NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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2nd_order_corr_n
/NXsts/ENTRY/INSTRUMENT/piezo_config/2nd_order_corr_N-field
@angular0_indices
/NXmpes_arpes/ENTRY/data@angular0_indices-attribute
@angular1_indices
/NXmpes_arpes/ENTRY/data@angular1_indices-attribute
@auxiliary_signals
/NXdata@auxiliary_signals-attribute
@axes
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d@axes-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@axes-attribute
/NXapm_compositionspace_results/ENTRY/autophase/result@axes-attribute
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@axes-attribute
/NXapm_compositionspace_results/ENTRY/segmentation/pca/result@axes-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@axes-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@axes-attribute
/NXcxi_ptycho/DATA@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
/NXdata/DATA@axes-attribute
/NXdata@axes-attribute
/NXdetector/efficiency@axes-attribute
/NXelectronanalyser/transmission_function@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@axes-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@axes-attribute
/NXem/ENTRY/roiID/ebsd/indexing/roi@axes-attribute
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@axes-attribute
/NXem/ENTRY/roiID/eds/indexing/summary@axes-attribute
/NXem_calorimetry/ENTRY/azimuthal_integration/result@axes-attribute
/NXem_calorimetry/ENTRY/background_subtraction/result@axes-attribute
/NXguide/reflectivity@axes-attribute
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@axes-attribute
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@axes-attribute
/NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function@axes-attribute
/NXmpes_arpes/ENTRY/data@axes-attribute
/NXoptical_spectroscopy/ENTRY/DATA@axes-attribute
/NXprocess_mpes/transmission_correction/transmission_function@axes-attribute
/NXtransmission/ENTRY/data@axes-attribute
@axis
/NXdata/AXISNAME@axis-attribute
/NXdetector/time_of_flight@axis-attribute
/NXdetector/x_pixel_offset@axis-attribute
/NXdetector/y_pixel_offset@axis-attribute
/NXdetector/z_pixel_offset@axis-attribute
@axisname_indices
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d@AXISNAME_indices-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@AXISNAME_indices-attribute
/NXapm_compositionspace_results/ENTRY/autophase/result@AXISNAME_indices-attribute
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@AXISNAME_indices-attribute
/NXapm_compositionspace_results/ENTRY/segmentation/pca/result@AXISNAME_indices-attribute
/NXdata@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@AXISNAME_indices-attribute
/NXem/ENTRY/roiID/ebsd/indexing/roi@AXISNAME_indices-attribute
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@AXISNAME_indices-attribute
/NXem/ENTRY/roiID/eds/indexing/summary@AXISNAME_indices-attribute
/NXem_calorimetry/ENTRY/azimuthal_integration/result@AXISNAME_indices-attribute
/NXem_calorimetry/ENTRY/background_subtraction/result@AXISNAME_indices-attribute
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute
@baseline_reference
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
/NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class
/NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/DATA@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
/NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
/NXcanSAS/ENTRY@canSAS_class-attribute
@characteristics_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics@characteristics_type-attribute
@check_sum
/NXdetector/data@check_sum-attribute
@comment
/NXentry/revision@comment-attribute
/NXsubentry/revision@comment-attribute
@components
/NXsample_component_set@components-attribute
@configuration
/NXentry/program_name@configuration-attribute
/NXsubentry/program_name@configuration-attribute
@creator
/NXroot@creator-attribute
@creator_version
/NXroot@creator_version-attribute
@default
/NXactuator@default-attribute
/NXaperture@default-attribute
/NXattenuator@default-attribute
/NXbeam@default-attribute
/NXbeam_stop@default-attribute
/NXbending_magnet@default-attribute
/NXcalibration@default-attribute
/NXcanSAS/ENTRY@default-attribute
/NXcapillary@default-attribute
/NXcite@default-attribute
/NXcollectioncolumn@default-attribute
/NXcollimator@default-attribute
/NXcrystal@default-attribute
/NXcylindrical_geometry@default-attribute
/NXdetector@default-attribute
/NXdetector_group@default-attribute
/NXdetector_module@default-attribute
/NXdisk_chopper@default-attribute
/NXelectron_level@default-attribute
/NXelectronanalyser@default-attribute
/NXenergydispersion@default-attribute
/NXentry@default-attribute
/NXenvironment@default-attribute
/NXevent_data@default-attribute
/NXfermi_chopper@default-attribute
/NXfilter@default-attribute
/NXfit_background@default-attribute
/NXflipper@default-attribute
/NXfresnel_zone_plate@default-attribute
/NXgeometry@default-attribute
/NXgrating@default-attribute
/NXguide@default-attribute
/NXinsertion_device@default-attribute
/NXinstrument@default-attribute
/NXlog@default-attribute
/NXmanipulator@default-attribute
/NXmirror@default-attribute
/NXmoderator@default-attribute
/NXmonitor@default-attribute
/NXmonochromator@default-attribute
/NXnote@default-attribute
/NXoff_geometry@default-attribute
/NXorientation@default-attribute
/NXparameters@default-attribute
/NXpeak@default-attribute
/NXpid@default-attribute
/NXpinhole@default-attribute
/NXpolarizer@default-attribute
/NXpositioner@default-attribute
/NXpositioner_sts@default-attribute
/NXprocess@default-attribute
/NXprocess_mpes@default-attribute
/NXreflections@default-attribute
/NXresolution@default-attribute
/NXroot@default-attribute
/NXsample@default-attribute
/NXsample_component@default-attribute
/NXsensor@default-attribute
/NXsensor_sts@default-attribute
/NXshape@default-attribute
/NXslit@default-attribute
/NXsource@default-attribute
/NXsubentry@default-attribute
/NXtransformations@default-attribute
/NXtranslation@default-attribute
/NXuser@default-attribute
/NXvelocity_selector@default-attribute
/NXxraylens@default-attribute
@depends_on
/NXapm_hit_finding/hit_positions@depends_on-attribute
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions@depends_on-attribute
/NXapm_reconstruction/reconstructed_positions@depends_on-attribute
/NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
/NXbeam_path/TRANSFORMATIONS/AXISNAME@depends_on-attribute
/NXcomponent@depends_on-attribute
/NXcrystal_structure/atom_position@depends_on-attribute
/NXdeflector@depends_on-attribute
/NXdetector_module/fast_pixel_direction@depends_on-attribute
/NXdetector_module/module_offset@depends_on-attribute
/NXdetector_module/slow_pixel_direction@depends_on-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@depends_on-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@depends_on-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@depends_on-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@depends_on-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@depends_on-attribute
/NXtransformations/AXISNAME@depends_on-attribute
/NXunit_cell/atom_positions@depends_on-attribute
/NXunit_cell/base_vector_a@depends_on-attribute
/NXunit_cell/base_vector_b@depends_on-attribute
/NXunit_cell/base_vector_c@depends_on-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@depends_on-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@depends_on-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@depends_on-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@depends_on-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@depends_on-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@depends_on-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@depends_on-attribute
@description
/NXelectron_level@description-attribute
/NXelectrostatic_kicker/timing@description-attribute
/NXmagnetic_kicker/timing@description-attribute
/NXreflections/background_mean@description-attribute
/NXreflections/bounding_box@description-attribute
/NXreflections/d@description-attribute
/NXreflections/det_module@description-attribute
/NXreflections/entering@description-attribute
/NXreflections/flags@description-attribute
/NXreflections/h@description-attribute
/NXreflections/id@description-attribute
/NXreflections/int_prf@description-attribute
/NXreflections/int_prf_errors@description-attribute
/NXreflections/int_prf_var@description-attribute
/NXreflections/int_sum@description-attribute
/NXreflections/int_sum_errors@description-attribute
/NXreflections/int_sum_var@description-attribute
/NXreflections/k@description-attribute
/NXreflections/l@description-attribute
/NXreflections/lp@description-attribute
/NXreflections/observed_frame@description-attribute
/NXreflections/observed_frame_errors@description-attribute
/NXreflections/observed_frame_var@description-attribute
/NXreflections/observed_phi@description-attribute
/NXreflections/observed_phi_errors@description-attribute
/NXreflections/observed_phi_var@description-attribute
/NXreflections/observed_px_x@description-attribute
/NXreflections/observed_px_x_errors@description-attribute
/NXreflections/observed_px_x_var@description-attribute
/NXreflections/observed_px_y@description-attribute
/NXreflections/observed_px_y_errors@description-attribute
/NXreflections/observed_px_y_var@description-attribute
/NXreflections/observed_x@description-attribute
/NXreflections/observed_x_errors@description-attribute
/NXreflections/observed_x_var@description-attribute
/NXreflections/observed_y@description-attribute
/NXreflections/observed_y_errors@description-attribute
/NXreflections/observed_y_var@description-attribute
/NXreflections/overlaps@description-attribute
/NXreflections/partiality@description-attribute
/NXreflections/polar_angle@description-attribute
/NXreflections/predicted_frame@description-attribute
/NXreflections/predicted_phi@description-attribute
/NXreflections/predicted_px_x@description-attribute
/NXreflections/predicted_px_y@description-attribute
/NXreflections/predicted_x@description-attribute
/NXreflections/predicted_y@description-attribute
/NXreflections/prf_cc@description-attribute
/NXreflections/reflection_id@description-attribute
/NXreflections@description-attribute
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
@device
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE@device-attribute
@direction
/NXsample/electric_field@direction-attribute
/NXsample/magnetic_field@direction-attribute
/NXsample/stress_field@direction-attribute
@distribution
/NXdata/AXISNAME@distribution-attribute
@energy_indices
/NXmpes/ENTRY/data@energy_indices-attribute
/NXmpes_arpes/ENTRY/data@energy_indices-attribute
/NXxps/ENTRY/data@energy_indices-attribute
@entry
/NXarpes/ENTRY@entry-attribute
/NXiqproc/ENTRY@entry-attribute
/NXsastof/ENTRY@entry-attribute
/NXsqom/ENTRY@entry-attribute
/NXxas/ENTRY@entry-attribute
/NXxasproc/ENTRY@entry-attribute
@epoch_start
/NXem_ebsd/measurement/time@epoch_start-attribute
@equipment_component
/NXtransformations/AXISNAME@equipment_component-attribute
@file_name
/NXroot@file_name-attribute
@file_time
/NXroot@file_time-attribute
@file_update_time
/NXroot@file_update_time-attribute
@first_good
/NXdata/AXISNAME@first_good-attribute
@first_point_for_fit
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux
/NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency
/NXdetector/raw_time_of_flight@frequency-attribute
@h5py_version
/NXroot@h5py_version-attribute
@hdf5_version
/NXroot@HDF5_Version-attribute
@hdf_version
/NXroot@HDF_version-attribute
@i_axes
/NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version
/NXentry@IDF_Version-attribute
/NXsubentry@IDF_Version-attribute
@index
/NXarchive/entry@index-attribute
@input
/NXbeam_transfer_matrix_table/TRANSFER_MATRIX@input-attribute
@input_path
/NXcalibration/input_SYMBOL@input_path-attribute
/NXcalibration/original_axis@input_path-attribute
@interpretation
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good
/NXdata/AXISNAME@last_good-attribute
@local_name
/NXdetector/crate@local_name-attribute
/NXdetector/input@local_name-attribute
/NXdetector/slot@local_name-attribute
@logged_against
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy@logged_against-attribute
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction@logged_against-attribute
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency@logged_against-attribute
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage@logged_against-attribute
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage@logged_against-attribute
/NXevent_data_apm/instrument/analysis_chamber/pressure@logged_against-attribute
/NXevent_data_apm/instrument/buffer_chamber/pressure@logged_against-attribute
/NXevent_data_apm/instrument/load_lock_chamber/pressure@logged_against-attribute
/NXevent_data_apm/instrument/stage_lab/temperature@logged_against-attribute
/NXpulser_apm/SOURCE/BEAM/incidence_vector@logged_against-attribute
/NXpulser_apm/SOURCE/BEAM/pinhole_position@logged_against-attribute
/NXpulser_apm/SOURCE/BEAM/spot_position@logged_against-attribute
/NXpulser_apm/SOURCE/pulse_energy@logged_against-attribute
/NXpulser_apm/pulse_fraction@logged_against-attribute
/NXpulser_apm/pulse_frequency@logged_against-attribute
/NXpulser_apm/pulse_number@logged_against-attribute
/NXpulser_apm/pulse_voltage@logged_against-attribute
/NXpulser_apm/standing_voltage@logged_against-attribute
@long_name
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i@long_name-attribute
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j@long_name-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z@long_name-attribute
/NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier@long_name-attribute
/NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance@long_name-attribute
/NXdata/AXISNAME@long_name-attribute
/NXdata/DATA@long_name-attribute
/NXdetector/data@long_name-attribute
/NXdetector/time_of_flight@long_name-attribute
/NXdetector/x_pixel_offset@long_name-attribute
/NXdetector/y_pixel_offset@long_name-attribute
/NXdetector/z_pixel_offset@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_i@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_j@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/imag@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/intensity@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/magnitude@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/real@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_i@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_j@long_name-attribute
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_k@long_name-attribute
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/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@transformation_type-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@transformation_type-attribute
/NXtransformations/AXISNAME@transformation_type-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@transformation_type-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@transformation_type-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@transformation_type-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@transformation_type-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@transformation_type-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@transformation_type-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@transformation_type-attribute
@type
/NXdata_mpes/energy@type-attribute
/NXdata_mpes_detector/energy@type-attribute
/NXentry/thumbnail@type-attribute
/NXmpes/ENTRY/data/energy@type-attribute
@uncertainties
/NXcanSAS/ENTRY/DATA/I@uncertainties-attribute
/NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
@units
/NXbeam/final_polarization@units-attribute
/NXbeam/fluence@units-attribute
/NXbeam/incident_polarization@units-attribute
/NXbeam_path/ATTENUATOR/attenuation@units-attribute
/NXbeam_path/GRATING/spectrum@units-attribute
/NXbeam_path/MONOCHROMATOR/spectrum@units-attribute
/NXbeam_path/SOURCE/excitation_wavelength@units-attribute
/NXcanSAS/ENTRY/DATA/I@units-attribute
/NXcanSAS/ENTRY/DATA/Idev@units-attribute
/NXcanSAS/ENTRY/DATA/Q@units-attribute
/NXcanSAS/ENTRY/DATA/Qdev@units-attribute
/NXcanSAS/ENTRY/DATA/Qmean@units-attribute
/NXcanSAS/ENTRY/DATA/dQl@units-attribute
/NXcanSAS/ENTRY/DATA/dQw@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute
/NXellipsometry/ENTRY/data_collection/NAME_spectrum@units-attribute
/NXellipsometry/ENTRY/data_collection/measured_data@units-attribute
/NXellipsometry/ENTRY/data_collection/measured_data_errors@units-attribute
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i@units-attribute
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j@units-attribute
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity@units-attribute
/NXfiber/attenuation@units-attribute
/NXfiber/spectral_range@units-attribute
/NXfiber/transfer_rate@units-attribute
/NXparameters/term@units-attribute
/NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle@units-attribute
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one@units-attribute
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two@units-attribute
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta@units-attribute
@url
/NXapm_compositionspace_results/ENTRY/programID/program@url-attribute
/NXdispersive_material/ENTRY/definition@url-attribute
/NXellipsometry/ENTRY/data_collection/data_software@URL-attribute
/NXellipsometry/ENTRY/definition@URL-attribute
/NXentry/definition@URL-attribute
/NXentry/definition_local@URL-attribute
/NXmicrostructure_gragles_config/ENTRY/program1/program_name@url-attribute
/NXmicrostructure_gragles_results/ENTRY/program1/program_name@url-attribute
/NXmicrostructure_imm_results/ENTRY/program1/program@url-attribute
/NXmicrostructure_kanapy_results/ENTRY/program1/program@url-attribute
/NXmicrostructure_kanapy_results/ENTRY/program2/program@url-attribute
/NXmicrostructure_score_config/ENTRY/program1/program_name@url-attribute
/NXmicrostructure_score_results/ENTRY/program1/program_name@url-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@URL-attribute
/NXoptical_spectroscopy/ENTRY/definition@URL-attribute
/NXprogram/program@url-attribute
/NXraman/ENTRY/definition@URL-attribute
/NXsubentry/definition@URL-attribute
/NXsubentry/definition_local@URL-attribute
/NXtransmission/ENTRY/acquisition_program@url-attribute
/NXtransmission/ENTRY/definition@url-attribute
@use_these
/NXmicrostructure/interface/crystal_identifier@use_these-attribute
/NXmicrostructure/interface/phase_identifier@use_these-attribute
/NXmicrostructure/interface/triple_junction_identifier@use_these-attribute
/NXmicrostructure/quadruple_junction/crystal_identifier@use_these-attribute
/NXmicrostructure/quadruple_junction/interface_identifier@use_these-attribute
/NXmicrostructure/quadruple_junction/location@use_these-attribute
/NXmicrostructure/quadruple_junction/phase_identifier@use_these-attribute
/NXmicrostructure/quadruple_junction/triple_junction_identifier@use_these-attribute
/NXmicrostructure/triple_junction/interface_identifier@use_these-attribute
/NXmicrostructure/triple_junction/location@use_these-attribute
/NXmicrostructure/triple_junction/polyline_identifier@use_these-attribute
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/crystal_identifier@use_these-attribute
@varied_variable
/NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
@vector
/NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute
/NXcxi_ptycho/sample_1/transformations@vector-attribute
/NXdetector_module/fast_pixel_direction@vector-attribute
/NXdetector_module/module_offset@vector-attribute
/NXdetector_module/slow_pixel_direction@vector-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@vector-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@vector-attribute
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@vector-attribute
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@vector-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@vector-attribute
/NXtransformations/AXISNAME@vector-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@vector-attribute
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@vector-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@vector-attribute
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@vector-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@vector-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@vector-attribute
/NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@vector-attribute
@version
/NXapm/ENTRY/atom_probe/hit_finding/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/ranging/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/raw_data/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/reconstruction/programID/program@version-attribute
/NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program@version-attribute
/NXapm/ENTRY/definition@version-attribute
/NXapm/ENTRY/profiling/programID/program@version-attribute
/NXapm_compositionspace_config/ENTRY/definition@version-attribute
/NXapm_compositionspace_results/ENTRY/definition@version-attribute
/NXapm_compositionspace_results/ENTRY/programID/program@version-attribute
/NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_clusterer_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_clusterer_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_distancer_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_distancer_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_distancer_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_distancer_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_intersector_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_intersector_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_intersector_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_intersector_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_nanochem_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_ranger_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_ranger_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_ranger_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_ranger_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_selector_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_selector_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_selector_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_selector_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_spatstat_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_spatstat_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_surfacer_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_surfacer_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_tessellator_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_tessellator_results/ENTRY/definition@version-attribute
/NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_transcoder_config/ENTRY/definition@version-attribute
/NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program@version-attribute
/NXapm_paraprobe_transcoder_results/ENTRY/definition@version-attribute
/NXarchive/entry/program@version-attribute
/NXcalibration/calibration_software@version-attribute
/NXcanSAS/ENTRY@version-attribute
/NXcs_computer/operating_system@version-attribute
/NXdispersive_material/ENTRY/definition@version-attribute
/NXellipsometry/ENTRY/definition@version-attribute
/NXem/ENTRY/definition@version-attribute
/NXem/ENTRY/measurement/em_lab/control_programID/program@version-attribute
/NXem/ENTRY/profiling/programID/program@version-attribute
/NXem_calorimetry/ENTRY/azimuthal_integration/programID/program@version-attribute
/NXem_calorimetry/ENTRY/background_subtraction/programID/program@version-attribute
/NXem_calorimetry/ENTRY/definition@version-attribute
/NXem_calorimetry/ENTRY/distortion_correction/programID/program@version-attribute
/NXentry/definition@version-attribute
/NXentry/definition_local@version-attribute
/NXentry/entry_identifier_uuid@version-attribute
/NXentry/program_name@version-attribute
/NXfabrication/model@version-attribute
/NXlab_electro_chemo_mechanical_preparation/ENTRY@version-attribute
/NXlab_sample_mounting/ENTRY@version-attribute
/NXmicrostructure_gragles_config/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_gragles_config/ENTRY/program1/program_name@version-attribute
/NXmicrostructure_gragles_results/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_gragles_results/ENTRY/program1/program_name@version-attribute
/NXmicrostructure_imm_results/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_imm_results/ENTRY/program1/program@version-attribute
/NXmicrostructure_kanapy_results/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_kanapy_results/ENTRY/program1/program@version-attribute
/NXmicrostructure_kanapy_results/ENTRY/program2/program@version-attribute
/NXmicrostructure_score_config/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_score_config/ENTRY/program1/program_name@version-attribute
/NXmicrostructure_score_results/ENTRY/environment/programID/program@version-attribute
/NXmicrostructure_score_results/ENTRY/program1/program_name@version-attribute
/NXmpes/ENTRY/definition@version-attribute
/NXmpes_arpes/ENTRY/definition@version-attribute
/NXmx/ENTRY@version-attribute
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@version-attribute
/NXoptical_spectroscopy/ENTRY/definition@version-attribute
/NXprogram/program@version-attribute
/NXraman/ENTRY/definition@version-attribute
/NXsensor_scan/ENTRY/PROCESS/program@version-attribute
/NXsensor_scan/ENTRY/definition@version-attribute
/NXspe/ENTRY/definition@version-attribute
/NXsubentry/definition@version-attribute
/NXsubentry/definition_local@version-attribute
/NXsubentry/program_name@version-attribute
/NXtransmission/ENTRY/definition@version-attribute
@wavelength_indices
/NXdetector/efficiency@wavelength_indices-attribute
/NXguide/reflectivity@wavelength_indices-attribute
@xml_version
/NXroot@XML_version-attribute
@xpos_indices
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@xpos_indices-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@xpos_indices-attribute
@ypos_indices
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@ypos_indices-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@ypos_indices-attribute
@zpos_indices
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@zpos_indices-attribute
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@zpos_indices-attribute
a
/NXcsg/a-group
a_1
/NXcorrector_cs/tableauID/a_1-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1-group
a_2
/NXcorrector_cs/tableauID/a_2-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2-group
a_3
/NXcorrector_cs/tableauID/a_3-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3-group
a_4
/NXcorrector_cs/tableauID/a_4-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4-group
a_6
/NXcorrector_cs/tableauID/a_6-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6-group
a_axis_direction
/NXmicrostructure_mtex_config/conventions/a_axis_direction-field
a_b_c
/NXcrystal_structure/a_b_c-field
/NXem/ENTRY/roiID/ebsd/indexing/phaseID/a_b_c-field
/NXunit_cell/a_b_c-field
abbe_number
/NXlens_opt/Abbe_number-field
abrasive_medium
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
abrasive_medium_carrier
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
absolute_path
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/absolute_path-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/absolute_path-field
/NXimage_set/PROCESS/source/absolute_path-field
/NXspectrum_set/PROCESS/source/absolute_path-field
absorbed_beam
/NXxas/ENTRY/DATA/absorbed_beam-link
/NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material
/NXcollimator/absorbing_material-field
/NXfermi_chopper/absorbing_material-field
absorption_cross_section
/NXattenuator/absorption_cross_section-field
ac_line_sync
/NXscanbox_em/ac_line_sync-field
acceleration_time
/NXpositioner/acceleration_time-field
/NXpositioner_sts/acceleration_time-field
acceptance_angle
/NXfiber/acceptance_angle-field
/NXpolarizer_opt/acceptance_angle-field
accepted_photon_beam_divergence
/NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture
/NXcapillary/accepting_aperture-field
acquisition_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
/NXdetector/acquisition_mode-field
acquisition_period
/NXcircuit/acquisition_period-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/acquisition_period-field
/NXsts/ENTRY/resolution_indicators/acquisition_period-field
acquisition_program
/NXtransmission/ENTRY/acquisition_program-group
active_calib
/NXpositioner_sts/active_calib-field
/NXsts/ENTRY/INSTRUMENT/piezo_config/active_calib-field
active_channels
/NXamplifier/active_channels-field
activity
/NXhistory/ACTIVITY-group
actuator
/NXebeam_column/ACTUATOR-group
/NXem/ENTRY/measurement/em_lab/ACTUATOR-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ACTUATOR-group
/NXem_calorimetry/ENTRY/actuator-group
/NXenvironment/ACTUATOR-group
/NXibeam_column/ACTUATOR-group
/NXinstrument/ACTUATOR-group
/NXmanipulator/ACTUATOR-group
actuatorid
/NXem/ENTRY/measurement/em_lab/ebeam_column/actuatorID-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/actuatorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/actuatorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/actuatorID-group
additional_detector_hardware
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/additional_detector_hardware-field
additional_phase_information
/NXdispersive_material/ENTRY/sample/additional_phase_information-field
address
/NXem/ENTRY/userID/address-field
/NXsensor_scan/ENTRY/USER/address-field
/NXtransmission/ENTRY/operator/address-field
/NXuser/address-field
aequatorial_angle
/NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field
/NXsas/ENTRY/SAMPLE/aequatorial_angle-field
/NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
/NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation
/NXem/ENTRY/userID/affiliation-field
/NXmpes/ENTRY/USER/affiliation-field
/NXsensor_scan/ENTRY/USER/affiliation-field
/NXtransmission/ENTRY/operator/affiliation-field
/NXuser/affiliation-field
algorithm
/NXapm/ENTRY/atom_probe/hit_finding/serialized/algorithm-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/algorithm-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/algorithm-field
/NXapm/ENTRY/atom_probe/ranging/definitions/algorithm-field
/NXapm/ENTRY/atom_probe/raw_data/serialized/algorithm-field
/NXapm/ENTRY/atom_probe/reconstruction/config/algorithm-field
/NXapm/ENTRY/atom_probe/reconstruction/results/algorithm-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/algorithm-field
/NXapm/ENTRY/serializedID/algorithm-field
/NXapm_compositionspace_config/ENTRY/config/ranging/algorithm-field
/NXapm_compositionspace_config/ENTRY/config/reconstruction/algorithm-field
/NXapm_compositionspace_results/ENTRY/config/algorithm-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/algorithm-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/algorithm-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/algorithm-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/algorithm-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/algorithm-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/algorithm-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/algorithm-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/algorithm-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/algorithm-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/algorithm-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/algorithm-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/algorithm-field
/NXapm_paraprobe_intersector_results/ENTRY/common/config/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/algorithm-field
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/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/algorithm-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/algorithm-field
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/NXapm_paraprobe_selector_results/ENTRY/common/config/algorithm-field
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/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/algorithm-field
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/NXapm_paraprobe_transcoder_results/ENTRY/common/config/algorithm-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/algorithm-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/algorithm-field
/NXem/ENTRY/roiID/ebsd/indexing/source/algorithm-field
/NXem/ENTRY/roiID/ebsd/measurement/source/algorithm-field
/NXem/ENTRY/roiID/ebsd/simulation/source/algorithm-field
/NXem/ENTRY/serializedID/algorithm-field
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/NXem_calorimetry/ENTRY/diffraction/algorithm-field
/NXmicrostructure/configuration/algorithm-field
/NXmicrostructure_gragles_config/ENTRY/discretization/grid/algorithm-field
/NXmicrostructure_score_config/ENTRY/deformation/ebsd/algorithm-field
/NXserialized/algorithm-field
alias
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/NXapm/ENTRY/sample/alias-field
/NXapm/ENTRY/specimen/alias-field
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/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/alias-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/alias-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/alias-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/alias-field
/NXstage_lab/alias-field
alpha
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/NXcg_alpha_complex/alpha-field
/NXxkappa/entry/sample/alpha-field
alpha_beta_gamma
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/NXunit_cell/alpha_beta_gamma-field
alpha_complexid
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alpha_value_choice
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alpha_values
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alternative_plot
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amperemeter
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amplifier
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/NXsensor_sts/amplifier-group
amplifier_bias
/NXdetector/amplifier_bias-field
amplifier_type
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/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
amplifier_voltage
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analyser
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/NXindirecttof/entry/INSTRUMENT/analyser-group
/NXtas/entry/INSTRUMENT/analyser-group
analyser_take_off_azimuth_angle
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analyser_take_off_polar_angle
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analysis_chamber
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/NXapm/ENTRY/measurement/instrument/analysis_chamber-group
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/NXevent_data_apm/instrument/analysis_chamber-group
analysis_identifier
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/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/analysis_identifier-field
/NXapm_paraprobe_intersector_results/ENTRY/common/analysis_identifier-field
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/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/analysis_identifier-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/analysis_identifier-field
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/NXapm_paraprobe_ranger_config/ENTRY/range/analysis_identifier-field
/NXapm_paraprobe_ranger_results/ENTRY/common/analysis_identifier-field
/NXapm_paraprobe_selector_config/ENTRY/select/analysis_identifier-field
/NXapm_paraprobe_selector_results/ENTRY/common/analysis_identifier-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/analysis_identifier-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/analysis_identifier-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/analysis_identifier-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/analysis_identifier-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/analysis_identifier-field
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/NXapm_paraprobe_tool_common/analysis_identifier-field
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/NXapm_paraprobe_transcoder_config/ENTRY/transcode/analysis_identifier-field
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analysis_program
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analyze_coprecipitation
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analyze_intersection
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analyze_proximity
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analyzer_dispersion
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analyzer_elevation
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analyzer_rotation
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angle
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angle_of_detection
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angle_of_in_plane_sample_rotation
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angle_of_incidence
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angle_of_incident_and_detection_beam
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angle_reference_frame
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angles
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/NXgrating/angles-field
angular0
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angular1
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angular_acceptance
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/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/angular_acceptance-field
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angular_calibration
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angular_calibration_applied
/NXdetector/angular_calibration_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion
/NXbeam_path/GRATING/angular_dispersion-field
/NXbeam_path/MONOCHROMATOR/GRATING/angular_dispersion-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
angular_resolution
/NXelectronanalyser/angular_resolution-group
angular_spread
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angularn
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/NXdata_mpes_detector/angularN-field
angularn_calibration
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/NXprocess_mpes/angularN_calibration-group
angularn_resolution
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/NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution-group
animations_period
/NXcircuit/animations_period-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/animations_period-field
/NXsts/ENTRY/resolution_indicators/animations_period-field
anode_material
/NXsource/anode_material-field
aoi_range
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aperture
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/NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
/NXcollectioncolumn/APERTURE-group
/NXcorrector_cs/APERTURE-group
/NXebeam_column/APERTURE-group
/NXenergydispersion/APERTURE-group
/NXibeam_column/APERTURE-group
/NXinstrument/APERTURE-group
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/NXsnshisto/ENTRY/instrument/APERTURE-group
/NXsource/APERTURE-group
/NXxraylens/aperture-field
aperture_number
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apertureid
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/NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID-group
applied
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/NXcomponent/applied-field
/NXcorrector_cs/applied-field
/NXdistortion/applied-field
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/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/applied-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/applied-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID/applied-field
/NXregistration/applied-field
apply
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area
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/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/area-field
/NXcg_hexahedron_set/area-field
/NXcg_primitive_set/area-field
/NXcrystal_structure/area-field
/NXmicrostructure/crystal/area-field
/NXmicrostructure/interface/area-field
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/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/area-field
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/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/area-field
/NXxps/ENTRY/FIT/peakPEAK/function/area-group
arpes_geometry
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arrival_time_pairs
/NXapm/ENTRY/atom_probe/hit_finding/arrival_time_pairs-field
/NXapm_hit_finding/arrival_time_pairs-field
arrow_char
/NXmicrostructure_mtex_config/plotting/arrow_char-field
aspect
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associated_beam
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/associated_beam-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/associated_beam-field
associated_source
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/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/associated_source-field
atom
/NXunit_cell/atom-field
atom_identifier
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/NXunit_cell/atom_identifier-field
atom_occupancy
/NXcrystal_structure/atom_occupancy-field
/NXunit_cell/atom_occupancy-field
atom_position
/NXcrystal_structure/atom_position-field
atom_positions
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atom_probe
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/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe-group
atom_type
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atom_types
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/NXdispersive_material/ENTRY/sample/atom_types-field
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/NXem_eds/indexing/atom_types-field
/NXiv_temp/ENTRY/SAMPLE/atom_types-field
/NXmpes/ENTRY/SAMPLE/atom_types-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/atom_types-field
attached_to
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/NXsensor/attached_to-field
/NXsensor_sts/attached_to-field
attenuation
/NXbeam_path/ATTENUATOR/attenuation-field
/NXfiber/attenuation-field
attenuator
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/NXinstrument/ATTENUATOR-group
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/NXsnsevent/ENTRY/instrument/ATTENUATOR-group
/NXsnshisto/ENTRY/instrument/ATTENUATOR-group
/NXxrot/entry/instrument/attenuator-group
attenuator_transmission
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/NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field
/NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author
/NXnote/author-field
/NXsnsevent/ENTRY/SNSHistoTool/author-field
/NXsnshisto/ENTRY/SNSHistoTool/author-field
autophase
/NXapm_compositionspace_config/ENTRY/config/autophase-group
/NXapm_compositionspace_results/ENTRY/autophase-group
average_power
/NXbeam/average_power-field
average_value
/NXlog/average_value-field
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/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error
/NXlog/average_value_error-field
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/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors
/NXlog/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axis_aic
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_aic-field
axis_angle_convention
/NXcoordinate_system_set/axis_angle_convention-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/axis_angle_convention-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/axis_angle_convention-field
axis_bic
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axis_dimension
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_dimension-field
axis_energy
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_energy-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_energy-field
/NXem/ENTRY/roiID/eds/indexing/summary/axis_energy-field
/NXem_eds/indexing/summary/axis_energy-field
/NXspectrum_set/spectrum_0d/axis_energy-field
/NXspectrum_set/spectrum_1d/axis_energy-field
/NXspectrum_set/spectrum_2d/axis_energy-field
/NXspectrum_set/spectrum_3d/axis_energy-field
/NXspectrum_set/stack_0d/axis_energy-field
/NXspectrum_set/stack_2d/axis_energy-field
/NXspectrum_set/stack_3d/axis_energy-field
axis_explained_variance
/NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_explained_variance-field
axis_feature_identifier
/NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier-field
axis_feature_importance
/NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance-field
axis_i
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_i-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_i-field
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i-field
/NXimage_set/image_1d/axis_i-field
/NXimage_set/image_2d/axis_i-field
/NXimage_set/image_3d/axis_i-field
/NXimage_set/stack_1d/axis_i-field
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axis_j
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/NXimage_set/stack_3d/axis_j-field
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/NXspectrum_set/stack_3d/axis_j-field
axis_k
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/NXimage_set/stack_3d/axis_k-field
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/NXspectrum_set/stack_3d/axis_k-field
axis_mass_to_charge
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axis_pattern_identifier
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axis_pca_dimension
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axis_s
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axis_time
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axis_x
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axis_y
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axis_z
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axisname
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axisname_end
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axisname_increment_set
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azimuth
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azimuthal
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azimuthal_angle
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azimuthal_integration
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azimuthal_width
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b
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b_2
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b_4
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b_axis_direction
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background
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background_correction
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background_mean
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background_quantification
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background_subtraction
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backgroundbackground
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backside_roughness
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backward_sweep
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bandwidth
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base_temperature
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base_vector_a
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base_vector_b
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base_vector_c
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beam
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beam_1
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beam_attenuation_factors
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beam_azimuth_angle
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beam_center_derived
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beam_center_x
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beam_device
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beam_incident
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beam_polar_angle_of_incidence
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beam_polarization_type
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beam_position
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beam_profile
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beam_ref_frame
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beam_sample_relation
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beam_shape
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beam_size_x
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beam_size_y
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beam_splitter
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beam_stop
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beam_transfer_matrix_table
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beam_type
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beamline
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beamline_distance
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beamtype
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bend_angle_x
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bend_angle_y
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bending_magnet
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bending_radius
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bias
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bias_calibration
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bias_divider
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bias_env
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bias_offset
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bias_spectroscopy
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bias_voltage
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bibtex
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binding_energy
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binning
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biprism
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bit_depth_readout
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bitdepth
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/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/bitdepth-field
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/NXcs_filter_boolean_mask/bitdepth-field
bitmask
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blade_geometry
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blade_spacing
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blade_thickness
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blaze_wavelength
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block
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boundaries
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boundary
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boundary_conditions
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boundary_contact
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/NXmicrostructure/triple_junction/boundary_contact-field
bounding_box
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bragg_angle
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bright_field
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brightness
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buffer_chamber
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/NXevent_data_apm/instrument/buffer_chamber-group
bunch_distance
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bunch_length
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bunch_pattern
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bunge_euler
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c_1
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c_1_0
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c_1_2_a
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c_1_2_b
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c_2_1_a
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c_2_1_b
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c_2_3_a
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c_2_3_b
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c_3
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c_3_0
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c_3_2_a
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c_3_2_b
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c_3_4_a
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/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a-group
c_3_4_b
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c_4_1_a
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c_4_5_a
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calibration_time
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cdeform_field
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cell_dimensions
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center
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central_stop_material
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cg_cylinder_set
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cg_geodesic_mesh
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cg_half_edge_data_structure
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cg_hexahedron_set
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cg_parallelogram_set
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cg_point_set
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cg_polygon_set
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cg_polyhedron_set
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cg_polyline_set
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cg_sphere_set
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cg_triangle_set
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chamber
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changer_position
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channels
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channels_current
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charge
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charge_state
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/NXmpes/ENTRY/INSTRUMENT/flood_gun/current-field
/NXsource/current-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current-field
/NXsts/ENTRY/reproducibility_indicators/current-field
current_amplifier
/NXsts/ENTRY/INSTRUMENT/current_amplifier-group
current_calibration
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_calibration-field
/NXsts/ENTRY/reproducibility_indicators/current_calibration-field
current_gain
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_gain-field
/NXsts/ENTRY/reproducibility_indicators/current_gain-field
current_log
/NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log-group
current_offset
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_offset-field
/NXsts/ENTRY/reproducibility_indicators/current_offset-field
current_sensor
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
current_set
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set-group
current_set_feature_to_cluster
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/current_set_feature_to_cluster-field
current_to_next_link
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link-field
current_to_next_link_type
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link_type-field
current_working_directory
/NXapm_compositionspace_results/ENTRY/profiling/current_working_directory-field
/NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_distancer_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_intersector_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_ranger_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_selector_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/current_working_directory-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/current_working_directory-field
/NXcs_profiling/current_working_directory-field
/NXem_calorimetry/ENTRY/profiling/current_working_directory-field
curvature
/NXxraylens/curvature-field
curvature_driving_force
/NXmicrostructure_gragles_config/ENTRY/curvature_driving_force-group
curvature_horizontal
/NXcrystal/curvature_horizontal-field
curvature_radius_face
/NXlens_opt/curvature_radius_FACE-field
curvature_radius_n
/NXsts/ENTRY/INSTRUMENT/piezo_config/curvature_radius_N-field
curvature_vertical
/NXcrystal/curvature_vertical-field
cut_angle
/NXcrystal/cut_angle-field
cw
/NXbeam_path/SOURCE/cw-field
cw_power
/NXbeam_path/SOURCE/cw_power-field
cylinder_orientation
/NXxraylens/cylinder_orientation-group
cylinder_set
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set-group
cylinders
/NXcylindrical_geometry/cylinders-field
cylindrical
/NXxraylens/cylindrical-field
cylindrical_geometry
/NXbeam_stop/CYLINDRICAL_GEOMETRY-group
cylindrical_orientation_angle
/NXcrystal/cylindrical_orientation_angle-field
d
/NXreflections/d-field
d_4
/NXcorrector_cs/tableauID/d_4-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4-group
d_spacing
/NXcrystal/d_spacing-field
dark_field
/NXtomophase/entry/instrument/dark_field-group
daslogs
/NXsnsevent/ENTRY/DASlogs-group
/NXsnshisto/ENTRY/DASlogs-group
data
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA-group
/NXapm_reconstruction/naive_discretization/DATA-group
/NXarpes/ENTRY/DATA-group
/NXarpes/ENTRY/INSTRUMENT/analyser/data-field
/NXbeam/DATA-group
/NXcalibration/DATA-group
/NXcanSAS/ENTRY/DATA-group
/NXcxi_ptycho/DATA-group
/NXcxi_ptycho/DATA/data-link
/NXcxi_ptycho/data_1/data-link
/NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field
/NXdata/DATA-field
/NXdetector/DATA-group
/NXdetector/data-field
/NXem/ENTRY/roiID/ebsd/indexing/roi/data-field
/NXem_correlation/indexing/roi/data-field
/NXem_ebsd/indexing/roi/data-field
/NXentry/DATA-group
/NXfit/data-group
/NXfit_background/data-group
/NXfluo/entry/INSTRUMENT/fluorescence/data-field
/NXfluo/entry/MONITOR/data-field
/NXfluo/entry/data-group
/NXfluo/entry/data/data-link
/NXguide/reflectivity/data-field
/NXinteraction_vol_em/DATA-group
/NXiqproc/ENTRY/DATA-group
/NXiqproc/ENTRY/DATA/data-field
/NXiv_temp/ENTRY/DATA-group
/NXlauetof/entry/control/data-field
/NXlauetof/entry/instrument/detector/data-field
/NXlauetof/entry/name/data-link
/NXmicrostructure_ipf/legend/data-field
/NXmicrostructure_ipf/map/data-field
/NXmicrostructure_mtex_config/path/data-field
/NXmonitor/data-field
/NXmonopd/entry/DATA-group
/NXmonopd/entry/DATA/data-link
/NXmonopd/entry/INSTRUMENT/DETECTOR/data-field
/NXmpes/ENTRY/data-group
/NXmpes/ENTRY/data/data-field
/NXmpes_arpes/ENTRY/data-group
/NXmpes_arpes/ENTRY/data/data-field
/NXmx/ENTRY/DATA-group
/NXmx/ENTRY/DATA/data-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXnote/data-field
/NXoptical_spectroscopy/ENTRY/DATA-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/DATA-group
/NXpeak/data-group
/NXrefscan/entry/control/data-field
/NXrefscan/entry/data-group
/NXrefscan/entry/data/data-link
/NXrefscan/entry/instrument/DETECTOR/data-field
/NXreftof/entry/control/data-field
/NXreftof/entry/data-group
/NXreftof/entry/data/data-link
/NXreftof/entry/instrument/detector/data-field
/NXsas/ENTRY/DATA-group
/NXsas/ENTRY/DATA/data-link
/NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXsastof/ENTRY/control/data-field
/NXsastof/ENTRY/data-group
/NXsastof/ENTRY/data/data-link
/NXsastof/ENTRY/instrument/detector/data-field
/NXscan/ENTRY/DATA-group
/NXscan/ENTRY/DATA/data-link
/NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXscan/ENTRY/MONITOR/data-field
/NXsensor_scan/ENTRY/DATA-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group
/NXsnsevent/ENTRY/DATA-group
/NXsnsevent/ENTRY/MONITOR/data-field
/NXsnshisto/ENTRY/DATA-group
/NXsnshisto/ENTRY/DATA/data-link
/NXsnshisto/ENTRY/MONITOR/data-field
/NXsnshisto/ENTRY/instrument/DETECTOR/data-field
/NXspe/ENTRY/data-group
/NXspe/ENTRY/data/data-field
/NXsqom/ENTRY/DATA-group
/NXsqom/ENTRY/DATA/data-field
/NXsts/ENTRY/DATA-group
/NXstxm/ENTRY/DATA-group
/NXstxm/ENTRY/DATA/data-field
/NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_x/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_y/data-field
/NXstxm/ENTRY/INSTRUMENT/sample_z/data-field
/NXstxm/ENTRY/control/data-field
/NXsubentry/DATA-group
/NXtas/entry/DATA-group
/NXtas/entry/DATA/data-link
/NXtas/entry/INSTRUMENT/DETECTOR/data-field
/NXtas/entry/MONITOR/data-field
/NXtofnpd/entry/INSTRUMENT/detector/data-field
/NXtofnpd/entry/MONITOR/data-field
/NXtofnpd/entry/data-group
/NXtofnpd/entry/data/data-link
/NXtofraw/entry/MONITOR/data-field
/NXtofraw/entry/data-group
/NXtofraw/entry/data/data-link
/NXtofraw/entry/instrument/detector/data-field
/NXtofsingle/entry/INSTRUMENT/detector/data-field
/NXtofsingle/entry/MONITOR/data-field
/NXtofsingle/entry/data-group
/NXtofsingle/entry/data/data-link
/NXtomo/entry/control/data-field
/NXtomo/entry/data-group
/NXtomo/entry/data/data-link
/NXtomo/entry/instrument/detector/data-field
/NXtomophase/entry/data-group
/NXtomophase/entry/data/data-link
/NXtomophase/entry/instrument/bright_field/data-field
/NXtomophase/entry/instrument/dark_field/data-field
/NXtomophase/entry/instrument/sample/data-field
/NXtomoproc/entry/data-group
/NXtomoproc/entry/data/data-field
/NXtransmission/ENTRY/data-group
/NXxas/ENTRY/DATA-group
/NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field
/NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field
/NXxas/ENTRY/MONITOR/data-field
/NXxasproc/ENTRY/DATA-group
/NXxasproc/ENTRY/DATA/data-field
/NXxbase/entry/DATA-group
/NXxbase/entry/DATA/data-link
/NXxbase/entry/instrument/detector/data-field
/NXxlaue/entry/instrument/source/distribution/data-field
/NXxpcs/entry/data-group
/NXxps/ENTRY/FIT/backgroundBACKGROUND/data-group
/NXxps/ENTRY/FIT/data-group
/NXxps/ENTRY/FIT/peakPEAK/data-group
/NXxps/ENTRY/data-group
/NXxrd/ENTRY/DATA-group
/NXxrd/ENTRY/DATA/data-field
data_1
/NXcxi_ptycho/data_1-group
/NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
data_collection
/NXellipsometry/ENTRY/data_collection-group
data_correction
/NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/data_correction-field
data_errors
/NXdetector/data_errors-field
data_file
/NXdetector/data_file-group
/NXxrd_pan/ENTRY/data_file-field
data_identifier
/NXellipsometry/ENTRY/data_collection/data_identifier-field
data_origin
/NXdetector_module/data_origin-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
data_size
/NXdetector_module/data_size-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
data_software
/NXellipsometry/ENTRY/data_collection/data_software-group
data_stride
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
data_type
/NXellipsometry/ENTRY/data_collection/data_type-field
data_x_time_of_flight
/NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
data_x_y
/NXsnsevent/ENTRY/DATA/data_x_y-link
/NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field
/NXsnshisto/ENTRY/DATA/data_x_y-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
data_y_time_of_flight
/NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link
/NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
datatype_n
/NXbeam_transfer_matrix_table/datatype_N-field
date
/NXcanSAS/ENTRY/PROCESS/date-field
/NXmicrostructure/date-field
/NXnote/date-field
/NXprocess/date-field
/NXprocess_mpes/date-field
/NXsnsevent/ENTRY/SNSHistoTool/date-field
/NXsnshisto/ENTRY/SNSHistoTool/date-field
/NXtomoproc/entry/reconstruction/date-field
/NXxasproc/ENTRY/XAS_data_reduction/date-field
dbscan
/NXapm_compositionspace_config/ENTRY/config/clustering/dbscan-group
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan-group
dbscanid
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID-group
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID-group
dead_time
/NXdetector/dead_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
decelerate_electrode
/NXapm_msr/instrument/decelerate_electrode-group
decoration_filter
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter-group
decorator_multiplicity
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/decorator_multiplicity-field
default_color_map
/NXmicrostructure_mtex_config/plotting/default_color_map-field
definition
/NXapm/ENTRY/definition-field
/NXapm_compositionspace_config/ENTRY/definition-field
/NXapm_compositionspace_results/ENTRY/definition-field
/NXapm_paraprobe_clusterer_config/ENTRY/definition-field
/NXapm_paraprobe_clusterer_results/ENTRY/definition-field
/NXapm_paraprobe_distancer_config/ENTRY/definition-field
/NXapm_paraprobe_distancer_results/ENTRY/definition-field
/NXapm_paraprobe_intersector_config/ENTRY/definition-field
/NXapm_paraprobe_intersector_results/ENTRY/definition-field
/NXapm_paraprobe_nanochem_config/ENTRY/definition-field
/NXapm_paraprobe_nanochem_results/ENTRY/definition-field
/NXapm_paraprobe_ranger_config/ENTRY/definition-field
/NXapm_paraprobe_ranger_results/ENTRY/definition-field
/NXapm_paraprobe_selector_config/ENTRY/definition-field
/NXapm_paraprobe_selector_results/ENTRY/definition-field
/NXapm_paraprobe_spatstat_config/ENTRY/definition-field
/NXapm_paraprobe_spatstat_results/ENTRY/definition-field
/NXapm_paraprobe_surfacer_config/ENTRY/definition-field
/NXapm_paraprobe_surfacer_results/ENTRY/definition-field
/NXapm_paraprobe_tessellator_config/ENTRY/definition-field
/NXapm_paraprobe_tessellator_results/ENTRY/definition-field
/NXapm_paraprobe_transcoder_config/ENTRY/definition-field
/NXapm_paraprobe_transcoder_results/ENTRY/definition-field
/NXarchive/entry/definition-field
/NXarpes/ENTRY/definition-field
/NXcanSAS/ENTRY/definition-field
/NXcxi_ptycho/entry_1/definition-field
/NXdirecttof/entry/definition-field
/NXdispersive_material/ENTRY/definition-field
/NXellipsometry/ENTRY/definition-field
/NXem/ENTRY/definition-field
/NXem_calorimetry/ENTRY/definition-field
/NXentry/definition-field
/NXfluo/entry/definition-field
/NXindirecttof/entry/definition-field
/NXiqproc/ENTRY/definition-field
/NXiv_temp/ENTRY/definition-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field
/NXlab_sample_mounting/ENTRY/definition-field
/NXlauetof/entry/definition-field
/NXmicrostructure_gragles_config/ENTRY/definition-field
/NXmicrostructure_gragles_results/ENTRY/definition-field
/NXmicrostructure_imm_config/ENTRY/definition-field
/NXmicrostructure_imm_results/ENTRY/definition-field
/NXmicrostructure_kanapy_results/ENTRY/definition-field
/NXmicrostructure_score_config/ENTRY/definition-field
/NXmicrostructure_score_results/ENTRY/definition-field
/NXmonopd/entry/definition-field
/NXmpes/ENTRY/definition-field
/NXmpes_arpes/ENTRY/definition-field
/NXmx/ENTRY/definition-field
/NXoptical_spectroscopy/ENTRY/definition-field
/NXraman/ENTRY/definition-field
/NXrefscan/entry/definition-field
/NXreftof/entry/definition-field
/NXsas/ENTRY/definition-field
/NXsastof/ENTRY/definition-field
/NXscan/ENTRY/definition-field
/NXsensor_scan/ENTRY/definition-field
/NXsnsevent/ENTRY/definition-field
/NXsnshisto/ENTRY/definition-field
/NXspe/ENTRY/definition-field
/NXsqom/ENTRY/definition-field
/NXsts/ENTRY/definition-field
/NXstxm/ENTRY/definition-field
/NXsubentry/definition-field
/NXtas/entry/definition-field
/NXtofnpd/entry/definition-field
/NXtofraw/entry/definition-field
/NXtofsingle/entry/definition-field
/NXtomo/entry/definition-field
/NXtomophase/entry/definition-field
/NXtomoproc/entry/definition-field
/NXtransmission/ENTRY/definition-field
/NXxas/ENTRY/definition-field
/NXxasproc/ENTRY/definition-field
/NXxbase/entry/definition-field
/NXxeuler/entry/definition-field
/NXxkappa/entry/definition-field
/NXxlaue/entry/definition-field
/NXxlaueplate/entry/definition-field
/NXxnb/entry/definition-field
/NXxpcs/entry/definition-field
/NXxps/ENTRY/definition-field
/NXxrd/ENTRY/definition-field
/NXxrd_pan/ENTRY/definition-field
/NXxrot/entry/definition-field
definition_local
/NXentry/definition_local-field
/NXsubentry/definition_local-field
definitions
/NXapm/ENTRY/atom_probe/ranging/definitions-group
deflection_angle
/NXbeam_splitter/deflection_angle-field
/NXgrating/deflection_angle-field
deflector
/NXcollectioncolumn/DEFLECTOR-group
/NXebeam_column/DEFLECTOR-group
/NXelectronanalyser/DEFLECTOR-group
/NXenergydispersion/DEFLECTOR-group
/NXibeam_column/DEFLECTOR-group
/NXscanbox_em/DEFLECTOR-group
/NXsource/DEFLECTOR-group
/NXspindispersion/DEFLECTOR-group
defocus
/NXoptical_system_em/defocus-field
deformation
/NXmicrostructure_score_config/ENTRY/deformation-group
deformation_gradient
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group
deformed_grain_identifier
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/deformed_grain_identifier-field
defragment_cell_cache
/NXmicrostructure_score_config/ENTRY/numerics/defragment_cell_cache-field
defragment_x
/NXmicrostructure_score_config/ENTRY/numerics/defragment_x-field
degree_char
/NXmicrostructure_mtex_config/plotting/degree_char-field
delay
/NXdata_mpes/delay-field
/NXdata_mpes_detector/delay-field
/NXdisk_chopper/delay-field
delay_calibration
/NXmpes/ENTRY/PROCESS_MPES/delay_calibration-group
/NXprocess_mpes/delay_calibration-group
delay_difference
/NXxpcs/entry/data/delay_difference-field
delocalization
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization-group
delocalizationid
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID-group
delta_time
/NXaberration/delta_time-field
/NXevent_data_apm/delta_time-field
demodulated_signal
/NXlockin/demodulated_signal-field
/NXsts/ENTRY/INSTRUMENT/lock_in/demodulated_signal-field
density
/NXcontainer/density-field
/NXcrystal/density-field
/NXem/ENTRY/sample/density-field
/NXfilter/density-field
/NXsample/density-field
/NXsample_component/density-field
depends_on
/NXactuator/depends_on-field
/NXaperture/depends_on-field
/NXattenuator/depends_on-field
/NXbeam/depends_on-field
/NXbeam_path/SOURCE/depends_on-field
/NXbeam_path/depends_on-field
/NXbeam_path/window_NUMBER/depends_on-field
/NXbeam_stop/depends_on-field
/NXbending_magnet/depends_on-field
/NXcapillary/depends_on-field
/NXcg_primitive_set/depends_on-field
/NXcollectioncolumn/depends_on-field
/NXcollimator/depends_on-field
/NXcoordinate_system/depends_on-field
/NXcrystal/depends_on-field
/NXcrystal_structure/depends_on-field
/NXcs_filter_boolean_mask/depends_on-field
/NXdetector/depends_on-field
/NXdetector_module/depends_on-field
/NXdisk_chopper/depends_on-field
/NXelectronanalyser/depends_on-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/depends_on-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/depends_on-field
/NXem/ENTRY/roiID/ebsd/measurement/depends_on-field
/NXem/ENTRY/roiID/ebsd/simulation/depends_on-field
/NXem_ebsd/calibration/depends_on-field
/NXem_ebsd/measurement/depends_on-field
/NXem_ebsd/simulation/depends_on-field
/NXenergydispersion/depends_on-field
/NXenvironment/depends_on-field
/NXfermi_chopper/depends_on-field
/NXfilter/depends_on-field
/NXflipper/depends_on-field
/NXfresnel_zone_plate/depends_on-field
/NXgraph_edge_set/depends_on-field
/NXgraph_node_set/depends_on-field
/NXgrating/depends_on-field
/NXguide/depends_on-field
/NXinsertion_device/depends_on-field
/NXmanipulator/depends_on-field
/NXmicrostructure_ipf/depends_on-field
/NXmirror/depends_on-field
/NXmoderator/depends_on-field
/NXmonitor/depends_on-field
/NXmonochromator/depends_on-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field
/NXmpes_arpes/ENTRY/SAMPLE/depends_on-field
/NXmpes_arpes/ENTRY/geometries/arpes_geometry/depends_on-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
/NXmx/ENTRY/SAMPLE/depends_on-field
/NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/depends_on-field
/NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/depends_on-field
/NXpinhole/depends_on-field
/NXpolarizer/depends_on-field
/NXpositioner/depends_on-field
/NXpositioner_sts/depends_on-field
/NXquadric/depends_on-field
/NXregistration/depends_on-field
/NXrotation_set/depends_on-field
/NXsample/depends_on-field
/NXsample_component/depends_on-field
/NXsensor/depends_on-field
/NXsensor_sts/depends_on-field
/NXslit/depends_on-field
/NXsource/depends_on-field
/NXspindispersion/depends_on-field
/NXunit_cell/depends_on-field
/NXvelocity_selector/depends_on-field
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field
/NXxps/ENTRY/INSTRUMENT/beamTYPE/depends_on-field
/NXxps/ENTRY/SAMPLE/depends_on-field
/NXxps/ENTRY/geometries/xps_coordinate_system/depends_on-field
/NXxraylens/depends_on-field
depolarization
/NXoptical_spectroscopy/ENTRY/derived_parameters/depolarization-field
depth
/NXgrating/depth-field
derived_parameters
/NXoptical_spectroscopy/ENTRY/derived_parameters-group
description
/NXactivity/description-field
/NXaperture/description-field
/NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/description-field
/NXapm/ENTRY/sample/description-field
/NXapm/ENTRY/specimen/description-field
/NXapm_paraprobe_tool_config/description-field
/NXapm_paraprobe_tool_results/description-field
/NXapm_ranging/background_quantification/description-field
/NXarchive/entry/instrument/description-field
/NXarchive/entry/sample/description-field
/NXbeam_stop/description-field
/NXcalibration/description-field
/NXcanSAS/ENTRY/PROCESS/description-field
/NXcg_marching_cubes/description-field
/NXchamber/description-field
/NXchemical_process/description-field
/NXcite/description-field
/NXcomponent/description-field
/NXcontainer/description-field
/NXcorrector_cs/tableauID/description-field
/NXcs_profiling_event/description-field
/NXdeflector/description-field
/NXdetector/description-field
/NXdispersion_repeated_parameter/description-field
/NXdispersion_single_parameter/description-field
/NXdistortion/description-field
/NXebeam_column/electron_source/description-field
/NXelectronanalyser/description-field
/NXelectrostatic_kicker/description-field
/NXem/ENTRY/sample/description-field
/NXem_eds/indexing/IMAGE_SET/description-field
/NXenvironment/description-field
/NXfiber/description-field
/NXfilter/description-field
/NXfit/error_function/description-field
/NXfit_function/description-field
/NXfit_parameter/description-field
/NXgeometry/description-field
/NXguide/description-field
/NXibeam_column/ion_source/description-field
/NXlog/description-field
/NXmagnetic_kicker/description-field
/NXmanipulator/description-field
/NXmicrostructure_gragles_config/ENTRY/description-field
/NXmicrostructure_gragles_results/ENTRY/description-field
/NXmicrostructure_imm_results/ENTRY/description-field
/NXmicrostructure_kanapy_results/ENTRY/description-field
/NXmicrostructure_score_config/ENTRY/description-field
/NXmicrostructure_score_results/ENTRY/description-field
/NXmirror/description-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
/NXnote/description-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/description-field
/NXphysical_process/description-field
/NXpid/description-field
/NXpositioner/description-field
/NXpositioner_sts/description-field
/NXquadrupole_magnet/description-field
/NXreflectron/description-field
/NXregistration/description-field
/NXsample/description-field
/NXsample_component/description-field
/NXseparator/description-field
/NXsnsevent/ENTRY/DASlogs/LOG/description-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
/NXsnsevent/ENTRY/SNSHistoTool/description-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsnshisto/ENTRY/DASlogs/LOG/description-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
/NXsnshisto/ENTRY/SNSHistoTool/description-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsolenoid_magnet/description-field
/NXspin_rotator/description-field
/NXxpcs/entry/instrument/DETECTOR/description-field
/NXxps/ENTRY/FIT/backgroundBACKGROUND/function/description-field
/NXxps/ENTRY/FIT/error_function/description-field
/NXxps/ENTRY/FIT/global_fit_function/description-field
/NXxps/ENTRY/FIT/peakPEAK/function/description-field
descriptor
/NXem/ENTRY/roiID/ebsd/indexing/roi/descriptor-field
/NXem_correlation/indexing/roi/descriptor-field
/NXem_ebsd/indexing/roi/descriptor-field
design
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB/design-field
/NXpump/design-field
/NXstage_lab/design-field
det_module
/NXreflections/det_module-field
details
/NXcanSAS/ENTRY/SAMPLE/details-field
detection_gas_path
/NXdetector/detection_gas_path-field
detector
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
/NXelectronanalyser/DETECTOR-group
/NXem_msr/em_lab/DETECTOR-group
/NXevent_data_em/em_lab/DETECTOR-group
/NXinstrument/DETECTOR-group
/NXlauetof/entry/instrument/detector-group
/NXmonopd/entry/INSTRUMENT/DETECTOR-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR-group
/NXrefscan/entry/instrument/DETECTOR-group
/NXreftof/entry/instrument/detector-group
/NXsas/ENTRY/INSTRUMENT/DETECTOR-group
/NXsastof/ENTRY/instrument/detector-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR-group
/NXsnsevent/ENTRY/instrument/DETECTOR-group
/NXsnshisto/ENTRY/instrument/DETECTOR-group
/NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
/NXtas/entry/INSTRUMENT/DETECTOR-group
/NXtofnpd/entry/INSTRUMENT/detector-group
/NXtofraw/entry/instrument/detector-group
/NXtofsingle/entry/INSTRUMENT/detector-group
/NXtomo/entry/instrument/detector-group
/NXtransmission/ENTRY/instrument/DETECTOR-group
/NXxbase/entry/instrument/detector-group
/NXxeuler/entry/instrument/detector-group
/NXxkappa/entry/instrument/detector-group
/NXxlaueplate/entry/instrument/detector-group
/NXxnb/entry/instrument/detector-group
/NXxpcs/entry/instrument/DETECTOR-group
/NXxrd/ENTRY/INSTRUMENT/DETECTOR-group
/NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR-group
/NXxrot/entry/instrument/detector-group
detector_1
/NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_channel_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_channel_type-field
detector_faces
/NXoff_geometry/detector_faces-field
detector_group
/NXinstrument/DETECTOR_GROUP-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/detector_identifier-field
/NXimage_set/PROCESS/detector_identifier-field
/NXspectrum_set/PROCESS/detector_identifier-field
detector_module
/NXdetector/DETECTOR_MODULE-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number
/NXcylindrical_geometry/detector_number-field
/NXdetector/detector_number-field
/NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
/NXtofnpd/entry/data/detector_number-link
/NXtofraw/entry/data/detector_number-link
/NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time
/NXdetector/detector_readout_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_reference_frameid
/NXcoordinate_system_set/detector_reference_frameID-group
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID-group
detector_type
/NXdetector/detector_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type-field
detector_type_other
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type_other-field
detector_voltage
/NXdetector/detector_voltage-field
detectorid
/NXem/ENTRY/measurement/em_lab/detectorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID-group
device_information
/NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/device_information-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information-group
/NXmpes/ENTRY/INSTRUMENT/device_information-group
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/device_information-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/device_information-group
device_path
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/device_path-field
diameter
/NXdetector/diameter-field
/NXenergydispersion/diameter-field
/NXmicrostructure_score_config/ENTRY/deformation/diameter-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/diameter-field
/NXpinhole/diameter-field
/NXwaveplate/diameter-field
/NXxlaueplate/entry/instrument/detector/diameter-field
dielectric_function
/NXdispersion_table/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
diffraction
/NXem_calorimetry/ENTRY/diffraction-group
diffraction_order
/NXgrating/diffraction_order-field
diffraction_space
/NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET/diffraction_space-group
diffractometer
/NXinstrument/DIFFRACTOMETER-group
dimensionality
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/dimensionality-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/dimensionality-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/dimensionality-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/dimensionality-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/dimensionality-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/dimensionality-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/dimensionality-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/dimensionality-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/dimensionality-field
/NXcg_primitive_set/dimensionality-field
/NXcrystal_structure/dimensionality-field
/NXgraph_node_set/dimensionality-field
/NXisocontour/dimensionality-field
/NXmicrostructure/configuration/dimensionality-field
/NXmicrostructure_imm_config/ENTRY/roi/dimensionality-field
/NXmicrostructure_score_results/ENTRY/discretization/grid/dimensionality-field
direction
/NXbeam/TRANSFORMATIONS/DIRECTION-field
/NXshape/direction-field
directionality
/NXgraph_edge_set/directionality-field
discretization
/NXmicrostructure_gragles_config/ENTRY/discretization-group
/NXmicrostructure_gragles_config/ENTRY/grid_coarsement/discretization-field
/NXmicrostructure_imm_config/ENTRY/roi/discretization-field
/NXmicrostructure_score_config/ENTRY/discretization-group
/NXmicrostructure_score_results/ENTRY/discretization-group
disk_chopper
/NXbeam_path/DISK_CHOPPER-group
/NXdirecttof/entry/INSTRUMENT/disk_chopper-group
/NXinstrument/DISK_CHOPPER-group
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
dislocation_density
/NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/dislocation_density-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/dislocation_density-field
dislocation_distribution
/NXmicrostructure_imm_config/ENTRY/dislocation_distribution-group
disorientation_angle
/NXrotation_set/disorientation_angle-field
disorientation_axis
/NXrotation_set/disorientation_axis-field
disorientation_quaternion
/NXrotation_set/disorientation_quaternion-field
disorientation_threshold
/NXmicrostructure/configuration/disorientation_threshold-field
dispersion
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/dispersion-field
/NXfiber/dispersion-field
dispersion_function
/NXdispersion/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
dispersion_repeated_parameter
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
dispersion_single_parameter
/NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
dispersion_table
/NXdispersion/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
dispersion_type
/NXdispersive_material/ENTRY/dispersion_type-field
/NXfiber/dispersion_type-field
dispersion_x
/NXdispersive_material/ENTRY/dispersion_x-group
dispersion_y
/NXdispersive_material/ENTRY/dispersion_y-group
dispersion_z
/NXdispersive_material/ENTRY/dispersion_z-group
dispersoid_drag
/NXmicrostructure_score_config/ENTRY/dispersoid_drag-group
distance
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/distance-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/distance-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/distance-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/distance-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/distance-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/distance-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/distance-field
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/distance-field
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/distance-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/distance-field
/NXapm_paraprobe_tool_config/surface_distance/distance-field
/NXattenuator/distance-field
/NXbeam/distance-field
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
/NXdetector/distance-field
/NXdisk_chopper/distance-field
/NXfermi_chopper/distance-field
/NXindirecttof/entry/INSTRUMENT/analyser/distance-field
/NXlauetof/entry/instrument/detector/distance-field
/NXmoderator/distance-field
/NXmonitor/distance-field
/NXmpes/ENTRY/INSTRUMENT/beamTYPE/distance-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXreftof/entry/instrument/chopper/distance-field
/NXreftof/entry/instrument/detector/distance-field
/NXsample/distance-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXsastof/ENTRY/instrument/detector/distance-field
/NXsnsevent/ENTRY/MONITOR/distance-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
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distance_to_detector
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duration
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dynamic_focus_correction
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dynamic_phi_list
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dynamic_q_list
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dynamic_refocusing
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dynamic_roi_map
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edge_method
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edges
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edges_are_unique
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electric_field
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electrical_conductivity
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emitter_material
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en
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end
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end_settling_time
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endnote
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energies
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energy
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energy_error
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energy_errors
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energy_identifier
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energy_interval
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energy_max
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energy_min
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energy_range
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energy_resolution
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energy_transfer
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energy_unit
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energydispersion
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entering
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entrance_slit
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entrance_slit_setting
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entrance_slit_shape
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entrance_slit_size
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entry
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/NXapm_paraprobe_intersector_config/ENTRY-group
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/NXapm_paraprobe_nanochem_config/ENTRY-group
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/NXapm_paraprobe_selector_config/ENTRY-group
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/NXapm_paraprobe_spatstat_config/ENTRY-group
/NXapm_paraprobe_spatstat_results/ENTRY-group
/NXapm_paraprobe_surfacer_config/ENTRY-group
/NXapm_paraprobe_surfacer_results/ENTRY-group
/NXapm_paraprobe_tessellator_config/ENTRY-group
/NXapm_paraprobe_tessellator_results/ENTRY-group
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/NXarpes/ENTRY-group
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/NXsqom/ENTRY-group
/NXsts/ENTRY-group
/NXstxm/ENTRY-group
/NXtas/entry-group
/NXtofnpd/entry-group
/NXtofraw/entry-group
/NXtofsingle/entry-group
/NXtomo/entry-group
/NXtomophase/entry-group
/NXtomoproc/entry-group
/NXtransmission/ENTRY-group
/NXxas/ENTRY-group
/NXxasproc/ENTRY-group
/NXxbase/entry-group
/NXxeuler/entry-group
/NXxkappa/entry-group
/NXxlaue/entry-group
/NXxlaueplate/entry-group
/NXxnb/entry-group
/NXxpcs/entry-group
/NXxps/ENTRY-group
/NXxrd/ENTRY-group
/NXxrd_pan/ENTRY-group
/NXxrot/entry-group
entry_1
/NXcxi_ptycho/entry_1-group
entry_identifier
/NXarchive/entry/entry_identifier-field
/NXentry/entry_identifier-group
/NXsnsevent/ENTRY/entry_identifier-field
/NXsnshisto/ENTRY/entry_identifier-field
/NXsts/ENTRY/entry_identifier-group
/NXsubentry/entry_identifier-group
/NXxpcs/entry/entry_identifier-field
entry_identifier_uuid
/NXentry/entry_identifier_uuid-group
/NXxpcs/entry/entry_identifier_uuid-field
envelope
/NXfit/data/envelope-field
/NXxps/ENTRY/FIT/data/envelope-field
environment
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group
/NXmicrostructure_gragles_config/ENTRY/environment-group
/NXmicrostructure_gragles_results/ENTRY/environment-group
/NXmicrostructure_imm_results/ENTRY/environment-group
/NXmicrostructure_kanapy_results/ENTRY/environment-group
/NXmicrostructure_score_config/ENTRY/environment-group
/NXmicrostructure_score_results/ENTRY/environment-group
/NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT-group
/NXsample/ENVIRONMENT-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT-group
eps
/NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/eps-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/eps-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/eps-field
/NXmicrostructure_mtex_config/numerics/eps-field
epsilon
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/epsilon-field
error
/NXspe/ENTRY/data/error-field
error_function
/NXfit/error_function-group
/NXxps/ENTRY/FIT/error_function-group
errors
/NXdata/errors-field
euler
/NXmicrostructure_odf/sampling/euler-field
euler_angle
/NXmicrostructure_mtex_config/conventions/euler_angle-field
euler_angle_convention
/NXcoordinate_system_set/euler_angle_convention-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/euler_angle_convention-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/euler_angle_convention-field
evaporation_control
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control/evaporation_control-field
/NXevent_data_apm/instrument/control/evaporation_control-field
evaporation_id_filter
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter-group
/NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter-group
/NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter-group
evaporation_identifier
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier-field
evaporation_identifier_offset
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier_offset-field
even_layer_density
/NXmirror/even_layer_density-field
even_layer_material
/NXmirror/even_layer_material-field
event_data
/NXinstrument/EVENT_DATA-group
/NXsnsevent/ENTRY/EVENT_DATA-group
event_data_apm
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm-group
/NXevent_data_apm_set/EVENT_DATA_APM-group
event_data_apm_set
/NXapm/ENTRY/measurement/event_data_apm_set-group
/NXapm_msr/instrument/EVENT_DATA_APM_SET-group
event_data_em
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM-group
/NXevent_data_em_set/EVENT_DATA_EM-group
event_data_em_set
/NXem/ENTRY/measurement/event_data_em_set-group
/NXem_msr/EVENT_DATA_EM_SET-group
event_id
/NXevent_data/event_id-field
event_identifier
/NXevent_data_em/event_identifier-field
event_index
/NXevent_data/event_index-field
/NXsnsevent/ENTRY/EVENT_DATA/event_index-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id
/NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight
/NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset
/NXevent_data/event_time_offset-field
event_time_zero
/NXevent_data/event_time_zero-field
event_type
/NXevent_data_em/event_type-field
example
/NXmicrostructure_mtex_config/path/example-field
excitation_wavelength
/NXbeam_path/SOURCE/excitation_wavelength-field
exit_slit
/NXmonochromator/exit_slit-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment_alias
/NXapm/ENTRY/experiment_alias-field
/NXem/ENTRY/experiment_alias-field
experiment_config
/NXxrd_pan/ENTRY/experiment_config-group
experiment_description
/NXapm/ENTRY/experiment_description-field
/NXarchive/entry/experiment_description-field
/NXem/ENTRY/experiment_description-field
/NXentry/experiment_description-field
/NXoptical_spectroscopy/ENTRY/experiment_description-field
/NXsensor_scan/ENTRY/experiment_description-field
/NXsts/ENTRY/experiment_description-field
/NXsubentry/experiment_description-field
/NXtransmission/ENTRY/experiment_description-field
experiment_documentation
/NXentry/experiment_documentation-group
/NXsubentry/experiment_documentation-group
experiment_end_date
/NXentry/experiment_end_date-field
experiment_facility
/NXentry/experiment_facility-field
experiment_identifier
/NXapm/ENTRY/experiment_identifier-group
/NXarchive/entry/experiment_identifier-field
/NXem/ENTRY/experiment_identifier-group
/NXentry/experiment_identifier-group
/NXoptical_spectroscopy/ENTRY/experiment_identifier-group
/NXsensor_scan/ENTRY/experiment_identifier-group
/NXsnsevent/ENTRY/experiment_identifier-field
/NXsnshisto/ENTRY/experiment_identifier-field
/NXsts/ENTRY/experiment_identifier-group
/NXsubentry/experiment_identifier-group
/NXtransmission/ENTRY/experiment_identifier-group
experiment_institution
/NXentry/experiment_institution-field
experiment_laboratory
/NXentry/experiment_laboratory-field
experiment_location
/NXentry/experiment_location-field
experiment_result
/NXxrd_pan/ENTRY/experiment_result-group
experiment_start_date
/NXentry/experiment_start_date-field
experiment_sub_type
/NXoptical_spectroscopy/ENTRY/experiment_sub_type-field
experiment_type
/NXellipsometry/ENTRY/experiment_type-field
/NXoptical_spectroscopy/ENTRY/experiment_type-field
/NXraman/ENTRY/experiment_type-field
/NXsts/ENTRY/experiment_type-field
experiment_type_other
/NXoptical_spectroscopy/ENTRY/experiment_type_other-field
experiments
/NXreflections/experiments-field
exposure_time
/NXcorrector_cs/tableauID/exposure_time-field
extent
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/extent-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/extent-field
/NXbeam/extent-field
/NXcg_grid/extent-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/extent-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/extent-field
/NXmicrostructure_score_config/ENTRY/deformation/extent-field
/NXmicrostructure_score_config/ENTRY/discretization/grid/extent-field
/NXmicrostructure_score_results/ENTRY/discretization/grid/extent-field
/NXmpes/ENTRY/INSTRUMENT/beamTYPE/extent-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/extent-field
/NXxpcs/entry/instrument/incident_beam/extent-field
external_adc
/NXsample/external_ADC-group
external_axis
/NXdata_mpes_detector/external_AXIS-field
external_dac
/NXsample/external_DAC-field
external_field_brief
/NXsensor/external_field_brief-field
/NXsensor_sts/external_field_brief-field
external_field_full
/NXsensor/external_field_full-group
/NXsensor_sts/external_field_full-group
external_material
/NXguide/external_material-field
/NXmirror/external_material-field
extinction_ratio
/NXpolarizer_opt/extinction_ratio-field
extraction_voltage
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/extraction_voltage-field
extractor_current
/NXcollectioncolumn/extractor_current-field
extractor_voltage
/NXcollectioncolumn/extractor_voltage-field
extrema
/NXmicrostructure_odf/kth_extrema/extrema-field
fabrication
/NXactuator/FABRICATION-group
/NXapm/ENTRY/measurement/instrument/fabrication-group
/NXapm/ENTRY/measurement/instrument/ion_detector/fabrication-group
/NXapm/ENTRY/measurement/instrument/local_electrode/fabrication-group
/NXapm/ENTRY/measurement/instrument/pulser/fabrication-group
/NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication-group
/NXapm/ENTRY/measurement/instrument/reflectron/fabrication-group
/NXapm_msr/instrument/FABRICATION-group
/NXchamber/FABRICATION-group
/NXcollectioncolumn/FABRICATION-group
/NXcomponent/FABRICATION-group
/NXdeflector/FABRICATION-group
/NXdetector/FABRICATION-group
/NXebeam_column/FABRICATION-group
/NXebeam_column/electron_source/FABRICATION-group
/NXelectronanalyser/FABRICATION-group
/NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication-group
/NXem/ENTRY/measurement/em_lab/detectorID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication-group
/NXem/ENTRY/measurement/em_lab/fabrication-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication-group
/NXem/ENTRY/measurement/em_lab/scan_controller/fabrication-group
/NXem_msr/em_lab/FABRICATION-group
/NXenergydispersion/FABRICATION-group
/NXfresnel_zone_plate/fabrication-field
/NXinstrument/FABRICATION-group
/NXmanipulator/FABRICATION-group
/NXpulser_apm/FABRICATION-group
/NXpulser_apm/SOURCE/FABRICATION-group
/NXpump/FABRICATION-group
/NXreflectron/FABRICATION-group
/NXsample/FABRICATION-group
/NXsample_component/FABRICATION-group
/NXsensor/FABRICATION-group
/NXsource/FABRICATION-group
face_area
/NXcg_hexahedron_set/face_area-field
/NXcg_polyhedron_set/face_area-field
/NXcg_tetrahedron_set/face_area-field
face_half_edge
/NXcg_half_edge_data_structure/face_half_edge-field
face_identifier
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier-field
/NXcg_face_list_data_structure/face_identifier-field
face_identifier_offset
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/face_identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/face_identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/face_identifier_offset-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/face_identifier_offset-field
/NXcg_face_list_data_structure/face_identifier_offset-field
/NXcg_half_edge_data_structure/face_identifier_offset-field
face_normal
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal-group
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal-field
/NXcg_hexahedron_set/face_normal-group
/NXcg_primitive_set/face_normal-group
face_normal_orientation
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal_orientation-field
face_normals
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/face_normals-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/face_normals-field
faces
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/faces-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/faces-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/faces-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/faces-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/faces-field
/NXcg_face_list_data_structure/faces-field
/NXoff_geometry/faces-field
faces_are_unique
/NXcg_face_list_data_structure/faces_are_unique-field
facet_normals
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/facet_normals-field
facility_user_id
/NXarchive/entry/user/facility_user_id-field
/NXsnsevent/ENTRY/USER/facility_user_id-field
/NXsnshisto/ENTRY/USER/facility_user_id-field
/NXuser/facility_user_id-field
farthest_corner
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/farthest_corner-field
fast_axes
/NXelectronanalyser/fast_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction
/NXdetector_module/fast_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number
/NXuser/fax_number-field
feature
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature-group
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE-group
feature_distance
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/feature_distance-field
feature_identifier
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_identifier-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_identifier-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_identifier-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/feature_identifier-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_identifier-field
feature_member_count
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_member_count-field
feature_type
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_type-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_type-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type-field
feature_type_dict_keyword
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_keyword-field
feature_type_dict_value
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_value-field
featureid
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID-group
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID-group
features
/NXentry/features-field
fermi_chopper
/NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
/NXinstrument/FERMI_CHOPPER-group
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
fft_accuracy
/NXmicrostructure_mtex_config/numerics/fft_accuracy-field
fiber
/NXbeam_path/FIBER-group
field_aperture
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view
/NXapm/ENTRY/atom_probe/reconstruction/field_of_view-field
/NXapm_reconstruction/field_of_view-field
/NXoptical_system_em/field_of_view-field
fieldname_errors
/NXdata/FIELDNAME_errors-field
figure_data
/NXgrating/figure_data-group
/NXmirror/figure_data-group
figure_of_merit
/NXspindispersion/figure_of_merit-field
figure_of_meritmetric
/NXfit/figure_of_meritMETRIC-field
/NXxps/ENTRY/FIT/figure_of_meritMETRIC-field
figure_size
/NXmicrostructure_mtex_config/plotting/figure_size-field
filament_current
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/filament_current-field
/NXsource/filament_current-field
file
/NXserialized/file-group
file_name
/NXnote/file_name-field
filenames
/NXiqproc/ENTRY/reduction/input/filenames-field
/NXsqom/ENTRY/reduction/input/filenames-field
filter
/NXinstrument/FILTER-group
filter_characteristics
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics-group
filter_mechanism
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/filter_mechanism-field
filter_number
/NXbeam_path/filter_NUMBER-group
filter_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_type-field
final_beam_divergence
/NXbeam/final_beam_divergence-field
final_energy
/NXbeam/final_energy-field
final_polarization
/NXbeam/final_polarization-field
final_polarization_stokes
/NXbeam/final_polarization_stokes-field
final_wavelength
/NXbeam/final_wavelength-field
final_wavelength_spread
/NXbeam/final_wavelength_spread-field
final_z
/NXpositioner_sts/final_z-field
/NXsts/ENTRY/reproducibility_indicators/final_z-field
first_settling_time
/NXbias_spectroscopy/first_settling_time-field
/NXsts/ENTRY/reproducibility_indicators/first_settling_time-field
fit
/NXxps/ENTRY/FIT-group
fit_function
/NXcalibration/fit_function-field
fit_parameter
/NXfit_function/FIT_PARAMETER-group
fixed_energy
/NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element/fixed_revolutions-field
fixed_slit
/NXbeam_path/MONOCHROMATOR/SLIT/fixed_slit-field
flags
/NXreflections/flags-field
flatfield
/NXdetector/flatfield-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied
/NXdetector/flatfield_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors
/NXdetector/flatfield_errors-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path
/NXapm/ENTRY/measurement/instrument/analysis_chamber/flight_path-field
flip_current
/NXflipper/flip_current-field
flip_turns
/NXflipper/flip_turns-field
flipper
/NXinstrument/FLIPPER-group
flood_gun
/NXmpes/ENTRY/INSTRUMENT/flood_gun-group
/NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun-group
flood_gun_current_env
/NXmpes/ENTRY/SAMPLE/flood_gun_current_env-group
fluence
/NXbeam/fluence-field
fluorescence
/NXfluo/entry/INSTRUMENT/fluorescence-group
flux
/NXbeam/flux-field
/NXibeam_column/ion_source/flux-field
/NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
/NXsource/flux-field
flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time
/NXscanbox_em/flyback_time-field
focal_length
/NXlens_opt/focal_length-field
/NXoptical_system_em/focal_length-field
focal_size
/NXcapillary/focal_size-field
focus_parameters
/NXfresnel_zone_plate/focus_parameters-field
focus_type
/NXxraylens/focus_type-field
focussing_probes
/NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-group
font_size
/NXmicrostructure_mtex_config/plotting/font_size-field
force
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
force_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
formula
/NXdispersion_function/formula-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field
/NXfit/error_function/formula-field
/NXfit/global_fit_function/formula-field
/NXfit_function/formula-field
/NXxps/ENTRY/FIT/backgroundBACKGROUND/function/formula-field
/NXxps/ENTRY/FIT/error_function/formula-field
/NXxps/ENTRY/FIT/global_fit_function/formula-field
/NXxps/ENTRY/FIT/peakPEAK/function/formula-field
formula_symbol
/NXresolution/formula_SYMBOL-field
frame
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/roi/frame-field
frame_average
/NXxpcs/entry/data/frame_average-field
frame_start_number
/NXdetector/frame_start_number-field
/NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum
/NXxpcs/entry/data/frame_sum-field
frame_time
/NXdetector/frame_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
/NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency
/NXcollimator/frequency-field
/NXsnsevent/ENTRY/instrument/SNS/frequency-field
/NXsnshisto/ENTRY/instrument/SNS/frequency-field
/NXsource/frequency-field
frequency_log
/NXcollimator/frequency_log-group
frequency_resolution
/NXbeam_path/DISK_CHOPPER/frequency_resolution-field
frog_delays
/NXbeam/frog_delays-field
frog_frequencies
/NXbeam/frog_frequencies-field
frog_trace
/NXbeam/frog_trace-field
function
/NXfit_background/function-group
/NXpeak/function-group
/NXxps/ENTRY/FIT/backgroundBACKGROUND/function-group
/NXxps/ENTRY/FIT/peakPEAK/function-group
g2
/NXxpcs/entry/data/g2-field
g2_derr
/NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized
/NXxpcs/entry/data/G2_unnormalized-field
gain
/NXcapillary/gain-group
/NXcircuit/gain-field
/NXtransmission/ENTRY/instrument/DETECTOR/gain-field
gain_setting
/NXdetector/gain_setting-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gamma
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/gamma-field
gap
/NXinsertion_device/gap-field
gas
/NXxraylens/gas-field
gas_pressure
/NXdetector/gas_pressure-field
/NXsource/gas_pressure-field
/NXxraylens/gas_pressure-field
gas_pressure_env
/NXmpes/ENTRY/SAMPLE/gas_pressure_env-group
gaussian_mixture
/NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/gaussian_mixture-group
generating_help_mode
/NXmicrostructure_mtex_config/miscellaneous/generating_help_mode-field
generic_beam_sample_angle_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE-group
geometries
/NXmpes/ENTRY/geometries-group
/NXmpes_arpes/ENTRY/geometries-group
/NXxps/ENTRY/geometries-group
geometry
/NXaperture/GEOMETRY-group
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/geometry-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/geometry-field
/NXbeam_path/ATTENUATOR/GEOMETRY-group
/NXbeam_stop/GEOMETRY-group
/NXbending_magnet/GEOMETRY-group
/NXcollimator/GEOMETRY-group
/NXcrystal/GEOMETRY-group
/NXcsg/geometry-field
/NXdetector/GEOMETRY-group
/NXdisk_chopper/GEOMETRY-group
/NXfermi_chopper/GEOMETRY-group
/NXfilter/GEOMETRY-group
/NXguide/GEOMETRY-group
/NXinsertion_device/GEOMETRY-group
/NXmicrostructure_gragles_config/ENTRY/sampling/geometry-field
/NXmirror/GEOMETRY-group
/NXmoderator/GEOMETRY-group
/NXmonitor/GEOMETRY-group
/NXmonochromator/geometry-group
/NXorientation/GEOMETRY-group
/NXsample/geometry-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group
/NXsastof/ENTRY/instrument/collimator/geometry-group
/NXsensor/geometry-group
/NXsensor_sts/geometry-group
/NXsource/geometry-group
/NXtranslation/geometry-group
/NXvelocity_selector/geometry-group
geometry_1
/NXcxi_ptycho/sample_1/geometry_1-group
getter_pump
/NXapm_msr/instrument/getter_pump-group
global_fit_function
/NXfit/global_fit_function-group
/NXxps/ENTRY/FIT/global_fit_function-group
gnomonic_reference_frame
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame-group
/NXem_ebsd/gnomonic_reference_frame-group
goniometer_x
/NXxrd_pan/ENTRY/experiment_config/goniometer_x-field
goniometer_y
/NXxrd_pan/ENTRY/experiment_config/goniometer_y-field
goniometer_z
/NXxrd_pan/ENTRY/experiment_config/goniometer_z-field
gradient
/NXmicrostructure_gragles_config/ENTRY/grid_coarsement/gradient-field
gradient_guide_magnitude
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
gradient_guide_projection
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_projection-field
grain_boundary_energy
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy-group
grain_boundary_mobility
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility-group
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility-group
grain_diameter
/NXapm/ENTRY/sample/grain_diameter-field
grain_diameter_error
/NXapm/ENTRY/sample/grain_diameter_error-field
grain_identifier
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/grain_identifier-field
grain_shape
/NXmicrostructure_imm_config/ENTRY/roi/grain_shape-field
grating
/NXbeam_path/GRATING-group
/NXbeam_path/MONOCHROMATOR/GRATING-group
/NXmonochromator/GRATING-group
/NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
grating_wavelength_max
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_max-field
grating_wavelength_min
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_min-field
grid
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid-group
/NXcg_marching_cubes/grid-group
/NXdelocalization/grid-group
/NXisocontour/grid-group
/NXmicrostructure_gragles_config/ENTRY/discretization/grid-group
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/grid-group
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid-group
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid-group
/NXmicrostructure_score_config/ENTRY/discretization/grid-group
/NXmicrostructure_score_results/ENTRY/discretization/grid-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid-group
grid_coarsement
/NXmicrostructure_gragles_config/ENTRY/grid_coarsement-group
grid_resolution
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/grid_resolution-field
grinding_machine
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
grinding_step
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
grooves
/NXbeam_path/GRATING/grooves-field
group
/NXbeam_device/group-field
group_identifier
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/group_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/group_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/group_identifier-field
/NXimage_set/stack_1d/group_identifier-field
/NXimage_set/stack_2d/group_identifier-field
/NXimage_set/stack_3d/group_identifier-field
/NXspectrum_set/stack_0d/group_identifier-field
/NXspectrum_set/stack_2d/group_identifier-field
/NXspectrum_set/stack_3d/group_identifier-field
group_index
/NXdetector_group/group_index-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_names
/NXdetector_group/group_names-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent
/NXdetector_group/group_parent-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type
/NXdetector_group/group_type-field
guide
/NXinstrument/GUIDE-group
guide_current
/NXflipper/guide_current-field
guide_turns
/NXflipper/guide_turns-field
h
/NXreflections/h-field
hagb_enthalpy
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_enthalpy-field
hagb_pre_factor
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_pre_factor-field
half_angle_interval
/NXem/ENTRY/roiID/imaging/IMAGE_SET/half_angle_interval-field
/NXem_img/IMAGE_SET/half_angle_interval-field
half_axes_radii
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/half_axes_radii-field
/NXcg_ellipsoid_set/half_axes_radii-field
half_axes_radius
/NXcg_ellipsoid_set/half_axes_radius-field
half_edge_incident_face
/NXcg_half_edge_data_structure/half_edge_incident_face-field
half_edge_next
/NXcg_half_edge_data_structure/half_edge_next-field
half_edge_prev
/NXcg_half_edge_data_structure/half_edge_prev-field
half_edge_twin
/NXcg_half_edge_data_structure/half_edge_twin-field
half_edge_vertex_origin
/NXcg_half_edge_data_structure/half_edge_vertex_origin-field
halfwidth
/NXmicrostructure_pf/configuration/halfwidth-field
halo_region
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/halo_region-field
handedness
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
/NXcoordinate_system/handedness-field
/NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/handedness-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/handedness-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/handedness-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
/NXxps/ENTRY/geometries/xps_coordinate_system/handedness-field
hardware
/NXamplifier/hardware-group
/NXcircuit/hardware-group
/NXlockin/hardware-group
/NXsts/ENTRY/INSTRUMENT/hardware-group
harmonic
/NXinsertion_device/harmonic-field
harmonic_order_n
/NXlockin/harmonic_order_N-field
/NXsts/ENTRY/INSTRUMENT/lock_in/harmonic_order_N-field
has_cell_edge_detection
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_edge_detection-field
has_cell_geometry
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_geometry-field
has_cell_neighbors
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_neighbors-field
has_cell_volume
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_volume-field
has_closure
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_closure-field
has_current_to_next_links
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_current_to_next_links-field
has_exterior_facets
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_exterior_facets-field
has_interior_tetrahedra
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_interior_tetrahedra-field
has_next_to_current_links
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_next_to_current_links-field
has_object
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object-field
has_object_edge_contact
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_edge_contact-field
has_object_geometry
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_geometry-field
has_object_ions
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_ions-field
has_object_obb
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_obb-field
has_object_properties
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_properties-field
has_object_proxigram
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram-field
has_object_proxigram_edge_contact
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram_edge_contact-field
has_proxy
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy-field
has_proxy_edge_contact
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_edge_contact-field
has_proxy_geometry
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_geometry-field
has_proxy_ions
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_ions-field
has_proxy_obb
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_obb-field
has_proxy_properties
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_properties-field
has_scalar_fields
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/has_scalar_fields-field
has_triangle_soup
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_triangle_soup-field
hdbscan
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan-group
heat_treatment_quenching_rate
/NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
heat_treatment_quenching_rate_error
/NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
heat_treatment_temperature
/NXapm/ENTRY/sample/heat_treatment_temperature-field
heat_treatment_temperature_error
/NXapm/ENTRY/sample/heat_treatment_temperature_error-field
heater
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater-group
heater_power
/NXmanipulator/sample_heater/heater_power-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/heater_power-field
heater_power_log
/NXmanipulator/sample_heater/heater_power_log-group
height
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/height-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/height-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/height-field
/NXcg_cylinder_set/height-field
/NXcg_hexahedron_set/height-field
/NXfermi_chopper/height-field
/NXvelocity_selector/height-field
hexahedra
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra-group
/NXcg_hexahedron_set/hexahedra-group
hexahedron
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron-group
hexahedron_half_edgeid
/NXcg_hexahedron_set/hexahedron_half_edgeID-group
hexahedron_set
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set-group
hexahedronid
/NXcg_hexahedron_set/hexahedronID-group
hi_pass
/NXamplifier/hi_pass-field
/NXlockin/hi_pass-field
high_throughput_method
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/high_throughput_method-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/high_throughput_method-field
high_trip_value
/NXsensor/high_trip_value-field
/NXsensor_sts/high_trip_value-field
history
/NXinstrument/HISTORY-group
/NXmpes/ENTRY/INSTRUMENT/history-group
/NXmpes/ENTRY/SAMPLE/history-group
/NXoptical_spectroscopy/ENTRY/SAMPLE/history-group
/NXsample/history-group
/NXsample_component/history-group
hit_filter
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter-group
hit_finding
/NXapm/ENTRY/atom_probe/hit_finding-group
hit_multiplicity
/NXapm/ENTRY/atom_probe/hit_finding/hit_multiplicity-field
/NXapm_hit_finding/hit_multiplicity-field
hit_multiplicity_filter
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter-group
/NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter-group
/NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter-group
hit_positions
/NXapm/ENTRY/atom_probe/hit_finding/hit_positions-field
/NXapm_hit_finding/hit_positions-field
hit_quality
/NXapm/ENTRY/atom_probe/hit_finding/hit_quality-field
/NXapm_hit_finding/hit_quality-field
hit_quality_identifier
/NXapm/ENTRY/atom_probe/hit_finding/hit_quality_identifier-field
/NXapm_hit_finding/hit_quality_identifier-field
hit_quality_types
/NXapm/ENTRY/atom_probe/hit_finding/hit_quality_types-field
/NXapm_hit_finding/hit_quality_types-field
hit_spatial_filtering
/NXapm/ENTRY/atom_probe/hit_spatial_filtering-group
hit_test
/NXmicrostructure_mtex_config/plotting/hit_test-field
holder
/NXsnsevent/ENTRY/sample/holder-field
/NXsnshisto/ENTRY/sample/holder-field
hp_filter_cutoff
/NXlockin/hp_filter_cutoff-field
hp_filter_order
/NXlockin/hp_filter_order-field
hv_gain_n
/NXsts/ENTRY/INSTRUMENT/piezo_config/hv_gain_N-field
i
/NXcanSAS/ENTRY/DATA/I-field
i_gain
/NXpositioner_sts/i_gain-field
ibeam_column
/NXem/ENTRY/measurement/em_lab/ibeam_column-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column-group
/NXem_msr/em_lab/IBEAM_COLUMN-group
/NXevent_data_em/em_lab/IBEAM_COLUMN-group
ic_opt
/NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt-group
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt-group
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt-group
id
/NXreflections/id-field
identifier
/NXapm/ENTRY/USER/identifier-group
/NXapm/ENTRY/USER/identifier/identifier-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/identifier-field
/NXapm/ENTRY/experiment_identifier/identifier-field
/NXapm/ENTRY/measurement/instrument/fabrication/identifier-group
/NXapm/ENTRY/sample/identifier-group
/NXapm/ENTRY/sample/identifier/identifier-field
/NXapm/ENTRY/specimen/identifier-group
/NXapm/ENTRY/specimen/identifier/identifier-field
/NXapm/ENTRY/specimen/parent_identifier/identifier-field
/NXapm_compositionspace_config/ENTRY/config/IDENTIFIER-group
/NXapm_compositionspace_results/ENTRY/IDENTIFIER-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/IDENTIFIER-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/identifier-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/IDENTIFIER-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/IDENTIFIER-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/IDENTIFIER-group
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/identifier-field
/NXapm_paraprobe_ranger_config/ENTRY/range/IDENTIFIER-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/identifier-field
/NXapm_paraprobe_selector_config/ENTRY/select/IDENTIFIER-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/identifier-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/IDENTIFIER-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/IDENTIFIER-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/identifier-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/IDENTIFIER-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/identifier-field
/NXapm_paraprobe_tool_common/IDENTIFIER-group
/NXapm_paraprobe_tool_config/IDENTIFIER-group
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/IDENTIFIER-group
/NXatom_set/identifier-field
/NXcg_marching_cubes/IDENTIFIER-group
/NXcg_primitive_set/identifier-field
/NXcomponent/IDENTIFIER-group
/NXcs_filter_boolean_mask/identifier-field
/NXem/ENTRY/experiment_identifier/identifier-field
/NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/identifier-group
/NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/identifier-group
/NXem/ENTRY/sample/identifier-group
/NXem/ENTRY/sample/identifier/identifier-field
/NXem/ENTRY/sample/parent_identifier/identifier-field
/NXem/ENTRY/userID/identifier-group
/NXem/ENTRY/userID/identifier/identifier-field
/NXem_calorimetry/ENTRY/identifier-group
/NXfabrication/identifier-group
/NXgraph_edge_set/identifier-field
/NXgraph_node_set/identifier-field
/NXhistory/IDENTIFIER-group
/NXidentifier/identifier-field
/NXion/identifier-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-group
/NXlab_sample_mounting/ENTRY/mounting_machine/identifier-group
/NXmicrostructure/interface/identifier-field
/NXmicrostructure/quadruple_junction/identifier-field
/NXmicrostructure/triple_junction/identifier-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/device_information/identifier-group
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/identifier-group
/NXmpes/ENTRY/SAMPLE/identifier-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/identifier-group
/NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier-field
/NXsample/identifier-group
/NXsimilarity_grouping/statistics/identifier-field
/NXsnsevent/ENTRY/sample/identifier-field
/NXsnshisto/ENTRY/sample/identifier-field
/NXtransmission/ENTRY/acquisition_program/identifier-group
/NXuser/IDENTIFIER-group
identifier_offset
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/identifier_offset-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/identifier_offset-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/identifier_offset-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/identifier_offset-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/identifier_offset-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/identifier_offset-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/identifier_offset-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_offset-field
/NXcg_primitive_set/identifier_offset-field
/NXgraph_edge_set/identifier_offset-field
/NXgraph_node_set/identifier_offset-field
/NXmicrostructure/interface/identifier_offset-field
/NXmicrostructure/quadruple_junction/identifier_offset-field
/NXmicrostructure/triple_junction/identifier_offset-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/identifier_offset-field
/NXmicrostructure_score_results/ENTRY/discretization/grid/identifier_offset-field
/NXsimilarity_grouping/identifier_offset-field
identifier_type
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/NXion/identifier_type-field
/NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier_type-field
idev
/NXcanSAS/ENTRY/DATA/Idev-field
imag
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/imag-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/imag-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/imag-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/imag-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/imag-field
/NXimage_set/image_1d/imag-field
/NXimage_set/image_2d/imag-field
/NXimage_set/image_3d/imag-field
/NXimage_set/stack_1d/imag-field
/NXimage_set/stack_2d/imag-field
/NXimage_set/stack_3d/imag-field
image_1d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d-group
/NXimage_set/image_1d-group
image_2d
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d-group
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d-group
/NXimage_set/image_2d-group
image_3d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d-group
/NXimage_set/image_3d-group
image_identifier
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/image_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/image_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/image_identifier-field
/NXimage_set/stack_1d/image_identifier-field
/NXimage_set/stack_2d/image_identifier-field
/NXimage_set/stack_3d/image_identifier-field
image_key
/NXdetector/image_key-field
/NXtomo/entry/data/image_key-link
/NXtomo/entry/instrument/detector/image_key-field
image_set
/NXcorrector_cs/tableauID/IMAGE_SET-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET-group
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET-group
/NXem/ENTRY/roiID/imaging/IMAGE_SET-group
/NXem_eds/indexing/IMAGE_SET-group
/NXem_img/IMAGE_SET-group
/NXem_method/IMAGE_SET-group
/NXevent_data_em/IMAGE_SET-group
imaging
/NXem/ENTRY/roiID/imaging-group
imaging_mode
/NXem/ENTRY/roiID/imaging/imaging_mode-field
/NXem_img/imaging_mode-field
implementation
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes/implementation-field
import_wizard
/NXmicrostructure_mtex_config/path/import_wizard-field
inchi_key
/NXsubstance/inchi_key-field
inchi_str
/NXsubstance/inchi_str-field
incidence_vector
/NXpulser_apm/SOURCE/BEAM/incidence_vector-field
incident_angle
/NXbeam_splitter/incident_angle-field
/NXguide/incident_angle-field
/NXmirror/incident_angle-field
incident_beam
/NXxpcs/entry/instrument/incident_beam-group
incident_beam_divergence
/NXbeam/incident_beam_divergence-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy
/NXbeam/incident_energy-field
/NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy-field
/NXxpcs/entry/instrument/incident_beam/incident_energy-field
/NXxrd/ENTRY/INSTRUMENT/BEAM/incident_energy-field
incident_energy_spread
/NXbeam/incident_energy_spread-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field
/NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy_spread-field
/NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
incident_energy_weights
/NXbeam/incident_energy_weights-field
incident_polarisation_stokes
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization
/NXbeam/incident_polarization-field
/NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_polarization-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_polarization-field
incident_polarization_stokes
/NXbeam/incident_polarization_stokes-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type
/NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
incident_wavelength
/NXbeam/incident_wavelength-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength-field
incident_wavelength_spectrum
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread
/NXbeam/incident_wavelength_spread-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength_spread-field
incident_wavelength_weight
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights
/NXbeam/incident_wavelength_weights-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam
/NXxas/ENTRY/INSTRUMENT/incoming_beam-group
incubation_time
/NXmicrostructure_score_config/ENTRY/nucleation/incubation_time-field
independent_controllers
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
index_of_refraction
/NXlens_opt/substrate/index_of_refraction-field
/NXpolarizer_opt/substrate/index_of_refraction-field
index_of_refraction_coating
/NXbeam_splitter/coating/index_of_refraction_coating-field
/NXlens_opt/COATING/index_of_refraction_coating-field
/NXpolarizer_opt/COATING/index_of_refraction_coating-field
/NXwaveplate/coating/index_of_refraction_coating-field
index_of_refration_substrate
/NXbeam_splitter/substrate/index_of_refration_substrate-field
/NXwaveplate/substrate/index_of_refration_substrate-field
indexing
/NXem/ENTRY/roiID/ebsd/indexing-group
/NXem/ENTRY/roiID/eds/indexing-group
/NXem_correlation/indexing-group
/NXem_ebsd/indexing-group
/NXem_eds/indexing-group
/NXem_eels/indexing-group
indexing_rate
/NXem/ENTRY/roiID/ebsd/indexing/indexing_rate-field
/NXem_ebsd/indexing/indexing_rate-field
indicators_period
/NXcircuit/indicators_period-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/indicators_period-field
/NXsts/ENTRY/resolution_indicators/indicators_period-field
indices
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/indices-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/indices-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/indices-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/indices-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/indices-field
infection_direction
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/infection_direction-field
initial_cell_cache
/NXmicrostructure_score_config/ENTRY/numerics/initial_cell_cache-field
initial_guess
/NXapm_compositionspace_config/ENTRY/config/autophase/initial_guess-field
initial_interface
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface-group
initial_radius
/NXapm/ENTRY/specimen/initial_radius-field
initial_specimen
/NXapm/ENTRY/atom_probe/initial_specimen-group
initialization
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/initialization-field
inner_plot_spacing
/NXmicrostructure_mtex_config/plotting/inner_plot_spacing-field
input
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input-group
/NXdetector/input-field
/NXiqproc/ENTRY/reduction/input-group
/NXresolution/response_function/input-field
/NXsqom/ENTRY/reduction/input-group
input_dependent
/NXfit/data/input_dependent-field
/NXxps/ENTRY/FIT/data/input_dependent-field
input_grid
/NXmicrostructure_ipf/input_grid-group
input_independent
/NXfit/data/input_independent-field
/NXxps/ENTRY/FIT/data/input_independent-field
input_symbol
/NXcalibration/input_SYMBOL-field
insertion_device
/NXinstrument/INSERTION_DEVICE-group
inside_poly
/NXmicrostructure_mtex_config/miscellaneous/inside_poly-field
instrument
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument-group
/NXapm/ENTRY/measurement/instrument-group
/NXapm_msr/instrument-group
/NXarchive/entry/instrument-group
/NXarpes/ENTRY/INSTRUMENT-group
/NXcanSAS/ENTRY/INSTRUMENT-group
/NXdirecttof/entry/INSTRUMENT-group
/NXellipsometry/ENTRY/INSTRUMENT-group
/NXentry/INSTRUMENT-group
/NXevent_data_apm/instrument-group
/NXfluo/entry/INSTRUMENT-group
/NXindirecttof/entry/INSTRUMENT-group
/NXiqproc/ENTRY/instrument-group
/NXiv_temp/ENTRY/INSTRUMENT-group
/NXlauetof/entry/instrument-group
/NXmonopd/entry/INSTRUMENT-group
/NXmpes/ENTRY/INSTRUMENT-group
/NXmpes_arpes/ENTRY/INSTRUMENT-group
/NXmx/ENTRY/INSTRUMENT-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT-group
/NXraman/ENTRY/INSTRUMENT-group
/NXrefscan/entry/instrument-group
/NXreftof/entry/instrument-group
/NXsas/ENTRY/INSTRUMENT-group
/NXsastof/ENTRY/instrument-group
/NXscan/ENTRY/INSTRUMENT-group
/NXsensor_scan/ENTRY/INSTRUMENT-group
/NXsnsevent/ENTRY/instrument-group
/NXsnshisto/ENTRY/instrument-group
/NXspe/ENTRY/INSTRUMENT-group
/NXsqom/ENTRY/instrument-group
/NXsts/ENTRY/INSTRUMENT-group
/NXstxm/ENTRY/INSTRUMENT-group
/NXsubentry/INSTRUMENT-group
/NXtas/entry/INSTRUMENT-group
/NXtofnpd/entry/INSTRUMENT-group
/NXtofraw/entry/instrument-group
/NXtofsingle/entry/INSTRUMENT-group
/NXtomo/entry/instrument-group
/NXtomophase/entry/instrument-group
/NXtomoproc/entry/INSTRUMENT-group
/NXtransmission/ENTRY/instrument-group
/NXxas/ENTRY/INSTRUMENT-group
/NXxbase/entry/instrument-group
/NXxeuler/entry/instrument-group
/NXxkappa/entry/instrument-group
/NXxlaue/entry/instrument-group
/NXxlaueplate/entry/instrument-group
/NXxnb/entry/instrument-group
/NXxpcs/entry/instrument-group
/NXxps/ENTRY/INSTRUMENT-group
/NXxrd/ENTRY/INSTRUMENT-group
/NXxrd_pan/ENTRY/INSTRUMENT-group
/NXxrot/entry/instrument-group
instrument_1
/NXcxi_ptycho/entry_1/instrument_1-group
instrument_calibration_device
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE-group
instrument_name
/NXapm/ENTRY/measurement/instrument/instrument_name-field
/NXapm_msr/instrument/instrument_name-field
/NXem/ENTRY/measurement/em_lab/instrument_name-field
/NXem_msr/em_lab/instrument_name-field
int_prf
/NXreflections/int_prf-field
int_prf_errors
/NXreflections/int_prf_errors-field
int_prf_var
/NXreflections/int_prf_var-field
int_sum
/NXreflections/int_sum-field
int_sum_errors
/NXreflections/int_sum_errors-field
int_sum_var
/NXreflections/int_sum_var-field
integral
/NXmonitor/integral-field
/NXmonopd/entry/MONITOR/integral-field
/NXreftof/entry/control/integral-field
/NXsas/ENTRY/MONITOR/integral-field
/NXtomophase/entry/control/integral-field
/NXxbase/entry/control/integral-field
integral_counts
/NXtofraw/entry/MONITOR/integral_counts-field
integral_log
/NXmonitor/integral_log-group
integration_time
/NXbias_spectroscopy/integration_time-field
/NXiv_bias/integration_time-field
/NXlockin/integration_time-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/integration_time-field
/NXsts/ENTRY/resolution_indicators/integration_time-field
/NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/integration_time-field
intended_use
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/intended_use-field
intensity
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/intensity-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/intensity-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/intensity-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/intensity-field
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity-field
/NXem/ENTRY/roiID/eds/indexing/summary/intensity-field
/NXem_calorimetry/ENTRY/azimuthal_integration/result/intensity-field
/NXem_calorimetry/ENTRY/background_subtraction/result/intensity-field
/NXem_eds/indexing/summary/intensity-field
/NXfit_background/data/intensity-field
/NXimage_set/image_1d/intensity-field
/NXimage_set/image_2d/intensity-field
/NXimage_set/image_3d/intensity-field
/NXimage_set/stack_1d/intensity-field
/NXimage_set/stack_2d/intensity-field
/NXimage_set/stack_3d/intensity-field
/NXmicrostructure_odf/phi_two_plot/intensity-field
/NXmicrostructure_pf/pf/intensity-field
/NXpeak/data/intensity-field
/NXspectrum_set/spectrum_0d/intensity-field
/NXspectrum_set/spectrum_1d/intensity-field
/NXspectrum_set/spectrum_2d/intensity-field
/NXspectrum_set/spectrum_3d/intensity-field
/NXspectrum_set/stack_0d/intensity-field
/NXspectrum_set/stack_2d/intensity-field
/NXspectrum_set/stack_3d/intensity-field
/NXxps/ENTRY/FIT/backgroundBACKGROUND/data/intensity-field
/NXxps/ENTRY/FIT/peakPEAK/data/intensity-field
/NXxrd_pan/ENTRY/experiment_result/intensity-field
/NXxrd_pan/ENTRY/q_data/intensity-field
interaction_vol_em
/NXevent_data_em/INTERACTION_VOL_EM-group
interface
/NXmicrostructure/interface-group
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface-group
interface_identifier
/NXmicrostructure/quadruple_junction/interface_identifier-field
/NXmicrostructure/triple_junction/interface_identifier-field
interface_meshing
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing-group
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing-group
interior_angle
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/interior_angle-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/interior_angle-field
/NXcg_polygon_set/interior_angle-field
/NXcg_triangle_set/interior_angle-field
interior_atmosphere
/NXgrating/interior_atmosphere-field
/NXguide/interior_atmosphere-field
/NXmirror/interior_atmosphere-field
interior_cellsid
/NXcg_alpha_complex/interior_cellsID-group
interior_tetrahedra
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra-group
interpolation
/NXmicrostructure_ipf/interpolation-field
intersection_detection_method
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/intersection_detection_method-field
intersection_volume
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/intersection_volume-field
ion
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION-group
/NXapm_ranging/peak_identification/ION-group
/NXchemical_composition/ION-group
/NXem_eds/indexing/PEAK/ION-group
ion_detector
/NXapm/ENTRY/measurement/instrument/ion_detector-group
/NXapm_msr/instrument/ion_detector-group
/NXevent_data_apm/instrument/ion_detector-group
ion_energy_profile
/NXibeam_column/ion_source/ion_energy_profile-field
ion_identifier
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/ion_identifier-field
ion_multiplicity
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/ion_multiplicity-field
ion_query_nuclide_source
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_source-field
ion_query_nuclide_target
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_target-field
ion_query_nuclide_vector
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_query_nuclide_vector-field
ion_query_type_source
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_source-field
ion_query_type_target
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_target-field
ion_source
/NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source-group
/NXibeam_column/ion_source-group
ion_type
/NXatom_set/ion_type-field
/NXion/ion_type-field
ion_type_filter
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_type_filter-field
ionid
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID-group
/NXapm/ENTRY/sample/chemical_composition/ionID-group
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID-group
iontype_filter
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter-group
/NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter-group
/NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter-group
iontypes
/NXapm_paraprobe_ranger_results/ENTRY/iontypes-group
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/iontypes-field
iontypes_randomized
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/iontypes_randomized-field
iris
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/iris-group
is_a
/NXgraph_edge_set/is_a-field
/NXgraph_node_set/is_a-field
is_active
/NXmicrostructure_gragles_config/ENTRY/curvature_driving_force/is_active-field
/NXmicrostructure_gragles_config/ENTRY/grid_coarsement/is_active-field
/NXmicrostructure_gragles_config/ENTRY/magnetic_field/is_active-field
/NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/is_active-field
is_amorphous
/NXapm/ENTRY/specimen/is_amorphous-field
is_antipodal
/NXrotation_set/is_antipodal-field
is_axis_aligned
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/is_axis_aligned-field
/NXcg_hexahedron_set/is_axis_aligned-field
/NXcg_parallelogram_set/is_axis_aligned-field
is_box
/NXcg_hexahedron_set/is_box-field
is_center_of_mass
/NXcg_primitive_set/is_center_of_mass-field
is_centrosymmetric
/NXcrystal_structure/is_centrosymmetric-field
/NXunit_cell/is_centrosymmetric-field
is_chiral
/NXcrystal_structure/is_chiral-field
/NXunit_cell/is_chiral-field
is_closed
/NXcg_primitive_set/is_closed-field
is_core
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_core-field
is_cylindrical
/NXcrystal/is_cylindrical-field
is_deformed
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_deformed-field
is_noise
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_noise-field
is_persistent
/NXapm/ENTRY/USER/identifier/is_persistent-field
/NXapm/ENTRY/experiment_identifier/is_persistent-field
/NXapm/ENTRY/sample/identifier/is_persistent-field
/NXapm/ENTRY/specimen/identifier/is_persistent-field
/NXapm/ENTRY/specimen/parent_identifier/is_persistent-field
/NXem/ENTRY/experiment_identifier/is_persistent-field
/NXem/ENTRY/sample/identifier/is_persistent-field
/NXem/ENTRY/sample/parent_identifier/is_persistent-field
/NXem/ENTRY/userID/identifier/is_persistent-field
/NXidentifier/is_persistent-field
/NXoptical_spectroscopy/ENTRY/experiment_identifier/is_persistent-field
is_polycrystalline
/NXapm/ENTRY/specimen/is_polycrystalline-field
is_recrystallized
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_recrystallized-field
is_rectangle
/NXcg_parallelogram_set/is_rectangle-field
is_specific
/NXmicrostructure_slip_system/is_specific-field
is_subgrain
/NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/is_subgrain-field
is_watertight
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/is_watertight-field
iso_surfaceid
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID-group
isosurfacing
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing-group
isovalue
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/isovalue-field
/NXisocontour/isovalue-field
iteration
/NXmicrostructure/iteration-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/iteration-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/iteration-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field
iupac_line_candidates
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/iupac_line_candidates-field
/NXem_eds/indexing/IMAGE_SET/iupac_line_candidates-field
iupac_line_names
/NXem_eds/indexing/PEAK/ION/iupac_line_names-field
iupac_name
/NXsubstance/iupac_name-field
jones_quality_factor
/NXoptical_spectroscopy/ENTRY/derived_parameters/jones_quality_factor-field
k
/NXinsertion_device/k-field
/NXreflections/k-field
k_alpha_one
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one-field
k_alpha_two
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two-field
k_d_value
/NXpid/K_d_value-field
k_i_value
/NXpid/K_i_value-field
k_p_value
/NXpid/K_p_value-field
k_t_const
/NXpid/K_t_const-field
kappa
/NXxkappa/entry/name/kappa-link
/NXxkappa/entry/sample/kappa-field
kbeta
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta-field
kernel_halfwidth
/NXmicrostructure_odf/configuration/kernel_halfwidth-field
kernel_mu
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_mu-field
kernel_name
/NXmicrostructure_odf/configuration/kernel_name-field
kernel_sigma
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_sigma-field
kernel_size
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_size-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_size-field
kernel_type
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_type-field
kernel_variance
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_variance-field
kernel_width
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/kernel_width-field
ki_over_kf_scaling
/NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
kinetic_energy
/NXelectronanalyser/transmission_function/kinetic_energy-field
/NXenergydispersion/kinetic_energy-field
/NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/kinetic_energy-field
/NXprocess_mpes/transmission_correction/transmission_function/kinetic_energy-field
kinetics
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group
kn
/NXdata_mpes/kN-field
/NXdata_mpes_detector/kN-field
kn_calibration
/NXmpes/ENTRY/PROCESS_MPES/kN_calibration-group
/NXprocess_mpes/kN_calibration-group
knn
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn-group
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn-group
kth
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/kth-field
/NXmicrostructure_odf/kth_extrema/kth-field
kth_extrema
/NXmicrostructure_odf/kth_extrema-group
l
/NXreflections/l-field
label
/NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/label-field
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/label-field
/NXfit/label-field
/NXfit_background/label-field
/NXgraph_edge_set/label-field
/NXgraph_node_set/label-field
/NXpeak/label-field
/NXxps/ENTRY/FIT/backgroundBACKGROUND/label-field
/NXxps/ENTRY/FIT/label-field
/NXxps/ENTRY/FIT/peakPEAK/label-field
lagb_enthalpy
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_enthalpy-field
lagb_pre_factor
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_pre_factor-field
lagb_to_hagb_cut
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_to_hagb_cut-field
lambda
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
last_fill
/NXsource/last_fill-field
last_process
/NXcalibration/last_process-field
/NXdistortion/last_process-field
/NXregistration/last_process-field
lateral_focal_point_offset
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/lateral_focal_point_offset-field
lateral_surface_area
/NXcg_cylinder_set/lateral_surface_area-field
lattice_system
/NXunit_cell/lattice_system-field
lattice_type
/NXmicrostructure_slip_system/lattice_type-field
laue_group
/NXcrystal_structure/laue_group-field
/NXunit_cell/laue_group-field
layer_structure
/NXoptical_spectroscopy/ENTRY/SAMPLE/layer_structure-field
layer_thickness
/NXgrating/layer_thickness-field
/NXmirror/layer_thickness-field
layout
/NXdetector/layout-field
legend
/NXmicrostructure_ipf/legend-group
length
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
/NXcg_hexahedron_set/length-field
/NXcg_primitive_set/length-field
/NXfiber/length-field
/NXinsertion_device/length-field
/NXmicrostructure/crystal/length-field
/NXmicrostructure/interface/length-field
/NXmicrostructure/triple_junction/length-field
/NXvelocity_selector/length-field
lens_diameter
/NXlens_opt/lens_diameter-field
lens_em
/NXcollectioncolumn/LENS_EM-group
/NXcorrector_cs/LENS_EM-group
/NXebeam_column/LENS_EM-group
/NXelectronanalyser/LENS_EM-group
/NXenergydispersion/LENS_EM-group
/NXibeam_column/LENS_EM-group
/NXsource/LENS_EM-group
/NXspindispersion/LENS_EM-group
lens_geometry
/NXxraylens/lens_geometry-field
lens_length
/NXxraylens/lens_length-field
lens_material
/NXxraylens/lens_material-field
lens_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
/NXcollectioncolumn/lens_mode-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/lens_mode-field
lens_opt
/NXbeam_path/LENS_OPT-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT-group
lens_thickness
/NXxraylens/lens_thickness-field
lensid
/NXem/ENTRY/measurement/em_lab/ebeam_column/lensID-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/lensID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID-group
level
/NXmpes/ENTRY/PROCESS_MPES/energy_referencing/level-group
/NXprocess_mpes/energy_referencing/level-group
level_electron_config
/NXelectron_level/level_electron_config-field
level_iupac
/NXelectron_level/level_iupac-field
lifespan
/NXbeam_path/SOURCE/lifespan-field
line_energy
/NXmicrostructure/triple_junction/line_energy-field
/NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/line_energy-field
line_scan
/NXsts/ENTRY/line_scan-group
line_time
/NXscanbox_em/line_time-field
linear_beam_sample_polarization
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/linear_beam_sample_polarization-field
lines
/NXpositioner_sts/lines-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/lines-field
load_lock_chamber
/NXapm_msr/instrument/load_lock_chamber-group
/NXevent_data_apm/instrument/load_lock_chamber-group
local_electrode
/NXapm/ENTRY/measurement/instrument/local_electrode-group
/NXapm_msr/instrument/local_electrode-group
/NXevent_data_apm/instrument/local_electrode-group
local_name
/NXdetector/local_name-field
/NXem_msr/em_lab/DETECTOR/local_name-field
location
/NXapm_msr/instrument/location-field
/NXem/ENTRY/measurement/em_lab/location-field
/NXem_msr/em_lab/location-field
/NXmicrostructure/quadruple_junction/location-field
/NXmicrostructure/triple_junction/location-field
/NXmicrostructure_odf/kth_extrema/location-field
lock_in
/NXsts/ENTRY/INSTRUMENT/lock_in-group
lock_in_data_flip_number
/NXsts/ENTRY/INSTRUMENT/lock_in/lock_in_data_flip_number-field
lock_in_run
/NXbias_spectroscopy/lock_in_run-field
/NXiv_bias/lock_in_run-field
log
/NXsnsevent/ENTRY/DASlogs/LOG-group
/NXsnshisto/ENTRY/DASlogs/LOG-group
low_pass
/NXamplifier/low_pass-field
/NXlockin/low_pass-field
low_trip_value
/NXsensor/low_trip_value-field
/NXsensor_sts/low_trip_value-field
lower_cap_radii
/NXcg_cylinder_set/lower_cap_radii-field
lower_cap_surface_area
/NXcg_cylinder_set/lower_cap_surface_area-field
lp
/NXreflections/lp-field
lp_filter_cutoff
/NXlockin/lp_filter_cutoff-field
lp_filter_order
/NXlockin/lp_filter_order-field
lubricant
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
m_null
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/m_null-field
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/m_null-field
m_value
/NXfilter/m_value-field
/NXguide/m_value-field
/NXmirror/m_value-field
magnetic_field
/NXarchive/entry/sample/magnetic_field-field
/NXbending_magnet/magnetic_field-field
/NXmicrostructure_gragles_config/ENTRY/magnetic_field-group
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group
/NXsample/magnetic_field-field
/NXsample/magnetic_field-group
magnetic_field_env
/NXsample/magnetic_field_env-group
magnetic_field_log
/NXsample/magnetic_field_log-group
magnetic_wavelength
/NXinsertion_device/magnetic_wavelength-field
magnification
/NXcollectioncolumn/magnification-field
/NXcorrector_cs/tableauID/magnification-field
/NXlens_opt/magnification-field
/NXoptical_system_em/magnification-field
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/magnification-field
magnitude
/NXaberration/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_2/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_4/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_0/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_0/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_0/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_a/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_b/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3/magnitude-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5/magnitude-field
/NXresolution/response_function/magnitude-field
manipulator
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
manufacturer
/NXcapillary/manufacturer-field
/NXtransmission/ENTRY/instrument/manufacturer-group
map
/NXmicrostructure_ipf/map-group
mapping_mapping
/NXcalibration/mapping_MAPPING-field
marching_cubes
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes-group
mark
/NXdelocalization/weighting_model/mark-field
marker
/NXmicrostructure_mtex_config/plotting/marker-field
marker_edge_color
/NXmicrostructure_mtex_config/plotting/marker_edge_color-field
marker_face_color
/NXmicrostructure_mtex_config/plotting/marker_face_color-field
marker_size
/NXmicrostructure_mtex_config/plotting/marker_size-field
mask
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/mask-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/mask-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/mask-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/mask-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/mask-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/mask-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/mask-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/mask-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/mask-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_selector_results/ENTRY/roi/window/mask-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/mask-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/mask-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/mask-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/mask-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/mask-field
/NXapm_paraprobe_tool_results/window/mask-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/mask-field
/NXcs_filter_boolean_mask/mask-field
mask_material
/NXfresnel_zone_plate/mask_material-field
mask_thickness
/NXfresnel_zone_plate/mask_thickness-field
masks
/NXxpcs/entry/instrument/masks-group
mass
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass-field
/NXapm_charge_state_analysis/mass-field
/NXsample/mass-field
/NXsample_component/mass-field
mass_spectrum
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
/NXapm_ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
/NXapm_compositionspace_config/ENTRY/config/reconstruction/mass_to_charge-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/mass_to_charge-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/mass_to_charge-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/mass_to_charge-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/mass_to_charge-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/mass_to_charge-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/mass_to_charge-field
/NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/mass_to_charge-field
/NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/mass_to_charge-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/mass_to_charge-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/mass_to_charge-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/mass_to_charge-field
/NXapm_paraprobe_tool_config/reconstruction/mass_to_charge-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/mass_to_charge-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
/NXapm_ranging/mass_to_charge_distribution-group
mass_to_charge_range
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass_to_charge_range-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/mass_to_charge_range-field
/NXapm_charge_state_analysis/mass_to_charge_range-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/mass_to_charge_range-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXatom_set/mass_to_charge_range-field
/NXion/mass_to_charge_range-field
match
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/match-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/match-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/match-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/match-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/match-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/match-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/match-field
/NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/match-field
/NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/match-field
/NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/match-field
/NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/match-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/match-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/match-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/match-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/match-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/match-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/match-field
/NXdelocalization/weighting_model/match-field
/NXmatch_filter/match-field
match_filter
/NXapm_paraprobe_tool_config/MATCH_FILTER-group
material
/NXaperture/material-field
/NXbeam_path/window_NUMBER/material-field
/NXopt_window/ENTRY/material-field
material_other
/NXopt_window/ENTRY/material_other-field
material_phase
/NXdispersive_material/ENTRY/sample/material_phase-field
material_phase_comment
/NXdispersive_material/ENTRY/sample/material_phase_comment-field
material_properties
/NXmicrostructure_score_config/ENTRY/material_properties-group
matrix_elements
/NXbeam_transfer_matrix_table/matrix_elements-field
max_delta_x
/NXmicrostructure_score_config/ENTRY/numerics/max_delta_x-field
max_frequency
/NXbeam_path/DISK_CHOPPER/max_frequency-field
max_gap
/NXbeam_path/MONOCHROMATOR/SLIT/max_gap-field
max_iteration
/NXmicrostructure_score_config/ENTRY/simulation_control/max_iteration-field
max_physical_capacity
/NXcs_computer/memory/CIRCUIT/max_physical_capacity-field
/NXcs_computer/storage/CIRCUIT/max_physical_capacity-field
max_resident_memory_snapshot
/NXcs_profiling_event/max_resident_memory_snapshot-field
max_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element/max_revolutions-field
max_sew_rate
/NXiv_bias/max_sew_rate-field
max_slew_rate
/NXbias_spectroscopy/max_slew_rate-field
/NXsts/ENTRY/reproducibility_indicators/max_slew_rate-field
max_sothree_bandwidth
/NXmicrostructure_mtex_config/numerics/max_sothree_bandwidth-field
max_stwo_bandwidth
/NXmicrostructure_mtex_config/numerics/max_stwo_bandwidth-field
max_time
/NXmicrostructure_score_config/ENTRY/simulation_control/max_time-field
max_value
/NXfit_parameter/max_value-field
max_virtual_memory_snapshot
/NXcs_profiling_event/max_virtual_memory_snapshot-field
max_x
/NXmicrostructure_score_config/ENTRY/simulation_control/max_x-field
maximum_incident_angle
/NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion
/NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
/NXapm_ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_value
/NXlog/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
measure_time
/NXbeam_path/SOURCE/measure_time-field
measured_data
/NXellipsometry/ENTRY/data_collection/measured_data-field
/NXtransmission/ENTRY/instrument/measured_data-field
measured_data_errors
/NXellipsometry/ENTRY/data_collection/measured_data_errors-field
measurement
/NXapm/ENTRY/measurement-group
/NXem/ENTRY/measurement-group
/NXem/ENTRY/roiID/ebsd/measurement-group
/NXem_ebsd/measurement-group
/NXmanipulator/drain_current_amperemeter/measurement-field
/NXmanipulator/sample_bias_voltmeter/measurement-field
/NXmanipulator/temperature_sensor/measurement-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/measurement-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/measurement-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/measurement-field
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/measurement-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/measurement-field
/NXsensor/measurement-field
/NXsensor_sts/measurement-field
measurement_data_calibration_type
/NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE-group
measurement_sensors
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
measurement_type
/NXxrd_pan/ENTRY/measurement_type-field
measurements_period
/NXcircuit/measurements_period-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/measurements_period-field
/NXsts/ENTRY/resolution_indicators/measurements_period-field
melting_temperature
/NXmicrostructure_score_config/ENTRY/material_properties/melting_temperature-field
member_count
/NXsimilarity_grouping/statistics/member_count-field
memory
/NXcs_computer/memory-group
/NXmicrostructure_mtex_config/system/memory-field
mesh_scan
/NXsts/ENTRY/mesh_scan-group
mesh_stateid
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID-group
method
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/method-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/method-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/method-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/method-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/method-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/method-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/method-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/method-field
/NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/method-field
/NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/method-field
/NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/method-field
/NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/method-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/method-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/method-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/method-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/method-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/method-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/method-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/method-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/method-field
/NXchemical_process/method-field
/NXdelocalization/weighting_model/method-field
/NXem_ebsd/indexing/method-field
/NXmatch_filter/method-field
/NXmpes/ENTRY/SAMPLE/history/sample_preparation/method-field
/NXmpes/ENTRY/method-field
/NXphysical_process/method-field
/NXxps/ENTRY/method-field
/NXxrd_pan/ENTRY/method-field
methods_advise
/NXmicrostructure_mtex_config/miscellaneous/methods_advise-field
microstructureid
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID-group
/NXmicrostructure_imm_results/ENTRY/microstructureID-group
/NXmicrostructure_kanapy_results/ENTRY/microstructureID-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID-group
miller
/NXcrystal_structure/miller-field
miller_direction
/NXmicrostructure_slip_system/miller_direction-field
miller_indices
/NXmicrostructure_pf/configuration/miller_indices-field
miller_plane
/NXmicrostructure_slip_system/miller_plane-field
min_abundance
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance-field
/NXapm_charge_state_analysis/min_abundance-field
min_abundance_product
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance_product-field
min_cluster_size
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_cluster_size-field
min_frequency
/NXbeam_path/DISK_CHOPPER/min_frequency-field
min_half_life
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_half_life-field
/NXapm_charge_state_analysis/min_half_life-field
min_incr_max
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/min_incr_max-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/min_incr_max-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf/min_incr_max-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter/min_incr_max-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter/min_incr_max-field
/NXapm_ranging/mass_to_charge_distribution/min_incr_max-field
/NXsubsampling_filter/min_incr_max-field
min_max_grain
/NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_grain-field
min_max_subgrain
/NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_subgrain-field
min_pts
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/min_pts-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/min_pts-field
min_samples
/NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/min_samples-field
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/min_samples-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_samples-field
min_value
/NXfit_parameter/min_value-field
minimum_value
/NXlog/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror
/NXbeam_path/MIRROR-group
/NXinstrument/MIRROR-group
miscellaneous
/NXmicrostructure_mtex_config/miscellaneous-group
misorientation_angle
/NXrotation_set/misorientation_angle-field
misorientation_axis
/NXrotation_set/misorientation_axis-field
misorientation_quaternion
/NXrotation_set/misorientation_quaternion-field
mobility
/NXmicrostructure/interface/mobility-field
/NXmicrostructure/quadruple_junction/mobility-field
/NXmicrostructure/triple_junction/mobility-field
mobility_weight
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/mobility_weight-field
mode
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/mode-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID/mode-field
/NXfluo/entry/MONITOR/mode-field
/NXlauetof/entry/control/mode-field
/NXlens_em/mode-field
/NXmonitor/mode-field
/NXmonopd/entry/MONITOR/mode-field
/NXrefscan/entry/control/mode-field
/NXreftof/entry/control/mode-field
/NXsas/ENTRY/MONITOR/mode-field
/NXsastof/ENTRY/control/mode-field
/NXsnsevent/ENTRY/MONITOR/mode-field
/NXsnshisto/ENTRY/MONITOR/mode-field
/NXsource/mode-field
/NXspectrum_set/PROCESS/mode-field
/NXtas/entry/MONITOR/mode-field
/NXtofnpd/entry/MONITOR/mode-field
/NXtofraw/entry/MONITOR/mode-field
/NXtofsingle/entry/MONITOR/mode-field
/NXxas/ENTRY/DATA/mode-field
/NXxas/ENTRY/MONITOR/mode-field
/NXxbase/entry/control/mode-field
model
/NXactuator/model-field
/NXapm/ENTRY/measurement/instrument/fabrication/model-field
/NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/model-field
/NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/model-field
/NXapm/ENTRY/measurement/instrument/pulser/fabrication/model-field
/NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/model-field
/NXapm/ENTRY/measurement/instrument/reflectron/fabrication/model-field
/NXcorrector_cs/tableauID/model-field
/NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/detectorID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/model-field
/NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/model-field
/NXfabrication/model-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/model-field
/NXlab_sample_mounting/ENTRY/mounting_machine/model-field
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/model-field
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/model-field
/NXmicrostructure_score_config/ENTRY/deformation/model-field
/NXmicrostructure_score_config/ENTRY/dispersoid_drag/model-field
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/model-field
/NXmicrostructure_score_config/ENTRY/stored_energy_recovery/model-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/device_information/model-field
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/model-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/model-field
/NXsensor/model-field
/NXsensor_sts/model-field
/NXtransmission/ENTRY/acquisition_program/model-field
model_labels
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/model_labels-field
model_name
/NXdispersion/model_name-field
/NXdispersion_function/model_name-field
/NXdispersion_table/model_name-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/model_name-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/model_name-field
/NXdispersive_material/ENTRY/dispersion_x/model_name-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/model_name-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/model_name-field
/NXdispersive_material/ENTRY/dispersion_y/model_name-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/model_name-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/model_name-field
/NXdispersive_material/ENTRY/dispersion_z/model_name-field
moderator
/NXinstrument/MODERATOR-group
/NXsnsevent/ENTRY/instrument/moderator-group
/NXsnshisto/ENTRY/instrument/moderator-group
modulated_signal_bias
/NXiv_bias/modulated_signal_bias-field
modulation_amplitude
/NXlockin/modulation_amplitude-field
/NXsts/ENTRY/INSTRUMENT/lock_in/modulation_amplitude-field
modulation_frequency
/NXlockin/modulation_frequency-field
/NXsts/ENTRY/INSTRUMENT/lock_in/modulation_frequency-field
modulation_signal
/NXlockin/modulation_signal-field
/NXsts/ENTRY/INSTRUMENT/lock_in/modulation_signal-field
/NXsts/ENTRY/resolution_indicators/modulation_signal-field
modulation_status
/NXlockin/modulation_status-field
module_offset
/NXdetector_module/module_offset-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
molecular_formula_hill
/NXmpes/ENTRY/SAMPLE/SUBSTANCE/molecular_formula_hill-field
/NXsubstance/molecular_formula_hill-field
molecular_mass
/NXsubstance/molecular_mass-field
momentum_resolution
/NXelectronanalyser/momentum_resolution-group
monitor
/NXcxi_ptycho/entry_1/instrument_1/MONITOR-group
/NXentry/MONITOR-group
/NXfluo/entry/MONITOR-group
/NXmonopd/entry/MONITOR-group
/NXsas/ENTRY/MONITOR-group
/NXscan/ENTRY/MONITOR-group
/NXsnsevent/ENTRY/MONITOR-group
/NXsnshisto/ENTRY/MONITOR-group
/NXsubentry/MONITOR-group
/NXtas/entry/MONITOR-group
/NXtofnpd/entry/MONITOR-group
/NXtofraw/entry/MONITOR-group
/NXtofsingle/entry/MONITOR-group
/NXxas/ENTRY/MONITOR-group
monochromator
/NXarpes/ENTRY/INSTRUMENT/monochromator-group
/NXbeam_path/MONOCHROMATOR-group
/NXebeam_column/MONOCHROMATOR-group
/NXfluo/entry/INSTRUMENT/monochromator-group
/NXibeam_column/MONOCHROMATOR-group
/NXinstrument/MONOCHROMATOR-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR-group
/NXrefscan/entry/instrument/monochromator-group
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group
/NXstxm/ENTRY/INSTRUMENT/monochromator-group
/NXtas/entry/INSTRUMENT/monochromator-group
/NXxas/ENTRY/INSTRUMENT/monochromator-group
/NXxbase/entry/instrument/monochromator-group
monochromatorid
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID-group
mosaic_horizontal
/NXcrystal/mosaic_horizontal-field
mosaic_vertical
/NXcrystal/mosaic_vertical-field
mosek
/NXmicrostructure_mtex_config/miscellaneous/mosek-field
mounting_machine
/NXlab_sample_mounting/ENTRY/mounting_machine-group
mounting_method
/NXlab_sample_mounting/ENTRY/mounting_method-field
mrp_mass_to_charge
/NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_mass_to_charge-field
mrp_value
/NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_value-field
mtex
/NXmicrostructure_mtex_config/path/mtex-field
multiple_outputs
/NXbeam_splitter/multiple_outputs-field
n_ic_cluster
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/n_ic_cluster-field
n_max_ic_cluster
/NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/n_max_ic_cluster-field
n_phases_per_scan_point
/NXem_ebsd/indexing/n_phases_per_scan_point-field
naive_discretization
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization-group
/NXapm_reconstruction/naive_discretization-group
name
/NXaberration/name-field
/NXactuator/name-field
/NXapm/ENTRY/USER/name-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/name-field
/NXapm/ENTRY/measurement/instrument/local_electrode/name-field
/NXapm_compositionspace_results/ENTRY/voxelization/elementID/name-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_distancer_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_intersector_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_ranger_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/name-field
/NXapm_paraprobe_selector_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/userID/name-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/userID/name-field
/NXarchive/entry/instrument/SOURCE/name-field
/NXarchive/entry/instrument/name-field
/NXarchive/entry/sample/name-field
/NXarchive/entry/user/name-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field
/NXarpes/ENTRY/SAMPLE/name-field
/NXatom_set/name-field
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field
/NXcanSAS/ENTRY/PROCESS/name-field
/NXcanSAS/ENTRY/SAMPLE/name-field
/NXchamber/name-field
/NXcomponent/name-field
/NXcontainer/name-field
/NXcs_computer/memory/CIRCUIT/name-field
/NXcs_computer/name-field
/NXcs_computer/processing/CIRCUIT/name-field
/NXcs_computer/storage/CIRCUIT/name-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/name-field
/NXcxi_ptycho/sample_1/name-field
/NXdeflector/name-field
/NXdispersion_repeated_parameter/name-field
/NXdispersion_single_parameter/name-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
/NXebeam_column/electron_source/name-field
/NXelectronanalyser/name-field
/NXem/ENTRY/sample/name-field
/NXem/ENTRY/userID/name-field
/NXenvironment/name-field
/NXfit_parameter/name-field
/NXfluo/entry/INSTRUMENT/SOURCE/name-field
/NXfluo/entry/SAMPLE/name-field
/NXibeam_column/ion_source/name-field
/NXinstrument/name-field
/NXion/name-field
/NXiqproc/ENTRY/SAMPLE/name-field
/NXiqproc/ENTRY/instrument/SOURCE/name-field
/NXiqproc/ENTRY/instrument/name-field
/NXiv_temp/ENTRY/SAMPLE/name-field
/NXlauetof/entry/name-group
/NXlauetof/entry/sample/name-field
/NXmanipulator/name-field
/NXmonopd/entry/INSTRUMENT/SOURCE/name-field
/NXmonopd/entry/SAMPLE/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/name-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/name-field
/NXmpes/ENTRY/INSTRUMENT/flood_gun/name-field
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/name-field
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/name-field
/NXmpes/ENTRY/SAMPLE/name-field
/NXmpes/ENTRY/USER/name-field
/NXmx/ENTRY/INSTRUMENT/name-field
/NXmx/ENTRY/SAMPLE/name-field
/NXmx/ENTRY/SOURCE/name-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/name-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/name-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/name-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/name-field
/NXpositioner/name-field
/NXpositioner_sts/name-field
/NXpulser_apm/SOURCE/name-field
/NXreflectron/name-field
/NXrefscan/entry/instrument/SOURCE/name-field
/NXrefscan/entry/sample/name-field
/NXreftof/entry/instrument/name-field
/NXreftof/entry/sample/name-field
/NXsample/name-field
/NXsample_component/name-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/name-field
/NXsas/ENTRY/INSTRUMENT/name-field
/NXsas/ENTRY/SAMPLE/name-field
/NXsastof/ENTRY/instrument/name-field
/NXsastof/ENTRY/instrument/source/name-field
/NXsastof/ENTRY/sample/name-field
/NXsensor/name-field
/NXsensor_scan/ENTRY/SAMPLE/name-field
/NXsensor_scan/ENTRY/USER/name-field
/NXsensor_sts/name-field
/NXsnsevent/ENTRY/USER/name-field
/NXsnsevent/ENTRY/instrument/SNS/name-field
/NXsnsevent/ENTRY/instrument/name-field
/NXsnsevent/ENTRY/sample/name-field
/NXsnshisto/ENTRY/USER/name-field
/NXsnshisto/ENTRY/instrument/SNS/name-field
/NXsnshisto/ENTRY/instrument/name-field
/NXsnshisto/ENTRY/sample/name-field
/NXsource/name-field
/NXspe/ENTRY/INSTRUMENT/name-field
/NXsqom/ENTRY/SAMPLE/name-field
/NXsqom/ENTRY/instrument/SOURCE/name-field
/NXsqom/ENTRY/instrument/name-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field
/NXsubstance/name-field
/NXtas/entry/INSTRUMENT/SOURCE/name-field
/NXtas/entry/SAMPLE/name-field
/NXtofnpd/entry/SAMPLE/name-field
/NXtofnpd/entry/user/name-field
/NXtofraw/entry/SAMPLE/name-field
/NXtofraw/entry/user/name-field
/NXtofsingle/entry/SAMPLE/name-field
/NXtofsingle/entry/user/name-field
/NXtomo/entry/instrument/SOURCE/name-field
/NXtomo/entry/sample/name-field
/NXtomophase/entry/instrument/SOURCE/name-field
/NXtomophase/entry/sample/name-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/name-field
/NXtomoproc/entry/SAMPLE/name-field
/NXtransmission/ENTRY/SAMPLE/name-field
/NXtransmission/ENTRY/operator/name-field
/NXuser/name-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/name-field
/NXxas/ENTRY/SAMPLE/name-field
/NXxasproc/ENTRY/SAMPLE/name-field
/NXxbase/entry/instrument/source/name-field
/NXxbase/entry/sample/name-field
/NXxeuler/entry/name-group
/NXxkappa/entry/name-group
/NXxnb/entry/name-group
/NXxrot/entry/name-group
name_spectrum
/NXellipsometry/ENTRY/data_collection/NAME_spectrum-field
natural_abundance_product
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/natural_abundance_product-field
/NXapm_charge_state_analysis/natural_abundance_product-field
nature
/NXsnsevent/ENTRY/sample/nature-field
/NXsnshisto/ENTRY/sample/nature-field
/NXtofraw/entry/SAMPLE/nature-field
/NXtofsingle/entry/SAMPLE/nature-field
next_device
/NXbeam/next_device-field
next_set
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set-group
next_set_feature_to_cluster
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/next_set_feature_to_cluster-field
next_to_current_link
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link-field
next_to_current_link_type
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link_type-field
node_pair
/NXgraph_edge_set/node_pair-field
nodes
/NXgraph_root/nodes-group
noise
/NXsimilarity_grouping/statistics/noise-field
nominal
/NXmonitor/nominal-field
normalization
/NXapm/ENTRY/sample/chemical_composition/normalization-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/normalization-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/normalization-field
normals
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/normals-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/normals-field
/NXcg_unit_normal_set/normals-field
note
/NXaperture/NOTE-group
/NXcanSAS/ENTRY/PROCESS/NOTE-group
/NXenvironment/NOTE-group
/NXprocess/NOTE-group
/NXprocess_mpes/NOTE-group
/NXresolution/note-group
/NXxpcs/entry/NOTE-group
notes
/NXactivity/notes-group
/NXchemical_process/notes-group
/NXentry/notes-group
/NXhistory/notes-group
/NXphysical_process/notes-group
/NXsnsevent/ENTRY/notes-field
/NXsnshisto/ENTRY/notes-field
/NXsource/notes-group
/NXsubentry/notes-group
nucleation
/NXmicrostructure_score_config/ENTRY/nucleation-group
nuclide_hash
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclide_hash-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_hash-field
/NXapm_charge_state_analysis/nuclide_hash-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_hash-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/nuclide_hash-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_hash-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_hash-field
/NXatom_set/nuclide_hash-field
/NXion/nuclide_hash-field
nuclide_list
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_list-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_list-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_list-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_list-field
/NXatom_set/nuclide_list-field
/NXion/nuclide_list-field
nuclide_whitelist
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/nuclide_whitelist-field
nuclides
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclides-field
/NXapm_charge_state_analysis/nuclides-field
num
/NXvelocity_selector/num-field
num_of_channels
/NXamplifier/num_of_channels-field
num_pixel
/NXbias_spectroscopy/num_pixel-field
/NXiv_bias/num_pixel-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/num_pixel-field
/NXsts/ENTRY/resolution_indicators/num_pixel-field
number
/NXfermi_chopper/number-field
number_of_atoms
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_atoms-field
number_of_boundaries
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/number_of_boundaries-field
/NXcg_grid/number_of_boundaries-field
/NXmicrostructure_score_results/ENTRY/discretization/boundary/number_of_boundaries-field
number_of_bunches
/NXsource/number_of_bunches-field
number_of_categorical_labels
/NXsimilarity_grouping/number_of_categorical_labels-field
number_of_core
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_core-field
number_of_crystals
/NXmicrostructure/crystal/number_of_crystals-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/number_of_crystals-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/number_of_crystals-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_crystals-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field
number_of_cycles
/NXdetector/number_of_cycles-field
number_of_demodulator_channels
/NXlockin/number_of_demodulator_channels-field
number_of_dld_wires
/NXapm/ENTRY/atom_probe/hit_finding/number_of_dld_wires-field
/NXapm_hit_finding/number_of_dld_wires-field
number_of_domains
/NXmicrostructure_score_config/ENTRY/solitary_unit/number_of_domains-field
number_of_edges
/NXcg_face_list_data_structure/number_of_edges-field
/NXcg_half_edge_data_structure/number_of_edges-field
/NXcg_polyhedron_set/number_of_edges-field
/NXgraph_edge_set/number_of_edges-field
number_of_faces
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_faces-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_faces-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_faces-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_faces-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/number_of_faces-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_faces-field
/NXcg_face_list_data_structure/number_of_faces-field
/NXcg_half_edge_data_structure/number_of_faces-field
/NXcg_polyhedron_set/number_of_faces-field
number_of_feature_types
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/number_of_feature_types-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/number_of_feature_types-field
number_of_features
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_features-field
number_of_gpus
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_gpus-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_gpus-field
/NXcs_profiling/number_of_gpus-field
/NXcs_profiling_event/number_of_gpus-field
number_of_grains
/NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_grains-field
/NXmicrostructure_imm_config/ENTRY/roi/number_of_grains-field
number_of_interfaces
/NXmicrostructure/interface/number_of_interfaces-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/number_of_interfaces-field
number_of_ion_types
/NXapm_ranging/number_of_ion_types-field
number_of_ions
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/number_of_ions-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/number_of_ions-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/number_of_ions-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/number_of_ions-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/number_of_ions-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_ions-field
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/number_of_ions-field
/NXapm_paraprobe_selector_results/ENTRY/roi/window/number_of_ions-field
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/number_of_ions-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/number_of_ions-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/number_of_ions-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/number_of_ions-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/number_of_ions-field
/NXapm_paraprobe_tool_results/window/number_of_ions-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/number_of_ions-field
number_of_iterations
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/number_of_iterations-field
/NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_iterations-field
number_of_junctions
/NXmicrostructure/quadruple_junction/number_of_junctions-field
/NXmicrostructure/triple_junction/number_of_junctions-field
number_of_lenses
/NXxraylens/number_of_lenses-field
number_of_noise
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_noise-field
number_of_numeric_labels
/NXsimilarity_grouping/number_of_numeric_labels-field
number_of_objects
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/number_of_objects-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/number_of_objects-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/number_of_objects-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/number_of_objects-field
/NXcs_filter_boolean_mask/number_of_objects-field
number_of_outputs
/NXcircuit/number_of_outputs-field
number_of_phases
/NXmicrostructure/crystal/number_of_phases-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_phases-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field
number_of_planes
/NXcrystal_structure/number_of_planes-field
number_of_processes
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_processes-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_processes-field
/NXcs_profiling/number_of_processes-field
/NXcs_profiling_event/number_of_processes-field
number_of_scan_points
/NXcrystal_structure/number_of_scan_points-field
/NXem/ENTRY/roiID/ebsd/indexing/number_of_scan_points-field
/NXem/ENTRY/roiID/ebsd/indexing/phaseID/number_of_scan_points-field
/NXem_ebsd/indexing/number_of_scan_points-field
number_of_solutions
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/number_of_solutions-field
number_of_subgrains
/NXmicrostructure_imm_config/ENTRY/roi/number_of_subgrains-field
number_of_sweeps
/NXbias_spectroscopy/number_of_sweeps-field
/NXiv_bias/number_of_sweeps-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/number_of_sweeps-field
/NXsts/ENTRY/resolution_indicators/number_of_sweeps-field
number_of_targets
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_targets-field
number_of_tasks
/NXapm_paraprobe_clusterer_config/ENTRY/number_of_tasks-field
/NXapm_paraprobe_intersector_config/ENTRY/number_of_tasks-field
/NXapm_paraprobe_spatstat_config/ENTRY/number_of_tasks-field
number_of_threads
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_threads-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_threads-field
/NXcs_profiling/number_of_threads-field
/NXcs_profiling_event/number_of_threads-field
number_of_total_vertices
/NXcg_polygon_set/number_of_total_vertices-field
/NXcg_polyline_set/number_of_total_vertices-field
number_of_triangle_sets
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/number_of_triangle_sets-field
number_of_triangles
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/number_of_triangles-field
number_of_unique_vertices
/NXcg_polyline_set/number_of_unique_vertices-field
/NXcg_triangle_set/number_of_unique_vertices-field
number_of_vertices
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_vertices-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_vertices-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_vertices-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_vertices-field
/NXcg_face_list_data_structure/number_of_vertices-field
/NXcg_half_edge_data_structure/number_of_vertices-field
/NXcg_polyline_set/number_of_vertices-field
number_sections
/NXguide/number_sections-field
numerical_aperture
/NXfiber/numerical_aperture-field
/NXlens_opt/numerical_aperture-field
numerical_label
/NXsimilarity_grouping/numerical_label-field
numerical_labels
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/numerical_labels-field
numerics
/NXmicrostructure_gragles_config/ENTRY/numerics-group
/NXmicrostructure_mtex_config/numerics-group
/NXmicrostructure_score_config/ENTRY/numerics-group
nxspe_info
/NXspe/ENTRY/NXSPE_info-group
obb
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb-group
objectid
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID-group
observed_frame
/NXreflections/observed_frame-field
observed_frame_errors
/NXreflections/observed_frame_errors-field
observed_frame_var
/NXreflections/observed_frame_var-field
observed_phi
/NXreflections/observed_phi-field
observed_phi_errors
/NXreflections/observed_phi_errors-field
observed_phi_var
/NXreflections/observed_phi_var-field
observed_px_x
/NXreflections/observed_px_x-field
observed_px_x_errors
/NXreflections/observed_px_x_errors-field
observed_px_x_var
/NXreflections/observed_px_x_var-field
observed_px_y
/NXreflections/observed_px_y-field
observed_px_y_errors
/NXreflections/observed_px_y_errors-field
observed_px_y_var
/NXreflections/observed_px_y_var-field
observed_x
/NXreflections/observed_x-field
observed_x_errors
/NXreflections/observed_x_errors-field
observed_x_var
/NXreflections/observed_x_var-field
observed_y
/NXreflections/observed_y-field
observed_y_errors
/NXreflections/observed_y_errors-field
observed_y_var
/NXreflections/observed_y_var-field
odd_layer_density
/NXmirror/odd_layer_density-field
odd_layer_material
/NXmirror/odd_layer_material-field
odf
/NXmicrostructure_mtex_config/path/odf-field
off_geometry
/NXbeam_stop/OFF_GEOMETRY-group
/NXbending_magnet/OFF_GEOMETRY-group
/NXcollimator/OFF_GEOMETRY-group
/NXcrystal/OFF_GEOMETRY-group
/NXdisk_chopper/OFF_GEOMETRY-group
/NXfermi_chopper/OFF_GEOMETRY-group
/NXfilter/OFF_GEOMETRY-group
/NXgrating/OFF_GEOMETRY-group
/NXguide/OFF_GEOMETRY-group
/NXinsertion_device/OFF_GEOMETRY-group
/NXmirror/OFF_GEOMETRY-group
/NXmoderator/OFF_GEOMETRY-group
/NXmonitor/OFF_GEOMETRY-group
/NXmonochromator/OFF_GEOMETRY-group
/NXsample/OFF_GEOMETRY-group
/NXsensor/OFF_GEOMETRY-group
/NXsensor_sts/OFF_GEOMETRY-group
/NXsolid_geometry/OFF_GEOMETRY-group
/NXsource/OFF_GEOMETRY-group
/NXvelocity_selector/OFF_GEOMETRY-group
/NXxraylens/OFF_GEOMETRY-group
offset
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/offset-field
/NXcalibration/offset-field
/NXcg_alpha_complex/offset-field
/NXcircuit/offset-field
/NXdata/offset-field
/NXiv_bias/offset-field
/NXmpes/ENTRY/PROCESS_MPES/energy_referencing/offset-field
/NXprocess_mpes/energy_referencing/offset-field
offset_azimuth
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth-field
offset_polar
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar-field
offset_tilt
/NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt-field
offset_values
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/offset_values-field
offset_x
/NXdeflector/offset_x-field
offset_y
/NXdeflector/offset_y-field
omega
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/omega-field
/NXxrd_pan/ENTRY/experiment_config/omega-group
/NXxrd_pan/ENTRY/experiment_result/omega-field
oned_profile
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile-group
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile-group
open_gl_bug
/NXmicrostructure_mtex_config/system/open_gl_bug-field
openloop_amplification
/NXamplifier/openloop_amplification-field
operating_system
/NXcs_computer/operating_system-field
operation
/NXcsg/operation-field
operation_mode
/NXapm/ENTRY/operation_mode-field
/NXebeam_column/operation_mode-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/operation_mode-field
operator
/NXtransmission/ENTRY/operator-group
opt_window
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/OPT_WINDOW-group
optical_loss
/NXbeam_splitter/optical_loss-field
optical_system_em
/NXem_msr/em_lab/OPTICAL_SYSTEM_EM-group
/NXevent_data_em/em_lab/OPTICAL_SYSTEM_EM-group
orcid
/NXsensor_scan/ENTRY/USER/orcid-field
order_no
/NXcrystal/order_no-field
orientation
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/orientation-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/orientation-field
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/orientation-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/orientation-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/orientation-field
/NXcg_primitive_set/orientation-field
/NXcg_unit_normal_set/orientation-field
/NXcontainer/orientation-group
/NXgeometry/ORIENTATION-group
/NXmicrostructure_score_config/ENTRY/nucleation/orientation-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle
/NXbeam_path/window_NUMBER/orientation_angle-field
/NXopt_window/ENTRY/orientation_angle-field
orientation_distribution
/NXmicrostructure_imm_config/ENTRY/orientation_distribution-group
orientation_euler
/NXrotation_set/orientation_euler-field
orientation_matrix
/NXcrystal/orientation_matrix-field
/NXfilter/orientation_matrix-field
/NXlauetof/entry/sample/orientation_matrix-field
/NXsample/orientation_matrix-field
/NXsample_component/orientation_matrix-field
/NXsingle_crystal/orientation_matrix-field
/NXtas/entry/SAMPLE/orientation_matrix-field
/NXxbase/entry/sample/orientation_matrix-field
orientation_quaternion
/NXrotation_set/orientation_quaternion-field
orientation_spread
/NXmicrostructure/crystal/orientation_spread-field
origin
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/origin-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/origin-field
/NXcg_grid/origin-field
/NXcoordinate_system/origin-field
/NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/origin-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/origin-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/origin-field
/NXem_ebsd/gnomonic_reference_frame/origin-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/origin-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
/NXmicrostructure_score_results/ENTRY/discretization/grid/origin-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin-group
/NXxps/ENTRY/geometries/xps_coordinate_system/origin-field
original_axis
/NXcalibration/original_axis-field
original_centre
/NXdistortion/original_centre-field
original_points
/NXdistortion/original_points-field
other_material
/NXbeam_path/window_NUMBER/other_material-field
other_shape
/NXbeam_splitter/SHAPE/other_shape-field
/NXpolarizer_opt/SHAPE/other_shape-field
other_type
/NXbeam_splitter/other_type-field
/NXlens_opt/other_type-field
/NXwaveplate/other_type-field
outer_diameter
/NXfresnel_zone_plate/outer_diameter-field
outer_plot_spacing
/NXmicrostructure_mtex_config/plotting/outer_plot_spacing-field
outermost_zone_width
/NXfresnel_zone_plate/outermost_zone_width-field
output
/NXactuator/OUTPUT-field
/NXiqproc/ENTRY/reduction/output-group
/NXsqom/ENTRY/reduction/output-group
output_cabling
/NXsts/ENTRY/INSTRUMENT/output_cabling-group
output_grid
/NXmicrostructure_ipf/output_grid-group
output_log
/NXactuator/OUTPUT_log-group
output_mode
/NXcircuit/output_mode-field
output_name
/NXcircuit/output_name-field
output_slew_rate
/NXcircuit/output_slew_rate-field
output_value
/NXcircuit/output_value-field
overlaps
/NXreflections/overlaps-field
p_gain
/NXpositioner_sts/p_gain-field
packing_fraction
/NXcontainer/packing_fraction-field
pair_separation
/NXdisk_chopper/pair_separation-field
parallelogramid
/NXcg_parallelogram_set/parallelogramID-group
parallelograms
/NXcg_parallelogram_set/parallelograms-group
parameter
/NXapm/ENTRY/atom_probe/reconstruction/parameter-field
/NXapm_reconstruction/parameter-field
/NXem_ebsd/indexing/parameter-group
parameter_reliability
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/parameter_reliability-field
parameter_units
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER/parameter_units-field
/NXdispersion_repeated_parameter/parameter_units-field
parameters
/NXentry/PARAMETERS-group
/NXquadric/parameters-field
/NXsubentry/PARAMETERS-group
/NXtomoproc/entry/reconstruction/parameters-group
/NXxasproc/ENTRY/XAS_data_reduction/parameters-group
paraprobe
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe-group
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe-group
parent
/NXregion/parent-field
parent_identifier
/NXapm/ENTRY/specimen/parent_identifier-group
/NXem/ENTRY/sample/parent_identifier-group
parent_mask
/NXregion/parent_mask-field
partiality
/NXreflections/partiality-field
pass_energy
/NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field
/NXenergydispersion/pass_energy-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
patch_filter
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter-group
patch_identifier
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_identifier-field
path
/NXapm/ENTRY/atom_probe/hit_finding/serialized/path-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/path-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/path-field
/NXapm/ENTRY/atom_probe/ranging/definitions/path-field
/NXapm/ENTRY/atom_probe/raw_data/serialized/path-field
/NXapm/ENTRY/atom_probe/reconstruction/config/path-field
/NXapm/ENTRY/atom_probe/reconstruction/results/path-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/path-field
/NXapm/ENTRY/serializedID/path-field
/NXapm_compositionspace_config/ENTRY/config/ranging/path-field
/NXapm_compositionspace_config/ENTRY/config/reconstruction/path-field
/NXapm_compositionspace_results/ENTRY/config/path-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/path-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/path-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/path-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/path-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/path-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/path-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/path-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/path-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/path-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/path-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/path-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/path-field
/NXapm_paraprobe_intersector_results/ENTRY/common/config/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/path-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/path-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/config/path-field
/NXapm_paraprobe_ranger_config/ENTRY/range/ranging/path-field
/NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/path-field
/NXapm_paraprobe_ranger_results/ENTRY/common/config/path-field
/NXapm_paraprobe_selector_config/ENTRY/select/ranging/path-field
/NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/path-field
/NXapm_paraprobe_selector_results/ENTRY/common/config/path-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/path-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/path-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/path-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/path-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/config/path-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/path-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/path-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/config/path-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/path-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/path-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/path-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/config/path-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/path-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/path-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/path-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/config/path-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/path-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/path-field
/NXem/ENTRY/roiID/ebsd/indexing/source/path-field
/NXem/ENTRY/roiID/ebsd/measurement/source/path-field
/NXem/ENTRY/roiID/ebsd/simulation/source/path-field
/NXem/ENTRY/serializedID/path-field
/NXem_calorimetry/ENTRY/actuator/path-field
/NXem_calorimetry/ENTRY/diffraction/path-field
/NXmicrostructure_gragles_config/ENTRY/discretization/grid/path-field
/NXmicrostructure_mtex_config/path-group
/NXmicrostructure_score_config/ENTRY/deformation/ebsd/path-field
/NXserialized/path-field
path_length
/NXsample/path_length-field
path_length_window
/NXsample/path_length_window-field
pattern_center
/NXem_calorimetry/ENTRY/pattern_center-group
pattern_centre
/NXem/ENTRY/roiID/ebsd/pattern_centre-group
/NXem_ebsd/pattern_centre-group
pattern_identifier
/NXem_calorimetry/ENTRY/time_synchronization/pattern_identifier-field
pca
/NXapm_compositionspace_config/ENTRY/config/segmentation/pca-group
/NXapm_compositionspace_results/ENTRY/segmentation/pca-group
peak
/NXapm_ranging/peak_search_and_deconvolution/PEAK-group
/NXem_eds/indexing/PEAK-group
/NXem_eels/indexing/PEAK-group
peak_identification
/NXapm/ENTRY/atom_probe/ranging/peak_identification-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification-group
/NXapm_ranging/peak_identification-group
peak_power
/NXbeam_path/SOURCE/peak_power-field
/NXsource/peak_power-field
peak_search
/NXapm/ENTRY/atom_probe/ranging/peak_search-group
peak_search_and_deconvolution
/NXapm_ranging/peak_search_and_deconvolution-group
peakid
/NXapm/ENTRY/atom_probe/ranging/peak_search/peakID-group
peakpeak
/NXfit/peakPEAK-group
/NXxps/ENTRY/FIT/peakPEAK-group
peaks
/NXem_eds/indexing/IMAGE_SET/PROCESS/peaks-field
period
/NXgrating/period-field
/NXsource/period-field
pf
/NXmicrostructure_mtex_config/path/pf-field
/NXmicrostructure_pf/pf-group
pf_anno_fun_hdl
/NXmicrostructure_mtex_config/plotting/pf_anno_fun_hdl-field
pf_extensions
/NXmicrostructure_mtex_config/path/pf_extensions-field
phase
/NXdisk_chopper/phase-field
/NXinsertion_device/phase-field
phase_identifier
/NXcrystal_structure/phase_identifier-field
/NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_identifier-field
/NXem_ebsd/indexing/phase_identifier-field
/NXmicrostructure/crystal/phase_identifier-field
/NXmicrostructure/interface/phase_identifier-field
/NXmicrostructure/quadruple_junction/phase_identifier-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/phase_identifier-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field
/NXunit_cell/phase_identifier-field
phase_identifier_offset
/NXmicrostructure/crystal/phase_identifier_offset-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field
phase_matching
/NXem_ebsd/indexing/phase_matching-field
phase_matching_descriptor
/NXem_ebsd/indexing/phase_matching_descriptor-field
phase_name
/NXcrystal_structure/phase_name-field
/NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_name-field
/NXunit_cell/phase_name-field
phaseid
/NXem/ENTRY/roiID/ebsd/indexing/phaseID-group
/NXem_ebsd/indexing/phaseID-group
phaseplateid
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/phaseplateID-group
phi
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/phi-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/phi-field
/NXxeuler/entry/name/phi-link
/NXxeuler/entry/sample/phi-field
/NXxkappa/entry/name/phi-link
/NXxkappa/entry/sample/phi-field
/NXxrd_pan/ENTRY/experiment_result/phi-field
phi_two_plot
/NXmicrostructure_odf/phi_two_plot-group
physical_form
/NXmpes/ENTRY/SAMPLE/physical_form-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/physical_form-field
/NXsample/physical_form-field
physical_process
/NXhistory/PHYSICAL_PROCESS-group
physical_quantity
/NXactuator/physical_quantity-field
/NXcalibration/physical_quantity-field
/NXelectronanalyser/angular_resolution/physical_quantity-field
/NXelectronanalyser/energy_resolution/physical_quantity-field
/NXelectronanalyser/momentum_resolution/physical_quantity-field
/NXelectronanalyser/spatial_resolution/physical_quantity-field
/NXmanipulator/cryostat/physical_quantity-field
/NXmanipulator/sample_bias_potentiostat/physical_quantity-field
/NXmanipulator/sample_heater/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution/physical_quantity-field
/NXmpes/ENTRY/INSTRUMENT/flood_gun/physical_quantity-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/physical_quantity-field
/NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/physical_quantity-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/physical_quantity-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/physical_quantity-field
/NXprocess_mpes/angularN_calibration/physical_quantity-field
/NXprocess_mpes/delay_calibration/physical_quantity-field
/NXprocess_mpes/ellipticity_calibration/physical_quantity-field
/NXprocess_mpes/energy_calibration/physical_quantity-field
/NXprocess_mpes/energy_referencing/physical_quantity-field
/NXprocess_mpes/kN_calibration/physical_quantity-field
/NXprocess_mpes/polarization_angle_calibration/physical_quantity-field
/NXprocess_mpes/spatialN_calibration/physical_quantity-field
/NXresolution/physical_quantity-field
pid
/NXactuator/PID-group
/NXmanipulator/cryostat/PID-group
/NXmanipulator/sample_bias_potentiostat/PID-group
/NXmanipulator/sample_heater/PID-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
piezo_calibration
/NXpositioner_sts/piezo_calibration-field
piezo_config
/NXsts/ENTRY/INSTRUMENT/piezo_config-group
pinhole
/NXbeam_path/PINHOLE-group
pinhole_position
/NXpulser_apm/SOURCE/BEAM/pinhole_position-field
pitch
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field
/NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id
/NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field
/NXsnshisto/ENTRY/DATA/pixel_id-link
/NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask
/NXdetector/pixel_mask-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied
/NXdetector/pixel_mask_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_time
/NXscanbox_em/pixel_time-field
pixel_x
/NXdata_mpes_detector/pixel_x-field
pixel_y
/NXdata_mpes_detector/pixel_y-field
pixels_line
/NXpositioner_sts/pixels_line-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/pixels_line-field
plot
/NXdispersive_material/ENTRY/dispersion_x/plot-group
/NXdispersive_material/ENTRY/dispersion_y/plot-group
/NXdispersive_material/ENTRY/dispersion_z/plot-group
plotting
/NXmicrostructure_mtex_config/plotting-group
point_group
/NXcrystal_structure/point_group-field
/NXsample/point_group-field
/NXsample_component/point_group-field
/NXunit_cell/point_group-field
point_identifier
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/point_identifier-field
point_normal_form
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface/point_normal_form-field
point_set_wrapping
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping-group
point_setid
/NXcg_alpha_complex/point_setID-group
point_to_triangle
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle-group
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle-group
poison_depth
/NXmoderator/poison_depth-field
poison_material
/NXmoderator/poison_material-field
polar
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar-field
/NXspe/ENTRY/data/polar-field
polar_angle
/NXcrystal/polar_angle-field
/NXdetector/polar_angle-field
/NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
/NXlauetof/entry/instrument/detector/polar_angle-field
/NXmonopd/entry/DATA/polar_angle-link
/NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXreflections/polar_angle-field
/NXrefscan/entry/data/polar_angle-link
/NXrefscan/entry/instrument/DETECTOR/polar_angle-field
/NXreftof/entry/instrument/detector/polar_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
/NXsastof/ENTRY/instrument/detector/polar_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/analyser/polar_angle-field
/NXtas/entry/SAMPLE/polar_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field
/NXtofraw/entry/instrument/detector/polar_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field
/NXxeuler/entry/instrument/detector/polar_angle-field
/NXxeuler/entry/name/polar_angle-link
/NXxkappa/entry/instrument/detector/polar_angle-field
/NXxkappa/entry/name/polar_angle-link
/NXxnb/entry/instrument/detector/polar_angle-field
/NXxnb/entry/name/polar_angle-link
/NXxrd/ENTRY/DATA/polar_angle-field
/NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
/NXxrot/entry/instrument/detector/polar_angle-field
polar_width
/NXspe/ENTRY/data/polar_width-field
polarization_angle
/NXdata_mpes/polarization_angle-field
/NXdata_mpes_detector/polarization_angle-field
polarization_angle_calibration
/NXmpes/ENTRY/PROCESS_MPES/polarization_angle_calibration-group
/NXprocess_mpes/polarization_angle_calibration-group
polarizer
/NXinstrument/POLARIZER-group
/NXsnsevent/ENTRY/instrument/POLARIZER-group
/NXsnshisto/ENTRY/instrument/POLARIZER-group
/NXtransmission/ENTRY/instrument/polarizer-field
polarizer_angle
/NXpolarizer_opt/polarizer_angle-field
polarizer_opt
/NXbeam_path/POLARIZER_OPT-group
polarizing
/NXbeam_splitter/polarizing-field
poles
/NXinsertion_device/poles-field
polfilter_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE-group
polygon_half_edgeid
/NXcg_polygon_set/polygon_half_edgeID-group
polygonid
/NXcg_polygon_set/polygonID-group
polygons
/NXcg_polygon_set/polygons-group
polyhedra
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra-group
/NXcg_polyhedron_set/polyhedra-group
polyhedron
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron-group
polyhedron_half_edgeid
/NXcg_polyhedron_set/polyhedron_half_edgeID-group
polyhedron_set
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/polyhedron_set-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/polyhedron_set-group
polyhedronid
/NXcg_polyhedron_set/polyhedronID-group
polyline_identifier
/NXmicrostructure/triple_junction/polyline_identifier-field
polylines
/NXcg_polyline_set/polylines-field
position
/NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/position-field
/NXapm_compositionspace_config/ENTRY/config/reconstruction/position-field
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/position-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/position-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/position-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/position-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/position-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/position-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/position-field
/NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/position-field
/NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/position-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/position-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/position-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/position-field
/NXapm_paraprobe_tool_config/reconstruction/position-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/position-field
/NXcg_grid/position-field
/NXcg_half_edge_data_structure/position-field
/NXcg_point_set/position-field
/NXem_calorimetry/ENTRY/pattern_center/result/position-field
/NXenvironment/position-group
/NXfit_background/data/position-field
/NXmicrostructure/quadruple_junction/position-field
/NXmicrostructure/triple_junction/position-field
/NXpeak/data/position-field
/NXpositioner_sts/position-group
/NXstage_lab/position-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position-group
/NXxps/ENTRY/FIT/backgroundBACKGROUND/data/position-field
/NXxps/ENTRY/FIT/peakPEAK/data/position-field
/NXxps/ENTRY/FIT/peakPEAK/function/position-group
position_x
/NXxpcs/entry/sample/position_x-group
position_y
/NXxpcs/entry/sample/position_y-group
position_z
/NXxpcs/entry/sample/position_z-group
positioner
/NXaperture/POSITIONER-group
/NXinstrument/POSITIONER-group
/NXmanipulator/POSITIONER-group
/NXsample/POSITIONER-group
/NXsnsevent/ENTRY/DASlogs/POSITIONER-group
/NXsnshisto/ENTRY/DASlogs/POSITIONER-group
/NXstage_lab/POSITIONER-group
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner-group
potentiostat
/NXmpes/ENTRY/SAMPLE/bias_env/potentiostat-group
power
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/power-field
/NXinsertion_device/power-field
/NXpulser_apm/SOURCE/power-field
/NXsource/power-field
/NXxps/ENTRY/INSTRUMENT/sourceTYPE/power-field
power_loss
/NXfiber/power_loss-field
power_spectral_density
/NXsensor_sts/power_spectral_density-field
pre_factor
/NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/pre_factor-field
pre_sample_flightpath
/NXentry/pre_sample_flightpath-field
/NXsubentry/pre_sample_flightpath-field
/NXtofnpd/entry/pre_sample_flightpath-field
/NXtofraw/entry/pre_sample_flightpath-field
/NXtofsingle/entry/pre_sample_flightpath-field
predicted_frame
/NXreflections/predicted_frame-field
predicted_phi
/NXreflections/predicted_phi-field
predicted_px_x
/NXreflections/predicted_px_x-field
predicted_px_y
/NXreflections/predicted_px_y-field
predicted_x
/NXreflections/predicted_x-field
predicted_y
/NXreflections/predicted_y-field
preparation_date
/NXapm/ENTRY/specimen/preparation_date-field
/NXarchive/entry/sample/preparation_date-field
/NXem/ENTRY/sample/preparation_date-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/preparation_date-field
/NXsample/preparation_date-field
preprocessing
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing-group
preset
/NXfluo/entry/MONITOR/preset-field
/NXlauetof/entry/control/preset-field
/NXmonitor/preset-field
/NXmonopd/entry/MONITOR/preset-field
/NXrefscan/entry/control/preset-field
/NXreftof/entry/control/preset-field
/NXsas/ENTRY/MONITOR/preset-field
/NXsastof/ENTRY/control/preset-field
/NXtas/entry/MONITOR/preset-field
/NXtofnpd/entry/MONITOR/preset-field
/NXtofraw/entry/MONITOR/preset-field
/NXtofsingle/entry/MONITOR/preset-field
/NXxas/ENTRY/MONITOR/preset-field
/NXxbase/entry/control/preset-field
pressure
/NXarchive/entry/sample/pressure-field
/NXevent_data_apm/instrument/analysis_chamber/pressure-field
/NXevent_data_apm/instrument/buffer_chamber/pressure-field
/NXevent_data_apm/instrument/load_lock_chamber/pressure-field
/NXsample/pressure-field
/NXsensor_sts/pressure-field
pressure_gauge
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge-group
/NXmpes/ENTRY/SAMPLE/gas_pressure_env/pressure_gauge-group
previous_device
/NXbeam/previous_device-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE/previous_device-field
previous_devices
/NXbeam_device/previous_devices-field
previous_source
/NXsource/previous_source-field
prf_cc
/NXreflections/prf_cc-field
probability_mass
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/probability_mass-field
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/probability_mass-field
probe
/NXarchive/entry/instrument/SOURCE/probe-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field
/NXebeam_column/electron_source/probe-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/probe-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source/probe-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/probe-group
/NXfluo/entry/INSTRUMENT/SOURCE/probe-field
/NXibeam_column/ion_source/probe-group
/NXiqproc/ENTRY/instrument/SOURCE/probe-field
/NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/probe-field
/NXoptical_system_em/probe-group
/NXrefscan/entry/instrument/SOURCE/probe-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXsastof/ENTRY/instrument/source/probe-field
/NXsnsevent/ENTRY/instrument/SNS/probe-field
/NXsnshisto/ENTRY/instrument/SNS/probe-field
/NXsource/probe-field
/NXsqom/ENTRY/instrument/SOURCE/probe-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXtas/entry/INSTRUMENT/SOURCE/probe-field
/NXtomo/entry/instrument/SOURCE/probe-field
/NXtomophase/entry/instrument/SOURCE/probe-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXxbase/entry/instrument/source/probe-field
probe_current
/NXoptical_system_em/probe_current-field
procedure
/NXopt_window/ENTRY/window_correction/procedure-field
process
/NXcanSAS/ENTRY/PROCESS-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS-group
/NXem_correlation/PROCESS-group
/NXem_eds/indexing/IMAGE_SET/PROCESS-group
/NXem_method/PROCESS-group
/NXentry/PROCESS-group
/NXimage_set/PROCESS-group
/NXinteraction_vol_em/PROCESS-group
/NXroi/PROCESS-group
/NXsensor_scan/ENTRY/PROCESS-group
/NXspectrum_set/PROCESS-group
/NXsubentry/PROCESS-group
/NXxpcs/PROCESS-group
/NXxrd/ENTRY/PROCESS-group
process_identifier
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/process_identifier-field
process_mpes
/NXmpes/ENTRY/PROCESS_MPES-group
/NXxps/ENTRY/PROCESS_MPES-group
processing
/NXcs_computer/processing-group
processing_reference_frame
/NXcoordinate_system_set/processing_reference_frame-group
/NXem/ENTRY/coordinate_system_set/processing_reference_frame-group
profile
/NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
profiling
/NXapm/ENTRY/profiling-group
/NXapm_compositionspace_results/ENTRY/profiling-group
/NXapm_paraprobe_clusterer_config/ENTRY/common/profiling-group
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling-group
/NXapm_paraprobe_distancer_config/ENTRY/common/profiling-group
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling-group
/NXapm_paraprobe_intersector_config/ENTRY/common/profiling-group
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling-group
/NXapm_paraprobe_nanochem_config/ENTRY/common/profiling-group
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling-group
/NXapm_paraprobe_ranger_config/ENTRY/common/profiling-group
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling-group
/NXapm_paraprobe_selector_config/ENTRY/common/profiling-group
/NXapm_paraprobe_selector_results/ENTRY/common/profiling-group
/NXapm_paraprobe_spatstat_config/ENTRY/common/profiling-group
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling-group
/NXapm_paraprobe_surfacer_config/ENTRY/common/profiling-group
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling-group
/NXapm_paraprobe_tessellator_config/ENTRY/common/profiling-group
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling-group
/NXapm_paraprobe_tool_common/profiling-group
/NXapm_paraprobe_transcoder_config/ENTRY/common/profiling-group
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling-group
/NXem/ENTRY/profiling-group
/NXem_calorimetry/ENTRY/profiling-group
/NXmicrostructure_gragles_config/ENTRY/profiling-group
/NXmicrostructure_imm_results/ENTRY/profiling-group
/NXmicrostructure_kanapy_results/ENTRY/profiling-group
/NXmicrostructure_score_config/ENTRY/profiling-group
program
/NXapm/ENTRY/atom_probe/hit_finding/programID/program-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program-field
/NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program-field
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program-field
/NXapm/ENTRY/atom_probe/ranging/programID/program-field
/NXapm/ENTRY/atom_probe/raw_data/programID/program-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program-field
/NXapm/ENTRY/atom_probe/reconstruction/programID/program-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program-field
/NXapm/ENTRY/profiling/programID/program-field
/NXapm_compositionspace_results/ENTRY/programID/program-field
/NXapm_hit_finding/PROGRAM-group
/NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_distancer_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_distancer_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_intersector_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_intersector_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_ranger_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_ranger_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_selector_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_selector_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program-field
/NXapm_paraprobe_tool_common/PROGRAM-group
/NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program-field
/NXapm_ranging/PROGRAM-group
/NXapm_ranging/background_quantification/PROGRAM-group
/NXapm_ranging/mass_to_charge_distribution/PROGRAM-group
/NXapm_ranging/peak_identification/PROGRAM-group
/NXapm_ranging/peak_search_and_deconvolution/PROGRAM-group
/NXapm_reconstruction/PROGRAM-group
/NXapm_reconstruction/naive_discretization/PROGRAM-group
/NXapm_sim/PROGRAM-group
/NXapm_volt_and_bowl/PROGRAM-group
/NXarchive/entry/program-field
/NXcg_marching_cubes/PROGRAM-group
/NXcomponent/PROGRAM-group
/NXcs_prng/PROGRAM-group
/NXellipsometry/ENTRY/data_collection/data_software/program-field
/NXem/ENTRY/measurement/em_lab/control_programID/program-field
/NXem/ENTRY/profiling/programID/program-field
/NXem_calorimetry/ENTRY/azimuthal_integration/programID/program-field
/NXem_calorimetry/ENTRY/background_subtraction/programID/program-field
/NXem_calorimetry/ENTRY/distortion_correction/programID/program-field
/NXem_eds/indexing/PROGRAM-group
/NXem_eels/indexing/PROGRAM-group
/NXem_eels/zlp_correction/PROGRAM-group
/NXem_sim/simulation/PROGRAM-group
/NXenvironment/program-field
/NXimage_set/PROCESS/PROGRAM-group
/NXiqproc/ENTRY/reduction/program-field
/NXmicrostructure/configuration/PROGRAM-group
/NXmicrostructure_gragles_config/ENTRY/environment/programID/program-field
/NXmicrostructure_gragles_results/ENTRY/environment/programID/program-field
/NXmicrostructure_imm_results/ENTRY/environment/programID/program-field
/NXmicrostructure_imm_results/ENTRY/program1/program-field
/NXmicrostructure_kanapy_results/ENTRY/environment/programID/program-field
/NXmicrostructure_kanapy_results/ENTRY/program1/program-field
/NXmicrostructure_kanapy_results/ENTRY/program2/program-field
/NXmicrostructure_score_config/ENTRY/environment/programID/program-field
/NXmicrostructure_score_results/ENTRY/environment/programID/program-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program-field
/NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/program-field
/NXprocess/program-field
/NXprocess_mpes/program-field
/NXprogram/program-field
/NXsensor_scan/ENTRY/PROCESS/program-field
/NXspectrum_set/PROCESS/PROGRAM-group
/NXsqom/ENTRY/reduction/program-field
/NXtomoproc/entry/reconstruction/program-field
/NXxasproc/ENTRY/XAS_data_reduction/program-field
program1
/NXmicrostructure_gragles_config/ENTRY/program1-group
/NXmicrostructure_gragles_results/ENTRY/program1-group
/NXmicrostructure_imm_results/ENTRY/program1-group
/NXmicrostructure_kanapy_results/ENTRY/program1-group
/NXmicrostructure_score_config/ENTRY/program1-group
/NXmicrostructure_score_results/ENTRY/program1-group
program2
/NXmicrostructure_kanapy_results/ENTRY/program2-group
program_name
/NXentry/program_name-field
/NXmicrostructure_gragles_config/ENTRY/program1/program_name-field
/NXmicrostructure_gragles_results/ENTRY/program1/program_name-field
/NXmicrostructure_score_config/ENTRY/program1/program_name-field
/NXmicrostructure_score_results/ENTRY/program1/program_name-field
/NXspe/ENTRY/program_name-field
/NXsubentry/program_name-field
programid
/NXapm/ENTRY/atom_probe/hit_finding/programID-group
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID-group
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID-group
/NXapm/ENTRY/atom_probe/ranging/background_quantification/programID-group
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID-group
/NXapm/ENTRY/atom_probe/ranging/peak_identification/programID-group
/NXapm/ENTRY/atom_probe/ranging/peak_search/programID-group
/NXapm/ENTRY/atom_probe/ranging/programID-group
/NXapm/ENTRY/atom_probe/raw_data/programID-group
/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID-group
/NXapm/ENTRY/atom_probe/reconstruction/programID-group
/NXapm/ENTRY/atom_probe/voltage_and_bowl/programID-group
/NXapm/ENTRY/profiling/programID-group
/NXapm_compositionspace_results/ENTRY/programID-group
/NXapm_paraprobe_clusterer_config/ENTRY/common/programID-group
/NXapm_paraprobe_clusterer_results/ENTRY/common/programID-group
/NXapm_paraprobe_distancer_config/ENTRY/common/programID-group
/NXapm_paraprobe_distancer_results/ENTRY/common/programID-group
/NXapm_paraprobe_intersector_config/ENTRY/common/programID-group
/NXapm_paraprobe_intersector_results/ENTRY/common/programID-group
/NXapm_paraprobe_nanochem_config/ENTRY/common/programID-group
/NXapm_paraprobe_nanochem_results/ENTRY/common/programID-group
/NXapm_paraprobe_ranger_config/ENTRY/common/programID-group
/NXapm_paraprobe_ranger_results/ENTRY/common/programID-group
/NXapm_paraprobe_selector_config/ENTRY/common/programID-group
/NXapm_paraprobe_selector_results/ENTRY/common/programID-group
/NXapm_paraprobe_spatstat_config/ENTRY/common/programID-group
/NXapm_paraprobe_spatstat_results/ENTRY/common/programID-group
/NXapm_paraprobe_surfacer_config/ENTRY/common/programID-group
/NXapm_paraprobe_surfacer_results/ENTRY/common/programID-group
/NXapm_paraprobe_tessellator_config/ENTRY/common/programID-group
/NXapm_paraprobe_tessellator_results/ENTRY/common/programID-group
/NXapm_paraprobe_transcoder_config/ENTRY/common/programID-group
/NXapm_paraprobe_transcoder_results/ENTRY/common/programID-group
/NXem/ENTRY/profiling/programID-group
/NXem_calorimetry/ENTRY/azimuthal_integration/programID-group
/NXem_calorimetry/ENTRY/background_subtraction/programID-group
/NXem_calorimetry/ENTRY/distortion_correction/programID-group
/NXmicrostructure_gragles_config/ENTRY/environment/programID-group
/NXmicrostructure_gragles_results/ENTRY/environment/programID-group
/NXmicrostructure_imm_results/ENTRY/environment/programID-group
/NXmicrostructure_kanapy_results/ENTRY/environment/programID-group
/NXmicrostructure_score_config/ENTRY/environment/programID-group
/NXmicrostructure_score_results/ENTRY/environment/programID-group
projection
/NXcollectioncolumn/projection-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
projection_direction
/NXmicrostructure_ipf/projection_direction-field
protocol_name
/NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
/NXapm_reconstruction/protocol_name-field
proton_charge
/NXsnsevent/ENTRY/proton_charge-field
/NXsnshisto/ENTRY/proton_charge-field
psi
/NXspe/ENTRY/NXSPE_info/psi-field
pulse_delay
/NXbeam/pulse_delay-field
pulse_duration
/NXbeam/pulse_duration-field
pulse_energy
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy-field
/NXbeam/pulse_energy-field
/NXpulser_apm/SOURCE/pulse_energy-field
/NXsource/pulse_energy-field
pulse_fraction
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction-field
/NXpulser_apm/pulse_fraction-field
pulse_frequency
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency-field
/NXpulser_apm/pulse_frequency-field
pulse_height
/NXevent_data/pulse_height-field
pulse_identifier
/NXevent_data_apm/pulse_identifier-field
pulse_identifier_offset
/NXevent_data_apm/pulse_identifier_offset-field
pulse_mode
/NXapm/ENTRY/measurement/instrument/pulser/pulse_mode-field
/NXpulser_apm/pulse_mode-field
pulse_number
/NXpulser_apm/pulse_number-field
pulse_shape
/NXmoderator/pulse_shape-group
/NXsource/pulse_shape-group
pulse_time
/NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
/NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_voltage
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage-field
/NXpulser_apm/pulse_voltage-field
pulse_width
/NXsource/pulse_width-field
pulser
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser-group
/NXapm/ENTRY/measurement/instrument/pulser-group
/NXapm_msr/instrument/pulser-group
/NXevent_data_apm/instrument/pulser-group
pump
/NXem/ENTRY/measurement/em_lab/PUMP-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/PUMP-group
/NXem_msr/em_lab/PUMP-group
/NXevent_data_em/em_lab/PUMP-group
purpose
/NXbeam_device/purpose-field
pv_sensor
/NXpid/pv_sensor-group
q
/NXcanSAS/ENTRY/DATA/Q-field
/NXxrd_pan/ENTRY/q_data/q-field
q_data
/NXxrd_pan/ENTRY/q_data-group
q_norm
/NXxrd_pan/ENTRY/experiment_result/q_norm-field
q_parallel
/NXxrd_pan/ENTRY/experiment_result/q_parallel-field
/NXxrd_pan/ENTRY/q_data/q_parallel-field
q_perpendicular
/NXxrd_pan/ENTRY/experiment_result/q_perpendicular-field
/NXxrd_pan/ENTRY/q_data/q_perpendicular-field
qdev
/NXcanSAS/ENTRY/DATA/Qdev-field
qh
/NXtas/entry/DATA/qh-link
/NXtas/entry/SAMPLE/qh-field
qk
/NXtas/entry/DATA/qk-link
/NXtas/entry/SAMPLE/qk-field
ql
/NXtas/entry/DATA/ql-link
/NXtas/entry/SAMPLE/ql-field
qmean
/NXcanSAS/ENTRY/DATA/Qmean-field
quadric
/NXsolid_geometry/QUADRIC-group
quadruple_junction
/NXmicrostructure/quadruple_junction-group
qx
/NXiqproc/ENTRY/DATA/qx-field
/NXsqom/ENTRY/DATA/qx-field
qy
/NXiqproc/ENTRY/DATA/qy-field
/NXsqom/ENTRY/DATA/qy-field
qz
/NXsqom/ENTRY/DATA/qz-field
r_5
/NXcorrector_cs/tableauID/r_5-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5-group
r_slit
/NXfermi_chopper/r_slit-field
radiation
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radii
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/radii-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/radii-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/radii-field
/NXcg_cylinder_set/radii-field
/NXcg_sphere_set/radii-field
radius
/NXcg_cylinder_set/radius-field
/NXcg_sphere_set/radius-field
/NXdisk_chopper/radius-field
/NXenergydispersion/radius-field
/NXfermi_chopper/radius-field
/NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius-field
/NXvelocity_selector/radius-field
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/radius-field
raman_experiment_type
/NXraman/ENTRY/raman_experiment_type-field
raman_experiment_type_other
/NXraman/ENTRY/raman_experiment_type_other-field
random_forest_classifier
/NXapm_compositionspace_config/ENTRY/config/autophase/random_forest_classifier-group
random_number_generator
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator-group
randomize_iontypes
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/randomize_iontypes-field
range
/NXapm_paraprobe_ranger_config/ENTRY/range-group
/NXmonitor/range-field
ranging
/NXapm/ENTRY/atom_probe/ranging-group
/NXapm_compositionspace_config/ENTRY/config/ranging-group
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging-group
/NXapm_paraprobe_ranger_config/ENTRY/range/ranging-group
/NXapm_paraprobe_selector_config/ENTRY/select/ranging-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging-group
/NXapm_paraprobe_tool_config/ranging-group
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging-group
ranging_definitions
/NXapm_compositionspace_config/ENTRY/config/ranging/ranging_definitions-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/ranging_definitions-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/ranging_definitions-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/ranging_definitions-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/ranging_definitions-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/ranging_definitions-field
/NXapm_paraprobe_ranger_config/ENTRY/range/ranging/ranging_definitions-field
/NXapm_paraprobe_selector_config/ENTRY/select/ranging/ranging_definitions-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/ranging_definitions-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/ranging_definitions-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/ranging_definitions-field
/NXapm_paraprobe_tool_config/ranging/ranging_definitions-field
ratio
/NXdisk_chopper/ratio-field
ratio_k_alphatwo_k_alphaone
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/ratio_k_alphatwo_k_alphaone-field
raw
/NXdata_mpes_detector/raw-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data/raw-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data/raw-field
raw_data
/NXapm/ENTRY/atom_probe/raw_data-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data-group
/NXxrd/ENTRY/INSTRUMENT/DETECTOR/raw_data-group
raw_file
/NXtomoproc/entry/reconstruction/parameters/raw_file-field
/NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames
/NXsnsevent/ENTRY/raw_frames-field
/NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight
/NXdetector/raw_time_of_flight-field
raw_tof
/NXapm/ENTRY/atom_probe/voltage_and_bowl/raw_tof-field
/NXapm_volt_and_bowl/raw_tof-field
raw_value
/NXlog/raw_value-field
/NXpositioner/raw_value-field
/NXpositioner_sts/raw_value-field
rdeform_field
/NXdistortion/rdeform_field-field
rdf
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf-group
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf-group
read_bfield_current
/NXseparator/read_Bfield_current-group
/NXspin_rotator/read_Bfield_current-group
read_bfield_voltage
/NXseparator/read_Bfield_voltage-group
/NXspin_rotator/read_Bfield_voltage-group
read_current
/NXelectrostatic_kicker/read_current-group
/NXmagnetic_kicker/read_current-group
/NXquadrupole_magnet/read_current-group
/NXsolenoid_magnet/read_current-group
read_efield_current
/NXseparator/read_Efield_current-group
/NXspin_rotator/read_Efield_current-group
read_efield_voltage
/NXseparator/read_Efield_voltage-group
/NXspin_rotator/read_Efield_voltage-group
read_voltage
/NXelectrostatic_kicker/read_voltage-group
/NXmagnetic_kicker/read_voltage-group
/NXquadrupole_magnet/read_voltage-group
/NXsolenoid_magnet/read_voltage-group
real
/NXapm/ENTRY/atom_probe/initial_specimen/image_2d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/real-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/real-field
/NXimage_set/image_1d/real-field
/NXimage_set/image_2d/real-field
/NXimage_set/image_3d/real-field
/NXimage_set/stack_1d/real-field
/NXimage_set/stack_2d/real-field
/NXimage_set/stack_3d/real-field
real_time
/NXdetector/real_time-field
realloc_cell_cache
/NXmicrostructure_score_config/ENTRY/numerics/realloc_cell_cache-field
reconstructed_positions
/NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
/NXapm_reconstruction/reconstructed_positions-field
reconstruction
/NXapm/ENTRY/atom_probe/reconstruction-group
/NXapm_compositionspace_config/ENTRY/config/reconstruction-group
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction-group
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction-group
/NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction-group
/NXapm_paraprobe_selector_config/ENTRY/select/reconstruction-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction-group
/NXapm_paraprobe_tool_config/reconstruction-group
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction-group
/NXtomoproc/entry/reconstruction-group
record_final_z
/NXbias_spectroscopy/record_final_z-field
/NXiv_bias/record_final_z-field
recover_evaporation_id
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/recover_evaporation_id-field
recrystallization_front
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front-group
recrystallized_grain_identifier
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/recrystallized_grain_identifier-field
recrystallized_volume_fraction
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/recrystallized_volume_fraction-field
rediscretization
/NXmicrostructure_score_config/ENTRY/solitary_unit/rediscretization-field
reduction
/NXiqproc/ENTRY/reduction-group
/NXsqom/ENTRY/reduction-group
ref_attenuator
/NXtransmission/ENTRY/instrument/ref_attenuator-group
ref_phase_n
/NXlockin/ref_phase_N-field
/NXsts/ENTRY/INSTRUMENT/lock_in/ref_phase_N-field
reference
/NXcrystal_structure/reference-group
/NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/reference-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/reference-field
reference_burgers_magnitude
/NXmicrostructure_score_config/ENTRY/material_properties/reference_burgers_magnitude-field
reference_data_link
/NXbeam_path/window_NUMBER/reference_data_link-field
/NXellipsometry/ENTRY/data_collection/reference_data_link-field
/NXopt_window/ENTRY/window_correction/reference_data_link-field
reference_frames
/NXoptical_spectroscopy/ENTRY/reference_frames-group
reference_measurement
/NXcontainer/reference_measurement-link
reference_peak
/NXmpes/ENTRY/PROCESS_MPES/energy_referencing/reference_peak-field
/NXprocess_mpes/energy_referencing/reference_peak-field
reference_plane
/NXbeam/TRANSFORMATIONS/reference_plane-field
reference_shear_modulus
/NXmicrostructure_score_config/ENTRY/material_properties/reference_shear_modulus-field
references
/NXdispersive_material/ENTRY/REFERENCES-group
reflectance
/NXbeam_splitter/reflectance-field
/NXlens_opt/reflectance-field
/NXwaveplate/reflectance-field
reflection
/NXcrystal/reflection-field
/NXpolarizer/reflection-field
/NXpolarizer_opt/reflection-field
reflection_id
/NXreflections/reflection_id-field
reflectivity
/NXcrystal/reflectivity-group
/NXguide/reflectivity-group
/NXmirror/reflectivity-group
/NXoptical_spectroscopy/ENTRY/derived_parameters/reflectivity-field
reflectron
/NXapm/ENTRY/measurement/instrument/reflectron-group
/NXapm_msr/instrument/REFLECTRON-group
/NXevent_data_apm/instrument/REFLECTRON-group
refractive_index
/NXdispersion_table/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/refractive_index-field
region_origin
/NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size
/NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
registration
/NXprocess/REGISTRATION-group
/NXprocess_mpes/REGISTRATION-group
regularize_alpha_complex
/NXcg_alpha_complex/regularize_alpha_complex-field
relation
/NXgraph_root/relation-group
relative_area
/NXfit/peakPEAK/relative_area-field
relative_atomic_concentration
/NXxps/ENTRY/FIT/peakPEAK/relative_atomic_concentration-field
relative_intensity
/NXcrystal_structure/relative_intensity-field
/NXelectronanalyser/transmission_function/relative_intensity-field
/NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/relative_intensity-field
/NXprocess_mpes/transmission_correction/transmission_function/relative_intensity-field
relative_mobility
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/relative_mobility-field
relative_molecular_mass
/NXcontainer/relative_molecular_mass-field
/NXsample/relative_molecular_mass-field
/NXsample_component/relative_molecular_mass-field
relative_resolution
/NXelectronanalyser/energy_resolution/relative_resolution-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution/relative_resolution-field
/NXresolution/relative_resolution-field
relative_resolution_errors
/NXresolution/relative_resolution_errors-field
relative_sensitivity_factor
/NXfit/peakPEAK/relative_sensitivity_factor-field
release_date
/NXarchive/entry/release_date-field
removal
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
representation
/NXdispersion_function/representation-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/representation-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/representation-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/representation-field
/NXmicrostructure/crystal/representation-field
/NXmicrostructure/interface/representation-field
/NXmicrostructure/quadruple_junction/representation-field
/NXmicrostructure/triple_junction/representation-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/representation-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field
reproducibility_indicators
/NXsts/ENTRY/reproducibility_indicators-group
requested_pixel_time
/NXscanbox_em/requested_pixel_time-field
reset_bias
/NXbias_spectroscopy/reset_bias-field
/NXiv_bias/reset_bias-field
residual
/NXfit/data/residual-field
/NXxps/ENTRY/FIT/data/residual-field
resolution
/NXelectronanalyser/RESOLUTION-group
/NXelectronanalyser/angular_resolution/resolution-field
/NXelectronanalyser/energy_resolution/resolution-field
/NXelectronanalyser/momentum_resolution/resolution-field
/NXelectronanalyser/spatial_resolution/resolution-field
/NXinstrument/RESOLUTION-group
/NXmicrostructure_odf/configuration/resolution-field
/NXmicrostructure_odf/sampling/resolution-field
/NXmicrostructure_pf/configuration/resolution-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/resolution-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution/resolution-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/resolution-field
/NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/resolution-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/resolution-field
/NXresolution/resolution-field
resolution_errors
/NXelectronanalyser/angular_resolution/resolution_errors-field
/NXelectronanalyser/energy_resolution/resolution_errors-field
/NXelectronanalyser/momentum_resolution/resolution_errors-field
/NXelectronanalyser/spatial_resolution/resolution_errors-field
/NXresolution/resolution_errors-field
resolution_formula
/NXresolution/resolution_formula-field
resolution_indicators
/NXsts/ENTRY/resolution_indicators-group
response_function
/NXresolution/response_function-group
response_time
/NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
result
/NXapm_compositionspace_results/ENTRY/autophase/result-group
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result-group
/NXapm_compositionspace_results/ENTRY/segmentation/pca/result-group
/NXem_calorimetry/ENTRY/azimuthal_integration/result-group
/NXem_calorimetry/ENTRY/background_subtraction/result-group
/NXem_calorimetry/ENTRY/distortion_correction/result-group
/NXem_calorimetry/ENTRY/pattern_center/result-group
results
/NXapm/ENTRY/atom_probe/reconstruction/results-group
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/results-field
retardance
/NXwaveplate/retardance-field
retardance_distribution
/NXwaveplate/retardance_distribution-group
revision
/NXarchive/entry/revision-field
/NXentry/revision-field
/NXsubentry/revision-field
revolutions
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element/revolutions-field
roi
/NXapm_paraprobe_selector_results/ENTRY/roi-group
/NXem/ENTRY/roiID/ebsd/indexing/roi-group
/NXem_correlation/indexing/roi-group
/NXem_ebsd/indexing/roi-group
/NXmicrostructure_imm_config/ENTRY/roi-group
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/roi-group
roi_cylinder_height
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_height-field
roi_cylinder_radius
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_radius-field
roi_orientation
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_orientation-field
roiid
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID-group
/NXem/ENTRY/roiID-group
rois_far_from_edge
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge-group
role
/NXarchive/entry/user/role-field
/NXem/ENTRY/userID/role-field
/NXsnsevent/ENTRY/USER/role-field
/NXsnshisto/ENTRY/USER/role-field
/NXuser/role-field
roll
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field
/NXcanSAS/ENTRY/SAMPLE/roll-field
rollett_holm
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm-group
rotating_element
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element-group
rotating_element_type
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element_type-field
rotation
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field
/NXscanbox_em/rotation-field
/NXstage_lab/rotation-field
rotation_angle
/NXmonopd/entry/SAMPLE/rotation_angle-field
/NXrefscan/entry/data/rotation_angle-link
/NXrefscan/entry/sample/rotation_angle-field
/NXreftof/entry/sample/rotation_angle-field
/NXsample/rotation_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field
/NXsastof/ENTRY/instrument/detector/rotation_angle-field
/NXscan/ENTRY/DATA/rotation_angle-link
/NXscan/ENTRY/SAMPLE/rotation_angle-field
/NXspe/ENTRY/SAMPLE/rotation_angle-field
/NXstxm/ENTRY/SAMPLE/rotation_angle-field
/NXtas/entry/INSTRUMENT/analyser/rotation_angle-field
/NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field
/NXtas/entry/SAMPLE/rotation_angle-field
/NXtomo/entry/data/rotation_angle-link
/NXtomo/entry/sample/rotation_angle-field
/NXtomophase/entry/data/rotation_angle-link
/NXtomophase/entry/sample/rotation_angle-field
/NXxeuler/entry/name/rotation_angle-link
/NXxeuler/entry/sample/rotation_angle-field
/NXxkappa/entry/name/rotation_angle-link
/NXxkappa/entry/sample/rotation_angle-field
/NXxnb/entry/name/rotation_angle-link
/NXxnb/entry/sample/rotation_angle-field
/NXxrot/entry/name/rotation_angle-link
/NXxrot/entry/sample/rotation_angle-field
rotation_angle_step
/NXxrot/entry/sample/rotation_angle_step-field
rotation_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
rotation_convention
/NXcoordinate_system_set/rotation_convention-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_convention-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_convention-field
rotation_euler
/NXrotation_set/rotation_euler-field
rotation_handedness
/NXcoordinate_system_set/rotation_handedness-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_handedness-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_handedness-field
rotation_quaternion
/NXrotation_set/rotation_quaternion-field
rotation_set
/NXem_ebsd/indexing/rotation_set-group
/NXsingle_crystal/rotation_set-group
rotation_speed
/NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field
/NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field
/NXdisk_chopper/rotation_speed-field
/NXfermi_chopper/rotation_speed-field
/NXvelocity_selector/rotation_speed-field
roughening_pump
/NXapm_msr/instrument/roughening_pump-group
rt_frequency
/NXcircuit/rt_frequency-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/rt_frequency-field
/NXsts/ENTRY/resolution_indicators/rt_frequency-field
run
/NXcanSAS/ENTRY/run-field
run_control
/NXsensor/run_control-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
/NXsensor_sts/run_control-field
run_cycle
/NXarchive/entry/run_cycle-field
/NXentry/run_cycle-field
/NXsubentry/run_cycle-field
run_number
/NXapm/ENTRY/run_number-field
/NXsnsevent/ENTRY/run_number-field
/NXsnshisto/ENTRY/run_number-field
/NXtofraw/entry/run_number-field
s_3
/NXcorrector_cs/tableauID/s_3-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3-group
s_5
/NXcorrector_cs/tableauID/s_5-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5-group
sacrifice_isotopic_uniqueness
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/sacrifice_isotopic_uniqueness-field
/NXapm_charge_state_analysis/sacrifice_isotopic_uniqueness-field
sample
/NXapm/ENTRY/sample-group
/NXarchive/entry/sample-group
/NXarpes/ENTRY/SAMPLE-group
/NXcanSAS/ENTRY/SAMPLE-group
/NXdispersive_material/ENTRY/sample-group
/NXellipsometry/ENTRY/SAMPLE-group
/NXem/ENTRY/sample-group
/NXem_calorimetry/ENTRY/SAMPLE-group
/NXentry/SAMPLE-group
/NXfluo/entry/SAMPLE-group
/NXiqproc/ENTRY/SAMPLE-group
/NXiv_temp/ENTRY/SAMPLE-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group
/NXlab_sample_mounting/ENTRY/SAMPLE-group
/NXlauetof/entry/sample-group
/NXmonopd/entry/SAMPLE-group
/NXmpes/ENTRY/SAMPLE-group
/NXmpes_arpes/ENTRY/SAMPLE-group
/NXmx/ENTRY/SAMPLE-group
/NXoptical_spectroscopy/ENTRY/SAMPLE-group
/NXrefscan/entry/sample-group
/NXreftof/entry/sample-group
/NXsas/ENTRY/SAMPLE-group
/NXsastof/ENTRY/sample-group
/NXscan/ENTRY/SAMPLE-group
/NXsensor_scan/ENTRY/SAMPLE-group
/NXsnsevent/ENTRY/sample-group
/NXsnshisto/ENTRY/sample-group
/NXspe/ENTRY/SAMPLE-group
/NXsqom/ENTRY/SAMPLE-group
/NXsts/ENTRY/sample-group
/NXstxm/ENTRY/SAMPLE-group
/NXsubentry/SAMPLE-group
/NXtas/entry/SAMPLE-group
/NXtofnpd/entry/SAMPLE-group
/NXtofraw/entry/SAMPLE-group
/NXtofsingle/entry/SAMPLE-group
/NXtomo/entry/sample-group
/NXtomophase/entry/instrument/sample-group
/NXtomophase/entry/sample-group
/NXtomoproc/entry/SAMPLE-group
/NXtransmission/ENTRY/SAMPLE-group
/NXxas/ENTRY/SAMPLE-group
/NXxasproc/ENTRY/SAMPLE-group
/NXxbase/entry/sample-group
/NXxeuler/entry/sample-group
/NXxkappa/entry/sample-group
/NXxnb/entry/sample-group
/NXxpcs/entry/sample-group
/NXxps/ENTRY/SAMPLE-group
/NXxrd_pan/ENTRY/SAMPLE-group
/NXxrot/entry/sample-group
sample_1
/NXcxi_ptycho/sample_1-group
sample_attenuator
/NXtransmission/ENTRY/instrument/sample_attenuator-group
sample_azimuth
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth-field
sample_bias
/NXsts/ENTRY/INSTRUMENT/sample_bias-group
sample_bias_potentiostat
/NXmanipulator/sample_bias_potentiostat-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat-group
sample_bias_voltmeter
/NXmanipulator/sample_bias_voltmeter-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter-group
sample_component
/NXsample/SAMPLE_COMPONENT-group
/NXsample/sample_component-field
/NXsample_component_set/SAMPLE_COMPONENT-group
sample_component_set
/NXsample/SAMPLE_COMPONENT_SET-group
/NXsample_component/SAMPLE_COMPONENT_SET-group
/NXsample_component_set/SAMPLE_COMPONENT_SET-group
sample_cooler
/NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_cooler-group
sample_heater
/NXmanipulator/sample_heater-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater-group
/NXmpes/ENTRY/SAMPLE/temperature_env/sample_heater-group
/NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_heater-group
sample_id
/NXarchive/entry/sample/sample_id-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/sample_id-field
/NXsample/sample_id-field
/NXsample_component/sample_id-field
/NXxrd_pan/ENTRY/SAMPLE/sample_id-field
sample_medium
/NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT/sample_medium-field
sample_medium_refractive_indices
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_medium_refractive_indices-field
sample_mode
/NXxrd_pan/ENTRY/SAMPLE/sample_mode-field
sample_name
/NXxrd_pan/ENTRY/SAMPLE/sample_name-field
sample_normal_polar_angle_of_tilt
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt-field
sample_normal_ref_frame
/NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame-group
sample_normal_tilt_azimuth_angle
/NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle-field
sample_orientation
/NXoptical_spectroscopy/ENTRY/SAMPLE/sample_orientation-field
/NXsample/sample_orientation-field
/NXsample_component/sample_orientation-field
/NXsingle_crystal/sample_orientation-field
sample_polar
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar-field
sample_prep_descripton
/NXsts/ENTRY/sample/sample_prep_descripton-field
sample_preparation
/NXmpes/ENTRY/SAMPLE/history/sample_preparation-group
sample_reference_frame
/NXcoordinate_system_set/sample_reference_frame-group
/NXem/ENTRY/coordinate_system_set/sample_reference_frame-group
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame-group
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame-group
sample_rotation_angle
/NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle-field
sample_stage
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage-group
sample_symmetry
/NXrotation_set/sample_symmetry-field
sample_tilt
/NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt-field
sample_x
/NXstxm/ENTRY/DATA/sample_x-field
/NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y
/NXstxm/ENTRY/DATA/sample_y-field
/NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z
/NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction
/NXmonitor/sampled_fraction-field
sampling
/NXmicrostructure_gragles_config/ENTRY/sampling-group
/NXmicrostructure_odf/sampling-group
/NXmicrostructure_score_config/ENTRY/sampling-group
saturation_value
/NXdetector/saturation_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
save_to_file
/NXmicrostructure_mtex_config/system/save_to_file-field
scalar_field_grad_suffix
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX-group
scalar_field_magn_suffix
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX-group
scale
/NXregion/scale-field
scaling
/NXcalibration/scaling-field
scaling_factor
/NXdata/scaling_factor-field
scan_angle
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_angle-field
scan_axis
/NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_axis-field
scan_control
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control-group
scan_controller
/NXem/ENTRY/measurement/em_lab/scan_controller-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller-group
scan_contronller
/NXpositioner_sts/scan_contronller-field
scan_direction
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_direction-field
scan_mode
/NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_mode-field
scan_number
/NXxpcs/entry/scan_number-field
scan_offset
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_offset-field
scan_point_positions
/NXem_ebsd/indexing/scan_point_positions-field
scan_range
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_range-field
scan_schema
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller/scan_schema-field
/NXscanbox_em/scan_schema-field
scanbox_em
/NXem_msr/em_lab/SCANBOX_EM-group
scanfield
/NXpositioner_sts/scanfield-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/scanfield-field
scattering_angle
/NXspindispersion/scattering_angle-field
scattering_configuration
/NXraman/ENTRY/INSTRUMENT/scattering_configuration-field
scattering_cross_section
/NXattenuator/scattering_cross_section-field
scattering_energy
/NXspindispersion/scattering_energy-field
scattering_length_density
/NXsample/scattering_length_density-field
/NXsample_component/scattering_length_density-field
/NXsample_component_set/scattering_length_density-field
scattering_vector
/NXcrystal/scattering_vector-field
scheme
/NXcollectioncolumn/scheme-field
/NXenergydispersion/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
sdd
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
sebald_gottstein
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein-group
seblock
/NXspe/ENTRY/SAMPLE/seblock-field
second_amplifier
/NXsensor_sts/second_amplifier-group
seed
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/seed-field
/NXcs_prng/seed-field
segment_columns
/NXcrystal/segment_columns-field
segment_gap
/NXcrystal/segment_gap-field
segment_height
/NXcrystal/segment_height-field
segment_rows
/NXcrystal/segment_rows-field
segment_thickness
/NXcrystal/segment_thickness-field
segment_width
/NXcrystal/segment_width-field
segmentation
/NXapm_compositionspace_config/ENTRY/config/segmentation-group
/NXapm_compositionspace_results/ENTRY/segmentation-group
select
/NXapm_paraprobe_selector_config/ENTRY/select-group
semi_convergence_angle
/NXoptical_system_em/semi_convergence_angle-field
sensitivity_factor
/NXlockin/sensitivity_factor-field
sensor
/NXebeam_column/SENSOR-group
/NXem/ENTRY/measurement/em_lab/SENSOR-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/SENSOR-group
/NXenvironment/SENSOR-group
/NXibeam_column/SENSOR-group
/NXinstrument/SENSOR-group
/NXmanipulator/SENSOR-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
/NXstage_lab/SENSOR-group
sensor_count
/NXdetector/sensor_count-field
sensor_material
/NXdetector/sensor_material-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_pixel_size
/NXdetector/sensor_pixel_size-field
sensor_pixels
/NXdetector/sensor_pixels-field
sensor_size
/NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
/NXdetector/sensor_size-field
sensor_thickness
/NXdetector/sensor_thickness-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type
/NXfilter/sensor_type-group
sensorid
/NXem/ENTRY/measurement/em_lab/ebeam_column/sensorID-group
/NXem/ENTRY/measurement/em_lab/ibeam_column/sensorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/sensorID-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/sensorID-group
sequence_index
/NXapm/ENTRY/atom_probe/hit_finding/sequence_index-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/sequence_index-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/background_quantification/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/peak_search/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/sequence_index-field
/NXapm/ENTRY/atom_probe/raw_data/sequence_index-field
/NXapm/ENTRY/atom_probe/reconstruction/sequence_index-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl/sequence_index-field
/NXapm_compositionspace_results/ENTRY/autophase/sequence_index-field
/NXapm_compositionspace_results/ENTRY/clustering/sequence_index-field
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/sequence_index-field
/NXapm_compositionspace_results/ENTRY/segmentation/pca/sequence_index-field
/NXapm_compositionspace_results/ENTRY/voxelization/sequence_index-field
/NXem_calorimetry/ENTRY/azimuthal_integration/sequence_index-field
/NXem_calorimetry/ENTRY/background_subtraction/sequence_index-field
/NXem_calorimetry/ENTRY/distortion_correction/sequence_index-field
/NXem_calorimetry/ENTRY/pattern_center/sequence_index-field
/NXem_calorimetry/ENTRY/time_synchronization/sequence_index-field
/NXem_correlation/PROCESS/sequence_index-field
/NXem_method/PROCESS/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field
/NXnote/sequence_index-field
/NXprocess/sequence_index-field
/NXprocess_mpes/sequence_index-field
/NXroi/PROCESS/sequence_index-field
sequence_number
/NXdetector/sequence_number-field
/NXtomophase/entry/instrument/bright_field/sequence_number-field
/NXtomophase/entry/instrument/dark_field/sequence_number-field
/NXtomophase/entry/instrument/sample/sequence_number-field
serial_number
/NXdetector/serial_number-field
/NXfabrication/serial_number-field
serialized
/NXapm/ENTRY/atom_probe/hit_finding/serialized-group
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized-group
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized-group
/NXapm/ENTRY/atom_probe/raw_data/serialized-group
/NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized-group
/NXapm_hit_finding/SERIALIZED-group
/NXapm_ranging/SERIALIZED-group
/NXapm_reconstruction/SERIALIZED-group
/NXapm_volt_and_bowl/SERIALIZED-group
serializedid
/NXapm/ENTRY/serializedID-group
/NXem/ENTRY/serializedID-group
service
/NXapm/ENTRY/USER/identifier/service-field
/NXapm/ENTRY/experiment_identifier/service-field
/NXapm/ENTRY/sample/identifier/service-field
/NXapm/ENTRY/specimen/identifier/service-field
/NXapm/ENTRY/specimen/parent_identifier/service-field
/NXem/ENTRY/experiment_identifier/service-field
/NXem/ENTRY/sample/identifier/service-field
/NXem/ENTRY/sample/parent_identifier/service-field
/NXem/ENTRY/userID/identifier/service-field
/NXidentifier/service-field
/NXoptical_spectroscopy/ENTRY/experiment_identifier/service-field
set_bfield_current
/NXseparator/set_Bfield_current-field
/NXspin_rotator/set_Bfield_current-field
set_current
/NXelectrostatic_kicker/set_current-field
/NXmagnetic_kicker/set_current-field
/NXquadrupole_magnet/set_current-field
/NXsolenoid_magnet/set_current-field
set_efield_voltage
/NXseparator/set_Efield_voltage-field
/NXspin_rotator/set_Efield_voltage-field
set_identifier
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/set_identifier-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/set_identifier-field
set_voltage
/NXelectrostatic_kicker/set_voltage-field
/NXmagnetic_kicker/set_voltage-field
setpoint
/NXactuator/PID/setpoint-field
/NXmanipulator/cryostat/PID/setpoint-field
/NXmanipulator/sample_bias_potentiostat/PID/setpoint-field
/NXmanipulator/sample_heater/PID/setpoint-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID/setpoint-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID/setpoint-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID/setpoint-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID/setpoint-field
/NXpid/setpoint-field
/NXpositioner_sts/setpoint-field
setpoint_log
/NXactuator/PID/setpoint_log-group
/NXmanipulator/cryostat/PID/setpoint_log-group
/NXmanipulator/sample_bias_potentiostat/PID/setpoint_log-group
/NXmanipulator/sample_heater/PID/setpoint_log-group
/NXpid/setpoint_log-group
setpoint_temperature
/NXevent_data_apm/instrument/stage_lab/setpoint_temperature-field
settling_time
/NXbias_spectroscopy/settling_time-field
/NXiv_bias/settling_time-field
/NXsts/ENTRY/reproducibility_indicators/settling_time-field
sgl
/NXtas/entry/SAMPLE/sgl-field
sgu
/NXtas/entry/SAMPLE/sgu-field
shadowfactor
/NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle
/NXapm/ENTRY/specimen/shank_angle-field
shape
/NXaperture/shape-field
/NXattenuator/shape-group
/NXbeam_splitter/SHAPE-group
/NXbeam_splitter/SHAPE/shape-field
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field
/NXcg_hexahedron_set/shape-field
/NXcg_polygon_set/shape-field
/NXcg_primitive_set/shape-field
/NXcontainer/shape-group
/NXcrystal/shape-group
/NXgeometry/SHAPE-group
/NXgrating/shape-group
/NXmirror/shape-group
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit/shape-field
/NXpolarizer_opt/SHAPE-group
/NXpolarizer_opt/SHAPE/shape-field
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape-group
/NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
/NXshape/shape-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shermann_function
/NXspindispersion/shermann_function-field
short_name
/NXactuator/short_name-field
/NXenvironment/short_name-field
/NXsensor/short_name-field
/NXsensor_sts/short_name-field
short_title
/NXsample/short_title-field
shortest_half_life
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/shortest_half_life-field
/NXapm_charge_state_analysis/shortest_half_life-field
show_coordinates
/NXmicrostructure_mtex_config/plotting/show_coordinates-field
show_micron_bar
/NXmicrostructure_mtex_config/plotting/show_micron_bar-field
sigma_x
/NXsource/sigma_x-field
sigma_y
/NXsource/sigma_y-field
sign_convention
/NXcoordinate_system_set/sign_convention-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sign_convention-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sign_convention-field
sign_valid
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid-group
signal_amplitude
/NXevent_data_apm/instrument/ion_detector/signal_amplitude-field
signal_over_noise
/NXamplifier/signal_over_noise-field
signals_oversampling
/NXcircuit/signals_oversampling-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/signals_oversampling-field
/NXsts/ENTRY/resolution_indicators/signals_oversampling-field
signed_distance
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/signed_distance-field
simulation
/NXapm/ENTRY/simulation-group
/NXem/ENTRY/roiID/ebsd/simulation-group
/NXem/ENTRY/simulation-group
/NXem_ebsd/simulation-group
/NXem_sim/simulation-group
simulation_control
/NXmicrostructure_gragles_config/ENTRY/simulation_control-group
/NXmicrostructure_score_config/ENTRY/simulation_control-group
simulation_identifier
/NXmicrostructure_gragles_config/ENTRY/simulation_identifier-field
/NXmicrostructure_gragles_results/ENTRY/simulation_identifier-field
/NXmicrostructure_score_config/ENTRY/simulation_identifier-field
/NXmicrostructure_score_results/ENTRY/simulation_identifier-field
single_crystal
/NXsample/SINGLE_CRYSTAL-group
/NXsample_component/SINGLE_CRYSTAL-group
single_point
/NXsts/ENTRY/single_point-group
situation
/NXarchive/entry/sample/situation-field
/NXmpes/ENTRY/SAMPLE/situation-field
/NXmpes_arpes/ENTRY/SAMPLE/situation-field
/NXsample/situation-field
size
/NXaperture/size-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/size-field
/NXbeam_splitter/SHAPE/size-field
/NXbeam_stop/size-field
/NXpolarizer_opt/SHAPE/size-field
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field
/NXshape/size-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
sketch
/NXbeam_splitter/SHAPE/sketch-group
/NXpolarizer_opt/SHAPE/sketch-group
slit
/NXbeam_path/MONOCHROMATOR/SLIT-group
/NXbeam_path/SLIT-group
/NXfermi_chopper/slit-field
/NXtransmission/ENTRY/instrument/DETECTOR/slit-group
slit_angle
/NXdisk_chopper/slit_angle-field
slit_edges
/NXdisk_chopper/slit_edges-field
slit_height
/NXdisk_chopper/slit_height-field
slit_length
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits
/NXdisk_chopper/slits-field
slot
/NXdetector/slot-field
slow_axes
/NXelectronanalyser/slow_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
slow_pixel_direction
/NXdetector_module/slow_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
smile
/NXsubstance/smile-field
sns
/NXsnsevent/ENTRY/instrument/SNS-group
/NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id
/NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field
/NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name
/NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field
/NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool
/NXsnsevent/ENTRY/SNSHistoTool-group
/NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service
/NXsnsevent/ENTRY/instrument/SNStranslation_service-field
/NXsnshisto/ENTRY/instrument/SNStranslation_service-field
soft_limit_max
/NXpositioner/soft_limit_max-field
/NXpositioner_sts/soft_limit_max-field
soft_limit_min
/NXpositioner/soft_limit_min-field
/NXpositioner_sts/soft_limit_min-field
software
/NXsts/ENTRY/INSTRUMENT/software-group
software_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE-group
solid_angle
/NXdetector/solid_angle-field
solitary_unit
/NXmicrostructure_score_config/ENTRY/solitary_unit-group
soller_angle
/NXcollimator/soller_angle-field
source
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE-group
/NXarchive/entry/instrument/SOURCE-group
/NXarpes/ENTRY/INSTRUMENT/SOURCE-group
/NXbeam_path/SOURCE-group
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source-group
/NXem/ENTRY/roiID/ebsd/indexing/source-group
/NXem/ENTRY/roiID/ebsd/measurement/source-group
/NXem/ENTRY/roiID/ebsd/simulation/source-group
/NXem_ebsd/calibration/source-group
/NXem_ebsd/indexing/source-group
/NXem_ebsd/measurement/source-group
/NXem_ebsd/simulation/source-group
/NXfluo/entry/INSTRUMENT/SOURCE-group
/NXimage_set/PROCESS/source-group
/NXinstrument/SOURCE-group
/NXiqproc/ENTRY/instrument/SOURCE-group
/NXmonopd/entry/INSTRUMENT/SOURCE-group
/NXmx/ENTRY/SOURCE-group
/NXpulser_apm/SOURCE-group
/NXrefscan/entry/instrument/SOURCE-group
/NXsas/ENTRY/INSTRUMENT/SOURCE-group
/NXsastof/ENTRY/instrument/source-group
/NXspectrum_set/PROCESS/source-group
/NXsqom/ENTRY/instrument/SOURCE-group
/NXstxm/ENTRY/INSTRUMENT/SOURCE-group
/NXtas/entry/INSTRUMENT/SOURCE-group
/NXtomo/entry/instrument/SOURCE-group
/NXtomophase/entry/instrument/SOURCE-group
/NXtomoproc/entry/INSTRUMENT/SOURCE-group
/NXtransmission/ENTRY/instrument/SOURCE-group
/NXxas/ENTRY/INSTRUMENT/SOURCE-group
/NXxbase/entry/instrument/source-group
/NXxlaue/entry/instrument/source-group
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE-group
source_1
/NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x
/NXbending_magnet/source_distance_x-field
source_distance_y
/NXbending_magnet/source_distance_y-field
source_peak_wavelength
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/source_peak_wavelength-field
source_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE-group
sourceid
/NXapm/ENTRY/measurement/instrument/pulser/sourceID-group
sourcetype
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE-group
/NXxps/ENTRY/INSTRUMENT/sourceTYPE-group
space
/NXgraph_node_set/space-field
space_group
/NXcrystal/space_group-field
/NXcrystal_structure/space_group-field
/NXem/ENTRY/roiID/ebsd/indexing/phaseID/space_group-field
/NXsample/space_group-field
/NXsample_component/space_group-field
/NXunit_cell/space_group-field
spatial_acceptance
/NXcollectioncolumn/spatial_acceptance-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/spatial_acceptance-field
spatial_distribution
/NXmicrostructure_score_config/ENTRY/nucleation/spatial_distribution-field
spatial_filter
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter-group
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter-group
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter-group
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter-group
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter-group
/NXapm_paraprobe_tool_config/SPATIAL_FILTER-group
spatial_resolution
/NXelectronanalyser/spatial_resolution-group
spatial_statisticsid
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID-group
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID-group
spatialn
/NXdata_mpes/spatialN-field
/NXdata_mpes_detector/spatialN-field
spatialn_calibration
/NXmpes/ENTRY/PROCESS_MPES/spatialN_calibration-group
/NXprocess_mpes/spatialN_calibration-group
spatiotemporalid
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID-group
/NXmicrostructure_score_results/ENTRY/spatiotemporalID-group
special_enthalpy
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_enthalpy-field
special_pre_factor
/NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_pre_factor-field
specific_polarization_filter_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/specific_polarization_filter_type-field
specimen
/NXapm/ENTRY/specimen-group
specimen_symmetry_point_group
/NXmicrostructure_odf/configuration/specimen_symmetry_point_group-field
/NXmicrostructure_pf/configuration/specimen_symmetry_point_group-field
spectral_range
/NXfiber/spectral_range-field
spectral_resolution
/NXbeam_path/MONOCHROMATOR/spectral_resolution-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field
/NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
spectralfilter_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE-group
spectrometer
/NXtransmission/ENTRY/instrument/spectrometer-group
spectrum
/NXbeam_path/GRATING/spectrum-field
/NXbeam_path/MONOCHROMATOR/spectrum-field
/NXbending_magnet/spectrum-group
/NXinsertion_device/spectrum-group
/NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
spectrum_0d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d-group
/NXspectrum_set/spectrum_0d-group
spectrum_1d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d-group
/NXspectrum_set/spectrum_1d-group
spectrum_2d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d-group
/NXspectrum_set/spectrum_2d-group
spectrum_3d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d-group
/NXspectrum_set/spectrum_3d-group
spectrum_identifier
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/spectrum_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/spectrum_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/spectrum_identifier-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/spectrum_identifier-field
/NXspectrum_set/stack_0d/spectrum_identifier-field
/NXspectrum_set/stack_2d/spectrum_identifier-field
/NXspectrum_set/stack_3d/spectrum_identifier-field
spectrum_set
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET-group
/NXem_eels/indexing/SPECTRUM_SET-group
/NXem_method/SPECTRUM_SET-group
/NXevent_data_em/SPECTRUM_SET-group
speed_backw
/NXpositioner_sts/speed_backw-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/speed_backw-field
speed_forw
/NXpositioner_sts/speed_forw-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/speed_forw-field
spindispersion
/NXelectronanalyser/SPINDISPERSION-group
splitting_ratio
/NXbeam_splitter/splitting_ratio-field
spot_position
/NXpulser_apm/SOURCE/BEAM/spot_position-field
spwidth
/NXvelocity_selector/spwidth-field
stack_0d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d-group
/NXspectrum_set/stack_0d-group
stack_1d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d-group
/NXimage_set/stack_1d-group
stack_2d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d-group
/NXimage_set/stack_2d-group
/NXspectrum_set/stack_2d-group
stack_3d
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d-group
/NXimage_set/stack_3d-group
/NXspectrum_set/stack_3d-group
stage_lab
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/stage_lab-group
/NXapm_msr/instrument/stage_lab-group
/NXem/ENTRY/measurement/em_lab/STAGE_LAB-group
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB-group
/NXem_msr/em_lab/STAGE_LAB-group
/NXevent_data_apm/instrument/stage_lab-group
/NXevent_data_em/em_lab/STAGE_LAB-group
stage_type
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type-field
stage_type_other
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type_other-field
standard
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/standard-field
standing_voltage
/NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage-field
/NXpulser_apm/standing_voltage-field
start
/NXregion/start-field
/NXxrd_pan/ENTRY/experiment_config/omega/start-field
/NXxrd_pan/ENTRY/experiment_config/two_theta/start-field
start_time
/NXactivity/start_time-field
/NXapm/ENTRY/start_time-field
/NXapm_compositionspace_results/ENTRY/profiling/start_time-field
/NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_distancer_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_intersector_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_ranger_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_selector_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_tool_common/profiling/start_time-field
/NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/start_time-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/start_time-field
/NXarchive/entry/start_time-field
/NXarpes/ENTRY/start_time-field
/NXchemical_process/start_time-field
/NXcs_profiling/start_time-field
/NXcs_profiling_event/start_time-field
/NXcxi_ptycho/entry_1/start_time-field
/NXdetector/start_time-field
/NXdirecttof/entry/start_time-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/start_time-field
/NXem/ENTRY/start_time-field
/NXem_calorimetry/ENTRY/profiling/start_time-field
/NXem_calorimetry/ENTRY/time_synchronization/start_time-field
/NXentry/start_time-field
/NXevent_data_apm/start_time-field
/NXevent_data_em/start_time-field
/NXfluo/entry/start_time-field
/NXindirecttof/entry/start_time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field
/NXlab_sample_mounting/ENTRY/start_time-field
/NXmicrostructure_gragles_config/ENTRY/start_time-field
/NXmicrostructure_gragles_results/ENTRY/start_time-field
/NXmicrostructure_imm_results/ENTRY/start_time-field
/NXmicrostructure_kanapy_results/ENTRY/start_time-field
/NXmicrostructure_score_config/ENTRY/start_time-field
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/NXmx/ENTRY/start_time-field
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/NXrefscan/entry/start_time-field
/NXreftof/entry/start_time-field
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/NXtas/entry/start_time-field
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/NXtofraw/entry/start_time-field
/NXtofsingle/entry/start_time-field
/NXtomo/entry/start_time-field
/NXtomophase/entry/start_time-field
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/NXxbase/entry/start_time-field
/NXxpcs/entry/start_time-field
state
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static_q_list
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static_roi_map
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statistics
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/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics-group
/NXregion/statistics-group
/NXsimilarity_grouping/statistics-group
status
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/NXapm/ENTRY/measurement/instrument/status-field
/NXapm_msr/instrument/status-field
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/NXapm_paraprobe_clusterer_results/ENTRY/common/status-field
/NXapm_paraprobe_distancer_config/ENTRY/common/status-field
/NXapm_paraprobe_distancer_results/ENTRY/common/status-field
/NXapm_paraprobe_intersector_config/ENTRY/common/status-field
/NXapm_paraprobe_intersector_results/ENTRY/common/status-field
/NXapm_paraprobe_nanochem_config/ENTRY/common/status-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/status-field
/NXapm_paraprobe_ranger_config/ENTRY/common/status-field
/NXapm_paraprobe_ranger_results/ENTRY/common/status-field
/NXapm_paraprobe_selector_config/ENTRY/common/status-field
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/NXapm_paraprobe_spatstat_results/ENTRY/common/status-field
/NXapm_paraprobe_surfacer_config/ENTRY/common/status-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/status-field
/NXapm_paraprobe_tessellator_config/ENTRY/common/status-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/status-field
/NXapm_paraprobe_tool_common/status-field
/NXapm_paraprobe_transcoder_config/ENTRY/common/status-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/status-field
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/NXbeam_stop/status-field
/NXem_ebsd/indexing/status-field
/NXfilter/status-field
/NXreflectron/status-field
/NXsts/ENTRY/INSTRUMENT/lock_in/status-field
step
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/NXxrd_pan/ENTRY/experiment_config/two_theta/step-field
stepsize
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stm_head_temp
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/NXsts/ENTRY/resolution_indicators/stm_head_temp-field
stop_on_symmetry_mismatch
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stop_time
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storage
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stored_elastic_energy
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stored_energy_recovery
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strain
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/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field
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/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field
strength
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/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field
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/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field
stress
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/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/stress-field
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/NXsample/stress_field-field
stride
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structure
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/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure-group
stxm_scan_type
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subentry
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subsampling_filter
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substance
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/NXsample/SUBSTANCE-group
/NXsample_component/SUBSTANCE-group
substrate
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/NXlens_opt/substrate-group
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/NXpolarizer_opt/substrate-group
/NXwaveplate/substrate-group
substrate_density
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/NXmirror/substrate_density-field
substrate_material
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/NXfilter/substrate_material-field
/NXgrating/substrate_material-field
/NXguide/substrate_material-field
/NXlens_opt/substrate/substrate_material-field
/NXmirror/substrate_material-field
/NXpolarizer_opt/substrate/substrate_material-field
/NXwaveplate/substrate/substrate_material-field
substrate_roughness
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/NXgrating/substrate_roughness-field
/NXguide/substrate_roughness-field
/NXmirror/substrate_roughness-field
substrate_thickness
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/NXfilter/substrate_thickness-field
/NXgrating/substrate_thickness-field
/NXguide/substrate_thickness-field
/NXlens_opt/substrate/substrate_thickness-field
/NXmirror/substrate_thickness-field
/NXpolarizer_opt/substrate/substrate_thickness-field
/NXwaveplate/substrate/substrate_thickness-field
summary
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/NXem_eds/indexing/summary-group
summary_statistics
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/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics-group
support_membrane_material
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support_membrane_thickness
/NXfresnel_zone_plate/support_membrane_thickness-field
surface
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/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface-group
/NXapm_paraprobe_tool_config/surface-group
/NXguide/reflectivity/surface-field
surface_distance
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/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance-group
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance-group
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance-group
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance-group
/NXapm_paraprobe_tool_config/surface_distance-group
surface_energy
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/NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/surface_energy-field
surface_meshing
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surface_type
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sw_filter_cutoff_frq
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/NXiv_bias/sw_filter_cutoff_frq-field
sw_filter_order
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sw_filter_type
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/NXiv_bias/sw_filter_type-field
sw_ilter_order
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sweep_control
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sweep_end
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/NXiv_bias/sweep_end-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/sweep_end-field
/NXsts/ENTRY/resolution_indicators/sweep_end-field
sweep_start
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/NXiv_bias/sweep_start-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/sweep_start-field
/NXsts/ENTRY/resolution_indicators/sweep_start-field
switch_off_delay
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symmetric
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symmetry
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/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/symmetry-field
/NXcg_grid/symmetry-field
/NXdistortion/symmetry-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/symmetry-field
/NXmicrostructure_score_results/ENTRY/discretization/grid/symmetry-field
sync
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system
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/NXmicrostructure_mtex_config/system-group
t
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table
/NXvelocity_selector/table-field
tableauid
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/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID-group
taper
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target
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target_dcom_radius
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target_detection_rate
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/NXevent_data_apm/instrument/control/target_detection_rate-field
target_edge_length
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target_material
/NXsource/target_material-field
target_preparation
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target_preparation_date
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target_smoothing_step
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target_value
/NXpositioner/target_value-field
/NXpositioner_sts/target_value-field
targets
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/targets-field
tdev
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
telephone_number
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/NXsensor_scan/ENTRY/USER/telephone_number-field
/NXtransmission/ENTRY/operator/telephone_number-field
/NXuser/telephone_number-field
temp_control_type
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temperature
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/NXarpes/ENTRY/SAMPLE/temperature-field
/NXcanSAS/ENTRY/SAMPLE/temperature-field
/NXcrystal/temperature-field
/NXevent_data_apm/instrument/stage_lab/temperature-field
/NXfilter/temperature-field
/NXiv_temp/ENTRY/DATA/temperature-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/temperature-field
/NXmicrostructure_score_config/ENTRY/time_temperature/temperature-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/temperature-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/temperature-field
/NXmoderator/temperature-field
/NXmx/ENTRY/SAMPLE/temperature-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/temperature-group
/NXsample/temperature-field
/NXsensor_sts/temperature-field
/NXsnsevent/ENTRY/instrument/moderator/temperature-field
/NXsnshisto/ENTRY/instrument/moderator/temperature-field
/NXspe/ENTRY/SAMPLE/temperature-field
/NXxbase/entry/sample/temperature-field
/NXxpcs/entry/sample/temperature-field
temperature_coefficient
/NXcrystal/temperature_coefficient-field
temperature_controller
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
temperature_env
/NXmpes/ENTRY/SAMPLE/temperature_env-group
/NXsample/temperature_env-group
temperature_log
/NXcrystal/temperature_log-group
/NXfilter/temperature_log-group
/NXmoderator/temperature_log-group
/NXsample/temperature_log-group
temperature_nominal
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temperature_nominal_other
/NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_nominal_other-field
temperature_sensor
/NXmanipulator/temperature_sensor-group
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor-group
/NXmpes/ENTRY/SAMPLE/temperature_env/temperature_sensor-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor-group
/NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_sensor-group
temperature_set
/NXxpcs/entry/sample/temperature_set-field
tensor
/NXmicrostructure_mtex_config/path/tensor-field
term
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/NXparameters/term-field
tessellate
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate-group
tessellation
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation-group
tetrahedra
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra-group
/NXcg_tetrahedron_set/tetrahedra-group
tetrahedron_half_edgeid
/NXcg_tetrahedron_set/tetrahedron_half_edgeID-group
tetrahedronid
/NXcg_tetrahedron_set/tetrahedronID-group
text
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text_interpreter
/NXmicrostructure_mtex_config/miscellaneous/text_interpreter-field
theta
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/NXmicrostructure_odf/kth_extrema/theta-field
thickness
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/NXbeam_path/window_NUMBER/thickness-field
/NXcanSAS/ENTRY/SAMPLE/thickness-field
/NXcrystal/thickness-field
/NXem/ENTRY/sample/thickness-field
/NXfilter/thickness-field
/NXflipper/thickness-field
/NXopt_window/ENTRY/thickness-field
/NXoptical_spectroscopy/ENTRY/SAMPLE/thickness-field
/NXsample/thickness-field
thickness_determination
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thickness_reduction
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
thread_identifier
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/thread_identifier-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/thread_identifier-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/thread_identifier-field
threshold_distance
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/threshold_distance-field
threshold_energy
/NXdetector/threshold_energy-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
threshold_proximity
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/threshold_proximity-field
thumbnail
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/NXsubentry/thumbnail-group
tilt
/NXxnb/entry/name/tilt-link
tilt_1
/NXstage_lab/tilt_1-field
tilt_2
/NXstage_lab/tilt_2-field
tilt_angle
/NXcorrector_cs/tableauID/tilt_angle-field
/NXxnb/entry/instrument/detector/tilt_angle-field
tilt_correction
/NXoptical_system_em/tilt_correction-field
tilt_n
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time
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/NXem_ebsd/measurement/time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field
/NXlog/time-field
/NXmicrostructure/time-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/time-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field
/NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/time-field
/NXmicrostructure_score_config/ENTRY/time_temperature/time-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/time-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field
/NXsnsevent/ENTRY/DASlogs/LOG/time-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
/NXsnshisto/ENTRY/DASlogs/LOG/time-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_const
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time_control
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time_of_flight
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/NXdetector/time_of_flight-field
/NXlauetof/entry/control/time_of_flight-field
/NXlauetof/entry/instrument/detector/time_of_flight-field
/NXlauetof/entry/name/time_of_flight-link
/NXmonitor/time_of_flight-field
/NXreftof/entry/control/time_of_flight-field
/NXreftof/entry/data/time_of_flight-link
/NXreftof/entry/instrument/detector/time_of_flight-field
/NXsastof/ENTRY/control/time_of_flight-field
/NXsastof/ENTRY/data/time_of_flight-link
/NXsastof/ENTRY/instrument/detector/time_of_flight-field
/NXsnsevent/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/DATA/time_of_flight-link
/NXsnshisto/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field
/NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofnpd/entry/MONITOR/time_of_flight-field
/NXtofnpd/entry/data/time_of_flight-link
/NXtofraw/entry/MONITOR/time_of_flight-field
/NXtofraw/entry/data/time_of_flight-link
/NXtofraw/entry/instrument/detector/time_of_flight-field
/NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofsingle/entry/MONITOR/time_of_flight-field
/NXtofsingle/entry/data/time_of_flight-link
time_of_flight_adc
/NXdata_mpes_detector/time_of_flight_adc-field
time_offset
/NXcg_point_set/time_offset-field
time_per_channel
/NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points
/NXtransmission/ENTRY/instrument/time_points-field
time_slope
/NXmicrostructure_gragles_config/ENTRY/numerics/time_slope-field
time_synchronization
/NXem_calorimetry/ENTRY/time_synchronization-group
time_temperature
/NXmicrostructure_score_config/ENTRY/time_temperature-group
time_zone
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timestamp
/NXcg_point_set/timestamp-field
timing
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/NXmagnetic_kicker/timing-field
tip_lift
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tip_position_z
/NXpositioner_sts/tip_position_z-field
title
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/NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/title-field
/NXapm_compositionspace_results/ENTRY/autophase/result/title-field
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/title-field
/NXapm_compositionspace_results/ENTRY/segmentation/pca/result/title-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/title-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/title-field
/NXarchive/entry/title-field
/NXarpes/ENTRY/title-field
/NXcanSAS/ENTRY/title-field
/NXcxi_ptycho/entry_1/title-field
/NXdata/title-field
/NXdirecttof/entry/title-field
/NXellipsometry/ENTRY/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/title-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/title-field
/NXem/ENTRY/roiID/ebsd/indexing/roi/title-field
/NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/title-field
/NXem/ENTRY/roiID/eds/indexing/summary/title-field
/NXem_calorimetry/ENTRY/azimuthal_integration/result/title-field
/NXem_calorimetry/ENTRY/background_subtraction/result/title-field
/NXem_correlation/indexing/roi/title-field
/NXem_ebsd/indexing/roi/title-field
/NXentry/title-field
/NXfluo/entry/title-field
/NXindirecttof/entry/title-field
/NXiqproc/ENTRY/title-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/title-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/title-field
/NXmonopd/entry/title-field
/NXmpes/ENTRY/title-field
/NXmx/ENTRY/title-field
/NXoptical_spectroscopy/ENTRY/title-field
/NXraman/ENTRY/title-field
/NXrefscan/entry/title-field
/NXreftof/entry/title-field
/NXsas/ENTRY/title-field
/NXsastof/ENTRY/title-field
/NXscan/ENTRY/title-field
/NXsnsevent/ENTRY/title-field
/NXsnshisto/ENTRY/title-field
/NXsource/bunch_pattern/title-field
/NXsqom/ENTRY/title-field
/NXstxm/ENTRY/title-field
/NXsubentry/title-field
/NXtas/entry/title-field
/NXtofnpd/entry/title-field
/NXtofraw/entry/title-field
/NXtofsingle/entry/title-field
/NXtomo/entry/title-field
/NXtomophase/entry/title-field
/NXtomoproc/entry/title-field
/NXxas/ENTRY/title-field
/NXxasproc/ENTRY/title-field
/NXxbase/entry/title-field
tof_distance
/NXenergydispersion/tof_distance-field
tolerance
/NXpositioner/tolerance-field
/NXpositioner_sts/tolerance-field
top_dead_center
/NXdisk_chopper/top_dead_center-field
top_up
/NXsource/top_up-field
total
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/total-field
/NXchemical_composition/total-field
/NXsimilarity_grouping/statistics/total-field
total_area
/NXfit/peakPEAK/total_area-field
/NXpeak/total_area-field
/NXxps/ENTRY/FIT/peakPEAK/total_area-field
total_counts
/NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field
/NXsnsevent/ENTRY/total_counts-field
/NXsnshisto/ENTRY/DATA/total_counts-link
/NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field
/NXsnshisto/ENTRY/total_counts-field
total_elapsed_time
/NXapm_compositionspace_results/ENTRY/profiling/total_elapsed_time-field
/NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_distancer_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_distancer_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_intersector_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_intersector_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_ranger_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_ranger_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_selector_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_selector_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_tool_common/profiling/total_elapsed_time-field
/NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/total_elapsed_time-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/total_elapsed_time-field
/NXcs_profiling/total_elapsed_time-field
/NXem_calorimetry/ENTRY/profiling/total_elapsed_time-field
total_flux
/NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
total_flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
total_surface_area
/NXcg_cylinder_set/total_surface_area-field
total_uncounted_counts
/NXsnsevent/ENTRY/total_uncounted_counts-field
/NXsnshisto/ENTRY/total_uncounted_counts-field
transcode
/NXapm_paraprobe_transcoder_config/ENTRY/transcode-group
transfer_matrix
/NXbeam_transfer_matrix_table/TRANSFER_MATRIX-field
transfer_rate
/NXfiber/transfer_rate-field
transformations
/NXactuator/TRANSFORMATIONS-group
/NXaperture/TRANSFORMATIONS-group
/NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM/TRANSFORMATIONS-group
/NXattenuator/TRANSFORMATIONS-group
/NXbeam/TRANSFORMATIONS-group
/NXbeam_device/TRANSFORMATIONS-group
/NXbeam_path/TRANSFORMATIONS-group
/NXbeam_stop/TRANSFORMATIONS-group
/NXbending_magnet/TRANSFORMATIONS-group
/NXcapillary/TRANSFORMATIONS-group
/NXcollectioncolumn/TRANSFORMATIONS-group
/NXcollimator/TRANSFORMATIONS-group
/NXcomponent/TRANSFORMATIONS-group
/NXcoordinate_system/TRANSFORMATIONS-group
/NXcrystal/TRANSFORMATIONS-group
/NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group
/NXcxi_ptycho/sample_1/transformations-group
/NXdeflector/TRANSFORMATIONS-group
/NXdetector/TRANSFORMATIONS-group
/NXdisk_chopper/TRANSFORMATIONS-group
/NXebeam_column/electron_source/TRANSFORMATIONS-group
/NXelectronanalyser/TRANSFORMATIONS-group
/NXenergydispersion/TRANSFORMATIONS-group
/NXenvironment/TRANSFORMATIONS-group
/NXfermi_chopper/TRANSFORMATIONS-group
/NXfilter/TRANSFORMATIONS-group
/NXflipper/TRANSFORMATIONS-group
/NXfresnel_zone_plate/TRANSFORMATIONS-group
/NXgrating/TRANSFORMATIONS-group
/NXguide/TRANSFORMATIONS-group
/NXinsertion_device/TRANSFORMATIONS-group
/NXmanipulator/TRANSFORMATIONS-group
/NXmirror/TRANSFORMATIONS-group
/NXmoderator/TRANSFORMATIONS-group
/NXmonitor/TRANSFORMATIONS-group
/NXmonochromator/TRANSFORMATIONS-group
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group
/NXmpes_arpes/ENTRY/SAMPLE/transformations-group
/NXmpes_arpes/ENTRY/geometries/arpes_geometry/TRANSFORMATIONS-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group
/NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/transformations-group
/NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/TRANSFORMATIONS-group
/NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/TRANSFORMATIONS-group
/NXpinhole/TRANSFORMATIONS-group
/NXpolarizer/TRANSFORMATIONS-group
/NXpositioner/TRANSFORMATIONS-group
/NXpositioner_sts/TRANSFORMATIONS-group
/NXpulser_apm/SOURCE/TRANSFORMATIONS-group
/NXreflectron/TRANSFORMATIONS-group
/NXregistration/TRANSFORMATIONS-group
/NXsample/TRANSFORMATIONS-group
/NXsensor/TRANSFORMATIONS-group
/NXsensor_sts/TRANSFORMATIONS-group
/NXslit/TRANSFORMATIONS-group
/NXsource/TRANSFORMATIONS-group
/NXspindispersion/TRANSFORMATIONS-group
/NXvelocity_selector/TRANSFORMATIONS-group
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group
/NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations-group
/NXxps/ENTRY/SAMPLE/transformations-group
/NXxraylens/TRANSFORMATIONS-group
translation
/NXcxi_ptycho/data_1/translation-link
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field
/NXcxi_ptycho/sample_1/geometry_1/translation-link
/NXgeometry/TRANSLATION-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission
/NXbeam_splitter/transmission-field
/NXcanSAS/ENTRY/SAMPLE/transmission-field
/NXcapillary/transmission-group
/NXcrystal/transmission-group
/NXfilter/transmission-group
/NXlens_opt/transmission-field
/NXpolarizer_opt/transmission-field
/NXsample/transmission-group
/NXsample_component/transmission-group
transmission_correction
/NXmpes/ENTRY/PROCESS_MPES/transmission_correction-group
/NXprocess_mpes/transmission_correction-group
/NXxps/ENTRY/PROCESS_MPES/transmission_correction-group
transmission_function
/NXelectronanalyser/transmission_function-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group
/NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function-group
/NXprocess_mpes/transmission_correction/transmission_function-group
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group
transmission_spectrum
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmittance
/NXoptical_spectroscopy/ENTRY/derived_parameters/transmittance-field
transmitting_material
/NXcollimator/transmitting_material-field
/NXfermi_chopper/transmitting_material-field
triangle_cluster_identifier
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/triangle_cluster_identifier-field
triangle_identifier
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/triangle_identifier-field
triangle_meshid
/NXcg_alpha_complex/triangle_meshID-group
triangle_set
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set-group
triangle_setid
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID-group
/NXcg_alpha_complex/triangle_setID-group
triangle_soup
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup-group
triangleid
/NXcg_triangle_set/triangleID-group
triangles
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles-group
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles-group
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles-group
/NXcg_triangle_set/triangles-group
trigger_dead_time
/NXdetector/trigger_dead_time-field
trigger_delay_time
/NXdetector/trigger_delay_time-field
trigger_delay_time_set
/NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time
/NXdetector/trigger_internal_delay_time-field
triple_junction
/NXmicrostructure/triple_junction-group
triple_junction_identifier
/NXmicrostructure/interface/triple_junction_identifier-field
/NXmicrostructure/quadruple_junction/triple_junction_identifier-field
triple_line_mobility
/NXmicrostructure_gragles_config/ENTRY/triple_line_mobility-group
trunc_species
/NXapm_compositionspace_config/ENTRY/config/autophase/trunc_species-field
tunneling_current
/NXcircuit/tunneling_current-field
tunneling_resistor
/NXiv_bias/tunneling_resistor-field
turbomolecular_pump
/NXapm_msr/instrument/turbomolecular_pump-group
twist
/NXvelocity_selector/twist-field
two_theta
/NXxrd_pan/ENTRY/experiment_config/two_theta-group
/NXxrd_pan/ENTRY/experiment_result/two_theta-field
two_time_corr_func
/NXxpcs/entry/twotime/two_time_corr_func-field
twotheta
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/twotheta-field
twotime
/NXxpcs/entry/twotime-group
type
/NXactuator/type-field
/NXapm/ENTRY/atom_probe/hit_finding/serialized/type-field
/NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/type-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/type-field
/NXapm/ENTRY/atom_probe/ranging/definitions/type-field
/NXapm/ENTRY/atom_probe/raw_data/serialized/type-field
/NXapm/ENTRY/atom_probe/reconstruction/config/type-field
/NXapm/ENTRY/atom_probe/reconstruction/results/type-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/type-field
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field
/NXapm/ENTRY/sample/type-field
/NXapm/ENTRY/serializedID/type-field
/NXapm/ENTRY/specimen/type-field
/NXapm_compositionspace_config/ENTRY/config/ranging/type-field
/NXapm_compositionspace_config/ENTRY/config/reconstruction/type-field
/NXapm_compositionspace_results/ENTRY/config/type-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/type-field
/NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/type-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/type-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/type-field
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/type-field
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/type-field
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/type-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/type-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/type-field
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/type-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/type-field
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/type-field
/NXapm_paraprobe_intersector_results/ENTRY/common/config/type-field
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/type-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/type-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/config/type-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_ranger_config/ENTRY/range/ranging/type-field
/NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/type-field
/NXapm_paraprobe_ranger_results/ENTRY/common/config/type-field
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_selector_config/ENTRY/select/ranging/type-field
/NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/type-field
/NXapm_paraprobe_selector_results/ENTRY/common/config/type-field
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/type-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/type-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/type-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/type-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/type-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/config/type-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/type-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/type-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/config/type-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/type-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/type-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/type-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/type-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/config/type-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/type-field
/NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/type-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/type-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/config/type-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
/NXarchive/entry/instrument/SOURCE/type-field
/NXarchive/entry/sample/type-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field
/NXattenuator/type-field
/NXbeam_path/GRATING/type-field
/NXbeam_path/SOURCE/type-field
/NXbeam_splitter/type-field
/NXcapillary/type-field
/NXcg_alpha_complex/type-field
/NXcollimator/type-field
/NXcoordinate_system/type-field
/NXcrystal/type-field
/NXcs_computer/memory/CIRCUIT/type-field
/NXcs_computer/processing/CIRCUIT/type-field
/NXcs_computer/storage/CIRCUIT/type-field
/NXcs_prng/type-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/type-field
/NXdeflector/type-field
/NXdetector/type-field
/NXdisk_chopper/type-field
/NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/type-field
/NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/type-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/type-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/type-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/type-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/type-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/type-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/type-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/type-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/type-field
/NXem/ENTRY/roiID/ebsd/indexing/source/type-field
/NXem/ENTRY/roiID/ebsd/measurement/source/type-field
/NXem/ENTRY/roiID/ebsd/simulation/source/type-field
/NXem/ENTRY/sample/type-field
/NXem/ENTRY/serializedID/type-field
/NXem_calorimetry/ENTRY/actuator/type-field
/NXem_calorimetry/ENTRY/diffraction/type-field
/NXenvironment/type-field
/NXfermi_chopper/type-field
/NXfiber/type-field
/NXflipper/type-field
/NXfluo/entry/INSTRUMENT/SOURCE/type-field
/NXinsertion_device/type-field
/NXiqproc/ENTRY/instrument/SOURCE/type-field
/NXlens_em/type-field
/NXlens_opt/type-field
/NXmanipulator/type-field
/NXmicrostructure_gragles_config/ENTRY/discretization/grid/type-field
/NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/type-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field
/NXmicrostructure_score_config/ENTRY/deformation/ebsd/type-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field
/NXmirror/type-field
/NXmoderator/type-field
/NXmonitor/type-field
/NXmonopd/entry/INSTRUMENT/SOURCE/type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/type-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/type-field
/NXmpes/ENTRY/INSTRUMENT/energy_resolution/type-field
/NXmpes/ENTRY/INSTRUMENT/flood_gun/type-field
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/type-field
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type-field
/NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/type-field
/NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/type-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field
/NXnote/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/type-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/type-field
/NXpolarizer/type-field
/NXpolarizer_opt/type-field
/NXrefscan/entry/instrument/SOURCE/type-field
/NXresolution/type-field
/NXsample/type-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXsastof/ENTRY/instrument/source/type-field
/NXsensor/type-field
/NXsensor_sts/type-field
/NXserialized/type-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/type-field
/NXsnsevent/ENTRY/instrument/SNS/type-field
/NXsnsevent/ENTRY/instrument/moderator/type-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/type-field
/NXsnshisto/ENTRY/instrument/SNS/type-field
/NXsnshisto/ENTRY/instrument/moderator/type-field
/NXsource/type-field
/NXspindispersion/type-field
/NXsqom/ENTRY/instrument/SOURCE/type-field
/NXsts/ENTRY/type-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field
/NXtomo/entry/instrument/SOURCE/type-field
/NXtomophase/entry/instrument/SOURCE/type-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/type-field
/NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field
/NXtransmission/ENTRY/instrument/DETECTOR/type-field
/NXtransmission/ENTRY/instrument/SOURCE/type-field
/NXvelocity_selector/type-field
/NXwaveplate/type-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXxbase/entry/instrument/source/type-field
type_other
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type_other-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type_other-field
/NXpolarizer_opt/type_other-field
/NXsource/type_other-field
ub_matrix
/NXsample/ub_matrix-field
/NXsingle_crystal/ub_matrix-field
unassigned
/NXsimilarity_grouping/statistics/unassigned-field
uncertainty
/NXaberration/uncertainty-field
uncertainty_model
/NXaberration/uncertainty_model-field
underload_value
/NXdetector/underload_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell
/NXcrystal/unit_cell-field
/NXlauetof/entry/sample/unit_cell-field
/NXsample/unit_cell-field
/NXsingle_crystal/UNIT_CELL-group
/NXtas/entry/SAMPLE/unit_cell-field
/NXxbase/entry/sample/unit_cell-field
unit_cell_a
/NXcrystal/unit_cell_a-field
/NXfilter/unit_cell_a-field
unit_cell_abc
/NXsample/unit_cell_abc-field
/NXsample_component/unit_cell_abc-field
unit_cell_alpha
/NXcrystal/unit_cell_alpha-field
/NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma
/NXsample/unit_cell_alphabetagamma-field
/NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b
/NXcrystal/unit_cell_b-field
/NXfilter/unit_cell_b-field
unit_cell_beta
/NXcrystal/unit_cell_beta-field
/NXfilter/unit_cell_beta-field
unit_cell_c
/NXcrystal/unit_cell_c-field
/NXfilter/unit_cell_c-field
unit_cell_class
/NXsample/unit_cell_class-field
/NXsample_component/unit_cell_class-field
unit_cell_gamma
/NXcrystal/unit_cell_gamma-field
/NXfilter/unit_cell_gamma-field
unit_cell_volume
/NXcrystal/unit_cell_volume-field
/NXfilter/unit_cell_volume-field
/NXsample/unit_cell_volume-field
/NXsample_component/unit_cell_volume-field
upper_cap_radii
/NXcg_cylinder_set/upper_cap_radii-field
upper_cap_surface_area
/NXcg_cylinder_set/upper_cap_surface_area-field
url
/NXcite/url-field
/NXtransmission/ENTRY/operator/url-field
usage
/NXcrystal/usage-field
use
/NXapm_compositionspace_config/ENTRY/config/autophase/use-field
user
/NXapm/ENTRY/USER-group
/NXapm_compositionspace_results/ENTRY/USER-group
/NXapm_paraprobe_tool_common/USER-group
/NXarchive/entry/user-group
/NXem_calorimetry/ENTRY/USER-group
/NXentry/USER-group
/NXevent_data_em/USER-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group
/NXlab_sample_mounting/ENTRY/USER-group
/NXmicrostructure_gragles_config/ENTRY/USER-group
/NXmicrostructure_gragles_results/ENTRY/USER-group
/NXmicrostructure_imm_results/ENTRY/USER-group
/NXmicrostructure_kanapy_results/ENTRY/USER-group
/NXmicrostructure_score_config/ENTRY/USER-group
/NXmicrostructure_score_results/ENTRY/USER-group
/NXmpes/ENTRY/USER-group
/NXoptical_spectroscopy/ENTRY/USER-group
/NXsensor_scan/ENTRY/USER-group
/NXsnsevent/ENTRY/USER-group
/NXsnshisto/ENTRY/USER-group
/NXsubentry/USER-group
/NXtofnpd/entry/user-group
/NXtofraw/entry/user-group
/NXtofsingle/entry/user-group
user_defined_roi
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi-group
userid
/NXapm_paraprobe_clusterer_results/ENTRY/common/userID-group
/NXapm_paraprobe_distancer_results/ENTRY/common/userID-group
/NXapm_paraprobe_intersector_results/ENTRY/common/userID-group
/NXapm_paraprobe_nanochem_results/ENTRY/common/userID-group
/NXapm_paraprobe_ranger_results/ENTRY/common/userID-group
/NXapm_paraprobe_selector_results/ENTRY/common/userID-group
/NXapm_paraprobe_spatstat_results/ENTRY/common/userID-group
/NXapm_paraprobe_surfacer_results/ENTRY/common/userID-group
/NXapm_paraprobe_tessellator_results/ENTRY/common/userID-group
/NXapm_paraprobe_transcoder_results/ENTRY/common/userID-group
/NXem/ENTRY/userID-group
uuid
/NXcs_computer/uuid-field
v_v_spatial_correlation
/NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation-group
v_v_spatial_correlationid
/NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID-group
value
/NXdispersion_single_parameter/value-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXelectrostatic_kicker/read_current/value-field
/NXelectrostatic_kicker/read_voltage/value-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID/value-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID/value-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID/value-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID/value-field
/NXenvironment/value-field
/NXfit_parameter/value-field
/NXlens_em/value-field
/NXlog/value-field
/NXmagnetic_kicker/read_current/value-field
/NXmagnetic_kicker/read_voltage/value-field
/NXmanipulator/cryostat/PID/setpoint_log/value-field
/NXmanipulator/drain_current_amperemeter/value-field
/NXmanipulator/drain_current_amperemeter/value_log/value-field
/NXmanipulator/sample_bias_potentiostat/PID/setpoint_log/value-field
/NXmanipulator/sample_bias_voltmeter/value-field
/NXmanipulator/sample_bias_voltmeter/value_log/value-field
/NXmanipulator/sample_heater/PID/setpoint_log/value-field
/NXmanipulator/sample_heater/heater_power_log/value-field
/NXmanipulator/temperature_sensor/value-field
/NXmanipulator/temperature_sensor/value_log/value-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/value-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/value-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/value-field
/NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log/value-field
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value-field
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log/value-field
/NXmpes/ENTRY/SAMPLE/bias_env/value-field
/NXmpes/ENTRY/SAMPLE/drain_current_env/value-field
/NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun/value-field
/NXmpes/ENTRY/SAMPLE/gas_pressure_env/value-field
/NXmpes/ENTRY/SAMPLE/temperature_env/value-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/value-field
/NXorientation/value-field
/NXpid/pv_sensor/value_log/value-field
/NXpositioner/value-field
/NXpositioner_sts/value-field
/NXquadrupole_magnet/read_current/value-field
/NXquadrupole_magnet/read_voltage/value-field
/NXsensor/value-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field
/NXsensor_sts/value-field
/NXseparator/read_Bfield_current/value-field
/NXseparator/read_Bfield_voltage/value-field
/NXseparator/read_Efield_current/value-field
/NXseparator/read_Efield_voltage/value-field
/NXsnsevent/ENTRY/DASlogs/LOG/value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsnshisto/ENTRY/DASlogs/LOG/value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsolenoid_magnet/read_current/value-field
/NXsolenoid_magnet/read_voltage/value-field
/NXspin_rotator/read_Bfield_current/value-field
/NXspin_rotator/read_Bfield_voltage/value-field
/NXspin_rotator/read_Efield_current/value-field
/NXspin_rotator/read_Efield_voltage/value-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/value-field
/NXxps/ENTRY/FIT/peakPEAK/function/position/value-field
/NXxps/ENTRY/FIT/peakPEAK/function/width/value-field
value_deriv1
/NXsensor/value_deriv1-field
/NXsensor_sts/value_deriv1-field
value_deriv1_log
/NXsensor/value_deriv1_log-group
/NXsensor_sts/value_deriv1_log-group
value_deriv2
/NXsensor/value_deriv2-field
/NXsensor_sts/value_deriv2-field
value_deriv2_log
/NXsensor/value_deriv2_log-group
/NXsensor_sts/value_deriv2_log-group
value_log
/NXmanipulator/drain_current_amperemeter/value_log-group
/NXmanipulator/sample_bias_voltmeter/value_log-group
/NXmanipulator/temperature_sensor/value_log-group
/NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log-group
/NXpid/pv_sensor/value_log-group
/NXsensor/value_log-group
/NXsensor_sts/value_log-group
value_timestamp
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
value_x
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_x-field
value_y
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_y-field
values
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersion_repeated_parameter/values-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
variable
/NXiqproc/ENTRY/DATA/variable-field
variance_grain
/NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_grain-field
variance_subgrain
/NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_subgrain-field
/NXmicrostructure_imm_config/ENTRY/orientation_distribution/variance_subgrain-field
varied_parameter_link
/NXellipsometry/ENTRY/data_collection/varied_parameter_link-field
varphi_one
/NXmicrostructure_odf/phi_two_plot/varphi_one-field
varphi_two
/NXmicrostructure_odf/phi_two_plot/varphi_two-field
vector
/NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity
/NXpositioner/velocity-field
/NXpositioner_sts/velocity-field
velocity_selector
/NXinstrument/VELOCITY_SELECTOR-group
/NXmonochromator/VELOCITY_SELECTOR-group
vendor
/NXapm/ENTRY/measurement/instrument/fabrication/vendor-field
/NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/vendor-field
/NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/vendor-field
/NXapm/ENTRY/measurement/instrument/pulser/fabrication/vendor-field
/NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/vendor-field
/NXapm/ENTRY/measurement/instrument/reflectron/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/detectorID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/vendor-field
/NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/vendor-field
/NXfabrication/vendor-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field
/NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/device_information/vendor-field
/NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/vendor-field
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/vendor-field
version
/NXellipsometry/ENTRY/data_collection/data_software/version-field
/NXiqproc/ENTRY/reduction/version-field
/NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/version-field
/NXprocess/version-field
/NXprocess_mpes/version-field
/NXsnsevent/ENTRY/SNSHistoTool/version-field
/NXsnshisto/ENTRY/SNSHistoTool/version-field
/NXsqom/ENTRY/reduction/version-field
/NXtomoproc/entry/reconstruction/version-field
/NXxasproc/ENTRY/XAS_data_reduction/version-field
vertex_identifier
/NXcg_face_list_data_structure/vertex_identifier-field
vertex_identifier_offset
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertex_identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertex_identifier_offset-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertex_identifier_offset-field
/NXcg_face_list_data_structure/vertex_identifier_offset-field
/NXcg_half_edge_data_structure/vertex_identifier_offset-field
vertex_incident_half_edge
/NXcg_half_edge_data_structure/vertex_incident_half_edge-field
vertex_normal
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal-group
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal-field
/NXcg_hexahedron_set/vertex_normal-group
/NXcg_primitive_set/vertex_normal-group
vertex_normal_orientation
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal_orientation-field
vertex_normals
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertex_normals-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertex_normals-field
vertices
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/vertices-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertices-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertices-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertices-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra/vertices-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertices-field
/NXcg_face_list_data_structure/vertices-field
/NXcg_polyline_set/vertices-field
/NXcylindrical_geometry/vertices-field
/NXoff_geometry/vertices-field
vertices_are_unique
/NXcg_face_list_data_structure/vertices_are_unique-field
/NXcg_polyline_set/vertices_are_unique-field
virtual_pixel_interpolation_applied
/NXdetector/virtual_pixel_interpolation_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
visualization
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization-group
voltage
/NXdeflector/voltage-field
/NXebeam_column/electron_source/voltage-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/voltage-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/voltage-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/voltage-field
/NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/voltage-field
/NXibeam_column/ion_source/voltage-field
/NXiv_temp/ENTRY/DATA/voltage-field
/NXlens_em/voltage-field
/NXreflectron/voltage-field
/NXsource/voltage-field
voltage_and_bowl
/NXapm/ENTRY/atom_probe/voltage_and_bowl-group
voltage_controller
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
voltage_energy_range
/NXelectronanalyser/voltage_energy_range-field
voltmeter
/NXmpes/ENTRY/SAMPLE/bias_env/voltmeter-group
volume
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/volume-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/volume-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/volume-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/volume-field
/NXatom_set/volume-field
/NXcg_hexahedron_set/volume-field
/NXcg_primitive_set/volume-field
/NXcrystal_structure/volume-field
/NXion/volume-field
/NXmicrostructure/crystal/volume-field
/NXmicrostructure/triple_junction/volume-field
/NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/volume-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/volume-field
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field
/NXunit_cell/volume-field
volume_fraction
/NXmicrostructure_odf/kth_extrema/volume_fraction-field
/NXsample/volume_fraction-field
/NXsample_component/volume_fraction-field
/NXsample_component_set/volume_fraction-field
volumetric_features
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features-group
voronoi_cells
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells-group
voxel
/NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/voxel-field
voxel_identifier
/NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/voxel_identifier-field
voxelization
/NXapm_compositionspace_config/ENTRY/config/voxelization-group
/NXapm_compositionspace_results/ENTRY/voxelization-group
wall
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall-group
wall_contact_bottom
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom-group
wall_contact_front
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front-group
wall_contact_global
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global-group
wall_contact_left
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left-group
wall_contact_rear
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear-group
wall_contact_right
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right-group
wall_contact_top
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top-group
warmup
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/warmup-field
/NXcs_prng/warmup-field
wavelength
/NXapm/ENTRY/measurement/instrument/pulser/sourceID/wavelength-field
/NXcrystal/wavelength-field
/NXdetector/efficiency/wavelength-field
/NXdispersion_table/wavelength-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/wavelength-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/wavelength-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/wavelength-field
/NXfermi_chopper/wavelength-field
/NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
/NXguide/reflectivity/wavelength-field
/NXmonochromator/wavelength-field
/NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
/NXpulser_apm/SOURCE/wavelength-field
/NXraman/ENTRY/INSTRUMENT/beam_incident/wavelength-field
/NXrefscan/entry/instrument/monochromator/wavelength-field
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field
/NXsource/wavelength-field
/NXtransmission/ENTRY/instrument/spectrometer/wavelength-field
/NXvelocity_selector/wavelength-field
/NXxbase/entry/instrument/monochromator/wavelength-field
/NXxlaue/entry/instrument/source/distribution/wavelength-field
wavelength_calibration
/NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration-group
wavelength_dispersion
/NXmonochromator/wavelength_dispersion-field
wavelength_error
/NXmonochromator/wavelength_error-field
wavelength_errors
/NXmonochromator/wavelength_errors-field
wavelength_identifier
/NXdispersion_function/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_identifier-field
wavelength_max
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
/NXdispersion_function/wavelength_max-field
wavelength_min
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
/NXdispersion_function/wavelength_min-field
wavelength_range
/NXbeam_splitter/wavelength_range-field
/NXdisk_chopper/wavelength_range-field
/NXpolarizer_opt/wavelength_range-field
/NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field
/NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
wavelength_range_coating
/NXbeam_splitter/coating/wavelength_range_coating-field
/NXwaveplate/coating/wavelength_range_coating-field
wavelength_resolution
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution-group
wavelength_spread
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field
/NXvelocity_selector/wavelength_spread-field
wavelength_unit
/NXdispersion_function/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_unit-field
wavelengths
/NXwaveplate/wavelengths-field
waveplate
/NXbeam_path/WAVEPLATE-group
/NXoptical_spectroscopy/ENTRY/INSTRUMENT/WAVEPLATE-group
wedge_angle
/NXbeam_splitter/SHAPE/wedge_angle-field
/NXpolarizer_opt/SHAPE/wedge_angle-field
weight
/NXapm_compositionspace_results/ENTRY/voxelization/elementID/weight-field
/NXapm_compositionspace_results/ENTRY/voxelization/weight-field
/NXdelocalization/weighting_model/weight-field
/NXmicrostructure_odf/sampling/weight-field
weighting_method
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/weighting_method-field
/NXdelocalization/weighting_model/weighting_method-field
weighting_model
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model-group
/NXdelocalization/weighting_model-group
weights
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/weights-field
/NXem_eds/indexing/IMAGE_SET/PROCESS/weights-field
weinberg_vector
/NXcg_half_edge_data_structure/weinberg_vector-field
width
/NXcg_hexahedron_set/width-field
/NXcg_primitive_set/width-field
/NXfermi_chopper/width-field
/NXvelocity_selector/width-field
/NXxps/ENTRY/FIT/peakPEAK/function/width-group
winding_order
/NXcg_face_list_data_structure/winding_order-field
/NXoff_geometry/winding_order-field
window
/NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window-group
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window-group
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window-group
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window-group
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window-group
/NXapm_paraprobe_ranger_results/ENTRY/iontypes/window-group
/NXapm_paraprobe_selector_results/ENTRY/roi/window-group
/NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window-group
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window-group
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window-group
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window-group
/NXapm_paraprobe_tool_results/window-group
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window-group
window_correction
/NXopt_window/ENTRY/window_correction-group
window_effects_corrected
/NXopt_window/ENTRY/window_effects_corrected-field
window_effects_type
/NXopt_window/ENTRY/window_effects_type-field
window_number
/NXbeam_path/window_NUMBER-group
window_triangles
/NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles-group
windowing_method
/NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/windowing_method-field
/NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/windowing_method-field
/NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/windowing_method-field
/NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/windowing_method-field
/NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/windowing_method-field
/NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/windowing_method-field
/NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/windowing_method-field
/NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/windowing_method-field
/NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/windowing_method-field
/NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/windowing_method-field
/NXspatial_filter/windowing_method-field
work_function
/NXelectronanalyser/work_function-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field
/NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field
workflow_step_description
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
workflow_step_identifier
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_identifier-field
working_distance
/NXcapillary/working_distance-field
/NXcollectioncolumn/working_distance-field
/NXoptical_system_em/working_distance-field
x
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
/NXbeam_stop/x-field
/NXcoordinate_system/x-field
/NXcxi_ptycho/DATA/x-link
/NXdata/x-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/x-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/x-field
/NXmicrostructure_score_config/ENTRY/sampling/x-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/x-field
/NXtomoproc/entry/data/x-field
/NXxps/ENTRY/geometries/xps_coordinate_system/x-field
x_alias
/NXcoordinate_system/x_alias-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field
x_axis_direction
/NXmicrostructure_mtex_config/conventions/x_axis_direction-field
x_boundary_convention
/NXem/ENTRY/roiID/ebsd/pattern_centre/x_boundary_convention-field
/NXem_ebsd/pattern_centre/x_boundary_convention-field
x_direction
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/x_direction-field
/NXcoordinate_system/x_direction-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/x_direction-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/x_direction-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/x_direction-field
/NXem_ebsd/gnomonic_reference_frame/x_direction-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
x_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field
/NXslit/x_gap-field
x_indices
/NXcxi_ptycho/DATA/x_indices-field
x_normalization_direction
/NXem/ENTRY/roiID/ebsd/pattern_centre/x_normalization_direction-field
/NXem_ebsd/pattern_centre/x_normalization_direction-field
x_pixel_offset
/NXdetector/x_pixel_offset-field
/NXsnsevent/ENTRY/DATA/x_pixel_offset-link
/NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field
/NXsnshisto/ENTRY/DATA/x_pixel_offset-link
/NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field
/NXdetector/x_pixel_size-field
/NXlauetof/entry/instrument/detector/x_pixel_size-field
/NXreftof/entry/instrument/detector/x_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXsastof/ENTRY/instrument/detector/x_pixel_size-field
/NXtomo/entry/instrument/detector/x_pixel_size-field
/NXtomophase/entry/instrument/sample/x_pixel_size-field
/NXxbase/entry/instrument/detector/x_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
x_position
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field
/NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position
/NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
x_target
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_target-field
x_translation
/NXsample/x_translation-field
/NXtomo/entry/sample/x_translation-field
/NXtomophase/entry/sample/x_translation-field
/NXxbase/entry/sample/x_translation-field
x_value
/NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_value-field
xas_data_reduction
/NXxasproc/ENTRY/XAS_data_reduction-group
xdmf_cell_identifier
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_cell_identifier-field
xdmf_cylinder
/NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder-group
xdmf_feature_identifier
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_feature_identifier-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_feature_identifier-field
xdmf_gradient
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_gradient-field
xdmf_intensity
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_intensity-field
xdmf_topology
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_topology-field
/NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/xdmf_topology-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/xdmf_topology-field
/NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/xdmf_topology-field
/NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_topology-field
/NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization/xdmf_topology-field
xdmf_xyz
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_xyz-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_xyz-field
xpos
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xpos-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xpos-field
xps_coordinate_system
/NXxps/ENTRY/geometries/xps_coordinate_system-group
xray_tube_current
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_current-field
xray_tube_material
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_material-field
xray_tube_voltage
/NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_voltage-field
xraylens
/NXbeam_path/XRAYLENS-group
/NXinstrument/XRAYLENS-group
y
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
/NXbeam_stop/y-field
/NXcoordinate_system/y-field
/NXcxi_ptycho/DATA/y-link
/NXdata/y-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/y-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/y-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/y-field
/NXtomoproc/entry/data/y-field
/NXxps/ENTRY/geometries/xps_coordinate_system/y-field
y_alias
/NXcoordinate_system/y_alias-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field
y_boundary_convention
/NXem/ENTRY/roiID/ebsd/pattern_centre/y_boundary_convention-field
/NXem_ebsd/pattern_centre/y_boundary_convention-field
y_control_p_gain
/NXsts/ENTRY/reproducibility_indicators/y_control_p_gain-field
y_direction
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/y_direction-field
/NXcoordinate_system/y_direction-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/y_direction-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/y_direction-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/y_direction-field
/NXem_ebsd/gnomonic_reference_frame/y_direction-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
y_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field
/NXslit/y_gap-field
/NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
y_indices
/NXcxi_ptycho/DATA/y_indices-field
y_normalization_direction
/NXem/ENTRY/roiID/ebsd/pattern_centre/y_normalization_direction-field
/NXem_ebsd/pattern_centre/y_normalization_direction-field
y_pixel_offset
/NXdetector/y_pixel_offset-field
/NXsnsevent/ENTRY/DATA/y_pixel_offset-link
/NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field
/NXsnshisto/ENTRY/DATA/y_pixel_offset-link
/NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field
/NXdetector/y_pixel_size-field
/NXlauetof/entry/instrument/detector/y_pixel_size-field
/NXreftof/entry/instrument/detector/y_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXsastof/ENTRY/instrument/detector/y_pixel_size-field
/NXtomo/entry/instrument/detector/y_pixel_size-field
/NXtomophase/entry/instrument/sample/y_pixel_size-field
/NXxbase/entry/instrument/detector/y_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
y_position
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field
/NXcanSAS/ENTRY/SAMPLE/y_position-field
y_pred
/NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/y_pred-field
y_rotation_axis_pixel_position
/NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
y_translation
/NXtomo/entry/sample/y_translation-field
/NXtomophase/entry/sample/y_translation-field
/NXxbase/entry/sample/y_translation-field
yaw
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field
/NXcanSAS/ENTRY/SAMPLE/yaw-field
ypos
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/ypos-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/ypos-field
z
/NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
/NXcoordinate_system/z-field
/NXdata/z-field
/NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/z-field
/NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/z-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z_controller/z-field
/NXtomoproc/entry/data/z-field
/NXxps/ENTRY/geometries/xps_coordinate_system/z-field
z_alias
/NXcoordinate_system/z_alias-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field
z_avg_time
/NXbias_spectroscopy/z_avg_time-field
/NXiv_bias/z_avg_time-field
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/z_avg_time-field
/NXsts/ENTRY/resolution_indicators/z_avg_time-field
z_axis_direction
/NXmicrostructure_mtex_config/conventions/z_axis_direction-field
z_ccontroller_hold
/NXbias_spectroscopy/z_ccontroller_hold-field
z_control_hold
/NXsts/ENTRY/reproducibility_indicators/z_control_hold-field
z_control_i_gain
/NXsts/ENTRY/reproducibility_indicators/z_control_i_gain-field
z_control_switchoff_delay
/NXsts/ENTRY/reproducibility_indicators/z_control_switchoff_delay-field
z_control_time
/NXbias_spectroscopy/z_control_time-field
/NXiv_bias/z_control_time-field
/NXsts/ENTRY/reproducibility_indicators/z_control_time-field
z_control_time_const
/NXsts/ENTRY/reproducibility_indicators/z_control_time_const-field
z_control_tip_lift
/NXsts/ENTRY/reproducibility_indicators/z_control_tip_lift-field
z_controller
/NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z_controller-group
z_controller_hold
/NXiv_bias/z_controller_hold-field
/NXpositioner_sts/z_controller_hold-field
z_controller_name
/NXsts/ENTRY/reproducibility_indicators/z_controller_name-field
z_controller_setpoint
/NXsts/ENTRY/reproducibility_indicators/z_controller_setpoint-field
z_controller_status
/NXsts/ENTRY/reproducibility_indicators/z_controller_status-field
z_contronller
/NXpositioner_sts/z_contronller-field
z_direction
/NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/z_direction-field
/NXcoordinate_system/z_direction-field
/NXem/ENTRY/coordinate_system_set/detector_reference_frameID/z_direction-field
/NXem/ENTRY/coordinate_system_set/processing_reference_frame/z_direction-field
/NXem/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
/NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/z_direction-field
/NXem_ebsd/gnomonic_reference_frame/z_direction-field
/NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
/NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
/NXxps/ENTRY/geometries/xps_coordinate_system/z_direction-field
z_offset
/NXbias_spectroscopy/z_offset-field
/NXiv_bias/z_offset-field
/NXpositioner_sts/z_offset-field
/NXsts/ENTRY/reproducibility_indicators/z_offset-field
z_pixel_offset
/NXdetector/z_pixel_offset-field
z_translation
/NXtomo/entry/sample/z_translation-field
/NXtomophase/entry/sample/z_translation-field
zener_smith
/NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith-group
zlp_correction
/NXem_eels/zlp_correction-group
zone_height
/NXfresnel_zone_plate/zone_height-field
zone_material
/NXfresnel_zone_plate/zone_material-field
zone_support_material
/NXfresnel_zone_plate/zone_support_material-field
zpos
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/zpos-field
/NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/zpos-field

written: 2024-11-22T13:47:39.690518