /NXiqproc/ENTRY/instrument/SOURCE/type-field; /NXlens_em/type-field; /NXlens_opt/type-field; /NXmanipulator/type-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/type-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/type-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/type-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field; /NXmirror/type-field; /NXmoderator/type-field; /NXmonitor/type-field; /NXmonopd/entry/INSTRUMENT/SOURCE/type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/type-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/type-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/type-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/type-field; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/type-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/type-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field; /NXnote/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/type-field; /NXpiezoelectric_material/type-field; /NXpolarizer/type-field; /NXpolarizer_opt/type-field; /NXrefscan/entry/instrument/SOURCE/type-field; /NXresolution/type-field; /NXsample/type-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXsastof/ENTRY/instrument/source/type-field; /NXsensor/type-field; /NXsensor_sts/type-field; /NXserialized/type-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/type-field; /NXsnsevent/ENTRY/instrument/SNS/type-field; /NXsnsevent/ENTRY/instrument/moderator/type-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/type-field; /NXsnshisto/ENTRY/instrument/SNS/type-field; /NXsnshisto/ENTRY/instrument/moderator/type-field; /NXsource/type-field; /NXspindispersion/type-field; /NXsqom/ENTRY/instrument/SOURCE/type-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field; /NXtomo/entry/instrument/SOURCE/type-field; /NXtomophase/entry/instrument/SOURCE/type-field; /NXtomoproc/entry/INSTRUMENT/SOURCE/type-field; /NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field; /NXtransmission/ENTRY/instrument/DETECTOR/type-field; /NXtransmission/ENTRY/instrument/SOURCE/type-field; /NXvelocity_selector/type-field; /NXwaveplate/type-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXxbase/entry/instrument/source/type-field
type_other: /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type_other-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type_other-field; /NXpolarizer_opt/type_other-field; /NXsource/type_other-field
ub_matrix: /NXsample/ub_matrix-field; /NXsingle_crystal/ub_matrix-field
unassigned: /NXsimilarity_grouping/statistics/unassigned-field
uncertainty: /NXaberration/uncertainty-field
uncertainty_model: /NXaberration/uncertainty_model-field
underload_value: /NXdetector/underload_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell: /NXcrystal/unit_cell-field; /NXlauetof/entry/sample/unit_cell-field; /NXsample/unit_cell-field; /NXsingle_crystal/UNIT_CELL-group; /NXtas/entry/SAMPLE/unit_cell-field; /NXxbase/entry/sample/unit_cell-field
unit_cell_a: /NXcrystal/unit_cell_a-field; /NXfilter/unit_cell_a-field
unit_cell_abc: /NXsample/unit_cell_abc-field; /NXsample_component/unit_cell_abc-field
unit_cell_alpha: /NXcrystal/unit_cell_alpha-field; /NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma: /NXsample/unit_cell_alphabetagamma-field; /NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b: /NXcrystal/unit_cell_b-field; /NXfilter/unit_cell_b-field
unit_cell_beta: /NXcrystal/unit_cell_beta-field; /NXfilter/unit_cell_beta-field
unit_cell_c: /NXcrystal/unit_cell_c-field; /NXfilter/unit_cell_c-field
unit_cell_class: /NXsample/unit_cell_class-field; /NXsample_component/unit_cell_class-field
unit_cell_gamma: /NXcrystal/unit_cell_gamma-field; /NXfilter/unit_cell_gamma-field
unit_cell_volume: /NXcrystal/unit_cell_volume-field; /NXfilter/unit_cell_volume-field; /NXsample/unit_cell_volume-field; /NXsample_component/unit_cell_volume-field
upper_cap_radii: /NXcg_cylinder_set/upper_cap_radii-field
upper_cap_surface_area: /NXcg_cylinder_set/upper_cap_surface_area-field
url: /NXcite/url-field; /NXtransmission/ENTRY/operator/url-field
usage: /NXcrystal/usage-field
use: /NXapm_compositionspace_config/ENTRY/config/autophase/use-field
user: /NXapm/ENTRY/USER-group; /NXapm_compositionspace_results/ENTRY/USER-group; /NXapm_paraprobe_tool_common/USER-group; /NXarchive/entry/user-group; /NXem_calorimetry/ENTRY/USER-group; /NXentry/USER-group; /NXevent_data_em/USER-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group; /NXlab_sample_mounting/ENTRY/USER-group; /NXmicrostructure_gragles_config/ENTRY/USER-group; /NXmicrostructure_gragles_results/ENTRY/USER-group; /NXmicrostructure_imm_results/ENTRY/USER-group; /NXmicrostructure_kanapy_results/ENTRY/USER-group; /NXmicrostructure_score_config/ENTRY/USER-group; /NXmicrostructure_score_results/ENTRY/USER-group; /NXmpes/ENTRY/USER-group; /NXoptical_spectroscopy/ENTRY/USER-group; /NXsensor_scan/ENTRY/USER-group; /NXsnsevent/ENTRY/USER-group; /NXsnshisto/ENTRY/USER-group; /NXsubentry/USER-group; /NXtofnpd/entry/user-group; /NXtofraw/entry/user-group; /NXtofsingle/entry/user-group
user_defined_roi: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi-group
userid: /NXapm_paraprobe_clusterer_results/ENTRY/common/userID-group; /NXapm_paraprobe_distancer_results/ENTRY/common/userID-group; /NXapm_paraprobe_intersector_results/ENTRY/common/userID-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/userID-group; /NXapm_paraprobe_ranger_results/ENTRY/common/userID-group; /NXapm_paraprobe_selector_results/ENTRY/common/userID-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/userID-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/userID-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/userID-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/userID-group; /NXem/ENTRY/userID-group
uuid: /NXcs_computer/uuid-field
v_v_spatial_correlation: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation-group
v_v_spatial_correlationid: /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID-group
validity_period: /NXcalibration/validity_period-field
value: /NXdispersion_single_parameter/value-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXelectrostatic_kicker/read_current/value-field; /NXelectrostatic_kicker/read_voltage/value-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID/value-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID/value-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID/value-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID/value-field; /NXenvironment/value-field; /NXfit_parameter/value-field; /NXlens_em/value-field; /NXlog/value-field; /NXmagnetic_kicker/read_current/value-field; /NXmagnetic_kicker/read_voltage/value-field; /NXmanipulator/cryostat/PID/setpoint_log/value-field; /NXmanipulator/drain_current_amperemeter/value-field; /NXmanipulator/drain_current_amperemeter/value_log/value-field; /NXmanipulator/sample_bias_potentiostat/PID/setpoint_log/value-field; /NXmanipulator/sample_bias_voltmeter/value-field; /NXmanipulator/sample_bias_voltmeter/value_log/value-field; /NXmanipulator/sample_heater/PID/setpoint_log/value-field; /NXmanipulator/sample_heater/heater_power_log/value-field; /NXmanipulator/temperature_sensor/value-field; /NXmanipulator/temperature_sensor/value_log/value-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/value-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log/value-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log/value-field; /NXmpes/ENTRY/SAMPLE/bias_env/value-field; /NXmpes/ENTRY/SAMPLE/drain_current_env/value-field; /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun/value-field; /NXmpes/ENTRY/SAMPLE/gas_pressure_env/value-field; /NXmpes/ENTRY/SAMPLE/temperature_env/value-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/value-field; /NXorientation/value-field; /NXpid/pv_sensor/value_log/value-field; /NXpositioner/value-field; /NXpositioner_sts/value-field; /NXquadrupole_magnet/read_current/value-field; /NXquadrupole_magnet/read_voltage/value-field; /NXsensor/value-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field; /NXsensor_sts/value-field; /NXseparator/read_Bfield_current/value-field; /NXseparator/read_Bfield_voltage/value-field; /NXseparator/read_Efield_current/value-field; /NXseparator/read_Efield_voltage/value-field; /NXsnsevent/ENTRY/DASlogs/LOG/value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsnshisto/ENTRY/DASlogs/LOG/value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsolenoid_magnet/read_current/value-field; /NXsolenoid_magnet/read_voltage/value-field; /NXspin_rotator/read_Bfield_current/value-field; /NXspin_rotator/read_Bfield_voltage/value-field; /NXspin_rotator/read_Efield_current/value-field; /NXspin_rotator/read_Efield_voltage/value-field; /NXxps/ENTRY/FIT/peakPEAK/function/position/value-field; /NXxps/ENTRY/FIT/peakPEAK/function/width/value-field
value_deriv1: /NXsensor/value_deriv1-field; /NXsensor_sts/value_deriv1-field
value_deriv1_log: /NXsensor/value_deriv1_log-group; /NXsensor_sts/value_deriv1_log-group
value_deriv2: /NXsensor/value_deriv2-field; /NXsensor_sts/value_deriv2-field
value_deriv2_log: /NXsensor/value_deriv2_log-group; /NXsensor_sts/value_deriv2_log-group
value_log: /NXmanipulator/drain_current_amperemeter/value_log-group; /NXmanipulator/sample_bias_voltmeter/value_log-group; /NXmanipulator/temperature_sensor/value_log-group; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log-group; /NXpid/pv_sensor/value_log-group; /NXsensor/value_log-group; /NXsensor_sts/value_log-group
value_timestamp: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
value_x: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_x-field
value_y: /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_y-field
values: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersion_repeated_parameter/values-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
variable: /NXiqproc/ENTRY/DATA/variable-field
variance_grain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_grain-field
variance_subgrain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_subgrain-field; /NXmicrostructure_imm_config/ENTRY/orientation_distribution/variance_subgrain-field
varied_parameter_link: /NXellipsometry/ENTRY/data_collection/varied_parameter_link-field
varphi_one: /NXmicrostructure_odf/phi_two_plot/varphi_one-field
varphi_two: /NXmicrostructure_odf/phi_two_plot/varphi_two-field
vector: /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity: /NXpositioner/velocity-field; /NXpositioner_sts/velocity-field
velocity_selector: /NXinstrument/VELOCITY_SELECTOR-group; /NXmonochromator/VELOCITY_SELECTOR-group
vendor: /NXapm/ENTRY/measurement/instrument/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/pulser/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/reflectron/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/detectorID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/vendor-field; /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/vendor-field; /NXfabrication/vendor-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field; /NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/vendor-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/vendor-field; /NXspm/ENTRY/experiment_instrument/hardware/vendor-field; /NXspm/ENTRY/experiment_instrument/software/vendor-field
version: /NXellipsometry/ENTRY/data_collection/data_software/version-field; /NXiqproc/ENTRY/reduction/version-field; /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/version-field; /NXprocess/version-field; /NXprocess_mpes/version-field; /NXsnsevent/ENTRY/SNSHistoTool/version-field; /NXsnshisto/ENTRY/SNSHistoTool/version-field; /NXsqom/ENTRY/reduction/version-field; /NXtomoproc/entry/reconstruction/version-field; /NXxasproc/ENTRY/XAS_data_reduction/version-field
vertex_identifier: /NXcg_face_list_data_structure/vertex_identifier-field
vertex_identifier_offset: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertex_identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertex_identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertex_identifier_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertex_identifier_offset-field; /NXcg_face_list_data_structure/vertex_identifier_offset-field; /NXcg_half_edge_data_structure/vertex_identifier_offset-field
vertex_incident_half_edge: /NXcg_half_edge_data_structure/vertex_incident_half_edge-field
vertex_normal: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal-field; /NXcg_hexahedron_set/vertex_normal-group; /NXcg_primitive_set/vertex_normal-group
vertex_normal_orientation: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal_orientation-field
vertex_normals: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertex_normals-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertex_normals-field
vertices: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertices-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertices-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertices-field; /NXcg_face_list_data_structure/vertices-field; /NXcg_polyline_set/vertices-field; /NXcylindrical_geometry/vertices-field; /NXoff_geometry/vertices-field
vertices_are_unique: /NXcg_face_list_data_structure/vertices_are_unique-field; /NXcg_polyline_set/vertices_are_unique-field
virtual_pixel_interpolation_applied: /NXdetector/virtual_pixel_interpolation_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
visualization: /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization-group
volatage_sensor: /NXspm/ENTRY/experiment_instrument/scan_environment/volatage_sensor-group
voltage: /NXdeflector/voltage-field; /NXebeam_column/electron_source/voltage-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/voltage-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/voltage-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/voltage-field; /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/voltage-field; /NXibeam_column/ion_source/voltage-field; /NXiv_temp/ENTRY/DATA/voltage-field; /NXlens_em/voltage-field; /NXreflectron/voltage-field; /NXsource/voltage-field
voltage_and_bowl: /NXapm/ENTRY/atom_probe/voltage_and_bowl-group
voltage_controller: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
voltage_energy_range: /NXelectronanalyser/voltage_energy_range-field
voltage_sensor: /NXspm/ENTRY/experiment_instrument/voltage_sensor-group
voltmeter: /NXmpes/ENTRY/SAMPLE/bias_env/voltmeter-group
volume: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/volume-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/volume-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/volume-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/volume-field; /NXatom_set/volume-field; /NXcg_hexahedron_set/volume-field; /NXcg_primitive_set/volume-field; /NXcrystal_structure/volume-field; /NXion/volume-field; /NXmicrostructure/crystal/volume-field; /NXmicrostructure/triple_junction/volume-field; /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/volume-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/volume-field; /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field; /NXunit_cell/volume-field
volume_fraction: /NXmicrostructure_odf/kth_extrema/volume_fraction-field; /NXsample/volume_fraction-field; /NXsample_component/volume_fraction-field; /NXsample_component_set/volume_fraction-field
volumetric_features: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features-group
voronoi_cells: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells-group
voxel: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/voxel-field
voxel_identifier: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/voxel_identifier-field
voxelization: /NXapm_compositionspace_config/ENTRY/config/voxelization-group; /NXapm_compositionspace_results/ENTRY/voxelization-group
wall: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall-group
wall_contact_bottom: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom-group
wall_contact_front: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front-group
wall_contact_global: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global-group
wall_contact_left: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left-group
wall_contact_rear: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear-group
wall_contact_right: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right-group
wall_contact_top: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top-group
warmup: /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/warmup-field; /NXcs_prng/warmup-field
wavelength: /NXapm/ENTRY/measurement/instrument/pulser/sourceID/wavelength-field; /NXcrystal/wavelength-field; /NXdetector/efficiency/wavelength-field; /NXdispersion_table/wavelength-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/wavelength-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/wavelength-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/wavelength-field; /NXfermi_chopper/wavelength-field; /NXfluo/entry/INSTRUMENT/monochromator/wavelength-field; /NXguide/reflectivity/wavelength-field; /NXmonochromator/wavelength-field; /NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field; /NXpulser_apm/SOURCE/wavelength-field; /NXraman/ENTRY/INSTRUMENT/beam_incident/wavelength-field; /NXrefscan/entry/instrument/monochromator/wavelength-field; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field; /NXsource/wavelength-field; /NXtransmission/ENTRY/instrument/spectrometer/wavelength-field; /NXvelocity_selector/wavelength-field; /NXxbase/entry/instrument/monochromator/wavelength-field; /NXxlaue/entry/instrument/source/distribution/wavelength-field
wavelength_calibration: /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration-group
wavelength_dispersion: /NXmonochromator/wavelength_dispersion-field
wavelength_error: /NXmonochromator/wavelength_error-field
wavelength_errors: /NXmonochromator/wavelength_errors-field
wavelength_identifier: /NXdispersion_function/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_identifier-field
wavelength_max: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field; /NXdispersion_function/wavelength_max-field
wavelength_min: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field; /NXdispersion_function/wavelength_min-field
wavelength_range: /NXbeam_splitter/wavelength_range-field; /NXdisk_chopper/wavelength_range-field; /NXpolarizer_opt/wavelength_range-field; /NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field; /NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field; /NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
wavelength_range_coating: /NXbeam_splitter/coating/wavelength_range_coating-field; /NXwaveplate/coating/wavelength_range_coating-field
wavelength_resolution: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution-group
wavelength_spread: /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field; /NXvelocity_selector/wavelength_spread-field
wavelength_unit: /NXdispersion_function/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_unit-field
wavelengths: /NXwaveplate/wavelengths-field
waveplate: /NXbeam_path/WAVEPLATE-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/WAVEPLATE-group
wedge_angle: /NXbeam_splitter/SHAPE/wedge_angle-field; /NXpolarizer_opt/SHAPE/wedge_angle-field
weight: /NXapm_compositionspace_results/ENTRY/voxelization/elementID/weight-field; /NXapm_compositionspace_results/ENTRY/voxelization/weight-field; /NXdelocalization/weighting_model/weight-field; /NXmicrostructure_odf/sampling/weight-field
weighting_method: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/weighting_method-field; /NXdelocalization/weighting_model/weighting_method-field
weighting_model: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model-group; /NXdelocalization/weighting_model-group
weights: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/weights-field; /NXem_eds/indexing/IMAGE_SET/PROCESS/weights-field
weinberg_vector: /NXcg_half_edge_data_structure/weinberg_vector-field
width: /NXcg_hexahedron_set/width-field; /NXcg_primitive_set/width-field; /NXfermi_chopper/width-field; /NXvelocity_selector/width-field; /NXxps/ENTRY/FIT/peakPEAK/function/width-group
winding_order: /NXcg_face_list_data_structure/winding_order-field; /NXoff_geometry/winding_order-field
window: /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window-group; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window-group; /NXapm_paraprobe_selector_results/ENTRY/roi/window-group; /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window-group; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window-group; /NXapm_paraprobe_tool_results/window-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window-group
window_correction: /NXopt_window/ENTRY/window_correction-group
window_effects_corrected: /NXopt_window/ENTRY/window_effects_corrected-field
window_effects_type: /NXopt_window/ENTRY/window_effects_type-field
window_number: /NXbeam_path/window_NUMBER-group
window_triangles: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles-group
windowing_method: /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/windowing_method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/windowing_method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/windowing_method-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/windowing_method-field; /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/windowing_method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/windowing_method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/windowing_method-field; /NXspatial_filter/windowing_method-field
work_function: /NXelectronanalyser/work_function-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field
workflow_step_description: /NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
workflow_step_identifier: /NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_identifier-field
working_distance: /NXcapillary/working_distance-field; /NXcollectioncolumn/working_distance-field; /NXoptical_system_em/working_distance-field
x: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXbeam_stop/x-field; /NXcoordinate_system/x-field; /NXcxi_ptycho/DATA/x-link; /NXdata/x-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/x-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/x-field; /NXmicrostructure_score_config/ENTRY/sampling/x-field; /NXspm/ENTRY/experiment_instrument/piezo_sensor/x-field; /NXtomoproc/entry/data/x-field; /NXxps/ENTRY/geometries/xps_coordinate_system/x-field
x_alias: /NXcoordinate_system/x_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field
x_axis_direction: /NXmicrostructure_mtex_config/conventions/x_axis_direction-field
x_boundary_convention: /NXem/ENTRY/roiID/ebsd/pattern_centre/x_boundary_convention-field; /NXem_ebsd/pattern_centre/x_boundary_convention-field
x_direction: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/x_direction-field; /NXcoordinate_system/x_direction-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/x_direction-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/x_direction-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/x_direction-field; /NXem_ebsd/gnomonic_reference_frame/x_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
x_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field; /NXslit/x_gap-field
x_indices: /NXcxi_ptycho/DATA/x_indices-field
x_normalization_direction: /NXem/ENTRY/roiID/ebsd/pattern_centre/x_normalization_direction-field; /NXem_ebsd/pattern_centre/x_normalization_direction-field
x_pixel_offset: /NXdetector/x_pixel_offset-field; /NXsnsevent/ENTRY/DATA/x_pixel_offset-link; /NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field; /NXsnshisto/ENTRY/DATA/x_pixel_offset-link; /NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field; /NXdetector/x_pixel_size-field; /NXlauetof/entry/instrument/detector/x_pixel_size-field; /NXreftof/entry/instrument/detector/x_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXsastof/ENTRY/instrument/detector/x_pixel_size-field; /NXtomo/entry/instrument/detector/x_pixel_size-field; /NXtomophase/entry/instrument/sample/x_pixel_size-field; /NXxbase/entry/instrument/detector/x_pixel_size-field; /NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
x_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field; /NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position: /NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
x_target: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_target-field
x_translation: /NXsample/x_translation-field; /NXtomo/entry/sample/x_translation-field; /NXtomophase/entry/sample/x_translation-field; /NXxbase/entry/sample/x_translation-field
x_value: /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_value-field
xas_data_reduction: /NXxasproc/ENTRY/XAS_data_reduction-group
xdmf_cell_identifier: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_cell_identifier-field
xdmf_cylinder: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder-group
xdmf_feature_identifier: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_feature_identifier-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_feature_identifier-field
xdmf_gradient: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_gradient-field
xdmf_intensity: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_intensity-field
xdmf_topology: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/xdmf_topology-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/xdmf_topology-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/xdmf_topology-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_topology-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization/xdmf_topology-field
xdmf_xyz: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_xyz-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_xyz-field
xpos: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xpos-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xpos-field
xps_coordinate_system: /NXxps/ENTRY/geometries/xps_coordinate_system-group
xray_tube_current: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_current-field
xray_tube_material: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_material-field
xray_tube_voltage: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_voltage-field
xraylens: /NXbeam_path/XRAYLENS-group; /NXinstrument/XRAYLENS-group
xy_piezo_sensor: /NXafm/ENTRY/experiment_instrument/XY_piezo_sensor-group; /NXafm/ENTRY/experiment_instrument/scan_environment/XY_piezo_sensor-group
y: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXbeam_stop/y-field; /NXcoordinate_system/y-field; /NXcxi_ptycho/DATA/y-link; /NXdata/y-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/y-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/y-field; /NXspm/ENTRY/experiment_instrument/piezo_sensor/y-field; /NXtomoproc/entry/data/y-field; /NXxps/ENTRY/geometries/xps_coordinate_system/y-field
y_alias: /NXcoordinate_system/y_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field
y_boundary_convention: /NXem/ENTRY/roiID/ebsd/pattern_centre/y_boundary_convention-field; /NXem_ebsd/pattern_centre/y_boundary_convention-field
y_direction: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/y_direction-field; /NXcoordinate_system/y_direction-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/y_direction-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/y_direction-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/y_direction-field; /NXem_ebsd/gnomonic_reference_frame/y_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
y_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field; /NXslit/y_gap-field; /NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
y_indices: /NXcxi_ptycho/DATA/y_indices-field
y_normalization_direction: /NXem/ENTRY/roiID/ebsd/pattern_centre/y_normalization_direction-field; /NXem_ebsd/pattern_centre/y_normalization_direction-field
y_pixel_offset: /NXdetector/y_pixel_offset-field; /NXsnsevent/ENTRY/DATA/y_pixel_offset-link; /NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field; /NXsnshisto/ENTRY/DATA/y_pixel_offset-link; /NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field; /NXdetector/y_pixel_size-field; /NXlauetof/entry/instrument/detector/y_pixel_size-field; /NXreftof/entry/instrument/detector/y_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXsastof/ENTRY/instrument/detector/y_pixel_size-field; /NXtomo/entry/instrument/detector/y_pixel_size-field; /NXtomophase/entry/instrument/sample/y_pixel_size-field; /NXxbase/entry/instrument/detector/y_pixel_size-field; /NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
y_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field; /NXcanSAS/ENTRY/SAMPLE/y_position-field
y_pred: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/y_pred-field
y_rotation_axis_pixel_position: /NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
y_translation: /NXtomo/entry/sample/y_translation-field; /NXtomophase/entry/sample/y_translation-field; /NXxbase/entry/sample/y_translation-field
yaw: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field; /NXcanSAS/ENTRY/SAMPLE/yaw-field
young_modulus: /NXpiezoelectric_material/young_modulus-field
ypos: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/ypos-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/ypos-field
z: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXcoordinate_system/z-field; /NXdata/z-field; /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/z-field; /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/z-field; /NXspm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/z-field; /NXspm/ENTRY/experiment_instrument/piezo_sensor/z-field; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/z-field; /NXtomoproc/entry/data/z-field; /NXxps/ENTRY/geometries/xps_coordinate_system/z-field
z_alias: /NXcoordinate_system/z_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field
z_average_time: /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_average_time-field
z_avg_time: /NXiv_bias/z_avg_time-field
z_axis_direction: /NXmicrostructure_mtex_config/conventions/z_axis_direction-field
z_control_time: /NXiv_bias/z_control_time-field
z_controller: /NXpositioner_spm/z_controller-group; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller-group; /NXspm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller-group; /NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller-group
z_controller_hold: /NXiv_bias/z_controller_hold-field; /NXpositioner_sts/z_controller_hold-field; /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_controller_hold-field
z_controller_time: /NXspm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_controller_time-field
z_contronller: /NXpositioner_sts/z_contronller-field
z_direction: /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/z_direction-field; /NXcoordinate_system/z_direction-field; /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/z_direction-field; /NXem/ENTRY/coordinate_system_set/processing_reference_frame/z_direction-field; /NXem/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field; /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/z_direction-field; /NXem_ebsd/gnomonic_reference_frame/z_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field; /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field; /NXxps/ENTRY/geometries/xps_coordinate_system/z_direction-field
z_offset: /NXbias_spectroscopy/POSITIONER_SPM/z_offset-field; /NXiv_bias/z_offset-field; /NXpositioner_spm/z_offset-field; /NXpositioner_sts/z_offset-field
z_pixel_offset: /NXdetector/z_pixel_offset-field
z_translation: /NXtomo/entry/sample/z_translation-field; /NXtomophase/entry/sample/z_translation-field
zener_smith: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith-group
zlp_correction: /NXem_eels/zlp_correction-group
zone_height: /NXfresnel_zone_plate/zone_height-field
zone_material: /NXfresnel_zone_plate/zone_material-field
zone_support_material: /NXfresnel_zone_plate/zone_support_material-field
zpos: /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/zpos-field; /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/zpos-field

written: 2024-12-13T21:39:10.938892