NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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@angular0_indices: /NXmpes_arpes/ENTRY/data@angular0_indices-attribute
@angular1_indices: /NXmpes_arpes/ENTRY/data@angular1_indices-attribute
@auxiliary_signals: /NXdata@auxiliary_signals-attribute
@axes: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@axes-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@axes-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@axes-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@axes-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@axes-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX@axes-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX@axes-attribute; /NXcxi_ptycho/DATA@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute; /NXdata/DATA@axes-attribute; /NXdata@axes-attribute; /NXdetector/efficiency@axes-attribute; /NXelectronanalyzer/transmission_function@axes-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend@axes-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map@axes-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi@axes-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d@axes-attribute; /NXem/ENTRY/ROI/eds/indexing/summary@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d@axes-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d@axes-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND@axes-attribute; /NXguide/reflectivity@axes-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure@axes-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure@axes-attribute; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution@axes-attribute; /NXmicrostructure_score_config/ENTRY/time_temperature@axes-attribute; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@axes-attribute; /NXmpes/ENTRY/transmission_correction/transmission_function@axes-attribute; /NXmpes_arpes/ENTRY/data@axes-attribute; /NXoptical_spectroscopy/ENTRY/DATA@axes-attribute; /NXtransmission/ENTRY/data@axes-attribute
@axis: /NXdata/AXISNAME@axis-attribute; /NXdetector/time_of_flight@axis-attribute; /NXdetector/x_pixel_offset@axis-attribute; /NXdetector/y_pixel_offset@axis-attribute; /NXdetector/z_pixel_offset@axis-attribute
@axisname_indices: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@AXISNAME_indices-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@AXISNAME_indices-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@AXISNAME_indices-attribute; /NXdata@AXISNAME_indices-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend@AXISNAME_indices-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map@AXISNAME_indices-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi@AXISNAME_indices-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d@AXISNAME_indices-attribute; /NXem/ENTRY/ROI/eds/indexing/summary@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d@AXISNAME_indices-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d@AXISNAME_indices-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND@AXISNAME_indices-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure@AXISNAME_indices-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure@AXISNAME_indices-attribute
@baseline_reference: /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func@baseline_reference-attribute; /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute; /NXxpcs/ENTRY/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class: /NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/DATA@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute; /NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute; /NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute; /NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute; /NXcanSAS/ENTRY@canSAS_class-attribute
@cas_name: /NXsubstance/identifier_cas@cas_name-attribute
@cas_number: /NXsubstance/identifier_cas@cas_number-attribute
@characteristics_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics@characteristics_type-attribute
@check_sum: /NXdetector/data@check_sum-attribute
@comment: /NXentry/revision@comment-attribute; /NXinstrument_em/stage/rotation@comment-attribute; /NXinstrument_em/stage/tilt1@comment-attribute; /NXinstrument_em/stage/tilt2@comment-attribute; /NXsubentry/revision@comment-attribute
@components: /NXsample_component_set@components-attribute
@configuration: /NXentry/program_name@configuration-attribute; /NXsubentry/program_name@configuration-attribute
@creator: /NXroot@creator-attribute
@creator_version: /NXroot@creator_version-attribute
@default: /NXcalibration@default-attribute; /NXcanSAS/ENTRY@default-attribute; /NXentry@default-attribute; /NXfit_background@default-attribute; /NXobject@default-attribute; /NXroot@default-attribute; /NXsensor_scan/ENTRY@default-attribute; /NXsubentry@default-attribute
@default_slice: /NXdata@default_slice-attribute
@depends_on: /NXapm/ENTRY/atom_probe/hit_finding/hit_positions@depends_on-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions@depends_on-attribute; /NXapm_reconstruction/reconstructed_positions@depends_on-attribute; /NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute; /NXdetector_module/fast_pixel_direction@depends_on-attribute; /NXdetector_module/module_offset@depends_on-attribute; /NXdetector_module/slow_pixel_direction@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_dispersion@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_elevation@depends_on-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_rotation@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@depends_on-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@depends_on-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@depends_on-attribute; /NXtransformations/AXISNAME@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_polar_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_polar_angle_of_incidence@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@depends_on-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@depends_on-attribute
@description: /NXelectrostatic_kicker/timing@description-attribute; /NXfit_function/fit_parameters/TERM@description-attribute; /NXmagnetic_kicker/timing@description-attribute; /NXreflections/background_mean@description-attribute; /NXreflections/bounding_box@description-attribute; /NXreflections/d@description-attribute; /NXreflections/det_module@description-attribute; /NXreflections/entering@description-attribute; /NXreflections/flags@description-attribute; /NXreflections/h@description-attribute; /NXreflections/id@description-attribute; /NXreflections/int_prf@description-attribute; /NXreflections/int_prf_errors@description-attribute; /NXreflections/int_prf_var@description-attribute; /NXreflections/int_sum@description-attribute; /NXreflections/int_sum_errors@description-attribute; /NXreflections/int_sum_var@description-attribute; /NXreflections/k@description-attribute; /NXreflections/l@description-attribute; /NXreflections/lp@description-attribute; /NXreflections/observed_frame@description-attribute; /NXreflections/observed_frame_errors@description-attribute; /NXreflections/observed_frame_var@description-attribute; /NXreflections/observed_phi@description-attribute; /NXreflections/observed_phi_errors@description-attribute; /NXreflections/observed_phi_var@description-attribute; /NXreflections/observed_px_x@description-attribute; /NXreflections/observed_px_x_errors@description-attribute; /NXreflections/observed_px_x_var@description-attribute; /NXreflections/observed_px_y@description-attribute; /NXreflections/observed_px_y_errors@description-attribute; /NXreflections/observed_px_y_var@description-attribute; /NXreflections/observed_x@description-attribute; /NXreflections/observed_x_errors@description-attribute; /NXreflections/observed_x_var@description-attribute; /NXreflections/observed_y@description-attribute; /NXreflections/observed_y_errors@description-attribute; /NXreflections/observed_y_var@description-attribute; /NXreflections/overlaps@description-attribute; /NXreflections/partiality@description-attribute; /NXreflections/polar_angle@description-attribute; /NXreflections/predicted_frame@description-attribute; /NXreflections/predicted_phi@description-attribute; /NXreflections/predicted_px_x@description-attribute; /NXreflections/predicted_px_y@description-attribute; /NXreflections/predicted_x@description-attribute; /NXreflections/predicted_y@description-attribute; /NXreflections/prf_cc@description-attribute; /NXreflections/reflection_id@description-attribute; /NXreflections@description-attribute; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
@direction: /NXsample/electric_field@direction-attribute; /NXsample/magnetic_field@direction-attribute; /NXsample/stress_field@direction-attribute
@distribution: /NXdata/AXISNAME@distribution-attribute
@energy_indices: /NXmpes/ENTRY/data@energy_indices-attribute; /NXmpes_arpes/ENTRY/data@energy_indices-attribute; /NXxps/ENTRY/data@energy_indices-attribute
@epoch_start: /NXem_ebsd/measurement/time@epoch_start-attribute
@equipment_component: /NXtransformations/AXISNAME@equipment_component-attribute
@estimated: /NXactivity/end_time@estimated-attribute
@file_name: /NXroot@file_name-attribute
@file_time: /NXroot@file_time-attribute
@file_update_time: /NXroot@file_update_time-attribute
@first_good: /NXdata/AXISNAME@first_good-attribute
@first_point_for_fit: /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@fixed: /NXfit_function/fit_parameters/TERM@fixed-attribute
@flux: /NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency: /NXdetector/raw_time_of_flight@frequency-attribute
@frog_leap_scan: /NXscan_control/linear_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/mesh_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/snake_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/spiral_SCAN/stepping_N@frog_leap_scan-attribute; /NXscan_control/traj_SCAN/stepping_N@frog_leap_scan-attribute
@h5py_version: /NXroot@h5py_version-attribute
@hdf5_version: /NXroot@HDF5_Version-attribute
@hdf_version: /NXroot@HDF_version-attribute
@i_axes: /NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version: /NXentry@IDF_Version-attribute; /NXsubentry@IDF_Version-attribute
@index: /NXarchive/ENTRY@index-attribute
@input: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX@input-attribute
@input_path: /NXcalibration/fit_formula_inputs/TERM@input_path-attribute; /NXcalibration/original_axis@input_path-attribute
@interpretation: /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@iteration_indices: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@iteration_indices-attribute
@last_good: /NXdata/AXISNAME@last_good-attribute
@local_name: /NXdetector/crate@local_name-attribute; /NXdetector/input@local_name-attribute; /NXdetector/slot@local_name-attribute
@logged_against: /NXinstrument_apm/pulser/SOURCE/BEAM/incidence_vector@logged_against-attribute; /NXinstrument_apm/pulser/SOURCE/BEAM/pinhole_position@logged_against-attribute; /NXinstrument_apm/pulser/SOURCE/BEAM/spot_position@logged_against-attribute; /NXinstrument_apm/pulser/SOURCE/pulse_energy@logged_against-attribute; /NXinstrument_apm/pulser/pulse_fraction@logged_against-attribute; /NXinstrument_apm/pulser/pulse_frequency@logged_against-attribute; /NXinstrument_apm/pulser/pulse_number@logged_against-attribute; /NXinstrument_apm/pulser/pulse_voltage@logged_against-attribute; /NXinstrument_apm/pulser/standing_voltage@logged_against-attribute
@long_name: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i@long_name-attribute; /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j@long_name-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y@long_name-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z@long_name-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance@long_name-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result/identifier_axis_feature@long_name-attribute; /NXdata/AXISNAME@long_name-attribute; /NXdata/DATA@long_name-attribute; /NXdetector/data@long_name-attribute; /NXdetector/time_of_flight@long_name-attribute; /NXdetector/x_pixel_offset@long_name-attribute; /NXdetector/y_pixel_offset@long_name-attribute; /NXdetector/z_pixel_offset@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/axis_x@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/axis_y@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/data@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_x@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_y@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_z@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/data@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_x@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_y@long_name-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_z@long_name-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_i@long_name-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_j@long_name-attribute; /NXem/ENTRY/ROI/eds/indexing/summary/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/identifier_group@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/identifier_image@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/identifier_group@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/identifier_image@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/identifier_group@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/identifier_image@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/imag@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/magnitude@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/real@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/identifier_spectrum@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/identifier_spectrum@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/identifier_spectrum@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/intensity@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_energy@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_i@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_j@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_k@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/identifier_spectrum@long_name-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/intensity@long_name-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/identifier_pattern@long_name-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/intensity@long_name-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/s@long_name-attribute; /NXem_ebsd/indexing/roi/axis_x@long_name-attribute; /NXem_ebsd/indexing/roi/axis_y@long_name-attribute; /NXem_ebsd/indexing/roi/data@long_name-attribute; /NXem_eds/indexing/summary/axis_energy@long_name-attribute; /NXem_eds/indexing/summary/intensity@long_name-attribute; /NXimage/image_1d/axis_i@long_name-attribute; /NXimage/image_2d/axis_i@long_name-attribute; /NXimage/image_2d/axis_j@long_name-attribute; /NXimage/image_3d/axis_i@long_name-attribute; /NXimage/image_3d/axis_j@long_name-attribute; /NXimage/image_3d/axis_k@long_name-attribute; /NXimage/stack_1d/axis_i@long_name-attribute; /NXimage/stack_1d/identifier_group@long_name-attribute; /NXimage/stack_1d/identifier_image@long_name-attribute; /NXimage/stack_2d/axis_i@long_name-attribute; /NXimage/stack_2d/axis_j@long_name-attribute; /NXimage/stack_2d/identifier_group@long_name-attribute; /NXimage/stack_2d/identifier_image@long_name-attribute; /NXimage/stack_3d/axis_i@long_name-attribute; /NXimage/stack_3d/axis_j@long_name-attribute; /NXimage/stack_3d/axis_k@long_name-attribute; /NXimage/stack_3d/identifier_group@long_name-attribute; /NXimage/stack_3d/identifier_image@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/x@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/y@long_name-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/z@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/x@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/y@long_name-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/z@long_name-attribute; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution/radius@long_name-attribute; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution/time@long_name-attribute; /NXmicrostructure_score_config/ENTRY/time_temperature/temperature@long_name-attribute; /NXmicrostructure_score_config/ENTRY/time_temperature/time@long_name-attribute; /NXspectrum/spectrum_0d/axis_energy@long_name-attribute; /NXspectrum/spectrum_0d/intensity@long_name-attribute; /NXspectrum/spectrum_1d/axis_energy@long_name-attribute; /NXspectrum/spectrum_1d/axis_i@long_name-attribute; /NXspectrum/spectrum_1d/intensity@long_name-attribute; /NXspectrum/spectrum_2d/axis_energy@long_name-attribute; /NXspectrum/spectrum_2d/axis_i@long_name-attribute; /NXspectrum/spectrum_2d/axis_j@long_name-attribute; /NXspectrum/spectrum_2d/intensity@long_name-attribute; /NXspectrum/spectrum_3d/axis_energy@long_name-attribute; /NXspectrum/spectrum_3d/axis_i@long_name-attribute; /NXspectrum/spectrum_3d/axis_j@long_name-attribute; /NXspectrum/spectrum_3d/axis_k@long_name-attribute; /NXspectrum/spectrum_3d/intensity@long_name-attribute; /NXspectrum/stack_0d/axis_energy@long_name-attribute; /NXspectrum/stack_0d/identifier_group@long_name-attribute; /NXspectrum/stack_0d/identifier_spectrum@long_name-attribute; /NXspectrum/stack_0d/intensity@long_name-attribute; /NXspectrum/stack_2d/axis_energy@long_name-attribute; /NXspectrum/stack_2d/axis_i@long_name-attribute; /NXspectrum/stack_2d/axis_j@long_name-attribute; /NXspectrum/stack_2d/identifier_group@long_name-attribute; /NXspectrum/stack_2d/identifier_spectrum@long_name-attribute; /NXspectrum/stack_2d/intensity@long_name-attribute; /NXspectrum/stack_3d/axis_energy@long_name-attribute; /NXspectrum/stack_3d/axis_i@long_name-attribute; /NXspectrum/stack_3d/axis_j@long_name-attribute; /NXspectrum/stack_3d/axis_k@long_name-attribute; /NXspectrum/stack_3d/identifier_group@long_name-attribute; /NXspectrum/stack_3d/identifier_spectrum@long_name-attribute; /NXspectrum/stack_3d/intensity@long_name-attribute
@mask: /NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices: /NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@max_value: /NXfit_function/fit_parameters/TERM@max_value-attribute
@metric: /NXfit/figure_of_meritMETRIC@metric-attribute; /NXxps/ENTRY/FIT/figure_of_meritMETRIC@metric-attribute
@mime_type: /NXsubentry/thumbnail@mime_type-attribute
@min_value: /NXfit_function/fit_parameters/TERM@min_value-attribute
@name: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute; /NXcanSAS/ENTRY/run@name-attribute
@nexus_release: /NXroot@NeXus_release-attribute
@nexus_repository: /NXroot@NeXus_repository-attribute
@nexus_version: /NXroot@NeXus_version-attribute
@nx_class: /NXroot@NX_class-attribute
@offset: /NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute; /NXdetector_module/fast_pixel_direction@offset-attribute; /NXdetector_module/module_offset@offset-attribute; /NXdetector_module/slow_pixel_direction@offset-attribute; /NXevent_data/event_time_zero@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute; /NXtomoproc/ENTRY/data/data@offset-attribute; /NXtransformations/AXISNAME@offset-attribute
@offset_units: /NXdetector_module/fast_pixel_direction@offset_units-attribute; /NXdetector_module/module_offset@offset_units-attribute; /NXdetector_module/slow_pixel_direction@offset_units-attribute; /NXtransformations/AXISNAME@offset_units-attribute
@output: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX@output-attribute
@partial: /NXroot@partial-attribute
@populated_elements: /NXxpcs/ENTRY/twotime/two_time_corr_func@populated_elements-attribute
@porto_notation_vectors: /NXraman/ENTRY/INSTRUMENT/scattering_configuration@porto_notation_vectors-attribute
@primary: /NXdetector/time_of_flight@primary-attribute; /NXdetector/x_pixel_offset@primary-attribute; /NXdetector/y_pixel_offset@primary-attribute; /NXdetector/z_pixel_offset@primary-attribute
@program_url: /NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
@pub_chem_link: /NXsubstance/identifier_pub_chem@pub_chem_link-attribute
@q_indices: /NXcanSAS/ENTRY/DATA@Q_indices-attribute
@radius_indices: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution@radius_indices-attribute
@reference: /NXdata/AXISNAME@reference-attribute; /NXdata/DATA@reference-attribute; /NXdata@reference-attribute; /NXmpes/ENTRY/data/energy@reference-attribute; /NXmpes_arpes/ENTRY/data/angular0@reference-attribute; /NXmpes_arpes/ENTRY/data/angular1@reference-attribute; /NXmpes_arpes/ENTRY/data/energy@reference-attribute; /NXxps/ENTRY/data/energy@reference-attribute
@reference_beam: /NXbeam/pulse_delay@reference_beam-attribute
@reference_frame: /NXatom/position@reference_frame-attribute
@region_type: /NXregion@region_type-attribute
@resolutions: /NXcanSAS/ENTRY/DATA/Q@resolutions-attribute
@resolutions_description: /NXcanSAS/ENTRY/DATA/Q@resolutions_description-attribute
@scaling: /NXtomoproc/ENTRY/data/data@scaling-attribute
@scaling_factor: /NXcanSAS/ENTRY/DATA/I@scaling_factor-attribute; /NXlog/cue_timestamp_zero@scaling_factor-attribute; /NXlog/time@scaling_factor-attribute
@short_name: /NXelectronanalyzer/name@short_name-attribute; /NXinstrument/name@short_name-attribute; /NXmx/ENTRY/INSTRUMENT/name@short_name-attribute; /NXmx/ENTRY/SOURCE/name@short_name-attribute; /NXsource/name@short_name-attribute
@signal: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@signal-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@signal-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@signal-attribute; /NXapm_compositionspace_results/ENTRY/autophase/result@signal-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@signal-attribute; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@signal-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX@signal-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX@signal-attribute; /NXcanSAS/ENTRY/DATA@signal-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@signal-attribute; /NXcxi_ptycho/DATA@signal-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1@signal-attribute; /NXdata/DATA@signal-attribute; /NXdata@signal-attribute; /NXdetector/efficiency@signal-attribute; /NXelectronanalyzer/transmission_function@signal-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend@signal-attribute; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map@signal-attribute; /NXem/ENTRY/ROI/ebsd/indexing/roi@signal-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d@signal-attribute; /NXem/ENTRY/ROI/eds/indexing/summary@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d@signal-attribute; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d@signal-attribute; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND@signal-attribute; /NXguide/reflectivity@signal-attribute; /NXlauetof/ENTRY/instrument/detector/data@signal-attribute; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure@signal-attribute; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure@signal-attribute; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution@signal-attribute; /NXmicrostructure_score_config/ENTRY/time_temperature@signal-attribute; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@signal-attribute; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data@signal-attribute; /NXmpes/ENTRY/data@signal-attribute; /NXmpes/ENTRY/transmission_correction/transmission_function@signal-attribute; /NXmpes_arpes/ENTRY/data@signal-attribute; /NXoptical_spectroscopy/ENTRY/DATA@signal-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data@signal-attribute; /NXsas/ENTRY/DATA@signal-attribute; /NXxbase/ENTRY/instrument/detector/data@signal-attribute
@spiral_direction: /NXscan_control/spiral_SCAN/scan_speed_N@spiral_direction-attribute
@start: /NXdetector/start_time@start-attribute; /NXdetector/stop_time@start-attribute; /NXdisk_chopper/top_dead_center@start-attribute; /NXevent_data/cue_timestamp_zero@start-attribute; /NXlog/cue_timestamp_zero@start-attribute; /NXlog/time@start-attribute
@storage_mode: /NXxpcs/ENTRY/data/G2_unnormalized@storage_mode-attribute; /NXxpcs/ENTRY/data/delay_difference@storage_mode-attribute; /NXxpcs/ENTRY/data/g2@storage_mode-attribute; /NXxpcs/ENTRY/data/g2_derr@storage_mode-attribute; /NXxpcs/ENTRY/twotime/g2_err_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func@storage_mode-attribute; /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func_partials@storage_mode-attribute; /NXxpcs/ENTRY/twotime/two_time_corr_func@storage_mode-attribute
@surface_indices: /NXguide/reflectivity@surface_indices-attribute
@symbol: /NXcalibration/original_axis@symbol-attribute
@t_axes: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
@temperature_indices: /NXmicrostructure_score_config/ENTRY/time_temperature@temperature_indices-attribute; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@temperature_indices-attribute
@time: /NXattenuator/status@time-attribute; /NXsource/last_fill@time-attribute
@time_indices: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution@time_indices-attribute; /NXmicrostructure_score_config/ENTRY/time_temperature@time_indices-attribute; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@time_indices-attribute
@time_origin_location: /NXxpcs/ENTRY/twotime/two_time_corr_func@time_origin_location-attribute
@timestamp: /NXcanSAS/ENTRY/DATA@timestamp-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
@transform: /NXtomoproc/ENTRY/data/data@transform-attribute
@transformation_type: /NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute; /NXdetector_module/fast_pixel_direction@transformation_type-attribute; /NXdetector_module/module_offset@transformation_type-attribute; /NXdetector_module/slow_pixel_direction@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_dispersion@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_elevation@transformation_type-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_rotation@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@transformation_type-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@transformation_type-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@transformation_type-attribute; /NXtransformations/AXISNAME@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_polar_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_polar_angle_of_incidence@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@transformation_type-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@transformation_type-attribute
@type: /NXapm/ENTRY/USER/identifierNAME@type-attribute; /NXem/ENTRY/SAMPLE/identifier_parent@type-attribute; /NXem/ENTRY/SAMPLE/identifier_sample@type-attribute; /NXem/ENTRY/USER/identifierNAME@type-attribute; /NXentry/thumbnail@type-attribute; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/energy@type-attribute; /NXmpes/ENTRY/data/energy@type-attribute; /NXobject/identifierNAME@type-attribute; /NXsubstance/identifier_cas@type-attribute
@uncertainties: /NXcanSAS/ENTRY/DATA/I@uncertainties-attribute; /NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute; /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
@units: /NXcanSAS/ENTRY/DATA/I@units-attribute; /NXcanSAS/ENTRY/DATA/Idev@units-attribute; /NXcanSAS/ENTRY/DATA/Q@units-attribute; /NXcanSAS/ENTRY/DATA/Qdev@units-attribute; /NXcanSAS/ENTRY/DATA/Qmean@units-attribute; /NXcanSAS/ENTRY/DATA/dQl@units-attribute; /NXcanSAS/ENTRY/DATA/dQw@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute; /NXdata/AXISNAME@units-attribute; /NXellipsometry/ENTRY/data_collection/NAME_spectrum@units-attribute; /NXellipsometry/ENTRY/data_collection/measured_data@units-attribute; /NXellipsometry/ENTRY/data_collection/measured_data_errors@units-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_i@units-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_j@units-attribute; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/intensity@units-attribute; /NXfiber/attenuation@units-attribute; /NXfiber/spectral_range@units-attribute; /NXfiber/transfer_rate@units-attribute; /NXparameters/TERM@units-attribute; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two@units-attribute; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta@units-attribute
@url: /NXdispersive_material/ENTRY/definition@url-attribute; /NXellipsometry/ENTRY/data_collection/data_software@URL-attribute; /NXellipsometry/ENTRY/definition@URL-attribute; /NXentry/definition@URL-attribute; /NXentry/definition_local@URL-attribute; /NXmicrostructure_gragles_config/ENTRY/program1/program_name@url-attribute; /NXmicrostructure_gragles_results/ENTRY/program1/program_name@url-attribute; /NXmicrostructure_imm_results/ENTRY/program1/program@url-attribute; /NXmicrostructure_kanapy_results/ENTRY/program1/program@url-attribute; /NXmicrostructure_kanapy_results/ENTRY/program2/program@url-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@URL-attribute; /NXoptical_spectroscopy/ENTRY/definition@URL-attribute; /NXprogram/program@url-attribute; /NXraman/ENTRY/definition@URL-attribute; /NXsubentry/definition@URL-attribute; /NXsubentry/definition_local@URL-attribute; /NXtransmission/ENTRY/acquisition_program@url-attribute; /NXtransmission/ENTRY/definition@url-attribute
@use_these: /NXmicrostructure/interfaces/identifier_crystal@use_these-attribute; /NXmicrostructure/interfaces/identifier_phase@use_these-attribute; /NXmicrostructure/interfaces/identifier_triple_junction@use_these-attribute; /NXmicrostructure/quadruple_junctions/identifier_crystal@use_these-attribute; /NXmicrostructure/quadruple_junctions/identifier_interface@use_these-attribute; /NXmicrostructure/quadruple_junctions/identifier_phase@use_these-attribute; /NXmicrostructure/quadruple_junctions/identifier_triple_junction@use_these-attribute; /NXmicrostructure/quadruple_junctions/location@use_these-attribute; /NXmicrostructure/triple_junctions/identifier_interface@use_these-attribute; /NXmicrostructure/triple_junctions/identifier_polyline@use_these-attribute; /NXmicrostructure/triple_junctions/location@use_these-attribute; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/identifier_crystal@use_these-attribute
@varied_variable: /NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
@vector: /NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute; /NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute; /NXcxi_ptycho/sample_1/transformations@vector-attribute; /NXdetector_module/fast_pixel_direction@vector-attribute; /NXdetector_module/module_offset@vector-attribute; /NXdetector_module/slow_pixel_direction@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_dispersion@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_elevation@vector-attribute; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_rotation@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@vector-attribute; /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@vector-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@vector-attribute; /NXtransformations/AXISNAME@vector-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_azimuth_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_polar_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_azimuth_angle@vector-attribute; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_polar_angle_of_incidence@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@vector-attribute; /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@vector-attribute
@version: /NXapm/ENTRY/atom_probe/hit_finding/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/background_quantification/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_identification/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/ranging/peak_search/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/raw_data/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/PROGRAM/program@version-attribute; /NXapm/ENTRY/atom_probe/voltage_and_bowl/PROGRAM/program@version-attribute; /NXapm/ENTRY/definition@version-attribute; /NXapm/ENTRY/profiling/PROGRAM/program@version-attribute; /NXapm_compositionspace_config/ENTRY/definition@version-attribute; /NXapm_compositionspace_results/ENTRY/PROGRAM/program@version-attribute; /NXapm_compositionspace_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_clusterer_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_clusterer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_clusterer_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_clusterer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_distancer_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_distancer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_distancer_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_distancer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_intersector_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_intersector_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_intersector_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_intersector_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_nanochem_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_nanochem_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_ranger_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_ranger_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_ranger_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_ranger_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_selector_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_selector_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_selector_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_selector_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_spatstat_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_spatstat_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_spatstat_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_spatstat_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_surfacer_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_surfacer_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_surfacer_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_surfacer_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_tessellator_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_tessellator_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_tessellator_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_tessellator_results/ENTRY/definition@version-attribute; /NXapm_paraprobe_transcoder_config/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_transcoder_config/ENTRY/definition@version-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/common/PROGRAM/program@version-attribute; /NXapm_paraprobe_transcoder_results/ENTRY/definition@version-attribute; /NXarchive/ENTRY/program@version-attribute; /NXcanSAS/ENTRY@version-attribute; /NXcs_computer/operating_system@version-attribute; /NXdispersive_material/ENTRY/definition@version-attribute; /NXellipsometry/ENTRY/definition@version-attribute; /NXem/ENTRY/SIMULATION/PROGRAM/program@version-attribute; /NXem/ENTRY/SIMULATION/environment/PROGRAM/program@version-attribute; /NXem/ENTRY/measurement/instrument/PROGRAM/program@version-attribute; /NXem/ENTRY/profiling/PROGRAM/program@version-attribute; /NXem_calorimetry/ENTRY/environment/PROGRAM/program@version-attribute; /NXem_calorimetry/ENTRY/program1/program@version-attribute; /NXentry/definition@version-attribute; /NXentry/definition_local@version-attribute; /NXentry/entry_identifier_uuid@version-attribute; /NXentry/identifier_entry_uuid@version-attribute; /NXentry/program_name@version-attribute; /NXfabrication/model@version-attribute; /NXlab_electro_chemo_mechanical_preparation/ENTRY@version-attribute; /NXlab_sample_mounting/ENTRY@version-attribute; /NXmicrostructure_gragles_config/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_gragles_config/ENTRY/program1/program_name@version-attribute; /NXmicrostructure_gragles_results/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_gragles_results/ENTRY/program1/program_name@version-attribute; /NXmicrostructure_imm_results/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_imm_results/ENTRY/program1/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/program1/program@version-attribute; /NXmicrostructure_kanapy_results/ENTRY/program2/program@version-attribute; /NXmicrostructure_score_config/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_score_config/ENTRY/program1/program@version-attribute; /NXmicrostructure_score_results/ENTRY/environment/PROGRAM/program@version-attribute; /NXmicrostructure_score_results/ENTRY/program1/program@version-attribute; /NXmpes/ENTRY/definition@version-attribute; /NXmpes_arpes/ENTRY/definition@version-attribute; /NXmx/ENTRY@version-attribute; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@version-attribute; /NXoptical_spectroscopy/ENTRY/definition@version-attribute; /NXprogram/program@version-attribute; /NXraman/ENTRY/definition@version-attribute; /NXsensor_scan/ENTRY/PROCESS/program@version-attribute; /NXsensor_scan/ENTRY/definition@version-attribute; /NXspe/ENTRY/definition@version-attribute; /NXspm/ENTRY/INSTRUMENT/hardware/model@version-attribute; /NXspm/ENTRY/INSTRUMENT/software/model@version-attribute; /NXsubentry/definition@version-attribute; /NXsubentry/definition_local@version-attribute; /NXsubentry/program_name@version-attribute; /NXtransmission/ENTRY/definition@version-attribute
@wavelength_indices: /NXdetector/efficiency@wavelength_indices-attribute; /NXguide/reflectivity@wavelength_indices-attribute
@x_indices: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics@x_indices-attribute
@xml_version: /NXroot@XML_version-attribute
@xpos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX@xpos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX@xpos_indices-attribute
@ypos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX@ypos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX@ypos_indices-attribute
@zpos_indices: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX@zpos_indices-attribute; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX@zpos_indices-attribute
a: /NXcsg/a-group
a_1: /NXcorrector_cs/TABLEAU/a_1-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_1-group
a_2: /NXcorrector_cs/TABLEAU/a_2-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_2-group
a_3: /NXcorrector_cs/TABLEAU/a_3-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_3-group
a_4: /NXcorrector_cs/TABLEAU/a_4-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_4-group
a_6: /NXcorrector_cs/TABLEAU/a_6-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_6-group
a_axis_direction: /NXmicrostructure_mtex_config/conventions/a_axis_direction-field
a_b_c: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/unit_cell/a_b_c-field; /NXunit_cell/a_b_c-field
abbe_number: /NXlens_opt/Abbe_number-field
abrasive_medium: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
abrasive_medium_carrier: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
absorbed_beam: /NXxas/ENTRY/DATA/absorbed_beam-link; /NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material: /NXcollimator/absorbing_material-field; /NXfermi_chopper/absorbing_material-field
absorption_cross_section: /NXattenuator/absorption_cross_section-field
acceleration_time: /NXpositioner/acceleration_time-field
acceptance_angle: /NXfiber/acceptance_angle-field; /NXpolarizer_opt/acceptance_angle-field
accepted_photon_beam_divergence: /NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture: /NXcapillary/accepting_aperture-field
accuracy_n: /NXscan_control/accuracy_N-field
acoustic_impedance: /NXpiezoelectric_material/acoustic_impedance-field
acquisition_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field; /NXdetector/acquisition_mode-field
acquisition_program: /NXtransmission/ENTRY/acquisition_program-group
acquisition_time: /NXbias_spectroscopy/CIRCUIT/acquisition_time-field; /NXcircuit/acquisition_time-field
active_channels: /NXamplifier/active_channels-field
active_frequency: /NXcantilever_spm/cantilever_oscillator/active_frequency-field
activity: /NXhistory/ACTIVITY-group
actuation_target: /NXactuator/actuation_target-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/actuation_target-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/actuation_target-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/actuation_target-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/actuation_target-field
actuator: /NXebeam_column/ACTUATOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ACTUATOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/ACTUATOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/ACTUATOR-group; /NXem/ENTRY/measurement/instrument/ACTUATOR-group; /NXem/ENTRY/measurement/instrument/ebeam_column/ACTUATOR-group; /NXem/ENTRY/measurement/instrument/ibeam_column/ACTUATOR-group; /NXem_calorimetry/ENTRY/actuator-group; /NXenvironment/ACTUATOR-group; /NXibeam_column/ACTUATOR-group; /NXinstrument/ACTUATOR-group; /NXinstrument_em/ACTUATOR-group; /NXmanipulator/ACTUATOR-group; /NXpositioner/actuator-group
additional_detector_hardware: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/additional_detector_hardware-field
additional_phase_information: /NXdispersive_material/ENTRY/sample/additional_phase_information-field
address: /NXem/ENTRY/USER/address-field; /NXsensor_scan/ENTRY/USER/address-field; /NXtransmission/ENTRY/operator/address-field; /NXuser/address-field
aequatorial_angle: /NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field; /NXsas/ENTRY/SAMPLE/aequatorial_angle-field; /NXsastof/ENTRY/instrument/detector/aequatorial_angle-field; /NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation: /NXem/ENTRY/USER/affiliation-field; /NXmpes/ENTRY/USER/affiliation-field; /NXsensor_scan/ENTRY/USER/affiliation-field; /NXtransmission/ENTRY/operator/affiliation-field; /NXuser/affiliation-field
algorithm: /NXapm/ENTRY/NOTE/algorithm-field; /NXapm/ENTRY/atom_probe/hit_finding/config/algorithm-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/source/algorithm-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/source/algorithm-field; /NXapm/ENTRY/atom_probe/ranging/definitions/algorithm-field; /NXapm/ENTRY/atom_probe/raw_data/source/algorithm-field; /NXapm/ENTRY/atom_probe/reconstruction/config/algorithm-field; /NXapm/ENTRY/atom_probe/reconstruction/results/algorithm-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/source/algorithm-field; /NXapm_compositionspace_config/ENTRY/config/ranging/algorithm-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/algorithm-field; /NXapm_compositionspace_results/ENTRY/config/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/algorithm-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/algorithm-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/config/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/algorithm-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/algorithm-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/algorithm-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/algorithm-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/algorithm-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/algorithm-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/algorithm-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/algorithm-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/algorithm-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/algorithm-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/algorithm-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/algorithm-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/algorithm-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/algorithm-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/algorithm-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/algorithm-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/algorithm-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/algorithm-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/algorithm-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/algorithm-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/algorithm-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/algorithm-field; /NXem/ENTRY/NOTE/algorithm-field; /NXem/ENTRY/ROI/ebsd/indexing/source/algorithm-field; /NXem/ENTRY/ROI/ebsd/measurement/source/algorithm-field; /NXem/ENTRY/ROI/ebsd/simulation/source/algorithm-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input/algorithm-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input/algorithm-field; /NXem_calorimetry/ENTRY/actuator/algorithm-field; /NXem_calorimetry/ENTRY/config/algorithm-field; /NXem_calorimetry/ENTRY/diffraction/algorithm-field; /NXmicrostructure/configuration/algorithm-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/algorithm-field; /NXmicrostructure_score_config/ENTRY/deformation/damask/algorithm-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/algorithm-field; /NXmicrostructure_score_results/ENTRY/config/algorithm-field; /NXnote/algorithm-field
alias: /NXaberration/alias-field; /NXapm/ENTRY/COORDINATE_SYSTEM/alias-field; /NXapm/ENTRY/sample/alias-field; /NXapm/ENTRY/specimen/alias-field; /NXcoordinate_system/alias-field; /NXem/ENTRY/COORDINATE_SYSTEM/alias-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/alias-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/alias-field; /NXem/ENTRY/processing_reference_frame/alias-field; /NXem/ENTRY/sample_reference_frame/alias-field; /NXinstrument_em/stage/alias-field
alpha: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan/alpha-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/alpha-field; /NXcg_alpha_complex/alpha-field; /NXxkappa/ENTRY/sample/alpha-field
alpha_beta_gamma: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/unit_cell/alpha_beta_gamma-field; /NXunit_cell/alpha_beta_gamma-field
alpha_complex: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX-group; /NXcg_alpha_complex/ALPHA_COMPLEX-group
alpha_value_choice: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_value_choice-field
alpha_values: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_values-field
ammeter: /NXmpes/ENTRY/SAMPLE/drain_current_env/ammeter-group
amplifier: /NXspm/ENTRY/INSTRUMENT/current_sensor/AMPLIFIER-group; /NXspm/ENTRY/INSTRUMENT/voltage_sensor/AMPLIFIER-group; /NXstm/ENTRY/INSTRUMENT/current_sensor/AMPLIFIER-group
amplifier_bias: /NXelectron_detector/amplifier_bias-field
amplifier_type: /NXelectron_detector/amplifier_type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/amplifier_type-field
amplifier_voltage: /NXelectron_detector/amplifier_voltage-field
amplitude_excitation: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop/amplitude_excitation-field; /NXafm/ENTRY/resolution_indicators/amplitude_excitation-field
amplitude_modulation_bandwidth: /NXlockin/amplitude_modulation_bandwidth-field
an: /NXcalibration/coefficients/aN-field
analyser: /NXarpes/ENTRY/INSTRUMENT/analyser-group; /NXindirecttof/ENTRY/INSTRUMENT/analyser-group; /NXtas/ENTRY/INSTRUMENT/analyser-group
analysis_chamber: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/analysis_chamber-group; /NXinstrument_apm/analysis_chamber-group
analysis_program: /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program-group
analyze_coprecipitation: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/analyze_coprecipitation-field
analyze_intersection: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/analyze_intersection-field
analyze_proximity: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/analyze_proximity-field
analyzer_dispersion: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_dispersion-field
analyzer_elevation: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_elevation-field
analyzer_rotation: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_rotation-field
analyzer_take_off_azimuth_angle: /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_azimuth_angle-field
analyzer_take_off_polar_angle: /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations/analyzer_take_off_polar_angle-field
angle: /NXaberration/angle-field
angle_of_detection: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_detection-field
angle_of_in_plane_sample_rotation: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_in_plane_sample_rotation-field
angle_of_incidence: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incidence-field
angle_of_incident_and_detection_beam: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incident_and_detection_beam-field
angle_reference_frame: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_reference_frame-field
angles: /NXarpes/ENTRY/INSTRUMENT/analyser/angles-field; /NXgrating/angles-field
angular0: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/angular0-field; /NXmpes/ENTRY/data/angular0-field; /NXmpes_arpes/ENTRY/data/angular0-field
angular1: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/angular1-field; /NXmpes/ENTRY/data/angular1-field; /NXmpes_arpes/ENTRY/data/angular1-field
angular_acceptance: /NXcollectioncolumn/angular_acceptance-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/angular_acceptance-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/angular_acceptance-field
angular_calibration: /NXdetector/angular_calibration-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied: /NXdetector/angular_calibration_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion: /NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
angular_resolution: /NXelectronanalyzer/angular_resolution-group
angular_spread: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/angular_spread-field
angularn_resolution: /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/angularN_resolution-group; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution-group
animation_time: /NXbias_spectroscopy/CIRCUIT/animation_time-field
anode_material: /NXsource/anode_material-field
aoi_range: /NXbeam_splitter/AOI_range-field
aperture: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group; /NXcollectioncolumn/APERTURE-group; /NXcorrector_cs/APERTURE-group; /NXebeam_column/APERTURE-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/APERTURE-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/APERTURE-group; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE-group; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE-group; /NXenergydispersion/APERTURE-group; /NXibeam_column/APERTURE-group; /NXinstrument/APERTURE-group; /NXsnsevent/ENTRY/instrument/APERTURE-group; /NXsnshisto/ENTRY/instrument/APERTURE-group; /NXsource/APERTURE-group; /NXxraylens/aperture-field
applied: /NXapm/ENTRY/measurement/instrument/reflectron/applied-field; /NXcalibration/applied-field; /NXcomponent/applied-field; /NXcorrector_cs/applied-field; /NXdistortion/applied-field; /NXebeam_column/MONOCHROMATOR/applied-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/MONOCHROMATOR/applied-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_ax/applied-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/applied-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/MONOCHROMATOR/applied-field; /NXinstrument_apm/reflectron/applied-field; /NXregistration/applied-field
apply: /NXmicrostructure_score_config/ENTRY/solitary_unit/apply-field
area: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/area-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/area-field; /NXcg_hexahedron/area-field; /NXcg_primitive/area-field; /NXmicrostructure/crystals/area-field; /NXmicrostructure/interfaces/area-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/area-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/area-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/area-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/area-field; /NXunit_cell/area-field; /NXxps/ENTRY/FIT/peakPEAK/function/fit_parameters/area-field
arpes_geometry: /NXmpes_arpes/ENTRY/arpes_geometry-group
arrival_time_pairs: /NXapm/ENTRY/atom_probe/raw_data/arrival_time_pairs-field
arrow_char: /NXmicrostructure_mtex_config/plotting/arrow_char-field
aspect: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/aspect-field
associated_beam: /NXmpes/ENTRY/INSTRUMENT/monochromator_TYPE/associated_beam-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/associated_beam-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/associated_beam-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/associated_beam-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/associated_beam-field
associated_source: /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/associated_source-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/associated_source-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/associated_source-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/associated_source-field
atom: /NXem_eds/indexing/PEAK/ATOM-group; /NXphase/ATOM-group; /NXunit_cell/ATOM-group
atom_probe: /NXapm/ENTRY/atom_probe-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe-group
atom_types: /NXapm/ENTRY/specimen/atom_types-field; /NXapm_compositionspace_results/ENTRY/specimen/atom_types-field; /NXdispersive_material/ENTRY/sample/atom_types-field; /NXem/ENTRY/ROI/eds/indexing/atom_types-field; /NXem/ENTRY/SAMPLE/atom_types-field; /NXem_calorimetry/ENTRY/sample/atom_types-field; /NXem_eds/indexing/atom_types-field; /NXiv_temp/ENTRY/SAMPLE/atom_types-field; /NXmicrostructure_score_config/ENTRY/sample/atom_types-field; /NXmpes/ENTRY/SAMPLE/atom_types-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/atom_types-field
attached_to: /NXsensor/attached_to-field
attenuation: /NXfiber/attenuation-field
attenuator: /NXinstrument/ATTENUATOR-group; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group; /NXsnsevent/ENTRY/instrument/ATTENUATOR-group; /NXsnshisto/ENTRY/instrument/ATTENUATOR-group; /NXxrot/ENTRY/instrument/attenuator-group
attenuator_transmission: /NXattenuator/attenuator_transmission-field; /NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field; /NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field; /NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field; /NXxrot/ENTRY/instrument/attenuator/attenuator_transmission-field
author: /NXnote/author-field; /NXsnsevent/ENTRY/SNSHistoTool/author-field; /NXsnshisto/ENTRY/SNSHistoTool/author-field
autophase: /NXapm_compositionspace_config/ENTRY/config/autophase-group; /NXapm_compositionspace_results/ENTRY/autophase-group
average_power: /NXbeam/average_power-field
average_value: /NXlog/average_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error: /NXlog/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors: /NXlog/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axis_aic: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_aic-field
axis_angle_convention: /NXapm/ENTRY/consistent_rotations/axis_angle_convention-field; /NXcoordinate_system_set/axis_angle_convention-field; /NXem/ENTRY/consistent_rotations/axis_angle_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/axis_angle_convention-field
axis_axis_calibration: /NXmpes/ENTRY/AXIS_axis_calibration-group
axis_bic: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_bic-field
axis_dimension: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_dimension-field
axis_energy: /NXem/ENTRY/ROI/eds/indexing/summary/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_energy-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_energy-field; /NXem_eds/indexing/summary/axis_energy-field; /NXspectrum/spectrum_0d/axis_energy-field; /NXspectrum/spectrum_1d/axis_energy-field; /NXspectrum/spectrum_2d/axis_energy-field; /NXspectrum/spectrum_3d/axis_energy-field; /NXspectrum/stack_0d/axis_energy-field; /NXspectrum/stack_2d/axis_energy-field; /NXspectrum/stack_3d/axis_energy-field
axis_explained_variance: /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_explained_variance-field
axis_feature_importance: /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance-field
axis_i: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i-field; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_i-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_i-field; /NXimage/image_1d/axis_i-field; /NXimage/image_2d/axis_i-field; /NXimage/image_3d/axis_i-field; /NXimage/stack_1d/axis_i-field; /NXimage/stack_2d/axis_i-field; /NXimage/stack_3d/axis_i-field; /NXspectrum/spectrum_1d/axis_i-field; /NXspectrum/spectrum_2d/axis_i-field; /NXspectrum/spectrum_3d/axis_i-field; /NXspectrum/stack_2d/axis_i-field; /NXspectrum/stack_3d/axis_i-field
axis_j: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j-field; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/axis_j-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_j-field; /NXimage/image_2d/axis_j-field; /NXimage/image_3d/axis_j-field; /NXimage/stack_2d/axis_j-field; /NXimage/stack_3d/axis_j-field; /NXspectrum/spectrum_2d/axis_j-field; /NXspectrum/spectrum_3d/axis_j-field; /NXspectrum/stack_2d/axis_j-field; /NXspectrum/stack_3d/axis_j-field
axis_k: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/axis_k-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/axis_k-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/axis_k-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/axis_k-field; /NXimage/image_3d/axis_k-field; /NXimage/stack_3d/axis_k-field; /NXspectrum/spectrum_3d/axis_k-field; /NXspectrum/stack_3d/axis_k-field
axis_mass_to_charge: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge-field
axis_pca_dimension: /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_pca_dimension-field
axis_x: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/axis_x-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_x-field; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_x-field; /NXem_ebsd/indexing/roi/axis_x-field; /NXmicrostructure_ipf/legend/axis_x-field; /NXmicrostructure_ipf/map/axis_x-field; /NXmicrostructure_pf/pf/axis_x-field
axis_y: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/axis_y-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_y-field; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_y-field; /NXem_ebsd/indexing/roi/axis_y-field; /NXmicrostructure_ipf/legend/axis_y-field; /NXmicrostructure_ipf/map/axis_y-field; /NXmicrostructure_pf/pf/axis_y-field
axis_z: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/axis_z-field; /NXem/ENTRY/ROI/ebsd/indexing/roi/axis_z-field; /NXmicrostructure_ipf/map/axis_z-field
axisname: /NXdata/AXISNAME-field; /NXtransformations/AXISNAME-field
axisname_end: /NXtransformations/AXISNAME_end-field
axisname_increment_set: /NXtransformations/AXISNAME_increment_set-field
azimuth: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth-field
azimuthal: /NXspe/ENTRY/data/azimuthal-field
azimuthal_angle: /NXcrystal/azimuthal_angle-field; /NXdetector/azimuthal_angle-field; /NXlauetof/ENTRY/instrument/detector/azimuthal_angle-field; /NXreflections/azimuthal_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field; /NXsastof/ENTRY/instrument/detector/azimuthal_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/azimuthal_angle-field; /NXtofraw/ENTRY/instrument/detector/azimuthal_angle-field; /NXtofsingle/ENTRY/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_width: /NXspe/ENTRY/data/azimuthal_width-field
b: /NXcsg/b-group
b_2: /NXcorrector_cs/TABLEAU/b_2-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/b_2-group
b_4: /NXcorrector_cs/TABLEAU/b_4-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/b_4-group
b_axis_direction: /NXmicrostructure_mtex_config/conventions/b_axis_direction-field
background: /NXapm/ENTRY/atom_probe/ranging/background_quantification/background-field
background_correction: /NXem_ebsd/indexing/background_correction-group
background_mean: /NXreflections/background_mean-field
background_quantification: /NXapm/ENTRY/atom_probe/ranging/background_quantification-group; /NXapm_ranging/background_quantification-group
background_subtraction: /NXem_calorimetry/ENTRY/background_subtraction-group
backgroundbackground: /NXfit/backgroundBACKGROUND-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND-group
backside_roughness: /NXellipsometry/ENTRY/SAMPLE/backside_roughness-field
backward_speed: /NXscan_control/linear_SCAN/backward_speed-field; /NXscan_control/snake_SCAN/backward_speed-field; /NXscan_control/traj_SCAN/backward_speed-field
backward_speed_n: /NXscan_control/mesh_SCAN/backward_speed_N-field; /NXscan_control/spiral_SCAN/backward_speed_N-field
backward_sweep: /NXbias_spectroscopy/bias_sweep/linear_sweep/backward_sweep-field
bandwidth: /NXamplifier/bandwidth-field; /NXcircuit/bandwidth-field; /NXinsertion_device/bandwidth-field
beam: /NXcontainer/beam-group; /NXebeam_column/BEAM-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/BEAM-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/BEAM-group; /NXem/ENTRY/measurement/instrument/ebeam_column/BEAM-group; /NXem/ENTRY/measurement/instrument/ibeam_column/BEAM-group; /NXibeam_column/BEAM-group; /NXinstrument/BEAM-group; /NXinstrument_apm/pulser/SOURCE/BEAM-group; /NXmx/ENTRY/INSTRUMENT/BEAM-group; /NXsample/BEAM-group; /NXxrd/ENTRY/INSTRUMENT/BEAM-group
beam_1: /NXcxi_ptycho/entry_1/instrument_1/beam_1-group
beam_attenuation_factors: /NXxrd_pan/ENTRY/experiment_config/beam_attenuation_factors-field
beam_azimuth_angle: /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_azimuth_angle-field
beam_center_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field; /NXdetector/beam_center_x-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field; /NXsastof/ENTRY/instrument/detector/beam_center_x-field; /NXxpcs/ENTRY/instrument/DETECTOR/beam_center_x-field; /NXxrot/ENTRY/instrument/detector/beam_center_x-field
beam_center_y: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field; /NXdetector/beam_center_y-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field; /NXsastof/ENTRY/instrument/detector/beam_center_y-field; /NXxpcs/ENTRY/instrument/DETECTOR/beam_center_y-field; /NXxrot/ENTRY/instrument/detector/beam_center_y-field
beam_incident: /NXraman/ENTRY/INSTRUMENT/beam_incident-group
beam_polar_angle_of_incidence: /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations/beam_polar_angle_of_incidence-field
beam_polarization_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/beam_polarization_type-field
beam_position: /NXdisk_chopper/beam_position-field
beam_probe: /NXmpes/ENTRY/INSTRUMENT/beam_probe-group; /NXxps/ENTRY/INSTRUMENT/beam_probe-group
beam_pump: /NXmpes/ENTRY/INSTRUMENT/beam_pump-group
beam_ref_frame: /NXoptical_spectroscopy/ENTRY/beam_ref_frame-group
beam_sample_relation: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/beam_sample_relation-field
beam_shape: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_stop: /NXinstrument/BEAM_STOP-group
beam_transfer_matrix_table: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_TRANSFER_MATRIX_TABLE-group
beam_type: /NXmpes/ENTRY/INSTRUMENT/beam_TYPE-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE-group
beamline: /NXsnsevent/ENTRY/instrument/beamline-field; /NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance: /NXelectrostatic_kicker/beamline_distance-field; /NXmagnetic_kicker/beamline_distance-field; /NXquadrupole_magnet/beamline_distance-field; /NXseparator/beamline_distance-field; /NXsolenoid_magnet/beamline_distance-field; /NXspin_rotator/beamline_distance-field
bend_angle_x: /NXguide/bend_angle_x-field; /NXmirror/bend_angle_x-field
bend_angle_y: /NXguide/bend_angle_y-field; /NXmirror/bend_angle_y-field
bending_magnet: /NXinstrument/BENDING_MAGNET-group
bending_radius: /NXbending_magnet/bending_radius-field
bias_calibration: /NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_calibration-group
bias_divider: /NXlockin/bias_divider-field
bias_env: /NXmpes/ENTRY/SAMPLE/bias_env-group
bias_offset: /NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_offset-field
bias_spectroscopy: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group; /NXstm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group; /NXsts/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group
bias_spectroscopy_environment: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment-group; /NXstm/ENTRY/INSTRUMENT/bias_spectroscopy_environment-group; /NXsts/ENTRY/INSTRUMENT/bias_spectroscopy_environment-group
bias_sweep: /NXbias_spectroscopy/bias_sweep-group; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep-group; /NXstm/ENTRY/reproducibility_indicators/bias_sweep-group; /NXstm/ENTRY/resolution_indicators/bias_sweep-group; /NXsts/ENTRY/reproducibility_indicators/bias_sweep-group; /NXsts/ENTRY/resolution_indicators/bias_sweep-group
bias_voltage: /NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_voltage-field
bibtex: /NXcite/bibtex-field
binding_energy: /NXmpes/ENTRY/energy_referencing/binding_energy-field
binning: /NXem_ebsd/indexing/binning-group
biprism: /NXebeam_column/BIPRISM-group; /NXem/ENTRY/measurement/instrument/ebeam_column/BIPRISM-group
bit_depth_readout: /NXdetector/bit_depth_readout-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
bitdepth: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/bitdepth-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/window/bitdepth-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/bitdepth-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/window/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/bitdepth-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/bitdepth-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/bitdepth-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/bitdepth-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/window/bitdepth-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/window/bitdepth-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/bitdepth-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/bitdepth-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/bitdepth-field; /NXapm_paraprobe_tool_results/window/bitdepth-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/bitdepth-field; /NXcs_filter_boolean_mask/bitdepth-field
bitmask: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/bitmask-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/bitmask-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask-group
blade_geometry: /NXaperture/BLADE_GEOMETRY-group
blade_spacing: /NXcollimator/blade_spacing-field
blade_thickness: /NXcollimator/blade_thickness-field
blaze_wavelength: /NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
block: /NXregion/block-field
boundaries: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/boundaries-field; /NXcg_grid/boundaries-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundaries-field
boundary: /NXmicrostructure_score_results/ENTRY/discretization/boundary-group
boundary_conditions: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/boundary_conditions-field; /NXcg_grid/boundary_conditions-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundary_conditions-field
boundary_contact: /NXmicrostructure/crystals/boundary_contact-field; /NXmicrostructure/interfaces/boundary_contact-field; /NXmicrostructure/quadruple_junctions/boundary_contact-field; /NXmicrostructure/triple_junctions/boundary_contact-field
bounding_box: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box-group; /NXcg_grid/bounding_box-group; /NXreflections/bounding_box-field
bragg_angle: /NXcrystal/bragg_angle-field
bright_field: /NXtomophase/ENTRY/instrument/bright_field-group
brightness: /NXibeam_column/ion_source/brightness-field
buffer_chamber: /NXinstrument_apm/buffer_chamber-group
bunch_distance: /NXsource/bunch_distance-field
bunch_length: /NXsource/bunch_length-field
bunch_pattern: /NXsource/bunch_pattern-group
bunge_euler: /NXmicrostructure_imm_config/ENTRY/component_analysis/bunge_euler-field; /NXmicrostructure_imm_config/ENTRY/orientation_distribution/bunge_euler-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/bunge_euler-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/bunge_euler-field; /NXmicrostructure_score_config/ENTRY/component_analysis/bunge_euler-field; /NXmicrostructure_score_config/ENTRY/deformation/ensemble/bunge_euler-field; /NXmicrostructure_score_config/ENTRY/nucleation/ensemble/bunge_euler-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/bunge_euler-field
burgers_vector: /NXmicrostructure_score_config/ENTRY/material/burgers_vector-field
c1: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c1-field
c2: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c2-field
c3: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c3-field
c_1: /NXcorrector_cs/TABLEAU/c_1-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1-group
c_1_0: /NXcorrector_cs/TABLEAU/c_1_0-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_0-group
c_1_2_a: /NXcorrector_cs/TABLEAU/c_1_2_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_2_a-group
c_1_2_b: /NXcorrector_cs/TABLEAU/c_1_2_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_2_b-group
c_2_1_a: /NXcorrector_cs/TABLEAU/c_2_1_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_1_a-group
c_2_1_b: /NXcorrector_cs/TABLEAU/c_2_1_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_1_b-group
c_2_3_a: /NXcorrector_cs/TABLEAU/c_2_3_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_3_a-group
c_2_3_b: /NXcorrector_cs/TABLEAU/c_2_3_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_3_b-group
c_3: /NXcorrector_cs/TABLEAU/c_3-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3-group
c_3_0: /NXcorrector_cs/TABLEAU/c_3_0-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_0-group
c_3_2_a: /NXcorrector_cs/TABLEAU/c_3_2_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_2_a-group
c_3_2_b: /NXcorrector_cs/TABLEAU/c_3_2_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_2_b-group
c_3_4_a: /NXcorrector_cs/TABLEAU/c_3_4_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_4_a-group
c_3_4_b: /NXcorrector_cs/TABLEAU/c_3_4_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_4_b-group
c_4_1_a: /NXcorrector_cs/TABLEAU/c_4_1_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_1_a-group
c_4_1_b: /NXcorrector_cs/TABLEAU/c_4_1_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_1_b-group
c_4_3_a: /NXcorrector_cs/TABLEAU/c_4_3_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_3_a-group
c_4_3_b: /NXcorrector_cs/TABLEAU/c_4_3_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_3_b-group
c_4_5_a: /NXcorrector_cs/TABLEAU/c_4_5_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_5_a-group
c_4_5_b: /NXcorrector_cs/TABLEAU/c_4_5_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_5_b-group
c_5: /NXcorrector_cs/TABLEAU/c_5-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5-group
c_5_0: /NXcorrector_cs/TABLEAU/c_5_0-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_0-group
c_5_2_a: /NXcorrector_cs/TABLEAU/c_5_2_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_2_a-group
c_5_2_b: /NXcorrector_cs/TABLEAU/c_5_2_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_2_b-group
c_5_4_a: /NXcorrector_cs/TABLEAU/c_5_4_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_4_a-group
c_5_4_b: /NXcorrector_cs/TABLEAU/c_5_4_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_4_b-group
c_5_6_a: /NXcorrector_cs/TABLEAU/c_5_6_a-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_6_a-group
c_5_6_b: /NXcorrector_cs/TABLEAU/c_5_6_b-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_6_b-group
c_one: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_one-field
c_three: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_three-field
c_two: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_two-field
calibrated_axis: /NXcalibration/calibrated_axis-field; /NXmpes/ENTRY/AXIS_axis_calibration/calibrated_axis-field; /NXmpes/ENTRY/energy_axis_calibration/calibrated_axis-field; /NXmpes/ENTRY/energy_referencing/calibrated_axis-field; /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration/calibrated_axis-field; /NXpiezo_config_spm/calibration/calibrated_AXIS-field
calibrated_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl/calibrated_tof-field
calibration: /NXcantilever_spm/cantilever_config/CALIBRATION-group; /NXcircuit/calibration-group; /NXem/ENTRY/ROI/ebsd/calibration-group; /NXem_ebsd/calibration-group; /NXmpes/ENTRY/CALIBRATION-group; /NXpiezo_config_spm/calibration-group; /NXresolution/CALIBRATION-group; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/piezo_configuration/calibration-group
calibration_accuracy: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_accuracy-group
calibration_coefficient_n: /NXpiezo_config_spm/calibration/calibration_coefficient_N-field
calibration_date: /NXdetector/calibration_date-field; /NXpiezo_config_spm/calibration/calibration_date-field
calibration_method: /NXdetector/calibration_method-group
calibration_name: /NXpiezo_config_spm/calibration/calibration_name-field
calibration_object: /NXcalibration/calibration_object-group
calibration_status: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_status-field
calibration_time: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_time-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
calibration_type: /NXpiezo_config_spm/calibration/calibration_type-field
cameca_to_nexus: /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus-group; /NXapm_paraprobe_clusterer_results/ENTRY/cameca_to_nexus-group
camera_length: /NXoptical_system_em/camera_length-field
cantilever_amplitude_positioner: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop/cantilever_amplitude_positioner-group; /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_amplitude_positioner-group
cantilever_coating: /NXcantilever_spm/cantilever_config/cantilever_coating-field
cantilever_config: /NXcantilever_spm/cantilever_config-group
cantilever_frequency_positioner: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop/cantilever_frequency_positioner-group; /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_frequency_positioner-group
cantilever_length: /NXcantilever_spm/cantilever_config/cantilever_length-field
cantilever_oscillator: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator-group; /NXafm/ENTRY/reproducibility_indicators/cantilever_oscillator-group; /NXcantilever_spm/cantilever_oscillator-group
cantilever_phase_positioner: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop/cantilever_phase_positioner-group; /NXcantilever_spm/cantilever_oscillator/phase_lock_loop/cantilever_phase_positioner-group
cantilever_resonance_frequency: /NXcantilever_spm/cantilever_config/cantilever_resonance_frequency-field
cantilever_spm: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM-group
cantilever_thickness: /NXcantilever_spm/cantilever_config/cantilever_thickness-field
cantilever_tip_temp: /NXafm/ENTRY/reproducibility_indicators/cantilever_tip_temp-field; /NXafm/ENTRY/resolution_indicators/cantilever_tip_temp-field
cantilever_type: /NXcantilever_spm/cantilever_config/cantilever_type-field
cantilever_width: /NXcantilever_spm/cantilever_config/cantilever_width-field
capability: /NXfabrication/capability-field
capillary: /NXinstrument/CAPILLARY-group
capital_phi: /NXmicrostructure_odf/phi_two_plot/capital_phi-field
cardinality: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/cardinality-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/cardinality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/cardinality-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/cardinality-field; /NXcg_primitive/cardinality-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/cardinality-field; /NXsimilarity_grouping/cardinality-field
cas_image: /NXsubstance/cas_image-group
categorical_label: /NXsimilarity_grouping/categorical_label-field
categorical_labels: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/categorical_labels-field
category: /NXapm/ENTRY/atom_probe/ranging/peak_search/PEAK/category-field
cdeform_field: /NXdistortion/cdeform_field-field
cell_cache: /NXmicrostructure_score_config/ENTRY/numerics/cell_cache-group
cell_dimensions: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cell_dimensions-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/cell_dimensions-field; /NXcg_grid/cell_dimensions-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/cell_dimensions-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/cell_dimensions-field; /NXmicrostructure_score_config/ENTRY/discretization/grid/cell_dimensions-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/cell_dimensions-field
center: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/center-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/center-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/center-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/center-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/center-field; /NXcg_primitive/center-field; /NXem_calorimetry/ENTRY/distortion_correction/center-field
center_energy: /NXenergydispersion/center_energy-field
central_stop_diameter: /NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material: /NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness: /NXfresnel_zone_plate/central_stop_thickness-field
cg_cylinder: /NXcg_roi/CG_CYLINDER-group; /NXspatial_filter/CG_CYLINDER-group
cg_ellipsoid: /NXcg_roi/CG_ELLIPSOID-group; /NXspatial_filter/CG_ELLIPSOID-group
cg_grid: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid-group; /NXmicrostructure/CG_GRID-group
cg_hexahedron: /NXcg_roi/CG_HEXAHEDRON-group; /NXspatial_filter/CG_HEXAHEDRON-group
cg_parallelogram: /NXcg_roi/CG_PARALLELOGRAM-group
cg_point: /NXcg_alpha_complex/CG_POINT-group; /NXmicrostructure/CG_POINT-group
cg_polygon: /NXmicrostructure/CG_POLYGON-group
cg_polyhedron: /NXcg_roi/CG_POLYHEDRON-group; /NXmicrostructure/CG_POLYHEDRON-group; /NXspatial_filter/CG_POLYHEDRON-group
cg_polyline: /NXmicrostructure/CG_POLYLINE-group
cg_triangle: /NXmicrostructure/CG_TRIANGLE-group
changer_position: /NXsample/changer_position-field; /NXsnsevent/ENTRY/sample/changer_position-field; /NXsnshisto/ENTRY/sample/changer_position-field
channel_name: /NXscan_control/linear_SCAN/channel_NAME-field; /NXscan_control/mesh_SCAN/channel_NAME-field; /NXscan_control/snake_SCAN/channel_NAME-field; /NXscan_control/traj_SCAN/channel_NAME-field
channel_temp: /NXspm/ENTRY/INSTRUMENT/TEMPERATURE/CHANNEL_temp-field
channelname_channel: /NXdetector/CHANNELNAME_channel-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/CHANNELNAME_channel-group
charge: /NXatom/charge-field; /NXion/charge-field
charge_state: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/charge_state-field; /NXapm_charge_state_analysis/charge_state-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/ION/charge_state-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/charge_state-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field; /NXatom/charge_state-field; /NXion/charge_state-field
charge_state_analysis: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis-group
charge_state_whitelist: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/decomposition/charge_state_whitelist-field
checksum: /NXapm/ENTRY/NOTE/checksum-field; /NXapm/ENTRY/atom_probe/hit_finding/config/checksum-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/source/checksum-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/source/checksum-field; /NXapm/ENTRY/atom_probe/ranging/definitions/checksum-field; /NXapm/ENTRY/atom_probe/raw_data/source/checksum-field; /NXapm/ENTRY/atom_probe/reconstruction/config/checksum-field; /NXapm/ENTRY/atom_probe/reconstruction/results/checksum-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/source/checksum-field; /NXapm_compositionspace_config/ENTRY/config/ranging/checksum-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/checksum-field; /NXapm_compositionspace_results/ENTRY/config/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/checksum-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/checksum-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/config/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/checksum-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/checksum-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/checksum-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/checksum-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/checksum-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/checksum-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/checksum-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/checksum-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/checksum-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/checksum-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/checksum-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/checksum-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/checksum-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/checksum-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/checksum-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/checksum-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/checksum-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/checksum-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/checksum-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/checksum-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/checksum-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/checksum-field; /NXem/ENTRY/NOTE/checksum-field; /NXem/ENTRY/ROI/ebsd/indexing/source/checksum-field; /NXem/ENTRY/ROI/ebsd/measurement/source/checksum-field; /NXem/ENTRY/ROI/ebsd/simulation/source/checksum-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input/checksum-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input/checksum-field; /NXem_calorimetry/ENTRY/actuator/checksum-field; /NXem_calorimetry/ENTRY/config/checksum-field; /NXem_calorimetry/ENTRY/diffraction/checksum-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/checksum-field; /NXmicrostructure_score_config/ENTRY/deformation/damask/checksum-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/checksum-field; /NXmicrostructure_score_results/ENTRY/config/checksum-field; /NXnote/checksum-field
chemical_composition: /NXapm/ENTRY/sample/chemical_composition-group; /NXmicrostructure/chemical_composition-group
chemical_description: /NXpiezoelectric_material/chemical_description-group
chemical_formula: /NXarchive/ENTRY/sample/chemical_formula-field; /NXcontainer/chemical_formula-field; /NXcrystal/chemical_formula-field; /NXdispersive_material/ENTRY/sample/chemical_formula-field; /NXfilter/chemical_formula-field; /NXmpes/ENTRY/SAMPLE/chemical_formula-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/chemical_formula-field; /NXsample/chemical_formula-field; /NXsample_component/chemical_formula-field
chemical_symbol: /NXapm/ENTRY/sample/chemical_composition/ELEMENT/chemical_symbol-field; /NXmicrostructure/chemical_composition/ELEMENT/chemical_symbol-field
chi: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/chi-field; /NXxeuler/ENTRY/name/chi-link; /NXxeuler/ENTRY/sample/chi-field; /NXxrd_pan/ENTRY/experiment_result/chi-field
chirp_gdd: /NXbeam/chirp_GDD-field
chirp_type: /NXbeam/chirp_type-field
chopper: /NXreftof/ENTRY/instrument/chopper-group
chromatic: /NXlens_opt/chromatic-field
cif: /NXmicrostructure_mtex_config/path/cif-field
circuit: /NXbias_spectroscopy/CIRCUIT-group; /NXcs_computer/memory/CIRCUIT-group; /NXcs_computer/processing/CIRCUIT-group; /NXcs_computer/storage/CIRCUIT-group; /NXscanbox_em/CIRCUIT-group
cite: /NXapm/ENTRY/CITE-group; /NXem/ENTRY/CITE-group; /NXem_calorimetry/ENTRY/CITE-group
clad_diameter: /NXfiber/cladding/clad_diameter-field
clad_index_of_refraction: /NXfiber/cladding/clad_index_of_refraction-field
clad_material: /NXfiber/cladding/clad_material-field
cladding: /NXfiber/cladding-group
cleaning_step: /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP-group
clear_aperture: /NXbeam_splitter/clear_aperture-field; /NXwaveplate/clear_aperture-field
closest_corner: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/closest_corner-field
cluster_analysis: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/CLUSTER_ANALYSIS-group; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS-group; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS-group
cluster_composition: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_composition-field
cluster_selection_epsilon: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan/cluster_selection_epsilon-field
cluster_statistics: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_statistics-field
clustering: /NXapm_compositionspace_config/ENTRY/config/clustering-group; /NXapm_compositionspace_results/ENTRY/clustering-group
coating: /NXbeam_splitter/coating-group; /NXfiber/coating-group; /NXlens_opt/COATING-group; /NXpolarizer_opt/COATING-group; /NXwaveplate/coating-group
coating_diameter: /NXfiber/coating/coating_diameter-field
coating_material: /NXbeam_splitter/coating/coating_material-field; /NXfiber/coating/coating_material-field; /NXfilter/coating_material-field; /NXgrating/coating_material-field; /NXguide/coating_material-field; /NXlens_opt/COATING/coating_material-field; /NXmirror/coating_material-field; /NXpolarizer_opt/COATING/coating_material-field; /NXwaveplate/coating/coating_material-field
coating_roughness: /NXfilter/coating_roughness-field; /NXgrating/coating_roughness-field; /NXguide/coating_roughness-field; /NXmirror/coating_roughness-field
coating_thickness: /NXbeam_splitter/coating/coating_thickness-field; /NXlens_opt/COATING/coating_thickness-field; /NXpolarizer_opt/COATING/coating_thickness-field; /NXwaveplate/coating/coating_thickness-field
coating_type: /NXbeam_splitter/coating/coating_type-field; /NXlens_opt/COATING/coating_type-field; /NXpolarizer_opt/COATING/coating_type-field; /NXwaveplate/coating/coating_type-field
coefficients: /NXcalibration/coefficients-group; /NXspm/ENTRY/INSTRUMENT/TEMPERATURE/temperature_calibration/coefficients-field; /NXspm/ENTRY/INSTRUMENT/current_sensor/current_calibration/coefficients-field; /NXspm/ENTRY/INSTRUMENT/sample_bias_voltage/bias_calibration/coefficients-field; /NXspm/ENTRY/INSTRUMENT/voltage_sensor/voltage_calibration/coefficients-field; /NXstm/ENTRY/INSTRUMENT/current_sensor/current_calibration/coefficients-field
collection: /NXcanSAS/ENTRY/COLLECTION-group; /NXcanSAS/ENTRY/PROCESS/COLLECTION-group; /NXdetector/COLLECTION-group; /NXentry/COLLECTION-group; /NXinstrument/COLLECTION-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group; /NXobject/COLLECTION-group; /NXsubentry/COLLECTION-group
collection_description: /NXarchive/ENTRY/collection_description-field; /NXentry/collection_description-field; /NXsubentry/collection_description-field
collection_identifier: /NXarchive/ENTRY/collection_identifier-field; /NXentry/collection_identifier-field; /NXsnsevent/ENTRY/collection_identifier-field; /NXsnshisto/ENTRY/collection_identifier-field; /NXsubentry/collection_identifier-field
collection_time: /NXarchive/ENTRY/collection_time-field; /NXentry/collection_time-field; /NXsubentry/collection_time-field
collection_title: /NXsnsevent/ENTRY/collection_title-field; /NXsnshisto/ENTRY/collection_title-field
collectioncolumn: /NXelectronanalyzer/COLLECTIONCOLUMN-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN-group
collimator: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXinstrument/COLLIMATOR-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR-group; /NXsastof/ENTRY/instrument/collimator-group
colloquial_name: /NXdispersive_material/ENTRY/sample/colloquial_name-field
color_map: /NXmicrostructure_mtex_config/plotting/color_map-field
color_palette: /NXmicrostructure_mtex_config/plotting/color_palette-field
command1: /NXsnsevent/ENTRY/SNSHistoTool/command1-field; /NXsnshisto/ENTRY/SNSHistoTool/command1-field
command_line_call: /NXcs_profiling/command_line_call-field
comment: /NXapm/ENTRY/measurement/instrument/comment-field; /NXinstrument_apm/comment-field; /NXmicrostructure/comment-field
common: /NXapm_paraprobe_clusterer_config/ENTRY/common-group; /NXapm_paraprobe_clusterer_results/ENTRY/common-group; /NXapm_paraprobe_distancer_config/ENTRY/common-group; /NXapm_paraprobe_distancer_results/ENTRY/common-group; /NXapm_paraprobe_intersector_config/ENTRY/common-group; /NXapm_paraprobe_intersector_results/ENTRY/common-group; /NXapm_paraprobe_nanochem_config/ENTRY/common-group; /NXapm_paraprobe_nanochem_results/ENTRY/common-group; /NXapm_paraprobe_ranger_config/ENTRY/common-group; /NXapm_paraprobe_ranger_results/ENTRY/common-group; /NXapm_paraprobe_selector_config/ENTRY/common-group; /NXapm_paraprobe_selector_results/ENTRY/common-group; /NXapm_paraprobe_spatstat_config/ENTRY/common-group; /NXapm_paraprobe_spatstat_results/ENTRY/common-group; /NXapm_paraprobe_surfacer_config/ENTRY/common-group; /NXapm_paraprobe_surfacer_results/ENTRY/common-group; /NXapm_paraprobe_tessellator_config/ENTRY/common-group; /NXapm_paraprobe_tessellator_results/ENTRY/common-group; /NXapm_paraprobe_transcoder_config/ENTRY/common-group; /NXapm_paraprobe_transcoder_results/ENTRY/common-group
common_beam_depolarizer: /NXtransmission/ENTRY/instrument/common_beam_depolarizer-field
common_beam_mask: /NXtransmission/ENTRY/instrument/common_beam_mask-group
comp_current: /NXflipper/comp_current-field
comp_turns: /NXflipper/comp_turns-field
complex: /NXimage/image_1d/complex-field; /NXimage/image_2d/complex-field; /NXimage/image_3d/complex-field; /NXimage/stack_1d/complex-field; /NXimage/stack_2d/complex-field; /NXimage/stack_3d/complex-field
component: /NXebeam_column/COMPONENT-group; /NXibeam_column/COMPONENT-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/COMPONENT-group; /NXsample/component-field
component_analysis: /NXmicrostructure_imm_config/ENTRY/component_analysis-group; /NXmicrostructure_score_config/ENTRY/component_analysis-group
component_index: /NXgeometry/component_index-field
component_name: /NXmicrostructure_imm_config/ENTRY/component_analysis/component_name-field
components: /NXcircuit/components-field
composition: /NXapm/ENTRY/sample/chemical_composition/ELEMENT/composition-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition-group; /NXchemical_composition/ELEMENT/composition-field; /NXmicrostructure/chemical_composition/ELEMENT/composition-field; /NXpolarizer/composition-field
composition_error: /NXapm/ENTRY/sample/chemical_composition/ELEMENT/composition_error-field; /NXchemical_composition/ELEMENT/composition_error-field; /NXmicrostructure/chemical_composition/ELEMENT/composition_error-field
concentration: /NXsample/concentration-field; /NXsample_component_set/concentration-field
config: /NXapm/ENTRY/atom_probe/hit_finding/config-group; /NXapm/ENTRY/atom_probe/reconstruction/config-group; /NXapm_compositionspace_config/ENTRY/config-group; /NXapm_compositionspace_results/ENTRY/config-group; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/config-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config-group; /NXapm_paraprobe_intersector_results/ENTRY/common/config-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/config-group; /NXapm_paraprobe_ranger_results/ENTRY/common/config-group; /NXapm_paraprobe_selector_results/ENTRY/common/config-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/config-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/config-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/config-group; /NXapm_paraprobe_tool_common/config-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/config-group; /NXem/ENTRY/SIMULATION/config-group; /NXem_calorimetry/ENTRY/config-group; /NXmicrostructure_score_results/ENTRY/config-group
configuration: /NXmicrostructure/configuration-group; /NXmicrostructure_odf/configuration-group; /NXmicrostructure_pf/configuration-group
connections: /NXcircuit/connections-field
consistent_rotations: /NXapm/ENTRY/consistent_rotations-group; /NXem/ENTRY/consistent_rotations-group
construction_date: /NXfabrication/construction_date-field
construction_year: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/construction_year-field
context: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input/context-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input/context-field; /NXimage/PROCESS/input/context-field; /NXspectrum/PROCESS/input/context-field
continuous: /NXscan_control/traj_SCAN/continuous-field
continuous_n: /NXscan_control/linear_SCAN/continuous_N-field; /NXscan_control/mesh_SCAN/continuous_N-field; /NXscan_control/snake_SCAN/continuous_N-field; /NXscan_control/spiral_SCAN/continuous_N-field
contrast_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/contrast_aperture-group
control: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/control-group; /NXinstrument_apm/control-group; /NXlauetof/ENTRY/control-group; /NXrefscan/ENTRY/control-group; /NXreftof/ENTRY/control-group; /NXsastof/ENTRY/control-group; /NXstxm/ENTRY/control-group; /NXtomo/ENTRY/control-group; /NXtomophase/ENTRY/control-group; /NXxbase/ENTRY/control-group
control_action: /NXpid_controller/control_action-field
control_point: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point-group
control_points: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/control_points-field
controller_label: /NXpositioner_spm/controller_label-field
controller_record: /NXpositioner/controller_record-field
controller_status: /NXpositioner_spm/z_controller/controller_status-field
convention: /NXdispersion_function/convention-field; /NXdispersion_table/convention-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/convention-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/convention-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/convention-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/convention-field
conventions: /NXmicrostructure_mtex_config/conventions-group
convolution_mode: /NXmicrostructure_gragles_config/ENTRY/numerics/convolution_mode-field
cooler_or_heater: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/cooler_or_heater-field
coordinate: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/coordinate-field; /NXcg_grid/coordinate-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/coordinate-field
coordinate_system: /NXapm/ENTRY/COORDINATE_SYSTEM-group; /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM-group; /NXcoordinate_system_set/COORDINATE_SYSTEM-group; /NXem/ENTRY/COORDINATE_SYSTEM-group; /NXmpes/ENTRY/COORDINATE_SYSTEM-group
coordinate_system_set: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set-group; /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set-group; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set-group
coordinate_system_transformations: /NXxps/ENTRY/xps_coordinate_system/coordinate_system_transformations-group
coprecipitation_analysis: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis-group
core: /NXfiber/core-group
core_diameter: /NXfiber/core/core_diameter-field
core_index_of_refraction: /NXfiber/core/core_index_of_refraction-field
core_material: /NXfiber/core/core_material-field
core_sample_indices: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/core_sample_indices-field
corrector_ax: /NXebeam_column/corrector_ax-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_ax-group; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_ax-group
corrector_cs: /NXebeam_column/corrector_cs-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs-group; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_cs-group
count: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/ION/count-field; /NXchemical_composition/ELEMENT/count-field; /NXregion/count-field
count_time: /NXdetector/count_time-field; /NXmonitor/count_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field; /NXxpcs/ENTRY/instrument/DETECTOR/count_time-field; /NXxrd_pan/ENTRY/experiment_config/count_time-field
countrate_correction_applied: /NXdetector/countrate_correction_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
countrate_correction_lookup_table: /NXdetector/countrate_correction_lookup_table-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_lookup_table-field
coupled: /NXmoderator/coupled-field
coupling_material: /NXmoderator/coupling_material-field; /NXsnsevent/ENTRY/instrument/moderator/coupling_material-field; /NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
crate: /NXdetector/crate-field
critical_energy: /NXbending_magnet/critical_energy-field
crosstalk_compensation: /NXamplifier/crosstalk_compensation-field
crosstalk_factor: /NXamplifier/crosstalk_factor-field
cryo_bottom_temp: /NXafm/ENTRY/reproducibility_indicators/cryo_bottom_temp-field; /NXafm/ENTRY/resolution_indicators/cryo_bottom_temp-field; /NXspm/ENTRY/INSTRUMENT/scan_environment/cryo_bottom_temp-field; /NXstm/ENTRY/resolution_indicators/cryo_bottom_temp-field; /NXsts/ENTRY/resolution_indicators/cryo_bottom_temp-field
cryo_shield_temp: /NXafm/ENTRY/reproducibility_indicators/cryo_shield_temp-field; /NXafm/ENTRY/resolution_indicators/cryo_shield_temp-field; /NXspm/ENTRY/INSTRUMENT/scan_environment/cryo_shield_temp-field; /NXstm/ENTRY/resolution_indicators/cryo_shield_temp-field; /NXsts/ENTRY/resolution_indicators/cryo_shield_temp-field
cryo_shield_temp_sensor: /NXstm/ENTRY/INSTRUMENT/cryo_shield_temp_sensor-group; /NXstm/ENTRY/INSTRUMENT/scan_environment/cryo_shield_temp_sensor-group
cryo_temp_sensor: /NXstm/ENTRY/INSTRUMENT/cryo_temp_sensor-group; /NXstm/ENTRY/INSTRUMENT/scan_environment/cryo_temp_sensor-group
cryostat: /NXmanipulator/cryostat-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat-group; /NXmpes/ENTRY/SAMPLE/temperature_env/cryostat-group
crystal: /NXinstrument/CRYSTAL-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal-group; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal-group; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal-group; /NXmonochromator/CRYSTAL-group; /NXmonopd/ENTRY/INSTRUMENT/CRYSTAL-group; /NXsnsevent/ENTRY/instrument/CRYSTAL-group; /NXsnshisto/ENTRY/instrument/CRYSTAL-group
crystal_symmetry: /NXmicrostructure_imm_config/ENTRY/roi/crystal_symmetry-field; /NXrotations/crystal_symmetry-field
crystal_symmetry_point_group: /NXmicrostructure_odf/configuration/crystal_symmetry_point_group-field; /NXmicrostructure_pf/configuration/crystal_symmetry_point_group-field
crystal_system: /NXunit_cell/crystal_system-field
crystallographic_calibration: /NXapm/ENTRY/atom_probe/reconstruction/crystallographic_calibration-field; /NXapm_reconstruction/crystallographic_calibration-field
crystals: /NXmicrostructure/crystals-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals-group
cs_computer: /NXcs_profiling/CS_COMPUTER-group
cs_filter_boolean_mask: /NXspatial_filter/CS_FILTER_BOOLEAN_MASK-group
cs_profiling_event: /NXcs_profiling/CS_PROFILING_EVENT-group
csg: /NXsolid_geometry/CSG-group
cue_index: /NXevent_data/cue_index-field; /NXlog/cue_index-field
cue_timestamp_zero: /NXevent_data/cue_timestamp_zero-field; /NXlog/cue_timestamp_zero-field
cumulated: /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/knn/cumulated-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/rdf/cumulated-field
cumulated_normalized: /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/knn/cumulated_normalized-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/rdf/cumulated_normalized-field
current: /NXdeflector/current-field; /NXibeam_column/ion_source/current-field; /NXiv_temp/ENTRY/DATA/current-field; /NXlens_em/current-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/current-field; /NXsource/current-field; /NXspm/ENTRY/INSTRUMENT/current_sensor/current-field; /NXstm/ENTRY/INSTRUMENT/current_sensor/current-field; /NXstm/ENTRY/reproducibility_indicators/current-field; /NXsts/ENTRY/reproducibility_indicators/current-field
current_calibration: /NXspm/ENTRY/INSTRUMENT/current_sensor/current_calibration-group; /NXstm/ENTRY/INSTRUMENT/current_sensor/current_calibration-group
current_gain: /NXspm/ENTRY/INSTRUMENT/current_sensor/AMPLIFIER/current_gain-field; /NXstm/ENTRY/INSTRUMENT/current_sensor/AMPLIFIER/current_gain-field; /NXstm/ENTRY/reproducibility_indicators/current_gain-field; /NXsts/ENTRY/reproducibility_indicators/current_gain-field
current_log: /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log-group
current_offset: /NXspm/ENTRY/INSTRUMENT/current_sensor/current_offset-field; /NXstm/ENTRY/INSTRUMENT/current_sensor/current_offset-field; /NXstm/ENTRY/reproducibility_indicators/current_offset-field; /NXsts/ENTRY/reproducibility_indicators/current_offset-field
current_sensor: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group; /NXspm/ENTRY/INSTRUMENT/current_sensor-group; /NXspm/ENTRY/INSTRUMENT/scan_environment/current_sensor-group; /NXstm/ENTRY/INSTRUMENT/current_sensor-group; /NXsts/ENTRY/INSTRUMENT/current_sensor-group
current_set: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set-group
current_set_feature_to_cluster: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/current_set_feature_to_cluster-field
current_to_next_link: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link-field
current_to_next_link_type: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link_type-field
current_working_directory: /NXapm_compositionspace_results/ENTRY/profiling/current_working_directory-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/current_working_directory-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/current_working_directory-field; /NXcs_profiling/current_working_directory-field
curvature: /NXxraylens/curvature-field
curvature_driving_force: /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force-group
curvature_horizontal: /NXcrystal/curvature_horizontal-field
curvature_radius_face: /NXlens_opt/curvature_radius_FACE-field
curvature_radius_n: /NXcantilever_spm/cantilever_config/curvature_radius_N-field; /NXpiezo_config_spm/piezo_material/curvature_radius_N-field
curvature_vertical: /NXcrystal/curvature_vertical-field
cut_angle: /NXcrystal/cut_angle-field
cylinder_orientation: /NXxraylens/cylinder_orientation-group
cylinder_set: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set-group
cylinders: /NXcylindrical_geometry/cylinders-field
cylindrical: /NXxraylens/cylindrical-field
cylindrical_geometry: /NXbeam_stop/CYLINDRICAL_GEOMETRY-group
cylindrical_orientation_angle: /NXcrystal/cylindrical_orientation_angle-field
d: /NXreflections/d-field
d_4: /NXcorrector_cs/TABLEAU/d_4-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/d_4-group
d_piezoelectric_constant: /NXpiezoelectric_material/D_piezoelectric_constant-field
d_spacing: /NXcrystal/d_spacing-field
d_t: /NXpositioner_spm/z_controller/D_t-field
damask: /NXmicrostructure_score_config/ENTRY/deformation/damask-group
dark_field: /NXtomophase/ENTRY/instrument/dark_field-group
daslogs: /NXsnsevent/ENTRY/DASlogs-group; /NXsnshisto/ENTRY/DASlogs-group
data: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA-group; /NXapm_reconstruction/naive_discretization/DATA-group; /NXarpes/ENTRY/DATA-group; /NXarpes/ENTRY/INSTRUMENT/analyser/data-field; /NXbeam/DATA-group; /NXcalibration/DATA-group; /NXcanSAS/ENTRY/DATA-group; /NXcxi_ptycho/DATA-group; /NXcxi_ptycho/DATA/data-link; /NXcxi_ptycho/data_1/data-link; /NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field; /NXdata/DATA-field; /NXdetector/data-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/data-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/data-field; /NXem/ENTRY/ROI/ebsd/indexing/roi/data-field; /NXem/ENTRY/SIMULATION/results/INTERACTION_VOLUME/DATA-group; /NXem_ebsd/indexing/roi/data-field; /NXentry/DATA-group; /NXfit/data-group; /NXfit_background/data-group; /NXfluo/ENTRY/INSTRUMENT/fluorescence/data-field; /NXfluo/ENTRY/MONITOR/data-field; /NXfluo/ENTRY/data-group; /NXfluo/ENTRY/data/data-link; /NXguide/reflectivity/data-field; /NXiqproc/ENTRY/DATA-group; /NXiqproc/ENTRY/DATA/data-field; /NXiv_temp/ENTRY/DATA-group; /NXlauetof/ENTRY/control/data-field; /NXlauetof/ENTRY/instrument/detector/data-field; /NXlauetof/ENTRY/name/data-link; /NXmicrostructure_ipf/legend/data-field; /NXmicrostructure_ipf/map/data-field; /NXmicrostructure_mtex_config/path/data-field; /NXmonitor/data-field; /NXmonopd/ENTRY/DATA-group; /NXmonopd/ENTRY/DATA/data-link; /NXmonopd/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXmpes/ENTRY/data-group; /NXmpes/ENTRY/data/data-field; /NXmpes_arpes/ENTRY/data-group; /NXmpes_arpes/ENTRY/data/data-field; /NXmx/ENTRY/DATA-group; /NXmx/ENTRY/DATA/data-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXnote/data-field; /NXobject/DATA-group; /NXoptical_spectroscopy/ENTRY/DATA-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/DATA-group; /NXpeak/data-group; /NXrefscan/ENTRY/control/data-field; /NXrefscan/ENTRY/data-group; /NXrefscan/ENTRY/data/data-link; /NXrefscan/ENTRY/instrument/DETECTOR/data-field; /NXreftof/ENTRY/control/data-field; /NXreftof/ENTRY/data-group; /NXreftof/ENTRY/data/data-link; /NXreftof/ENTRY/instrument/detector/data-field; /NXsas/ENTRY/DATA-group; /NXsas/ENTRY/DATA/data-link; /NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXsastof/ENTRY/control/data-field; /NXsastof/ENTRY/data-group; /NXsastof/ENTRY/data/data-link; /NXsastof/ENTRY/instrument/detector/data-field; /NXscan/ENTRY/DATA-group; /NXscan/ENTRY/DATA/data-link; /NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXscan/ENTRY/MONITOR/data-field; /NXscan_control/linear_SCAN/SCAN_data/DATA-field; /NXscan_control/mesh_SCAN/SCAN_data/DATA-field; /NXscan_control/snake_SCAN/SCAN_data/DATA-field; /NXscan_control/spiral_SCAN/SCAN_data/DATA-field; /NXscan_control/traj_SCAN/SCAN_data/DATA-field; /NXsensor_scan/ENTRY/DATA-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group; /NXsnsevent/ENTRY/DATA-group; /NXsnsevent/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/DATA-group; /NXsnshisto/ENTRY/DATA/data-link; /NXsnshisto/ENTRY/MONITOR/data-field; /NXsnshisto/ENTRY/instrument/DETECTOR/data-field; /NXspe/ENTRY/data-group; /NXspe/ENTRY/data/data-field; /NXspm/ENTRY/DATA-group; /NXspm/ENTRY/DATA/DATA-field; /NXsqom/ENTRY/DATA-group; /NXsqom/ENTRY/DATA/data-field; /NXstxm/ENTRY/DATA-group; /NXstxm/ENTRY/DATA/data-field; /NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_x/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_y/data-field; /NXstxm/ENTRY/INSTRUMENT/sample_z/data-field; /NXstxm/ENTRY/control/data-field; /NXsubentry/DATA-group; /NXtas/ENTRY/DATA-group; /NXtas/ENTRY/DATA/data-link; /NXtas/ENTRY/INSTRUMENT/DETECTOR/data-field; /NXtas/ENTRY/MONITOR/data-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/data-field; /NXtofnpd/ENTRY/MONITOR/data-field; /NXtofnpd/ENTRY/data-group; /NXtofnpd/ENTRY/data/data-link; /NXtofraw/ENTRY/MONITOR/data-field; /NXtofraw/ENTRY/data-group; /NXtofraw/ENTRY/data/data-link; /NXtofraw/ENTRY/instrument/detector/data-field; /NXtofsingle/ENTRY/INSTRUMENT/detector/data-field; /NXtofsingle/ENTRY/MONITOR/data-field; /NXtofsingle/ENTRY/data-group; /NXtofsingle/ENTRY/data/data-link; /NXtomo/ENTRY/control/data-field; /NXtomo/ENTRY/data-group; /NXtomo/ENTRY/data/data-link; /NXtomo/ENTRY/instrument/detector/data-field; /NXtomophase/ENTRY/data-group; /NXtomophase/ENTRY/data/data-link; /NXtomophase/ENTRY/instrument/bright_field/data-field; /NXtomophase/ENTRY/instrument/dark_field/data-field; /NXtomophase/ENTRY/instrument/sample/data-field; /NXtomoproc/ENTRY/data-group; /NXtomoproc/ENTRY/data/data-field; /NXtransmission/ENTRY/data-group; /NXxas/ENTRY/DATA-group; /NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field; /NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field; /NXxas/ENTRY/MONITOR/data-field; /NXxasproc/ENTRY/DATA-group; /NXxasproc/ENTRY/DATA/data-field; /NXxbase/ENTRY/DATA-group; /NXxbase/ENTRY/DATA/data-link; /NXxbase/ENTRY/instrument/detector/data-field; /NXxlaue/ENTRY/instrument/source/distribution/data-field; /NXxpcs/ENTRY/data-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data-group; /NXxps/ENTRY/FIT/data-group; /NXxps/ENTRY/FIT/peakPEAK/data-group; /NXxps/ENTRY/data-group; /NXxrd/ENTRY/DATA-group; /NXxrd/ENTRY/DATA/data-field
data_1: /NXcxi_ptycho/data_1-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
data_collection: /NXellipsometry/ENTRY/data_collection-group
data_correction: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/data_correction-field
data_errors: /NXdetector/data_errors-field
data_file: /NXdetector/data_file-group; /NXxrd_pan/ENTRY/data_file-field
data_identifier: /NXellipsometry/ENTRY/data_collection/data_identifier-field
data_offset: /NXmx/ENTRY/DATA/data_offset-field
data_origin: /NXdetector_module/data_origin-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
data_scaling_factor: /NXmx/ENTRY/DATA/data_scaling_factor-field
data_size: /NXdetector_module/data_size-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
data_software: /NXellipsometry/ENTRY/data_collection/data_software-group
data_stride: /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
data_type: /NXellipsometry/ENTRY/data_collection/data_type-field
data_x_time_of_flight: /NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
data_x_y: /NXsnsevent/ENTRY/DATA/data_x_y-link; /NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field; /NXsnshisto/ENTRY/DATA/data_x_y-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
data_y_time_of_flight: /NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link; /NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
datatype_n: /NXbeam_transfer_matrix_table/datatype_N-field
date: /NXcanSAS/ENTRY/PROCESS/date-field; /NXdispersive_material/ENTRY/date-field; /NXmicrostructure/date-field; /NXnote/date-field; /NXprocess/date-field; /NXsnsevent/ENTRY/SNSHistoTool/date-field; /NXsnshisto/ENTRY/SNSHistoTool/date-field; /NXtomoproc/ENTRY/reconstruction/date-field; /NXxasproc/ENTRY/XAS_data_reduction/date-field
dbscan: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan-group; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS/DBSCAN-group; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/dbscan-group; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN-group
dead_time: /NXdetector/dead_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
decelerate_electrode: /NXinstrument_apm/decelerate_electrode-group
decomposition: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/decomposition-group
decoration_filter: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter-group
decorator_multiplicity: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/decorator_multiplicity-field
default_color_map: /NXmicrostructure_mtex_config/plotting/default_color_map-field
definition: /NXafm/ENTRY/definition-field; /NXapm/ENTRY/definition-field; /NXapm_compositionspace_config/ENTRY/definition-field; /NXapm_compositionspace_results/ENTRY/definition-field; /NXapm_paraprobe_clusterer_config/ENTRY/definition-field; /NXapm_paraprobe_clusterer_results/ENTRY/definition-field; /NXapm_paraprobe_distancer_config/ENTRY/definition-field; /NXapm_paraprobe_distancer_results/ENTRY/definition-field; /NXapm_paraprobe_intersector_config/ENTRY/definition-field; /NXapm_paraprobe_intersector_results/ENTRY/definition-field; /NXapm_paraprobe_nanochem_config/ENTRY/definition-field; /NXapm_paraprobe_nanochem_results/ENTRY/definition-field; /NXapm_paraprobe_ranger_config/ENTRY/definition-field; /NXapm_paraprobe_ranger_results/ENTRY/definition-field; /NXapm_paraprobe_selector_config/ENTRY/definition-field; /NXapm_paraprobe_selector_results/ENTRY/definition-field; /NXapm_paraprobe_spatstat_config/ENTRY/definition-field; /NXapm_paraprobe_spatstat_results/ENTRY/definition-field; /NXapm_paraprobe_surfacer_config/ENTRY/definition-field; /NXapm_paraprobe_surfacer_results/ENTRY/definition-field; /NXapm_paraprobe_tessellator_config/ENTRY/definition-field; /NXapm_paraprobe_tessellator_results/ENTRY/definition-field; /NXapm_paraprobe_transcoder_config/ENTRY/definition-field; /NXapm_paraprobe_transcoder_results/ENTRY/definition-field; /NXarchive/ENTRY/definition-field; /NXarpes/ENTRY/definition-field; /NXcanSAS/ENTRY/definition-field; /NXcxi_ptycho/entry_1/definition-field; /NXdirecttof/ENTRY/definition-field; /NXdispersive_material/ENTRY/definition-field; /NXellipsometry/ENTRY/definition-field; /NXem/ENTRY/definition-field; /NXem_calorimetry/ENTRY/definition-field; /NXentry/definition-field; /NXfluo/ENTRY/definition-field; /NXindirecttof/ENTRY/definition-field; /NXiqproc/ENTRY/definition-field; /NXiv_temp/ENTRY/definition-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field; /NXlab_sample_mounting/ENTRY/definition-field; /NXlauetof/ENTRY/definition-field; /NXmicrostructure_gragles_config/ENTRY/definition-field; /NXmicrostructure_gragles_results/ENTRY/definition-field; /NXmicrostructure_imm_config/ENTRY/definition-field; /NXmicrostructure_imm_results/ENTRY/definition-field; /NXmicrostructure_kanapy_results/ENTRY/definition-field; /NXmicrostructure_score_config/ENTRY/definition-field; /NXmicrostructure_score_results/ENTRY/definition-field; /NXmonopd/ENTRY/definition-field; /NXmpes/ENTRY/definition-field; /NXmpes_arpes/ENTRY/definition-field; /NXmx/ENTRY/definition-field; /NXoptical_spectroscopy/ENTRY/definition-field; /NXraman/ENTRY/definition-field; /NXrefscan/ENTRY/definition-field; /NXreftof/ENTRY/definition-field; /NXsas/ENTRY/definition-field; /NXsastof/ENTRY/definition-field; /NXscan/ENTRY/definition-field; /NXsensor_scan/ENTRY/definition-field; /NXsnsevent/ENTRY/definition-field; /NXsnshisto/ENTRY/definition-field; /NXspe/ENTRY/definition-field; /NXspm/ENTRY/definition-field; /NXsqom/ENTRY/definition-field; /NXstm/ENTRY/definition-field; /NXsts/ENTRY/definition-field; /NXstxm/ENTRY/definition-field; /NXsubentry/definition-field; /NXtas/ENTRY/definition-field; /NXtofnpd/ENTRY/definition-field; /NXtofraw/ENTRY/definition-field; /NXtofsingle/ENTRY/definition-field; /NXtomo/ENTRY/definition-field; /NXtomophase/ENTRY/definition-field; /NXtomoproc/ENTRY/definition-field; /NXtransmission/ENTRY/definition-field; /NXxas/ENTRY/definition-field; /NXxasproc/ENTRY/definition-field; /NXxbase/ENTRY/definition-field; /NXxeuler/ENTRY/definition-field; /NXxkappa/ENTRY/definition-field; /NXxlaue/ENTRY/definition-field; /NXxlaueplate/ENTRY/definition-field; /NXxnb/ENTRY/definition-field; /NXxpcs/ENTRY/definition-field; /NXxps/ENTRY/definition-field; /NXxrd/ENTRY/definition-field; /NXxrd_pan/ENTRY/definition-field; /NXxrot/ENTRY/definition-field
definition_local: /NXentry/definition_local-field; /NXsubentry/definition_local-field
definitions: /NXapm/ENTRY/atom_probe/ranging/definitions-group
deflection_angle: /NXbeam_splitter/deflection_angle-field; /NXgrating/deflection_angle-field
deflector: /NXcollectioncolumn/DEFLECTOR-group; /NXcorrector_cs/DEFLECTOR-group; /NXebeam_column/DEFLECTOR-group; /NXelectronanalyzer/DEFLECTOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/DEFLECTOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/DEFLECTOR-group; /NXem/ENTRY/measurement/instrument/ebeam_column/DEFLECTOR-group; /NXem/ENTRY/measurement/instrument/ibeam_column/DEFLECTOR-group; /NXenergydispersion/DEFLECTOR-group; /NXibeam_column/DEFLECTOR-group; /NXscanbox_em/DEFLECTOR-group; /NXsource/DEFLECTOR-group; /NXspindispersion/DEFLECTOR-group
defocus: /NXoptical_system_em/defocus-field
deformation: /NXmicrostructure_score_config/ENTRY/deformation-group
deformation_gradient: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient-group
defragment: /NXmicrostructure_score_config/ENTRY/numerics/cell_cache/defragment-field
defragment_x: /NXmicrostructure_score_config/ENTRY/numerics/cell_cache/defragment_x-field
degree_char: /NXmicrostructure_mtex_config/plotting/degree_char-field
delay: /NXdisk_chopper/delay-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/delay-field; /NXmpes/ENTRY/data/delay-field
delay_difference: /NXxpcs/ENTRY/data/delay_difference-field
delocalization: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION-group
delta_time: /NXaberration/delta_time-field; /NXem_calorimetry/ENTRY/synchronization/delta_time-field; /NXevent_data_apm/delta_time-field
demodulated_amplitude: /NXlockin/demodulated_amplitude-field
demodulated_frequency: /NXlockin/demodulated_frequency-field
demodulated_phase: /NXlockin/demodulated_phase-field
demodulated_signal: /NXlockin/demodulated_signal-field
demodulator_channels: /NXlockin/demodulator_channels-field
density: /NXcontainer/density-field; /NXcrystal/density-field; /NXem/ENTRY/SAMPLE/density-field; /NXfilter/density-field; /NXpiezoelectric_material/density-field; /NXsample/density-field; /NXsample_component/density-field
depends_on: /NXaperture/depends_on-field; /NXattenuator/depends_on-field; /NXbeam/depends_on-field; /NXbeam_stop/depends_on-field; /NXbending_magnet/depends_on-field; /NXcapillary/depends_on-field; /NXcg_polyline/depends_on-field; /NXcg_primitive/depends_on-field; /NXcollimator/depends_on-field; /NXcomponent/depends_on-field; /NXcoordinate_system/depends_on-field; /NXcrystal/depends_on-field; /NXcs_filter_boolean_mask/depends_on-field; /NXdetector/depends_on-field; /NXdetector_module/depends_on-field; /NXdisk_chopper/depends_on-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/depends_on-field; /NXem/ENTRY/ROI/ebsd/measurement/depends_on-field; /NXem/ENTRY/ROI/ebsd/simulation/depends_on-field; /NXem/ENTRY/sample_reference_frame/depends_on-field; /NXem_ebsd/calibration/depends_on-field; /NXem_ebsd/measurement/depends_on-field; /NXem_ebsd/simulation/depends_on-field; /NXenvironment/depends_on-field; /NXfermi_chopper/depends_on-field; /NXfilter/depends_on-field; /NXflipper/depends_on-field; /NXfresnel_zone_plate/depends_on-field; /NXgrating/depends_on-field; /NXguide/depends_on-field; /NXinsertion_device/depends_on-field; /NXmicrostructure_ipf/depends_on-field; /NXmirror/depends_on-field; /NXmoderator/depends_on-field; /NXmonitor/depends_on-field; /NXmonochromator/depends_on-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/depends_on-field; /NXmpes_arpes/ENTRY/SAMPLE/depends_on-field; /NXmpes_arpes/ENTRY/arpes_geometry/depends_on-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field; /NXmx/ENTRY/SAMPLE/depends_on-field; /NXoptical_spectroscopy/ENTRY/beam_ref_frame/depends_on-field; /NXoptical_spectroscopy/ENTRY/sample_normal_ref_frame/depends_on-field; /NXpinhole/depends_on-field; /NXpolarizer/depends_on-field; /NXpositioner/depends_on-field; /NXquadric/depends_on-field; /NXregistration/depends_on-field; /NXsensor/depends_on-field; /NXslit/depends_on-field; /NXsource/depends_on-field; /NXvelocity_selector/depends_on-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/depends_on-field; /NXxps/ENTRY/INSTRUMENT/beam_probe/depends_on-field; /NXxps/ENTRY/SAMPLE/depends_on-field; /NXxps/ENTRY/xps_coordinate_system/depends_on-field; /NXxraylens/depends_on-field
depolarization: /NXoptical_spectroscopy/ENTRY/derived_parameters/depolarization-field
depth: /NXgrating/depth-field
derived_parameters: /NXoptical_spectroscopy/ENTRY/derived_parameters-group
description: /NXactivity/description-field; /NXaperture/description-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/PEAK/description-field; /NXapm/ENTRY/sample/description-field; /NXapm/ENTRY/specimen/description-field; /NXapm_paraprobe_tool_config/description-field; /NXapm_paraprobe_tool_results/description-field; /NXapm_ranging/background_quantification/description-field; /NXarchive/ENTRY/instrument/description-field; /NXarchive/ENTRY/sample/description-field; /NXbeam_stop/description-field; /NXcalibration/description-field; /NXcanSAS/ENTRY/PROCESS/description-field; /NXcg_primitive/description-field; /NXcite/description-field; /NXcomponent/description-field; /NXcontainer/description-field; /NXcorrector_cs/TABLEAU/description-field; /NXcs_profiling_event/description-field; /NXdetector/description-field; /NXdispersion_repeated_parameter/description-field; /NXdispersion_single_parameter/description-field; /NXdistortion/description-field; /NXelectronanalyzer/description-field; /NXelectrostatic_kicker/description-field; /NXem/ENTRY/SAMPLE/description-field; /NXem_eds/indexing/IMAGE/description-field; /NXenvironment/description-field; /NXfiber/description-field; /NXfilter/description-field; /NXfit/error_function/description-field; /NXfit_function/description-field; /NXgeometry/description-field; /NXguide/description-field; /NXibeam_column/ion_source/description-field; /NXlens_em/description-field; /NXlog/description-field; /NXmagnetic_kicker/description-field; /NXmanipulator/description-field; /NXmicrostructure_gragles_config/ENTRY/description-field; /NXmicrostructure_gragles_results/ENTRY/description-field; /NXmicrostructure_imm_results/ENTRY/description-field; /NXmicrostructure_kanapy_results/ENTRY/description-field; /NXmicrostructure_score_config/ENTRY/description-field; /NXmicrostructure_score_results/ENTRY/description-field; /NXmirror/description-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/description-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field; /NXnote/description-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/description-field; /NXpid_controller/description-field; /NXpositioner/description-field; /NXquadrupole_magnet/description-field; /NXregistration/description-field; /NXsample/description-field; /NXsample_component/description-field; /NXseparator/description-field; /NXsnsevent/ENTRY/DASlogs/LOG/description-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field; /NXsnsevent/ENTRY/SNSHistoTool/description-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsnshisto/ENTRY/DASlogs/LOG/description-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field; /NXsnshisto/ENTRY/SNSHistoTool/description-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field; /NXsolenoid_magnet/description-field; /NXspin_rotator/description-field; /NXxpcs/ENTRY/instrument/DETECTOR/description-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/description-field; /NXxps/ENTRY/FIT/error_function/description-field; /NXxps/ENTRY/FIT/global_fit_function/description-field; /NXxps/ENTRY/FIT/peakPEAK/function/description-field
descriptor: /NXem/ENTRY/ROI/ebsd/indexing/roi/descriptor-field; /NXem_ebsd/indexing/roi/descriptor-field
design: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/design-field; /NXem/ENTRY/measurement/instrument/PUMP/design-field; /NXem/ENTRY/measurement/instrument/stage/design-field; /NXinstrument_em/stage/design-field; /NXpump/design-field
det_module: /NXreflections/det_module-field
details: /NXcanSAS/ENTRY/SAMPLE/details-field
detection_gas_path: /NXdetector/detection_gas_path-field
detector: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group; /NXelectronanalyzer/DETECTOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/DETECTOR-group; /NXem/ENTRY/measurement/instrument/DETECTOR-group; /NXinstrument/DETECTOR-group; /NXinstrument_em/DETECTOR-group; /NXlauetof/ENTRY/instrument/detector-group; /NXmonopd/ENTRY/INSTRUMENT/DETECTOR-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR-group; /NXrefscan/ENTRY/instrument/DETECTOR-group; /NXreftof/ENTRY/instrument/detector-group; /NXsas/ENTRY/INSTRUMENT/DETECTOR-group; /NXsastof/ENTRY/instrument/detector-group; /NXscan/ENTRY/INSTRUMENT/DETECTOR-group; /NXsnsevent/ENTRY/instrument/DETECTOR-group; /NXsnshisto/ENTRY/instrument/DETECTOR-group; /NXstxm/ENTRY/INSTRUMENT/DETECTOR-group; /NXtas/ENTRY/INSTRUMENT/DETECTOR-group; /NXtofnpd/ENTRY/INSTRUMENT/detector-group; /NXtofraw/ENTRY/instrument/detector-group; /NXtofsingle/ENTRY/INSTRUMENT/detector-group; /NXtomo/ENTRY/instrument/detector-group; /NXtransmission/ENTRY/instrument/DETECTOR-group; /NXxbase/ENTRY/instrument/detector-group; /NXxeuler/ENTRY/instrument/detector-group; /NXxkappa/ENTRY/instrument/detector-group; /NXxlaueplate/ENTRY/instrument/detector-group; /NXxnb/ENTRY/instrument/detector-group; /NXxpcs/ENTRY/instrument/DETECTOR-group; /NXxrd/ENTRY/INSTRUMENT/DETECTOR-group; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR-group; /NXxrot/ENTRY/instrument/detector-group
detector_1: /NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_channel_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_channel_type-field
detector_faces: /NXoff_geometry/detector_faces-field
detector_group: /NXinstrument/DETECTOR_GROUP-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_module: /NXdetector/DETECTOR_MODULE-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number: /NXcylindrical_geometry/detector_number-field; /NXdetector/detector_number-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/detector_number-field; /NXtofnpd/ENTRY/data/detector_number-link; /NXtofraw/ENTRY/data/detector_number-link; /NXtofraw/ENTRY/instrument/detector/detector_number-field
detector_readout_time: /NXdetector/detector_readout_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_reference_frame: /NXcoordinate_system_set/DETECTOR_REFERENCE_FRAME-group; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME-group
detector_type: /NXelectron_detector/detector_type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/detector_type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type-field
detector_voltage: /NXelectron_detector/detector_voltage-field
device_information: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/device_information-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/device_information-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information-group; /NXmpes/ENTRY/INSTRUMENT/device_information-group; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/device_information-group; /NXmpes/ENTRY/INSTRUMENT/source_probe/device_information-group; /NXmpes/ENTRY/INSTRUMENT/source_pump/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/device_information-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/device_information-group
device_path: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/device_path-field
diameter: /NXdetector/diameter-field; /NXenergydispersion/diameter-field; /NXmicrostructure_score_config/ENTRY/deformation/diameter-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/diameter-field; /NXpinhole/diameter-field; /NXwaveplate/diameter-field; /NXxlaueplate/ENTRY/instrument/detector/diameter-field
dielectric_function: /NXdispersion_table/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
diffraction: /NXem_calorimetry/ENTRY/diffraction-group
diffraction_order: /NXgrating/diffraction_order-field
diffraction_space: /NXem_calorimetry/ENTRY/diffraction_space-group
diffractometer: /NXinstrument/DIFFRACTOMETER-group
dimensionality: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/dimensionality-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/dimensionality-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/dimensionality-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/dimensionality-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/dimensionality-field; /NXcg_half_edge_data_structure/dimensionality-field; /NXcg_primitive/dimensionality-field; /NXisocontour/dimensionality-field; /NXmicrostructure/configuration/dimensionality-field; /NXmicrostructure_imm_config/ENTRY/roi/dimensionality-field; /NXmicrostructure_score_config/ENTRY/sample/dimensionality-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/dimensionality-field; /NXunit_cell/dimensionality-field
direction: /NXbeam/TRANSFORMATIONS/DIRECTION-field; /NXshape/direction-field
discretization: /NXmicrostructure_gragles_config/ENTRY/discretization-group; /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/discretization-field; /NXmicrostructure_imm_config/ENTRY/roi/discretization-field; /NXmicrostructure_score_config/ENTRY/discretization-group; /NXmicrostructure_score_results/ENTRY/discretization-group
disk_chopper: /NXdirecttof/ENTRY/INSTRUMENT/disk_chopper-group; /NXinstrument/DISK_CHOPPER-group; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
dislocation_density: /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/dislocation_density-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/dislocation_density-field
dislocation_distribution: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution-group
disorientation_angle: /NXrotations/disorientation_angle-field
disorientation_axis: /NXrotations/disorientation_axis-field
disorientation_quaternion: /NXrotations/disorientation_quaternion-field
disorientation_threshold: /NXmicrostructure/configuration/disorientation_threshold-field
dispersion: /NXebeam_column/MONOCHROMATOR/dispersion-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/MONOCHROMATOR/dispersion-field; /NXfiber/dispersion-field
dispersion_function: /NXdispersion/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
dispersion_repeated_parameter: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
dispersion_single_parameter: /NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
dispersion_table: /NXdispersion/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
dispersion_type: /NXdispersive_material/ENTRY/dispersion_type-field; /NXfiber/dispersion_type-field
dispersion_x: /NXdispersive_material/ENTRY/dispersion_x-group
dispersion_y: /NXdispersive_material/ENTRY/dispersion_y-group
dispersion_z: /NXdispersive_material/ENTRY/dispersion_z-group
dispersoid_drag: /NXmicrostructure_score_config/ENTRY/dispersoid_drag-group
distance: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance/distance-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/distance-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/distance-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/distance-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/distance-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/knn/distance-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/rdf/distance-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/distance-field; /NXapm_paraprobe_tool_config/surface_distance/distance-field; /NXattenuator/distance-field; /NXbeam/distance-field; /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field; /NXdetector/distance-field; /NXdisk_chopper/distance-field; /NXfermi_chopper/distance-field; /NXindirecttof/ENTRY/INSTRUMENT/analyser/distance-field; /NXlauetof/ENTRY/instrument/detector/distance-field; /NXmoderator/distance-field; /NXmonitor/distance-field; /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/distance-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/distance-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/distance-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXreftof/ENTRY/instrument/chopper/distance-field; /NXreftof/ENTRY/instrument/detector/distance-field; /NXsample/distance-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field; /NXsastof/ENTRY/instrument/detector/distance-field; /NXsnsevent/ENTRY/MONITOR/distance-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/distance-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnsevent/ENTRY/instrument/moderator/distance-field; /NXsnshisto/ENTRY/MONITOR/distance-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/distance-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field; /NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field; /NXsnshisto/ENTRY/instrument/moderator/distance-field; /NXsource/distance-field; /NXspe/ENTRY/data/distance-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/distance-field; /NXtofnpd/ENTRY/MONITOR/distance-field; /NXtofraw/ENTRY/MONITOR/distance-field; /NXtofraw/ENTRY/instrument/detector/distance-field; /NXtofsingle/ENTRY/INSTRUMENT/detector/distance-field; /NXtofsingle/ENTRY/MONITOR/distance-field; /NXtomo/ENTRY/instrument/detector/distance-field; /NXtomophase/ENTRY/instrument/sample/distance-field; /NXxbase/ENTRY/instrument/detector/distance-field; /NXxbase/ENTRY/sample/distance-field; /NXxpcs/ENTRY/instrument/DETECTOR/distance-field
distance_derived: /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector: /NXbeam_stop/distance_to_detector-field
distances: /NXtranslation/distances-field
distancing_model: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/distancing_model-field
distortion: /NXmpes/ENTRY/DISTORTION-group
distortion_correction: /NXem_calorimetry/ENTRY/distortion_correction-group
distribution: /NXmonochromator/distribution-group; /NXsource/distribution-group; /NXxlaue/ENTRY/instrument/source/distribution-group
divergence_x: /NXcollimator/divergence_x-field
divergence_x_minus: /NXbending_magnet/divergence_x_minus-field
divergence_x_plus: /NXbending_magnet/divergence_x_plus-field
divergence_y: /NXcollimator/divergence_y-field
divergence_y_minus: /NXbending_magnet/divergence_y_minus-field
divergence_y_plus: /NXbending_magnet/divergence_y_plus-field
dld_wire_names: /NXapm/ENTRY/atom_probe/raw_data/dld_wire_names-field
doi: /NXapm/ENTRY/CITE/doi-field; /NXcite/doi-field; /NXdispersive_material/ENTRY/REFERENCES/doi-field
dose_management: /NXoptical_system_em/dose_management-field
dose_rate: /NXoptical_system_em/dose_rate-field
downsampled: /NXregion/downsampled-group
dql: /NXcanSAS/ENTRY/DATA/dQl-field
dqw: /NXcanSAS/ENTRY/DATA/dQw-field
drag: /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility/drag-field
drain_current_ammeter: /NXmanipulator/drain_current_ammeter-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_ammeter-group
drain_current_env: /NXmpes/ENTRY/SAMPLE/drain_current_env-group
drift_correction_status: /NXpiezo_config_spm/calibration/drift_correction_status-field
drift_energy: /NXenergydispersion/drift_energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/drift_energy-field
drift_n: /NXpiezo_config_spm/calibration/drift_N-field
dspacing: /NXem_ebsd/indexing/PHASE/dspacing-field
duration: /NXarchive/ENTRY/duration-field; /NXentry/duration-field; /NXlog/duration-field; /NXsnsevent/ENTRY/DASlogs/LOG/duration-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnsevent/ENTRY/duration-field; /NXsnshisto/ENTRY/DASlogs/LOG/duration-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field; /NXsnshisto/ENTRY/duration-field; /NXsubentry/duration-field; /NXtofraw/ENTRY/duration-field; /NXtofsingle/ENTRY/duration-field
duty_cycle: /NXgrating/duty_cycle-field
dwell_time: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/scan_controller/dwell_time-field; /NXscanbox_em/dwell_time-field
dynamic_focus_correction: /NXoptical_system_em/dynamic_focus_correction-field
dynamic_phi_list: /NXxpcs/ENTRY/instrument/masks/dynamic_phi_list-field
dynamic_q_list: /NXxpcs/ENTRY/instrument/masks/dynamic_q_list-field
dynamic_refocusing: /NXoptical_system_em/dynamic_refocusing-field
dynamic_roi_map: /NXxpcs/ENTRY/instrument/masks/dynamic_roi_map-field
ebeam_column: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column-group; /NXem/ENTRY/measurement/instrument/ebeam_column-group; /NXinstrument_em/EBEAM_COLUMN-group
ebsd: /NXem/ENTRY/ROI/ebsd-group; /NXmicrostructure_mtex_config/path/ebsd-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd-group
ebsd_extensions: /NXmicrostructure_mtex_config/path/ebsd_extensions-field
edge_contact: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/edge_contact-field
edge_distance: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/edge_distance-field
edge_length: /NXapm_compositionspace_config/ENTRY/config/voxelization/edge_length-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/edge_length-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/edge_length-field; /NXcg_polygon/edge_length-field; /NXcg_polyhedron/edge_length-field; /NXcg_tetrahedron/edge_length-field; /NXcg_triangle/edge_length-field; /NXmicrostructure_gragles_config/ENTRY/discretization/edge_length-field
edge_method: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_method-field
edge_normal: /NXcg_hexahedron/edge_normal-group; /NXcg_primitive/edge_normal-group
edge_threshold: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_threshold-field
edges: /NXcg_face_list_data_structure/edges-field
edges_are_unique: /NXcg_face_list_data_structure/edges_are_unique-field
eds: /NXem/ENTRY/ROI/eds-group
eels: /NXem/ENTRY/ROI/eels-group
ef: /NXtas/ENTRY/DATA/ef-link; /NXtas/ENTRY/INSTRUMENT/analyser/ef-field
efficiency: /NXapm_reconstruction/efficiency-field; /NXdetector/efficiency-group; /NXdetector/efficiency/efficiency-field; /NXmonitor/efficiency-field; /NXpolarizer/efficiency-field
ei: /NXtas/ENTRY/DATA/ei-link; /NXtas/ENTRY/INSTRUMENT/monochromator/ei-field
elapsed_time: /NXapm/ENTRY/elapsed_time-field; /NXcs_profiling_event/elapsed_time-field
electric_field: /NXarchive/ENTRY/sample/electric_field-field; /NXsample/electric_field-field
electrical_conductivity: /NXlab_sample_mounting/ENTRY/electrical_conductivity-field
electrical_field: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/electrical_field-group
electron_detector: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR-group
electron_source: /NXebeam_column/electron_source-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/electron_source-group; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source-group
electronanalyzer: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER-group
element: /NXapm/ENTRY/sample/chemical_composition/ELEMENT-group; /NXchemical_composition/ELEMENT-group; /NXmicrostructure/chemical_composition/ELEMENT-group
ellipsoid_set: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set-group
ellipsometer_type: /NXellipsometry/ENTRY/INSTRUMENT/ellipsometer_type-field
ellipsometry_experiment_type: /NXellipsometry/ENTRY/ellipsometry_experiment_type-field
email: /NXem/ENTRY/USER/email-field; /NXsensor_scan/ENTRY/USER/email-field; /NXtransmission/ENTRY/operator/email-field; /NXuser/email-field
embedding_medium: /NXlab_sample_mounting/ENTRY/embedding_medium-field
emission_current: /NXebeam_column/electron_source/emission_current-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/electron_source/emission_current-field; /NXsource/emission_current-field
emittance_x: /NXsource/emittance_x-field
emittance_y: /NXsource/emittance_y-field
emitter_material: /NXebeam_column/electron_source/emitter_material-field
emitter_type: /NXebeam_column/electron_source/emitter_type-field; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/emitter_type-field; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/emitter_type-field; /NXibeam_column/ion_source/emitter_type-field
en: /NXsqom/ENTRY/DATA/en-field; /NXtas/ENTRY/DATA/en-link; /NXtas/ENTRY/SAMPLE/en-field
end: /NXxrd_pan/ENTRY/experiment_config/omega/end-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/end-field
end_settling_time: /NXbias_spectroscopy/bias_sweep/end_settling_time-field
end_time: /NXactivity/end_time-field; /NXapm/ENTRY/end_time-field; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/end_time-field; /NXapm_compositionspace_results/ENTRY/profiling/end_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_tool_common/profiling/end_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/end_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/end_time-field; /NXarchive/ENTRY/end_time-field; /NXcs_profiling/end_time-field; /NXcs_profiling_event/end_time-field; /NXcxi_ptycho/entry_1/end_time-field; /NXem/ENTRY/end_time-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/end_time-field; /NXem_calorimetry/ENTRY/profiling/end_time-field; /NXentry/end_time-field; /NXevent_data_apm/end_time-field; /NXevent_data_em/end_time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/end_time-field; /NXlab_sample_mounting/ENTRY/end_time-field; /NXmicrostructure_gragles_config/ENTRY/end_time-field; /NXmicrostructure_gragles_results/ENTRY/end_time-field; /NXmicrostructure_imm_results/ENTRY/end_time-field; /NXmicrostructure_kanapy_results/ENTRY/end_time-field; /NXmicrostructure_score_results/ENTRY/end_time-field; /NXmonitor/end_time-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/end_time-field; /NXmpes/ENTRY/end_time-field; /NXmx/ENTRY/end_time-field; /NXoptical_spectroscopy/ENTRY/end_time-field; /NXrefscan/ENTRY/end_time-field; /NXreftof/ENTRY/end_time-field; /NXsas/ENTRY/end_time-field; /NXscan/ENTRY/end_time-field; /NXsensor_scan/ENTRY/end_time-field; /NXsnsevent/ENTRY/end_time-field; /NXsnshisto/ENTRY/end_time-field; /NXstxm/ENTRY/end_time-field; /NXsubentry/end_time-field; /NXtomo/ENTRY/end_time-field; /NXtomophase/ENTRY/end_time-field; /NXxpcs/ENTRY/end_time-field
end_time_estimated: /NXmx/ENTRY/end_time_estimated-field
endnote: /NXcite/endnote-field
energies: /NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
energy: /NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field; /NXdirecttof/ENTRY/INSTRUMENT/disk_chopper/energy-field; /NXdirecttof/ENTRY/INSTRUMENT/fermi_chopper/energy-field; /NXdispersion_table/energy-field; /NXem_eds/indexing/PEAK/ATOM/energy-field; /NXfermi_chopper/energy-field; /NXfluo/ENTRY/INSTRUMENT/fluorescence/energy-field; /NXfluo/ENTRY/data/energy-link; /NXindirecttof/ENTRY/INSTRUMENT/analyser/energy-field; /NXinsertion_device/energy-field; /NXmicrostructure/quadruple_junctions/energy-field; /NXmonochromator/energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/energy-field; /NXmpes/ENTRY/INSTRUMENT/monochromator_TYPE/energy-field; /NXmpes/ENTRY/data/energy-field; /NXmpes_arpes/ENTRY/data/energy-field; /NXsource/energy-field; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field; /NXspe/ENTRY/data/energy-field; /NXstxm/ENTRY/DATA/energy-field; /NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxas/ENTRY/DATA/energy-link; /NXxas/ENTRY/INSTRUMENT/monochromator/energy-field; /NXxasproc/ENTRY/DATA/energy-field; /NXxps/ENTRY/data/energy-field
energy_axis_calibration: /NXmpes/ENTRY/energy_axis_calibration-group
energy_dispersion: /NXmonochromator/energy_dispersion-field
energy_error: /NXmonochromator/energy_error-field
energy_errors: /NXmonochromator/energy_errors-field
energy_identifier: /NXdispersion_function/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_identifier-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_identifier-field
energy_interval: /NXenergydispersion/energy_interval-field
energy_max: /NXdispersion_function/energy_max-field
energy_min: /NXdispersion_function/energy_min-field
energy_range: /NXem/ENTRY/ROI/eds/indexing/IMAGE/energy_range-field; /NXem_eds/indexing/IMAGE/energy_range-field; /NXem_eds/indexing/PEAK/ATOM/energy_range-field
energy_referencing: /NXmpes/ENTRY/energy_referencing-group; /NXxps/ENTRY/energy_referencing-group
energy_resolution: /NXelectronanalyzer/energy_resolution-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/energy_resolution-group; /NXmpes/ENTRY/INSTRUMENT/energy_resolution-group
energy_scan_mode: /NXenergydispersion/energy_scan_mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/energy_scan_mode-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/energy_scan_mode-field
energy_transfer: /NXbeam/energy_transfer-field
energy_unit: /NXdispersion_function/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_unit-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_unit-field
energydispersion: /NXelectronanalyzer/ENERGYDISPERSION-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION-group
ensemble: /NXmicrostructure_score_config/ENTRY/deformation/ensemble-group; /NXmicrostructure_score_config/ENTRY/nucleation/ensemble-group
entering: /NXreflections/entering-field
enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/enthalpy-field
entrance_slit: /NXmonochromator/entrance_slit-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/entrance_slit-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/entrance_slit-group
entrance_slit_setting: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
entrance_slit_shape: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
entrance_slit_size: /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
entry: /NXafm/ENTRY-group; /NXapm/ENTRY-group; /NXapm_compositionspace_config/ENTRY-group; /NXapm_compositionspace_results/ENTRY-group; /NXapm_paraprobe_clusterer_config/ENTRY-group; /NXapm_paraprobe_clusterer_results/ENTRY-group; /NXapm_paraprobe_distancer_config/ENTRY-group; /NXapm_paraprobe_distancer_results/ENTRY-group; /NXapm_paraprobe_intersector_config/ENTRY-group; /NXapm_paraprobe_intersector_results/ENTRY-group; /NXapm_paraprobe_nanochem_config/ENTRY-group; /NXapm_paraprobe_nanochem_results/ENTRY-group; /NXapm_paraprobe_ranger_config/ENTRY-group; /NXapm_paraprobe_ranger_results/ENTRY-group; /NXapm_paraprobe_selector_config/ENTRY-group; /NXapm_paraprobe_selector_results/ENTRY-group; /NXapm_paraprobe_spatstat_config/ENTRY-group; /NXapm_paraprobe_spatstat_results/ENTRY-group; /NXapm_paraprobe_surfacer_config/ENTRY-group; /NXapm_paraprobe_surfacer_results/ENTRY-group; /NXapm_paraprobe_tessellator_config/ENTRY-group; /NXapm_paraprobe_tessellator_results/ENTRY-group; /NXapm_paraprobe_transcoder_config/ENTRY-group; /NXapm_paraprobe_transcoder_results/ENTRY-group; /NXarchive/ENTRY-group; /NXarpes/ENTRY-group; /NXcanSAS/ENTRY-group; /NXdirecttof/ENTRY-group; /NXdispersive_material/ENTRY-group; /NXellipsometry/ENTRY-group; /NXem/ENTRY-group; /NXem_calorimetry/ENTRY-group; /NXfluo/ENTRY-group; /NXindirecttof/ENTRY-group; /NXiqproc/ENTRY-group; /NXiv_temp/ENTRY-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY-group; /NXlab_sample_mounting/ENTRY-group; /NXlauetof/ENTRY-group; /NXmicrostructure_gragles_config/ENTRY-group; /NXmicrostructure_gragles_results/ENTRY-group; /NXmicrostructure_imm_config/ENTRY-group; /NXmicrostructure_imm_results/ENTRY-group; /NXmicrostructure_kanapy_results/ENTRY-group; /NXmicrostructure_score_config/ENTRY-group; /NXmicrostructure_score_results/ENTRY-group; /NXmonopd/ENTRY-group; /NXmpes/ENTRY-group; /NXmpes_arpes/ENTRY-group; /NXmx/ENTRY-group; /NXopt_window/ENTRY-group; /NXoptical_spectroscopy/ENTRY-group; /NXraman/ENTRY-group; /NXrefscan/ENTRY-group; /NXreftof/ENTRY-group; /NXroot/ENTRY-group; /NXsas/ENTRY-group; /NXsastof/ENTRY-group; /NXscan/ENTRY-group; /NXsensor_scan/ENTRY-group; /NXsnsevent/ENTRY-group; /NXsnshisto/ENTRY-group; /NXspe/ENTRY-group; /NXspm/ENTRY-group; /NXsqom/ENTRY-group; /NXstm/ENTRY-group; /NXsts/ENTRY-group; /NXstxm/ENTRY-group; /NXtas/ENTRY-group; /NXtofnpd/ENTRY-group; /NXtofraw/ENTRY-group; /NXtofsingle/ENTRY-group; /NXtomo/ENTRY-group; /NXtomophase/ENTRY-group; /NXtomoproc/ENTRY-group; /NXtransmission/ENTRY-group; /NXxas/ENTRY-group; /NXxasproc/ENTRY-group; /NXxbase/ENTRY-group; /NXxeuler/ENTRY-group; /NXxkappa/ENTRY-group; /NXxlaue/ENTRY-group; /NXxlaueplate/ENTRY-group; /NXxnb/ENTRY-group; /NXxpcs/ENTRY-group; /NXxps/ENTRY-group; /NXxrd/ENTRY-group; /NXxrd_pan/ENTRY-group; /NXxrot/ENTRY-group
entry_1: /NXcxi_ptycho/entry_1-group
entry_identifier: /NXarchive/ENTRY/entry_identifier-field; /NXentry/entry_identifier-field; /NXsnsevent/ENTRY/entry_identifier-field; /NXsnshisto/ENTRY/entry_identifier-field; /NXsubentry/entry_identifier-field; /NXxpcs/ENTRY/entry_identifier-field
entry_identifier_uuid: /NXentry/entry_identifier_uuid-field; /NXxpcs/ENTRY/entry_identifier_uuid-field
envelope: /NXfit/data/envelope-field; /NXxps/ENTRY/FIT/data/envelope-field
environment: /NXem/ENTRY/SIMULATION/environment-group; /NXem_calorimetry/ENTRY/environment-group; /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group; /NXmicrostructure_gragles_config/ENTRY/environment-group; /NXmicrostructure_gragles_results/ENTRY/environment-group; /NXmicrostructure_imm_results/ENTRY/environment-group; /NXmicrostructure_kanapy_results/ENTRY/environment-group; /NXmicrostructure_score_config/ENTRY/environment-group; /NXmicrostructure_score_results/ENTRY/environment-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT-group; /NXsample/ENVIRONMENT-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
eps: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/eps-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/dbscan/eps-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/eps-field; /NXmicrostructure_mtex_config/numerics/eps-field
epsilon: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS/DBSCAN/epsilon-field
error: /NXspe/ENTRY/data/error-field
error_function: /NXfit/error_function-group; /NXxps/ENTRY/FIT/error_function-group
errors: /NXdata/errors-field
euler: /NXmicrostructure_odf/sampling/euler-field
euler_angle: /NXmicrostructure_mtex_config/conventions/euler_angle-field
euler_angle_convention: /NXapm/ENTRY/consistent_rotations/euler_angle_convention-field; /NXcoordinate_system_set/euler_angle_convention-field; /NXem/ENTRY/consistent_rotations/euler_angle_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/euler_angle_convention-field
evaporation_control: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/control/evaporation_control-field; /NXinstrument_apm/control/evaporation_control-field
evaporation_field: /NXapm_reconstruction/evaporation_field-field
evaporation_id_filter: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/evaporation_id_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/evaporation_id_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter-group
even_layer_density: /NXmirror/even_layer_density-field
even_layer_material: /NXmirror/even_layer_material-field
event_data: /NXinstrument/EVENT_DATA-group; /NXsnsevent/ENTRY/EVENT_DATA-group
event_data_apm: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM-group
event_data_em: /NXem/ENTRY/measurement/events/EVENT_DATA_EM-group
event_id: /NXevent_data/event_id-field
event_index: /NXevent_data/event_index-field; /NXsnsevent/ENTRY/EVENT_DATA/event_index-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id: /NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight: /NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link; /NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset: /NXevent_data/event_time_offset-field
event_time_zero: /NXevent_data/event_time_zero-field
events: /NXapm/ENTRY/measurement/events-group; /NXem/ENTRY/measurement/events-group
example: /NXmicrostructure_mtex_config/path/example-field
exit_slit: /NXmonochromator/exit_slit-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/exit_slit-group
experiment_alias: /NXapm/ENTRY/experiment_alias-field; /NXem/ENTRY/experiment_alias-field
experiment_config: /NXxrd_pan/ENTRY/experiment_config-group
experiment_description: /NXapm/ENTRY/experiment_description-field; /NXarchive/ENTRY/experiment_description-field; /NXem/ENTRY/experiment_description-field; /NXentry/experiment_description-field; /NXoptical_spectroscopy/ENTRY/experiment_description-field; /NXsensor_scan/ENTRY/experiment_description-field; /NXsubentry/experiment_description-field; /NXtransmission/ENTRY/experiment_description-field
experiment_documentation: /NXentry/experiment_documentation-group; /NXsubentry/experiment_documentation-group
experiment_end_date: /NXentry/experiment_end_date-field; /NXsubentry/experiment_end_date-field
experiment_facility: /NXentry/experiment_facility-field; /NXsubentry/experiment_facility-field
experiment_identifier: /NXarchive/ENTRY/experiment_identifier-field; /NXentry/experiment_identifier-field; /NXsnsevent/ENTRY/experiment_identifier-field; /NXsnshisto/ENTRY/experiment_identifier-field; /NXsubentry/experiment_identifier-field; /NXtransmission/ENTRY/experiment_identifier-field
experiment_institution: /NXentry/experiment_institution-field; /NXsubentry/experiment_institution-field
experiment_laboratory: /NXentry/experiment_laboratory-field; /NXsubentry/experiment_laboratory-field
experiment_location: /NXentry/experiment_location-field; /NXsubentry/experiment_location-field
experiment_result: /NXxrd_pan/ENTRY/experiment_result-group
experiment_start_date: /NXentry/experiment_start_date-field; /NXsubentry/experiment_start_date-field
experiment_sub_type: /NXoptical_spectroscopy/ENTRY/experiment_sub_type-field
experiment_technique: /NXspm/ENTRY/experiment_technique-field
experiment_type: /NXellipsometry/ENTRY/experiment_type-field; /NXoptical_spectroscopy/ENTRY/experiment_type-field; /NXraman/ENTRY/experiment_type-field
experiments: /NXreflections/experiments-field
exposure_time: /NXcorrector_cs/TABLEAU/exposure_time-field
extent: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/extent-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/extent-field; /NXbeam/extent-field; /NXcg_grid/extent-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/extent-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/extent-field; /NXmicrostructure_score_config/ENTRY/deformation/extent-field; /NXmicrostructure_score_config/ENTRY/discretization/grid/extent-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/extent-field; /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/extent-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/extent-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/extent-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/extent-field; /NXxpcs/ENTRY/instrument/incident_beam/extent-field
external_adc: /NXsample/external_ADC-group
external_dac: /NXsample/external_DAC-field
external_field_brief: /NXsensor/external_field_brief-field
external_field_full: /NXsensor/external_field_full-group
external_material: /NXguide/external_material-field; /NXmirror/external_material-field
extinction_ratio: /NXpolarizer_opt/extinction_ratio-field
extraction_voltage: /NXebeam_column/electron_source/extraction_voltage-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/electron_source/extraction_voltage-field
extractor_current: /NXcollectioncolumn/extractor_current-field
extractor_voltage: /NXcollectioncolumn/extractor_voltage-field
extrema: /NXmicrostructure_odf/kth_extrema/extrema-field
fabrication: /NXapm/ENTRY/measurement/instrument/fabrication-group; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication-group; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication-group; /NXapm/ENTRY/measurement/instrument/pulser/SOURCE/fabrication-group; /NXapm/ENTRY/measurement/instrument/pulser/fabrication-group; /NXcollectioncolumn/FABRICATION-group; /NXcomponent/FABRICATION-group; /NXebeam_column/BIPRISM/FABRICATION-group; /NXebeam_column/MONOCHROMATOR/FABRICATION-group; /NXebeam_column/PHASEPLATE/FABRICATION-group; /NXelectronanalyzer/FABRICATION-group; /NXem/ENTRY/measurement/instrument/DETECTOR/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/BIPRISM/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_ax/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_cs/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/fabrication-group; /NXem/ENTRY/measurement/instrument/ebeam_column/fabrication-group; /NXem/ENTRY/measurement/instrument/fabrication-group; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE/fabrication-group; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM/fabrication-group; /NXem/ENTRY/measurement/instrument/ibeam_column/MONOCHROMATOR/fabrication-group; /NXem/ENTRY/measurement/instrument/ibeam_column/fabrication-group; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/fabrication-group; /NXem/ENTRY/measurement/instrument/nanoprobe/fabrication-group; /NXem/ENTRY/measurement/instrument/scan_controller/fabrication-group; /NXem/ENTRY/measurement/instrument/stage/fabrication-group; /NXenergydispersion/FABRICATION-group; /NXfresnel_zone_plate/fabrication-field; /NXinstrument/FABRICATION-group; /NXinstrument_apm/fabrication-group; /NXinstrument_apm/pulser/fabrication-group; /NXinstrument_em/FABRICATION-group; /NXinstrument_em/nanoprobe/FABRICATION-group; /NXinstrument_em/stage/FABRICATION-group; /NXsensor/FABRICATION-group; /NXsource/FABRICATION-group
face_area: /NXcg_hexahedron/face_area-field; /NXcg_polyhedron/face_area-field; /NXcg_tetrahedron/face_area-field
face_half_edge: /NXcg_half_edge_data_structure/face_half_edge-field
face_identifier_offset: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/face_identifier_offset-field
face_normal: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/face_normal-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/face_normal-field; /NXcg_hexahedron/face_normal-group; /NXcg_primitive/face_normal-group
face_normal_orientation: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/face_normal_orientation-field
face_normals: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/face_normals-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/face_normals-field
faces: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/faces-field; /NXcg_face_list_data_structure/faces-field; /NXoff_geometry/faces-field
faces_are_unique: /NXcg_face_list_data_structure/faces_are_unique-field
facet_normals: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/facet_normals-field
facility_user_id: /NXarchive/ENTRY/user/facility_user_id-field; /NXsnsevent/ENTRY/USER/facility_user_id-field; /NXsnshisto/ENTRY/USER/facility_user_id-field; /NXuser/facility_user_id-field
farthest_corner: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/farthest_corner-field
fast_axes: /NXelectronanalyzer/fast_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/fast_axes-field
fast_pixel_direction: /NXdetector_module/fast_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number: /NXuser/fax_number-field
feature: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE-group
feature_distance: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/feature_distance-field
feature_member_count: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/feature_member_count-field
feature_type: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/feature_type-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/feature_type-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/feature_type-field
feature_type_dict_keyword: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/feature_type_dict_keyword-field
feature_type_dict_value: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/feature_type_dict_value-field
features: /NXentry/features-field
feed_forward_model: /NXpid_controller/feed_forward_model-field
feedback: /NXpositioner/actuator/feedback-group
fermi_chopper: /NXdirecttof/ENTRY/INSTRUMENT/fermi_chopper-group; /NXinstrument/FERMI_CHOPPER-group; /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group; /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
fft_accuracy: /NXmicrostructure_mtex_config/numerics/fft_accuracy-field
field_aperture: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/field_aperture-group
field_of_view: /NXapm/ENTRY/atom_probe/reconstruction/field_of_view-field; /NXapm_reconstruction/field_of_view-field; /NXoptical_system_em/field_of_view-field
fieldname_errors: /NXdata/FIELDNAME_errors-field; /NXobject/FIELDNAME_errors-field
fieldname_mask: /NXobject/FIELDNAME_mask-field
fieldname_offset: /NXdata/FIELDNAME_offset-field
fieldname_scaling_factor: /NXdata/FIELDNAME_scaling_factor-field
fieldname_set: /NXobject/FIELDNAME_set-field
fieldname_weights: /NXobject/FIELDNAME_weights-field
figure_data: /NXgrating/figure_data-group; /NXmirror/figure_data-group
figure_of_merit: /NXspindispersion/figure_of_merit-field
figure_of_meritmetric: /NXfit/figure_of_meritMETRIC-field; /NXxps/ENTRY/FIT/figure_of_meritMETRIC-field
figure_size: /NXmicrostructure_mtex_config/plotting/figure_size-field
filament_current: /NXebeam_column/electron_source/filament_current-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/electron_source/filament_current-field; /NXsource/filament_current-field
file_name: /NXapm/ENTRY/NOTE/file_name-field; /NXapm/ENTRY/atom_probe/hit_finding/config/file_name-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/source/file_name-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/source/file_name-field; /NXapm/ENTRY/atom_probe/ranging/definitions/file_name-field; /NXapm/ENTRY/atom_probe/raw_data/source/file_name-field; /NXapm/ENTRY/atom_probe/reconstruction/config/file_name-field; /NXapm/ENTRY/atom_probe/reconstruction/results/file_name-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/source/file_name-field; /NXapm_compositionspace_results/ENTRY/config/file_name-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging/file_name-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/file_name-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance/file_name-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/file_name-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/file_name-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/config/file_name-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/file_name-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/file_name-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/file_name-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/file_name-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/file_name-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/file_name-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/file_name-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/file_name-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/file_name-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/file_name-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/file_name-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/file_name-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging/file_name-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/file_name-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/file_name-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/file_name-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/file_name-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/file_name-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/file_name-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/file_name-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/file_name-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/file_name-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/file_name-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/file_name-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/file_name-field; /NXem/ENTRY/NOTE/file_name-field; /NXem/ENTRY/ROI/ebsd/indexing/source/file_name-field; /NXem/ENTRY/ROI/ebsd/measurement/source/file_name-field; /NXem/ENTRY/ROI/ebsd/simulation/source/file_name-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input/file_name-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input/file_name-field; /NXem_calorimetry/ENTRY/actuator/file_name-field; /NXem_calorimetry/ENTRY/config/file_name-field; /NXem_calorimetry/ENTRY/diffraction/file_name-field; /NXmicrostructure_score_config/ENTRY/deformation/damask/file_name-field; /NXmicrostructure_score_config/ENTRY/deformation/ebsd/file_name-field; /NXmicrostructure_score_results/ENTRY/config/file_name-field; /NXnote/file_name-field
file_path: /NXapm_compositionspace_config/ENTRY/config/ranging/file_path-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/file_path-field
filenames: /NXiqproc/ENTRY/reduction/input/filenames-field; /NXsqom/ENTRY/reduction/input/filenames-field
filter: /NXinstrument/FILTER-group
filter_characteristics: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics-group
filter_mechanism: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/filter_mechanism-field
filter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_type-field
final_beam_divergence: /NXbeam/final_beam_divergence-field
final_energy: /NXbeam/final_energy-field
final_polarization: /NXbeam/final_polarization-field
final_polarization_stokes: /NXbeam/final_polarization_stokes-field
final_wavelength: /NXbeam/final_wavelength-field
final_wavelength_spread: /NXbeam/final_wavelength_spread-field
final_z: /NXbias_spectroscopy/bias_sweep/final_z-field
first_settling_time: /NXbias_spectroscopy/bias_sweep/first_settling_time-field
fit: /NXmpes/ENTRY/FIT-group; /NXxps/ENTRY/FIT-group
fit_formula_description: /NXcalibration/fit_formula_description-field
fit_formula_inputs: /NXcalibration/fit_formula_inputs-group
fit_parameters: /NXfit_function/fit_parameters-group; /NXxps/ENTRY/FIT/peakPEAK/function/fit_parameters-group
fixed_energy: /NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/fixed_revolutions-field
flags: /NXreflections/flags-field
flatfield: /NXdetector/flatfield-field; /NXdetector_channel/flatfield-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied: /NXdetector/flatfield_applied-field; /NXdetector_channel/flatfield_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error: /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors: /NXdetector/flatfield_errors-field; /NXdetector_channel/flatfield_errors-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path: /NXapm_reconstruction/flight_path-field; /NXinstrument_apm/analysis_chamber/flight_path-field
flip_current: /NXflipper/flip_current-field
flip_turns: /NXflipper/flip_turns-field
flipper: /NXinstrument/FLIPPER-group
flood_gun: /NXmpes/ENTRY/INSTRUMENT/flood_gun-group; /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun-group
flood_gun_current_env: /NXmpes/ENTRY/SAMPLE/flood_gun_current_env-group
fluence: /NXbeam/fluence-field
fluorescence: /NXfluo/ENTRY/INSTRUMENT/fluorescence-group
flux: /NXbeam/flux-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/ion_source/flux-field; /NXibeam_column/ion_source/flux-field; /NXmx/ENTRY/INSTRUMENT/BEAM/flux-field; /NXsource/flux-field
flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time: /NXscanbox_em/flyback_time-field
focal_length: /NXlens_opt/focal_length-field; /NXoptical_system_em/focal_length-field
focal_size: /NXcapillary/focal_size-field
focus_parameters: /NXfresnel_zone_plate/focus_parameters-field
focus_type: /NXxraylens/focus_type-field
focussing_probes: /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-group
font_size: /NXmicrostructure_mtex_config/plotting/font_size-field
force: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
force_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
formula: /NXdispersion_function/formula-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field; /NXfit/error_function/formula-field; /NXfit/global_fit_function/formula-field
formula_description: /NXfit_function/formula_description-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/formula_description-field; /NXxps/ENTRY/FIT/error_function/formula_description-field; /NXxps/ENTRY/FIT/global_fit_function/formula_description-field; /NXxps/ENTRY/FIT/peakPEAK/function/formula_description-field
formula_symbols: /NXresolution/formula_symbols-group
forward_speed: /NXscan_control/linear_SCAN/forward_speed-field; /NXscan_control/snake_SCAN/forward_speed-field; /NXscan_control/traj_SCAN/forward_speed-field
forward_speed_n: /NXscan_control/mesh_SCAN/forward_speed_N-field; /NXscan_control/spiral_SCAN/forward_speed_N-field
frame_average: /NXxpcs/ENTRY/data/frame_average-field
frame_start_number: /NXdetector/frame_start_number-field; /NXxbase/ENTRY/instrument/detector/frame_start_number-field
frame_sum: /NXxpcs/ENTRY/data/frame_sum-field
frame_time: /NXdetector/frame_time-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field; /NXxpcs/ENTRY/instrument/DETECTOR/frame_time-field
frequency: /NXcollimator/frequency-field; /NXsnsevent/ENTRY/instrument/SNS/frequency-field; /NXsnshisto/ENTRY/instrument/SNS/frequency-field; /NXsource/frequency-field
frequency_bandwidth: /NXcantilever_spm/cantilever_oscillator/frequency_bandwidth-field
frequency_cutoff: /NXcantilever_spm/cantilever_oscillator/frequency_cutoff-field
frequency_demodulation_bandwidth: /NXlockin/frequency_demodulation_bandwidth-field
frequency_harmonic: /NXcantilever_spm/cantilever_oscillator/frequency_harmonic-field
frequency_log: /NXcollimator/frequency_log-group
frequency_shift: /NXcantilever_spm/cantilever_oscillator/frequency_shift-field
frog_delays: /NXbeam/frog_delays-field
frog_frequencies: /NXbeam/frog_frequencies-field
frog_trace: /NXbeam/frog_trace-field
function: /NXfit_background/function-group; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function-group; /NXxps/ENTRY/FIT/peakPEAK/function-group
function_type: /NXfit_function/function_type-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/function_type-field; /NXxps/ENTRY/FIT/error_function/function_type-field; /NXxps/ENTRY/FIT/global_fit_function/function_type-field; /NXxps/ENTRY/FIT/peakPEAK/function/function_type-field
g2: /NXxpcs/ENTRY/data/g2-field
g2_derr: /NXxpcs/ENTRY/data/g2_derr-field
g2_err_from_two_time_corr_func: /NXxpcs/ENTRY/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials: /NXxpcs/ENTRY/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func: /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials: /NXxpcs/ENTRY/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized: /NXxpcs/ENTRY/data/G2_unnormalized-field
g_voltage_constant: /NXpiezoelectric_material/G_voltage_constant-field
gain: /NXcapillary/gain-group; /NXcircuit/gain-field; /NXtransmission/ENTRY/instrument/DETECTOR/gain-field
gain_setting: /NXdetector/gain_setting-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gamma: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/gamma-field
gap: /NXinsertion_device/gap-field
gas: /NXxraylens/gas-field
gas_pressure: /NXdetector/gas_pressure-field; /NXsource/gas_pressure-field; /NXxraylens/gas_pressure-field
gas_pressure_env: /NXmpes/ENTRY/SAMPLE/gas_pressure_env-group
gaussian_mixture: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/gaussian_mixture-group
generating_help_mode: /NXmicrostructure_mtex_config/miscellaneous/generating_help_mode-field
generic_beam_sample_angle_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE-group
geometry: /NXaperture/GEOMETRY-group; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/geometry-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/geometry-field; /NXbeam_stop/GEOMETRY-group; /NXbending_magnet/GEOMETRY-group; /NXcollimator/GEOMETRY-group; /NXcrystal/GEOMETRY-group; /NXcsg/geometry-field; /NXdetector/GEOMETRY-group; /NXdisk_chopper/GEOMETRY-group; /NXfermi_chopper/GEOMETRY-group; /NXfilter/GEOMETRY-group; /NXguide/GEOMETRY-group; /NXinsertion_device/GEOMETRY-group; /NXmicrostructure_gragles_config/ENTRY/sampling/geometry-field; /NXmirror/GEOMETRY-group; /NXmoderator/GEOMETRY-group; /NXmonitor/GEOMETRY-group; /NXmonochromator/geometry-group; /NXorientation/GEOMETRY-group; /NXsample/geometry-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group; /NXsastof/ENTRY/instrument/collimator/geometry-group; /NXsensor/geometry-group; /NXsource/geometry-group; /NXtranslation/geometry-group; /NXvelocity_selector/geometry-group
geometry_1: /NXcxi_ptycho/sample_1/geometry_1-group
getter_pump: /NXinstrument_apm/getter_pump-group
glass_transition_temperature: /NXpiezoelectric_material/glass_transition_temperature-field
global_fit_function: /NXfit/global_fit_function-group; /NXxps/ENTRY/FIT/global_fit_function-group
gnomonic_reference_frame: /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame-group; /NXem_ebsd/gnomonic_reference_frame-group
goniometer_x: /NXxrd_pan/ENTRY/experiment_config/goniometer_x-field
goniometer_y: /NXxrd_pan/ENTRY/experiment_config/goniometer_y-field
goniometer_z: /NXxrd_pan/ENTRY/experiment_config/goniometer_z-field
gradient: /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/gradient-field
gradient_guide_magnitude: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
gradient_guide_projection: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/face_normal/gradient_guide_projection-field
grain_boundary_energy: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy-group
grain_boundary_mobility: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility-group; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility-group
grain_diameter: /NXapm/ENTRY/sample/grain_diameter-field
grain_diameter_error: /NXapm/ENTRY/sample/grain_diameter_error-field
grain_shape: /NXmicrostructure_imm_config/ENTRY/roi/grain_shape-field
grating: /NXmonochromator/GRATING-group; /NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
grid: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid-group; /NXdelocalization/grid-group; /NXisocontour/grid-group; /NXmicrostructure_gragles_config/ENTRY/discretization/grid-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/grid-group; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid-group; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid-group; /NXmicrostructure_score_config/ENTRY/discretization/grid-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/grid-group; /NXmicrostructure_score_results/ENTRY/discretization/grid-group
grid_coarsement: /NXmicrostructure_gragles_config/ENTRY/grid_coarsement-group
grid_resolution: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/grid_resolution-field
grinding_machine: /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
grinding_step: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
group_index: /NXdetector_group/group_index-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_names: /NXdetector_group/group_names-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent: /NXdetector_group/group_parent-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type: /NXdetector_group/group_type-field
groupname_log: /NXobject/GROUPNAME_log-group
guide: /NXinstrument/GUIDE-group
guide_current: /NXflipper/guide_current-field
guide_turns: /NXflipper/guide_turns-field
h: /NXreflections/h-field
hagb_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_enthalpy-field
hagb_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_pre_factor-field
half_angle_interval: /NXem_img/IMAGE/half_angle_interval-field
half_axes_radii: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/half_axes_radii-field
half_edge_incident_face: /NXcg_half_edge_data_structure/half_edge_incident_face-field
half_edge_next: /NXcg_half_edge_data_structure/half_edge_next-field
half_edge_prev: /NXcg_half_edge_data_structure/half_edge_prev-field
half_edge_twin: /NXcg_half_edge_data_structure/half_edge_twin-field
half_edge_vertex_origin: /NXcg_half_edge_data_structure/half_edge_vertex_origin-field
halfwidth: /NXmicrostructure_pf/configuration/halfwidth-field
halo_region: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/halo_region-field
handedness: /NXapm/ENTRY/COORDINATE_SYSTEM/handedness-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field; /NXcoordinate_system/handedness-field; /NXem/ENTRY/COORDINATE_SYSTEM/handedness-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/handedness-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/handedness-field; /NXem/ENTRY/processing_reference_frame/handedness-field; /NXem/ENTRY/sample_reference_frame/handedness-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/handedness-field; /NXxps/ENTRY/xps_coordinate_system/handedness-field
hardware: /NXamplifier/hardware-group; /NXcircuit/hardware-group; /NXlockin/hardware-group; /NXspm/ENTRY/INSTRUMENT/hardware-group
harmonic: /NXinsertion_device/harmonic-field
harmonic_order_n: /NXlockin/harmonic_order_N-field
has_cell_edge_detection: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_edge_detection-field
has_cell_geometry: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_geometry-field
has_cell_neighbors: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_neighbors-field
has_cell_volume: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_volume-field
has_closure: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_closure-field
has_current_to_next_links: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/has_current_to_next_links-field
has_exterior_facets: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_exterior_facets-field
has_interior_tetrahedra: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_interior_tetrahedra-field
has_next_to_current_links: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/has_next_to_current_links-field
has_object: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object-field
has_object_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_edge_contact-field
has_object_geometry: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_geometry-field
has_object_ions: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_ions-field
has_object_obb: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_obb-field
has_object_properties: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_properties-field
has_object_proxigram: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram-field
has_object_proxigram_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram_edge_contact-field
has_proxy: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy-field
has_proxy_edge_contact: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_edge_contact-field
has_proxy_geometry: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_geometry-field
has_proxy_ions: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_ions-field
has_proxy_obb: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_obb-field
has_proxy_properties: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_properties-field
has_scalar_fields: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/has_scalar_fields-field
has_triangle_soup: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_triangle_soup-field
hdbscan: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan-group
heat_treatment_quenching_rate: /NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
heat_treatment_quenching_rate_error: /NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
heat_treatment_temperature: /NXapm/ENTRY/sample/heat_treatment_temperature-field
heat_treatment_temperature_error: /NXapm/ENTRY/sample/heat_treatment_temperature_error-field
heater_current: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/sample_heater/heater_current-field
heater_power: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/sample_heater/heater_power-field
heater_voltage: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/sample_heater/heater_voltage-field
height: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/height-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/height-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/height-field; /NXcg_cylinder/height-field; /NXcg_hexahedron/height-field; /NXcg_primitive/height-field; /NXfermi_chopper/height-field; /NXvelocity_selector/height-field
height_piezo_sensor: /NXafm/ENTRY/INSTRUMENT/height_piezo_sensor-group; /NXafm/ENTRY/INSTRUMENT/scan_environment/height_piezo_sensor-group
hexahedra: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra-group; /NXcg_hexahedron/hexahedra-group
hexahedron: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron-group; /NXcg_hexahedron/HEXAHEDRON-group
hexahedron_half_edge: /NXcg_hexahedron/HEXAHEDRON_HALF_EDGE-group
hexahedron_set: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set-group
hi_pass: /NXamplifier/hi_pass-field
hi_pass_n: /NXlockin/hi_pass_N-field
high_throughput_method: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/dbscan/high_throughput_method-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan/high_throughput_method-field
high_trip_value: /NXsensor/high_trip_value-field
history: /NXinstrument/HISTORY-group; /NXmpes/ENTRY/INSTRUMENT/history-group; /NXmpes/ENTRY/SAMPLE/history-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/history-group; /NXsample/history-group; /NXsample_component/history-group; /NXsensor_scan/ENTRY/SAMPLE/HISTORY-group; /NXspm/ENTRY/SAMPLE/history-group
hit_filter: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter-group
hit_finding: /NXapm/ENTRY/atom_probe/hit_finding-group
hit_multiplicity: /NXapm/ENTRY/atom_probe/hit_finding/hit_multiplicity-field
hit_multiplicity_filter: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hit_multiplicity_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/hit_multiplicity_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter-group
hit_positions: /NXapm/ENTRY/atom_probe/hit_finding/hit_positions-field
hit_quality: /NXapm/ENTRY/atom_probe/hit_finding/hit_quality-field
hit_spatial_filtering: /NXapm/ENTRY/atom_probe/hit_spatial_filtering-group
hit_test: /NXmicrostructure_mtex_config/plotting/hit_test-field
holder: /NXsnsevent/ENTRY/sample/holder-field; /NXsnshisto/ENTRY/sample/holder-field
hp_filter_order_n: /NXlockin/hp_filter_order_N-field
hv_gain_n: /NXpiezo_config_spm/calibration/hv_gain_N-field
i: /NXcanSAS/ENTRY/DATA/I-field
i_t: /NXpositioner_spm/z_controller/I_t-field
ibeam_column: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column-group; /NXem/ENTRY/measurement/instrument/ibeam_column-group; /NXinstrument_em/IBEAM_COLUMN-group
ic_opt: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt-group; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt-group
id: /NXreflections/id-field
identifier: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/identifier-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/identifier-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/identifier-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/identifier-field; /NXatom/identifier-field; /NXcg_primitive/identifier-field; /NXcs_filter_boolean_mask/identifier-field; /NXion/identifier-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-field; /NXlab_sample_mounting/ENTRY/mounting_machine/identifier-field; /NXmicrostructure/interfaces/identifier-field; /NXmicrostructure/quadruple_junctions/identifier-field; /NXmicrostructure/triple_junctions/identifier-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/identifier-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/device_information/identifier-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/device_information/identifier-field; /NXmpes/ENTRY/SAMPLE/identifier-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/identifier-field; /NXphase/identifier-field; /NXsimilarity_grouping/statistics/identifier-field; /NXsnsevent/ENTRY/sample/identifier-field; /NXsnshisto/ENTRY/sample/identifier-field; /NXtransmission/ENTRY/acquisition_program/identifier-field
identifier_analysis: /NXapm_compositionspace_config/ENTRY/config/identifier_analysis-field; /NXapm_compositionspace_results/ENTRY/identifier_analysis-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/identifier_analysis-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/identifier_analysis-field; /NXapm_paraprobe_intersector_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/identifier_analysis-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/identifier_analysis-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/identifier_analysis-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_ranger_config/ENTRY/range/identifier_analysis-field; /NXapm_paraprobe_ranger_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_selector_config/ENTRY/select/identifier_analysis-field; /NXapm_paraprobe_selector_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/identifier_analysis-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/identifier_analysis-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/identifier_analysis-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/identifier_analysis-field; /NXapm_paraprobe_tool_common/identifier_analysis-field; /NXapm_paraprobe_tool_config/identifier_analysis-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/identifier_analysis-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/identifier_analysis-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/identifier_analysis-field
identifier_axis_feature: /NXapm_compositionspace_results/ENTRY/autophase/result/identifier_axis_feature-field
identifier_calibration_method: /NXcalibration/identifier_calibration_method-field
identifier_calibration_reference: /NXcalibration/identifier_calibration_reference-field
identifier_canonical_smiles: /NXsubstance/identifier_canonical_smiles-field
identifier_cas: /NXsubstance/identifier_cas-field
identifier_chemical: /NXatom/identifier_chemical-field
identifier_cluster: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/identifier_cluster-field
identifier_collection: /NXentry/identifier_collection-field; /NXsensor_scan/ENTRY/identifier_collection-field; /NXsubentry/identifier_collection-field
identifier_crystal: /NXmicrostructure/crystals/identifier_crystal-field; /NXmicrostructure/interfaces/identifier_crystal-field; /NXmicrostructure/quadruple_junctions/identifier_crystal-field; /NXmicrostructure/triple_junctions/identifier_crystal-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/identifier_crystal-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/identifier_crystal-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/identifier_crystal-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/identifier_crystal-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/identifier_crystal-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/identifier_crystal-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/identifier_crystal-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/grid/identifier_crystal-field
identifier_crystal_offset: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/identifier_crystal_offset-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/identifier_crystal_offset-field
identifier_deformed_grain: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/identifier_deformed_grain-field
identifier_detector: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/identifier_detector-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/identifier_detector-field; /NXimage/PROCESS/identifier_detector-field; /NXspectrum/PROCESS/identifier_detector-field
identifier_edge: /NXcg_face_list_data_structure/identifier_edge-field
identifier_edge_offset: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/identifier_edge_offset-field; /NXcg_face_list_data_structure/identifier_edge_offset-field; /NXcg_half_edge_data_structure/identifier_edge_offset-field
identifier_entry: /NXentry/identifier_entry-field; /NXsubentry/identifier_entry-field
identifier_entry_uuid: /NXentry/identifier_entry_uuid-field
identifier_evaporation: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/identifier_evaporation-field
identifier_evaporation_offset: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/identifier_evaporation_offset-field
identifier_event: /NXevent_data_em/identifier_event-field
identifier_experiment: /NXentry/identifier_experiment-field; /NXoptical_spectroscopy/ENTRY/identifier_experiment-field; /NXsensor_scan/ENTRY/identifier_experiment-field; /NXspm/ENTRY/identifier_experiment-field; /NXsubentry/identifier_experiment-field
identifier_face: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/identifier_face-field; /NXcg_face_list_data_structure/identifier_face-field
identifier_face_offset: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/identifier_face_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/identifier_face_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/identifier_face_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/identifier_face_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/identifier_face_offset-field; /NXcg_face_list_data_structure/identifier_face_offset-field; /NXcg_half_edge_data_structure/identifier_face_offset-field
identifier_feature: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/identifier_feature-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/identifier_feature-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/identifier_feature-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/identifier_feature-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/identifier_feature-field
identifier_feature_xdmf: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/identifier_feature_xdmf-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/identifier_feature_xdmf-field
identifier_group: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/identifier_group-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/identifier_group-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/identifier_group-field; /NXimage/stack_1d/identifier_group-field; /NXimage/stack_2d/identifier_group-field; /NXimage/stack_3d/identifier_group-field; /NXspectrum/stack_0d/identifier_group-field; /NXspectrum/stack_2d/identifier_group-field; /NXspectrum/stack_3d/identifier_group-field
identifier_hit_quality: /NXapm/ENTRY/atom_probe/hit_finding/identifier_hit_quality-field
identifier_image: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/identifier_image-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/identifier_image-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/identifier_image-field; /NXimage/stack_1d/identifier_image-field; /NXimage/stack_2d/identifier_image-field; /NXimage/stack_3d/identifier_image-field
identifier_inchi_key: /NXsubstance/identifier_inchi_key-field
identifier_inchi_str: /NXsubstance/identifier_inchi_str-field
identifier_interface: /NXmicrostructure/quadruple_junctions/identifier_interface-field; /NXmicrostructure/triple_junctions/identifier_interface-field
identifier_ion: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/identifier_ion-field
identifier_iupac_name: /NXsubstance/identifier_iupac_name-field
identifier_offset: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/identifier_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/identifier_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/identifier_offset-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/identifier_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_offset-field; /NXcg_primitive/identifier_offset-field; /NXmicrostructure/interfaces/identifier_offset-field; /NXmicrostructure/quadruple_junctions/identifier_offset-field; /NXmicrostructure/triple_junctions/identifier_offset-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/identifier_offset-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/identifier_offset-field; /NXsimilarity_grouping/identifier_offset-field
identifier_offset_crystal: /NXmicrostructure/crystals/identifier_offset_crystal-field
identifier_offset_phase: /NXmicrostructure/crystals/identifier_offset_phase-field
identifier_parent: /NXapm/ENTRY/specimen/identifier_parent-field; /NXem/ENTRY/SAMPLE/identifier_parent-field
identifier_patch: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/identifier_patch-field
identifier_pattern: /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/identifier_pattern-field; /NXem_calorimetry/ENTRY/synchronization/identifier_pattern-field
identifier_phase: /NXem_ebsd/indexing/identifier_phase-field; /NXmicrostructure/crystals/identifier_phase-field; /NXmicrostructure/interfaces/identifier_phase-field; /NXmicrostructure/quadruple_junctions/identifier_phase-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/identifier_phase-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/identifier_phase-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/identifier_phase-field
identifier_phase_offset: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/identifier_phase_offset-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/identifier_phase_offset-field
identifier_piezo_material: /NXpiezoelectric_material/identifier_piezo_material-field
identifier_point: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/identifier_point-field
identifier_polyline: /NXmicrostructure/triple_junctions/identifier_polyline-field
identifier_process: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_process-field
identifier_pub_chem: /NXsubstance/identifier_pub_chem-field
identifier_pulse: /NXevent_data_apm/identifier_pulse-field
identifier_pulse_offset: /NXevent_data_apm/identifier_pulse_offset-field
identifier_recrystallized_grain: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/identifier_recrystallized_grain-field
identifier_sample: /NXem/ENTRY/SAMPLE/identifier_sample-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/identifier_sample-field; /NXevent_data_em/identifier_sample-field
identifier_set: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/identifier_set-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/identifier_set-field
identifier_simulation: /NXmicrostructure_gragles_config/ENTRY/identifier_simulation-field; /NXmicrostructure_gragles_results/ENTRY/identifier_simulation-field; /NXmicrostructure_score_config/ENTRY/identifier_simulation-field; /NXmicrostructure_score_results/ENTRY/identifier_simulation-field
identifier_smiles: /NXsubstance/identifier_smiles-field
identifier_spectrum: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/identifier_spectrum-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/identifier_spectrum-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/identifier_spectrum-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/identifier_spectrum-field; /NXspectrum/stack_0d/identifier_spectrum-field; /NXspectrum/stack_2d/identifier_spectrum-field; /NXspectrum/stack_3d/identifier_spectrum-field
identifier_thread: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_thread-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/grid/identifier_thread-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/identifier_thread-field
identifier_triangle: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/identifier_triangle-field
identifier_triangle_cluster: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/identifier_triangle_cluster-field
identifier_triple_junction: /NXmicrostructure/interfaces/identifier_triple_junction-field; /NXmicrostructure/quadruple_junctions/identifier_triple_junction-field
identifier_type: /NXion/identifier_type-field
identifier_vertex: /NXcg_face_list_data_structure/identifier_vertex-field
identifier_vertex_offset: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/identifier_vertex_offset-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/identifier_vertex_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/identifier_vertex_offset-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/identifier_vertex_offset-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/identifier_vertex_offset-field; /NXcg_face_list_data_structure/identifier_vertex_offset-field; /NXcg_half_edge_data_structure/identifier_vertex_offset-field
identifier_voxel: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/identifier_voxel-field
identifier_workflow_step: /NXlab_electro_chemo_mechanical_preparation/ENTRY/identifier_workflow_step-field
identifier_xdmf_cell: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_xdmf_cell-field
identifiername: /NXapm/ENTRY/USER/identifierNAME-field; /NXapm/ENTRY/sample/identifierNAME-field; /NXapm/ENTRY/specimen/identifierNAME-field; /NXem/ENTRY/USER/identifierNAME-field; /NXhistory/identifierNAME-field; /NXnote/identifierNAME-field; /NXobject/identifierNAME-field
idev: /NXcanSAS/ENTRY/DATA/Idev-field
imag: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/imag-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/imag-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/imag-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/imag-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/imag-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/imag-field; /NXimage/image_1d/imag-field; /NXimage/image_2d/imag-field; /NXimage/image_3d/imag-field; /NXimage/stack_1d/imag-field; /NXimage/stack_2d/imag-field; /NXimage/stack_3d/imag-field
image: /NXcorrector_cs/TABLEAU/IMAGE-group; /NXem/ENTRY/ROI/eds/indexing/IMAGE-group; /NXem/ENTRY/ROI/img/IMAGE-group; /NXem/ENTRY/SIMULATION/results/IMAGE-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE-group; /NXem_eds/indexing/IMAGE-group; /NXem_img/IMAGE-group; /NXevent_data_em/IMAGE-group
image_1d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d-group; /NXimage/image_1d-group
image_2d: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d-group; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d-group; /NXimage/image_2d-group
image_3d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d-group; /NXimage/image_3d-group
image_compression: /NXapm_reconstruction/image_compression-field
image_key: /NXdetector/image_key-field; /NXtomo/ENTRY/data/image_key-link; /NXtomo/ENTRY/instrument/detector/image_key-field
imaging_mode: /NXem/ENTRY/ROI/img/IMAGE/imaging_mode-field; /NXem_img/IMAGE/imaging_mode-field
img: /NXem/ENTRY/ROI/img-group
import_wizard: /NXmicrostructure_mtex_config/path/import_wizard-field
incidence_vector: /NXinstrument_apm/pulser/SOURCE/BEAM/incidence_vector-field
incident_angle: /NXbeam_splitter/incident_angle-field; /NXguide/incident_angle-field; /NXmirror/incident_angle-field
incident_beam: /NXxpcs/ENTRY/instrument/incident_beam-group
incident_beam_divergence: /NXbeam/incident_beam_divergence-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy: /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy: /NXbeam/incident_energy-field; /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/incident_energy-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/incident_energy-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/incident_energy-field; /NXxpcs/ENTRY/instrument/incident_beam/incident_energy-field; /NXxrd/ENTRY/INSTRUMENT/BEAM/incident_energy-field
incident_energy_spread: /NXbeam/incident_energy_spread-field; /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field; /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/incident_energy_spread-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/incident_energy_spread-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/incident_energy_spread-field; /NXxpcs/ENTRY/instrument/incident_beam/incident_energy_spread-field
incident_energy_weights: /NXbeam/incident_energy_weights-field
incident_polarisation_stokes: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization: /NXbeam/incident_polarization-field; /NXmpes/ENTRY/INSTRUMENT/beam_TYPE/incident_polarization-field; /NXmpes/ENTRY/INSTRUMENT/beam_probe/incident_polarization-field; /NXmpes/ENTRY/INSTRUMENT/beam_pump/incident_polarization-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_polarization-field
incident_polarization_stokes: /NXbeam/incident_polarization_stokes-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type: /NXxpcs/ENTRY/instrument/incident_beam/incident_polarization_type-field
incident_wavelength: /NXbeam/incident_wavelength-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength-field
incident_wavelength_spectrum: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread: /NXbeam/incident_wavelength_spread-field; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength_spread-field
incident_wavelength_weight: /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights: /NXbeam/incident_wavelength_weights-field; /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam: /NXxas/ENTRY/INSTRUMENT/incoming_beam-group
incubation_time: /NXmicrostructure_score_config/ENTRY/nucleation/ensemble/incubation_time-field; /NXmicrostructure_score_config/ENTRY/nucleation/incubation_time-field
independent_controllers: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
independent_scan_axes: /NXscan_control/independent_scan_axes-field
index_of_refraction: /NXlens_opt/substrate/index_of_refraction-field; /NXpolarizer_opt/substrate/index_of_refraction-field
index_of_refraction_coating: /NXbeam_splitter/coating/index_of_refraction_coating-field; /NXlens_opt/COATING/index_of_refraction_coating-field; /NXpolarizer_opt/COATING/index_of_refraction_coating-field; /NXwaveplate/coating/index_of_refraction_coating-field
index_of_refraction_substrate: /NXbeam_splitter/substrate/index_of_refraction_substrate-field; /NXwaveplate/substrate/index_of_refraction_substrate-field
indexing: /NXem/ENTRY/ROI/ebsd/indexing-group; /NXem/ENTRY/ROI/eds/indexing-group; /NXem_ebsd/indexing-group; /NXem_eds/indexing-group; /NXem_eels/indexing-group
indexing_rate: /NXem/ENTRY/ROI/ebsd/indexing/indexing_rate-field; /NXem_ebsd/indexing/indexing_rate-field
indicators_period: /NXbias_spectroscopy/CIRCUIT/indicators_period-field
indices: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/indices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/indices-field
infection_direction: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/infection_direction-field
initial: /NXmicrostructure_score_config/ENTRY/numerics/cell_cache/initial-field
initial_guess: /NXapm_compositionspace_config/ENTRY/config/autophase/initial_guess-field
initial_interface: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface-group
initial_radius: /NXapm/ENTRY/specimen/initial_radius-field
initial_specimen: /NXapm/ENTRY/atom_probe/initial_specimen-group
initialization: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/initialization-field
inner_plot_spacing: /NXmicrostructure_mtex_config/plotting/inner_plot_spacing-field
input: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input-group; /NXdetector/input-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input-group; /NXimage/PROCESS/input-group; /NXiqproc/ENTRY/reduction/input-group; /NXspectrum/PROCESS/input-group; /NXsqom/ENTRY/reduction/input-group
input_dependent: /NXfit/data/input_dependent-field; /NXxps/ENTRY/FIT/data/input_dependent-field
input_grid: /NXmicrostructure_ipf/input_grid-group
input_impedance: /NXcircuit/input_impedance-field
input_independent: /NXfit/data/input_independent-field; /NXxps/ENTRY/FIT/data/input_independent-field
inputs: /NXcomponent/inputs-field
insertion_device: /NXinstrument/INSERTION_DEVICE-group; /NXmpes/ENTRY/INSTRUMENT/INSERTION_DEVICE-group
inside_poly: /NXmicrostructure_mtex_config/miscellaneous/inside_poly-field
instrument: /NXafm/ENTRY/INSTRUMENT-group; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument-group; /NXapm/ENTRY/measurement/instrument-group; /NXarchive/ENTRY/instrument-group; /NXarpes/ENTRY/INSTRUMENT-group; /NXcanSAS/ENTRY/INSTRUMENT-group; /NXdirecttof/ENTRY/INSTRUMENT-group; /NXellipsometry/ENTRY/INSTRUMENT-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument-group; /NXem/ENTRY/measurement/instrument-group; /NXentry/INSTRUMENT-group; /NXevent_data_apm/instrument-group; /NXfluo/ENTRY/INSTRUMENT-group; /NXindirecttof/ENTRY/INSTRUMENT-group; /NXiqproc/ENTRY/instrument-group; /NXiv_temp/ENTRY/INSTRUMENT-group; /NXlauetof/ENTRY/instrument-group; /NXmonopd/ENTRY/INSTRUMENT-group; /NXmpes/ENTRY/INSTRUMENT-group; /NXmpes_arpes/ENTRY/INSTRUMENT-group; /NXmx/ENTRY/INSTRUMENT-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT-group; /NXraman/ENTRY/INSTRUMENT-group; /NXrefscan/ENTRY/instrument-group; /NXreftof/ENTRY/instrument-group; /NXsas/ENTRY/INSTRUMENT-group; /NXsastof/ENTRY/instrument-group; /NXscan/ENTRY/INSTRUMENT-group; /NXsensor_scan/ENTRY/INSTRUMENT-group; /NXsnsevent/ENTRY/instrument-group; /NXsnshisto/ENTRY/instrument-group; /NXspe/ENTRY/INSTRUMENT-group; /NXspm/ENTRY/INSTRUMENT-group; /NXsqom/ENTRY/instrument-group; /NXstm/ENTRY/INSTRUMENT-group; /NXsts/ENTRY/INSTRUMENT-group; /NXstxm/ENTRY/INSTRUMENT-group; /NXsubentry/INSTRUMENT-group; /NXtas/ENTRY/INSTRUMENT-group; /NXtofnpd/ENTRY/INSTRUMENT-group; /NXtofraw/ENTRY/instrument-group; /NXtofsingle/ENTRY/INSTRUMENT-group; /NXtomo/ENTRY/instrument-group; /NXtomophase/ENTRY/instrument-group; /NXtomoproc/ENTRY/INSTRUMENT-group; /NXtransmission/ENTRY/instrument-group; /NXxas/ENTRY/INSTRUMENT-group; /NXxbase/ENTRY/instrument-group; /NXxeuler/ENTRY/instrument-group; /NXxkappa/ENTRY/instrument-group; /NXxlaue/ENTRY/instrument-group; /NXxlaueplate/ENTRY/instrument-group; /NXxnb/ENTRY/instrument-group; /NXxpcs/ENTRY/instrument-group; /NXxps/ENTRY/INSTRUMENT-group; /NXxrd/ENTRY/INSTRUMENT-group; /NXxrd_pan/ENTRY/INSTRUMENT-group; /NXxrot/ENTRY/instrument-group
instrument_1: /NXcxi_ptycho/entry_1/instrument_1-group
instrument_calibration_device: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE-group
instrument_em: /NXevent_data_em/INSTRUMENT_EM-group
int_prf: /NXreflections/int_prf-field
int_prf_errors: /NXreflections/int_prf_errors-field
int_prf_var: /NXreflections/int_prf_var-field
int_sum: /NXreflections/int_sum-field
int_sum_errors: /NXreflections/int_sum_errors-field
int_sum_var: /NXreflections/int_sum_var-field
integral: /NXmonitor/integral-field; /NXmonopd/ENTRY/MONITOR/integral-field; /NXreftof/ENTRY/control/integral-field; /NXsas/ENTRY/MONITOR/integral-field; /NXtomophase/ENTRY/control/integral-field; /NXxbase/ENTRY/control/integral-field
integral_counts: /NXtofraw/ENTRY/MONITOR/integral_counts-field
integral_log: /NXmonitor/integral_log-group
integration: /NXem_calorimetry/ENTRY/integration-group
integration_time: /NXlockin/integration_time-field; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/integration_time-field
intended_use: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/intended_use-field
intensity: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/intensity-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/intensity-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/intensity-field; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/intensity-field; /NXem/ENTRY/ROI/eds/indexing/summary/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/intensity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/intensity-field; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/intensity-field; /NXem_eds/indexing/summary/intensity-field; /NXfit_background/data/intensity-field; /NXimage/image_1d/intensity-field; /NXimage/image_2d/intensity-field; /NXimage/image_3d/intensity-field; /NXimage/stack_1d/intensity-field; /NXimage/stack_2d/intensity-field; /NXimage/stack_3d/intensity-field; /NXmicrostructure_odf/phi_two_plot/intensity-field; /NXmicrostructure_pf/pf/intensity-field; /NXpeak/data/intensity-field; /NXspectrum/spectrum_0d/intensity-field; /NXspectrum/spectrum_1d/intensity-field; /NXspectrum/spectrum_2d/intensity-field; /NXspectrum/spectrum_3d/intensity-field; /NXspectrum/stack_0d/intensity-field; /NXspectrum/stack_2d/intensity-field; /NXspectrum/stack_3d/intensity-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/intensity-field; /NXxps/ENTRY/FIT/peakPEAK/data/intensity-field; /NXxrd_pan/ENTRY/experiment_result/intensity-field; /NXxrd_pan/ENTRY/q_data/intensity-field
interaction_volume: /NXem/ENTRY/SIMULATION/results/INTERACTION_VOLUME-group
interface: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface-group
interface_meshing: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing-group
interfaces: /NXmicrostructure/interfaces-group
interior_angle: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/interior_angle-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/interior_angle-field; /NXcg_polygon/interior_angle-field; /NXcg_triangle/interior_angle-field
interior_atmosphere: /NXgrating/interior_atmosphere-field; /NXguide/interior_atmosphere-field; /NXmirror/interior_atmosphere-field
interior_tetrahedra: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra-group
interpolation: /NXmicrostructure_ipf/interpolation-field
intersection_detection_method: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/intersection_detection_method-field
intersection_volume: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/intersection_volume-field
ion: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION-group; /NXapm_compositionspace_results/ENTRY/voxelization/ION-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/ION-group; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION-group; /NXapm_ranging/peak_identification/ION-group
ion_detector: /NXapm/ENTRY/measurement/instrument/ion_detector-group; /NXinstrument_apm/ion_detector-group
ion_energy_profile: /NXibeam_column/ion_source/ion_energy_profile-field
ion_multiplicity: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/ion_multiplicity-field
ion_query_nuclide_source: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ion_query_nuclide_source-field
ion_query_nuclide_target: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ion_query_nuclide_target-field
ion_query_nuclide_vector: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ion_query_nuclide_vector-field
ion_query_type_source: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ion_query_type_source-field
ion_query_type_target: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ion_query_type_target-field
ion_source: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/ion_source-group; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source-group; /NXibeam_column/ion_source-group
ion_type: /NXion/ion_type-field
ion_type_filter: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ion_type_filter-field
iontype_filter: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/iontype_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/iontype_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter-group
iontypes: /NXapm_paraprobe_ranger_results/ENTRY/iontypes-group; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/iontypes-field
iontypes_randomized: /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/iontypes_randomized-field
ipf: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF-group
iris: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/iris-group
is_active: /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force/is_active-field; /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/is_active-field; /NXmicrostructure_gragles_config/ENTRY/magnetic_field/is_active-field; /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/is_active-field
is_amorphous: /NXapm/ENTRY/specimen/is_amorphous-field
is_antipodal: /NXrotations/is_antipodal-field
is_axis_aligned: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/is_axis_aligned-field; /NXcg_hexahedron/is_axis_aligned-field; /NXcg_parallelogram/is_axis_aligned-field
is_box: /NXcg_hexahedron/is_box-field
is_center_of_mass: /NXcg_primitive/is_center_of_mass-field
is_centrosymmetric: /NXunit_cell/is_centrosymmetric-field
is_chiral: /NXunit_cell/is_chiral-field
is_closed: /NXcg_primitive/is_closed-field
is_core: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/is_core-field
is_cylindrical: /NXcrystal/is_cylindrical-field
is_deformed: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/is_deformed-field
is_geodesic_mesh: /NXcg_primitive/is_geodesic_mesh-field
is_mesh: /NXcg_primitive/is_mesh-field
is_noise: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/is_noise-field
is_polycrystalline: /NXapm/ENTRY/specimen/is_polycrystalline-field
is_recrystallized: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/is_recrystallized-field
is_rectangle: /NXcg_parallelogram/is_rectangle-field
is_regularized: /NXcg_alpha_complex/is_regularized-field
is_simulation: /NXapm/ENTRY/sample/is_simulation-field; /NXapm/ENTRY/specimen/is_simulation-field; /NXem/ENTRY/SAMPLE/is_simulation-field
is_specific: /NXmicrostructure_slip_system/is_specific-field
is_subgrain: /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/is_subgrain-field
is_surface_mesh: /NXcg_primitive/is_surface_mesh-field
is_triangle_mesh: /NXcg_primitive/is_triangle_mesh-field
is_watertight: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/is_watertight-field
isocontour: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR-group
isosurfacing: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing-group
isovalue: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/isovalue-field; /NXisocontour/isovalue-field
iteration: /NXmicrostructure/iteration-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/iteration-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/iteration-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/iteration-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/iteration-field
iupac_line_candidate: /NXem_eds/indexing/IMAGE/iupac_line_candidate-field
iupac_line_candidates: /NXem/ENTRY/ROI/eds/indexing/IMAGE/iupac_line_candidates-field
iupac_line_name: /NXem_eds/indexing/PEAK/ATOM/iupac_line_name-field
jones_quality_factor: /NXoptical_spectroscopy/ENTRY/derived_parameters/jones_quality_factor-field
k: /NXinsertion_device/k-field; /NXreflections/k-field
k_alpha_one: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one-field
k_alpha_two: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two-field
k_d: /NXpid_controller/K_d-field
k_electromechanical_constant: /NXpiezoelectric_material/K_electromechanical_constant-field
k_ff: /NXpid_controller/K_ff-field
k_i: /NXpid_controller/K_i-field
k_p: /NXpid_controller/K_p-field
k_parallel: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/k_parallel-field; /NXmpes/ENTRY/data/k_parallel-field
k_perpendicular: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/k_perpendicular-field; /NXmpes/ENTRY/data/k_perpendicular-field
kappa: /NXxkappa/ENTRY/name/kappa-link; /NXxkappa/ENTRY/sample/kappa-field
kbeta: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta-field
kernel_halfwidth: /NXmicrostructure_odf/configuration/kernel_halfwidth-field
kernel_mu: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/kernel_mu-field
kernel_name: /NXmicrostructure_odf/configuration/kernel_name-field
kernel_sigma: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/kernel_sigma-field
kernel_size: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_size-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/kernel_size-field
kernel_type: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/kernel_type-field
kernel_variance: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_variance-field
kernel_width: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/kernel_width-field
kfactor: /NXapm_reconstruction/kfactor-field
ki_over_kf_scaling: /NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
kinetic_energy: /NXelectronanalyzer/transmission_function/kinetic_energy-field; /NXenergydispersion/kinetic_energy-field; /NXmpes/ENTRY/transmission_correction/transmission_function/kinetic_energy-field
kinetics: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics-group
knn: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics/knn-group; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/knn-group
kth: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics/knn/kth-field; /NXmicrostructure_odf/kth_extrema/kth-field
kth_extrema: /NXmicrostructure_odf/kth_extrema-group
kx: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/kx-field; /NXmpes/ENTRY/data/kx-field
ky: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/ky-field; /NXmpes/ENTRY/data/ky-field
kz: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/kz-field; /NXmpes/ENTRY/data/kz-field
l: /NXreflections/l-field
label: /NXapm/ENTRY/atom_probe/ranging/peak_search/PEAK/label-field; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS/DBSCAN/label-field; /NXfit/label-field; /NXfit_background/label-field; /NXpeak/label-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/label-field; /NXxps/ENTRY/FIT/label-field; /NXxps/ENTRY/FIT/peakPEAK/label-field
lagb_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_enthalpy-field
lagb_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_pre_factor-field
lambda: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
last_fill: /NXsource/last_fill-field
last_process: /NXcalibration/last_process-field
lateral_focal_point_offset: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/lateral_focal_point_offset-field
lateral_surface_area: /NXcg_cylinder/lateral_surface_area-field
lattice_type: /NXmicrostructure_slip_system/lattice_type-field
laue_group: /NXunit_cell/laue_group-field
layer_structure: /NXoptical_spectroscopy/ENTRY/SAMPLE/layer_structure-field
layer_thickness: /NXgrating/layer_thickness-field; /NXmirror/layer_thickness-field
layout: /NXdetector/layout-field
legend: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend-group; /NXmicrostructure_ipf/legend-group
length: /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field; /NXcg_hexahedron/length-field; /NXcg_primitive/length-field; /NXfiber/length-field; /NXinsertion_device/length-field; /NXmicrostructure/crystals/length-field; /NXmicrostructure/interfaces/length-field; /NXmicrostructure/triple_junctions/length-field; /NXvelocity_selector/length-field
lens_diameter: /NXlens_opt/lens_diameter-field
lens_em: /NXcollectioncolumn/LENS_EM-group; /NXcorrector_cs/LENS_EM-group; /NXebeam_column/LENS_EM-group; /NXelectronanalyzer/LENS_EM-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/LENS_EM-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/LENS_EM-group; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM-group; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM-group; /NXenergydispersion/LENS_EM-group; /NXibeam_column/LENS_EM-group; /NXsource/LENS_EM-group; /NXspindispersion/LENS_EM-group
lens_geometry: /NXxraylens/lens_geometry-field
lens_length: /NXxraylens/lens_length-field
lens_material: /NXxraylens/lens_material-field
lens_mode: /NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field; /NXcollectioncolumn/lens_mode-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/lens_mode-field
lens_opt: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT-group
lens_thickness: /NXxraylens/lens_thickness-field
level: /NXmpes/ENTRY/energy_referencing/level-field
lifetime: /NXebeam_column/electron_source/lifetime-field
line_energy: /NXmicrostructure/triple_junctions/line_energy-field; /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/line_energy-field
linear_beam_sample_polarization: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/linear_beam_sample_polarization-field
linear_scan: /NXscan_control/linear_SCAN-group
linear_sweep: /NXbias_spectroscopy/bias_sweep/linear_sweep-group; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep-group
load_lock_chamber: /NXinstrument_apm/load_lock_chamber-group
local_electrode: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/local_electrode-group; /NXapm/ENTRY/measurement/instrument/local_electrode-group; /NXinstrument_apm/local_electrode-group
local_name: /NXdetector/local_name-field
location: /NXapm/ENTRY/measurement/instrument/location-field; /NXem/ENTRY/measurement/instrument/location-field; /NXinstrument_apm/location-field; /NXinstrument_em/location-field; /NXmicrostructure/quadruple_junctions/location-field; /NXmicrostructure/triple_junctions/location-field; /NXmicrostructure_odf/kth_extrema/location-field
lockin_amplifier: /NXspm/ENTRY/INSTRUMENT/lockin_amplifier-group; /NXstm/ENTRY/INSTRUMENT/lockin_amplifier-group; /NXsts/ENTRY/INSTRUMENT/lockin_amplifier-group
lockin_current_flip_sign: /NXlockin/lockin_current_flip_sign-field
log: /NXobject/LOG-group; /NXsnsevent/ENTRY/DASlogs/LOG-group; /NXsnshisto/ENTRY/DASlogs/LOG-group
low_pass: /NXamplifier/low_pass-field
low_pass_n: /NXlockin/low_pass_N-field
low_trip_value: /NXsensor/low_trip_value-field
lower_cap_radii: /NXcg_cylinder/lower_cap_radii-field
lower_cap_surface_area: /NXcg_cylinder/lower_cap_surface_area-field
lp: /NXreflections/lp-field
lp_filter_order_n: /NXlockin/lp_filter_order_N-field
lubricant: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
m_null: /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/m_null-field
m_value: /NXfilter/m_value-field; /NXguide/m_value-field; /NXmirror/m_value-field
magnetic_field: /NXarchive/ENTRY/sample/magnetic_field-field; /NXbending_magnet/magnetic_field-field; /NXmicrostructure_gragles_config/ENTRY/magnetic_field-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/magnetic_field-group; /NXsample/magnetic_field-field; /NXsample/magnetic_field-group
magnetic_field_env: /NXsample/magnetic_field_env-group
magnetic_field_log: /NXsample/magnetic_field_log-group
magnetic_wavelength: /NXinsertion_device/magnetic_wavelength-field
magnification: /NXcollectioncolumn/magnification-field; /NXcorrector_cs/TABLEAU/magnification-field; /NXlens_opt/magnification-field; /NXoptical_system_em/magnification-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/magnification-field
magnitude: /NXaberration/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_1/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_2/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_3/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_4/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/a_6/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/b_2/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/b_4/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_0/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_2_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_1_2_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_1_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_1_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_3_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_2_3_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_0/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_2_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_2_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_4_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_3_4_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_1_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_1_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_3_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_3_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_5_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_4_5_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_0/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_2_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_2_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_4_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_4_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_6_a/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/c_5_6_b/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/d_4/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/r_5/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/s_3/magnitude-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/s_5/magnitude-field
magnitude_errors: /NXaberration/magnitude_errors-field
magnitude_errors_model: /NXaberration/magnitude_errors_model-field
manipulator: /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
manufacturer: /NXcapillary/manufacturer-field; /NXtransmission/ENTRY/instrument/manufacturer-group
map: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map-group; /NXmicrostructure_ipf/map-group
mapping_mapping: /NXcalibration/mapping_MAPPING-field
marching_cubes: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/marching_cubes-field
mark: /NXdelocalization/weighting_model/mark-field
marker: /NXmicrostructure_mtex_config/plotting/marker-field
marker_edge_color: /NXmicrostructure_mtex_config/plotting/marker_edge_color-field
marker_face_color: /NXmicrostructure_mtex_config/plotting/marker_face_color-field
marker_size: /NXmicrostructure_mtex_config/plotting/marker_size-field
mask: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/mask-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/window/mask-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/mask-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/window/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/mask-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/mask-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/mask-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/mask-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/window/mask-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/window/mask-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/mask-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/mask-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/mask-field; /NXapm_paraprobe_tool_results/window/mask-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/mask-field; /NXcs_filter_boolean_mask/mask-field
mask_material: /NXfresnel_zone_plate/mask_material-field
mask_thickness: /NXfresnel_zone_plate/mask_thickness-field
masks: /NXxpcs/ENTRY/instrument/masks-group
mass: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/mass-field; /NXapm_charge_state_analysis/mass-field; /NXsample/mass-field; /NXsample_component/mass-field
mass_spectrum: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group; /NXapm_ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/mass_to_charge-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/mass_to_charge-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/mass_to_charge-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/mass_to_charge-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/mass_to_charge-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/mass_to_charge-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/mass_to_charge-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/mass_to_charge-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/mass_to_charge-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/mass_to_charge-field; /NXapm_paraprobe_tool_config/reconstruction/mass_to_charge-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/mass_to_charge-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion: /NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group; /NXapm_ranging/mass_to_charge_distribution-group
mass_to_charge_range: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/mass_to_charge_range-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field; /NXapm_charge_state_analysis/mass_to_charge_range-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/mass_to_charge_range-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field; /NXion/mass_to_charge_range-field
match: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hit_multiplicity_filter/match-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/iontype_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/patch_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/match-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/match-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/match-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/weighting_model/match-field; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/match-field; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/match-field; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/match-field; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/match-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/hit_multiplicity_filter/match-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/iontype_filter/match-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/match-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/match-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/match-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/match-field; /NXdelocalization/weighting_model/match-field; /NXmatch_filter/match-field
match_filter: /NXapm_paraprobe_tool_config/MATCH_FILTER-group
matching_phase: /NXem_ebsd/indexing/matching_phase-field
matching_phase_descriptor: /NXem_ebsd/indexing/matching_phase_descriptor-field
material: /NXaperture/material-field; /NXmicrostructure_score_config/ENTRY/material-group; /NXopt_window/ENTRY/material-field
material_other: /NXopt_window/ENTRY/material_other-field
material_phase: /NXdispersive_material/ENTRY/sample/material_phase-field
material_phase_comment: /NXdispersive_material/ENTRY/sample/material_phase_comment-field
matrix_elements: /NXbeam_transfer_matrix_table/matrix_elements-field
max_delta_x: /NXmicrostructure_score_config/ENTRY/numerics/max_delta_x-field
max_iteration: /NXmicrostructure_score_config/ENTRY/numerics/max_iteration-field
max_physical_capacity: /NXcs_computer/memory/CIRCUIT/max_physical_capacity-field; /NXcs_computer/storage/CIRCUIT/max_physical_capacity-field
max_resident_memory_snapshot: /NXcs_profiling_event/max_resident_memory_snapshot-field
max_revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/max_revolutions-field
max_slew_rate: /NXbias_spectroscopy/bias_sweep/max_slew_rate-field
max_sothree_bandwidth: /NXmicrostructure_mtex_config/numerics/max_sothree_bandwidth-field
max_stwo_bandwidth: /NXmicrostructure_mtex_config/numerics/max_stwo_bandwidth-field
max_time: /NXmicrostructure_score_config/ENTRY/numerics/max_time-field
max_virtual_memory_snapshot: /NXcs_profiling_event/max_virtual_memory_snapshot-field
max_x: /NXmicrostructure_score_config/ENTRY/numerics/max_x-field
maximum_incident_angle: /NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion: /NXapm/ENTRY/atom_probe/ranging/peak_identification/maximum_number_of_atoms_per_molecular_ion-field; /NXapm_ranging/peak_identification/maximum_number_of_atoms_per_molecular_ion-field
maximum_value: /NXlog/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
mcp_efficiency: /NXinstrument_apm/ion_detector/mcp_efficiency-field
measured_data: /NXellipsometry/ENTRY/data_collection/measured_data-field; /NXtransmission/ENTRY/instrument/measured_data-field
measured_data_errors: /NXellipsometry/ENTRY/data_collection/measured_data_errors-field
measurement: /NXapm/ENTRY/measurement-group; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/analysis_chamber/pressure_sensor/measurement-field; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/stage/temperature_sensor/measurement-field; /NXem/ENTRY/ROI/ebsd/measurement-group; /NXem/ENTRY/measurement-group; /NXem_ebsd/measurement-group; /NXinstrument_apm/analysis_chamber/pressure_sensor/measurement-field; /NXmanipulator/drain_current_ammeter/measurement-field; /NXmanipulator/sample_bias_voltmeter/measurement-field; /NXmanipulator/temperature_sensor/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_ammeter/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/measurement-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/measurement-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/measurement-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/measurement-field; /NXsensor/measurement-field
measurement_data_calibration_type: /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE-group
measurement_sensors: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
measurement_time: /NXbias_spectroscopy/CIRCUIT/measurement_time-field
measurement_type: /NXbias_spectroscopy/measurement_type-field; /NXxrd_pan/ENTRY/measurement_type-field
melting_temperature: /NXmicrostructure_score_config/ENTRY/material/melting_temperature-field
member_count: /NXsimilarity_grouping/statistics/member_count-field
memory: /NXcs_computer/memory-group; /NXmicrostructure_mtex_config/system/memory-field
mesh_efficiency: /NXinstrument_apm/ion_detector/mesh_efficiency-field
mesh_scan: /NXscan_control/mesh_SCAN-group; /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/mesh_SCAN-group
mesh_state: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE-group
method: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hit_multiplicity_filter/method-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/iontype_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/patch_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/decomposition/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/method-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/weighting_model/method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/method-field; /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/method-field; /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/method-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/hit_multiplicity_filter/method-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/iontype_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/method-field; /NXdelocalization/weighting_model/method-field; /NXem_ebsd/indexing/method-field; /NXmatch_filter/method-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/method-field; /NXmpes/ENTRY/method-field; /NXxps/ENTRY/method-field; /NXxrd_pan/ENTRY/method-field
methods_advise: /NXmicrostructure_mtex_config/miscellaneous/methods_advise-field
microstructure: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/MICROSTRUCTURE-group; /NXem/ENTRY/ROI/img/IMAGE/MICROSTRUCTURE-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE-group; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE-group; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE-group
miller: /NXem_ebsd/indexing/PHASE/miller-field
miller_direction: /NXmicrostructure_slip_system/miller_direction-field
miller_indices: /NXmicrostructure_pf/configuration/miller_indices-field
miller_plane: /NXmicrostructure_slip_system/miller_plane-field
min_abundance: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/min_abundance-field; /NXapm_charge_state_analysis/min_abundance-field
min_abundance_product: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/min_abundance_product-field
min_cluster_size: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan/min_cluster_size-field
min_half_life: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/min_half_life-field; /NXapm_charge_state_analysis/min_half_life-field
min_incr_max: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/min_incr_max-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics/knn/min_incr_max-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics/rdf/min_incr_max-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter/min_incr_max-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter/min_incr_max-field; /NXapm_ranging/mass_to_charge_distribution/min_incr_max-field; /NXsubsampling_filter/min_incr_max-field
min_max_grain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_grain-field
min_max_subgrain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_subgrain-field
min_pts: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/dbscan/min_pts-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/min_pts-field
min_samples: /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/min_samples-field; /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS/DBSCAN/min_samples-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/hdbscan/min_samples-field
minimum_value: /NXlog/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
mirror: /NXinstrument/MIRROR-group
miscellaneous: /NXmicrostructure_mtex_config/miscellaneous-group
misorientation_angle: /NXrotations/misorientation_angle-field
misorientation_axis: /NXrotations/misorientation_axis-field
misorientation_quaternion: /NXrotations/misorientation_quaternion-field
mobility: /NXmicrostructure/interfaces/mobility-field; /NXmicrostructure/quadruple_junctions/mobility-field; /NXmicrostructure/triple_junctions/mobility-field
mobility_weight: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front/mobility_weight-field
mode: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/mode-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/DETECTOR/mode-field; /NXfluo/ENTRY/MONITOR/mode-field; /NXlauetof/ENTRY/control/mode-field; /NXlens_em/mode-field; /NXmonitor/mode-field; /NXmonopd/ENTRY/MONITOR/mode-field; /NXrefscan/ENTRY/control/mode-field; /NXreftof/ENTRY/control/mode-field; /NXsas/ENTRY/MONITOR/mode-field; /NXsastof/ENTRY/control/mode-field; /NXsnsevent/ENTRY/MONITOR/mode-field; /NXsnshisto/ENTRY/MONITOR/mode-field; /NXsource/mode-field; /NXspectrum/PROCESS/mode-field; /NXtas/ENTRY/MONITOR/mode-field; /NXtofnpd/ENTRY/MONITOR/mode-field; /NXtofraw/ENTRY/MONITOR/mode-field; /NXtofsingle/ENTRY/MONITOR/mode-field; /NXxas/ENTRY/DATA/mode-field; /NXxas/ENTRY/MONITOR/mode-field; /NXxbase/ENTRY/control/mode-field
model: /NXapm/ENTRY/measurement/instrument/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/pulser/SOURCE/fabrication/model-field; /NXapm/ENTRY/measurement/instrument/pulser/fabrication/model-field; /NXcorrector_cs/TABLEAU/model-field; /NXem/ENTRY/measurement/instrument/DETECTOR/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/BIPRISM/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_ax/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_cs/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ebeam_column/fabrication/model-field; /NXem/ENTRY/measurement/instrument/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ibeam_column/MONOCHROMATOR/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ibeam_column/fabrication/model-field; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/fabrication/model-field; /NXem/ENTRY/measurement/instrument/nanoprobe/fabrication/model-field; /NXem/ENTRY/measurement/instrument/scan_controller/fabrication/model-field; /NXem/ENTRY/measurement/instrument/stage/fabrication/model-field; /NXfabrication/model-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/model-field; /NXlab_sample_mounting/ENTRY/mounting_machine/model-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/model-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/model-field; /NXmicrostructure_score_config/ENTRY/deformation/model-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/model-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/model-field; /NXmicrostructure_score_config/ENTRY/stored_energy_recovery/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/device_information/model-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/device_information/model-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/model-field; /NXsensor/model-field; /NXspm/ENTRY/INSTRUMENT/hardware/model-field; /NXspm/ENTRY/INSTRUMENT/software/model-field; /NXtransmission/ENTRY/acquisition_program/model-field
model_labels: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/model_labels-field
model_name: /NXdispersion/model_name-field; /NXdispersion_function/model_name-field; /NXdispersion_table/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_x/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_y/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/model_name-field; /NXdispersive_material/ENTRY/dispersion_z/model_name-field
moderator: /NXinstrument/MODERATOR-group; /NXsnsevent/ENTRY/instrument/moderator-group; /NXsnshisto/ENTRY/instrument/moderator-group
modulation_frequency: /NXstm/ENTRY/INSTRUMENT/lockin_amplifier/modulation_frequency-field; /NXsts/ENTRY/resolution_indicators/modulation_frequency-field
modulation_signal: /NXlockin/modulation_signal-field; /NXstm/ENTRY/INSTRUMENT/lockin_amplifier/modulation_signal-field
modulation_signal_type: /NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field; /NXstm/ENTRY/resolution_indicators/modulation_signal_type-field; /NXsts/ENTRY/reproducibility_indicators/modulation_signal_type-field; /NXsts/ENTRY/resolution_indicators/modulation_signal_type-field
modulation_status: /NXlockin/modulation_status-field
module_offset: /NXdetector_module/module_offset-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
molecular_formula_hill: /NXsubstance/molecular_formula_hill-field
molecular_mass: /NXsubstance/molecular_mass-field
momentum_resolution: /NXelectronanalyzer/momentum_resolution-group
monitor: /NXcxi_ptycho/entry_1/instrument_1/MONITOR-group; /NXentry/MONITOR-group; /NXfluo/ENTRY/MONITOR-group; /NXmonopd/ENTRY/MONITOR-group; /NXsas/ENTRY/MONITOR-group; /NXscan/ENTRY/MONITOR-group; /NXsnsevent/ENTRY/MONITOR-group; /NXsnshisto/ENTRY/MONITOR-group; /NXsubentry/MONITOR-group; /NXtas/ENTRY/MONITOR-group; /NXtofnpd/ENTRY/MONITOR-group; /NXtofraw/ENTRY/MONITOR-group; /NXtofsingle/ENTRY/MONITOR-group; /NXxas/ENTRY/MONITOR-group
monochromator: /NXarpes/ENTRY/INSTRUMENT/monochromator-group; /NXebeam_column/MONOCHROMATOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/MONOCHROMATOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/MONOCHROMATOR-group; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR-group; /NXem/ENTRY/measurement/instrument/ibeam_column/MONOCHROMATOR-group; /NXfluo/ENTRY/INSTRUMENT/monochromator-group; /NXibeam_column/MONOCHROMATOR-group; /NXinstrument/MONOCHROMATOR-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR-group; /NXrefscan/ENTRY/instrument/monochromator-group; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group; /NXstxm/ENTRY/INSTRUMENT/monochromator-group; /NXtas/ENTRY/INSTRUMENT/monochromator-group; /NXxas/ENTRY/INSTRUMENT/monochromator-group; /NXxbase/ENTRY/instrument/monochromator-group
monochromator_type: /NXmpes/ENTRY/INSTRUMENT/monochromator_TYPE-group
mosaic_horizontal: /NXcrystal/mosaic_horizontal-field
mosaic_vertical: /NXcrystal/mosaic_vertical-field
mosek: /NXmicrostructure_mtex_config/miscellaneous/mosek-field
mounting_machine: /NXlab_sample_mounting/ENTRY/mounting_machine-group
mounting_method: /NXlab_sample_mounting/ENTRY/mounting_method-field
mrp_mass_to_charge: /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_mass_to_charge-field
mrp_value: /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_value-field
mtex: /NXmicrostructure_mtex_config/path/mtex-field
multiple_outputs: /NXbeam_splitter/multiple_outputs-field
n_ic_cluster: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/CLUSTER_ANALYSIS/n_ic_cluster-field
n_max_ic_cluster: /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/n_max_ic_cluster-field
naive_discretization: /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization-group; /NXapm_reconstruction/naive_discretization-group
name: /NXaberration/name-field; /NXactuator/name-field; /NXapm/ENTRY/USER/name-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/name-field; /NXapm/ENTRY/measurement/instrument/local_electrode/name-field; /NXapm_compositionspace_results/ENTRY/voxelization/ION/name-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_distancer_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_intersector_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_ranger_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/name-field; /NXapm_paraprobe_selector_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/USER/name-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/USER/name-field; /NXarchive/ENTRY/instrument/SOURCE/name-field; /NXarchive/ENTRY/instrument/name-field; /NXarchive/ENTRY/sample/name-field; /NXarchive/ENTRY/user/name-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field; /NXarpes/ENTRY/SAMPLE/name-field; /NXatom/name-field; /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field; /NXcanSAS/ENTRY/PROCESS/name-field; /NXcanSAS/ENTRY/SAMPLE/name-field; /NXcomponent/name-field; /NXcontainer/name-field; /NXcs_computer/memory/CIRCUIT/name-field; /NXcs_computer/name-field; /NXcs_computer/processing/CIRCUIT/name-field; /NXcs_computer/storage/CIRCUIT/name-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/name-field; /NXcxi_ptycho/sample_1/name-field; /NXdeflector/name-field; /NXdispersion_repeated_parameter/name-field; /NXdispersion_single_parameter/name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field; /NXelectronanalyzer/name-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/name-field; /NXem/ENTRY/SAMPLE/name-field; /NXem/ENTRY/USER/name-field; /NXem/ENTRY/measurement/instrument/DETECTOR/name-field; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE/name-field; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM/name-field; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE/name-field; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM/name-field; /NXem/ENTRY/measurement/instrument/name-field; /NXenvironment/name-field; /NXfluo/ENTRY/INSTRUMENT/SOURCE/name-field; /NXfluo/ENTRY/SAMPLE/name-field; /NXibeam_column/ion_source/name-field; /NXinstrument/name-field; /NXinstrument_em/name-field; /NXion/name-field; /NXiqproc/ENTRY/SAMPLE/name-field; /NXiqproc/ENTRY/instrument/SOURCE/name-field; /NXiqproc/ENTRY/instrument/name-field; /NXiv_temp/ENTRY/SAMPLE/name-field; /NXlauetof/ENTRY/name-group; /NXlauetof/ENTRY/sample/name-field; /NXlens_em/name-field; /NXmanipulator/name-field; /NXmicrostructure_score_config/ENTRY/component_analysis/name-field; /NXmonopd/ENTRY/INSTRUMENT/SOURCE/name-field; /NXmonopd/ENTRY/SAMPLE/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_ammeter/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/name-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/name-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/name-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/name-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/name-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/name-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/name-field; /NXmpes/ENTRY/SAMPLE/name-field; /NXmpes/ENTRY/USER/name-field; /NXmx/ENTRY/INSTRUMENT/name-field; /NXmx/ENTRY/SAMPLE/name-field; /NXmx/ENTRY/SOURCE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/name-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/name-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/name-field; /NXphase/name-field; /NXpiezoelectric_material/name-field; /NXpositioner/name-field; /NXrefscan/ENTRY/instrument/SOURCE/name-field; /NXrefscan/ENTRY/sample/name-field; /NXreftof/ENTRY/instrument/name-field; /NXreftof/ENTRY/sample/name-field; /NXsample/name-field; /NXsample_component/name-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXsas/ENTRY/INSTRUMENT/name-field; /NXsas/ENTRY/SAMPLE/name-field; /NXsastof/ENTRY/instrument/name-field; /NXsastof/ENTRY/instrument/source/name-field; /NXsastof/ENTRY/sample/name-field; /NXsensor/name-field; /NXsensor_scan/ENTRY/SAMPLE/name-field; /NXsensor_scan/ENTRY/USER/name-field; /NXsnsevent/ENTRY/USER/name-field; /NXsnsevent/ENTRY/instrument/SNS/name-field; /NXsnsevent/ENTRY/instrument/name-field; /NXsnsevent/ENTRY/sample/name-field; /NXsnshisto/ENTRY/USER/name-field; /NXsnshisto/ENTRY/instrument/SNS/name-field; /NXsnshisto/ENTRY/instrument/name-field; /NXsnshisto/ENTRY/sample/name-field; /NXsource/name-field; /NXspe/ENTRY/INSTRUMENT/name-field; /NXspm/ENTRY/INSTRUMENT/hardware/name-field; /NXspm/ENTRY/INSTRUMENT/software/name-field; /NXsqom/ENTRY/SAMPLE/name-field; /NXsqom/ENTRY/instrument/SOURCE/name-field; /NXsqom/ENTRY/instrument/name-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field; /NXsubstance/name-field; /NXtas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXtas/ENTRY/SAMPLE/name-field; /NXtofnpd/ENTRY/SAMPLE/name-field; /NXtofnpd/ENTRY/user/name-field; /NXtofraw/ENTRY/SAMPLE/name-field; /NXtofraw/ENTRY/user/name-field; /NXtofsingle/ENTRY/SAMPLE/name-field; /NXtofsingle/ENTRY/user/name-field; /NXtomo/ENTRY/instrument/SOURCE/name-field; /NXtomo/ENTRY/sample/name-field; /NXtomophase/ENTRY/instrument/SOURCE/name-field; /NXtomophase/ENTRY/sample/name-field; /NXtomoproc/ENTRY/INSTRUMENT/SOURCE/name-field; /NXtomoproc/ENTRY/SAMPLE/name-field; /NXtransmission/ENTRY/SAMPLE/name-field; /NXtransmission/ENTRY/operator/name-field; /NXuser/name-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/name-field; /NXxas/ENTRY/SAMPLE/name-field; /NXxasproc/ENTRY/SAMPLE/name-field; /NXxbase/ENTRY/instrument/source/name-field; /NXxbase/ENTRY/sample/name-field; /NXxeuler/ENTRY/name-group; /NXxkappa/ENTRY/name-group; /NXxnb/ENTRY/name-group; /NXxrot/ENTRY/name-group
name_spectrum: /NXellipsometry/ENTRY/data_collection/NAME_spectrum-field
nanoprobe: /NXem/ENTRY/measurement/instrument/nanoprobe-group; /NXinstrument_em/nanoprobe-group
natural_abundance_product: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/natural_abundance_product-field; /NXapm_charge_state_analysis/natural_abundance_product-field
nature: /NXsnsevent/ENTRY/sample/nature-field; /NXsnshisto/ENTRY/sample/nature-field; /NXtofraw/ENTRY/SAMPLE/nature-field; /NXtofsingle/ENTRY/SAMPLE/nature-field
next_set: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set-group
next_set_feature_to_cluster: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/next_set_feature_to_cluster-field
next_to_current_link: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link-field
next_to_current_link_type: /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link_type-field
noise: /NXsimilarity_grouping/statistics/noise-field
noise_level: /NXcircuit/noise_level-field
nominal: /NXmonitor/nominal-field
normalization: /NXapm/ENTRY/sample/chemical_composition/normalization-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/normalization-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/normalization-field; /NXchemical_composition/normalization-field; /NXmicrostructure/chemical_composition/normalization-field
normals: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/face_normal/normals-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/vertex_normal/normals-field; /NXcg_unit_normal/normals-field
note: /NXactivity/NOTE-group; /NXaperture/NOTE-group; /NXapm/ENTRY/NOTE-group; /NXapm_ranging/NOTE-group; /NXapm_reconstruction/NOTE-group; /NXcanSAS/ENTRY/PROCESS/NOTE-group; /NXem/ENTRY/NOTE-group; /NXenvironment/NOTE-group; /NXhistory/NOTE-group; /NXobject/NOTE-group; /NXprocess/NOTE-group; /NXresolution/note-group; /NXsensor_scan/ENTRY/NOTE-group; /NXxpcs/ENTRY/NOTE-group
notes: /NXentry/notes-group; /NXsnsevent/ENTRY/notes-field; /NXsnshisto/ENTRY/notes-field; /NXsource/notes-group; /NXsubentry/notes-group
nucleation: /NXmicrostructure_score_config/ENTRY/nucleation-group
nuclide_hash: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/nuclide_hash-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_hash-field; /NXapm_charge_state_analysis/nuclide_hash-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/ION/nuclide_hash-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/ROI/nuclide_hash-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_hash-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_hash-field; /NXion/nuclide_hash-field
nuclide_list: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_list-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/ION/nuclide_list-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_list-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_list-field; /NXion/nuclide_list-field
nuclide_whitelist: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/decomposition/nuclide_whitelist-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/nuclide_whitelist-field
nuclides: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/nuclides-field; /NXapm_charge_state_analysis/nuclides-field
num: /NXvelocity_selector/num-field
num_of_channels: /NXamplifier/num_of_channels-field
number: /NXfermi_chopper/number-field
number_of_atoms: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_atoms-field
number_of_boundaries: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/number_of_boundaries-field; /NXcg_grid/number_of_boundaries-field; /NXmicrostructure_score_results/ENTRY/discretization/boundary/number_of_boundaries-field
number_of_bunches: /NXsource/number_of_bunches-field
number_of_categorical_labels: /NXsimilarity_grouping/number_of_categorical_labels-field
number_of_core: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/number_of_core-field
number_of_crystals: /NXmicrostructure/crystals/number_of_crystals-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/number_of_crystals-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/number_of_crystals-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/number_of_crystals-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/number_of_crystals-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/number_of_crystals-field
number_of_cycles: /NXdetector/number_of_cycles-field
number_of_dld_wires: /NXapm/ENTRY/atom_probe/raw_data/number_of_dld_wires-field
number_of_domains: /NXmicrostructure_score_config/ENTRY/solitary_unit/number_of_domains-field
number_of_edges: /NXcg_face_list_data_structure/number_of_edges-field; /NXcg_half_edge_data_structure/number_of_edges-field; /NXcg_polyhedron/number_of_edges-field
number_of_faces: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/number_of_faces-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/number_of_faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/number_of_faces-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/number_of_faces-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/number_of_faces-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_faces-field; /NXcg_face_list_data_structure/number_of_faces-field; /NXcg_polyhedron/number_of_faces-field
number_of_feature_types: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/number_of_feature_types-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/number_of_feature_types-field
number_of_features: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/number_of_features-field
number_of_gpus: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_gpus-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_gpus-field; /NXcs_profiling/number_of_gpus-field; /NXcs_profiling_event/number_of_gpus-field
number_of_grains: /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_grains-field; /NXmicrostructure_imm_config/ENTRY/roi/number_of_grains-field
number_of_interfaces: /NXmicrostructure/interfaces/number_of_interfaces-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/number_of_interfaces-field
number_of_ion_types: /NXapm/ENTRY/atom_probe/ranging/peak_identification/number_of_ion_types-field; /NXapm_ranging/peak_identification/number_of_ion_types-field
number_of_ions: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/window/number_of_ions-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/number_of_ions-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_ions-field; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/number_of_ions-field; /NXapm_paraprobe_selector_results/ENTRY/roi/window/number_of_ions-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/window/number_of_ions-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/window/number_of_ions-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/number_of_ions-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/number_of_ions-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/number_of_ions-field; /NXapm_paraprobe_tool_results/window/number_of_ions-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/number_of_ions-field
number_of_iterations: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/number_of_iterations-field; /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_iterations-field
number_of_junctions: /NXmicrostructure/quadruple_junctions/number_of_junctions-field; /NXmicrostructure/triple_junctions/number_of_junctions-field
number_of_lenses: /NXxraylens/number_of_lenses-field
number_of_noise: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/number_of_noise-field
number_of_numeric_labels: /NXsimilarity_grouping/number_of_numeric_labels-field
number_of_objects: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/number_of_objects-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/number_of_objects-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/number_of_objects-field; /NXcs_filter_boolean_mask/number_of_objects-field
number_of_phases: /NXmicrostructure/crystals/number_of_phases-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/number_of_phases-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/number_of_phases-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/number_of_phases-field
number_of_planes: /NXem_ebsd/indexing/PHASE/number_of_planes-field
number_of_processes: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_processes-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_processes-field; /NXcs_profiling/number_of_processes-field; /NXcs_profiling_event/number_of_processes-field
number_of_scan_points: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/number_of_scan_points-field; /NXem/ENTRY/ROI/ebsd/indexing/number_of_scan_points-field; /NXem_ebsd/indexing/PHASE/number_of_scan_points-field; /NXem_ebsd/indexing/number_of_scan_points-field
number_of_solutions: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/number_of_solutions-field
number_of_subgrains: /NXmicrostructure_imm_config/ENTRY/roi/number_of_subgrains-field
number_of_targets: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics/number_of_targets-field
number_of_tasks: /NXapm_paraprobe_clusterer_config/ENTRY/number_of_tasks-field; /NXapm_paraprobe_intersector_config/ENTRY/number_of_tasks-field; /NXapm_paraprobe_spatstat_config/ENTRY/number_of_tasks-field
number_of_threads: /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_threads-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_threads-field; /NXcs_profiling/number_of_threads-field; /NXcs_profiling_event/number_of_threads-field
number_of_total_vertices: /NXcg_polygon/number_of_total_vertices-field; /NXcg_polyline/number_of_total_vertices-field
number_of_trajectory_points: /NXscan_control/traj_SCAN/number_of_trajectory_points-field
number_of_triangle_sets: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/number_of_triangle_sets-field
number_of_triangles: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/number_of_triangles-field
number_of_unique_vertices: /NXcg_polyline/number_of_unique_vertices-field; /NXcg_triangle/number_of_unique_vertices-field
number_of_vertices: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/number_of_vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/number_of_vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/number_of_vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/number_of_vertices-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_vertices-field; /NXcg_face_list_data_structure/number_of_vertices-field; /NXcg_half_edge_data_structure/number_of_vertices-field; /NXcg_polyline/number_of_vertices-field
number_sections: /NXguide/number_sections-field
numerical_aperture: /NXfiber/numerical_aperture-field; /NXlens_opt/numerical_aperture-field
numerical_label: /NXsimilarity_grouping/numerical_label-field
numerical_labels: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/numerical_labels-field
numerics: /NXmicrostructure_gragles_config/ENTRY/numerics-group; /NXmicrostructure_mtex_config/numerics-group; /NXmicrostructure_score_config/ENTRY/numerics-group
nxspe_info: /NXspe/ENTRY/NXSPE_info-group
obb: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb-group; /NXapm_reconstruction/obb-group
object: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT-group; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT-group
observed_frame: /NXreflections/observed_frame-field
observed_frame_errors: /NXreflections/observed_frame_errors-field
observed_frame_var: /NXreflections/observed_frame_var-field
observed_phi: /NXreflections/observed_phi-field
observed_phi_errors: /NXreflections/observed_phi_errors-field
observed_phi_var: /NXreflections/observed_phi_var-field
observed_px_x: /NXreflections/observed_px_x-field
observed_px_x_errors: /NXreflections/observed_px_x_errors-field
observed_px_x_var: /NXreflections/observed_px_x_var-field
observed_px_y: /NXreflections/observed_px_y-field
observed_px_y_errors: /NXreflections/observed_px_y_errors-field
observed_px_y_var: /NXreflections/observed_px_y_var-field
observed_x: /NXreflections/observed_x-field
observed_x_errors: /NXreflections/observed_x_errors-field
observed_x_var: /NXreflections/observed_x_var-field
observed_y: /NXreflections/observed_y-field
observed_y_errors: /NXreflections/observed_y_errors-field
observed_y_var: /NXreflections/observed_y_var-field
occupancy: /NXatom/occupancy-field
odd_layer_density: /NXmirror/odd_layer_density-field
odd_layer_material: /NXmirror/odd_layer_material-field
odf: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/ODF-group; /NXmicrostructure_mtex_config/path/odf-field
off_geometry: /NXaperture/OFF_GEOMETRY-group; /NXbeam_stop/OFF_GEOMETRY-group; /NXbending_magnet/OFF_GEOMETRY-group; /NXcollimator/OFF_GEOMETRY-group; /NXcrystal/OFF_GEOMETRY-group; /NXdisk_chopper/OFF_GEOMETRY-group; /NXfermi_chopper/OFF_GEOMETRY-group; /NXfilter/OFF_GEOMETRY-group; /NXgrating/OFF_GEOMETRY-group; /NXguide/OFF_GEOMETRY-group; /NXinsertion_device/OFF_GEOMETRY-group; /NXmirror/OFF_GEOMETRY-group; /NXmoderator/OFF_GEOMETRY-group; /NXmonitor/OFF_GEOMETRY-group; /NXmonochromator/OFF_GEOMETRY-group; /NXsample/OFF_GEOMETRY-group; /NXsensor/OFF_GEOMETRY-group; /NXsolid_geometry/OFF_GEOMETRY-group; /NXsource/OFF_GEOMETRY-group; /NXvelocity_selector/OFF_GEOMETRY-group; /NXxraylens/OFF_GEOMETRY-group
offset: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/offset-field; /NXcalibration/offset-field; /NXcg_alpha_complex/offset-field; /NXcircuit/offset-field; /NXdata/offset-field; /NXmpes/ENTRY/energy_referencing/offset-field
offset_azimuth: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth-field
offset_polar: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar-field
offset_tilt: /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt-field
offset_values: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/offset_values-field
omega: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/omega-field; /NXxrd_pan/ENTRY/experiment_config/omega-group; /NXxrd_pan/ENTRY/experiment_result/omega-field
oned_profile: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile-group; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile-group
open_gl_bug: /NXmicrostructure_mtex_config/system/open_gl_bug-field
openloop_amplification: /NXamplifier/openloop_amplification-field
operating_frequency: /NXcircuit/operating_frequency-field
operating_system: /NXcs_computer/operating_system-field
operation: /NXcsg/operation-field
operation_mode: /NXapm/ENTRY/operation_mode-field; /NXebeam_column/operation_mode-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/operation_mode-field
operator: /NXtransmission/ENTRY/operator-group
opt_window: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/OPT_WINDOW-group
optical_loss: /NXbeam_splitter/optical_loss-field
optical_system_em: /NXinstrument_em/OPTICAL_SYSTEM_EM-group
optics: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/optics-group
orcid: /NXsensor_scan/ENTRY/USER/orcid-field; /NXuser/ORCID-field
order_no: /NXcrystal/order_no-field
orientation: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/face_normal/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/vertex_normal/orientation-field; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/orientation-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/orientation-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/orientation-field; /NXcg_primitive/orientation-field; /NXcg_unit_normal/orientation-field; /NXcontainer/orientation-group; /NXgeometry/ORIENTATION-group; /NXmicrostructure_score_config/ENTRY/nucleation/orientation-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle: /NXopt_window/ENTRY/orientation_angle-field
orientation_distribution: /NXmicrostructure_imm_config/ENTRY/orientation_distribution-group
orientation_euler: /NXrotations/orientation_euler-field
orientation_matrix: /NXcrystal/orientation_matrix-field; /NXfilter/orientation_matrix-field; /NXlauetof/ENTRY/sample/orientation_matrix-field; /NXsample/orientation_matrix-field; /NXsample_component/orientation_matrix-field; /NXtas/ENTRY/SAMPLE/orientation_matrix-field; /NXxbase/ENTRY/sample/orientation_matrix-field
orientation_quaternion: /NXrotations/orientation_quaternion-field
orientation_spread: /NXmicrostructure/crystals/orientation_spread-field
origin: /NXapm/ENTRY/COORDINATE_SYSTEM/origin-field; /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/origin-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/origin-field; /NXcg_grid/origin-field; /NXcoordinate_system/origin-field; /NXem/ENTRY/COORDINATE_SYSTEM/origin-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/origin-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/origin-field; /NXem/ENTRY/processing_reference_frame/origin-field; /NXem/ENTRY/sample_reference_frame/origin-field; /NXem_ebsd/gnomonic_reference_frame/origin-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/origin-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/origin-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/origin-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin-group; /NXxps/ENTRY/xps_coordinate_system/origin-field
original_axis: /NXcalibration/original_axis-field
original_centre: /NXdistortion/original_centre-field
original_points: /NXdistortion/original_points-field
oscillating_n: /NXscan_control/linear_SCAN/oscillating_N-field; /NXscan_control/mesh_SCAN/oscillating_N-field; /NXscan_control/snake_SCAN/oscillating_N-field; /NXscan_control/spiral_SCAN/oscillating_N-field; /NXscan_control/traj_SCAN/oscillating_N-field
oscillation_frequency: /NXscan_control/linear_SCAN/oscillation_frequency-field; /NXscan_control/mesh_SCAN/oscillation_frequency-field; /NXscan_control/snake_SCAN/oscillation_frequency-field; /NXscan_control/spiral_SCAN/oscillation_frequency-field; /NXscan_control/traj_SCAN/oscillation_frequency-field
oscillator_excitation: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/oscillator_excitation-field; /NXafm/ENTRY/resolution_indicators/oscillator_excitation-field
other_shape: /NXbeam_splitter/SHAPE/other_shape-field; /NXpolarizer_opt/SHAPE/other_shape-field
other_type: /NXbeam_splitter/other_type-field; /NXlens_opt/other_type-field; /NXwaveplate/other_type-field
outer_diameter: /NXfresnel_zone_plate/outer_diameter-field
outer_plot_spacing: /NXmicrostructure_mtex_config/plotting/outer_plot_spacing-field
outermost_zone_width: /NXfresnel_zone_plate/outermost_zone_width-field
output: /NXiqproc/ENTRY/reduction/output-group; /NXsqom/ENTRY/reduction/output-group
output_channels: /NXcircuit/output_channels-field
output_grid: /NXmicrostructure_ipf/output_grid-group
output_heater_power: /NXmanipulator/sample_heater/output_heater_power-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/output_heater_power-field
output_heater_power_log: /NXmanipulator/sample_heater/output_heater_power_log-group
output_impedance: /NXcircuit/output_impedance-field
output_signal: /NXcircuit/output_signal-field
output_slew_rate: /NXcircuit/output_slew_rate-field
outputs: /NXcomponent/outputs-field
outputvalue: /NXactuator/outputVALUE-field
overlaps: /NXreflections/overlaps-field
p_pyroelectric_constant: /NXpiezoelectric_material/P_pyroelectric_constant-field
packing_fraction: /NXcontainer/packing_fraction-field
pair_separation: /NXdisk_chopper/pair_separation-field
parallelogram: /NXcg_parallelogram/PARALLELOGRAM-group
parallelograms: /NXcg_parallelogram/parallelograms-group
parameter: /NXapm/ENTRY/atom_probe/reconstruction/parameter-field; /NXapm_reconstruction/parameter-field; /NXem_ebsd/indexing/parameter-group
parameter_reliability: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/parameter_reliability-field
parameter_units: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/parameter_units-field; /NXdispersion_repeated_parameter/parameter_units-field
parameters: /NXentry/PARAMETERS-group; /NXobject/PARAMETERS-group; /NXquadric/parameters-field; /NXsubentry/PARAMETERS-group; /NXtomoproc/ENTRY/reconstruction/parameters-group; /NXxasproc/ENTRY/XAS_data_reduction/parameters-group
paraprobe: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe-group
parent: /NXregion/parent-field
parent_mask: /NXregion/parent_mask-field
partial: /NXapm_paraprobe_intersector_results/ENTRY/common/config/partial-field
partiality: /NXreflections/partiality-field
pass_energy: /NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field; /NXenergydispersion/pass_energy-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/pass_energy-field
patch_filter: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/patch_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter-group
path: /NXmicrostructure_mtex_config/path-group
path_length: /NXsample/path_length-field
path_length_window: /NXsample/path_length_window-field
pattern_center: /NXem_calorimetry/ENTRY/pattern_center-group
pattern_centre: /NXem/ENTRY/ROI/ebsd/pattern_centre-group; /NXem_ebsd/pattern_centre-group
pca: /NXapm_compositionspace_config/ENTRY/config/segmentation/pca-group; /NXapm_compositionspace_results/ENTRY/segmentation/pca-group
peak: /NXapm/ENTRY/atom_probe/ranging/peak_search/PEAK-group; /NXapm_ranging/peak_search_and_deconvolution/PEAK-group; /NXem_eds/indexing/IMAGE/PROCESS/peak-field; /NXem_eds/indexing/PEAK-group; /NXem_eels/indexing/PEAK-group
peak_identification: /NXapm/ENTRY/atom_probe/ranging/peak_identification-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification-group; /NXapm_ranging/peak_identification-group
peak_power: /NXsource/peak_power-field
peak_search: /NXapm/ENTRY/atom_probe/ranging/peak_search-group
peak_search_and_deconvolution: /NXapm_ranging/peak_search_and_deconvolution-group
peakpeak: /NXfit/peakPEAK-group; /NXxps/ENTRY/FIT/peakPEAK-group
period: /NXgrating/period-field; /NXsource/period-field
pf: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/PF-group; /NXmicrostructure_mtex_config/path/pf-field; /NXmicrostructure_pf/pf-group
pf_anno_fun_hdl: /NXmicrostructure_mtex_config/plotting/pf_anno_fun_hdl-field
pf_extensions: /NXmicrostructure_mtex_config/path/pf_extensions-field
phase: /NXdisk_chopper/phase-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE-group; /NXem_ebsd/indexing/PHASE-group; /NXinsertion_device/phase-field
phase_lock_loop: /NXafm/ENTRY/INSTRUMENT/CANTILEVER_SPM/cantilever_oscillator/phase_lock_loop-group; /NXcantilever_spm/cantilever_oscillator/phase_lock_loop-group
phase_modulation_bandwidth: /NXlockin/phase_modulation_bandwidth-field
phase_shift: /NXcantilever_spm/cantilever_oscillator/phase_shift-field
phaseplate: /NXebeam_column/PHASEPLATE-group; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE-group
phases_per_scan_point: /NXem_ebsd/indexing/phases_per_scan_point-field
phi: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/phi-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/phi-field; /NXxeuler/ENTRY/name/phi-link; /NXxeuler/ENTRY/sample/phi-field; /NXxkappa/ENTRY/name/phi-link; /NXxkappa/ENTRY/sample/phi-field; /NXxrd_pan/ENTRY/experiment_result/phi-field
phi_two_plot: /NXmicrostructure_odf/phi_two_plot-group
photo_detector: /NXafm/ENTRY/INSTRUMENT/photo_detector-group
photon_energy: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/photon_energy-field; /NXmpes/ENTRY/data/photon_energy-field
physical_form: /NXem/ENTRY/SAMPLE/physical_form-field; /NXmpes/ENTRY/SAMPLE/physical_form-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/physical_form-field; /NXsample/physical_form-field
physical_quantity: /NXactuator/physical_quantity-field; /NXcalibration/physical_quantity-field; /NXelectronanalyzer/angular_resolution/physical_quantity-field; /NXelectronanalyzer/energy_resolution/physical_quantity-field; /NXelectronanalyzer/momentum_resolution/physical_quantity-field; /NXelectronanalyzer/spatial_resolution/physical_quantity-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/sample_heater/physical_quantity-field; /NXmanipulator/cryostat/physical_quantity-field; /NXmanipulator/sample_bias_potentiostat/physical_quantity-field; /NXmanipulator/sample_heater/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/energy_resolution/physical_quantity-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/physical_quantity-field; /NXmpes/ENTRY/energy_axis_calibration/physical_quantity-field; /NXmpes/ENTRY/energy_referencing/physical_quantity-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/angularN_resolution/physical_quantity-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/physical_quantity-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/physical_quantity-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/physical_quantity-field; /NXresolution/physical_quantity-field
pid_controller: /NXactuator/PID_CONTROLLER-group; /NXmanipulator/cryostat/PID_CONTROLLER-group; /NXmanipulator/sample_bias_potentiostat/PID_CONTROLLER-group; /NXmanipulator/sample_heater/PID_CONTROLLER-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID_CONTROLLER-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID_CONTROLLER-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID_CONTROLLER-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID_CONTROLLER-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID_CONTROLLER-group
piezo_configuration: /NXafm/ENTRY/INSTRUMENT/XY_piezo_sensor/piezo_configuration-group; /NXafm/ENTRY/INSTRUMENT/height_piezo_sensor/piezo_configuration-group; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/piezo_configuration-group; /NXstm/ENTRY/INSTRUMENT/piezo_sensor/piezo_configuration-group; /NXsts/ENTRY/INSTRUMENT/piezo_sensor/piezo_configuration-group
piezo_material: /NXafm/ENTRY/INSTRUMENT/XY_piezo_sensor/piezo_configuration/piezo_material-group; /NXafm/ENTRY/INSTRUMENT/height_piezo_sensor/piezo_configuration/piezo_material-group; /NXpiezo_config_spm/piezo_material-group; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/piezo_material-group
piezo_sensor: /NXspm/ENTRY/INSTRUMENT/piezo_sensor-group; /NXspm/ENTRY/INSTRUMENT/scan_environment/piezo_sensor-group; /NXstm/ENTRY/INSTRUMENT/piezo_sensor-group; /NXsts/ENTRY/INSTRUMENT/piezo_sensor-group
pinhole_position: /NXinstrument_apm/pulser/SOURCE/BEAM/pinhole_position-field
pitch: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field; /NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id: /NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field; /NXsnshisto/ENTRY/DATA/pixel_id-link; /NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask: /NXdetector/pixel_mask-field; /NXdetector_channel/pixel_mask-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied: /NXdetector/pixel_mask_applied-field; /NXdetector_channel/pixel_mask_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_x: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/pixel_x-field
pixel_y: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/pixel_y-field
plot: /NXdispersive_material/ENTRY/dispersion_x/plot-group; /NXdispersive_material/ENTRY/dispersion_y/plot-group; /NXdispersive_material/ENTRY/dispersion_z/plot-group
plotting: /NXmicrostructure_mtex_config/plotting-group
point_group: /NXsample/point_group-field; /NXsample_component/point_group-field; /NXunit_cell/point_group-field
point_normal_form: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface/point_normal_form-field
point_set_wrapping: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping-group
point_to_triangle: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle-group
poison_depth: /NXmoderator/poison_depth-field
poison_material: /NXmoderator/poison_material-field
polar: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar-field; /NXspe/ENTRY/data/polar-field
polar_angle: /NXcrystal/polar_angle-field; /NXdetector/polar_angle-field; /NXindirecttof/ENTRY/INSTRUMENT/analyser/polar_angle-field; /NXlauetof/ENTRY/instrument/detector/polar_angle-field; /NXmonopd/ENTRY/DATA/polar_angle-link; /NXmonopd/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXreflections/polar_angle-field; /NXrefscan/ENTRY/data/polar_angle-link; /NXrefscan/ENTRY/instrument/DETECTOR/polar_angle-field; /NXreftof/ENTRY/instrument/detector/polar_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXsastof/ENTRY/instrument/detector/polar_angle-field; /NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field; /NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field; /NXtas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXtas/ENTRY/INSTRUMENT/analyser/polar_angle-field; /NXtas/ENTRY/SAMPLE/polar_angle-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/polar_angle-field; /NXtofraw/ENTRY/instrument/detector/polar_angle-field; /NXtofsingle/ENTRY/INSTRUMENT/detector/polar_angle-field; /NXxeuler/ENTRY/instrument/detector/polar_angle-field; /NXxeuler/ENTRY/name/polar_angle-link; /NXxkappa/ENTRY/instrument/detector/polar_angle-field; /NXxkappa/ENTRY/name/polar_angle-link; /NXxnb/ENTRY/instrument/detector/polar_angle-field; /NXxnb/ENTRY/name/polar_angle-link; /NXxrd/ENTRY/DATA/polar_angle-field; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field; /NXxrot/ENTRY/instrument/detector/polar_angle-field
polar_width: /NXspe/ENTRY/data/polar_width-field
polarizer: /NXinstrument/POLARIZER-group; /NXsnsevent/ENTRY/instrument/POLARIZER-group; /NXsnshisto/ENTRY/instrument/POLARIZER-group; /NXtransmission/ENTRY/instrument/polarizer-field
polarizer_angle: /NXpolarizer_opt/polarizer_angle-field
polarizing: /NXbeam_splitter/polarizing-field
poles: /NXinsertion_device/poles-field
polfilter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE-group
polygon: /NXcg_polygon/POLYGON-group
polygon_half_edge: /NXcg_polygon/POLYGON_HALF_EDGE-group
polygons: /NXcg_polygon/polygons-group
polyhedra: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra-group; /NXcg_polyhedron/polyhedra-group
polyhedron: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron-group; /NXcg_polyhedron/POLYHEDRON-group
polyhedron_half_edge: /NXcg_polyhedron/POLYHEDRON_HALF_EDGE-group
polyhedron_set: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/polyhedron_set-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/polyhedron_set-group
polylines: /NXcg_polyline/polylines-field
position: /NXapm/ENTRY/atom_probe/ranging/peak_search/PEAK/position-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/position-field; /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/position-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/position-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/position-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/position-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/position-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/position-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/position-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/position-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/position-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/position-field; /NXapm_paraprobe_tool_config/reconstruction/position-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/position-field; /NXatom/position-field; /NXcg_grid/position-field; /NXcg_half_edge_data_structure/position-field; /NXcg_point/position-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/position-field; /NXem_calorimetry/ENTRY/pattern_center/position-field; /NXenvironment/position-group; /NXfit_background/data/position-field; /NXinstrument_em/stage/position-field; /NXmicrostructure/quadruple_junctions/position-field; /NXmicrostructure/triple_junctions/position-field; /NXpeak/data/position-field; /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/position-field; /NXxps/ENTRY/FIT/peakPEAK/data/position-field; /NXxps/ENTRY/FIT/peakPEAK/function/fit_parameters/position-field
position_x: /NXxpcs/ENTRY/sample/position_x-group
position_y: /NXxpcs/ENTRY/sample/position_y-group
position_z: /NXxpcs/ENTRY/sample/position_z-group
positioner: /NXaperture/POSITIONER-group; /NXinstrument/POSITIONER-group; /NXmanipulator/POSITIONER-group; /NXsample/POSITIONER-group; /NXsnsevent/ENTRY/DASlogs/POSITIONER-group; /NXsnshisto/ENTRY/DASlogs/POSITIONER-group
positioner_spm: /NXafm/ENTRY/INSTRUMENT/XY_piezo_sensor/POSITIONER_SPM-group; /NXafm/ENTRY/INSTRUMENT/height_piezo_sensor/POSITIONER_SPM-group; /NXbias_spectroscopy/POSITIONER_SPM-group; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM-group; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM-group; /NXstm/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM-group; /NXsts/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM-group
potentiostat: /NXmpes/ENTRY/SAMPLE/bias_env/potentiostat-group
power: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/SOURCE/power-field; /NXinsertion_device/power-field; /NXinstrument_apm/pulser/SOURCE/power-field; /NXsource/power-field; /NXxps/ENTRY/INSTRUMENT/source_probe/power-field
power_consumption: /NXcircuit/power_consumption-field
power_loss: /NXfiber/power_loss-field
power_setting: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/LENS_EM/power_setting-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/LENS_EM/power_setting-field; /NXlens_em/power_setting-field
power_source: /NXcircuit/power_source-field
pre_factor: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/pre_factor-field; /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/pre_factor-field
pre_sample_flightpath: /NXentry/pre_sample_flightpath-field; /NXsubentry/pre_sample_flightpath-field; /NXtofnpd/ENTRY/pre_sample_flightpath-field; /NXtofraw/ENTRY/pre_sample_flightpath-field; /NXtofsingle/ENTRY/pre_sample_flightpath-field
predicted_frame: /NXreflections/predicted_frame-field
predicted_phi: /NXreflections/predicted_phi-field
predicted_px_x: /NXreflections/predicted_px_x-field
predicted_px_y: /NXreflections/predicted_px_y-field
predicted_x: /NXreflections/predicted_x-field
predicted_y: /NXreflections/predicted_y-field
preparation_date: /NXapm/ENTRY/specimen/preparation_date-field; /NXarchive/ENTRY/sample/preparation_date-field; /NXem/ENTRY/SAMPLE/preparation_date-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/preparation_date-field; /NXsample/preparation_date-field
preprocessing: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing-group
preset: /NXfluo/ENTRY/MONITOR/preset-field; /NXlauetof/ENTRY/control/preset-field; /NXmonitor/preset-field; /NXmonopd/ENTRY/MONITOR/preset-field; /NXrefscan/ENTRY/control/preset-field; /NXreftof/ENTRY/control/preset-field; /NXsas/ENTRY/MONITOR/preset-field; /NXsastof/ENTRY/control/preset-field; /NXtas/ENTRY/MONITOR/preset-field; /NXtofnpd/ENTRY/MONITOR/preset-field; /NXtofraw/ENTRY/MONITOR/preset-field; /NXtofsingle/ENTRY/MONITOR/preset-field; /NXxas/ENTRY/MONITOR/preset-field; /NXxbase/ENTRY/control/preset-field
pressure: /NXarchive/ENTRY/sample/pressure-field; /NXsample/pressure-field
pressure_gauge: /NXmpes/ENTRY/INSTRUMENT/pressure_gauge-group; /NXmpes/ENTRY/SAMPLE/gas_pressure_env/pressure_gauge-group
pressure_sensor: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/analysis_chamber/pressure_sensor-group; /NXinstrument_apm/analysis_chamber/pressure_sensor-group
previous_source: /NXsource/previous_source-field
prf_cc: /NXreflections/prf_cc-field
primary_element: /NXapm_reconstruction/primary_element-field
probability_mass: /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/knn/probability_mass-field; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/rdf/probability_mass-field
probe: /NXarchive/ENTRY/instrument/SOURCE/probe-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field; /NXebeam_column/electron_source/probe-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/ion_source/probe-group; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/probe-field; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/probe-group; /NXfluo/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXibeam_column/ion_source/probe-group; /NXiqproc/ENTRY/instrument/SOURCE/probe-field; /NXmonopd/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/probe-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/probe-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/probe-field; /NXoptical_system_em/probe-group; /NXrefscan/ENTRY/instrument/SOURCE/probe-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXsastof/ENTRY/instrument/source/probe-field; /NXsnsevent/ENTRY/instrument/SNS/probe-field; /NXsnshisto/ENTRY/instrument/SNS/probe-field; /NXsource/probe-field; /NXsqom/ENTRY/instrument/SOURCE/probe-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXtas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXtomo/ENTRY/instrument/SOURCE/probe-field; /NXtomophase/ENTRY/instrument/SOURCE/probe-field; /NXtomoproc/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field; /NXxbase/ENTRY/instrument/source/probe-field
probe_current: /NXoptical_system_em/probe_current-field
procedure: /NXopt_window/ENTRY/window_correction/procedure-field
process: /NXcanSAS/ENTRY/PROCESS-group; /NXem/ENTRY/SIMULATION/results/INTERACTION_VOLUME/PROCESS-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS-group; /NXem_eds/indexing/IMAGE/PROCESS-group; /NXentry/PROCESS-group; /NXimage/PROCESS-group; /NXsensor_scan/ENTRY/PROCESS-group; /NXspectrum/PROCESS-group; /NXspm/ENTRY/PROCESS-group; /NXsubentry/PROCESS-group; /NXxpcs/PROCESS-group; /NXxrd/ENTRY/PROCESS-group
processing: /NXcs_computer/processing-group
processing_reference_frame: /NXcoordinate_system_set/processing_reference_frame-group; /NXem/ENTRY/processing_reference_frame-group
profile: /NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
profiling: /NXapm/ENTRY/profiling-group; /NXapm_compositionspace_results/ENTRY/profiling-group; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling-group; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling-group; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling-group; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling-group; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling-group; /NXapm_paraprobe_selector_config/ENTRY/common/profiling-group; /NXapm_paraprobe_selector_results/ENTRY/common/profiling-group; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling-group; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling-group; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling-group; /NXapm_paraprobe_tool_common/profiling-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling-group; /NXem/ENTRY/profiling-group; /NXem_calorimetry/ENTRY/profiling-group; /NXmicrostructure_gragles_config/ENTRY/profiling-group; /NXmicrostructure_imm_results/ENTRY/profiling-group; /NXmicrostructure_kanapy_results/ENTRY/profiling-group; /NXmicrostructure_score_config/ENTRY/profiling-group; /NXmicrostructure_score_results/ENTRY/profiling-group
program: /NXapm/ENTRY/atom_probe/hit_finding/PROGRAM-group; /NXapm/ENTRY/atom_probe/hit_finding/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/PROGRAM-group; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/PROGRAM-group; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/ranging/PROGRAM-group; /NXapm/ENTRY/atom_probe/ranging/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/ranging/background_quantification/PROGRAM-group; /NXapm/ENTRY/atom_probe/ranging/background_quantification/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/PROGRAM-group; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/PROGRAM-group; /NXapm/ENTRY/atom_probe/ranging/peak_identification/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/PROGRAM-group; /NXapm/ENTRY/atom_probe/ranging/peak_search/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/raw_data/PROGRAM-group; /NXapm/ENTRY/atom_probe/raw_data/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/reconstruction/PROGRAM-group; /NXapm/ENTRY/atom_probe/reconstruction/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/PROGRAM-group; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/PROGRAM/program-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/PROGRAM-group; /NXapm/ENTRY/atom_probe/voltage_and_bowl/PROGRAM/program-field; /NXapm/ENTRY/profiling/PROGRAM-group; /NXapm/ENTRY/profiling/PROGRAM/program-field; /NXapm_compositionspace_results/ENTRY/PROGRAM-group; /NXapm_compositionspace_results/ENTRY/PROGRAM/program-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_clusterer_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_distancer_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_distancer_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_distancer_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_distancer_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_intersector_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_intersector_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_intersector_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_intersector_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_nanochem_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_ranger_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_ranger_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_ranger_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_ranger_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_selector_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_selector_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_selector_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_selector_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_spatstat_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_surfacer_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_tessellator_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_tool_common/PROGRAM-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_transcoder_config/ENTRY/common/PROGRAM/program-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/PROGRAM-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/PROGRAM/program-field; /NXapm_ranging/PROGRAM-group; /NXapm_ranging/background_quantification/PROGRAM-group; /NXapm_ranging/mass_to_charge_distribution/PROGRAM-group; /NXapm_ranging/peak_identification/PROGRAM-group; /NXapm_ranging/peak_search_and_deconvolution/PROGRAM-group; /NXapm_reconstruction/PROGRAM-group; /NXapm_reconstruction/naive_discretization/PROGRAM-group; /NXarchive/ENTRY/program-field; /NXcomponent/PROGRAM-group; /NXcs_prng/PROGRAM-group; /NXdispersive_material/ENTRY/program-field; /NXellipsometry/ENTRY/data_collection/data_software/program-field; /NXem/ENTRY/SIMULATION/PROGRAM-group; /NXem/ENTRY/SIMULATION/PROGRAM/program-field; /NXem/ENTRY/SIMULATION/environment/PROGRAM-group; /NXem/ENTRY/SIMULATION/environment/PROGRAM/program-field; /NXem/ENTRY/measurement/instrument/PROGRAM-group; /NXem/ENTRY/measurement/instrument/PROGRAM/program-field; /NXem/ENTRY/profiling/PROGRAM-group; /NXem/ENTRY/profiling/PROGRAM/program-field; /NXem_calorimetry/ENTRY/environment/PROGRAM-group; /NXem_calorimetry/ENTRY/environment/PROGRAM/program-field; /NXem_calorimetry/ENTRY/program1/program-field; /NXem_eds/indexing/PROGRAM-group; /NXem_eels/indexing/PROGRAM-group; /NXem_eels/zlp_correction/PROGRAM-group; /NXenvironment/program-field; /NXimage/PROCESS/PROGRAM-group; /NXiqproc/ENTRY/reduction/program-field; /NXmicrostructure/configuration/PROGRAM-group; /NXmicrostructure_gragles_config/ENTRY/environment/PROGRAM-group; /NXmicrostructure_gragles_config/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_gragles_results/ENTRY/environment/PROGRAM-group; /NXmicrostructure_gragles_results/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_imm_results/ENTRY/environment/PROGRAM-group; /NXmicrostructure_imm_results/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_imm_results/ENTRY/program1/program-field; /NXmicrostructure_kanapy_results/ENTRY/environment/PROGRAM-group; /NXmicrostructure_kanapy_results/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_kanapy_results/ENTRY/program1/program-field; /NXmicrostructure_kanapy_results/ENTRY/program2/program-field; /NXmicrostructure_score_config/ENTRY/environment/PROGRAM-group; /NXmicrostructure_score_config/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_score_config/ENTRY/program1/program-field; /NXmicrostructure_score_results/ENTRY/environment/PROGRAM-group; /NXmicrostructure_score_results/ENTRY/environment/PROGRAM/program-field; /NXmicrostructure_score_results/ENTRY/program1/program-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program-field; /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/program-field; /NXprocess/program-field; /NXprogram/program-field; /NXsensor_scan/ENTRY/PROCESS/program-field; /NXspectrum/PROCESS/PROGRAM-group; /NXsqom/ENTRY/reduction/program-field; /NXtomoproc/ENTRY/reconstruction/program-field; /NXxasproc/ENTRY/XAS_data_reduction/program-field
program1: /NXem_calorimetry/ENTRY/program1-group; /NXmicrostructure_gragles_config/ENTRY/program1-group; /NXmicrostructure_gragles_results/ENTRY/program1-group; /NXmicrostructure_imm_results/ENTRY/program1-group; /NXmicrostructure_kanapy_results/ENTRY/program1-group; /NXmicrostructure_score_config/ENTRY/program1-group; /NXmicrostructure_score_results/ENTRY/program1-group
program2: /NXmicrostructure_kanapy_results/ENTRY/program2-group
program_name: /NXentry/program_name-field; /NXmicrostructure_gragles_config/ENTRY/program1/program_name-field; /NXmicrostructure_gragles_results/ENTRY/program1/program_name-field; /NXspe/ENTRY/program_name-field; /NXsubentry/program_name-field
projection: /NXcollectioncolumn/projection-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/projection-field
projection_direction: /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/projection_direction-field; /NXmicrostructure_ipf/projection_direction-field
protection_features: /NXcircuit/protection_features-field
protocol_name: /NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field; /NXapm_reconstruction/protocol_name-field
proton_charge: /NXsnsevent/ENTRY/proton_charge-field; /NXsnshisto/ENTRY/proton_charge-field
psi: /NXspe/ENTRY/NXSPE_info/psi-field
pulse_delay: /NXbeam/pulse_delay-field
pulse_duration: /NXbeam/pulse_duration-field
pulse_energy: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/SOURCE/pulse_energy-field; /NXbeam/pulse_energy-field; /NXinstrument_apm/pulser/SOURCE/pulse_energy-field; /NXsource/pulse_energy-field
pulse_fraction: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/pulse_fraction-field; /NXinstrument_apm/pulser/pulse_fraction-field
pulse_frequency: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/pulse_frequency-field; /NXinstrument_apm/pulser/pulse_frequency-field
pulse_height: /NXevent_data/pulse_height-field
pulse_mode: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/pulse_mode-field; /NXinstrument_apm/pulser/pulse_mode-field
pulse_number: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/pulse_number-field; /NXinstrument_apm/pulser/pulse_number-field
pulse_shape: /NXmoderator/pulse_shape-group; /NXsource/pulse_shape-group
pulse_time: /NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link; /NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_voltage: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/pulse_voltage-field; /NXinstrument_apm/pulser/pulse_voltage-field
pulse_width: /NXsource/pulse_width-field
pulser: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser-group; /NXapm/ENTRY/measurement/instrument/pulser-group; /NXinstrument_apm/pulser-group
pump: /NXem/ENTRY/measurement/instrument/PUMP-group; /NXinstrument_em/PUMP-group
pv_sensor: /NXpid_controller/pv_sensor-group; /NXpositioner/actuator/feedback/pv_sensor-group
q: /NXcanSAS/ENTRY/DATA/Q-field; /NXxrd_pan/ENTRY/q_data/q-field
q_data: /NXxrd_pan/ENTRY/q_data-group
q_norm: /NXxrd_pan/ENTRY/experiment_result/q_norm-field
q_parallel: /NXxrd_pan/ENTRY/experiment_result/q_parallel-field; /NXxrd_pan/ENTRY/q_data/q_parallel-field
q_perpendicular: /NXxrd_pan/ENTRY/experiment_result/q_perpendicular-field; /NXxrd_pan/ENTRY/q_data/q_perpendicular-field
qdev: /NXcanSAS/ENTRY/DATA/Qdev-field
qh: /NXtas/ENTRY/DATA/qh-link; /NXtas/ENTRY/SAMPLE/qh-field
qk: /NXtas/ENTRY/DATA/qk-link; /NXtas/ENTRY/SAMPLE/qk-field
ql: /NXtas/ENTRY/DATA/ql-link; /NXtas/ENTRY/SAMPLE/ql-field
qmean: /NXcanSAS/ENTRY/DATA/Qmean-field
quadric: /NXsolid_geometry/QUADRIC-group
quadruple_junctions: /NXmicrostructure/quadruple_junctions-group
quality: /NXapm/ENTRY/measurement/quality-field
qx: /NXiqproc/ENTRY/DATA/qx-field; /NXsqom/ENTRY/DATA/qx-field
qy: /NXiqproc/ENTRY/DATA/qy-field; /NXsqom/ENTRY/DATA/qy-field
qz: /NXsqom/ENTRY/DATA/qz-field
r_5: /NXcorrector_cs/TABLEAU/r_5-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/r_5-group
r_slit: /NXfermi_chopper/r_slit-field
radiation: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radii: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/radii-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/radii-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/radii-field; /NXcg_cylinder/radii-field; /NXcg_ellipsoid/radii-field
radius: /NXcg_cylinder/radius-field; /NXcg_ellipsoid/radius-field; /NXdisk_chopper/radius-field; /NXenergydispersion/radius-field; /NXfermi_chopper/radius-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution/radius-field; /NXvelocity_selector/radius-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/radius-field
radius_evolution: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution-group
raman_experiment_type: /NXraman/ENTRY/raman_experiment_type-field
random_forest_classifier: /NXapm_compositionspace_config/ENTRY/config/autophase/random_forest_classifier-group
random_number_generator: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/random_number_generator-group
randomize_iontypes: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/randomize_iontypes-field
range: /NXapm_paraprobe_ranger_config/ENTRY/range-group; /NXmonitor/range-field
range_n: /NXpiezo_config_spm/calibration/range_N-field
ranging: /NXapm/ENTRY/atom_probe/ranging-group; /NXapm_compositionspace_config/ENTRY/config/ranging-group; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging-group; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging-group; /NXapm_paraprobe_selector_config/ENTRY/select/ranging-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging-group; /NXapm_paraprobe_tool_config/ranging-group; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging-group
ranging_definitions: /NXapm_compositionspace_config/ENTRY/config/ranging/ranging_definitions-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging/ranging_definitions-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/ranging_definitions-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/ranging_definitions-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/ranging_definitions-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/ranging_definitions-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging/ranging_definitions-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/ranging_definitions-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/ranging_definitions-field; /NXapm_paraprobe_tool_config/ranging/ranging_definitions-field
ratio: /NXdisk_chopper/ratio-field
ratio_k_alphatwo_k_alphaone: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/ratio_k_alphatwo_k_alphaone-field
raw: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/raw-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data/raw-field
raw_data: /NXapm/ENTRY/atom_probe/raw_data-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data-group; /NXxrd/ENTRY/INSTRUMENT/DETECTOR/raw_data-group
raw_file: /NXtomoproc/ENTRY/reconstruction/parameters/raw_file-field; /NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames: /NXsnsevent/ENTRY/raw_frames-field; /NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight: /NXdetector/raw_time_of_flight-field
raw_tof: /NXapm/ENTRY/atom_probe/voltage_and_bowl/raw_tof-field
raw_value: /NXlog/raw_value-field; /NXpositioner/raw_value-field
rcs_acquisition_time: /NXrcs/rcs_acquisition_time-field
rcs_animation_time: /NXrcs/rcs_animation_time-field
rcs_description: /NXrcs/rcs_description-field
rcs_fabrication: /NXrcs/rcs_fabrication-group
rcs_frequency: /NXrcs/rcs_frequency-field; /NXspm/ENTRY/INSTRUMENT/real_time_controller/rcs_frequency-field
rcs_indication_time: /NXrcs/rcs_indication_time-field
rcs_manufacturer: /NXrcs/rcs_manufacturer-field
rcs_measurement_time: /NXrcs/rcs_measurement_time-field
rcs_name: /NXrcs/rcs_name-field
rcs_serial_number: /NXrcs/rcs_serial_number-field
rcs_type: /NXrcs/rcs_type-field
rdeform_field: /NXdistortion/rdeform_field-field
rdf: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics/rdf-group; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/rdf-group
read_bfield_current: /NXseparator/read_Bfield_current-group; /NXspin_rotator/read_Bfield_current-group
read_bfield_voltage: /NXseparator/read_Bfield_voltage-group; /NXspin_rotator/read_Bfield_voltage-group
read_current: /NXelectrostatic_kicker/read_current-group; /NXmagnetic_kicker/read_current-group; /NXquadrupole_magnet/read_current-group; /NXsolenoid_magnet/read_current-group
read_efield_current: /NXseparator/read_Efield_current-group; /NXspin_rotator/read_Efield_current-group
read_efield_voltage: /NXseparator/read_Efield_voltage-group; /NXspin_rotator/read_Efield_voltage-group
read_voltage: /NXelectrostatic_kicker/read_voltage-group; /NXmagnetic_kicker/read_voltage-group; /NXquadrupole_magnet/read_voltage-group; /NXsolenoid_magnet/read_voltage-group
real: /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/real-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/real-field; /NXimage/image_1d/real-field; /NXimage/image_2d/real-field; /NXimage/image_3d/real-field; /NXimage/stack_1d/real-field; /NXimage/stack_2d/real-field; /NXimage/stack_3d/real-field
real_time: /NXdetector/real_time-field
real_time_controller: /NXspm/ENTRY/INSTRUMENT/real_time_controller-group
realloc: /NXmicrostructure_score_config/ENTRY/numerics/cell_cache/realloc-field
reconstructed_positions: /NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions-field; /NXapm_reconstruction/reconstructed_positions-field
reconstruction: /NXapm/ENTRY/atom_probe/reconstruction-group; /NXapm_compositionspace_config/ENTRY/config/reconstruction-group; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction-group; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction-group; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction-group; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction-group; /NXapm_paraprobe_tool_config/reconstruction-group; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction-group; /NXtomoproc/ENTRY/reconstruction-group
record_final_z: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/record_final_z-field
recover_evaporation_id: /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/recover_evaporation_id-field
recrystallization_front: /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/recrystallization_front-group
rediscretization: /NXmicrostructure_score_config/ENTRY/solitary_unit/rediscretization-field
reduction: /NXiqproc/ENTRY/reduction-group; /NXsqom/ENTRY/reduction-group
ref_attenuator: /NXtransmission/ENTRY/instrument/ref_attenuator-group
ref_phase_n: /NXlockin/ref_phase_N-field
reference: /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/reference-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/reference-field
reference_amplitude: /NXcantilever_spm/cantilever_oscillator/reference_amplitude-field; /NXlockin/reference_amplitude-field
reference_data_link: /NXellipsometry/ENTRY/data_collection/reference_data_link-field; /NXopt_window/ENTRY/window_correction/reference_data_link-field
reference_frame: /NXrotations/reference_frame-field; /NXunit_cell/reference_frame-field
reference_frequency: /NXcantilever_spm/cantilever_oscillator/reference_frequency-field; /NXlockin/reference_frequency-field; /NXstm/ENTRY/reproducibility_indicators/reference_frequency-field; /NXstm/ENTRY/resolution_indicators/reference_frequency-field; /NXsts/ENTRY/reproducibility_indicators/reference_frequency-field
reference_measurement: /NXcontainer/reference_measurement-link
reference_peak: /NXmpes/ENTRY/energy_referencing/reference_peak-field
reference_phase: /NXcantilever_spm/cantilever_oscillator/reference_phase-field; /NXlockin/reference_phase-field
reference_plane: /NXbeam/TRANSFORMATIONS/reference_plane-field
references: /NXdispersive_material/ENTRY/REFERENCES-group
reflectance: /NXbeam_splitter/reflectance-field; /NXlens_opt/reflectance-field; /NXwaveplate/reflectance-field
reflection: /NXcrystal/reflection-field; /NXpolarizer/reflection-field; /NXpolarizer_opt/reflection-field
reflection_id: /NXreflections/reflection_id-field
reflectivity: /NXcrystal/reflectivity-group; /NXguide/reflectivity-group; /NXmirror/reflectivity-group; /NXoptical_spectroscopy/ENTRY/derived_parameters/reflectivity-field
reflectron: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/reflectron-group; /NXapm/ENTRY/measurement/instrument/reflectron-group; /NXinstrument_apm/reflectron-group
refractive_index: /NXdispersion_table/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/refractive_index-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/refractive_index-field
region_origin: /NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size: /NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
registration: /NXmpes/ENTRY/REGISTRATION-group
regularization: /NXcg_alpha_complex/regularization-field
relative_area: /NXfit/peakPEAK/relative_area-field
relative_atomic_concentration: /NXxps/ENTRY/FIT/peakPEAK/relative_atomic_concentration-field
relative_intensity: /NXelectronanalyzer/transmission_function/relative_intensity-field; /NXem_ebsd/indexing/PHASE/relative_intensity-field; /NXmpes/ENTRY/transmission_correction/transmission_function/relative_intensity-field
relative_mobility: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/relative_mobility-field
relative_molecular_mass: /NXcontainer/relative_molecular_mass-field; /NXsample/relative_molecular_mass-field; /NXsample_component/relative_molecular_mass-field
relative_permittivity: /NXpiezoelectric_material/relative_permittivity-field
relative_resolution: /NXelectronanalyzer/energy_resolution/relative_resolution-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/relative_resolution-field; /NXresolution/relative_resolution-field
relative_resolution_errors: /NXresolution/relative_resolution_errors-field
relative_sensitivity_factor: /NXfit/peakPEAK/relative_sensitivity_factor-field
release_date: /NXarchive/ENTRY/release_date-field
removal: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
representation: /NXdispersion_function/representation-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/representation-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/representation-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/representation-field; /NXmicrostructure/crystals/representation-field; /NXmicrostructure/interfaces/representation-field; /NXmicrostructure/quadruple_junctions/representation-field; /NXmicrostructure/triple_junctions/representation-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/representation-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/interface/representation-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/representation-field
reproducibility_indicators: /NXafm/ENTRY/reproducibility_indicators-group; /NXspm/ENTRY/reproducibility_indicators-group; /NXstm/ENTRY/reproducibility_indicators-group; /NXsts/ENTRY/reproducibility_indicators-group
reset_bias: /NXbias_spectroscopy/bias_sweep/linear_sweep/reset_bias-field
residual: /NXfit/data/residual-field; /NXxps/ENTRY/FIT/data/residual-field
resolution: /NXelectronanalyzer/RESOLUTION-group; /NXelectronanalyzer/angular_resolution/resolution-field; /NXelectronanalyzer/energy_resolution/resolution-field; /NXelectronanalyzer/momentum_resolution/resolution-field; /NXelectronanalyzer/spatial_resolution/resolution-field; /NXmicrostructure_odf/configuration/resolution-field; /NXmicrostructure_odf/sampling/resolution-field; /NXmicrostructure_pf/configuration/resolution-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/energy_resolution/resolution-field; /NXmpes/ENTRY/INSTRUMENT/RESOLUTION-group; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/resolution-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/angularN_resolution/resolution-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/resolution-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/resolution-field; /NXresolution/resolution-field
resolution_errors: /NXelectronanalyzer/angular_resolution/resolution_errors-field; /NXelectronanalyzer/energy_resolution/resolution_errors-field; /NXelectronanalyzer/momentum_resolution/resolution_errors-field; /NXelectronanalyzer/spatial_resolution/resolution_errors-field; /NXresolution/resolution_errors-field
resolution_formula_description: /NXresolution/resolution_formula_description-field
resolution_indicators: /NXafm/ENTRY/resolution_indicators-group; /NXspm/ENTRY/resolution_indicators-group; /NXstm/ENTRY/resolution_indicators-group; /NXsts/ENTRY/resolution_indicators-group
response_function: /NXresolution/response_function-group
response_time: /NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
result: /NXapm_compositionspace_results/ENTRY/autophase/result-group; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result-group; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result-group
resultbackground: /NXem_calorimetry/ENTRY/integration/resultBACKGROUND-group
results: /NXapm/ENTRY/atom_probe/reconstruction/results-group; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/results-field; /NXem/ENTRY/SIMULATION/results-group
retardance: /NXwaveplate/retardance-field
retardance_distribution: /NXwaveplate/retardance_distribution-group
revision: /NXarchive/ENTRY/revision-field; /NXentry/revision-field; /NXsubentry/revision-field
revolutions: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/revolutions-field
roi: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/ROI-group; /NXapm_paraprobe_selector_results/ENTRY/roi-group; /NXem/ENTRY/ROI-group; /NXem/ENTRY/ROI/ebsd/indexing/roi-group; /NXem_ebsd/indexing/roi-group; /NXmicrostructure_imm_config/ENTRY/roi-group
roi_cylinder_height: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_height-field
roi_cylinder_radius: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_radius-field
roi_orientation: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_orientation-field
rois_far_from_edge: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge-group
role: /NXarchive/ENTRY/user/role-field; /NXem/ENTRY/USER/role-field; /NXsnsevent/ENTRY/USER/role-field; /NXsnshisto/ENTRY/USER/role-field; /NXuser/role-field
roll: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field; /NXcanSAS/ENTRY/SAMPLE/roll-field
rollett_holm: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm-group
rotating_element: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element-group
rotating_element_type: /NXellipsometry/ENTRY/INSTRUMENT/rotating_element_type-field
rotation: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/rotation-field; /NXem_ebsd/indexing/rotation-group; /NXinstrument_em/stage/rotation-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field; /NXoptical_system_em/rotation-field
rotation_angle: /NXmonopd/ENTRY/SAMPLE/rotation_angle-field; /NXrefscan/ENTRY/data/rotation_angle-link; /NXrefscan/ENTRY/sample/rotation_angle-field; /NXreftof/ENTRY/sample/rotation_angle-field; /NXsample/rotation_angle-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field; /NXsastof/ENTRY/instrument/detector/rotation_angle-field; /NXscan/ENTRY/DATA/rotation_angle-link; /NXscan/ENTRY/SAMPLE/rotation_angle-field; /NXspe/ENTRY/SAMPLE/rotation_angle-field; /NXstxm/ENTRY/SAMPLE/rotation_angle-field; /NXtas/ENTRY/INSTRUMENT/analyser/rotation_angle-field; /NXtas/ENTRY/INSTRUMENT/monochromator/rotation_angle-field; /NXtas/ENTRY/SAMPLE/rotation_angle-field; /NXtomo/ENTRY/data/rotation_angle-link; /NXtomo/ENTRY/sample/rotation_angle-field; /NXtomophase/ENTRY/data/rotation_angle-link; /NXtomophase/ENTRY/sample/rotation_angle-field; /NXxeuler/ENTRY/name/rotation_angle-link; /NXxeuler/ENTRY/sample/rotation_angle-field; /NXxkappa/ENTRY/name/rotation_angle-link; /NXxkappa/ENTRY/sample/rotation_angle-field; /NXxnb/ENTRY/name/rotation_angle-link; /NXxnb/ENTRY/sample/rotation_angle-field; /NXxrot/ENTRY/name/rotation_angle-link; /NXxrot/ENTRY/sample/rotation_angle-field
rotation_angle_step: /NXxrot/ENTRY/sample/rotation_angle_step-field
rotation_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
rotation_convention: /NXapm/ENTRY/consistent_rotations/rotation_convention-field; /NXcoordinate_system_set/rotation_convention-field; /NXem/ENTRY/consistent_rotations/rotation_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_convention-field
rotation_euler: /NXrotations/rotation_euler-field
rotation_handedness: /NXapm/ENTRY/consistent_rotations/rotation_handedness-field; /NXcoordinate_system_set/rotation_handedness-field; /NXem/ENTRY/consistent_rotations/rotation_handedness-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_handedness-field
rotation_quaternion: /NXrotations/rotation_quaternion-field
rotation_speed: /NXdirecttof/ENTRY/INSTRUMENT/disk_chopper/rotation_speed-field; /NXdirecttof/ENTRY/INSTRUMENT/fermi_chopper/rotation_speed-field; /NXdisk_chopper/rotation_speed-field; /NXfermi_chopper/rotation_speed-field; /NXvelocity_selector/rotation_speed-field
roughening_pump: /NXinstrument_apm/roughening_pump-group
run: /NXcanSAS/ENTRY/run-field
run_control: /NXsensor/run_control-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
run_cycle: /NXarchive/ENTRY/run_cycle-field; /NXentry/run_cycle-field; /NXsubentry/run_cycle-field
run_number: /NXapm/ENTRY/run_number-field; /NXsnsevent/ENTRY/run_number-field; /NXsnshisto/ENTRY/run_number-field; /NXtofraw/ENTRY/run_number-field
s: /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/s-field
s_3: /NXcorrector_cs/TABLEAU/s_3-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/s_3-group
s_5: /NXcorrector_cs/TABLEAU/s_5-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU/s_5-group
sacrifice_isotopic_uniqueness: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/sacrifice_isotopic_uniqueness-field; /NXapm_charge_state_analysis/sacrifice_isotopic_uniqueness-field
sample: /NXapm/ENTRY/sample-group; /NXarchive/ENTRY/sample-group; /NXarpes/ENTRY/SAMPLE-group; /NXcanSAS/ENTRY/SAMPLE-group; /NXdispersive_material/ENTRY/sample-group; /NXellipsometry/ENTRY/SAMPLE-group; /NXem/ENTRY/SAMPLE-group; /NXem_calorimetry/ENTRY/sample-group; /NXentry/SAMPLE-group; /NXfluo/ENTRY/SAMPLE-group; /NXiqproc/ENTRY/SAMPLE-group; /NXiv_temp/ENTRY/SAMPLE-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group; /NXlab_sample_mounting/ENTRY/SAMPLE-group; /NXlauetof/ENTRY/sample-group; /NXmicrostructure_score_config/ENTRY/sample-group; /NXmonopd/ENTRY/SAMPLE-group; /NXmpes/ENTRY/SAMPLE-group; /NXmpes_arpes/ENTRY/SAMPLE-group; /NXmx/ENTRY/SAMPLE-group; /NXoptical_spectroscopy/ENTRY/SAMPLE-group; /NXrefscan/ENTRY/sample-group; /NXreftof/ENTRY/sample-group; /NXsas/ENTRY/SAMPLE-group; /NXsastof/ENTRY/sample-group; /NXscan/ENTRY/SAMPLE-group; /NXsensor_scan/ENTRY/SAMPLE-group; /NXsnsevent/ENTRY/sample-group; /NXsnshisto/ENTRY/sample-group; /NXspe/ENTRY/SAMPLE-group; /NXspm/ENTRY/SAMPLE-group; /NXsqom/ENTRY/SAMPLE-group; /NXstxm/ENTRY/SAMPLE-group; /NXsubentry/SAMPLE-group; /NXtas/ENTRY/SAMPLE-group; /NXtofnpd/ENTRY/SAMPLE-group; /NXtofraw/ENTRY/SAMPLE-group; /NXtofsingle/ENTRY/SAMPLE-group; /NXtomo/ENTRY/sample-group; /NXtomophase/ENTRY/instrument/sample-group; /NXtomophase/ENTRY/sample-group; /NXtomoproc/ENTRY/SAMPLE-group; /NXtransmission/ENTRY/SAMPLE-group; /NXxas/ENTRY/SAMPLE-group; /NXxasproc/ENTRY/SAMPLE-group; /NXxbase/ENTRY/sample-group; /NXxeuler/ENTRY/sample-group; /NXxkappa/ENTRY/sample-group; /NXxnb/ENTRY/sample-group; /NXxpcs/ENTRY/sample-group; /NXxps/ENTRY/SAMPLE-group; /NXxrd_pan/ENTRY/SAMPLE-group; /NXxrot/ENTRY/sample-group
sample_1: /NXcxi_ptycho/sample_1-group
sample_attenuator: /NXtransmission/ENTRY/instrument/sample_attenuator-group
sample_azimuth: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth-field
sample_bias_potentiostat: /NXmanipulator/sample_bias_potentiostat-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat-group
sample_bias_voltage: /NXspm/ENTRY/INSTRUMENT/sample_bias_voltage-group; /NXspm/ENTRY/SAMPLE/sample_environment/sample_bias_voltage-group
sample_bias_voltmeter: /NXmanipulator/sample_bias_voltmeter-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter-group
sample_component: /NXsample/SAMPLE_COMPONENT-group; /NXsample/sample_component-field; /NXsample_component_set/SAMPLE_COMPONENT-group
sample_component_set: /NXsample_component_set/SAMPLE_COMPONENT_SET-group
sample_cooler: /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature_env/sample_cooler-group
sample_environment: /NXspm/ENTRY/SAMPLE/sample_environment-group
sample_heater: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/sample_heater-group; /NXmanipulator/sample_heater-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater-group; /NXmpes/ENTRY/SAMPLE/temperature_env/sample_heater-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature_env/sample_heater-group
sample_id: /NXarchive/ENTRY/sample/sample_id-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_id-field; /NXxrd_pan/ENTRY/SAMPLE/sample_id-field
sample_medium: /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT/sample_medium-field
sample_medium_refractive_indices: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_medium_refractive_indices-field
sample_mode: /NXxrd_pan/ENTRY/SAMPLE/sample_mode-field
sample_name: /NXxrd_pan/ENTRY/SAMPLE/sample_name-field
sample_normal_polar_angle_of_tilt: /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt-field
sample_normal_ref_frame: /NXoptical_spectroscopy/ENTRY/sample_normal_ref_frame-group
sample_normal_tilt_azimuth_angle: /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle-field
sample_orientation: /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_orientation-field; /NXsample/sample_orientation-field; /NXsample_component/sample_orientation-field
sample_polar: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar-field
sample_preparation: /NXmpes/ENTRY/SAMPLE/history/sample_preparation-group
sample_reference_frame: /NXcoordinate_system_set/sample_reference_frame-group; /NXem/ENTRY/sample_reference_frame-group; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame-group; /NXmicrostructure_score_results/ENTRY/sample_reference_frame-group
sample_rotation_angle: /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle-field
sample_stage: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage-group
sample_symmetry: /NXrotations/sample_symmetry-field
sample_tilt: /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt-field
sample_x: /NXstxm/ENTRY/DATA/sample_x-field; /NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y: /NXstxm/ENTRY/DATA/sample_y-field; /NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z: /NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction: /NXmonitor/sampled_fraction-field
sampling: /NXmicrostructure_gragles_config/ENTRY/sampling-group; /NXmicrostructure_odf/sampling-group
saturation_value: /NXdetector/saturation_value-field; /NXdetector_channel/saturation_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
save_to_file: /NXmicrostructure_mtex_config/system/save_to_file-field
scalar_field_grad_suffix: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX-group
scalar_field_magn_suffix: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX-group
scale: /NXregion/scale-field
scaling_factor: /NXcalibration/scaling_factor-field; /NXdata/scaling_factor-field
scan_angle_n: /NXscan_control/scan_region/scan_angle_N-field
scan_angle_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_angle_x-field
scan_angle_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_angle_y-field
scan_axis: /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_axis-field
scan_control: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL-group; /NXstm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL-group
scan_control_type: /NXscan_control/scan_control_type-field
scan_controller: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/scan_controller-group; /NXem/ENTRY/measurement/instrument/scan_controller-group
scan_data: /NXbias_spectroscopy/bias_sweep/linear_sweep/SCAN_data-group; /NXscan_control/linear_SCAN/SCAN_data-group; /NXscan_control/mesh_SCAN/SCAN_data-group; /NXscan_control/snake_SCAN/SCAN_data-group; /NXscan_control/spiral_SCAN/SCAN_data-group; /NXscan_control/traj_SCAN/SCAN_data-group
scan_end_bias: /NXbias_spectroscopy/bias_sweep/scan_region/scan_end_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_end_bias-field
scan_end_n: /NXscan_control/scan_region/scan_end_N-field
scan_end_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_end_x-field
scan_end_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_end_y-field
scan_environment: /NXafm/ENTRY/INSTRUMENT/scan_environment-group; /NXspm/ENTRY/INSTRUMENT/scan_environment-group; /NXstm/ENTRY/INSTRUMENT/scan_environment-group
scan_mode: /NXafm/ENTRY/scan_mode-field; /NXspm/ENTRY/scan_mode-field; /NXstm/ENTRY/scan_mode-field; /NXsts/ENTRY/scan_mode-field; /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_mode-field
scan_name: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_name-field; /NXspm/ENTRY/INSTRUMENT/scan_environment/scan_name-field
scan_number: /NXxpcs/ENTRY/scan_number-field
scan_offset_bias: /NXbias_spectroscopy/bias_sweep/scan_region/scan_offset_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_offset_bias-field
scan_offset_n: /NXscan_control/scan_region/scan_offset_N-field
scan_offset_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_offset_x-field
scan_offset_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_offset_y-field
scan_point_positions: /NXem_ebsd/indexing/scan_point_positions-field
scan_points_bias: /NXbias_spectroscopy/bias_sweep/linear_sweep/scan_points_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep/scan_points_bias-field
scan_points_n: /NXscan_control/linear_SCAN/scan_points_N-field; /NXscan_control/mesh_SCAN/scan_points_N-field; /NXscan_control/snake_SCAN/scan_points_N-field; /NXscan_control/spiral_SCAN/scan_points_N-field; /NXscan_control/traj_SCAN/scan_points_N-field
scan_points_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/mesh_SCAN/scan_points_x-field
scan_points_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/mesh_SCAN/scan_points_y-field
scan_range_bias: /NXbias_spectroscopy/bias_sweep/scan_region/scan_range_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_range_bias-field
scan_range_n: /NXscan_control/scan_region/scan_range_N-field
scan_range_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_range_x-field
scan_range_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_range_y-field
scan_region: /NXbias_spectroscopy/bias_sweep/scan_region-group; /NXscan_control/scan_region-group; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region-group; /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region-group
scan_resolution_n: /NXscan_control/scan_resolution_N-field
scan_schema: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/scan_controller/scan_schema-field; /NXscanbox_em/scan_schema-field
scan_speed: /NXscan_control/linear_SCAN/scan_speed-field; /NXscan_control/traj_SCAN/scan_speed-field
scan_speed_n: /NXscan_control/mesh_SCAN/scan_speed_N-field; /NXscan_control/snake_SCAN/scan_speed_N-field; /NXscan_control/spiral_SCAN/scan_speed_N-field
scan_start_bias: /NXbias_spectroscopy/bias_sweep/scan_region/scan_start_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/scan_region/scan_start_bias-field
scan_start_n: /NXscan_control/scan_region/scan_start_N-field
scan_start_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_start_x-field
scan_start_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_region/scan_start_y-field
scan_time: /NXbias_spectroscopy/bias_sweep/linear_sweep/scan_time-field
scan_time_end: /NXscan_control/scan_time_end-field
scan_time_start: /NXscan_control/scan_time_start-field
scan_type: /NXbias_spectroscopy/bias_sweep/scan_type-field; /NXscan_control/scan_type-field; /NXspm/ENTRY/scan_type-field; /NXstm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/scan_type-field
scanbox_em: /NXinstrument_em/SCANBOX_EM-group
scattering_angle: /NXspindispersion/scattering_angle-field
scattering_configuration: /NXraman/ENTRY/INSTRUMENT/scattering_configuration-field
scattering_cross_section: /NXattenuator/scattering_cross_section-field
scattering_energy: /NXspindispersion/scattering_energy-field
scattering_length_density: /NXsample/scattering_length_density-field; /NXsample_component/scattering_length_density-field; /NXsample_component_set/scattering_length_density-field
scattering_vector: /NXcrystal/scattering_vector-field
scheme: /NXcollectioncolumn/scheme-field; /NXenergydispersion/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/scheme-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/scheme-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/scheme-field
sdd: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
sebald_gottstein: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein-group
seblock: /NXspe/ENTRY/SAMPLE/seblock-field
second_order_correction_n: /NXpiezo_config_spm/calibration/second_order_correction_N-field
seed: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/random_number_generator/seed-field; /NXcs_prng/seed-field
segment_columns: /NXcrystal/segment_columns-field
segment_gap: /NXcrystal/segment_gap-field
segment_height: /NXcrystal/segment_height-field
segment_rows: /NXcrystal/segment_rows-field
segment_thickness: /NXcrystal/segment_thickness-field
segment_width: /NXcrystal/segment_width-field
segmentation: /NXapm_compositionspace_config/ENTRY/config/segmentation-group; /NXapm_compositionspace_results/ENTRY/segmentation-group
select: /NXapm_paraprobe_selector_config/ENTRY/select-group
semi_axes_value: /NXcg_ellipsoid/semi_axes_value-field
semi_axes_values: /NXcg_ellipsoid/semi_axes_values-field
semi_convergence_angle: /NXoptical_system_em/semi_convergence_angle-field
sensitivity: /NXcantilever_spm/cantilever_config/CALIBRATION/sensitivity-field
sensitivity_factor: /NXlockin/sensitivity_factor-field
sensor: /NXebeam_column/SENSOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/SENSOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/SENSOR-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/SENSOR-group; /NXem/ENTRY/measurement/instrument/SENSOR-group; /NXem/ENTRY/measurement/instrument/ebeam_column/SENSOR-group; /NXem/ENTRY/measurement/instrument/ibeam_column/SENSOR-group; /NXenvironment/SENSOR-group; /NXibeam_column/SENSOR-group; /NXinstrument/SENSOR-group; /NXinstrument_em/SENSOR-group; /NXmanipulator/SENSOR-group; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
sensor_material: /NXdetector/sensor_material-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_size: /NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
sensor_thickness: /NXdetector/sensor_thickness-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type: /NXfilter/sensor_type-group
sequence_index: /NXapm/ENTRY/atom_probe/hit_finding/sequence_index-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/sequence_index-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/background_quantification/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/peak_identification/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/peak_search/sequence_index-field; /NXapm/ENTRY/atom_probe/ranging/sequence_index-field; /NXapm/ENTRY/atom_probe/raw_data/sequence_index-field; /NXapm/ENTRY/atom_probe/reconstruction/sequence_index-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/sequence_index-field; /NXapm_compositionspace_results/ENTRY/autophase/sequence_index-field; /NXapm_compositionspace_results/ENTRY/clustering/sequence_index-field; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/sequence_index-field; /NXapm_compositionspace_results/ENTRY/segmentation/pca/sequence_index-field; /NXapm_compositionspace_results/ENTRY/voxelization/sequence_index-field; /NXem_calorimetry/ENTRY/background_subtraction/sequence_index-field; /NXem_calorimetry/ENTRY/distortion_correction/sequence_index-field; /NXem_calorimetry/ENTRY/integration/sequence_index-field; /NXem_calorimetry/ENTRY/pattern_center/sequence_index-field; /NXem_calorimetry/ENTRY/synchronization/sequence_index-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field; /NXnote/sequence_index-field; /NXprocess/sequence_index-field
sequence_number: /NXdetector/sequence_number-field; /NXtomophase/ENTRY/instrument/bright_field/sequence_number-field; /NXtomophase/ENTRY/instrument/dark_field/sequence_number-field; /NXtomophase/ENTRY/instrument/sample/sequence_number-field
serial_number: /NXapm/ENTRY/measurement/instrument/fabrication/serial_number-field; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/serial_number-field; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/serial_number-field; /NXapm/ENTRY/measurement/instrument/pulser/SOURCE/fabrication/serial_number-field; /NXapm/ENTRY/measurement/instrument/pulser/fabrication/serial_number-field; /NXdetector/serial_number-field; /NXem/ENTRY/measurement/instrument/DETECTOR/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/BIPRISM/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_ax/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_cs/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ebeam_column/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ibeam_column/MONOCHROMATOR/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ibeam_column/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/nanoprobe/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/scan_controller/fabrication/serial_number-field; /NXem/ENTRY/measurement/instrument/stage/fabrication/serial_number-field; /NXfabrication/serial_number-field
set_bfield_current: /NXseparator/set_Bfield_current-field; /NXspin_rotator/set_Bfield_current-field
set_current: /NXelectrostatic_kicker/set_current-field; /NXmagnetic_kicker/set_current-field; /NXquadrupole_magnet/set_current-field; /NXsolenoid_magnet/set_current-field
set_efield_voltage: /NXseparator/set_Efield_voltage-field; /NXspin_rotator/set_Efield_voltage-field
set_point: /NXpositioner_spm/z_controller/set_point-field
set_voltage: /NXelectrostatic_kicker/set_voltage-field; /NXmagnetic_kicker/set_voltage-field
setpoint: /NXmanipulator/cryostat/PID_CONTROLLER/setpoint-field; /NXmanipulator/sample_bias_potentiostat/PID_CONTROLLER/setpoint-field; /NXmanipulator/sample_heater/PID_CONTROLLER/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID_CONTROLLER/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID_CONTROLLER/setpoint-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID_CONTROLLER/setpoint-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID_CONTROLLER/setpoint-field; /NXpid_controller/setpoint-field
setpoint_log: /NXmanipulator/cryostat/PID_CONTROLLER/setpoint_log-group; /NXmanipulator/sample_bias_potentiostat/PID_CONTROLLER/setpoint_log-group; /NXmanipulator/sample_heater/PID_CONTROLLER/setpoint_log-group
setting: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/APERTURE/setting-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/APERTURE/setting-field
settling_time: /NXbias_spectroscopy/bias_sweep/settling_time-field
sgl: /NXtas/ENTRY/SAMPLE/sgl-field
sgu: /NXtas/ENTRY/SAMPLE/sgu-field
shadowfactor: /NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle: /NXapm/ENTRY/specimen/shank_angle-field; /NXapm_reconstruction/shank_angle-field
shape: /NXaperture/shape-field; /NXattenuator/shape-group; /NXbeam_splitter/SHAPE-group; /NXbeam_splitter/SHAPE/shape-field; /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field; /NXcg_hexahedron/shape-field; /NXcg_polygon/shape-field; /NXcg_primitive/shape-field; /NXcontainer/shape-group; /NXcrystal/shape-group; /NXgeometry/SHAPE-group; /NXgrating/shape-group; /NXmirror/shape-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/entrance_slit/shape-field; /NXpolarizer_opt/SHAPE-group; /NXpolarizer_opt/SHAPE/shape-field; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape-group; /NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field; /NXshape/shape-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shear_modulus: /NXmicrostructure_score_config/ENTRY/material/shear_modulus-field
shermann_function: /NXspindispersion/shermann_function-field
short_name: /NXactuator/short_name-field; /NXenvironment/short_name-field; /NXsensor/short_name-field
short_title: /NXsample/short_title-field
shortest_half_life: /NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state_analysis/shortest_half_life-field; /NXapm_charge_state_analysis/shortest_half_life-field
show_coordinates: /NXmicrostructure_mtex_config/plotting/show_coordinates-field
show_micron_bar: /NXmicrostructure_mtex_config/plotting/show_micron_bar-field
sigma_x: /NXsource/sigma_x-field
sigma_y: /NXsource/sigma_y-field
sign_convention: /NXapm/ENTRY/consistent_rotations/sign_convention-field; /NXcoordinate_system_set/sign_convention-field; /NXem/ENTRY/consistent_rotations/sign_convention-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sign_convention-field
sign_valid: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid-group
signal_amplitude: /NXinstrument_apm/ion_detector/signal_amplitude-field
signal_over_noise: /NXamplifier/signal_over_noise-field
signal_type: /NXcircuit/signal_type-field
signed_distance: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/ROI/signed_distance-field
simulation: /NXapm/ENTRY/simulation-group; /NXem/ENTRY/ROI/ebsd/simulation-group; /NXem/ENTRY/SIMULATION-group; /NXem_ebsd/simulation-group
simulation_control: /NXmicrostructure_gragles_config/ENTRY/simulation_control-group
situation: /NXarchive/ENTRY/sample/situation-field; /NXmpes/ENTRY/SAMPLE/situation-field; /NXmpes_arpes/ENTRY/SAMPLE/situation-field; /NXsample/situation-field
size: /NXaperture/size-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/size-field; /NXbeam_splitter/SHAPE/size-field; /NXbeam_stop/size-field; /NXpolarizer_opt/SHAPE/size-field; /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field; /NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field; /NXshape/size-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
sketch: /NXbeam_splitter/SHAPE/sketch-group; /NXpolarizer_opt/SHAPE/sketch-group
slit: /NXfermi_chopper/slit-field; /NXtransmission/ENTRY/instrument/DETECTOR/slit-group
slit_angle: /NXdisk_chopper/slit_angle-field
slit_edges: /NXdisk_chopper/slit_edges-field
slit_height: /NXdisk_chopper/slit_height-field
slit_length: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits: /NXdisk_chopper/slits-field
slot: /NXdetector/slot-field
slow_axes: /NXelectronanalyzer/slow_axes-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/slow_axes-field
slow_pixel_direction: /NXdetector_module/slow_pixel_direction-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
snake_scan: /NXscan_control/snake_SCAN-group
sns: /NXsnsevent/ENTRY/instrument/SNS-group; /NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id: /NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field; /NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name: /NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field; /NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool: /NXsnsevent/ENTRY/SNSHistoTool-group; /NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name: /NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field; /NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service: /NXsnsevent/ENTRY/instrument/SNStranslation_service-field; /NXsnshisto/ENTRY/instrument/SNStranslation_service-field
soft_limit_max: /NXpositioner/soft_limit_max-field
soft_limit_min: /NXpositioner/soft_limit_min-field
software: /NXspm/ENTRY/INSTRUMENT/software-group
software_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE-group
solid_angle: /NXdetector/solid_angle-field
solitary_unit: /NXmicrostructure_score_config/ENTRY/solitary_unit-group
soller_angle: /NXcollimator/soller_angle-field
source: /NXapm/ENTRY/atom_probe/hit_spatial_filtering/source-group; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/source-group; /NXapm/ENTRY/atom_probe/raw_data/source-group; /NXapm/ENTRY/atom_probe/voltage_and_bowl/source-group; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/SOURCE-group; /NXapm/ENTRY/measurement/instrument/pulser/SOURCE-group; /NXarchive/ENTRY/instrument/SOURCE-group; /NXarpes/ENTRY/INSTRUMENT/SOURCE-group; /NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group; /NXem/ENTRY/ROI/ebsd/indexing/source-group; /NXem/ENTRY/ROI/ebsd/measurement/source-group; /NXem/ENTRY/ROI/ebsd/simulation/source-group; /NXem_ebsd/calibration/source-group; /NXem_ebsd/indexing/source-group; /NXem_ebsd/measurement/source-group; /NXem_ebsd/simulation/source-group; /NXfluo/ENTRY/INSTRUMENT/SOURCE-group; /NXinstrument/SOURCE-group; /NXinstrument_apm/pulser/SOURCE-group; /NXiqproc/ENTRY/instrument/SOURCE-group; /NXmonopd/ENTRY/INSTRUMENT/SOURCE-group; /NXmx/ENTRY/SOURCE-group; /NXrefscan/ENTRY/instrument/SOURCE-group; /NXsas/ENTRY/INSTRUMENT/SOURCE-group; /NXsastof/ENTRY/instrument/source-group; /NXsqom/ENTRY/instrument/SOURCE-group; /NXstxm/ENTRY/INSTRUMENT/SOURCE-group; /NXtas/ENTRY/INSTRUMENT/SOURCE-group; /NXtomo/ENTRY/instrument/SOURCE-group; /NXtomophase/ENTRY/instrument/SOURCE-group; /NXtomoproc/ENTRY/INSTRUMENT/SOURCE-group; /NXtransmission/ENTRY/instrument/SOURCE-group; /NXxas/ENTRY/INSTRUMENT/SOURCE-group; /NXxbase/ENTRY/instrument/source-group; /NXxlaue/ENTRY/instrument/source-group; /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE-group
source_1: /NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x: /NXbending_magnet/source_distance_x-field
source_distance_y: /NXbending_magnet/source_distance_y-field
source_peak_wavelength: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/source_peak_wavelength-field
source_probe: /NXmpes/ENTRY/INSTRUMENT/source_probe-group; /NXxps/ENTRY/INSTRUMENT/source_probe-group
source_pump: /NXmpes/ENTRY/INSTRUMENT/source_pump-group
source_type: /NXmpes/ENTRY/INSTRUMENT/source_TYPE-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE-group
space_group: /NXcrystal/space_group-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/unit_cell/space_group-field; /NXsample/space_group-field; /NXsample_component/space_group-field; /NXunit_cell/space_group-field
spatial0: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/spatial0-field; /NXmpes/ENTRY/data/spatial0-field
spatial1: /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/spatial1-field; /NXmpes/ENTRY/data/spatial1-field
spatial_acceptance: /NXcollectioncolumn/spatial_acceptance-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/spatial_acceptance-field
spatial_distribution: /NXmicrostructure_score_config/ENTRY/nucleation/spatial_distribution-field
spatial_filter: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter-group; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter-group; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter-group; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter-group; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter-group; /NXapm_paraprobe_tool_config/SPATIAL_FILTER-group
spatial_resolution: /NXelectronanalyzer/spatial_resolution-group
spatial_statistics: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS-group; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS-group
spatiotemporal: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL-group
special_enthalpy: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_enthalpy-field
special_pre_factor: /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_pre_factor-field
specific_polarization_filter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/specific_polarization_filter_type-field
specimen: /NXapm/ENTRY/specimen-group; /NXapm_compositionspace_results/ENTRY/specimen-group
specimen_symmetry_point_group: /NXmicrostructure_odf/configuration/specimen_symmetry_point_group-field; /NXmicrostructure_pf/configuration/specimen_symmetry_point_group-field
spectral_range: /NXfiber/spectral_range-field
spectral_resolution: /NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field; /NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
spectralfilter_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE-group
spectrometer: /NXtransmission/ENTRY/instrument/spectrometer-group
spectrum: /NXbending_magnet/spectrum-group; /NXem/ENTRY/SIMULATION/results/SPECTRUM-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM-group; /NXem_eels/indexing/SPECTRUM-group; /NXevent_data_em/SPECTRUM-group; /NXinsertion_device/spectrum-group; /NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
spectrum_0d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d-group; /NXspectrum/spectrum_0d-group
spectrum_1d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d-group; /NXspectrum/spectrum_1d-group
spectrum_2d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d-group; /NXspectrum/spectrum_2d-group
spectrum_3d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d-group; /NXspectrum/spectrum_3d-group
spindispersion: /NXelectronanalyzer/SPINDISPERSION-group
spiral_radius_n: /NXscan_control/spiral_SCAN/spiral_radius_N-field
spiral_scan: /NXscan_control/spiral_SCAN-group
splitting_ratio: /NXbeam_splitter/splitting_ratio-field
spot_position: /NXinstrument_apm/pulser/SOURCE/BEAM/spot_position-field
spring_constant: /NXcantilever_spm/cantilever_config/CALIBRATION/spring_constant-field
spwidth: /NXvelocity_selector/spwidth-field
stack_0d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d-group; /NXspectrum/stack_0d-group
stack_1d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d-group; /NXimage/stack_1d-group
stack_2d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d-group; /NXimage/stack_2d-group; /NXspectrum/stack_2d-group
stack_3d: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d-group; /NXimage/stack_3d-group; /NXspectrum/stack_3d-group
stage: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/stage-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage-group; /NXem/ENTRY/measurement/instrument/stage-group; /NXinstrument_apm/stage-group; /NXinstrument_em/stage-group
stage_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type-field
standard: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/standard-field
standing_voltage: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/standing_voltage-field; /NXinstrument_apm/pulser/standing_voltage-field
start: /NXregion/start-field; /NXxrd_pan/ENTRY/experiment_config/omega/start-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/start-field
start_time: /NXactivity/start_time-field; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/start_time-field; /NXapm/ENTRY/start_time-field; /NXapm_compositionspace_results/ENTRY/profiling/start_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_tool_common/profiling/start_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/start_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/start_time-field; /NXarchive/ENTRY/start_time-field; /NXarpes/ENTRY/start_time-field; /NXcs_profiling/start_time-field; /NXcs_profiling_event/start_time-field; /NXcxi_ptycho/entry_1/start_time-field; /NXdetector/start_time-field; /NXdirecttof/ENTRY/start_time-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/start_time-field; /NXem/ENTRY/start_time-field; /NXem_calorimetry/ENTRY/profiling/start_time-field; /NXem_calorimetry/ENTRY/synchronization/start_time-field; /NXentry/start_time-field; /NXevent_data_apm/start_time-field; /NXevent_data_em/start_time-field; /NXfluo/ENTRY/start_time-field; /NXindirecttof/ENTRY/start_time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field; /NXlab_sample_mounting/ENTRY/start_time-field; /NXmicrostructure_gragles_config/ENTRY/start_time-field; /NXmicrostructure_gragles_results/ENTRY/start_time-field; /NXmicrostructure_imm_results/ENTRY/start_time-field; /NXmicrostructure_kanapy_results/ENTRY/start_time-field; /NXmicrostructure_score_config/ENTRY/start_time-field; /NXmicrostructure_score_results/ENTRY/start_time-field; /NXmonitor/start_time-field; /NXmonopd/ENTRY/start_time-field; /NXmpes/ENTRY/SAMPLE/history/sample_preparation/start_time-field; /NXmpes/ENTRY/start_time-field; /NXmx/ENTRY/start_time-field; /NXoptical_spectroscopy/ENTRY/start_time-field; /NXrefscan/ENTRY/start_time-field; /NXreftof/ENTRY/start_time-field; /NXsas/ENTRY/start_time-field; /NXsastof/ENTRY/start_time-field; /NXscan/ENTRY/start_time-field; /NXsensor_scan/ENTRY/start_time-field; /NXsnsevent/ENTRY/start_time-field; /NXsnshisto/ENTRY/start_time-field; /NXstxm/ENTRY/start_time-field; /NXsubentry/start_time-field; /NXtas/ENTRY/start_time-field; /NXtofnpd/ENTRY/start_time-field; /NXtofraw/ENTRY/start_time-field; /NXtofsingle/ENTRY/start_time-field; /NXtomo/ENTRY/start_time-field; /NXtomophase/ENTRY/start_time-field; /NXtransmission/ENTRY/start_time-field; /NXxas/ENTRY/start_time-field; /NXxbase/ENTRY/start_time-field; /NXxpcs/ENTRY/start_time-field
state: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/state-field
static_q_list: /NXxpcs/ENTRY/instrument/masks/static_q_list-field
static_roi_map: /NXxpcs/ENTRY/instrument/masks/static_roi_map-field
statistics: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/statistics-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/statistics-group; /NXregion/statistics-group; /NXsimilarity_grouping/statistics-group
status: /NXapm/ENTRY/measurement/status-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/status-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/status-field; /NXapm_paraprobe_distancer_config/ENTRY/common/status-field; /NXapm_paraprobe_distancer_results/ENTRY/common/status-field; /NXapm_paraprobe_intersector_config/ENTRY/common/status-field; /NXapm_paraprobe_intersector_results/ENTRY/common/status-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/status-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/status-field; /NXapm_paraprobe_ranger_config/ENTRY/common/status-field; /NXapm_paraprobe_ranger_results/ENTRY/common/status-field; /NXapm_paraprobe_selector_config/ENTRY/common/status-field; /NXapm_paraprobe_selector_results/ENTRY/common/status-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/status-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/status-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/status-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/status-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/status-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/status-field; /NXapm_paraprobe_tool_common/status-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/status-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/status-field; /NXattenuator/status-field; /NXbeam_stop/status-field; /NXem_ebsd/indexing/status-field; /NXfilter/status-field
status_indicators: /NXcircuit/status_indicators-field
step: /NXxrd_pan/ENTRY/experiment_config/omega/step-field; /NXxrd_pan/ENTRY/experiment_config/two_theta/step-field
step_size: /NXscan_control/traj_SCAN/step_size-field
step_size_bias: /NXbias_spectroscopy/bias_sweep/linear_sweep/step_size_bias-field; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/bias_sweep/linear_sweep/step_size_bias-field
step_size_n: /NXscan_control/linear_SCAN/step_size_N-field; /NXscan_control/mesh_SCAN/step_size_N-field; /NXscan_control/snake_SCAN/step_size_N-field; /NXscan_control/spiral_SCAN/step_size_N-field
step_size_x: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/mesh_SCAN/step_size_x-field
step_size_y: /NXspm/ENTRY/INSTRUMENT/scan_environment/SCAN_CONTROL/mesh_SCAN/step_size_y-field
stepping_n: /NXscan_control/linear_SCAN/stepping_N-field; /NXscan_control/mesh_SCAN/stepping_N-field; /NXscan_control/snake_SCAN/stepping_N-field; /NXscan_control/spiral_SCAN/stepping_N-field; /NXscan_control/traj_SCAN/stepping_N-field
stepsize: /NXmicrostructure_score_config/ENTRY/deformation/ebsd/stepsize-field
stm_head_temp: /NXstm/ENTRY/resolution_indicators/stm_head_temp-field
stop_on_symmetry_mismatch: /NXmicrostructure_mtex_config/miscellaneous/stop_on_symmetry_mismatch-field
stop_time: /NXdetector/stop_time-field
storage: /NXcs_computer/storage-group
stored_elastic_energy: /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy-group
stored_energy: /NXmicrostructure_score_config/ENTRY/deformation/ensemble/stored_energy-field
stored_energy_recovery: /NXmicrostructure_score_config/ENTRY/stored_energy_recovery-group
strain: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain/strain-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain-group
strength: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/electrical_field/strength-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/magnetic_field/strength-field
stress: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress-group; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress/stress-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress-group
stress_field: /NXarchive/ENTRY/sample/stress_field-field; /NXsample/stress_field-field
stride: /NXregion/stride-field
structure: /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure-group; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure-group
stxm_scan_type: /NXstxm/ENTRY/DATA/stxm_scan_type-field
subentry: /NXentry/SUBENTRY-group
subsampling_filter: /NXapm_paraprobe_tool_config/SUBSAMPLING_FILTER-group
substrate: /NXbeam_splitter/substrate-group; /NXlens_opt/substrate-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/substrate-field; /NXpolarizer_opt/substrate-group; /NXwaveplate/substrate-group
substrate_density: /NXgrating/substrate_density-field; /NXmirror/substrate_density-field
substrate_material: /NXbeam_splitter/substrate/substrate_material-field; /NXfilter/substrate_material-field; /NXgrating/substrate_material-field; /NXguide/substrate_material-field; /NXlens_opt/substrate/substrate_material-field; /NXmirror/substrate_material-field; /NXpolarizer_opt/substrate/substrate_material-field; /NXwaveplate/substrate/substrate_material-field
substrate_roughness: /NXfilter/substrate_roughness-field; /NXgrating/substrate_roughness-field; /NXguide/substrate_roughness-field; /NXmirror/substrate_roughness-field
substrate_thickness: /NXbeam_splitter/substrate/substrate_thickness-field; /NXfilter/substrate_thickness-field; /NXgrating/substrate_thickness-field; /NXguide/substrate_thickness-field; /NXlens_opt/substrate/substrate_thickness-field; /NXmirror/substrate_thickness-field; /NXpolarizer_opt/substrate/substrate_thickness-field; /NXwaveplate/substrate/substrate_thickness-field
summary: /NXem/ENTRY/ROI/eds/indexing/summary-group; /NXem_eds/indexing/summary-group
summary_statistics: /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics-group; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics-group
support_membrane_material: /NXfresnel_zone_plate/support_membrane_material-field
support_membrane_thickness: /NXfresnel_zone_plate/support_membrane_thickness-field
surface: /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface-group; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface-group; /NXapm_paraprobe_tool_config/surface-group; /NXguide/reflectivity/surface-field
surface_distance: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance-group; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance-group; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance-group; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance-group; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance-group; /NXapm_paraprobe_tool_config/surface_distance-group
surface_energy: /NXmicrostructure/interfaces/surface_energy-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/surface_energy-field
surface_meshing: /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing-group
surface_reconstruction: /NXcg_grid/surface_reconstruction-field
surface_resistivity: /NXpiezoelectric_material/surface_resistivity-field
surface_type: /NXquadric/surface_type-field
sweep_number: /NXbias_spectroscopy/bias_sweep/sweep_number-field
switch_off_delay: /NXpositioner_spm/z_controller/switch_off_delay-field; /NXsts/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM/z_controller/switch_off_delay-field
symmetric: /NXxraylens/symmetric-field
symmetry: /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/symmetry-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/symmetry-field; /NXcg_grid/symmetry-field; /NXdistortion/symmetry-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/symmetry-field; /NXmicrostructure_score_results/ENTRY/discretization/grid/symmetry-field
synchronization: /NXem_calorimetry/ENTRY/synchronization-group
system: /NXmicrostructure_gragles_config/ENTRY/sampling/system-field; /NXmicrostructure_mtex_config/system-group
t: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table: /NXvelocity_selector/table-field
tableau: /NXcorrector_cs/TABLEAU-group; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_cs/TABLEAU-group
taper: /NXinsertion_device/taper-field
target: /NXspindispersion/target-field
target_amplitude: /NXcantilever_spm/cantilever_oscillator/target_amplitude-field
target_dcom_radius: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_dcom_radius-field
target_detection_rate: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/control/target_detection_rate-field; /NXinstrument_apm/control/target_detection_rate-field
target_edge_length: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_edge_length-field
target_material: /NXsource/target_material-field
target_preparation: /NXspindispersion/target_preparation-field
target_preparation_date: /NXspindispersion/target_preparation_date-field
target_smoothing_step: /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_smoothing_step-field
target_value: /NXpositioner/target_value-field
targets: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/targets-field
tdev: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
telephone_number: /NXem/ENTRY/USER/telephone_number-field; /NXsensor_scan/ENTRY/USER/telephone_number-field; /NXtransmission/ENTRY/operator/telephone_number-field; /NXuser/telephone_number-field
temp_control_type: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE-group
temperature: /NXarchive/ENTRY/sample/temperature-field; /NXarpes/ENTRY/SAMPLE/temperature-field; /NXcanSAS/ENTRY/SAMPLE/temperature-field; /NXcrystal/temperature-field; /NXfilter/temperature-field; /NXiv_temp/ENTRY/DATA/temperature-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/temperature-field; /NXmicrostructure_score_config/ENTRY/time_temperature/temperature-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/temperature-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/temperature-field; /NXmoderator/temperature-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/raw_data/temperature-field; /NXmpes/ENTRY/data/temperature-field; /NXmx/ENTRY/SAMPLE/temperature-field; /NXsample/temperature-field; /NXsnsevent/ENTRY/instrument/moderator/temperature-field; /NXsnshisto/ENTRY/instrument/moderator/temperature-field; /NXspe/ENTRY/SAMPLE/temperature-field; /NXspm/ENTRY/INSTRUMENT/TEMPERATURE-group; /NXspm/ENTRY/INSTRUMENT/TEMPERATURE/temperature-field; /NXxbase/ENTRY/sample/temperature-field; /NXxpcs/ENTRY/sample/temperature-field
temperature_calibration: /NXspm/ENTRY/INSTRUMENT/TEMPERATURE/temperature_calibration-group
temperature_coefficient: /NXcrystal/temperature_coefficient-field
temperature_controller: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
temperature_data: /NXspm/ENTRY/INSTRUMENT/TEMPERATURE/TEMPERATURE_DATA-group
temperature_env: /NXmpes/ENTRY/SAMPLE/temperature_env-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature_env-group; /NXsample/temperature_env-group
temperature_log: /NXcrystal/temperature_log-group; /NXfilter/temperature_log-group; /NXmoderator/temperature_log-group; /NXsample/temperature_log-group
temperature_nominal: /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature_env/temperature_nominal-field
temperature_range: /NXcircuit/temperature_range-field; /NXpiezoelectric_material/temperature_range-field
temperature_sensor: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/stage/temperature_sensor-group; /NXinstrument_apm/stage/temperature_sensor-group; /NXmanipulator/temperature_sensor-group; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor-group; /NXmpes/ENTRY/SAMPLE/temperature_env/temperature_sensor-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor-group; /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature_env/temperature_sensor-group
temperature_set: /NXxpcs/ENTRY/sample/temperature_set-field
tensor: /NXmicrostructure_mtex_config/path/tensor-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient/tensor-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain/tensor-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress/tensor-field
term: /NXcalibration/fit_formula_inputs/TERM-field; /NXcanSAS/ENTRY/PROCESS/term-field; /NXfit_function/fit_parameters/TERM-field; /NXparameters/TERM-field
tessellate: /NXapm_paraprobe_tessellator_config/ENTRY/tessellate-group
tessellation: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation-group
tetrahedra: /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra-group; /NXcg_tetrahedron/tetrahedra-group
tetrahedralization: /NXcg_alpha_complex/TETRAHEDRALIZATION-group
tetrahedron: /NXcg_tetrahedron/TETRAHEDRON-group
tetrahedron_half_edge: /NXcg_tetrahedron/TETRAHEDRON_HALF_EDGE-group
text: /NXdispersive_material/ENTRY/REFERENCES/text-field
text_interpreter: /NXmicrostructure_mtex_config/miscellaneous/text_interpreter-field
theta: /NXmicrostructure_imm_config/ENTRY/component_analysis/theta-field; /NXmicrostructure_odf/kth_extrema/theta-field; /NXmicrostructure_score_config/ENTRY/component_analysis/theta-field
thickness: /NXattenuator/thickness-field; /NXcanSAS/ENTRY/SAMPLE/thickness-field; /NXcrystal/thickness-field; /NXem/ENTRY/SAMPLE/thickness-field; /NXfilter/thickness-field; /NXflipper/thickness-field; /NXopt_window/ENTRY/thickness-field; /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness-field; /NXsample/thickness-field
thickness_determination: /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness_determination-field
thickness_reduction: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
threshold_distance: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/threshold_distance-field
threshold_energy: /NXdetector/threshold_energy-field; /NXdetector_channel/threshold_energy-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
threshold_proximity: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/threshold_proximity-field
thumbnail: /NXentry/thumbnail-group; /NXsubentry/thumbnail-group
tilt: /NXxnb/ENTRY/name/tilt-link
tilt1: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/tilt1-field; /NXinstrument_em/stage/tilt1-field
tilt2: /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/stage/tilt2-field; /NXinstrument_em/stage/tilt2-field
tilt_angle: /NXcorrector_cs/TABLEAU/tilt_angle-field; /NXxnb/ENTRY/instrument/detector/tilt_angle-field
tilt_correction: /NXoptical_system_em/tilt_correction-field
tilt_n: /NXpiezo_config_spm/calibration/tilt_N-field
time: /NXcg_point/time-field; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/time-field; /NXem_ebsd/measurement/time-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field; /NXlog/time-field; /NXmicrostructure/time-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/time-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/time-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution/time-field; /NXmicrostructure_score_config/ENTRY/time_temperature/time-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/time-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/time-field; /NXsnsevent/ENTRY/DASlogs/LOG/time-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field; /NXsnshisto/ENTRY/DASlogs/LOG/time-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_control: /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time_control-field
time_of_flight: /NXdetector/time_of_flight-field; /NXlauetof/ENTRY/control/time_of_flight-field; /NXlauetof/ENTRY/instrument/detector/time_of_flight-field; /NXlauetof/ENTRY/name/time_of_flight-link; /NXmonitor/time_of_flight-field; /NXreftof/ENTRY/control/time_of_flight-field; /NXreftof/ENTRY/data/time_of_flight-link; /NXreftof/ENTRY/instrument/detector/time_of_flight-field; /NXsastof/ENTRY/control/time_of_flight-field; /NXsastof/ENTRY/data/time_of_flight-link; /NXsastof/ENTRY/instrument/detector/time_of_flight-field; /NXsnsevent/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/DATA/time_of_flight-link; /NXsnshisto/ENTRY/MONITOR/time_of_flight-field; /NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field; /NXtofnpd/ENTRY/INSTRUMENT/detector/time_of_flight-field; /NXtofnpd/ENTRY/MONITOR/time_of_flight-field; /NXtofnpd/ENTRY/data/time_of_flight-link; /NXtofraw/ENTRY/MONITOR/time_of_flight-field; /NXtofraw/ENTRY/data/time_of_flight-link; /NXtofraw/ENTRY/instrument/detector/time_of_flight-field; /NXtofsingle/ENTRY/INSTRUMENT/detector/time_of_flight-field; /NXtofsingle/ENTRY/MONITOR/time_of_flight-field; /NXtofsingle/ENTRY/data/time_of_flight-link
time_offset: /NXcg_point/time_offset-field
time_per_channel: /NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points: /NXtransmission/ENTRY/instrument/time_points-field
time_slope: /NXmicrostructure_gragles_config/ENTRY/numerics/time_slope-field
time_temperature: /NXmicrostructure_score_config/ENTRY/time_temperature-group
time_zone: /NXmx/ENTRY/INSTRUMENT/time_zone-field
timestamp: /NXcg_point/timestamp-field
timing: /NXelectrostatic_kicker/timing-field; /NXmagnetic_kicker/timing-field
tip_lift: /NXpositioner_spm/z_controller/tip_lift-field; /NXsts/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM/z_controller/tip_lift-field
tip_radius: /NXapm_reconstruction/tip_radius-field
tip_radius_zero: /NXapm_reconstruction/tip_radius_zero-field
tip_temp: /NXspm/ENTRY/INSTRUMENT/scan_environment/tip_temp-field; /NXsts/ENTRY/resolution_indicators/tip_temp-field
tip_temp_sensor: /NXafm/ENTRY/INSTRUMENT/scan_environment/tip_temp_sensor-group; /NXafm/ENTRY/INSTRUMENT/tip_temp_sensor-group; /NXstm/ENTRY/INSTRUMENT/scan_environment/tip_temp_sensor-group; /NXstm/ENTRY/INSTRUMENT/tip_temp_sensor-group
title: /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/title-field; /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/title-field; /NXapm_compositionspace_results/ENTRY/autophase/result/title-field; /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/title-field; /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/title-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/title-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/title-field; /NXarchive/ENTRY/title-field; /NXarpes/ENTRY/title-field; /NXcanSAS/ENTRY/title-field; /NXcxi_ptycho/entry_1/title-field; /NXdata/title-field; /NXdirecttof/ENTRY/title-field; /NXellipsometry/ENTRY/title-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/legend/title-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/IPF/map/title-field; /NXem/ENTRY/ROI/ebsd/indexing/roi/title-field; /NXem/ENTRY/ROI/eds/indexing/IMAGE/image_2d/title-field; /NXem/ENTRY/ROI/eds/indexing/summary/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_1d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_2d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/image_3d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_1d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_2d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/stack_3d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_0d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_1d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_2d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/spectrum_3d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_0d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_1d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_2d/title-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/stack_3d/title-field; /NXem_calorimetry/ENTRY/integration/resultBACKGROUND/title-field; /NXem_ebsd/indexing/roi/title-field; /NXentry/title-field; /NXfluo/ENTRY/title-field; /NXindirecttof/ENTRY/title-field; /NXiqproc/ENTRY/title-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/title-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/title-field; /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius_evolution/title-field; /NXmicrostructure_score_config/ENTRY/time_temperature/title-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/title-field; /NXmonopd/ENTRY/title-field; /NXmpes/ENTRY/title-field; /NXmx/ENTRY/title-field; /NXoptical_spectroscopy/ENTRY/title-field; /NXraman/ENTRY/title-field; /NXrefscan/ENTRY/title-field; /NXreftof/ENTRY/title-field; /NXsas/ENTRY/title-field; /NXsastof/ENTRY/title-field; /NXscan/ENTRY/title-field; /NXsnsevent/ENTRY/title-field; /NXsnshisto/ENTRY/title-field; /NXsource/bunch_pattern/title-field; /NXsqom/ENTRY/title-field; /NXstxm/ENTRY/title-field; /NXsubentry/title-field; /NXtas/ENTRY/title-field; /NXtofnpd/ENTRY/title-field; /NXtofraw/ENTRY/title-field; /NXtofsingle/ENTRY/title-field; /NXtomo/ENTRY/title-field; /NXtomophase/ENTRY/title-field; /NXtomoproc/ENTRY/title-field; /NXxas/ENTRY/title-field; /NXxasproc/ENTRY/title-field; /NXxbase/ENTRY/title-field
tof_distance: /NXenergydispersion/tof_distance-field
tof_zero_estimate: /NXapm/ENTRY/atom_probe/voltage_and_bowl/tof_zero_estimate-field
tolerance: /NXpositioner/tolerance-field
top_dead_center: /NXdisk_chopper/top_dead_center-field
top_up: /NXsource/top_up-field
total: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/composition/total-field; /NXchemical_composition/total-field; /NXsimilarity_grouping/statistics/total-field
total_area: /NXfit/peakPEAK/total_area-field; /NXpeak/total_area-field; /NXxps/ENTRY/FIT/peakPEAK/total_area-field
total_counts: /NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnsevent/ENTRY/total_counts-field; /NXsnshisto/ENTRY/DATA/total_counts-link; /NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field; /NXsnshisto/ENTRY/total_counts-field
total_elapsed_time: /NXapm_compositionspace_results/ENTRY/profiling/total_elapsed_time-field; /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_selector_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_selector_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_tool_common/profiling/total_elapsed_time-field; /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/total_elapsed_time-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/total_elapsed_time-field; /NXcs_profiling/total_elapsed_time-field; /NXem_calorimetry/ENTRY/profiling/total_elapsed_time-field
total_event_golden: /NXapm/ENTRY/atom_probe/hit_finding/total_event_golden-field
total_event_incomplete: /NXapm/ENTRY/atom_probe/hit_finding/total_event_incomplete-field
total_event_multiple: /NXapm/ENTRY/atom_probe/hit_finding/total_event_multiple-field
total_event_partial: /NXapm/ENTRY/atom_probe/hit_finding/total_event_partial-field
total_event_record: /NXapm/ENTRY/atom_probe/hit_finding/total_event_record-field
total_flux: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
total_flux_integrated: /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
total_spectroscopy_time: /NXbias_spectroscopy/bias_sweep/total_spectroscopy_time-field
total_surface_area: /NXcg_cylinder/total_surface_area-field
total_uncounted_counts: /NXsnsevent/ENTRY/total_uncounted_counts-field; /NXsnshisto/ENTRY/total_uncounted_counts-field
traj_scan: /NXscan_control/traj_SCAN-group
trajectory_points: /NXscan_control/traj_SCAN/trajectory_points-field
transcode: /NXapm_paraprobe_transcoder_config/ENTRY/transcode-group
transfer_matrix: /NXbeam_transfer_matrix_table/TRANSFER_MATRIX-field
transfer_rate: /NXfiber/transfer_rate-field
transformations: /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM/TRANSFORMATIONS-group; /NXbeam/TRANSFORMATIONS-group; /NXcomponent/TRANSFORMATIONS-group; /NXcoordinate_system/TRANSFORMATIONS-group; /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group; /NXcxi_ptycho/sample_1/transformations-group; /NXenvironment/TRANSFORMATIONS-group; /NXgrating/TRANSFORMATIONS-group; /NXinstrument_apm/pulser/SOURCE/TRANSFORMATIONS-group; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations-group; /NXmpes_arpes/ENTRY/SAMPLE/transformations-group; /NXmpes_arpes/ENTRY/arpes_geometry/TRANSFORMATIONS-group; /NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group; /NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/transformations-group; /NXoptical_spectroscopy/ENTRY/beam_ref_frame/TRANSFORMATIONS-group; /NXoptical_spectroscopy/ENTRY/sample_normal_ref_frame/TRANSFORMATIONS-group; /NXregistration/TRANSFORMATIONS-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transformations-group; /NXxps/ENTRY/INSTRUMENT/beam_probe/transformations-group; /NXxps/ENTRY/SAMPLE/transformations-group
transitions: /NXmpes/ENTRY/transitions-field; /NXxps/ENTRY/transitions-field
translation: /NXcxi_ptycho/data_1/translation-link; /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field; /NXcxi_ptycho/sample_1/geometry_1/translation-link; /NXgeometry/TRANSLATION-group; /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group; /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission: /NXbeam_splitter/transmission-field; /NXcanSAS/ENTRY/SAMPLE/transmission-field; /NXcapillary/transmission-group; /NXcrystal/transmission-group; /NXfilter/transmission-group; /NXlens_opt/transmission-field; /NXpolarizer_opt/transmission-field; /NXsample/transmission-group; /NXsample_component/transmission-group
transmission_correction: /NXmpes/ENTRY/transmission_correction-group; /NXxps/ENTRY/transmission_correction-group
transmission_function: /NXelectronanalyzer/transmission_function-group; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/transmission_function-group; /NXmpes/ENTRY/transmission_correction/transmission_function-group; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/transmission_function-group
transmission_spectrum: /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmittance: /NXoptical_spectroscopy/ENTRY/derived_parameters/transmittance-field
transmitting_material: /NXcollimator/transmitting_material-field; /NXfermi_chopper/transmitting_material-field
triangle: /NXcg_triangle/TRIANGLE-group
triangle_set: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set-group
triangle_soup: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup-group; /NXcg_alpha_complex/TRIANGLE_SOUP-group
triangles: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles-group; /NXcg_triangle/triangles-group
trigger_dead_time: /NXdetector/trigger_dead_time-field
trigger_delay_time: /NXdetector/trigger_delay_time-field
trigger_delay_time_set: /NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time: /NXdetector/trigger_internal_delay_time-field
triple_junctions: /NXmicrostructure/triple_junctions-group
triple_line_mobility: /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility-group
trunc_species: /NXapm_compositionspace_config/ENTRY/config/autophase/trunc_species-field
turbomolecular_pump: /NXinstrument_apm/turbomolecular_pump-group
twist: /NXvelocity_selector/twist-field
two_theta: /NXxrd_pan/ENTRY/experiment_config/two_theta-group; /NXxrd_pan/ENTRY/experiment_result/two_theta-field
two_time_corr_func: /NXxpcs/ENTRY/twotime/two_time_corr_func-field
twotheta: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/twotheta-field
twotime: /NXxpcs/ENTRY/twotime-group
type: /NXactuator/type-field; /NXapm/ENTRY/COORDINATE_SYSTEM/type-field; /NXapm/ENTRY/NOTE/type-field; /NXapm/ENTRY/atom_probe/hit_finding/config/type-field; /NXapm/ENTRY/atom_probe/hit_spatial_filtering/source/type-field; /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/source/type-field; /NXapm/ENTRY/atom_probe/ranging/definitions/type-field; /NXapm/ENTRY/atom_probe/raw_data/source/type-field; /NXapm/ENTRY/atom_probe/reconstruction/config/type-field; /NXapm/ENTRY/atom_probe/reconstruction/results/type-field; /NXapm/ENTRY/atom_probe/voltage_and_bowl/source/type-field; /NXapm/ENTRY/measurement/instrument/type-field; /NXapm_compositionspace_config/ENTRY/config/ranging/type-field; /NXapm_compositionspace_config/ENTRY/config/reconstruction/type-field; /NXapm_compositionspace_results/ENTRY/config/type-field; /NXapm_compositionspace_results/ENTRY/specimen/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/ranging/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/reconstruction/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/surface_distance/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/type-field; /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/type-field; /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/config/type-field; /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/type-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/type-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/type-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/current_set/OBJECT/type-field; /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION/next_set/OBJECT/type-field; /NXapm_paraprobe_intersector_results/ENTRY/common/config/type-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/type-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/type-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/config/type-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/type-field; /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/type-field; /NXapm_paraprobe_ranger_results/ENTRY/common/config/type-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_selector_config/ENTRY/select/ranging/type-field; /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/type-field; /NXapm_paraprobe_selector_results/ENTRY/common/config/type-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/feature_distance/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/random_number_generator/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/ranging/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/reconstruction/type-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/surface_distance/type-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/config/type-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/type-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/config/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/type-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/type-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/config/type-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/type-field; /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/config/type-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/type-field; /NXarchive/ENTRY/instrument/SOURCE/type-field; /NXarchive/ENTRY/sample/type-field; /NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field; /NXatom/type-field; /NXattenuator/type-field; /NXbeam_splitter/type-field; /NXcapillary/type-field; /NXcg_alpha_complex/type-field; /NXcollimator/type-field; /NXcoordinate_system/type-field; /NXcrystal/type-field; /NXcs_computer/memory/CIRCUIT/type-field; /NXcs_computer/processing/CIRCUIT/type-field; /NXcs_computer/storage/CIRCUIT/type-field; /NXcs_prng/type-field; /NXcxi_ptycho/entry_1/instrument_1/source_1/type-field; /NXdeflector/type-field; /NXdetector/type-field; /NXdisk_chopper/type-field; /NXebeam_column/MONOCHROMATOR/type-field; /NXebeam_column/PHASEPLATE/type-field; /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/type-field; /NXem/ENTRY/COORDINATE_SYSTEM/type-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/type-field; /NXem/ENTRY/NOTE/type-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/type-field; /NXem/ENTRY/ROI/ebsd/indexing/source/type-field; /NXem/ENTRY/ROI/ebsd/measurement/source/type-field; /NXem/ENTRY/ROI/ebsd/simulation/source/type-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/IMAGE/PROCESS/input/type-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/SPECTRUM/PROCESS/input/type-field; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR/type-field; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE/type-field; /NXem/ENTRY/measurement/instrument/type-field; /NXem/ENTRY/processing_reference_frame/type-field; /NXem/ENTRY/sample_reference_frame/type-field; /NXem_calorimetry/ENTRY/sample/type-field; /NXenvironment/type-field; /NXevent_data_em/type-field; /NXfermi_chopper/type-field; /NXfiber/type-field; /NXflipper/type-field; /NXfluo/ENTRY/INSTRUMENT/SOURCE/type-field; /NXinsertion_device/type-field; /NXinstrument_apm/type-field; /NXinstrument_em/type-field; /NXiqproc/ENTRY/instrument/SOURCE/type-field; /NXlens_em/type-field; /NXlens_opt/type-field; /NXmanipulator/type-field; /NXmicrostructure_gragles_config/ENTRY/discretization/grid/type-field; /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/type-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient/type-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain/type-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress/type-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field; /NXmicrostructure_score_config/ENTRY/sample/type-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient/type-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/strain/type-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/stress/type-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/type-field; /NXmirror/type-field; /NXmoderator/type-field; /NXmonitor/type-field; /NXmonopd/ENTRY/INSTRUMENT/SOURCE/type-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/energy_resolution/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_ammeter/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/type-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/type-field; /NXmpes/ENTRY/INSTRUMENT/energy_resolution/type-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/type-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/type-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/type-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/type-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/type-field; /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/angularN_resolution/type-field; /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/type-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field; /NXnote/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/type-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/type-field; /NXpiezoelectric_material/type-field; /NXpolarizer/type-field; /NXpolarizer_opt/type-field; /NXrefscan/ENTRY/instrument/SOURCE/type-field; /NXresolution/type-field; /NXsample/type-field; /NXsas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXsastof/ENTRY/instrument/source/type-field; /NXsensor/type-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/type-field; /NXsnsevent/ENTRY/instrument/SNS/type-field; /NXsnsevent/ENTRY/instrument/moderator/type-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/type-field; /NXsnshisto/ENTRY/instrument/SNS/type-field; /NXsnshisto/ENTRY/instrument/moderator/type-field; /NXsource/type-field; /NXspindispersion/type-field; /NXsqom/ENTRY/instrument/SOURCE/type-field; /NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field; /NXtomo/ENTRY/instrument/SOURCE/type-field; /NXtomophase/ENTRY/instrument/SOURCE/type-field; /NXtomoproc/ENTRY/INSTRUMENT/SOURCE/type-field; /NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field; /NXtransmission/ENTRY/instrument/DETECTOR/type-field; /NXtransmission/ENTRY/instrument/SOURCE/type-field; /NXvelocity_selector/type-field; /NXwaveplate/type-field; /NXxas/ENTRY/INSTRUMENT/SOURCE/type-field; /NXxbase/ENTRY/instrument/source/type-field
type_other: /NXpolarizer_opt/type_other-field
ub_matrix: /NXsample/ub_matrix-field
unassigned: /NXsimilarity_grouping/statistics/unassigned-field
underload_value: /NXdetector/underload_value-field; /NXdetector_channel/underload_value-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell: /NXcrystal/unit_cell-field; /NXem/ENTRY/ROI/ebsd/indexing/PHASE/unit_cell-group; /NXlauetof/ENTRY/sample/unit_cell-field; /NXphase/UNIT_CELL-group; /NXsample/unit_cell-field; /NXtas/ENTRY/SAMPLE/unit_cell-field; /NXxbase/ENTRY/sample/unit_cell-field
unit_cell_a: /NXcrystal/unit_cell_a-field; /NXfilter/unit_cell_a-field
unit_cell_abc: /NXsample/unit_cell_abc-field; /NXsample_component/unit_cell_abc-field
unit_cell_alpha: /NXcrystal/unit_cell_alpha-field; /NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma: /NXsample/unit_cell_alphabetagamma-field; /NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b: /NXcrystal/unit_cell_b-field; /NXfilter/unit_cell_b-field
unit_cell_beta: /NXcrystal/unit_cell_beta-field; /NXfilter/unit_cell_beta-field
unit_cell_c: /NXcrystal/unit_cell_c-field; /NXfilter/unit_cell_c-field
unit_cell_class: /NXsample/unit_cell_class-field; /NXsample_component/unit_cell_class-field
unit_cell_gamma: /NXcrystal/unit_cell_gamma-field; /NXfilter/unit_cell_gamma-field
unit_cell_volume: /NXcrystal/unit_cell_volume-field; /NXfilter/unit_cell_volume-field; /NXsample/unit_cell_volume-field; /NXsample_component/unit_cell_volume-field
upper_cap_radii: /NXcg_cylinder/upper_cap_radii-field
upper_cap_surface_area: /NXcg_cylinder/upper_cap_surface_area-field
url: /NXcite/url-field; /NXtransmission/ENTRY/operator/url-field
usage: /NXcrystal/usage-field
use: /NXapm_compositionspace_config/ENTRY/config/autophase/use-field
user: /NXapm/ENTRY/USER-group; /NXapm_compositionspace_results/ENTRY/USER-group; /NXapm_paraprobe_clusterer_results/ENTRY/common/USER-group; /NXapm_paraprobe_distancer_results/ENTRY/common/USER-group; /NXapm_paraprobe_intersector_results/ENTRY/common/USER-group; /NXapm_paraprobe_nanochem_results/ENTRY/common/USER-group; /NXapm_paraprobe_ranger_results/ENTRY/common/USER-group; /NXapm_paraprobe_selector_results/ENTRY/common/USER-group; /NXapm_paraprobe_spatstat_results/ENTRY/common/USER-group; /NXapm_paraprobe_surfacer_results/ENTRY/common/USER-group; /NXapm_paraprobe_tessellator_results/ENTRY/common/USER-group; /NXapm_paraprobe_tool_common/USER-group; /NXapm_paraprobe_transcoder_results/ENTRY/common/USER-group; /NXarchive/ENTRY/user-group; /NXem/ENTRY/USER-group; /NXem_calorimetry/ENTRY/USER-group; /NXentry/USER-group; /NXevent_data_em/USER-group; /NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group; /NXlab_sample_mounting/ENTRY/USER-group; /NXmicrostructure_gragles_config/ENTRY/USER-group; /NXmicrostructure_gragles_results/ENTRY/USER-group; /NXmicrostructure_imm_results/ENTRY/USER-group; /NXmicrostructure_kanapy_results/ENTRY/USER-group; /NXmicrostructure_score_config/ENTRY/USER-group; /NXmpes/ENTRY/USER-group; /NXoptical_spectroscopy/ENTRY/USER-group; /NXsensor_scan/ENTRY/USER-group; /NXsnsevent/ENTRY/USER-group; /NXsnshisto/ENTRY/USER-group; /NXsubentry/USER-group; /NXtofnpd/ENTRY/user-group; /NXtofraw/ENTRY/user-group; /NXtofsingle/ENTRY/user-group
user_defined_roi: /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi-group
uuid: /NXcs_computer/uuid-field
v_v_spatial_correlation: /NXapm_paraprobe_intersector_config/ENTRY/V_V_SPATIAL_CORRELATION-group; /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation-group
value: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/analysis_chamber/pressure_sensor/value-field; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/stage/temperature_sensor/value-field; /NXdispersion_single_parameter/value-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field; /NXelectrostatic_kicker/read_current/value-field; /NXelectrostatic_kicker/read_voltage/value-field; /NXenvironment/value-field; /NXinstrument_apm/analysis_chamber/pressure_sensor/value-field; /NXinstrument_apm/stage/temperature_sensor/value-field; /NXlog/value-field; /NXmagnetic_kicker/read_current/value-field; /NXmagnetic_kicker/read_voltage/value-field; /NXmanipulator/cryostat/PID_CONTROLLER/setpoint_log/value-field; /NXmanipulator/drain_current_ammeter/value-field; /NXmanipulator/drain_current_ammeter/value_log/value-field; /NXmanipulator/sample_bias_potentiostat/PID_CONTROLLER/setpoint_log/value-field; /NXmanipulator/sample_bias_voltmeter/value-field; /NXmanipulator/sample_bias_voltmeter/value_log/value-field; /NXmanipulator/sample_heater/PID_CONTROLLER/setpoint_log/value-field; /NXmanipulator/sample_heater/output_heater_power_log/value-field; /NXmanipulator/temperature_sensor/value-field; /NXmanipulator/temperature_sensor/value_log/value-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/summary_statistics/deformation_gradient/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_ammeter/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/value-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/value-field; /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log/value-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value-field; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log/value-field; /NXmpes/ENTRY/SAMPLE/bias_env/value-field; /NXmpes/ENTRY/SAMPLE/drain_current_env/value-field; /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/value-field; /NXmpes/ENTRY/SAMPLE/gas_pressure_env/value-field; /NXmpes/ENTRY/SAMPLE/temperature_env/value-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/value-field; /NXorientation/value-field; /NXpid_controller/pv_sensor/value_log/value-field; /NXpositioner/value-field; /NXquadrupole_magnet/read_current/value-field; /NXquadrupole_magnet/read_voltage/value-field; /NXsensor/value-field; /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field; /NXseparator/read_Bfield_current/value-field; /NXseparator/read_Bfield_voltage/value-field; /NXseparator/read_Efield_current/value-field; /NXseparator/read_Efield_voltage/value-field; /NXsnsevent/ENTRY/DASlogs/LOG/value-field; /NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field; /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsnshisto/ENTRY/DASlogs/LOG/value-field; /NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field; /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field; /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field; /NXsolenoid_magnet/read_current/value-field; /NXsolenoid_magnet/read_voltage/value-field; /NXspin_rotator/read_Bfield_current/value-field; /NXspin_rotator/read_Bfield_voltage/value-field; /NXspin_rotator/read_Efield_current/value-field; /NXspin_rotator/read_Efield_voltage/value-field
value_deriv1: /NXsensor/value_deriv1-field
value_deriv1_log: /NXsensor/value_deriv1_log-group
value_deriv2: /NXsensor/value_deriv2-field
value_deriv2_log: /NXsensor/value_deriv2_log-group
value_log: /NXmanipulator/drain_current_ammeter/value_log-group; /NXmanipulator/sample_bias_voltmeter/value_log-group; /NXmanipulator/temperature_sensor/value_log-group; /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log-group; /NXpid_controller/pv_sensor/value_log-group; /NXsensor/value_log-group
value_timestamp: /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
value_x: /NXebeam_column/corrector_ax/value_x-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_ax/value_x-field
value_y: /NXebeam_column/corrector_ax/value_y-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/corrector_ax/value_y-field
values: /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersion_repeated_parameter/values-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
variable: /NXiqproc/ENTRY/DATA/variable-field
variance_grain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_grain-field
variance_subgrain: /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_subgrain-field; /NXmicrostructure_imm_config/ENTRY/orientation_distribution/variance_subgrain-field
varied_parameter_link: /NXellipsometry/ENTRY/data_collection/varied_parameter_link-field
varphi_one: /NXmicrostructure_odf/phi_two_plot/varphi_one-field
varphi_two: /NXmicrostructure_odf/phi_two_plot/varphi_two-field
vector: /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity: /NXpositioner/velocity-field
velocity_selector: /NXinstrument/VELOCITY_SELECTOR-group; /NXmonochromator/VELOCITY_SELECTOR-group
vendor: /NXapm/ENTRY/measurement/instrument/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/pulser/SOURCE/fabrication/vendor-field; /NXapm/ENTRY/measurement/instrument/pulser/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/DETECTOR/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/APERTURE/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/BIPRISM/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/LENS_EM/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/MONOCHROMATOR/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/PHASEPLATE/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_ax/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/corrector_cs/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/electron_source/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ebeam_column/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ibeam_column/APERTURE/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ibeam_column/LENS_EM/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ibeam_column/MONOCHROMATOR/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ibeam_column/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/ibeam_column/ion_source/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/nanoprobe/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/scan_controller/fabrication/vendor-field; /NXem/ENTRY/measurement/instrument/stage/fabrication/vendor-field; /NXfabrication/vendor-field; /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field; /NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/COLLECTIONCOLUMN/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ELECTRON_DETECTOR/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/ENERGYDISPERSION/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/source_TYPE/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/source_probe/device_information/vendor-field; /NXmpes/ENTRY/INSTRUMENT/source_pump/device_information/vendor-field; /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/vendor-field; /NXspm/ENTRY/INSTRUMENT/hardware/vendor-field; /NXspm/ENTRY/INSTRUMENT/software/vendor-field
version: /NXdispersive_material/ENTRY/version-field; /NXellipsometry/ENTRY/data_collection/data_software/version-field; /NXiqproc/ENTRY/reduction/version-field; /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/version-field; /NXprocess/version-field; /NXsnsevent/ENTRY/SNSHistoTool/version-field; /NXsnshisto/ENTRY/SNSHistoTool/version-field; /NXsqom/ENTRY/reduction/version-field; /NXtomoproc/ENTRY/reconstruction/version-field; /NXxasproc/ENTRY/XAS_data_reduction/version-field
vertex_identifier_offset: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/vertex_identifier_offset-field
vertex_incident_half_edge: /NXcg_half_edge_data_structure/vertex_incident_half_edge-field
vertex_normal: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/vertex_normal-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/vertex_normal-field; /NXcg_hexahedron/vertex_normal-group; /NXcg_primitive/vertex_normal-group
vertex_normal_orientation: /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/vertex_normal_orientation-field
vertex_normals: /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/vertex_normals-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertex_normals-field
vertices: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/TRIANGLE_SET/vertices-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/vertices-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/vertices-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/vertices-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/vertices-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra/vertices-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertices-field; /NXcg_face_list_data_structure/vertices-field; /NXcg_polyline/vertices-field; /NXcylindrical_geometry/vertices-field; /NXoff_geometry/vertices-field
vertices_are_unique: /NXcg_face_list_data_structure/vertices_are_unique-field; /NXcg_polyline/vertices_are_unique-field
virtual_pixel_interpolation_applied: /NXdetector/virtual_pixel_interpolation_applied-field; /NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
visualization: /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization-group
voltage: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/local_electrode/voltage-field; /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/reflectron/voltage-field; /NXdeflector/voltage-field; /NXebeam_column/MONOCHROMATOR/voltage-field; /NXebeam_column/electron_source/voltage-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/MONOCHROMATOR/voltage-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ebeam_column/electron_source/voltage-field; /NXem/ENTRY/measurement/events/EVENT_DATA_EM/instrument/ibeam_column/ion_source/voltage-field; /NXibeam_column/ion_source/voltage-field; /NXinstrument_apm/local_electrode/voltage-field; /NXinstrument_apm/reflectron/voltage-field; /NXiv_temp/ENTRY/DATA/voltage-field; /NXlens_em/voltage-field; /NXsource/voltage-field; /NXspm/ENTRY/INSTRUMENT/voltage_sensor/voltage-field
voltage_and_bowl: /NXapm/ENTRY/atom_probe/voltage_and_bowl-group
voltage_calibration: /NXspm/ENTRY/INSTRUMENT/voltage_sensor/voltage_calibration-group
voltage_controller: /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
voltage_energy_range: /NXelectronanalyzer/voltage_energy_range-field
voltage_gain: /NXspm/ENTRY/INSTRUMENT/voltage_sensor/AMPLIFIER/voltage_gain-field
voltage_offset: /NXspm/ENTRY/INSTRUMENT/voltage_sensor/voltage_offset-field
voltage_sensor: /NXspm/ENTRY/INSTRUMENT/scan_environment/voltage_sensor-group; /NXspm/ENTRY/INSTRUMENT/voltage_sensor-group; /NXsts/ENTRY/INSTRUMENT/voltage_sensor-group
voltage_zero: /NXapm_reconstruction/voltage_zero-field
voltmeter: /NXmpes/ENTRY/SAMPLE/bias_env/voltmeter-group
volume: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/volume-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/volume-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/volume-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/volume-field; /NXapm_reconstruction/volume-field; /NXatom/volume-field; /NXcg_hexahedron/volume-field; /NXcg_primitive/volume-field; /NXion/volume-field; /NXmicrostructure/crystals/volume-field; /NXmicrostructure/triple_junctions/volume-field; /NXmicrostructure_gragles_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystal/volume-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/crystal/volume-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/crystal/volume-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/crystals/volume-field; /NXunit_cell/volume-field
volume_fraction: /NXmicrostructure_odf/kth_extrema/volume_fraction-field; /NXsample/volume_fraction-field; /NXsample_component/volume_fraction-field; /NXsample_component_set/volume_fraction-field
volumetric_features: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features-group
voronoi_cells: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells-group
voxel: /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/CLUSTER_ANALYSIS/DBSCAN/voxel-field
voxelization: /NXapm_compositionspace_config/ENTRY/config/voxelization-group; /NXapm_compositionspace_results/ENTRY/voxelization-group
wall: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall-group
wall_contact_bottom: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom-group
wall_contact_front: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front-group
wall_contact_global: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global-group
wall_contact_left: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left-group
wall_contact_rear: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear-group
wall_contact_right: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right-group
wall_contact_top: /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top-group
warmup: /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/random_number_generator/warmup-field; /NXcs_prng/warmup-field
wavelength: /NXapm/ENTRY/measurement/events/EVENT_DATA_APM/instrument/pulser/SOURCE/wavelength-field; /NXcrystal/wavelength-field; /NXdetector/efficiency/wavelength-field; /NXdispersion_table/wavelength-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/wavelength-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/wavelength-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/wavelength-field; /NXfermi_chopper/wavelength-field; /NXfluo/ENTRY/INSTRUMENT/monochromator/wavelength-field; /NXguide/reflectivity/wavelength-field; /NXinstrument_apm/pulser/SOURCE/wavelength-field; /NXmonochromator/wavelength-field; /NXmonopd/ENTRY/INSTRUMENT/CRYSTAL/wavelength-field; /NXraman/ENTRY/INSTRUMENT/beam_incident/wavelength-field; /NXrefscan/ENTRY/instrument/monochromator/wavelength-field; /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field; /NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field; /NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field; /NXsource/wavelength-field; /NXtransmission/ENTRY/instrument/spectrometer/wavelength-field; /NXvelocity_selector/wavelength-field; /NXxbase/ENTRY/instrument/monochromator/wavelength-field; /NXxlaue/ENTRY/instrument/source/distribution/wavelength-field
wavelength_calibration: /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration-group
wavelength_dispersion: /NXmonochromator/wavelength_dispersion-field
wavelength_error: /NXmonochromator/wavelength_error-field
wavelength_errors: /NXmonochromator/wavelength_errors-field
wavelength_identifier: /NXdispersion_function/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_identifier-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_identifier-field
wavelength_max: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field; /NXdispersion_function/wavelength_max-field
wavelength_min: /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field; /NXdispersion_function/wavelength_min-field
wavelength_range: /NXbeam_splitter/wavelength_range-field; /NXdisk_chopper/wavelength_range-field; /NXpolarizer_opt/wavelength_range-field; /NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field; /NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field; /NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
wavelength_range_coating: /NXbeam_splitter/coating/wavelength_range_coating-field; /NXwaveplate/coating/wavelength_range_coating-field
wavelength_resolution: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution-group
wavelength_spread: /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field; /NXvelocity_selector/wavelength_spread-field
wavelength_unit: /NXdispersion_function/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_unit-field; /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_unit-field
wavelengths: /NXwaveplate/wavelengths-field
waveplate: /NXoptical_spectroscopy/ENTRY/INSTRUMENT/WAVEPLATE-group
wedge_angle: /NXbeam_splitter/SHAPE/wedge_angle-field; /NXpolarizer_opt/SHAPE/wedge_angle-field
weight: /NXapm_compositionspace_results/ENTRY/voxelization/ION/weight-field; /NXapm_compositionspace_results/ENTRY/voxelization/weight-field; /NXdelocalization/weighting_model/weight-field; /NXem_eds/indexing/IMAGE/PROCESS/weight-field; /NXmicrostructure_odf/sampling/weight-field
weighting_method: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/weighting_model/weighting_method-field; /NXdelocalization/weighting_model/weighting_method-field
weighting_model: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/weighting_model-group; /NXdelocalization/weighting_model-group
weights: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/DBSCAN/weights-field
weinberg_vector: /NXcg_half_edge_data_structure/weinberg_vector-field
width: /NXcg_hexahedron/width-field; /NXcg_primitive/width-field; /NXfermi_chopper/width-field; /NXvelocity_selector/width-field; /NXxps/ENTRY/FIT/peakPEAK/function/fit_parameters/width-field
winding_order: /NXcg_face_list_data_structure/winding_order-field; /NXoff_geometry/winding_order-field
window: /NXapm_paraprobe_clusterer_results/ENTRY/CLUSTER_ANALYSIS/window-group; /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window-group; /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window-group; /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window-group; /NXapm_paraprobe_selector_results/ENTRY/roi/window-group; /NXapm_paraprobe_spatstat_results/ENTRY/SPATIAL_STATISTICS/window-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/window-group; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window-group; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window-group; /NXapm_paraprobe_tool_results/window-group; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window-group
window_correction: /NXopt_window/ENTRY/window_correction-group
window_effects_corrected: /NXopt_window/ENTRY/window_effects_corrected-field
window_effects_type: /NXopt_window/ENTRY/window_effects_type-field
window_triangles: /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles-group
windowing_method: /NXapm_paraprobe_clusterer_config/ENTRY/CLUSTER_ANALYSIS/spatial_filter/windowing_method-field; /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/windowing_method-field; /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/windowing_method-field; /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/windowing_method-field; /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/windowing_method-field; /NXapm_paraprobe_spatstat_config/ENTRY/SPATIAL_STATISTICS/spatial_filter/windowing_method-field; /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/windowing_method-field; /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/windowing_method-field; /NXspatial_filter/windowing_method-field
work_function: /NXelectronanalyzer/work_function-field; /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYZER/work_function-field; /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYZER/work_function-field
workflow_step_description: /NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
working_distance: /NXcapillary/working_distance-field; /NXcollectioncolumn/working_distance-field; /NXoptical_system_em/working_distance-field
x: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/x-field; /NXbeam_stop/x-field; /NXcoordinate_system/x-field; /NXcxi_ptycho/DATA/x-link; /NXdata/x-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/x-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/x-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/x-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/summary_statistics/kinetics/x-field; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/x-field; /NXtomoproc/ENTRY/data/x-field; /NXxps/ENTRY/xps_coordinate_system/x-field
x_alias: /NXcoordinate_system/x_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/x_alias-field
x_axis_direction: /NXmicrostructure_mtex_config/conventions/x_axis_direction-field
x_boundary_convention: /NXem/ENTRY/ROI/ebsd/pattern_centre/x_boundary_convention-field; /NXem_ebsd/pattern_centre/x_boundary_convention-field
x_direction: /NXapm/ENTRY/COORDINATE_SYSTEM/x_direction-field; /NXcoordinate_system/x_direction-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/x_direction-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/x_direction-field; /NXem/ENTRY/processing_reference_frame/x_direction-field; /NXem/ENTRY/sample_reference_frame/x_direction-field; /NXem_ebsd/gnomonic_reference_frame/x_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/x_direction-field
x_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field; /NXslit/x_gap-field
x_indices: /NXcxi_ptycho/DATA/x_indices-field
x_normalization_direction: /NXem/ENTRY/ROI/ebsd/pattern_centre/x_normalization_direction-field; /NXem_ebsd/pattern_centre/x_normalization_direction-field
x_pixel_offset: /NXdetector/x_pixel_offset-field; /NXsnsevent/ENTRY/DATA/x_pixel_offset-link; /NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field; /NXsnshisto/ENTRY/DATA/x_pixel_offset-link; /NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field; /NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field; /NXdetector/x_pixel_size-field; /NXlauetof/ENTRY/instrument/detector/x_pixel_size-field; /NXreftof/ENTRY/instrument/detector/x_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field; /NXsastof/ENTRY/instrument/detector/x_pixel_size-field; /NXtomo/ENTRY/instrument/detector/x_pixel_size-field; /NXtomophase/ENTRY/instrument/sample/x_pixel_size-field; /NXxbase/ENTRY/instrument/detector/x_pixel_size-field; /NXxpcs/ENTRY/instrument/DETECTOR/x_pixel_size-field
x_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field; /NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position: /NXtomo/ENTRY/instrument/detector/x_rotation_axis_pixel_position-field
x_set: /NXmicrostructure_score_config/ENTRY/numerics/x_set-field; /NXmicrostructure_score_results/ENTRY/SPATIOTEMPORAL/MICROSTRUCTURE/x_set-field
x_translation: /NXsample/x_translation-field; /NXtomo/ENTRY/sample/x_translation-field; /NXtomophase/ENTRY/sample/x_translation-field; /NXxbase/ENTRY/sample/x_translation-field
xas_data_reduction: /NXxasproc/ENTRY/XAS_data_reduction-group
xdmf_cylinder: /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder-group
xdmf_gradient: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/xdmf_gradient-field
xdmf_intensity: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/xdmf_intensity-field
xdmf_topology: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/OBJECT/polyhedron/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/ISOCONTOUR/triangle_soup/triangles/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/bounding_box/hexahedron/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/xdmf_topology-field; /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/MESH_STATE/triangles/xdmf_topology-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/interior_tetrahedra/tetrahedra/xdmf_topology-field; /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/ALPHA_COMPLEX/triangle_set/triangles/xdmf_topology-field; /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_topology-field; /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization/xdmf_topology-field
xdmf_xyz: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/xdmf_xyz-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/xdmf_xyz-field
xmax: /NXapm_reconstruction/obb/xmax-field
xmin: /NXapm_reconstruction/obb/xmin-field
xpos: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/xpos-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/xpos-field
xps_coordinate_system: /NXxps/ENTRY/xps_coordinate_system-group
xray_tube_current: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_current-field
xray_tube_material: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_material-field
xray_tube_voltage: /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_voltage-field
xraylens: /NXinstrument/XRAYLENS-group
xy_piezo_sensor: /NXafm/ENTRY/INSTRUMENT/XY_piezo_sensor-group; /NXafm/ENTRY/INSTRUMENT/scan_environment/XY_piezo_sensor-group
y: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/y-field; /NXbeam_stop/y-field; /NXcoordinate_system/y-field; /NXcxi_ptycho/DATA/y-link; /NXdata/y-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/y-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/y-field; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/y-field; /NXtomoproc/ENTRY/data/y-field; /NXxps/ENTRY/xps_coordinate_system/y-field
y_alias: /NXcoordinate_system/y_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/y_alias-field
y_boundary_convention: /NXem/ENTRY/ROI/ebsd/pattern_centre/y_boundary_convention-field; /NXem_ebsd/pattern_centre/y_boundary_convention-field
y_direction: /NXapm/ENTRY/COORDINATE_SYSTEM/y_direction-field; /NXcoordinate_system/y_direction-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/y_direction-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/y_direction-field; /NXem/ENTRY/processing_reference_frame/y_direction-field; /NXem/ENTRY/sample_reference_frame/y_direction-field; /NXem_ebsd/gnomonic_reference_frame/y_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/y_direction-field
y_gap: /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field; /NXslit/y_gap-field; /NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
y_indices: /NXcxi_ptycho/DATA/y_indices-field
y_normalization_direction: /NXem/ENTRY/ROI/ebsd/pattern_centre/y_normalization_direction-field; /NXem_ebsd/pattern_centre/y_normalization_direction-field
y_pixel_offset: /NXdetector/y_pixel_offset-field; /NXsnsevent/ENTRY/DATA/y_pixel_offset-link; /NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field; /NXsnshisto/ENTRY/DATA/y_pixel_offset-link; /NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field; /NXdetector/y_pixel_size-field; /NXlauetof/ENTRY/instrument/detector/y_pixel_size-field; /NXreftof/ENTRY/instrument/detector/y_pixel_size-field; /NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field; /NXsastof/ENTRY/instrument/detector/y_pixel_size-field; /NXtomo/ENTRY/instrument/detector/y_pixel_size-field; /NXtomophase/ENTRY/instrument/sample/y_pixel_size-field; /NXxbase/ENTRY/instrument/detector/y_pixel_size-field; /NXxpcs/ENTRY/instrument/DETECTOR/y_pixel_size-field
y_position: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field; /NXcanSAS/ENTRY/SAMPLE/y_position-field
y_pred: /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/CLUSTER_ANALYSIS/y_pred-field
y_rotation_axis_pixel_position: /NXtomo/ENTRY/instrument/detector/y_rotation_axis_pixel_position-field
y_translation: /NXtomo/ENTRY/sample/y_translation-field; /NXtomophase/ENTRY/sample/y_translation-field; /NXxbase/ENTRY/sample/y_translation-field
yaw: /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field; /NXcanSAS/ENTRY/SAMPLE/yaw-field
ymax: /NXapm_reconstruction/obb/ymax-field
ymin: /NXapm_reconstruction/obb/ymin-field
young_modulus: /NXpiezoelectric_material/young_modulus-field
ypos: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/ypos-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/ypos-field
z: /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/z-field; /NXcoordinate_system/z-field; /NXdata/z-field; /NXmicrostructure_imm_results/ENTRY/MICROSTRUCTURE/grid/structure/z-field; /NXmicrostructure_kanapy_results/ENTRY/MICROSTRUCTURE/grid/structure/z-field; /NXpositioner_spm/z_controller/z-field; /NXspm/ENTRY/INSTRUMENT/piezo_sensor/z-field; /NXtomoproc/ENTRY/data/z-field; /NXxps/ENTRY/xps_coordinate_system/z-field
z_alias: /NXcoordinate_system/z_alias-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/z_alias-field
z_average_time: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_average_time-field
z_axis_direction: /NXmicrostructure_mtex_config/conventions/z_axis_direction-field
z_controller: /NXpositioner_spm/z_controller-group; /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller-group; /NXstm/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM/z_controller-group; /NXsts/ENTRY/INSTRUMENT/piezo_sensor/POSITIONER_SPM/z_controller-group
z_controller_hold: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_controller_hold-field
z_controller_time: /NXspm/ENTRY/INSTRUMENT/bias_spectroscopy_environment/BIAS_SPECTROSCOPY/POSITIONER_SPM/z_controller/z_controller_time-field
z_direction: /NXapm/ENTRY/COORDINATE_SYSTEM/z_direction-field; /NXcoordinate_system/z_direction-field; /NXem/ENTRY/DETECTOR_REFERENCE_FRAME/z_direction-field; /NXem/ENTRY/ROI/ebsd/gnomonic_reference_frame/z_direction-field; /NXem/ENTRY/processing_reference_frame/z_direction-field; /NXem/ENTRY/sample_reference_frame/z_direction-field; /NXem_ebsd/gnomonic_reference_frame/z_direction-field; /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field; /NXmicrostructure_score_results/ENTRY/sample_reference_frame/z_direction-field; /NXxps/ENTRY/xps_coordinate_system/z_direction-field
z_offset: /NXbias_spectroscopy/POSITIONER_SPM/z_offset-field; /NXpositioner_spm/z_offset-field
z_pixel_offset: /NXdetector/z_pixel_offset-field
z_translation: /NXtomo/ENTRY/sample/z_translation-field; /NXtomophase/ENTRY/sample/z_translation-field
zener_smith: /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith-group
zlp_correction: /NXem_eels/zlp_correction-group
zmax: /NXapm_reconstruction/obb/zmax-field
zmin: /NXapm_reconstruction/obb/zmin-field
zone_height: /NXfresnel_zone_plate/zone_height-field
zone_material: /NXfresnel_zone_plate/zone_material-field
zone_support_material: /NXfresnel_zone_plate/zone_support_material-field
zpos: /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_grad_SUFFIX/zpos-field; /NXapm_paraprobe_nanochem_results/ENTRY/DELOCALIZATION/grid/scalar_field_magn_SUFFIX/zpos-field

written: 2025-04-04T11:20:01.508184