NeXus NXDL vocabulary
Anchors for all NeXus fields, groups, attributes, and links
NXDL Vocabulary
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- 2nd_order_corr_n
- /NXsts/ENTRY/INSTRUMENT/piezo_config/2nd_order_corr_N-field
- @angular0_indices
- /NXmpes_arpes/ENTRY/data@angular0_indices-attribute
- @angular1_indices
- /NXmpes_arpes/ENTRY/data@angular1_indices-attribute
- @auxiliary_signals
- /NXdata@auxiliary_signals-attribute
- @axes
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@axes-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@axes-attribute
- /NXapm_compositionspace_results/ENTRY/autophase/result@axes-attribute
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@axes-attribute
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@axes-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@axes-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@axes-attribute
- /NXcxi_ptycho/DATA@axes-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
- /NXdata/DATA@axes-attribute
- /NXdata@axes-attribute
- /NXdetector/efficiency@axes-attribute
- /NXelectronanalyser/transmission_function@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@axes-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@axes-attribute
- /NXem/ENTRY/roiID/ebsd/indexing/roi@axes-attribute
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@axes-attribute
- /NXem/ENTRY/roiID/eds/indexing/summary@axes-attribute
- /NXem_calorimetry/ENTRY/azimuthal_integration/result@axes-attribute
- /NXem_calorimetry/ENTRY/background_subtraction/result@axes-attribute
- /NXguide/reflectivity@axes-attribute
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@axes-attribute
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@axes-attribute
- /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function@axes-attribute
- /NXmpes_arpes/ENTRY/data@axes-attribute
- /NXoptical_spectroscopy/ENTRY/DATA@axes-attribute
- /NXprocess_mpes/transmission_correction/transmission_function@axes-attribute
- /NXtransmission/ENTRY/data@axes-attribute
- @axis
- /NXdata/AXISNAME@axis-attribute
- /NXdetector/time_of_flight@axis-attribute
- /NXdetector/x_pixel_offset@axis-attribute
- /NXdetector/y_pixel_offset@axis-attribute
- /NXdetector/z_pixel_offset@axis-attribute
- @axisname_indices
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d@AXISNAME_indices-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA@AXISNAME_indices-attribute
- /NXapm_compositionspace_results/ENTRY/autophase/result@AXISNAME_indices-attribute
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result@AXISNAME_indices-attribute
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result@AXISNAME_indices-attribute
- /NXdata@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d@AXISNAME_indices-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d@AXISNAME_indices-attribute
- /NXem/ENTRY/roiID/ebsd/indexing/roi@AXISNAME_indices-attribute
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d@AXISNAME_indices-attribute
- /NXem/ENTRY/roiID/eds/indexing/summary@AXISNAME_indices-attribute
- /NXem_calorimetry/ENTRY/azimuthal_integration/result@AXISNAME_indices-attribute
- /NXem_calorimetry/ENTRY/background_subtraction/result@AXISNAME_indices-attribute
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure@AXISNAME_indices-attribute
- @baseline_reference
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
- /NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
- @cansas_class
- /NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
- /NXcanSAS/ENTRY/DATA@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
- /NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
- /NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
- /NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
- /NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
- /NXcanSAS/ENTRY@canSAS_class-attribute
- @characteristics_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics@characteristics_type-attribute
- @check_sum
- /NXdetector/data@check_sum-attribute
- @comment
- /NXentry/revision@comment-attribute
- /NXsubentry/revision@comment-attribute
- @components
- /NXsample_component_set@components-attribute
- @configuration
- /NXentry/program_name@configuration-attribute
- /NXsubentry/program_name@configuration-attribute
- @creator
- /NXroot@creator-attribute
- @creator_version
- /NXroot@creator_version-attribute
- @default
- /NXactuator@default-attribute
- /NXaperture@default-attribute
- /NXattenuator@default-attribute
- /NXbeam@default-attribute
- /NXbeam_stop@default-attribute
- /NXbending_magnet@default-attribute
- /NXcalibration@default-attribute
- /NXcanSAS/ENTRY@default-attribute
- /NXcapillary@default-attribute
- /NXcite@default-attribute
- /NXcollectioncolumn@default-attribute
- /NXcollimator@default-attribute
- /NXcrystal@default-attribute
- /NXcylindrical_geometry@default-attribute
- /NXdetector@default-attribute
- /NXdetector_group@default-attribute
- /NXdetector_module@default-attribute
- /NXdisk_chopper@default-attribute
- /NXelectron_level@default-attribute
- /NXelectronanalyser@default-attribute
- /NXenergydispersion@default-attribute
- /NXentry@default-attribute
- /NXenvironment@default-attribute
- /NXevent_data@default-attribute
- /NXfermi_chopper@default-attribute
- /NXfilter@default-attribute
- /NXfit_background@default-attribute
- /NXflipper@default-attribute
- /NXfresnel_zone_plate@default-attribute
- /NXgeometry@default-attribute
- /NXgrating@default-attribute
- /NXguide@default-attribute
- /NXinsertion_device@default-attribute
- /NXinstrument@default-attribute
- /NXlog@default-attribute
- /NXmanipulator@default-attribute
- /NXmirror@default-attribute
- /NXmoderator@default-attribute
- /NXmonitor@default-attribute
- /NXmonochromator@default-attribute
- /NXnote@default-attribute
- /NXoff_geometry@default-attribute
- /NXorientation@default-attribute
- /NXparameters@default-attribute
- /NXpeak@default-attribute
- /NXpid@default-attribute
- /NXpinhole@default-attribute
- /NXpolarizer@default-attribute
- /NXpositioner@default-attribute
- /NXpositioner_sts@default-attribute
- /NXprocess@default-attribute
- /NXprocess_mpes@default-attribute
- /NXreflections@default-attribute
- /NXresolution@default-attribute
- /NXroot@default-attribute
- /NXsample@default-attribute
- /NXsample_component@default-attribute
- /NXsensor@default-attribute
- /NXsensor_sts@default-attribute
- /NXshape@default-attribute
- /NXslit@default-attribute
- /NXsource@default-attribute
- /NXsubentry@default-attribute
- /NXtransformations@default-attribute
- /NXtranslation@default-attribute
- /NXuser@default-attribute
- /NXvelocity_selector@default-attribute
- /NXxraylens@default-attribute
- @depends_on
- /NXapm_hit_finding/hit_positions@depends_on-attribute
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions@depends_on-attribute
- /NXapm_reconstruction/reconstructed_positions@depends_on-attribute
- /NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
- /NXbeam_path/TRANSFORMATIONS/AXISNAME@depends_on-attribute
- /NXcomponent@depends_on-attribute
- /NXcrystal_structure/atom_position@depends_on-attribute
- /NXdeflector@depends_on-attribute
- /NXdetector_module/fast_pixel_direction@depends_on-attribute
- /NXdetector_module/module_offset@depends_on-attribute
- /NXdetector_module/slow_pixel_direction@depends_on-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@depends_on-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@depends_on-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@depends_on-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@depends_on-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@depends_on-attribute
- /NXtransformations/AXISNAME@depends_on-attribute
- /NXunit_cell/atom_positions@depends_on-attribute
- /NXunit_cell/base_vector_a@depends_on-attribute
- /NXunit_cell/base_vector_b@depends_on-attribute
- /NXunit_cell/base_vector_c@depends_on-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@depends_on-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@depends_on-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@depends_on-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@depends_on-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@depends_on-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@depends_on-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@depends_on-attribute
- @description
- /NXelectron_level@description-attribute
- /NXelectrostatic_kicker/timing@description-attribute
- /NXmagnetic_kicker/timing@description-attribute
- /NXreflections/background_mean@description-attribute
- /NXreflections/bounding_box@description-attribute
- /NXreflections/d@description-attribute
- /NXreflections/det_module@description-attribute
- /NXreflections/entering@description-attribute
- /NXreflections/flags@description-attribute
- /NXreflections/h@description-attribute
- /NXreflections/id@description-attribute
- /NXreflections/int_prf@description-attribute
- /NXreflections/int_prf_errors@description-attribute
- /NXreflections/int_prf_var@description-attribute
- /NXreflections/int_sum@description-attribute
- /NXreflections/int_sum_errors@description-attribute
- /NXreflections/int_sum_var@description-attribute
- /NXreflections/k@description-attribute
- /NXreflections/l@description-attribute
- /NXreflections/lp@description-attribute
- /NXreflections/observed_frame@description-attribute
- /NXreflections/observed_frame_errors@description-attribute
- /NXreflections/observed_frame_var@description-attribute
- /NXreflections/observed_phi@description-attribute
- /NXreflections/observed_phi_errors@description-attribute
- /NXreflections/observed_phi_var@description-attribute
- /NXreflections/observed_px_x@description-attribute
- /NXreflections/observed_px_x_errors@description-attribute
- /NXreflections/observed_px_x_var@description-attribute
- /NXreflections/observed_px_y@description-attribute
- /NXreflections/observed_px_y_errors@description-attribute
- /NXreflections/observed_px_y_var@description-attribute
- /NXreflections/observed_x@description-attribute
- /NXreflections/observed_x_errors@description-attribute
- /NXreflections/observed_x_var@description-attribute
- /NXreflections/observed_y@description-attribute
- /NXreflections/observed_y_errors@description-attribute
- /NXreflections/observed_y_var@description-attribute
- /NXreflections/overlaps@description-attribute
- /NXreflections/partiality@description-attribute
- /NXreflections/polar_angle@description-attribute
- /NXreflections/predicted_frame@description-attribute
- /NXreflections/predicted_phi@description-attribute
- /NXreflections/predicted_px_x@description-attribute
- /NXreflections/predicted_px_y@description-attribute
- /NXreflections/predicted_x@description-attribute
- /NXreflections/predicted_y@description-attribute
- /NXreflections/prf_cc@description-attribute
- /NXreflections/reflection_id@description-attribute
- /NXreflections@description-attribute
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
- @device
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE@device-attribute
- @direction
- /NXsample/electric_field@direction-attribute
- /NXsample/magnetic_field@direction-attribute
- /NXsample/stress_field@direction-attribute
- @distribution
- /NXdata/AXISNAME@distribution-attribute
- @energy_indices
- /NXmpes/ENTRY/data@energy_indices-attribute
- /NXmpes_arpes/ENTRY/data@energy_indices-attribute
- /NXxps/ENTRY/data@energy_indices-attribute
- @entry
- /NXarpes/ENTRY@entry-attribute
- /NXiqproc/ENTRY@entry-attribute
- /NXsastof/ENTRY@entry-attribute
- /NXsqom/ENTRY@entry-attribute
- /NXxas/ENTRY@entry-attribute
- /NXxasproc/ENTRY@entry-attribute
- @epoch_start
- /NXem_ebsd/measurement/time@epoch_start-attribute
- @equipment_component
- /NXtransformations/AXISNAME@equipment_component-attribute
- @file_name
- /NXroot@file_name-attribute
- @file_time
- /NXroot@file_time-attribute
- @file_update_time
- /NXroot@file_update_time-attribute
- @first_good
- /NXdata/AXISNAME@first_good-attribute
- @first_point_for_fit
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
- @flux
- /NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
- @frequency
- /NXdetector/raw_time_of_flight@frequency-attribute
- @h5py_version
- /NXroot@h5py_version-attribute
- @hdf5_version
- /NXroot@HDF5_Version-attribute
- @hdf_version
- /NXroot@HDF_version-attribute
- @i_axes
- /NXcanSAS/ENTRY/DATA@I_axes-attribute
- @idf_version
- /NXentry@IDF_Version-attribute
- /NXsubentry@IDF_Version-attribute
- @index
- /NXarchive/entry@index-attribute
- @input
- /NXbeam_transfer_matrix_table/TRANSFER_MATRIX@input-attribute
- @input_path
- /NXcalibration/input_SYMBOL@input_path-attribute
- /NXcalibration/original_axis@input_path-attribute
- @interpretation
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
- @last_good
- /NXdata/AXISNAME@last_good-attribute
- @local_name
- /NXdetector/crate@local_name-attribute
- /NXdetector/input@local_name-attribute
- /NXdetector/slot@local_name-attribute
- @logged_against
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy@logged_against-attribute
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction@logged_against-attribute
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency@logged_against-attribute
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage@logged_against-attribute
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage@logged_against-attribute
- /NXevent_data_apm/instrument/analysis_chamber/pressure@logged_against-attribute
- /NXevent_data_apm/instrument/buffer_chamber/pressure@logged_against-attribute
- /NXevent_data_apm/instrument/load_lock_chamber/pressure@logged_against-attribute
- /NXevent_data_apm/instrument/stage_lab/temperature@logged_against-attribute
- /NXpulser_apm/SOURCE/BEAM/incidence_vector@logged_against-attribute
- /NXpulser_apm/SOURCE/BEAM/pinhole_position@logged_against-attribute
- /NXpulser_apm/SOURCE/BEAM/spot_position@logged_against-attribute
- /NXpulser_apm/SOURCE/pulse_energy@logged_against-attribute
- /NXpulser_apm/pulse_fraction@logged_against-attribute
- /NXpulser_apm/pulse_frequency@logged_against-attribute
- /NXpulser_apm/pulse_number@logged_against-attribute
- /NXpulser_apm/pulse_voltage@logged_against-attribute
- /NXpulser_apm/standing_voltage@logged_against-attribute
- @long_name
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i@long_name-attribute
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j@long_name-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity@long_name-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x@long_name-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y@long_name-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z@long_name-attribute
- /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier@long_name-attribute
- /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance@long_name-attribute
- /NXdata/AXISNAME@long_name-attribute
- /NXdata/DATA@long_name-attribute
- /NXdetector/data@long_name-attribute
- /NXdetector/time_of_flight@long_name-attribute
- /NXdetector/x_pixel_offset@long_name-attribute
- /NXdetector/y_pixel_offset@long_name-attribute
- /NXdetector/z_pixel_offset@long_name-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i@long_name-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag@long_name-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity@long_name-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude@long_name-attribute
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real@long_name-attribute
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- /NXxpcs/entry/twotime/two_time_corr_func@storage_mode-attribute
- @surface_indices
- /NXguide/reflectivity@surface_indices-attribute
- @symbol
- /NXcalibration/original_axis@symbol-attribute
- @t_axes
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@T_axes-attribute
- @time
- /NXattenuator/status@time-attribute
- /NXsource/last_fill@time-attribute
- @time_origin_location
- /NXxpcs/entry/twotime/two_time_corr_func@time_origin_location-attribute
- @timestamp
- /NXcanSAS/ENTRY/DATA@timestamp-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@timestamp-attribute
- @transform
- /NXtomoproc/entry/data/data@transform-attribute
- @transformation_type
- /NXbeam/TRANSFORMATIONS/DIRECTION@transformation_type-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@transformation_type-attribute
- /NXdetector_module/fast_pixel_direction@transformation_type-attribute
- /NXdetector_module/module_offset@transformation_type-attribute
- /NXdetector_module/slow_pixel_direction@transformation_type-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@transformation_type-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@transformation_type-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@transformation_type-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@transformation_type-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@transformation_type-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@transformation_type-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@transformation_type-attribute
- /NXtransformations/AXISNAME@transformation_type-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@transformation_type-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@transformation_type-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@transformation_type-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@transformation_type-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@transformation_type-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@transformation_type-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@transformation_type-attribute
- @type
- /NXdata_mpes/energy@type-attribute
- /NXdata_mpes_detector/energy@type-attribute
- /NXentry/thumbnail@type-attribute
- /NXmpes/ENTRY/data/energy@type-attribute
- @uncertainties
- /NXcanSAS/ENTRY/DATA/I@uncertainties-attribute
- /NXcanSAS/ENTRY/DATA/Q@uncertainties-attribute
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T@uncertainties-attribute
- @units
- /NXbeam/final_polarization@units-attribute
- /NXbeam/fluence@units-attribute
- /NXbeam/incident_polarization@units-attribute
- /NXbeam_path/ATTENUATOR/attenuation@units-attribute
- /NXbeam_path/GRATING/spectrum@units-attribute
- /NXbeam_path/MONOCHROMATOR/spectrum@units-attribute
- /NXbeam_path/SOURCE/excitation_wavelength@units-attribute
- /NXcanSAS/ENTRY/DATA/I@units-attribute
- /NXcanSAS/ENTRY/DATA/Idev@units-attribute
- /NXcanSAS/ENTRY/DATA/Q@units-attribute
- /NXcanSAS/ENTRY/DATA/Qdev@units-attribute
- /NXcanSAS/ENTRY/DATA/Qmean@units-attribute
- /NXcanSAS/ENTRY/DATA/dQl@units-attribute
- /NXcanSAS/ENTRY/DATA/dQw@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size@units-attribute
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size@units-attribute
- /NXellipsometry/ENTRY/data_collection/NAME_spectrum@units-attribute
- /NXellipsometry/ENTRY/data_collection/measured_data@units-attribute
- /NXellipsometry/ENTRY/data_collection/measured_data_errors@units-attribute
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i@units-attribute
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j@units-attribute
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity@units-attribute
- /NXfiber/attenuation@units-attribute
- /NXfiber/spectral_range@units-attribute
- /NXfiber/transfer_rate@units-attribute
- /NXparameters/term@units-attribute
- /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle@units-attribute
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one@units-attribute
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two@units-attribute
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta@units-attribute
- @url
- /NXapm_compositionspace_results/ENTRY/programID/program@url-attribute
- /NXdispersive_material/ENTRY/definition@url-attribute
- /NXellipsometry/ENTRY/data_collection/data_software@URL-attribute
- /NXellipsometry/ENTRY/definition@URL-attribute
- /NXentry/definition@URL-attribute
- /NXentry/definition_local@URL-attribute
- /NXmicrostructure_gragles_config/ENTRY/program1/program_name@url-attribute
- /NXmicrostructure_gragles_results/ENTRY/program1/program_name@url-attribute
- /NXmicrostructure_imm_results/ENTRY/program1/program@url-attribute
- /NXmicrostructure_kanapy_results/ENTRY/program1/program@url-attribute
- /NXmicrostructure_kanapy_results/ENTRY/program2/program@url-attribute
- /NXmicrostructure_score_config/ENTRY/program1/program_name@url-attribute
- /NXmicrostructure_score_results/ENTRY/program1/program_name@url-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@URL-attribute
- /NXoptical_spectroscopy/ENTRY/definition@URL-attribute
- /NXprogram/program@url-attribute
- /NXraman/ENTRY/definition@URL-attribute
- /NXsubentry/definition@URL-attribute
- /NXsubentry/definition_local@URL-attribute
- /NXtransmission/ENTRY/acquisition_program@url-attribute
- /NXtransmission/ENTRY/definition@url-attribute
- @use_these
- /NXmicrostructure/interface/crystal_identifier@use_these-attribute
- /NXmicrostructure/interface/phase_identifier@use_these-attribute
- /NXmicrostructure/interface/triple_junction_identifier@use_these-attribute
- /NXmicrostructure/quadruple_junction/crystal_identifier@use_these-attribute
- /NXmicrostructure/quadruple_junction/interface_identifier@use_these-attribute
- /NXmicrostructure/quadruple_junction/location@use_these-attribute
- /NXmicrostructure/quadruple_junction/phase_identifier@use_these-attribute
- /NXmicrostructure/quadruple_junction/triple_junction_identifier@use_these-attribute
- /NXmicrostructure/triple_junction/interface_identifier@use_these-attribute
- /NXmicrostructure/triple_junction/location@use_these-attribute
- /NXmicrostructure/triple_junction/polyline_identifier@use_these-attribute
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/crystal_identifier@use_these-attribute
- @varied_variable
- /NXiqproc/ENTRY/DATA/variable@varied_variable-attribute
- @vector
- /NXbeam/TRANSFORMATIONS/DIRECTION@vector-attribute
- /NXbeam/TRANSFORMATIONS/reference_plane@vector-attribute
- /NXcxi_ptycho/sample_1/transformations@vector-attribute
- /NXdetector_module/fast_pixel_direction@vector-attribute
- /NXdetector_module/module_offset@vector-attribute
- /NXdetector_module/slow_pixel_direction@vector-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion@vector-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation@vector-attribute
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar@vector-attribute
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@vector-attribute
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@vector-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth@vector-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar@vector-attribute
- /NXtransformations/AXISNAME@vector-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle@vector-attribute
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle@vector-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle@vector-attribute
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence@vector-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt@vector-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle@vector-attribute
- /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle@vector-attribute
- @version
- /NXapm/ENTRY/atom_probe/hit_finding/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/ranging/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/raw_data/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/reconstruction/programID/program@version-attribute
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program@version-attribute
- /NXapm/ENTRY/definition@version-attribute
- /NXapm/ENTRY/profiling/programID/program@version-attribute
- /NXapm_compositionspace_config/ENTRY/definition@version-attribute
- /NXapm_compositionspace_results/ENTRY/definition@version-attribute
- /NXapm_compositionspace_results/ENTRY/programID/program@version-attribute
- /NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_clusterer_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_clusterer_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_distancer_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_distancer_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_distancer_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_distancer_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_intersector_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_intersector_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_intersector_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_intersector_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_nanochem_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_ranger_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_ranger_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_ranger_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_ranger_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_selector_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_selector_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_selector_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_selector_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_spatstat_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_spatstat_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_surfacer_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_surfacer_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_tessellator_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_tessellator_results/ENTRY/definition@version-attribute
- /NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_transcoder_config/ENTRY/definition@version-attribute
- /NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program@version-attribute
- /NXapm_paraprobe_transcoder_results/ENTRY/definition@version-attribute
- /NXarchive/entry/program@version-attribute
- /NXcalibration/calibration_software@version-attribute
- /NXcanSAS/ENTRY@version-attribute
- /NXcs_computer/operating_system@version-attribute
- /NXdispersive_material/ENTRY/definition@version-attribute
- /NXellipsometry/ENTRY/definition@version-attribute
- /NXem/ENTRY/definition@version-attribute
- /NXem/ENTRY/measurement/em_lab/control_programID/program@version-attribute
- /NXem/ENTRY/profiling/programID/program@version-attribute
- /NXem_calorimetry/ENTRY/azimuthal_integration/programID/program@version-attribute
- /NXem_calorimetry/ENTRY/background_subtraction/programID/program@version-attribute
- /NXem_calorimetry/ENTRY/definition@version-attribute
- /NXem_calorimetry/ENTRY/distortion_correction/programID/program@version-attribute
- /NXentry/definition@version-attribute
- /NXentry/definition_local@version-attribute
- /NXentry/entry_identifier_uuid@version-attribute
- /NXentry/program_name@version-attribute
- /NXfabrication/model@version-attribute
- /NXlab_electro_chemo_mechanical_preparation/ENTRY@version-attribute
- /NXlab_sample_mounting/ENTRY@version-attribute
- /NXmicrostructure_gragles_config/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_gragles_config/ENTRY/program1/program_name@version-attribute
- /NXmicrostructure_gragles_results/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_gragles_results/ENTRY/program1/program_name@version-attribute
- /NXmicrostructure_imm_results/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_imm_results/ENTRY/program1/program@version-attribute
- /NXmicrostructure_kanapy_results/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_kanapy_results/ENTRY/program1/program@version-attribute
- /NXmicrostructure_kanapy_results/ENTRY/program2/program@version-attribute
- /NXmicrostructure_score_config/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_score_config/ENTRY/program1/program_name@version-attribute
- /NXmicrostructure_score_results/ENTRY/environment/programID/program@version-attribute
- /NXmicrostructure_score_results/ENTRY/program1/program_name@version-attribute
- /NXmpes/ENTRY/definition@version-attribute
- /NXmpes_arpes/ENTRY/definition@version-attribute
- /NXmx/ENTRY@version-attribute
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program@version-attribute
- /NXoptical_spectroscopy/ENTRY/definition@version-attribute
- /NXprogram/program@version-attribute
- /NXraman/ENTRY/definition@version-attribute
- /NXsensor_scan/ENTRY/PROCESS/program@version-attribute
- /NXsensor_scan/ENTRY/definition@version-attribute
- /NXspe/ENTRY/definition@version-attribute
- /NXsubentry/definition@version-attribute
- /NXsubentry/definition_local@version-attribute
- /NXsubentry/program_name@version-attribute
- /NXtransmission/ENTRY/definition@version-attribute
- @wavelength_indices
- /NXdetector/efficiency@wavelength_indices-attribute
- /NXguide/reflectivity@wavelength_indices-attribute
- @xml_version
- /NXroot@XML_version-attribute
- @xpos_indices
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@xpos_indices-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@xpos_indices-attribute
- @ypos_indices
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@ypos_indices-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@ypos_indices-attribute
- @zpos_indices
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX@zpos_indices-attribute
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX@zpos_indices-attribute
- a
- /NXcsg/a-group
- a_1
- /NXcorrector_cs/tableauID/a_1-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1-group
- a_2
- /NXcorrector_cs/tableauID/a_2-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2-group
- a_3
- /NXcorrector_cs/tableauID/a_3-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3-group
- a_4
- /NXcorrector_cs/tableauID/a_4-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4-group
- a_6
- /NXcorrector_cs/tableauID/a_6-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6-group
- a_axis_direction
- /NXmicrostructure_mtex_config/conventions/a_axis_direction-field
- a_b_c
- /NXcrystal_structure/a_b_c-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/a_b_c-field
- /NXunit_cell/a_b_c-field
- abbe_number
- /NXlens_opt/Abbe_number-field
- abrasive_medium
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
- abrasive_medium_carrier
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
- absolute_path
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/absolute_path-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/absolute_path-field
- /NXimage_set/PROCESS/source/absolute_path-field
- /NXspectrum_set/PROCESS/source/absolute_path-field
- absorbed_beam
- /NXxas/ENTRY/DATA/absorbed_beam-link
- /NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
- absorbing_material
- /NXcollimator/absorbing_material-field
- /NXfermi_chopper/absorbing_material-field
- absorption_cross_section
- /NXattenuator/absorption_cross_section-field
- ac_line_sync
- /NXscanbox_em/ac_line_sync-field
- acceleration_time
- /NXpositioner/acceleration_time-field
- /NXpositioner_sts/acceleration_time-field
- acceptance_angle
- /NXfiber/acceptance_angle-field
- /NXpolarizer_opt/acceptance_angle-field
- accepted_photon_beam_divergence
- /NXbending_magnet/accepted_photon_beam_divergence-field
- accepting_aperture
- /NXcapillary/accepting_aperture-field
- acquisition_mode
- /NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
- /NXdetector/acquisition_mode-field
- acquisition_period
- /NXcircuit/acquisition_period-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/acquisition_period-field
- /NXsts/ENTRY/resolution_indicators/acquisition_period-field
- acquisition_program
- /NXtransmission/ENTRY/acquisition_program-group
- active_calib
- /NXpositioner_sts/active_calib-field
- /NXsts/ENTRY/INSTRUMENT/piezo_config/active_calib-field
- active_channels
- /NXamplifier/active_channels-field
- activity
- /NXhistory/ACTIVITY-group
- actuator
- /NXebeam_column/ACTUATOR-group
- /NXem/ENTRY/measurement/em_lab/ACTUATOR-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ACTUATOR-group
- /NXem_calorimetry/ENTRY/actuator-group
- /NXenvironment/ACTUATOR-group
- /NXibeam_column/ACTUATOR-group
- /NXinstrument/ACTUATOR-group
- /NXmanipulator/ACTUATOR-group
- actuatorid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/actuatorID-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/actuatorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/actuatorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/actuatorID-group
- additional_detector_hardware
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/additional_detector_hardware-field
- additional_phase_information
- /NXdispersive_material/ENTRY/sample/additional_phase_information-field
- address
- /NXem/ENTRY/userID/address-field
- /NXsensor_scan/ENTRY/USER/address-field
- /NXtransmission/ENTRY/operator/address-field
- /NXuser/address-field
- aequatorial_angle
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field
- /NXsas/ENTRY/SAMPLE/aequatorial_angle-field
- /NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
- /NXsastof/ENTRY/sample/aequatorial_angle-field
- affiliation
- /NXem/ENTRY/userID/affiliation-field
- /NXmpes/ENTRY/USER/affiliation-field
- /NXsensor_scan/ENTRY/USER/affiliation-field
- /NXtransmission/ENTRY/operator/affiliation-field
- /NXuser/affiliation-field
- algorithm
- /NXapm/ENTRY/atom_probe/hit_finding/serialized/algorithm-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/algorithm-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/algorithm-field
- /NXapm/ENTRY/atom_probe/ranging/definitions/algorithm-field
- /NXapm/ENTRY/atom_probe/raw_data/serialized/algorithm-field
- /NXapm/ENTRY/atom_probe/reconstruction/config/algorithm-field
- /NXapm/ENTRY/atom_probe/reconstruction/results/algorithm-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/algorithm-field
- /NXapm/ENTRY/serializedID/algorithm-field
- /NXapm_compositionspace_config/ENTRY/config/ranging/algorithm-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/algorithm-field
- /NXapm_compositionspace_results/ENTRY/config/algorithm-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/algorithm-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/algorithm-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/algorithm-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/algorithm-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/algorithm-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/algorithm-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/algorithm-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/algorithm-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/algorithm-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/algorithm-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/algorithm-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/algorithm-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/algorithm-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/algorithm-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/algorithm-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/algorithm-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging/algorithm-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/algorithm-field
- /NXapm_paraprobe_selector_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/algorithm-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/algorithm-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/algorithm-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/algorithm-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/algorithm-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/algorithm-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/algorithm-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/algorithm-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/algorithm-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/config/algorithm-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/algorithm-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/algorithm-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/algorithm-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/config/algorithm-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/algorithm-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/algorithm-field
- /NXem/ENTRY/roiID/ebsd/indexing/source/algorithm-field
- /NXem/ENTRY/roiID/ebsd/measurement/source/algorithm-field
- /NXem/ENTRY/roiID/ebsd/simulation/source/algorithm-field
- /NXem/ENTRY/serializedID/algorithm-field
- /NXem_calorimetry/ENTRY/actuator/algorithm-field
- /NXem_calorimetry/ENTRY/diffraction/algorithm-field
- /NXmicrostructure/configuration/algorithm-field
- /NXmicrostructure_gragles_config/ENTRY/discretization/grid/algorithm-field
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd/algorithm-field
- /NXserialized/algorithm-field
- alias
- /NXaberration/alias-field
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/alias-field
- /NXapm/ENTRY/sample/alias-field
- /NXapm/ENTRY/specimen/alias-field
- /NXcoordinate_system/alias-field
- /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/alias-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/alias-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/alias-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/alias-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/alias-field
- /NXstage_lab/alias-field
- alpha
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/alpha-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/alpha-field
- /NXcg_alpha_complex/alpha-field
- /NXxkappa/entry/sample/alpha-field
- alpha_beta_gamma
- /NXcrystal_structure/alpha_beta_gamma-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/alpha_beta_gamma-field
- /NXunit_cell/alpha_beta_gamma-field
- alpha_complexid
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID-group
- alpha_value_choice
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_value_choice-field
- alpha_values
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/alpha_values-field
- alternative_plot
- /NXsts/ENTRY/alternative_plot-group
- amperemeter
- /NXmpes/ENTRY/SAMPLE/drain_current_env/amperemeter-group
- amplifier
- /NXlockin/AMPLIFIER-group
- /NXsensor_sts/amplifier-group
- amplifier_bias
- /NXdetector/amplifier_bias-field
- amplifier_type
- /NXdetector/amplifier_type-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
- amplifier_voltage
- /NXdetector/amplifier_voltage-field
- analyser
- /NXarpes/ENTRY/INSTRUMENT/analyser-group
- /NXindirecttof/entry/INSTRUMENT/analyser-group
- /NXtas/entry/INSTRUMENT/analyser-group
- analyser_take_off_azimuth_angle
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_azimuth_angle-field
- analyser_take_off_polar_angle
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyser_take_off_polar_angle-field
- analysis_chamber
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/analysis_chamber-group
- /NXapm/ENTRY/measurement/instrument/analysis_chamber-group
- /NXapm_msr/instrument/analysis_chamber-group
- /NXevent_data_apm/instrument/analysis_chamber-group
- analysis_identifier
- /NXapm_compositionspace_config/ENTRY/config/analysis_identifier-field
- /NXapm_compositionspace_results/ENTRY/analysis_identifier-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/analysis_identifier-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/analysis_identifier-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/analysis_identifier-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/analysis_identifier-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/analysis_identifier-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/analysis_identifier-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/analysis_identifier-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_selector_config/ENTRY/select/analysis_identifier-field
- /NXapm_paraprobe_selector_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/analysis_identifier-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/analysis_identifier-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/analysis_identifier-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/analysis_identifier-field
- /NXapm_paraprobe_tool_common/analysis_identifier-field
- /NXapm_paraprobe_tool_config/analysis_identifier-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/analysis_identifier-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/analysis_identifier-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/analysis_identifier-field
- analysis_program
- /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program-group
- analyze_coprecipitation
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_coprecipitation-field
- analyze_intersection
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_intersection-field
- analyze_proximity
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/analyze_proximity-field
- analyzer_dispersion
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_dispersion-field
- analyzer_elevation
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_elevation-field
- analyzer_rotation
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations/analyzer_rotation-field
- angle
- /NXaberration/angle-field
- angle_of_detection
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_detection-field
- angle_of_in_plane_sample_rotation
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_in_plane_sample_rotation-field
- angle_of_incidence
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incidence-field
- angle_of_incident_and_detection_beam
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_of_incident_and_detection_beam-field
- angle_reference_frame
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/angle_reference_frame-field
- angles
- /NXarpes/ENTRY/INSTRUMENT/analyser/angles-field
- /NXgrating/angles-field
- angular0
- /NXmpes_arpes/ENTRY/data/angular0-field
- angular1
- /NXmpes_arpes/ENTRY/data/angular1-field
- angular_acceptance
- /NXcollectioncolumn/angular_acceptance-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/angular_acceptance-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/angular_acceptance-field
- angular_calibration
- /NXdetector/angular_calibration-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
- angular_calibration_applied
- /NXdetector/angular_calibration_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
- angular_dispersion
- /NXbeam_path/GRATING/angular_dispersion-field
- /NXbeam_path/MONOCHROMATOR/GRATING/angular_dispersion-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
- angular_resolution
- /NXelectronanalyser/angular_resolution-group
- angular_spread
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/angular_spread-field
- angularn
- /NXdata_mpes/angularN-field
- /NXdata_mpes_detector/angularN-field
- angularn_calibration
- /NXmpes/ENTRY/PROCESS_MPES/angularN_calibration-group
- /NXprocess_mpes/angularN_calibration-group
- angularn_resolution
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution-group
- animations_period
- /NXcircuit/animations_period-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/animations_period-field
- /NXsts/ENTRY/resolution_indicators/animations_period-field
- anode_material
- /NXsource/anode_material-field
- aoi_range
- /NXbeam_splitter/AOI_range-field
- aperture
- /NXbeam_path/ATTENUATOR/APERTURE-group
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
- /NXcollectioncolumn/APERTURE-group
- /NXcorrector_cs/APERTURE-group
- /NXebeam_column/APERTURE-group
- /NXenergydispersion/APERTURE-group
- /NXibeam_column/APERTURE-group
- /NXinstrument/APERTURE-group
- /NXsnsevent/ENTRY/instrument/APERTURE-group
- /NXsnshisto/ENTRY/instrument/APERTURE-group
- /NXsource/APERTURE-group
- /NXxraylens/aperture-field
- aperture_number
- /NXbeam_path/aperture_NUMBER-group
- apertureid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID-group
- applied
- /NXcalibration/applied-field
- /NXcomponent/applied-field
- /NXcorrector_cs/applied-field
- /NXdistortion/applied-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/applied-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/applied-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/applied-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID/applied-field
- /NXregistration/applied-field
- apply
- /NXmicrostructure_score_config/ENTRY/solitary_unit/apply-field
- area
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/area-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/area-field
- /NXcg_hexahedron_set/area-field
- /NXcg_primitive_set/area-field
- /NXcrystal_structure/area-field
- /NXmicrostructure/crystal/area-field
- /NXmicrostructure/interface/area-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/area-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/area-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/area-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/area-field
- /NXxps/ENTRY/FIT/peakPEAK/function/area-group
- arpes_geometry
- /NXmpes_arpes/ENTRY/geometries/arpes_geometry-group
- arrival_time_pairs
- /NXapm/ENTRY/atom_probe/hit_finding/arrival_time_pairs-field
- /NXapm_hit_finding/arrival_time_pairs-field
- arrow_char
- /NXmicrostructure_mtex_config/plotting/arrow_char-field
- aspect
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/aspect-field
- associated_beam
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/associated_beam-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/associated_beam-field
- associated_source
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/associated_source-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/associated_source-field
- atom
- /NXunit_cell/atom-field
- atom_identifier
- /NXcrystal_structure/atom_identifier-field
- /NXunit_cell/atom_identifier-field
- atom_occupancy
- /NXcrystal_structure/atom_occupancy-field
- /NXunit_cell/atom_occupancy-field
- atom_position
- /NXcrystal_structure/atom_position-field
- atom_positions
- /NXunit_cell/atom_positions-field
- atom_probe
- /NXapm/ENTRY/atom_probe-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe-group
- atom_type
- /NXcrystal_structure/atom_type-field
- atom_types
- /NXapm/ENTRY/specimen/atom_types-field
- /NXdispersive_material/ENTRY/sample/atom_types-field
- /NXem/ENTRY/roiID/eds/indexing/atom_types-field
- /NXem/ENTRY/sample/atom_types-field
- /NXem_eds/indexing/atom_types-field
- /NXiv_temp/ENTRY/SAMPLE/atom_types-field
- /NXmpes/ENTRY/SAMPLE/atom_types-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/atom_types-field
- attached_to
- /NXactuator/attached_to-field
- /NXsensor/attached_to-field
- /NXsensor_sts/attached_to-field
- attenuation
- /NXbeam_path/ATTENUATOR/attenuation-field
- /NXfiber/attenuation-field
- attenuator
- /NXbeam_path/ATTENUATOR-group
- /NXinstrument/ATTENUATOR-group
- /NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group
- /NXsnsevent/ENTRY/instrument/ATTENUATOR-group
- /NXsnshisto/ENTRY/instrument/ATTENUATOR-group
- /NXxrot/entry/instrument/attenuator-group
- attenuator_transmission
- /NXattenuator/attenuator_transmission-field
- /NXbeam_path/ATTENUATOR/attenuator_transmission-field
- /NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
- /NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field
- /NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field
- /NXxrot/entry/instrument/attenuator/attenuator_transmission-field
- author
- /NXnote/author-field
- /NXsnsevent/ENTRY/SNSHistoTool/author-field
- /NXsnshisto/ENTRY/SNSHistoTool/author-field
- autophase
- /NXapm_compositionspace_config/ENTRY/config/autophase-group
- /NXapm_compositionspace_results/ENTRY/autophase-group
- average_power
- /NXbeam/average_power-field
- average_value
- /NXlog/average_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
- average_value_error
- /NXlog/average_value_error-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
- average_value_errors
- /NXlog/average_value_errors-field
- /NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
- /NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
- axis_aic
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_aic-field
- axis_angle_convention
- /NXcoordinate_system_set/axis_angle_convention-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/axis_angle_convention-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/axis_angle_convention-field
- axis_bic
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_bic-field
- axis_dimension
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/axis_dimension-field
- axis_energy
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_energy-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_energy-field
- /NXem/ENTRY/roiID/eds/indexing/summary/axis_energy-field
- /NXem_eds/indexing/summary/axis_energy-field
- /NXspectrum_set/spectrum_0d/axis_energy-field
- /NXspectrum_set/spectrum_1d/axis_energy-field
- /NXspectrum_set/spectrum_2d/axis_energy-field
- /NXspectrum_set/spectrum_3d/axis_energy-field
- /NXspectrum_set/stack_0d/axis_energy-field
- /NXspectrum_set/stack_2d/axis_energy-field
- /NXspectrum_set/stack_3d/axis_energy-field
- axis_explained_variance
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_explained_variance-field
- axis_feature_identifier
- /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_identifier-field
- axis_feature_importance
- /NXapm_compositionspace_results/ENTRY/autophase/result/axis_feature_importance-field
- axis_i
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_i-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_i-field
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_i-field
- /NXimage_set/image_1d/axis_i-field
- /NXimage_set/image_2d/axis_i-field
- /NXimage_set/image_3d/axis_i-field
- /NXimage_set/stack_1d/axis_i-field
- /NXimage_set/stack_2d/axis_i-field
- /NXimage_set/stack_3d/axis_i-field
- /NXspectrum_set/spectrum_1d/axis_i-field
- /NXspectrum_set/spectrum_2d/axis_i-field
- /NXspectrum_set/spectrum_3d/axis_i-field
- /NXspectrum_set/stack_2d/axis_i-field
- /NXspectrum_set/stack_3d/axis_i-field
- axis_j
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/axis_j-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_j-field
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/axis_j-field
- /NXimage_set/image_2d/axis_j-field
- /NXimage_set/image_3d/axis_j-field
- /NXimage_set/stack_2d/axis_j-field
- /NXimage_set/stack_3d/axis_j-field
- /NXspectrum_set/spectrum_2d/axis_j-field
- /NXspectrum_set/spectrum_3d/axis_j-field
- /NXspectrum_set/stack_2d/axis_j-field
- /NXspectrum_set/stack_3d/axis_j-field
- axis_k
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/axis_k-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/axis_k-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/axis_k-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/axis_k-field
- /NXimage_set/image_3d/axis_k-field
- /NXimage_set/stack_3d/axis_k-field
- /NXspectrum_set/spectrum_3d/axis_k-field
- /NXspectrum_set/stack_3d/axis_k-field
- axis_mass_to_charge
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge-field
- axis_pattern_identifier
- /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_pattern_identifier-field
- /NXem_calorimetry/ENTRY/background_subtraction/result/axis_pattern_identifier-field
- axis_pca_dimension
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/axis_pca_dimension-field
- axis_s
- /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_s-field
- /NXem_calorimetry/ENTRY/background_subtraction/result/axis_s-field
- axis_time
- /NXem_calorimetry/ENTRY/azimuthal_integration/result/axis_time-field
- /NXem_calorimetry/ENTRY/background_subtraction/result/axis_time-field
- axis_x
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_x-field
- /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_x-field
- /NXem_correlation/indexing/roi/axis_x-field
- /NXem_ebsd/indexing/roi/axis_x-field
- /NXmicrostructure_ipf/legend/axis_x-field
- /NXmicrostructure_ipf/map/axis_x-field
- /NXmicrostructure_pf/pf/axis_x-field
- axis_y
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_y-field
- /NXem/ENTRY/roiID/ebsd/indexing/roi/axis_y-field
- /NXem_correlation/indexing/roi/axis_y-field
- /NXem_ebsd/indexing/roi/axis_y-field
- /NXmicrostructure_ipf/legend/axis_y-field
- /NXmicrostructure_ipf/map/axis_y-field
- /NXmicrostructure_pf/pf/axis_y-field
- axis_z
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/axis_z-field
- /NXem_correlation/indexing/roi/axis_z-field
- /NXmicrostructure_ipf/map/axis_z-field
- axisname
- /NXbeam_path/TRANSFORMATIONS/AXISNAME-field
- /NXdata/AXISNAME-field
- /NXtransformations/AXISNAME-field
- axisname_end
- /NXtransformations/AXISNAME_end-field
- axisname_increment_set
- /NXtransformations/AXISNAME_increment_set-field
- azimuth
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/azimuth-field
- azimuthal
- /NXspe/ENTRY/data/azimuthal-field
- azimuthal_angle
- /NXcrystal/azimuthal_angle-field
- /NXdetector/azimuthal_angle-field
- /NXlauetof/entry/instrument/detector/azimuthal_angle-field
- /NXreflections/azimuthal_angle-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field
- /NXsastof/ENTRY/instrument/detector/azimuthal_angle-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field
- /NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field
- /NXtofraw/entry/instrument/detector/azimuthal_angle-field
- /NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
- azimuthal_integration
- /NXem_calorimetry/ENTRY/azimuthal_integration-group
- azimuthal_width
- /NXspe/ENTRY/data/azimuthal_width-field
- b
- /NXcsg/b-group
- b_2
- /NXcorrector_cs/tableauID/b_2-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_2-group
- b_4
- /NXcorrector_cs/tableauID/b_4-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_4-group
- b_axis_direction
- /NXmicrostructure_mtex_config/conventions/b_axis_direction-field
- background
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/background-field
- /NXem_calorimetry/ENTRY/background_subtraction/background-group
- background_correction
- /NXem_ebsd/indexing/background_correction-group
- background_mean
- /NXreflections/background_mean-field
- background_quantification
- /NXapm/ENTRY/atom_probe/ranging/background_quantification-group
- /NXapm_ranging/background_quantification-group
- background_subtraction
- /NXem_calorimetry/ENTRY/background_subtraction-group
- backgroundbackground
- /NXfit/backgroundBACKGROUND-group
- /NXxps/ENTRY/FIT/backgroundBACKGROUND-group
- backside_roughness
- /NXellipsometry/ENTRY/SAMPLE/backside_roughness-field
- backward_sweep
- /NXbias_spectroscopy/backward_sweep-field
- /NXiv_bias/backward_sweep-field
- /NXsts/ENTRY/reproducibility_indicators/backward_sweep-field
- bandwidth
- /NXamplifier/bandwidth-field
- /NXbeam_path/SOURCE/bandwidth-field
- /NXinsertion_device/bandwidth-field
- base_temperature
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/stage_lab/base_temperature-field
- /NXevent_data_apm/instrument/stage_lab/base_temperature-field
- base_vector_a
- /NXunit_cell/base_vector_a-field
- base_vector_b
- /NXunit_cell/base_vector_b-field
- base_vector_c
- /NXunit_cell/base_vector_c-field
- beam
- /NXcontainer/beam-group
- /NXebeam_column/BEAM-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/BEAM-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/BEAM-group
- /NXibeam_column/BEAM-group
- /NXinstrument/BEAM-group
- /NXmx/ENTRY/INSTRUMENT/BEAM-group
- /NXpulser_apm/SOURCE/BEAM-group
- /NXsample/BEAM-group
- /NXxrd/ENTRY/INSTRUMENT/BEAM-group
- beam_1
- /NXcxi_ptycho/entry_1/instrument_1/beam_1-group
- beam_attenuation_factors
- /NXxrd_pan/ENTRY/experiment_config/beam_attenuation_factors-field
- beam_azimuth_angle
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_azimuth_angle-field
- beam_center_derived
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
- beam_center_x
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field
- /NXdetector/beam_center_x-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
- /NXsastof/ENTRY/instrument/detector/beam_center_x-field
- /NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
- /NXxrot/entry/instrument/detector/beam_center_x-field
- beam_center_y
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field
- /NXdetector/beam_center_y-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
- /NXsastof/ENTRY/instrument/detector/beam_center_y-field
- /NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
- /NXxrot/entry/instrument/detector/beam_center_y-field
- beam_device
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE-group
- beam_incident
- /NXraman/ENTRY/INSTRUMENT/beam_incident-group
- beam_polar_angle_of_incidence
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations/beam_polar_angle_of_incidence-field
- beam_polarization_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/beam_polarization_type-field
- beam_position
- /NXdisk_chopper/beam_position-field
- beam_profile
- /NXbeam_path/SOURCE/beam_profile-field
- beam_ref_frame
- /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame-group
- beam_sample_relation
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/beam_sample_relation-field
- beam_shape
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
- beam_size_x
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
- beam_size_y
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
- beam_splitter
- /NXbeam_path/BEAM_SPLITTER-group
- beam_stop
- /NXinstrument/BEAM_STOP-group
- beam_transfer_matrix_table
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_TRANSFER_MATRIX_TABLE-group
- beam_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE-group
- beamline
- /NXsnsevent/ENTRY/instrument/beamline-field
- /NXsnshisto/ENTRY/instrument/beamline-field
- beamline_distance
- /NXelectrostatic_kicker/beamline_distance-field
- /NXmagnetic_kicker/beamline_distance-field
- /NXquadrupole_magnet/beamline_distance-field
- /NXseparator/beamline_distance-field
- /NXsolenoid_magnet/beamline_distance-field
- /NXspin_rotator/beamline_distance-field
- beamtype
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE-group
- /NXxps/ENTRY/INSTRUMENT/beamTYPE-group
- bend_angle_x
- /NXguide/bend_angle_x-field
- /NXmirror/bend_angle_x-field
- bend_angle_y
- /NXguide/bend_angle_y-field
- /NXmirror/bend_angle_y-field
- bending_magnet
- /NXinstrument/BENDING_MAGNET-group
- bending_radius
- /NXbending_magnet/bending_radius-field
- bias
- /NXiv_bias/bias-field
- /NXsts/ENTRY/INSTRUMENT/sample_bias/bias-field
- /NXsts/ENTRY/reproducibility_indicators/bias-field
- bias_calibration
- /NXsts/ENTRY/INSTRUMENT/sample_bias/bias_calibration-field
- /NXsts/ENTRY/reproducibility_indicators/bias_calibration-field
- bias_divider
- /NXlockin/bias_divider-field
- bias_env
- /NXmpes/ENTRY/SAMPLE/bias_env-group
- bias_offset
- /NXsts/ENTRY/INSTRUMENT/sample_bias/bias_offset-field
- /NXsts/ENTRY/reproducibility_indicators/bias_offset-field
- bias_spectroscopy
- /NXiv_bias/BIAS_SPECTROSCOPY-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy-group
- bias_voltage
- /NXstage_lab/bias_voltage-field
- bibtex
- /NXcite/bibtex-field
- binding_energy
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/binding_energy-field
- /NXprocess_mpes/energy_referencing/binding_energy-field
- binning
- /NXem_ebsd/indexing/binning-group
- biprism
- /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/biprism-group
- bit_depth_readout
- /NXdetector/bit_depth_readout-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
- bitdepth
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/bitdepth-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/bitdepth-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/bitdepth-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/bitdepth-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/bitdepth-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/bitdepth-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/bitdepth-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/bitdepth-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/bitdepth-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_selector_results/ENTRY/roi/window/bitdepth-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/bitdepth-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/bitdepth-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/bitdepth-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/bitdepth-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/bitdepth-field
- /NXapm_paraprobe_tool_results/window/bitdepth-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/bitdepth-field
- /NXcs_filter_boolean_mask/bitdepth-field
- bitmask
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask-group
- blade_geometry
- /NXaperture/BLADE_GEOMETRY-group
- blade_spacing
- /NXcollimator/blade_spacing-field
- blade_thickness
- /NXcollimator/blade_thickness-field
- blaze_wavelength
- /NXbeam_path/GRATING/blaze_wavelength-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
- block
- /NXregion/block-field
- boundaries
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/boundaries-field
- /NXcg_grid/boundaries-field
- /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundaries-field
- boundary
- /NXmicrostructure_score_results/ENTRY/discretization/boundary-group
- boundary_conditions
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/boundary_conditions-field
- /NXcg_grid/boundary_conditions-field
- /NXmicrostructure_score_results/ENTRY/discretization/boundary/boundary_conditions-field
- boundary_contact
- /NXmicrostructure/crystal/boundary_contact-field
- /NXmicrostructure/interface/boundary_contact-field
- /NXmicrostructure/quadruple_junction/boundary_contact-field
- /NXmicrostructure/triple_junction/boundary_contact-field
- bounding_box
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box-group
- /NXcg_grid/bounding_box-group
- /NXreflections/bounding_box-field
- bragg_angle
- /NXcrystal/bragg_angle-field
- bright_field
- /NXtomophase/entry/instrument/bright_field-group
- brightness
- /NXibeam_column/ion_source/brightness-field
- buffer_chamber
- /NXapm_msr/instrument/buffer_chamber-group
- /NXevent_data_apm/instrument/buffer_chamber-group
- bunch_distance
- /NXsource/bunch_distance-field
- bunch_length
- /NXsource/bunch_length-field
- bunch_pattern
- /NXsource/bunch_pattern-group
- bunge_euler
- /NXmicrostructure_imm_config/ENTRY/component_analysis/bunge_euler-field
- /NXmicrostructure_imm_config/ENTRY/orientation_distribution/bunge_euler-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/bunge_euler-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/bunge_euler-field
- /NXmicrostructure_score_config/ENTRY/deformation/bunge_euler-field
- /NXmicrostructure_score_config/ENTRY/nucleation/bunge_euler-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/bunge_euler-field
- c_1
- /NXcorrector_cs/tableauID/c_1-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1-group
- c_1_0
- /NXcorrector_cs/tableauID/c_1_0-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_0-group
- c_1_2_a
- /NXcorrector_cs/tableauID/c_1_2_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_a-group
- c_1_2_b
- /NXcorrector_cs/tableauID/c_1_2_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_b-group
- c_2_1_a
- /NXcorrector_cs/tableauID/c_2_1_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_a-group
- c_2_1_b
- /NXcorrector_cs/tableauID/c_2_1_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_b-group
- c_2_3_a
- /NXcorrector_cs/tableauID/c_2_3_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_a-group
- c_2_3_b
- /NXcorrector_cs/tableauID/c_2_3_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_b-group
- c_3
- /NXcorrector_cs/tableauID/c_3-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3-group
- c_3_0
- /NXcorrector_cs/tableauID/c_3_0-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_0-group
- c_3_2_a
- /NXcorrector_cs/tableauID/c_3_2_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_a-group
- c_3_2_b
- /NXcorrector_cs/tableauID/c_3_2_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_b-group
- c_3_4_a
- /NXcorrector_cs/tableauID/c_3_4_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a-group
- c_3_4_b
- /NXcorrector_cs/tableauID/c_3_4_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_b-group
- c_4_1_a
- /NXcorrector_cs/tableauID/c_4_1_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_a-group
- c_4_1_b
- /NXcorrector_cs/tableauID/c_4_1_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_b-group
- c_4_3_a
- /NXcorrector_cs/tableauID/c_4_3_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_a-group
- c_4_3_b
- /NXcorrector_cs/tableauID/c_4_3_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_b-group
- c_4_5_a
- /NXcorrector_cs/tableauID/c_4_5_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_a-group
- c_4_5_b
- /NXcorrector_cs/tableauID/c_4_5_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_b-group
- c_5
- /NXcorrector_cs/tableauID/c_5-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5-group
- c_5_0
- /NXcorrector_cs/tableauID/c_5_0-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_0-group
- c_5_2_a
- /NXcorrector_cs/tableauID/c_5_2_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_a-group
- c_5_2_b
- /NXcorrector_cs/tableauID/c_5_2_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_b-group
- c_5_4_a
- /NXcorrector_cs/tableauID/c_5_4_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_a-group
- c_5_4_b
- /NXcorrector_cs/tableauID/c_5_4_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_b-group
- c_5_6_a
- /NXcorrector_cs/tableauID/c_5_6_a-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_a-group
- c_5_6_b
- /NXcorrector_cs/tableauID/c_5_6_b-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_b-group
- c_one
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_one-field
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_one-field
- c_three
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_three-field
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_three-field
- c_two
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/c_two-field
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/c_two-field
- calib_n
- /NXpositioner_sts/calib_N-field
- /NXsts/ENTRY/INSTRUMENT/piezo_config/calib_N-field
- calibrated_axis
- /NXcalibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/angularN_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/delay_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/ellipticity_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/energy_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/kN_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/polarization_angle_calibration/calibrated_axis-field
- /NXmpes/ENTRY/PROCESS_MPES/spatialN_calibration/calibrated_axis-field
- /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration/calibrated_axis-field
- /NXprocess_mpes/angularN_calibration/calibrated_axis-field
- /NXprocess_mpes/delay_calibration/calibrated_axis-field
- /NXprocess_mpes/ellipticity_calibration/calibrated_axis-field
- /NXprocess_mpes/energy_calibration/calibrated_axis-field
- /NXprocess_mpes/energy_referencing/calibrated_axis-field
- /NXprocess_mpes/kN_calibration/calibrated_axis-field
- /NXprocess_mpes/polarization_angle_calibration/calibrated_axis-field
- /NXprocess_mpes/spatialN_calibration/calibrated_axis-field
- calibrated_tof
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/calibrated_tof-field
- /NXapm_volt_and_bowl/calibrated_tof-field
- calibration
- /NXcircuit/calibration-field
- /NXem_ebsd/calibration-group
- /NXiv_bias/calibration-field
- /NXprocess/CALIBRATION-group
- /NXprocess_mpes/CALIBRATION-group
- /NXresolution/CALIBRATION-group
- calibration_accuracy
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_accuracy-group
- calibration_date
- /NXdetector/calibration_date-field
- calibration_method
- /NXcalibration/calibration_method-group
- /NXdetector/calibration_method-group
- calibration_object
- /NXcalibration/calibration_object-group
- calibration_reference
- /NXcalibration/calibration_reference-group
- calibration_software
- /NXcalibration/calibration_software-field
- calibration_status
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_status-field
- calibration_style
- /NXscanbox_em/calibration_style-field
- calibration_time
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/calibration_time-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/calibration_time-field
- cameca_to_nexus
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus-group
- /NXapm_paraprobe_clusterer_results/ENTRY/cameca_to_nexus-group
- camera_length
- /NXoptical_system_em/camera_length-field
- canonical_smile
- /NXsubstance/canonical_smile-field
- capability
- /NXfabrication/capability-field
- capillary
- /NXinstrument/CAPILLARY-group
- capital_phi
- /NXmicrostructure_odf/phi_two_plot/capital_phi-field
- cardinality
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cardinality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/cardinality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/cardinality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/cardinality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/cardinality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/cardinality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/cardinality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/cardinality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/cardinality-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/cardinality-field
- /NXcg_primitive_set/cardinality-field
- /NXgraph_node_set/cardinality-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/cardinality-field
- /NXsimilarity_grouping/cardinality-field
- cas_image
- /NXsubstance/cas_image-group
- cas_name
- /NXsubstance/cas_name-field
- cas_number
- /NXsubstance/cas_number-field
- cas_synonyms
- /NXsubstance/cas_synonyms-field
- cas_uri
- /NXsubstance/cas_uri-field
- categorical_label
- /NXsimilarity_grouping/categorical_label-field
- categorical_labels
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/categorical_labels-field
- category
- /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/category-field
- cdeform_field
- /NXdistortion/cdeform_field-field
- cell_dimensions
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/cell_dimensions-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/cell_dimensions-field
- /NXcg_grid/cell_dimensions-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/cell_dimensions-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/cell_dimensions-field
- /NXmicrostructure_score_config/ENTRY/discretization/grid/cell_dimensions-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/cell_dimensions-field
- center
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/center-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/center-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/center-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/center-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/center-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/center-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/center-field
- /NXcg_primitive_set/center-field
- /NXem_calorimetry/ENTRY/distortion_correction/result/center-field
- /NXscanbox_em/center-field
- center_energy
- /NXenergydispersion/center_energy-field
- central_stop_diameter
- /NXfresnel_zone_plate/central_stop_diameter-field
- central_stop_material
- /NXfresnel_zone_plate/central_stop_material-field
- central_stop_thickness
- /NXfresnel_zone_plate/central_stop_thickness-field
- cg_cylinder_set
- /NXcg_roi_set/CG_CYLINDER_SET-group
- /NXspatial_filter/CG_CYLINDER_SET-group
- cg_ellipsoid_set
- /NXcg_roi_set/CG_ELLIPSOID_SET-group
- /NXspatial_filter/CG_ELLIPSOID_SET-group
- cg_geodesic_mesh
- /NXem_sim/simulation/CG_GEODESIC_MESH-group
- cg_grid
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid-group
- /NXmicrostructure/CG_GRID-group
- cg_half_edge_data_structure
- /NXcg_triangulated_surface_mesh/CG_HALF_EDGE_DATA_STRUCTURE-group
- cg_hexahedron_set
- /NXcg_roi_set/CG_HEXAHEDRON_SET-group
- /NXspatial_filter/CG_HEXAHEDRON_SET-group
- cg_parallelogram_set
- /NXcg_roi_set/CG_PARALLELOGRAM_SET-group
- cg_point_set
- /NXmicrostructure/CG_POINT_SET-group
- cg_polygon_set
- /NXmicrostructure/CG_POLYGON_SET-group
- cg_polyhedron_set
- /NXcg_roi_set/CG_POLYHEDRON_SET-group
- /NXmicrostructure/CG_POLYHEDRON_SET-group
- /NXspatial_filter/CG_POLYHEDRON_SET-group
- cg_polyline_set
- /NXmicrostructure/CG_POLYLINE_SET-group
- cg_sphere_set
- /NXcg_roi_set/CG_SPHERE_SET-group
- cg_triangle_set
- /NXmicrostructure/CG_TRIANGLE_SET-group
- cg_triangulated_surface_mesh
- /NXcg_geodesic_mesh/CG_TRIANGULATED_SURFACE_MESH-group
- chamber
- /NXebeam_column/CHAMBER-group
- /NXem/ENTRY/measurement/em_lab/CHAMBER-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/chamber-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/chamber-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/CHAMBER-group
- /NXem_msr/em_lab/CHAMBER-group
- /NXevent_data_em/em_lab/CHAMBER-group
- /NXibeam_column/CHAMBER-group
- chamber_pressure
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/analysis_chamber/chamber_pressure-field
- /NXevent_data_apm/instrument/analysis_chamber/chamber_pressure-field
- changer_position
- /NXsample/changer_position-field
- /NXsnsevent/ENTRY/sample/changer_position-field
- /NXsnshisto/ENTRY/sample/changer_position-field
- channels
- /NXbias_spectroscopy/channels-field
- /NXcircuit/channels-field
- /NXiv_bias/channels-field
- channels_current
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/circuit/channels_current-field
- charge
- /NXatom_set/charge-field
- /NXion/charge-field
- charge_state
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/charge_state-field
- /NXapm_charge_state_analysis/charge_state-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/charge_state-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/charge_state-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/charge_state-field
- /NXatom_set/charge_state-field
- /NXion/charge_state-field
- charge_state_analysis
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis-group
- checksum
- /NXapm/ENTRY/atom_probe/hit_finding/serialized/checksum-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/checksum-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/checksum-field
- /NXapm/ENTRY/atom_probe/ranging/definitions/checksum-field
- /NXapm/ENTRY/atom_probe/raw_data/serialized/checksum-field
- /NXapm/ENTRY/atom_probe/reconstruction/config/checksum-field
- /NXapm/ENTRY/atom_probe/reconstruction/results/checksum-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/checksum-field
- /NXapm/ENTRY/serializedID/checksum-field
- /NXapm_compositionspace_config/ENTRY/config/ranging/checksum-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/checksum-field
- /NXapm_compositionspace_results/ENTRY/config/checksum-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/checksum-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/checksum-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/checksum-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/checksum-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/checksum-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/checksum-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/checksum-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/checksum-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/checksum-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/checksum-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/checksum-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/checksum-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/checksum-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/checksum-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/checksum-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/checksum-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging/checksum-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/checksum-field
- /NXapm_paraprobe_selector_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/checksum-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/checksum-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/checksum-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/checksum-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/checksum-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/checksum-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/checksum-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/checksum-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/checksum-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/config/checksum-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/checksum-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/checksum-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/checksum-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/config/checksum-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/checksum-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/checksum-field
- /NXem/ENTRY/roiID/ebsd/indexing/source/checksum-field
- /NXem/ENTRY/roiID/ebsd/measurement/source/checksum-field
- /NXem/ENTRY/roiID/ebsd/simulation/source/checksum-field
- /NXem/ENTRY/serializedID/checksum-field
- /NXem_calorimetry/ENTRY/actuator/checksum-field
- /NXem_calorimetry/ENTRY/diffraction/checksum-field
- /NXmicrostructure_gragles_config/ENTRY/discretization/grid/checksum-field
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd/checksum-field
- /NXserialized/checksum-field
- chemical_composition
- /NXapm/ENTRY/sample/chemical_composition-group
- chemical_formula
- /NXarchive/entry/sample/chemical_formula-field
- /NXcontainer/chemical_formula-field
- /NXcrystal/chemical_formula-field
- /NXdispersive_material/ENTRY/sample/chemical_formula-field
- /NXfilter/chemical_formula-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/chemical_formula-field
- /NXsample/chemical_formula-field
- /NXsample_component/chemical_formula-field
- chemical_process
- /NXhistory/CHEMICAL_PROCESS-group
- chemical_symbol
- /NXapm/ENTRY/sample/chemical_composition/ionID/chemical_symbol-field
- chi
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/chi-field
- /NXxeuler/entry/name/chi-link
- /NXxeuler/entry/sample/chi-field
- /NXxrd_pan/ENTRY/experiment_result/chi-field
- chirp_gdd
- /NXbeam/chirp_GDD-field
- chirp_type
- /NXbeam/chirp_type-field
- chopper
- /NXreftof/entry/instrument/chopper-group
- chromatic
- /NXlens_opt/chromatic-field
- cif
- /NXmicrostructure_mtex_config/path/cif-field
- circuit
- /NXcomponent/CIRCUIT-group
- /NXcs_computer/memory/CIRCUIT-group
- /NXcs_computer/processing/CIRCUIT-group
- /NXcs_computer/storage/CIRCUIT-group
- /NXscanbox_em/CIRCUIT-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/circuit-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit-group
- cite
- /NXapm/ENTRY/CITE-group
- /NXem_calorimetry/ENTRY/CITE-group
- citeid
- /NXem/ENTRY/citeID-group
- clad_diameter
- /NXfiber/cladding/clad_diameter-field
- clad_index_of_refraction
- /NXfiber/cladding/clad_index_of_refraction-field
- clad_material
- /NXfiber/cladding/clad_material-field
- cladding
- /NXfiber/cladding-group
- cleaning_step
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP-group
- clear_aperture
- /NXbeam_splitter/clear_aperture-field
- /NXwaveplate/clear_aperture-field
- closest_corner
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/closest_corner-field
- cluster_analysisid
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID-group
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID-group
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID-group
- cluster_composition
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_composition-field
- cluster_identifier
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_identifier-field
- cluster_selection_epsilon
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/cluster_selection_epsilon-field
- cluster_statistics
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/cluster_statistics-field
- clustering
- /NXapm_compositionspace_config/ENTRY/config/clustering-group
- /NXapm_compositionspace_results/ENTRY/clustering-group
- coating
- /NXbeam_splitter/coating-group
- /NXfiber/coating-group
- /NXlens_opt/COATING-group
- /NXpolarizer_opt/COATING-group
- /NXwaveplate/coating-group
- coating_diameter
- /NXfiber/coating/coating_diameter-field
- coating_material
- /NXbeam_splitter/coating/coating_material-field
- /NXfiber/coating/coating_material-field
- /NXfilter/coating_material-field
- /NXgrating/coating_material-field
- /NXguide/coating_material-field
- /NXlens_opt/COATING/coating_material-field
- /NXmirror/coating_material-field
- /NXpolarizer_opt/COATING/coating_material-field
- /NXwaveplate/coating/coating_material-field
- coating_roughness
- /NXfilter/coating_roughness-field
- /NXgrating/coating_roughness-field
- /NXguide/coating_roughness-field
- /NXmirror/coating_roughness-field
- coating_thickness
- /NXbeam_splitter/coating/coating_thickness-field
- /NXlens_opt/COATING/coating_thickness-field
- /NXpolarizer_opt/COATING/coating_thickness-field
- /NXwaveplate/coating/coating_thickness-field
- coating_type
- /NXbeam_splitter/coating/coating_type-field
- /NXlens_opt/COATING/coating_type-field
- /NXpolarizer_opt/COATING/coating_type-field
- /NXwaveplate/coating/coating_type-field
- coefficients
- /NXcalibration/coefficients-field
- coherence_length
- /NXbeam_path/SOURCE/coherence_length-field
- collection
- /NXcanSAS/ENTRY/COLLECTION-group
- /NXcanSAS/ENTRY/PROCESS/COLLECTION-group
- /NXdetector/COLLECTION-group
- /NXentry/COLLECTION-group
- /NXinstrument/COLLECTION-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/COLLECTION-group
- /NXsubentry/COLLECTION-group
- collection_description
- /NXarchive/entry/collection_description-field
- /NXentry/collection_description-field
- /NXsubentry/collection_description-field
- collection_identifier
- /NXarchive/entry/collection_identifier-field
- /NXentry/collection_identifier-group
- /NXsnsevent/ENTRY/collection_identifier-field
- /NXsnshisto/ENTRY/collection_identifier-field
- /NXsts/ENTRY/collection_identifier-group
- /NXsubentry/collection_identifier-group
- collection_time
- /NXarchive/entry/collection_time-field
- /NXentry/collection_time-field
- /NXsubentry/collection_time-field
- collection_title
- /NXsnsevent/ENTRY/collection_title-field
- /NXsnshisto/ENTRY/collection_title-field
- collectioncolumn
- /NXelectronanalyser/COLLECTIONCOLUMN-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN-group
- collimator
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR-group
- /NXinstrument/COLLIMATOR-group
- /NXsas/ENTRY/INSTRUMENT/COLLIMATOR-group
- /NXsastof/ENTRY/instrument/collimator-group
- colloquial_name
- /NXdispersive_material/ENTRY/sample/colloquial_name-field
- color_map
- /NXmicrostructure_mtex_config/plotting/color_map-field
- color_palette
- /NXmicrostructure_mtex_config/plotting/color_palette-field
- command1
- /NXsnsevent/ENTRY/SNSHistoTool/command1-field
- /NXsnshisto/ENTRY/SNSHistoTool/command1-field
- command_line_call
- /NXcs_profiling/command_line_call-field
- comment
- /NXmicrostructure/comment-field
- common
- /NXapm_paraprobe_clusterer_config/ENTRY/common-group
- /NXapm_paraprobe_clusterer_results/ENTRY/common-group
- /NXapm_paraprobe_distancer_config/ENTRY/common-group
- /NXapm_paraprobe_distancer_results/ENTRY/common-group
- /NXapm_paraprobe_intersector_config/ENTRY/common-group
- /NXapm_paraprobe_intersector_results/ENTRY/common-group
- /NXapm_paraprobe_nanochem_config/ENTRY/common-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common-group
- /NXapm_paraprobe_ranger_config/ENTRY/common-group
- /NXapm_paraprobe_ranger_results/ENTRY/common-group
- /NXapm_paraprobe_selector_config/ENTRY/common-group
- /NXapm_paraprobe_selector_results/ENTRY/common-group
- /NXapm_paraprobe_spatstat_config/ENTRY/common-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common-group
- /NXapm_paraprobe_surfacer_config/ENTRY/common-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common-group
- /NXapm_paraprobe_tessellator_config/ENTRY/common-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common-group
- /NXapm_paraprobe_transcoder_config/ENTRY/common-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common-group
- common_beam_depolarizer
- /NXtransmission/ENTRY/instrument/common_beam_depolarizer-field
- common_beam_mask
- /NXtransmission/ENTRY/instrument/common_beam_mask-group
- comp_current
- /NXflipper/comp_current-field
- comp_turns
- /NXflipper/comp_turns-field
- complex
- /NXimage_set/image_1d/complex-field
- /NXimage_set/image_2d/complex-field
- /NXimage_set/image_3d/complex-field
- /NXimage_set/stack_1d/complex-field
- /NXimage_set/stack_2d/complex-field
- /NXimage_set/stack_3d/complex-field
- component
- /NXebeam_column/COMPONENT-group
- /NXibeam_column/COMPONENT-group
- /NXsample/component-field
- component_analysis
- /NXmicrostructure_imm_config/ENTRY/component_analysis-group
- component_index
- /NXgeometry/component_index-field
- component_name
- /NXmicrostructure_imm_config/ENTRY/component_analysis/component_name-field
- composition
- /NXapm/ENTRY/sample/chemical_composition/ionID/composition-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition-group
- /NXchemical_composition/ION/composition-field
- /NXpolarizer/composition-field
- composition_error
- /NXapm/ENTRY/sample/chemical_composition/ionID/composition_error-field
- concentration
- /NXsample/concentration-field
- /NXsample_component_set/concentration-field
- config
- /NXapm/ENTRY/atom_probe/reconstruction/config-group
- /NXapm_compositionspace_config/ENTRY/config-group
- /NXapm_compositionspace_results/ENTRY/config-group
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config-group
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/config-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/config-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/config-group
- /NXapm_paraprobe_selector_results/ENTRY/common/config-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/config-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/config-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/config-group
- /NXapm_paraprobe_tool_common/config-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/config-group
- /NXem_calorimetry/ENTRY/azimuthal_integration/config-group
- /NXem_calorimetry/ENTRY/background_subtraction/config-group
- /NXem_calorimetry/ENTRY/distortion_correction/config-group
- /NXem_calorimetry/ENTRY/pattern_center/config-group
- configuration
- /NXmicrostructure/configuration-group
- /NXmicrostructure_odf/configuration-group
- /NXmicrostructure_pf/configuration-group
- construction_year
- /NXfabrication/construction_year-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/construction_year-field
- contrast_aperture
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/contrast_aperture-group
- control
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control-group
- /NXevent_data_apm/instrument/control-group
- /NXlauetof/entry/control-group
- /NXrefscan/entry/control-group
- /NXreftof/entry/control-group
- /NXsastof/ENTRY/control-group
- /NXstxm/ENTRY/control-group
- /NXtomo/entry/control-group
- /NXtomophase/entry/control-group
- /NXxbase/entry/control-group
- control_point
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point-group
- control_points
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/control_points-field
- control_programid
- /NXem/ENTRY/measurement/em_lab/control_programID-group
- controller_name
- /NXpositioner_sts/controller_name-field
- controller_record
- /NXpositioner/controller_record-field
- /NXpositioner_sts/controller_record-field
- convention
- /NXdispersion_function/convention-field
- /NXdispersion_table/convention-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/convention-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/convention-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/convention-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/convention-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/convention-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/convention-field
- conventions
- /NXmicrostructure_mtex_config/conventions-group
- convolution_mode
- /NXmicrostructure_gragles_config/ENTRY/numerics/convolution_mode-field
- cooler_or_heater
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/cooler_or_heater-field
- coordinate
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/coordinate-field
- /NXcg_grid/coordinate-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/coordinate-field
- coordinate_system
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM-group
- /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM-group
- /NXcoordinate_system_set/COORDINATE_SYSTEM-group
- /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM-group
- /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM-group
- coordinate_system_set
- /NXapm/ENTRY/coordinate_system_set-group
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set-group
- /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set-group
- /NXem/ENTRY/coordinate_system_set-group
- /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET-group
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set-group
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set-group
- coordinate_system_transformations
- /NXxps/ENTRY/geometries/xps_coordinate_system/coordinate_system_transformations-group
- coprecipitation_analysis
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis-group
- core
- /NXfiber/core-group
- core_diameter
- /NXfiber/core/core_diameter-field
- core_index_of_refraction
- /NXfiber/core/core_index_of_refraction-field
- core_material
- /NXfiber/core/core_material-field
- core_sample_indices
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/core_sample_indices-field
- corrector_ax
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax-group
- corrector_cs
- /NXebeam_column/CORRECTOR_CS-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs-group
- correlation
- /NXem/ENTRY/roiID/correlation-group
- count
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/count-field
- /NXchemical_composition/ION/count-field
- /NXregion/count-field
- count_time
- /NXdetector/count_time-field
- /NXmonitor/count_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/count_time-field
- /NXxpcs/entry/instrument/DETECTOR/count_time-field
- /NXxrd_pan/ENTRY/experiment_config/count_time-field
- countrate_correction_applied
- /NXdetector/countrate_correction_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_applied-field
- countrate_correction_lookup_table
- /NXdetector/countrate_correction_lookup_table-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/countrate_correction_lookup_table-field
- coupled
- /NXmoderator/coupled-field
- coupling_material
- /NXmoderator/coupling_material-field
- /NXsnsevent/ENTRY/instrument/moderator/coupling_material-field
- /NXsnshisto/ENTRY/instrument/moderator/coupling_material-field
- crate
- /NXdetector/crate-field
- critical_energy
- /NXbending_magnet/critical_energy-field
- crosstalk_compensation
- /NXamplifier/crosstalk_compensation-field
- crosstalk_factor
- /NXamplifier/crosstalk_factor-field
- cryo_bottom_temp
- /NXsts/ENTRY/INSTRUMENT/cryo_bottom_temp-field
- /NXsts/ENTRY/resolution_indicators/cryo_bottom_temp-field
- cryo_shield_temp
- /NXsts/ENTRY/INSTRUMENT/cryo_shield_temp-field
- /NXsts/ENTRY/resolution_indicators/cryo_shield_temp-field
- cryostat
- /NXmanipulator/cryostat-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat-group
- /NXmpes/ENTRY/SAMPLE/temperature_env/cryostat-group
- crystal
- /NXinstrument/CRYSTAL-group
- /NXmicrostructure/crystal-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal-group
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal-group
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal-group
- /NXmonochromator/CRYSTAL-group
- /NXmonopd/entry/INSTRUMENT/CRYSTAL-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL-group
- crystal_identifier
- /NXmicrostructure/crystal/crystal_identifier-field
- /NXmicrostructure/interface/crystal_identifier-field
- /NXmicrostructure/quadruple_junction/crystal_identifier-field
- /NXmicrostructure/triple_junction/crystal_identifier-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/crystal_identifier-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/crystal_identifier-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/crystal_identifier-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/crystal_identifier-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/crystal_identifier-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier-field
- crystal_identifier_offset
- /NXmicrostructure/crystal/crystal_identifier_offset-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier_offset-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/crystal_identifier_offset-field
- crystal_structure
- /NXem_correlation/indexing/CRYSTAL_STRUCTURE-group
- crystal_symmetry
- /NXmicrostructure_imm_config/ENTRY/roi/crystal_symmetry-field
- /NXrotation_set/crystal_symmetry-field
- crystal_symmetry_point_group
- /NXmicrostructure_odf/configuration/crystal_symmetry_point_group-field
- /NXmicrostructure_pf/configuration/crystal_symmetry_point_group-field
- crystal_system
- /NXcrystal_structure/crystal_system-field
- crystallographic_calibration
- /NXapm/ENTRY/atom_probe/reconstruction/crystallographic_calibration-field
- /NXapm_reconstruction/crystallographic_calibration-field
- crystallographic_database
- /NXunit_cell/crystallographic_database-field
- crystallographic_database_identifier
- /NXunit_cell/crystallographic_database_identifier-field
- cs_computer
- /NXcs_profiling/CS_COMPUTER-group
- cs_filter_boolean_mask
- /NXspatial_filter/CS_FILTER_BOOLEAN_MASK-group
- cs_profiling_event
- /NXcs_profiling/CS_PROFILING_EVENT-group
- csg
- /NXsolid_geometry/CSG-group
- cue_index
- /NXevent_data/cue_index-field
- /NXlog/cue_index-field
- cue_timestamp_zero
- /NXevent_data/cue_timestamp_zero-field
- /NXlog/cue_timestamp_zero-field
- cumulated
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/cumulated-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/cumulated-field
- cumulated_normalized
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/cumulated_normalized-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/cumulated_normalized-field
- current
- /NXdeflector/current-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/current-field
- /NXibeam_column/ion_source/current-field
- /NXiv_temp/ENTRY/DATA/current-field
- /NXlens_em/current-field
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/current-field
- /NXsource/current-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current-field
- /NXsts/ENTRY/reproducibility_indicators/current-field
- current_amplifier
- /NXsts/ENTRY/INSTRUMENT/current_amplifier-group
- current_calibration
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_calibration-field
- /NXsts/ENTRY/reproducibility_indicators/current_calibration-field
- current_gain
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_gain-field
- /NXsts/ENTRY/reproducibility_indicators/current_gain-field
- current_log
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log-group
- current_offset
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/current_offset-field
- /NXsts/ENTRY/reproducibility_indicators/current_offset-field
- current_sensor
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor-group
- current_set
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set-group
- current_set_feature_to_cluster
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/current_set_feature_to_cluster-field
- current_to_next_link
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link-field
- current_to_next_link_type
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/current_to_next_link_type-field
- current_working_directory
- /NXapm_compositionspace_results/ENTRY/profiling/current_working_directory-field
- /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_selector_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/current_working_directory-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/current_working_directory-field
- /NXcs_profiling/current_working_directory-field
- /NXem_calorimetry/ENTRY/profiling/current_working_directory-field
- curvature
- /NXxraylens/curvature-field
- curvature_driving_force
- /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force-group
- curvature_horizontal
- /NXcrystal/curvature_horizontal-field
- curvature_radius_face
- /NXlens_opt/curvature_radius_FACE-field
- curvature_radius_n
- /NXsts/ENTRY/INSTRUMENT/piezo_config/curvature_radius_N-field
- curvature_vertical
- /NXcrystal/curvature_vertical-field
- cut_angle
- /NXcrystal/cut_angle-field
- cw
- /NXbeam_path/SOURCE/cw-field
- cw_power
- /NXbeam_path/SOURCE/cw_power-field
- cylinder_orientation
- /NXxraylens/cylinder_orientation-group
- cylinder_set
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set-group
- cylinders
- /NXcylindrical_geometry/cylinders-field
- cylindrical
- /NXxraylens/cylindrical-field
- cylindrical_geometry
- /NXbeam_stop/CYLINDRICAL_GEOMETRY-group
- cylindrical_orientation_angle
- /NXcrystal/cylindrical_orientation_angle-field
- d
- /NXreflections/d-field
- d_4
- /NXcorrector_cs/tableauID/d_4-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4-group
- d_spacing
- /NXcrystal/d_spacing-field
- dark_field
- /NXtomophase/entry/instrument/dark_field-group
- daslogs
- /NXsnsevent/ENTRY/DASlogs-group
- /NXsnshisto/ENTRY/DASlogs-group
- data
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA-group
- /NXapm_reconstruction/naive_discretization/DATA-group
- /NXarpes/ENTRY/DATA-group
- /NXarpes/ENTRY/INSTRUMENT/analyser/data-field
- /NXbeam/DATA-group
- /NXcalibration/DATA-group
- /NXcanSAS/ENTRY/DATA-group
- /NXcxi_ptycho/DATA-group
- /NXcxi_ptycho/DATA/data-link
- /NXcxi_ptycho/data_1/data-link
- /NXcxi_ptycho/entry_1/instrument_1/MONITOR/data-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/data-field
- /NXdata/DATA-field
- /NXdetector/DATA-group
- /NXdetector/data-field
- /NXem/ENTRY/roiID/ebsd/indexing/roi/data-field
- /NXem_correlation/indexing/roi/data-field
- /NXem_ebsd/indexing/roi/data-field
- /NXentry/DATA-group
- /NXfit/data-group
- /NXfit_background/data-group
- /NXfluo/entry/INSTRUMENT/fluorescence/data-field
- /NXfluo/entry/MONITOR/data-field
- /NXfluo/entry/data-group
- /NXfluo/entry/data/data-link
- /NXguide/reflectivity/data-field
- /NXinteraction_vol_em/DATA-group
- /NXiqproc/ENTRY/DATA-group
- /NXiqproc/ENTRY/DATA/data-field
- /NXiv_temp/ENTRY/DATA-group
- /NXlauetof/entry/control/data-field
- /NXlauetof/entry/instrument/detector/data-field
- /NXlauetof/entry/name/data-link
- /NXmicrostructure_ipf/legend/data-field
- /NXmicrostructure_ipf/map/data-field
- /NXmicrostructure_mtex_config/path/data-field
- /NXmonitor/data-field
- /NXmonopd/entry/DATA-group
- /NXmonopd/entry/DATA/data-link
- /NXmonopd/entry/INSTRUMENT/DETECTOR/data-field
- /NXmpes/ENTRY/data-group
- /NXmpes/ENTRY/data/data-field
- /NXmpes_arpes/ENTRY/data-group
- /NXmpes_arpes/ENTRY/data/data-field
- /NXmx/ENTRY/DATA-group
- /NXmx/ENTRY/DATA/data-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXnote/data-field
- /NXoptical_spectroscopy/ENTRY/DATA-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/DATA-group
- /NXpeak/data-group
- /NXrefscan/entry/control/data-field
- /NXrefscan/entry/data-group
- /NXrefscan/entry/data/data-link
- /NXrefscan/entry/instrument/DETECTOR/data-field
- /NXreftof/entry/control/data-field
- /NXreftof/entry/data-group
- /NXreftof/entry/data/data-link
- /NXreftof/entry/instrument/detector/data-field
- /NXsas/ENTRY/DATA-group
- /NXsas/ENTRY/DATA/data-link
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXsastof/ENTRY/control/data-field
- /NXsastof/ENTRY/data-group
- /NXsastof/ENTRY/data/data-link
- /NXsastof/ENTRY/instrument/detector/data-field
- /NXscan/ENTRY/DATA-group
- /NXscan/ENTRY/DATA/data-link
- /NXscan/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXscan/ENTRY/MONITOR/data-field
- /NXsensor_scan/ENTRY/DATA-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/DATA-group
- /NXsnsevent/ENTRY/DATA-group
- /NXsnsevent/ENTRY/MONITOR/data-field
- /NXsnshisto/ENTRY/DATA-group
- /NXsnshisto/ENTRY/DATA/data-link
- /NXsnshisto/ENTRY/MONITOR/data-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/data-field
- /NXspe/ENTRY/data-group
- /NXspe/ENTRY/data/data-field
- /NXsqom/ENTRY/DATA-group
- /NXsqom/ENTRY/DATA/data-field
- /NXsts/ENTRY/DATA-group
- /NXstxm/ENTRY/DATA-group
- /NXstxm/ENTRY/DATA/data-field
- /NXstxm/ENTRY/INSTRUMENT/DETECTOR/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_x/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_y/data-field
- /NXstxm/ENTRY/INSTRUMENT/sample_z/data-field
- /NXstxm/ENTRY/control/data-field
- /NXsubentry/DATA-group
- /NXtas/entry/DATA-group
- /NXtas/entry/DATA/data-link
- /NXtas/entry/INSTRUMENT/DETECTOR/data-field
- /NXtas/entry/MONITOR/data-field
- /NXtofnpd/entry/INSTRUMENT/detector/data-field
- /NXtofnpd/entry/MONITOR/data-field
- /NXtofnpd/entry/data-group
- /NXtofnpd/entry/data/data-link
- /NXtofraw/entry/MONITOR/data-field
- /NXtofraw/entry/data-group
- /NXtofraw/entry/data/data-link
- /NXtofraw/entry/instrument/detector/data-field
- /NXtofsingle/entry/INSTRUMENT/detector/data-field
- /NXtofsingle/entry/MONITOR/data-field
- /NXtofsingle/entry/data-group
- /NXtofsingle/entry/data/data-link
- /NXtomo/entry/control/data-field
- /NXtomo/entry/data-group
- /NXtomo/entry/data/data-link
- /NXtomo/entry/instrument/detector/data-field
- /NXtomophase/entry/data-group
- /NXtomophase/entry/data/data-link
- /NXtomophase/entry/instrument/bright_field/data-field
- /NXtomophase/entry/instrument/dark_field/data-field
- /NXtomophase/entry/instrument/sample/data-field
- /NXtomoproc/entry/data-group
- /NXtomoproc/entry/data/data-field
- /NXtransmission/ENTRY/data-group
- /NXxas/ENTRY/DATA-group
- /NXxas/ENTRY/INSTRUMENT/absorbed_beam/data-field
- /NXxas/ENTRY/INSTRUMENT/incoming_beam/data-field
- /NXxas/ENTRY/MONITOR/data-field
- /NXxasproc/ENTRY/DATA-group
- /NXxasproc/ENTRY/DATA/data-field
- /NXxbase/entry/DATA-group
- /NXxbase/entry/DATA/data-link
- /NXxbase/entry/instrument/detector/data-field
- /NXxlaue/entry/instrument/source/distribution/data-field
- /NXxpcs/entry/data-group
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/data-group
- /NXxps/ENTRY/FIT/data-group
- /NXxps/ENTRY/FIT/peakPEAK/data-group
- /NXxps/ENTRY/data-group
- /NXxrd/ENTRY/DATA-group
- /NXxrd/ENTRY/DATA/data-field
- data_1
- /NXcxi_ptycho/data_1-group
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/data_1-link
- data_collection
- /NXellipsometry/ENTRY/data_collection-group
- data_correction
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/data_correction-field
- data_errors
- /NXdetector/data_errors-field
- data_file
- /NXdetector/data_file-group
- /NXxrd_pan/ENTRY/data_file-field
- data_identifier
- /NXellipsometry/ENTRY/data_collection/data_identifier-field
- data_origin
- /NXdetector_module/data_origin-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_origin-field
- data_size
- /NXdetector_module/data_size-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_size-field
- data_software
- /NXellipsometry/ENTRY/data_collection/data_software-group
- data_stride
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/data_stride-field
- data_type
- /NXellipsometry/ENTRY/data_collection/data_type-field
- data_x_time_of_flight
- /NXsnshisto/ENTRY/DATA/data_x_time_of_flight-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_time_of_flight-field
- data_x_y
- /NXsnsevent/ENTRY/DATA/data_x_y-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/data_x_y-field
- /NXsnshisto/ENTRY/DATA/data_x_y-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_x_y-field
- data_y_time_of_flight
- /NXsnshisto/ENTRY/DATA/data_y_time_of_flight-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/data_y_time_of_flight-field
- datatype_n
- /NXbeam_transfer_matrix_table/datatype_N-field
- date
- /NXcanSAS/ENTRY/PROCESS/date-field
- /NXmicrostructure/date-field
- /NXnote/date-field
- /NXprocess/date-field
- /NXprocess_mpes/date-field
- /NXsnsevent/ENTRY/SNSHistoTool/date-field
- /NXsnshisto/ENTRY/SNSHistoTool/date-field
- /NXtomoproc/entry/reconstruction/date-field
- /NXxasproc/ENTRY/XAS_data_reduction/date-field
- dbscan
- /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan-group
- dbscanid
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID-group
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID-group
- dead_time
- /NXdetector/dead_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
- decelerate_electrode
- /NXapm_msr/instrument/decelerate_electrode-group
- decoration_filter
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter-group
- decorator_multiplicity
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/decorator_multiplicity-field
- default_color_map
- /NXmicrostructure_mtex_config/plotting/default_color_map-field
- definition
- /NXapm/ENTRY/definition-field
- /NXapm_compositionspace_config/ENTRY/definition-field
- /NXapm_compositionspace_results/ENTRY/definition-field
- /NXapm_paraprobe_clusterer_config/ENTRY/definition-field
- /NXapm_paraprobe_clusterer_results/ENTRY/definition-field
- /NXapm_paraprobe_distancer_config/ENTRY/definition-field
- /NXapm_paraprobe_distancer_results/ENTRY/definition-field
- /NXapm_paraprobe_intersector_config/ENTRY/definition-field
- /NXapm_paraprobe_intersector_results/ENTRY/definition-field
- /NXapm_paraprobe_nanochem_config/ENTRY/definition-field
- /NXapm_paraprobe_nanochem_results/ENTRY/definition-field
- /NXapm_paraprobe_ranger_config/ENTRY/definition-field
- /NXapm_paraprobe_ranger_results/ENTRY/definition-field
- /NXapm_paraprobe_selector_config/ENTRY/definition-field
- /NXapm_paraprobe_selector_results/ENTRY/definition-field
- /NXapm_paraprobe_spatstat_config/ENTRY/definition-field
- /NXapm_paraprobe_spatstat_results/ENTRY/definition-field
- /NXapm_paraprobe_surfacer_config/ENTRY/definition-field
- /NXapm_paraprobe_surfacer_results/ENTRY/definition-field
- /NXapm_paraprobe_tessellator_config/ENTRY/definition-field
- /NXapm_paraprobe_tessellator_results/ENTRY/definition-field
- /NXapm_paraprobe_transcoder_config/ENTRY/definition-field
- /NXapm_paraprobe_transcoder_results/ENTRY/definition-field
- /NXarchive/entry/definition-field
- /NXarpes/ENTRY/definition-field
- /NXcanSAS/ENTRY/definition-field
- /NXcxi_ptycho/entry_1/definition-field
- /NXdirecttof/entry/definition-field
- /NXdispersive_material/ENTRY/definition-field
- /NXellipsometry/ENTRY/definition-field
- /NXem/ENTRY/definition-field
- /NXem_calorimetry/ENTRY/definition-field
- /NXentry/definition-field
- /NXfluo/entry/definition-field
- /NXindirecttof/entry/definition-field
- /NXiqproc/ENTRY/definition-field
- /NXiv_temp/ENTRY/definition-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field
- /NXlab_sample_mounting/ENTRY/definition-field
- /NXlauetof/entry/definition-field
- /NXmicrostructure_gragles_config/ENTRY/definition-field
- /NXmicrostructure_gragles_results/ENTRY/definition-field
- /NXmicrostructure_imm_config/ENTRY/definition-field
- /NXmicrostructure_imm_results/ENTRY/definition-field
- /NXmicrostructure_kanapy_results/ENTRY/definition-field
- /NXmicrostructure_score_config/ENTRY/definition-field
- /NXmicrostructure_score_results/ENTRY/definition-field
- /NXmonopd/entry/definition-field
- /NXmpes/ENTRY/definition-field
- /NXmpes_arpes/ENTRY/definition-field
- /NXmx/ENTRY/definition-field
- /NXoptical_spectroscopy/ENTRY/definition-field
- /NXraman/ENTRY/definition-field
- /NXrefscan/entry/definition-field
- /NXreftof/entry/definition-field
- /NXsas/ENTRY/definition-field
- /NXsastof/ENTRY/definition-field
- /NXscan/ENTRY/definition-field
- /NXsensor_scan/ENTRY/definition-field
- /NXsnsevent/ENTRY/definition-field
- /NXsnshisto/ENTRY/definition-field
- /NXspe/ENTRY/definition-field
- /NXsqom/ENTRY/definition-field
- /NXsts/ENTRY/definition-field
- /NXstxm/ENTRY/definition-field
- /NXsubentry/definition-field
- /NXtas/entry/definition-field
- /NXtofnpd/entry/definition-field
- /NXtofraw/entry/definition-field
- /NXtofsingle/entry/definition-field
- /NXtomo/entry/definition-field
- /NXtomophase/entry/definition-field
- /NXtomoproc/entry/definition-field
- /NXtransmission/ENTRY/definition-field
- /NXxas/ENTRY/definition-field
- /NXxasproc/ENTRY/definition-field
- /NXxbase/entry/definition-field
- /NXxeuler/entry/definition-field
- /NXxkappa/entry/definition-field
- /NXxlaue/entry/definition-field
- /NXxlaueplate/entry/definition-field
- /NXxnb/entry/definition-field
- /NXxpcs/entry/definition-field
- /NXxps/ENTRY/definition-field
- /NXxrd/ENTRY/definition-field
- /NXxrd_pan/ENTRY/definition-field
- /NXxrot/entry/definition-field
- definition_local
- /NXentry/definition_local-field
- /NXsubentry/definition_local-field
- definitions
- /NXapm/ENTRY/atom_probe/ranging/definitions-group
- deflection_angle
- /NXbeam_splitter/deflection_angle-field
- /NXgrating/deflection_angle-field
- deflector
- /NXcollectioncolumn/DEFLECTOR-group
- /NXebeam_column/DEFLECTOR-group
- /NXelectronanalyser/DEFLECTOR-group
- /NXenergydispersion/DEFLECTOR-group
- /NXibeam_column/DEFLECTOR-group
- /NXscanbox_em/DEFLECTOR-group
- /NXsource/DEFLECTOR-group
- /NXspindispersion/DEFLECTOR-group
- defocus
- /NXoptical_system_em/defocus-field
- deformation
- /NXmicrostructure_score_config/ENTRY/deformation-group
- deformation_gradient
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient-group
- deformed_grain_identifier
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/deformed_grain_identifier-field
- defragment_cell_cache
- /NXmicrostructure_score_config/ENTRY/numerics/defragment_cell_cache-field
- defragment_x
- /NXmicrostructure_score_config/ENTRY/numerics/defragment_x-field
- degree_char
- /NXmicrostructure_mtex_config/plotting/degree_char-field
- delay
- /NXdata_mpes/delay-field
- /NXdata_mpes_detector/delay-field
- /NXdisk_chopper/delay-field
- delay_calibration
- /NXmpes/ENTRY/PROCESS_MPES/delay_calibration-group
- /NXprocess_mpes/delay_calibration-group
- delay_difference
- /NXxpcs/entry/data/delay_difference-field
- delocalization
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization-group
- delocalizationid
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID-group
- delta_time
- /NXaberration/delta_time-field
- /NXevent_data_apm/delta_time-field
- demodulated_signal
- /NXlockin/demodulated_signal-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/demodulated_signal-field
- density
- /NXcontainer/density-field
- /NXcrystal/density-field
- /NXem/ENTRY/sample/density-field
- /NXfilter/density-field
- /NXsample/density-field
- /NXsample_component/density-field
- depends_on
- /NXactuator/depends_on-field
- /NXaperture/depends_on-field
- /NXattenuator/depends_on-field
- /NXbeam/depends_on-field
- /NXbeam_path/SOURCE/depends_on-field
- /NXbeam_path/depends_on-field
- /NXbeam_path/window_NUMBER/depends_on-field
- /NXbeam_stop/depends_on-field
- /NXbending_magnet/depends_on-field
- /NXcapillary/depends_on-field
- /NXcg_primitive_set/depends_on-field
- /NXcollectioncolumn/depends_on-field
- /NXcollimator/depends_on-field
- /NXcoordinate_system/depends_on-field
- /NXcrystal/depends_on-field
- /NXcrystal_structure/depends_on-field
- /NXcs_filter_boolean_mask/depends_on-field
- /NXdetector/depends_on-field
- /NXdetector_module/depends_on-field
- /NXdisk_chopper/depends_on-field
- /NXelectronanalyser/depends_on-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/depends_on-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/depends_on-field
- /NXem/ENTRY/roiID/ebsd/measurement/depends_on-field
- /NXem/ENTRY/roiID/ebsd/simulation/depends_on-field
- /NXem_ebsd/calibration/depends_on-field
- /NXem_ebsd/measurement/depends_on-field
- /NXem_ebsd/simulation/depends_on-field
- /NXenergydispersion/depends_on-field
- /NXenvironment/depends_on-field
- /NXfermi_chopper/depends_on-field
- /NXfilter/depends_on-field
- /NXflipper/depends_on-field
- /NXfresnel_zone_plate/depends_on-field
- /NXgraph_edge_set/depends_on-field
- /NXgraph_node_set/depends_on-field
- /NXgrating/depends_on-field
- /NXguide/depends_on-field
- /NXinsertion_device/depends_on-field
- /NXmanipulator/depends_on-field
- /NXmicrostructure_ipf/depends_on-field
- /NXmirror/depends_on-field
- /NXmoderator/depends_on-field
- /NXmonitor/depends_on-field
- /NXmonochromator/depends_on-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field
- /NXmpes_arpes/ENTRY/SAMPLE/depends_on-field
- /NXmpes_arpes/ENTRY/geometries/arpes_geometry/depends_on-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
- /NXmx/ENTRY/SAMPLE/depends_on-field
- /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/depends_on-field
- /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/depends_on-field
- /NXpinhole/depends_on-field
- /NXpolarizer/depends_on-field
- /NXpositioner/depends_on-field
- /NXpositioner_sts/depends_on-field
- /NXquadric/depends_on-field
- /NXregistration/depends_on-field
- /NXrotation_set/depends_on-field
- /NXsample/depends_on-field
- /NXsample_component/depends_on-field
- /NXsensor/depends_on-field
- /NXsensor_sts/depends_on-field
- /NXslit/depends_on-field
- /NXsource/depends_on-field
- /NXspindispersion/depends_on-field
- /NXunit_cell/depends_on-field
- /NXvelocity_selector/depends_on-field
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/depends_on-field
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/depends_on-field
- /NXxps/ENTRY/SAMPLE/depends_on-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/depends_on-field
- /NXxraylens/depends_on-field
- depolarization
- /NXoptical_spectroscopy/ENTRY/derived_parameters/depolarization-field
- depth
- /NXgrating/depth-field
- derived_parameters
- /NXoptical_spectroscopy/ENTRY/derived_parameters-group
- description
- /NXactivity/description-field
- /NXaperture/description-field
- /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/description-field
- /NXapm/ENTRY/sample/description-field
- /NXapm/ENTRY/specimen/description-field
- /NXapm_paraprobe_tool_config/description-field
- /NXapm_paraprobe_tool_results/description-field
- /NXapm_ranging/background_quantification/description-field
- /NXarchive/entry/instrument/description-field
- /NXarchive/entry/sample/description-field
- /NXbeam_stop/description-field
- /NXcalibration/description-field
- /NXcanSAS/ENTRY/PROCESS/description-field
- /NXcg_marching_cubes/description-field
- /NXchamber/description-field
- /NXchemical_process/description-field
- /NXcite/description-field
- /NXcomponent/description-field
- /NXcontainer/description-field
- /NXcorrector_cs/tableauID/description-field
- /NXcs_profiling_event/description-field
- /NXdeflector/description-field
- /NXdetector/description-field
- /NXdispersion_repeated_parameter/description-field
- /NXdispersion_single_parameter/description-field
- /NXdistortion/description-field
- /NXebeam_column/electron_source/description-field
- /NXelectronanalyser/description-field
- /NXelectrostatic_kicker/description-field
- /NXem/ENTRY/sample/description-field
- /NXem_eds/indexing/IMAGE_SET/description-field
- /NXenvironment/description-field
- /NXfiber/description-field
- /NXfilter/description-field
- /NXfit/error_function/description-field
- /NXfit_function/description-field
- /NXfit_parameter/description-field
- /NXgeometry/description-field
- /NXguide/description-field
- /NXibeam_column/ion_source/description-field
- /NXlog/description-field
- /NXmagnetic_kicker/description-field
- /NXmanipulator/description-field
- /NXmicrostructure_gragles_config/ENTRY/description-field
- /NXmicrostructure_gragles_results/ENTRY/description-field
- /NXmicrostructure_imm_results/ENTRY/description-field
- /NXmicrostructure_kanapy_results/ENTRY/description-field
- /NXmicrostructure_score_config/ENTRY/description-field
- /NXmicrostructure_score_results/ENTRY/description-field
- /NXmirror/description-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
- /NXnote/description-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/description-field
- /NXphysical_process/description-field
- /NXpid/description-field
- /NXpositioner/description-field
- /NXpositioner_sts/description-field
- /NXquadrupole_magnet/description-field
- /NXreflectron/description-field
- /NXregistration/description-field
- /NXsample/description-field
- /NXsample_component/description-field
- /NXseparator/description-field
- /NXsnsevent/ENTRY/DASlogs/LOG/description-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
- /NXsnsevent/ENTRY/SNSHistoTool/description-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
- /NXsnshisto/ENTRY/DASlogs/LOG/description-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
- /NXsnshisto/ENTRY/SNSHistoTool/description-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
- /NXsolenoid_magnet/description-field
- /NXspin_rotator/description-field
- /NXxpcs/entry/instrument/DETECTOR/description-field
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/description-field
- /NXxps/ENTRY/FIT/error_function/description-field
- /NXxps/ENTRY/FIT/global_fit_function/description-field
- /NXxps/ENTRY/FIT/peakPEAK/function/description-field
- descriptor
- /NXem/ENTRY/roiID/ebsd/indexing/roi/descriptor-field
- /NXem_correlation/indexing/roi/descriptor-field
- /NXem_ebsd/indexing/roi/descriptor-field
- design
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB/design-field
- /NXpump/design-field
- /NXstage_lab/design-field
- det_module
- /NXreflections/det_module-field
- details
- /NXcanSAS/ENTRY/SAMPLE/details-field
- detection_gas_path
- /NXdetector/detection_gas_path-field
- detector
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
- /NXelectronanalyser/DETECTOR-group
- /NXem_msr/em_lab/DETECTOR-group
- /NXevent_data_em/em_lab/DETECTOR-group
- /NXinstrument/DETECTOR-group
- /NXlauetof/entry/instrument/detector-group
- /NXmonopd/entry/INSTRUMENT/DETECTOR-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR-group
- /NXrefscan/entry/instrument/DETECTOR-group
- /NXreftof/entry/instrument/detector-group
- /NXsas/ENTRY/INSTRUMENT/DETECTOR-group
- /NXsastof/ENTRY/instrument/detector-group
- /NXscan/ENTRY/INSTRUMENT/DETECTOR-group
- /NXsnsevent/ENTRY/instrument/DETECTOR-group
- /NXsnshisto/ENTRY/instrument/DETECTOR-group
- /NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
- /NXtas/entry/INSTRUMENT/DETECTOR-group
- /NXtofnpd/entry/INSTRUMENT/detector-group
- /NXtofraw/entry/instrument/detector-group
- /NXtofsingle/entry/INSTRUMENT/detector-group
- /NXtomo/entry/instrument/detector-group
- /NXtransmission/ENTRY/instrument/DETECTOR-group
- /NXxbase/entry/instrument/detector-group
- /NXxeuler/entry/instrument/detector-group
- /NXxkappa/entry/instrument/detector-group
- /NXxlaueplate/entry/instrument/detector-group
- /NXxnb/entry/instrument/detector-group
- /NXxpcs/entry/instrument/DETECTOR-group
- /NXxrd/ENTRY/INSTRUMENT/DETECTOR-group
- /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR-group
- /NXxrot/entry/instrument/detector-group
- detector_1
- /NXcxi_ptycho/entry_1/instrument_1/detector_1-group
- detector_channel_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_channel_type-field
- detector_faces
- /NXoff_geometry/detector_faces-field
- detector_group
- /NXinstrument/DETECTOR_GROUP-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
- detector_identifier
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/detector_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/detector_identifier-field
- /NXimage_set/PROCESS/detector_identifier-field
- /NXspectrum_set/PROCESS/detector_identifier-field
- detector_module
- /NXdetector/DETECTOR_MODULE-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
- detector_number
- /NXcylindrical_geometry/detector_number-field
- /NXdetector/detector_number-field
- /NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
- /NXtofnpd/entry/data/detector_number-link
- /NXtofraw/entry/data/detector_number-link
- /NXtofraw/entry/instrument/detector/detector_number-field
- detector_readout_time
- /NXdetector/detector_readout_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
- detector_reference_frameid
- /NXcoordinate_system_set/detector_reference_frameID-group
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID-group
- detector_type
- /NXdetector/detector_type-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type-field
- detector_type_other
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/detector_type_other-field
- detector_voltage
- /NXdetector/detector_voltage-field
- detectorid
- /NXem/ENTRY/measurement/em_lab/detectorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID-group
- device_information
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/device_information-group
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/device_information-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/device_information-group
- device_path
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE/device_path-field
- diameter
- /NXdetector/diameter-field
- /NXenergydispersion/diameter-field
- /NXmicrostructure_score_config/ENTRY/deformation/diameter-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/diameter-field
- /NXpinhole/diameter-field
- /NXwaveplate/diameter-field
- /NXxlaueplate/entry/instrument/detector/diameter-field
- dielectric_function
- /NXdispersion_table/dielectric_function-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
- diffraction
- /NXem_calorimetry/ENTRY/diffraction-group
- diffraction_order
- /NXgrating/diffraction_order-field
- diffraction_space
- /NXem_calorimetry/ENTRY/COORDINATE_SYSTEM_SET/diffraction_space-group
- diffractometer
- /NXinstrument/DIFFRACTOMETER-group
- dimensionality
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/dimensionality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/dimensionality-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/dimensionality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/dimensionality-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/dimensionality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/dimensionality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/dimensionality-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/dimensionality-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/dimensionality-field
- /NXcg_primitive_set/dimensionality-field
- /NXcrystal_structure/dimensionality-field
- /NXgraph_node_set/dimensionality-field
- /NXisocontour/dimensionality-field
- /NXmicrostructure/configuration/dimensionality-field
- /NXmicrostructure_imm_config/ENTRY/roi/dimensionality-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/dimensionality-field
- direction
- /NXbeam/TRANSFORMATIONS/DIRECTION-field
- /NXshape/direction-field
- directionality
- /NXgraph_edge_set/directionality-field
- discretization
- /NXmicrostructure_gragles_config/ENTRY/discretization-group
- /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/discretization-field
- /NXmicrostructure_imm_config/ENTRY/roi/discretization-field
- /NXmicrostructure_score_config/ENTRY/discretization-group
- /NXmicrostructure_score_results/ENTRY/discretization-group
- disk_chopper
- /NXbeam_path/DISK_CHOPPER-group
- /NXdirecttof/entry/INSTRUMENT/disk_chopper-group
- /NXinstrument/DISK_CHOPPER-group
- /NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
- /NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
- dislocation_density
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/dislocation_density-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/dislocation_density-field
- dislocation_distribution
- /NXmicrostructure_imm_config/ENTRY/dislocation_distribution-group
- disorientation_angle
- /NXrotation_set/disorientation_angle-field
- disorientation_axis
- /NXrotation_set/disorientation_axis-field
- disorientation_quaternion
- /NXrotation_set/disorientation_quaternion-field
- disorientation_threshold
- /NXmicrostructure/configuration/disorientation_threshold-field
- dispersion
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/dispersion-field
- /NXfiber/dispersion-field
- dispersion_function
- /NXdispersion/DISPERSION_FUNCTION-group
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
- dispersion_repeated_parameter
- /NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
- dispersion_single_parameter
- /NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
- dispersion_table
- /NXdispersion/DISPERSION_TABLE-group
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
- dispersion_type
- /NXdispersive_material/ENTRY/dispersion_type-field
- /NXfiber/dispersion_type-field
- dispersion_x
- /NXdispersive_material/ENTRY/dispersion_x-group
- dispersion_y
- /NXdispersive_material/ENTRY/dispersion_y-group
- dispersion_z
- /NXdispersive_material/ENTRY/dispersion_z-group
- dispersoid_drag
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag-group
- distance
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/distance-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/distance-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/distance-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/distance-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/distance-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/distance-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/distance-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/distance-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/distance-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/distance-field
- /NXapm_paraprobe_tool_config/surface_distance/distance-field
- /NXattenuator/distance-field
- /NXbeam/distance-field
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
- /NXdetector/distance-field
- /NXdisk_chopper/distance-field
- /NXfermi_chopper/distance-field
- /NXindirecttof/entry/INSTRUMENT/analyser/distance-field
- /NXlauetof/entry/instrument/detector/distance-field
- /NXmoderator/distance-field
- /NXmonitor/distance-field
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/distance-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
- /NXreftof/entry/instrument/chopper/distance-field
- /NXreftof/entry/instrument/detector/distance-field
- /NXsample/distance-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field
- /NXsastof/ENTRY/instrument/detector/distance-field
- /NXsnsevent/ENTRY/MONITOR/distance-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field
- /NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field
- /NXsnsevent/ENTRY/instrument/moderator/distance-field
- /NXsnshisto/ENTRY/MONITOR/distance-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/distance-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field
- /NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field
- /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field
- /NXsnshisto/ENTRY/instrument/moderator/distance-field
- /NXsource/distance-field
- /NXspe/ENTRY/data/distance-field
- /NXtofnpd/entry/INSTRUMENT/detector/distance-field
- /NXtofnpd/entry/MONITOR/distance-field
- /NXtofraw/entry/MONITOR/distance-field
- /NXtofraw/entry/instrument/detector/distance-field
- /NXtofsingle/entry/INSTRUMENT/detector/distance-field
- /NXtofsingle/entry/MONITOR/distance-field
- /NXtomo/entry/instrument/detector/distance-field
- /NXtomophase/entry/instrument/sample/distance-field
- /NXxbase/entry/instrument/detector/distance-field
- /NXxbase/entry/sample/distance-field
- /NXxpcs/entry/instrument/DETECTOR/distance-field
- distance_derived
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
- distance_to_detector
- /NXbeam_stop/distance_to_detector-field
- distances
- /NXtranslation/distances-field
- distancing_model
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/distancing_model-field
- distortion
- /NXprocess/DISTORTION-group
- /NXprocess_mpes/DISTORTION-group
- distortion_correction
- /NXem_calorimetry/ENTRY/distortion_correction-group
- distribution
- /NXmonochromator/distribution-group
- /NXsource/distribution-group
- /NXxlaue/entry/instrument/source/distribution-group
- divergence
- /NXbeam_path/SOURCE/divergence-field
- divergence_x
- /NXcollimator/divergence_x-field
- divergence_x_minus
- /NXbending_magnet/divergence_x_minus-field
- divergence_x_plus
- /NXbending_magnet/divergence_x_plus-field
- divergence_y
- /NXcollimator/divergence_y-field
- divergence_y_minus
- /NXbending_magnet/divergence_y_minus-field
- divergence_y_plus
- /NXbending_magnet/divergence_y_plus-field
- dld_wire_names
- /NXapm_hit_finding/dld_wire_names-field
- doi
- /NXapm/ENTRY/CITE/doi-field
- /NXcite/doi-field
- /NXdispersive_material/ENTRY/REFERENCES/doi-field
- domain_identifier
- /NXmicrostructure_score_config/ENTRY/solitary_unit/domain_identifier-field
- dose_management
- /NXoptical_system_em/dose_management-field
- downsampled
- /NXregion/downsampled-group
- dql
- /NXcanSAS/ENTRY/DATA/dQl-field
- dqw
- /NXcanSAS/ENTRY/DATA/dQw-field
- drag
- /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility/drag-field
- drain_current_amperemeter
- /NXmanipulator/drain_current_amperemeter-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter-group
- drain_current_env
- /NXmpes/ENTRY/SAMPLE/drain_current_env-group
- drift
- /NXpositioner_sts/drift-field
- drift_correction_status
- /NXpositioner_sts/drift_correction_status-field
- /NXsts/ENTRY/INSTRUMENT/piezo_config/drift_correction_status-field
- drift_energy
- /NXenergydispersion/drift_energy-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/drift_energy-field
- drift_n
- /NXsts/ENTRY/INSTRUMENT/piezo_config/drift_N-field
- dspacing
- /NXcrystal_structure/dspacing-field
- duration
- /NXarchive/entry/duration-field
- /NXentry/duration-field
- /NXlog/duration-field
- /NXsnsevent/ENTRY/DASlogs/LOG/duration-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/duration-field
- /NXsnsevent/ENTRY/duration-field
- /NXsnshisto/ENTRY/DASlogs/LOG/duration-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/duration-field
- /NXsnshisto/ENTRY/duration-field
- /NXsubentry/duration-field
- /NXtofraw/entry/duration-field
- /NXtofsingle/entry/duration-field
- duty_cycle
- /NXgrating/duty_cycle-field
- dwell_time
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller/dwell_time-field
- /NXscanbox_em/dwell_time-field
- dynamic_focus_correction
- /NXoptical_system_em/dynamic_focus_correction-field
- dynamic_phi_list
- /NXxpcs/entry/instrument/masks/dynamic_phi_list-field
- dynamic_q_list
- /NXxpcs/entry/instrument/masks/dynamic_q_list-field
- dynamic_refocusing
- /NXoptical_system_em/dynamic_refocusing-field
- dynamic_roi_map
- /NXxpcs/entry/instrument/masks/dynamic_roi_map-field
- ebeam_column
- /NXem/ENTRY/measurement/em_lab/ebeam_column-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column-group
- /NXem_msr/em_lab/EBEAM_COLUMN-group
- /NXevent_data_em/em_lab/EBEAM_COLUMN-group
- ebsd
- /NXem/ENTRY/roiID/ebsd-group
- /NXmicrostructure_mtex_config/path/ebsd-field
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd-group
- ebsd_extensions
- /NXmicrostructure_mtex_config/path/ebsd_extensions-field
- edge_contact
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/edge_contact-field
- edge_distance
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/edge_distance-field
- edge_identifier
- /NXcg_face_list_data_structure/edge_identifier-field
- edge_identifier_offset
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/edge_identifier_offset-field
- /NXcg_face_list_data_structure/edge_identifier_offset-field
- /NXcg_half_edge_data_structure/edge_identifier_offset-field
- edge_length
- /NXapm_compositionspace_config/ENTRY/config/voxelization/edge_length-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/edge_length-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/edge_length-field
- /NXcg_polygon_set/edge_length-field
- /NXcg_polyhedron_set/edge_length-field
- /NXcg_tetrahedron_set/edge_length-field
- /NXcg_triangle_set/edge_length-field
- /NXmicrostructure_gragles_config/ENTRY/discretization/edge_length-field
- edge_method
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_method-field
- edge_normal
- /NXcg_hexahedron_set/edge_normal-group
- /NXcg_primitive_set/edge_normal-group
- edge_threshold
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/edge_threshold-field
- edges
- /NXcg_face_list_data_structure/edges-field
- edges_are_unique
- /NXcg_face_list_data_structure/edges_are_unique-field
- eds
- /NXem/ENTRY/roiID/eds-group
- eels
- /NXem/ENTRY/roiID/eels-group
- ef
- /NXtas/entry/DATA/ef-link
- /NXtas/entry/INSTRUMENT/analyser/ef-field
- efficiency
- /NXbeam_path/GRATING/efficiency-field
- /NXdetector/efficiency-group
- /NXdetector/efficiency/efficiency-field
- /NXmonitor/efficiency-field
- /NXpolarizer/efficiency-field
- ei
- /NXtas/entry/DATA/ei-link
- /NXtas/entry/INSTRUMENT/monochromator/ei-field
- elapsed_time
- /NXcs_profiling_event/elapsed_time-field
- electric_field
- /NXarchive/entry/sample/electric_field-field
- /NXsample/electric_field-field
- electrical_conductivity
- /NXlab_sample_mounting/ENTRY/electrical_conductivity-field
- electrical_field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field-group
- electron_source
- /NXebeam_column/electron_source-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source-group
- electronanalyser
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER-group
- element
- /NXelectron_level/element-field
- elementid
- /NXapm_compositionspace_results/ENTRY/voxelization/elementID-group
- ellipsoid_set
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set-group
- ellipsometer_type
- /NXellipsometry/ENTRY/INSTRUMENT/ellipsometer_type-field
- ellipsometer_type_other
- /NXellipsometry/ENTRY/INSTRUMENT/ellipsometer_type_other-field
- ellipsometry_experiment_type
- /NXellipsometry/ENTRY/ellipsometry_experiment_type-field
- ellipsometry_experiment_type_other
- /NXellipsometry/ENTRY/ellipsometry_experiment_type_other-field
- ellipticity
- /NXdata_mpes/ellipticity-field
- /NXdata_mpes_detector/ellipticity-field
- ellipticity_calibration
- /NXmpes/ENTRY/PROCESS_MPES/ellipticity_calibration-group
- /NXprocess_mpes/ellipticity_calibration-group
- em_lab
- /NXem/ENTRY/measurement/em_lab-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab-group
- /NXem_msr/em_lab-group
- /NXevent_data_em/em_lab-group
- email
- /NXem/ENTRY/userID/email-field
- /NXsensor_scan/ENTRY/USER/email-field
- /NXtransmission/ENTRY/operator/email-field
- /NXuser/email-field
- embedding_medium
- /NXlab_sample_mounting/ENTRY/embedding_medium-field
- emission_current
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/emission_current-field
- /NXsource/emission_current-field
- emittance_x
- /NXsource/emittance_x-field
- emittance_y
- /NXsource/emittance_y-field
- emitter_material
- /NXebeam_column/electron_source/emitter_material-field
- emitter_type
- /NXebeam_column/electron_source/emitter_type-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/emitter_type-field
- /NXibeam_column/ion_source/emitter_type-field
- en
- /NXsqom/ENTRY/DATA/en-field
- /NXtas/entry/DATA/en-link
- /NXtas/entry/SAMPLE/en-field
- end
- /NXxrd_pan/ENTRY/experiment_config/omega/end-field
- /NXxrd_pan/ENTRY/experiment_config/two_theta/end-field
- end_settling_time
- /NXbias_spectroscopy/end_settling_time-field
- /NXiv_bias/end_settling_time-field
- /NXsts/ENTRY/reproducibility_indicators/end_settling_time-field
- end_time
- /NXactivity/end_time-field
- /NXapm/ENTRY/end_time-field
- /NXapm_compositionspace_results/ENTRY/profiling/end_time-field
- /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_selector_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_tool_common/profiling/end_time-field
- /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/end_time-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/end_time-field
- /NXarchive/entry/end_time-field
- /NXchemical_process/end_time-field
- /NXcs_profiling/end_time-field
- /NXcs_profiling_event/end_time-field
- /NXcxi_ptycho/entry_1/end_time-field
- /NXem/ENTRY/end_time-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/end_time-field
- /NXem_calorimetry/ENTRY/profiling/end_time-field
- /NXem_calorimetry/ENTRY/time_synchronization/end_time-field
- /NXentry/end_time-field
- /NXevent_data_apm/end_time-field
- /NXevent_data_em/end_time-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/end_time-field
- /NXlab_sample_mounting/ENTRY/end_time-field
- /NXmicrostructure_gragles_config/ENTRY/end_time-field
- /NXmicrostructure_gragles_results/ENTRY/end_time-field
- /NXmicrostructure_imm_results/ENTRY/end_time-field
- /NXmicrostructure_kanapy_results/ENTRY/end_time-field
- /NXmicrostructure_score_config/ENTRY/end_time-field
- /NXmicrostructure_score_results/ENTRY/end_time-field
- /NXmonitor/end_time-field
- /NXmpes/ENTRY/SAMPLE/history/sample_preparation/end_time-field
- /NXmpes/ENTRY/end_time-field
- /NXmx/ENTRY/end_time-field
- /NXoptical_spectroscopy/ENTRY/end_time-field
- /NXphysical_process/end_time-field
- /NXrefscan/entry/end_time-field
- /NXreftof/entry/end_time-field
- /NXsas/ENTRY/end_time-field
- /NXscan/ENTRY/end_time-field
- /NXsensor_scan/ENTRY/end_time-field
- /NXsnsevent/ENTRY/end_time-field
- /NXsnshisto/ENTRY/end_time-field
- /NXstxm/ENTRY/end_time-field
- /NXsubentry/end_time-field
- /NXtomo/entry/end_time-field
- /NXtomophase/entry/end_time-field
- /NXxpcs/entry/end_time-field
- end_time_estimated
- /NXmx/ENTRY/end_time_estimated-field
- endnote
- /NXcite/endnote-field
- energies
- /NXarpes/ENTRY/INSTRUMENT/analyser/energies-field
- energy
- /NXarpes/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/energy-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/energy-field
- /NXdata_mpes/energy-field
- /NXdata_mpes_detector/energy-field
- /NXdirecttof/entry/INSTRUMENT/disk_chopper/energy-field
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field
- /NXdispersion_table/energy-field
- /NXem_eds/indexing/PEAK/ION/energy-field
- /NXfermi_chopper/energy-field
- /NXfluo/entry/INSTRUMENT/fluorescence/energy-field
- /NXfluo/entry/data/energy-link
- /NXindirecttof/entry/INSTRUMENT/analyser/energy-field
- /NXinsertion_device/energy-field
- /NXmicrostructure/quadruple_junction/energy-field
- /NXmonochromator/energy-field
- /NXmpes/ENTRY/data/energy-field
- /NXmpes_arpes/ENTRY/data/energy-field
- /NXsource/energy-field
- /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER/energy-field
- /NXspe/ENTRY/data/energy-field
- /NXstxm/ENTRY/DATA/energy-field
- /NXstxm/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXxas/ENTRY/DATA/energy-link
- /NXxas/ENTRY/INSTRUMENT/monochromator/energy-field
- /NXxasproc/ENTRY/DATA/energy-field
- /NXxps/ENTRY/data/energy-field
- energy_calibration
- /NXmpes/ENTRY/PROCESS_MPES/energy_calibration-group
- /NXprocess_mpes/energy_calibration-group
- energy_dispersion
- /NXmonochromator/energy_dispersion-field
- energy_error
- /NXmonochromator/energy_error-field
- energy_errors
- /NXmonochromator/energy_errors-field
- energy_identifier
- /NXdispersion_function/energy_identifier-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_identifier-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_identifier-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_identifier-field
- energy_interval
- /NXenergydispersion/energy_interval-field
- energy_max
- /NXdispersion_function/energy_max-field
- energy_min
- /NXdispersion_function/energy_min-field
- energy_range
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/energy_range-field
- /NXem_eds/indexing/IMAGE_SET/energy_range-field
- /NXem_eds/indexing/PEAK/ION/energy_range-field
- energy_referencing
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing-group
- /NXprocess_mpes/energy_referencing-group
- /NXxps/ENTRY/PROCESS_MPES/energy_referencing-group
- energy_resolution
- /NXelectronanalyser/energy_resolution-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution-group
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution-group
- energy_scan_mode
- /NXenergydispersion/energy_scan_mode-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/energy_scan_mode-field
- energy_transfer
- /NXbeam/energy_transfer-field
- energy_unit
- /NXdispersion_function/energy_unit-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/energy_unit-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/energy_unit-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/energy_unit-field
- energydispersion
- /NXelectronanalyser/ENERGYDISPERSION-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION-group
- entering
- /NXreflections/entering-field
- entrance_slit
- /NXmonochromator/entrance_slit-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit-group
- entrance_slit_setting
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_setting-field
- entrance_slit_shape
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_shape-field
- entrance_slit_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/entrance_slit_size-field
- entry
- /NXapm/ENTRY-group
- /NXapm_compositionspace_config/ENTRY-group
- /NXapm_compositionspace_results/ENTRY-group
- /NXapm_paraprobe_clusterer_config/ENTRY-group
- /NXapm_paraprobe_clusterer_results/ENTRY-group
- /NXapm_paraprobe_distancer_config/ENTRY-group
- /NXapm_paraprobe_distancer_results/ENTRY-group
- /NXapm_paraprobe_intersector_config/ENTRY-group
- /NXapm_paraprobe_intersector_results/ENTRY-group
- /NXapm_paraprobe_nanochem_config/ENTRY-group
- /NXapm_paraprobe_nanochem_results/ENTRY-group
- /NXapm_paraprobe_ranger_config/ENTRY-group
- /NXapm_paraprobe_ranger_results/ENTRY-group
- /NXapm_paraprobe_selector_config/ENTRY-group
- /NXapm_paraprobe_selector_results/ENTRY-group
- /NXapm_paraprobe_spatstat_config/ENTRY-group
- /NXapm_paraprobe_spatstat_results/ENTRY-group
- /NXapm_paraprobe_surfacer_config/ENTRY-group
- /NXapm_paraprobe_surfacer_results/ENTRY-group
- /NXapm_paraprobe_tessellator_config/ENTRY-group
- /NXapm_paraprobe_tessellator_results/ENTRY-group
- /NXapm_paraprobe_transcoder_config/ENTRY-group
- /NXapm_paraprobe_transcoder_results/ENTRY-group
- /NXarchive/entry-group
- /NXarpes/ENTRY-group
- /NXcanSAS/ENTRY-group
- /NXdirecttof/entry-group
- /NXdispersive_material/ENTRY-group
- /NXellipsometry/ENTRY-group
- /NXem/ENTRY-group
- /NXem_calorimetry/ENTRY-group
- /NXfluo/entry-group
- /NXindirecttof/entry-group
- /NXiqproc/ENTRY-group
- /NXiv_temp/ENTRY-group
- /NXlab_electro_chemo_mechanical_preparation/ENTRY-group
- /NXlab_sample_mounting/ENTRY-group
- /NXlauetof/entry-group
- /NXmicrostructure_gragles_config/ENTRY-group
- /NXmicrostructure_gragles_results/ENTRY-group
- /NXmicrostructure_imm_config/ENTRY-group
- /NXmicrostructure_imm_results/ENTRY-group
- /NXmicrostructure_kanapy_results/ENTRY-group
- /NXmicrostructure_score_config/ENTRY-group
- /NXmicrostructure_score_results/ENTRY-group
- /NXmonopd/entry-group
- /NXmpes/ENTRY-group
- /NXmpes_arpes/ENTRY-group
- /NXmx/ENTRY-group
- /NXopt_window/ENTRY-group
- /NXoptical_spectroscopy/ENTRY-group
- /NXraman/ENTRY-group
- /NXrefscan/entry-group
- /NXreftof/entry-group
- /NXroot/ENTRY-group
- /NXsas/ENTRY-group
- /NXsastof/ENTRY-group
- /NXscan/ENTRY-group
- /NXsensor_scan/ENTRY-group
- /NXsnsevent/ENTRY-group
- /NXsnshisto/ENTRY-group
- /NXspe/ENTRY-group
- /NXsqom/ENTRY-group
- /NXsts/ENTRY-group
- /NXstxm/ENTRY-group
- /NXtas/entry-group
- /NXtofnpd/entry-group
- /NXtofraw/entry-group
- /NXtofsingle/entry-group
- /NXtomo/entry-group
- /NXtomophase/entry-group
- /NXtomoproc/entry-group
- /NXtransmission/ENTRY-group
- /NXxas/ENTRY-group
- /NXxasproc/ENTRY-group
- /NXxbase/entry-group
- /NXxeuler/entry-group
- /NXxkappa/entry-group
- /NXxlaue/entry-group
- /NXxlaueplate/entry-group
- /NXxnb/entry-group
- /NXxpcs/entry-group
- /NXxps/ENTRY-group
- /NXxrd/ENTRY-group
- /NXxrd_pan/ENTRY-group
- /NXxrot/entry-group
- entry_1
- /NXcxi_ptycho/entry_1-group
- entry_identifier
- /NXarchive/entry/entry_identifier-field
- /NXentry/entry_identifier-group
- /NXsnsevent/ENTRY/entry_identifier-field
- /NXsnshisto/ENTRY/entry_identifier-field
- /NXsts/ENTRY/entry_identifier-group
- /NXsubentry/entry_identifier-group
- /NXxpcs/entry/entry_identifier-field
- entry_identifier_uuid
- /NXentry/entry_identifier_uuid-group
- /NXxpcs/entry/entry_identifier_uuid-field
- envelope
- /NXfit/data/envelope-field
- /NXxps/ENTRY/FIT/data/envelope-field
- environment
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT-group
- /NXmicrostructure_gragles_config/ENTRY/environment-group
- /NXmicrostructure_gragles_results/ENTRY/environment-group
- /NXmicrostructure_imm_results/ENTRY/environment-group
- /NXmicrostructure_kanapy_results/ENTRY/environment-group
- /NXmicrostructure_score_config/ENTRY/environment-group
- /NXmicrostructure_score_results/ENTRY/environment-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT-group
- /NXsample/ENVIRONMENT-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT-group
- eps
- /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/eps-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/eps-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/eps-field
- /NXmicrostructure_mtex_config/numerics/eps-field
- epsilon
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/epsilon-field
- error
- /NXspe/ENTRY/data/error-field
- error_function
- /NXfit/error_function-group
- /NXxps/ENTRY/FIT/error_function-group
- errors
- /NXdata/errors-field
- euler
- /NXmicrostructure_odf/sampling/euler-field
- euler_angle
- /NXmicrostructure_mtex_config/conventions/euler_angle-field
- euler_angle_convention
- /NXcoordinate_system_set/euler_angle_convention-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/euler_angle_convention-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/euler_angle_convention-field
- evaporation_control
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control/evaporation_control-field
- /NXevent_data_apm/instrument/control/evaporation_control-field
- evaporation_id_filter
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter-group
- /NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter-group
- evaporation_identifier
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier-field
- evaporation_identifier_offset
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/evaporation_identifier_offset-field
- even_layer_density
- /NXmirror/even_layer_density-field
- even_layer_material
- /NXmirror/even_layer_material-field
- event_data
- /NXinstrument/EVENT_DATA-group
- /NXsnsevent/ENTRY/EVENT_DATA-group
- event_data_apm
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm-group
- /NXevent_data_apm_set/EVENT_DATA_APM-group
- event_data_apm_set
- /NXapm/ENTRY/measurement/event_data_apm_set-group
- /NXapm_msr/instrument/EVENT_DATA_APM_SET-group
- event_data_em
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM-group
- /NXevent_data_em_set/EVENT_DATA_EM-group
- event_data_em_set
- /NXem/ENTRY/measurement/event_data_em_set-group
- /NXem_msr/EVENT_DATA_EM_SET-group
- event_id
- /NXevent_data/event_id-field
- event_identifier
- /NXevent_data_em/event_identifier-field
- event_index
- /NXevent_data/event_index-field
- /NXsnsevent/ENTRY/EVENT_DATA/event_index-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
- event_pixel_id
- /NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
- event_time_of_flight
- /NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
- event_time_offset
- /NXevent_data/event_time_offset-field
- event_time_zero
- /NXevent_data/event_time_zero-field
- event_type
- /NXevent_data_em/event_type-field
- example
- /NXmicrostructure_mtex_config/path/example-field
- excitation_wavelength
- /NXbeam_path/SOURCE/excitation_wavelength-field
- exit_slit
- /NXmonochromator/exit_slit-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
- experiment_alias
- /NXapm/ENTRY/experiment_alias-field
- /NXem/ENTRY/experiment_alias-field
- experiment_config
- /NXxrd_pan/ENTRY/experiment_config-group
- experiment_description
- /NXapm/ENTRY/experiment_description-field
- /NXarchive/entry/experiment_description-field
- /NXem/ENTRY/experiment_description-field
- /NXentry/experiment_description-field
- /NXoptical_spectroscopy/ENTRY/experiment_description-field
- /NXsensor_scan/ENTRY/experiment_description-field
- /NXsts/ENTRY/experiment_description-field
- /NXsubentry/experiment_description-field
- /NXtransmission/ENTRY/experiment_description-field
- experiment_documentation
- /NXentry/experiment_documentation-group
- /NXsubentry/experiment_documentation-group
- experiment_end_date
- /NXentry/experiment_end_date-field
- experiment_facility
- /NXentry/experiment_facility-field
- experiment_identifier
- /NXapm/ENTRY/experiment_identifier-group
- /NXarchive/entry/experiment_identifier-field
- /NXem/ENTRY/experiment_identifier-group
- /NXentry/experiment_identifier-group
- /NXoptical_spectroscopy/ENTRY/experiment_identifier-group
- /NXsensor_scan/ENTRY/experiment_identifier-group
- /NXsnsevent/ENTRY/experiment_identifier-field
- /NXsnshisto/ENTRY/experiment_identifier-field
- /NXsts/ENTRY/experiment_identifier-group
- /NXsubentry/experiment_identifier-group
- /NXtransmission/ENTRY/experiment_identifier-group
- experiment_institution
- /NXentry/experiment_institution-field
- experiment_laboratory
- /NXentry/experiment_laboratory-field
- experiment_location
- /NXentry/experiment_location-field
- experiment_result
- /NXxrd_pan/ENTRY/experiment_result-group
- experiment_start_date
- /NXentry/experiment_start_date-field
- experiment_sub_type
- /NXoptical_spectroscopy/ENTRY/experiment_sub_type-field
- experiment_type
- /NXellipsometry/ENTRY/experiment_type-field
- /NXoptical_spectroscopy/ENTRY/experiment_type-field
- /NXraman/ENTRY/experiment_type-field
- /NXsts/ENTRY/experiment_type-field
- experiment_type_other
- /NXoptical_spectroscopy/ENTRY/experiment_type_other-field
- experiments
- /NXreflections/experiments-field
- exposure_time
- /NXcorrector_cs/tableauID/exposure_time-field
- extent
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/extent-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/extent-field
- /NXbeam/extent-field
- /NXcg_grid/extent-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/extent-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/extent-field
- /NXmicrostructure_score_config/ENTRY/deformation/extent-field
- /NXmicrostructure_score_config/ENTRY/discretization/grid/extent-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/extent-field
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/extent-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/extent-field
- /NXxpcs/entry/instrument/incident_beam/extent-field
- external_adc
- /NXsample/external_ADC-group
- external_axis
- /NXdata_mpes_detector/external_AXIS-field
- external_dac
- /NXsample/external_DAC-field
- external_field_brief
- /NXsensor/external_field_brief-field
- /NXsensor_sts/external_field_brief-field
- external_field_full
- /NXsensor/external_field_full-group
- /NXsensor_sts/external_field_full-group
- external_material
- /NXguide/external_material-field
- /NXmirror/external_material-field
- extinction_ratio
- /NXpolarizer_opt/extinction_ratio-field
- extraction_voltage
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/extraction_voltage-field
- extractor_current
- /NXcollectioncolumn/extractor_current-field
- extractor_voltage
- /NXcollectioncolumn/extractor_voltage-field
- extrema
- /NXmicrostructure_odf/kth_extrema/extrema-field
- fabrication
- /NXactuator/FABRICATION-group
- /NXapm/ENTRY/measurement/instrument/fabrication-group
- /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication-group
- /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication-group
- /NXapm/ENTRY/measurement/instrument/pulser/fabrication-group
- /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication-group
- /NXapm/ENTRY/measurement/instrument/reflectron/fabrication-group
- /NXapm_msr/instrument/FABRICATION-group
- /NXchamber/FABRICATION-group
- /NXcollectioncolumn/FABRICATION-group
- /NXcomponent/FABRICATION-group
- /NXdeflector/FABRICATION-group
- /NXdetector/FABRICATION-group
- /NXebeam_column/FABRICATION-group
- /NXebeam_column/electron_source/FABRICATION-group
- /NXelectronanalyser/FABRICATION-group
- /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication-group
- /NXem/ENTRY/measurement/em_lab/detectorID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication-group
- /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication-group
- /NXem_msr/em_lab/FABRICATION-group
- /NXenergydispersion/FABRICATION-group
- /NXfresnel_zone_plate/fabrication-field
- /NXinstrument/FABRICATION-group
- /NXmanipulator/FABRICATION-group
- /NXpulser_apm/FABRICATION-group
- /NXpulser_apm/SOURCE/FABRICATION-group
- /NXpump/FABRICATION-group
- /NXreflectron/FABRICATION-group
- /NXsample/FABRICATION-group
- /NXsample_component/FABRICATION-group
- /NXsensor/FABRICATION-group
- /NXsource/FABRICATION-group
- face_area
- /NXcg_hexahedron_set/face_area-field
- /NXcg_polyhedron_set/face_area-field
- /NXcg_tetrahedron_set/face_area-field
- face_half_edge
- /NXcg_half_edge_data_structure/face_half_edge-field
- face_identifier
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier-field
- /NXcg_face_list_data_structure/face_identifier-field
- face_identifier_offset
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/face_identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/face_identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/face_identifier_offset-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/face_identifier_offset-field
- /NXcg_face_list_data_structure/face_identifier_offset-field
- /NXcg_half_edge_data_structure/face_identifier_offset-field
- face_normal
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal-group
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal-field
- /NXcg_hexahedron_set/face_normal-group
- /NXcg_primitive_set/face_normal-group
- face_normal_orientation
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/face_normal_orientation-field
- face_normals
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/face_normals-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/face_normals-field
- faces
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/faces-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/faces-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/faces-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/faces-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/faces-field
- /NXcg_face_list_data_structure/faces-field
- /NXoff_geometry/faces-field
- faces_are_unique
- /NXcg_face_list_data_structure/faces_are_unique-field
- facet_normals
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/facet_normals-field
- facility_user_id
- /NXarchive/entry/user/facility_user_id-field
- /NXsnsevent/ENTRY/USER/facility_user_id-field
- /NXsnshisto/ENTRY/USER/facility_user_id-field
- /NXuser/facility_user_id-field
- farthest_corner
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall/farthest_corner-field
- fast_axes
- /NXelectronanalyser/fast_axes-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
- fast_pixel_direction
- /NXdetector_module/fast_pixel_direction-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
- fax_number
- /NXuser/fax_number-field
- feature
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature-group
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE-group
- feature_distance
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/feature_distance-field
- feature_identifier
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_identifier-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_identifier-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_identifier-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/feature_identifier-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_identifier-field
- feature_member_count
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/feature_member_count-field
- feature_type
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/feature_type-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/feature_type-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type-field
- feature_type_dict_keyword
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_keyword-field
- feature_type_dict_value
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/feature_type_dict_value-field
- featureid
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID-group
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID-group
- features
- /NXentry/features-field
- fermi_chopper
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
- /NXinstrument/FERMI_CHOPPER-group
- /NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
- /NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
- fft_accuracy
- /NXmicrostructure_mtex_config/numerics/fft_accuracy-field
- fiber
- /NXbeam_path/FIBER-group
- field_aperture
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
- field_of_view
- /NXapm/ENTRY/atom_probe/reconstruction/field_of_view-field
- /NXapm_reconstruction/field_of_view-field
- /NXoptical_system_em/field_of_view-field
- fieldname_errors
- /NXdata/FIELDNAME_errors-field
- figure_data
- /NXgrating/figure_data-group
- /NXmirror/figure_data-group
- figure_of_merit
- /NXspindispersion/figure_of_merit-field
- figure_of_meritmetric
- /NXfit/figure_of_meritMETRIC-field
- /NXxps/ENTRY/FIT/figure_of_meritMETRIC-field
- figure_size
- /NXmicrostructure_mtex_config/plotting/figure_size-field
- filament_current
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/filament_current-field
- /NXsource/filament_current-field
- file
- /NXserialized/file-group
- file_name
- /NXnote/file_name-field
- filenames
- /NXiqproc/ENTRY/reduction/input/filenames-field
- /NXsqom/ENTRY/reduction/input/filenames-field
- filter
- /NXinstrument/FILTER-group
- filter_characteristics
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_characteristics-group
- filter_mechanism
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/filter_mechanism-field
- filter_number
- /NXbeam_path/filter_NUMBER-group
- filter_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/filter_type-field
- final_beam_divergence
- /NXbeam/final_beam_divergence-field
- final_energy
- /NXbeam/final_energy-field
- final_polarization
- /NXbeam/final_polarization-field
- final_polarization_stokes
- /NXbeam/final_polarization_stokes-field
- final_wavelength
- /NXbeam/final_wavelength-field
- final_wavelength_spread
- /NXbeam/final_wavelength_spread-field
- final_z
- /NXpositioner_sts/final_z-field
- /NXsts/ENTRY/reproducibility_indicators/final_z-field
- first_settling_time
- /NXbias_spectroscopy/first_settling_time-field
- /NXsts/ENTRY/reproducibility_indicators/first_settling_time-field
- fit
- /NXxps/ENTRY/FIT-group
- fit_function
- /NXcalibration/fit_function-field
- fit_parameter
- /NXfit_function/FIT_PARAMETER-group
- fixed_energy
- /NXspe/ENTRY/NXSPE_info/fixed_energy-field
- fixed_revolutions
- /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/fixed_revolutions-field
- fixed_slit
- /NXbeam_path/MONOCHROMATOR/SLIT/fixed_slit-field
- flags
- /NXreflections/flags-field
- flatfield
- /NXdetector/flatfield-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
- flatfield_applied
- /NXdetector/flatfield_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
- flatfield_error
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
- flatfield_errors
- /NXdetector/flatfield_errors-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
- flight_path
- /NXapm/ENTRY/measurement/instrument/analysis_chamber/flight_path-field
- flip_current
- /NXflipper/flip_current-field
- flip_turns
- /NXflipper/flip_turns-field
- flipper
- /NXinstrument/FLIPPER-group
- flood_gun
- /NXmpes/ENTRY/INSTRUMENT/flood_gun-group
- /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun-group
- flood_gun_current_env
- /NXmpes/ENTRY/SAMPLE/flood_gun_current_env-group
- fluence
- /NXbeam/fluence-field
- fluorescence
- /NXfluo/entry/INSTRUMENT/fluorescence-group
- flux
- /NXbeam/flux-field
- /NXibeam_column/ion_source/flux-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
- /NXsource/flux-field
- flux_integrated
- /NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
- flyback_time
- /NXscanbox_em/flyback_time-field
- focal_length
- /NXlens_opt/focal_length-field
- /NXoptical_system_em/focal_length-field
- focal_size
- /NXcapillary/focal_size-field
- focus_parameters
- /NXfresnel_zone_plate/focus_parameters-field
- focus_type
- /NXxraylens/focus_type-field
- focussing_probes
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes-group
- font_size
- /NXmicrostructure_mtex_config/plotting/font_size-field
- force
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
- force_control
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
- formula
- /NXdispersion_function/formula-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field
- /NXfit/error_function/formula-field
- /NXfit/global_fit_function/formula-field
- /NXfit_function/formula-field
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/function/formula-field
- /NXxps/ENTRY/FIT/error_function/formula-field
- /NXxps/ENTRY/FIT/global_fit_function/formula-field
- /NXxps/ENTRY/FIT/peakPEAK/function/formula-field
- formula_symbol
- /NXresolution/formula_SYMBOL-field
- frame
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/roi/frame-field
- frame_average
- /NXxpcs/entry/data/frame_average-field
- frame_start_number
- /NXdetector/frame_start_number-field
- /NXxbase/entry/instrument/detector/frame_start_number-field
- frame_sum
- /NXxpcs/entry/data/frame_sum-field
- frame_time
- /NXdetector/frame_time-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
- /NXxpcs/entry/instrument/DETECTOR/frame_time-field
- frequency
- /NXcollimator/frequency-field
- /NXsnsevent/ENTRY/instrument/SNS/frequency-field
- /NXsnshisto/ENTRY/instrument/SNS/frequency-field
- /NXsource/frequency-field
- frequency_log
- /NXcollimator/frequency_log-group
- frequency_resolution
- /NXbeam_path/DISK_CHOPPER/frequency_resolution-field
- frog_delays
- /NXbeam/frog_delays-field
- frog_frequencies
- /NXbeam/frog_frequencies-field
- frog_trace
- /NXbeam/frog_trace-field
- function
- /NXfit_background/function-group
- /NXpeak/function-group
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/function-group
- /NXxps/ENTRY/FIT/peakPEAK/function-group
- g2
- /NXxpcs/entry/data/g2-field
- g2_derr
- /NXxpcs/entry/data/g2_derr-field
- g2_err_from_two_time_corr_func
- /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
- g2_err_from_two_time_corr_func_partials
- /NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
- g2_from_two_time_corr_func
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
- g2_from_two_time_corr_func_partials
- /NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
- g2_unnormalized
- /NXxpcs/entry/data/G2_unnormalized-field
- gain
- /NXcapillary/gain-group
- /NXcircuit/gain-field
- /NXtransmission/ENTRY/instrument/DETECTOR/gain-field
- gain_setting
- /NXdetector/gain_setting-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
- gamma
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/gamma-field
- gap
- /NXinsertion_device/gap-field
- gas
- /NXxraylens/gas-field
- gas_pressure
- /NXdetector/gas_pressure-field
- /NXsource/gas_pressure-field
- /NXxraylens/gas_pressure-field
- gas_pressure_env
- /NXmpes/ENTRY/SAMPLE/gas_pressure_env-group
- gaussian_mixture
- /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/gaussian_mixture-group
- generating_help_mode
- /NXmicrostructure_mtex_config/miscellaneous/generating_help_mode-field
- generic_beam_sample_angle_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE-group
- geometries
- /NXmpes/ENTRY/geometries-group
- /NXmpes_arpes/ENTRY/geometries-group
- /NXxps/ENTRY/geometries-group
- geometry
- /NXaperture/GEOMETRY-group
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/geometry-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/geometry-field
- /NXbeam_path/ATTENUATOR/GEOMETRY-group
- /NXbeam_stop/GEOMETRY-group
- /NXbending_magnet/GEOMETRY-group
- /NXcollimator/GEOMETRY-group
- /NXcrystal/GEOMETRY-group
- /NXcsg/geometry-field
- /NXdetector/GEOMETRY-group
- /NXdisk_chopper/GEOMETRY-group
- /NXfermi_chopper/GEOMETRY-group
- /NXfilter/GEOMETRY-group
- /NXguide/GEOMETRY-group
- /NXinsertion_device/GEOMETRY-group
- /NXmicrostructure_gragles_config/ENTRY/sampling/geometry-field
- /NXmirror/GEOMETRY-group
- /NXmoderator/GEOMETRY-group
- /NXmonitor/GEOMETRY-group
- /NXmonochromator/geometry-group
- /NXorientation/GEOMETRY-group
- /NXsample/geometry-group
- /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group
- /NXsastof/ENTRY/instrument/collimator/geometry-group
- /NXsensor/geometry-group
- /NXsensor_sts/geometry-group
- /NXsource/geometry-group
- /NXtranslation/geometry-group
- /NXvelocity_selector/geometry-group
- geometry_1
- /NXcxi_ptycho/sample_1/geometry_1-group
- getter_pump
- /NXapm_msr/instrument/getter_pump-group
- global_fit_function
- /NXfit/global_fit_function-group
- /NXxps/ENTRY/FIT/global_fit_function-group
- gnomonic_reference_frame
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame-group
- /NXem_ebsd/gnomonic_reference_frame-group
- goniometer_x
- /NXxrd_pan/ENTRY/experiment_config/goniometer_x-field
- goniometer_y
- /NXxrd_pan/ENTRY/experiment_config/goniometer_y-field
- goniometer_z
- /NXxrd_pan/ENTRY/experiment_config/goniometer_z-field
- gradient
- /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/gradient-field
- gradient_guide_magnitude
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
- gradient_guide_projection
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/gradient_guide_projection-field
- grain_boundary_energy
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy-group
- grain_boundary_mobility
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility-group
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility-group
- grain_diameter
- /NXapm/ENTRY/sample/grain_diameter-field
- grain_diameter_error
- /NXapm/ENTRY/sample/grain_diameter_error-field
- grain_identifier
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/grain_identifier-field
- grain_shape
- /NXmicrostructure_imm_config/ENTRY/roi/grain_shape-field
- grating
- /NXbeam_path/GRATING-group
- /NXbeam_path/MONOCHROMATOR/GRATING-group
- /NXmonochromator/GRATING-group
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
- grating_wavelength_max
- /NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_max-field
- grating_wavelength_min
- /NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_min-field
- grid
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid-group
- /NXcg_marching_cubes/grid-group
- /NXdelocalization/grid-group
- /NXisocontour/grid-group
- /NXmicrostructure_gragles_config/ENTRY/discretization/grid-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/grid-group
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid-group
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid-group
- /NXmicrostructure_score_config/ENTRY/discretization/grid-group
- /NXmicrostructure_score_results/ENTRY/discretization/grid-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid-group
- grid_coarsement
- /NXmicrostructure_gragles_config/ENTRY/grid_coarsement-group
- grid_resolution
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/grid_resolution-field
- grinding_machine
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
- grinding_step
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
- grooves
- /NXbeam_path/GRATING/grooves-field
- group
- /NXbeam_device/group-field
- group_identifier
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/group_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/group_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/group_identifier-field
- /NXimage_set/stack_1d/group_identifier-field
- /NXimage_set/stack_2d/group_identifier-field
- /NXimage_set/stack_3d/group_identifier-field
- /NXspectrum_set/stack_0d/group_identifier-field
- /NXspectrum_set/stack_2d/group_identifier-field
- /NXspectrum_set/stack_3d/group_identifier-field
- group_index
- /NXdetector_group/group_index-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
- group_names
- /NXdetector_group/group_names-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
- group_parent
- /NXdetector_group/group_parent-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
- group_type
- /NXdetector_group/group_type-field
- guide
- /NXinstrument/GUIDE-group
- guide_current
- /NXflipper/guide_current-field
- guide_turns
- /NXflipper/guide_turns-field
- h
- /NXreflections/h-field
- hagb_enthalpy
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_enthalpy-field
- hagb_pre_factor
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/hagb_pre_factor-field
- half_angle_interval
- /NXem/ENTRY/roiID/imaging/IMAGE_SET/half_angle_interval-field
- /NXem_img/IMAGE_SET/half_angle_interval-field
- half_axes_radii
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/half_axes_radii-field
- /NXcg_ellipsoid_set/half_axes_radii-field
- half_axes_radius
- /NXcg_ellipsoid_set/half_axes_radius-field
- half_edge_incident_face
- /NXcg_half_edge_data_structure/half_edge_incident_face-field
- half_edge_next
- /NXcg_half_edge_data_structure/half_edge_next-field
- half_edge_prev
- /NXcg_half_edge_data_structure/half_edge_prev-field
- half_edge_twin
- /NXcg_half_edge_data_structure/half_edge_twin-field
- half_edge_vertex_origin
- /NXcg_half_edge_data_structure/half_edge_vertex_origin-field
- halfwidth
- /NXmicrostructure_pf/configuration/halfwidth-field
- halo_region
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/halo_region-field
- handedness
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/handedness-field
- /NXcoordinate_system/handedness-field
- /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/handedness-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/handedness-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/handedness-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/handedness-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/handedness-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/handedness-field
- hardware
- /NXamplifier/hardware-group
- /NXcircuit/hardware-group
- /NXlockin/hardware-group
- /NXsts/ENTRY/INSTRUMENT/hardware-group
- harmonic
- /NXinsertion_device/harmonic-field
- harmonic_order_n
- /NXlockin/harmonic_order_N-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/harmonic_order_N-field
- has_cell_edge_detection
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_edge_detection-field
- has_cell_geometry
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_geometry-field
- has_cell_neighbors
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_neighbors-field
- has_cell_volume
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/has_cell_volume-field
- has_closure
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_closure-field
- has_current_to_next_links
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_current_to_next_links-field
- has_exterior_facets
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_exterior_facets-field
- has_interior_tetrahedra
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/has_interior_tetrahedra-field
- has_next_to_current_links
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/has_next_to_current_links-field
- has_object
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object-field
- has_object_edge_contact
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_edge_contact-field
- has_object_geometry
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_geometry-field
- has_object_ions
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_ions-field
- has_object_obb
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_obb-field
- has_object_properties
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_properties-field
- has_object_proxigram
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram-field
- has_object_proxigram_edge_contact
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_object_proxigram_edge_contact-field
- has_proxy
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy-field
- has_proxy_edge_contact
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_edge_contact-field
- has_proxy_geometry
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_geometry-field
- has_proxy_ions
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_ions-field
- has_proxy_obb
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_obb-field
- has_proxy_properties
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_proxy_properties-field
- has_scalar_fields
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/has_scalar_fields-field
- has_triangle_soup
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/has_triangle_soup-field
- hdbscan
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan-group
- heat_treatment_quenching_rate
- /NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
- heat_treatment_quenching_rate_error
- /NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
- heat_treatment_temperature
- /NXapm/ENTRY/sample/heat_treatment_temperature-field
- heat_treatment_temperature_error
- /NXapm/ENTRY/sample/heat_treatment_temperature_error-field
- heater
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater-group
- heater_power
- /NXmanipulator/sample_heater/heater_power-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/heater_power-field
- heater_power_log
- /NXmanipulator/sample_heater/heater_power_log-group
- height
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/height-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/height-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/height-field
- /NXcg_cylinder_set/height-field
- /NXcg_hexahedron_set/height-field
- /NXfermi_chopper/height-field
- /NXvelocity_selector/height-field
- hexahedra
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra-group
- /NXcg_hexahedron_set/hexahedra-group
- hexahedron
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron-group
- hexahedron_half_edgeid
- /NXcg_hexahedron_set/hexahedron_half_edgeID-group
- hexahedron_set
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set-group
- hexahedronid
- /NXcg_hexahedron_set/hexahedronID-group
- hi_pass
- /NXamplifier/hi_pass-field
- /NXlockin/hi_pass-field
- high_throughput_method
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/high_throughput_method-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/high_throughput_method-field
- high_trip_value
- /NXsensor/high_trip_value-field
- /NXsensor_sts/high_trip_value-field
- history
- /NXinstrument/HISTORY-group
- /NXmpes/ENTRY/INSTRUMENT/history-group
- /NXmpes/ENTRY/SAMPLE/history-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE/history-group
- /NXsample/history-group
- /NXsample_component/history-group
- hit_filter
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter-group
- hit_finding
- /NXapm/ENTRY/atom_probe/hit_finding-group
- hit_multiplicity
- /NXapm/ENTRY/atom_probe/hit_finding/hit_multiplicity-field
- /NXapm_hit_finding/hit_multiplicity-field
- hit_multiplicity_filter
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter-group
- /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter-group
- hit_positions
- /NXapm/ENTRY/atom_probe/hit_finding/hit_positions-field
- /NXapm_hit_finding/hit_positions-field
- hit_quality
- /NXapm/ENTRY/atom_probe/hit_finding/hit_quality-field
- /NXapm_hit_finding/hit_quality-field
- hit_quality_identifier
- /NXapm/ENTRY/atom_probe/hit_finding/hit_quality_identifier-field
- /NXapm_hit_finding/hit_quality_identifier-field
- hit_quality_types
- /NXapm/ENTRY/atom_probe/hit_finding/hit_quality_types-field
- /NXapm_hit_finding/hit_quality_types-field
- hit_spatial_filtering
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering-group
- hit_test
- /NXmicrostructure_mtex_config/plotting/hit_test-field
- holder
- /NXsnsevent/ENTRY/sample/holder-field
- /NXsnshisto/ENTRY/sample/holder-field
- hp_filter_cutoff
- /NXlockin/hp_filter_cutoff-field
- hp_filter_order
- /NXlockin/hp_filter_order-field
- hv_gain_n
- /NXsts/ENTRY/INSTRUMENT/piezo_config/hv_gain_N-field
- i
- /NXcanSAS/ENTRY/DATA/I-field
- i_gain
- /NXpositioner_sts/i_gain-field
- ibeam_column
- /NXem/ENTRY/measurement/em_lab/ibeam_column-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column-group
- /NXem_msr/em_lab/IBEAM_COLUMN-group
- /NXevent_data_em/em_lab/IBEAM_COLUMN-group
- ic_opt
- /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt-group
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt-group
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt-group
- id
- /NXreflections/id-field
- identifier
- /NXapm/ENTRY/USER/identifier-group
- /NXapm/ENTRY/USER/identifier/identifier-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/identifier-field
- /NXapm/ENTRY/experiment_identifier/identifier-field
- /NXapm/ENTRY/measurement/instrument/fabrication/identifier-group
- /NXapm/ENTRY/sample/identifier-group
- /NXapm/ENTRY/sample/identifier/identifier-field
- /NXapm/ENTRY/specimen/identifier-group
- /NXapm/ENTRY/specimen/identifier/identifier-field
- /NXapm/ENTRY/specimen/parent_identifier/identifier-field
- /NXapm_compositionspace_config/ENTRY/config/IDENTIFIER-group
- /NXapm_compositionspace_results/ENTRY/IDENTIFIER-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/IDENTIFIER-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/identifier-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/IDENTIFIER-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/IDENTIFIER-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/IDENTIFIER-group
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/identifier-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/IDENTIFIER-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/identifier-field
- /NXapm_paraprobe_selector_config/ENTRY/select/IDENTIFIER-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/identifier-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/IDENTIFIER-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/IDENTIFIER-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/identifier-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/IDENTIFIER-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/identifier-field
- /NXapm_paraprobe_tool_common/IDENTIFIER-group
- /NXapm_paraprobe_tool_config/IDENTIFIER-group
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/IDENTIFIER-group
- /NXatom_set/identifier-field
- /NXcg_marching_cubes/IDENTIFIER-group
- /NXcg_primitive_set/identifier-field
- /NXcomponent/IDENTIFIER-group
- /NXcs_filter_boolean_mask/identifier-field
- /NXem/ENTRY/experiment_identifier/identifier-field
- /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/identifier-group
- /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/identifier-group
- /NXem/ENTRY/sample/identifier-group
- /NXem/ENTRY/sample/identifier/identifier-field
- /NXem/ENTRY/sample/parent_identifier/identifier-field
- /NXem/ENTRY/userID/identifier-group
- /NXem/ENTRY/userID/identifier/identifier-field
- /NXem_calorimetry/ENTRY/identifier-group
- /NXfabrication/identifier-group
- /NXgraph_edge_set/identifier-field
- /NXgraph_node_set/identifier-field
- /NXhistory/IDENTIFIER-group
- /NXidentifier/identifier-field
- /NXion/identifier-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-group
- /NXlab_sample_mounting/ENTRY/mounting_machine/identifier-group
- /NXmicrostructure/interface/identifier-field
- /NXmicrostructure/quadruple_junction/identifier-field
- /NXmicrostructure/triple_junction/identifier-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/device_information/identifier-group
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/identifier-group
- /NXmpes/ENTRY/SAMPLE/identifier-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/identifier-group
- /NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier-field
- /NXsample/identifier-group
- /NXsimilarity_grouping/statistics/identifier-field
- /NXsnsevent/ENTRY/sample/identifier-field
- /NXsnshisto/ENTRY/sample/identifier-field
- /NXtransmission/ENTRY/acquisition_program/identifier-group
- /NXuser/IDENTIFIER-group
- identifier_offset
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/identifier_offset-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/identifier_offset-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/identifier_offset-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/identifier_offset-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/identifier_offset-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/identifier_offset-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/identifier_offset-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/identifier_offset-field
- /NXcg_primitive_set/identifier_offset-field
- /NXgraph_edge_set/identifier_offset-field
- /NXgraph_node_set/identifier_offset-field
- /NXmicrostructure/interface/identifier_offset-field
- /NXmicrostructure/quadruple_junction/identifier_offset-field
- /NXmicrostructure/triple_junction/identifier_offset-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/identifier_offset-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/identifier_offset-field
- /NXsimilarity_grouping/identifier_offset-field
- identifier_type
- /NXatom_set/identifier_type-field
- /NXion/identifier_type-field
- /NXoptical_spectroscopy/ENTRY/experiment_identifier/identifier_type-field
- idev
- /NXcanSAS/ENTRY/DATA/Idev-field
- imag
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/imag-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/imag-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/imag-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/imag-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/imag-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/imag-field
- /NXimage_set/image_1d/imag-field
- /NXimage_set/image_2d/imag-field
- /NXimage_set/image_3d/imag-field
- /NXimage_set/stack_1d/imag-field
- /NXimage_set/stack_2d/imag-field
- /NXimage_set/stack_3d/imag-field
- image_1d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d-group
- /NXimage_set/image_1d-group
- image_2d
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d-group
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d-group
- /NXimage_set/image_2d-group
- image_3d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d-group
- /NXimage_set/image_3d-group
- image_identifier
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/image_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/image_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/image_identifier-field
- /NXimage_set/stack_1d/image_identifier-field
- /NXimage_set/stack_2d/image_identifier-field
- /NXimage_set/stack_3d/image_identifier-field
- image_key
- /NXdetector/image_key-field
- /NXtomo/entry/data/image_key-link
- /NXtomo/entry/instrument/detector/image_key-field
- image_set
- /NXcorrector_cs/tableauID/IMAGE_SET-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET-group
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET-group
- /NXem/ENTRY/roiID/imaging/IMAGE_SET-group
- /NXem_eds/indexing/IMAGE_SET-group
- /NXem_img/IMAGE_SET-group
- /NXem_method/IMAGE_SET-group
- /NXevent_data_em/IMAGE_SET-group
- imaging
- /NXem/ENTRY/roiID/imaging-group
- imaging_mode
- /NXem/ENTRY/roiID/imaging/imaging_mode-field
- /NXem_img/imaging_mode-field
- implementation
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes/implementation-field
- import_wizard
- /NXmicrostructure_mtex_config/path/import_wizard-field
- inchi_key
- /NXsubstance/inchi_key-field
- inchi_str
- /NXsubstance/inchi_str-field
- incidence_vector
- /NXpulser_apm/SOURCE/BEAM/incidence_vector-field
- incident_angle
- /NXbeam_splitter/incident_angle-field
- /NXguide/incident_angle-field
- /NXmirror/incident_angle-field
- incident_beam
- /NXxpcs/entry/instrument/incident_beam-group
- incident_beam_divergence
- /NXbeam/incident_beam_divergence-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
- incident_beam_energy
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
- incident_beam_size
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
- incident_energy
- /NXbeam/incident_energy-field
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy-field
- /NXxpcs/entry/instrument/incident_beam/incident_energy-field
- /NXxrd/ENTRY/INSTRUMENT/BEAM/incident_energy-field
- incident_energy_spread
- /NXbeam/incident_energy_spread-field
- /NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_energy_spread-field
- /NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
- incident_energy_weights
- /NXbeam/incident_energy_weights-field
- incident_polarisation_stokes
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
- incident_polarization
- /NXbeam/incident_polarization-field
- /NXmpes/ENTRY/INSTRUMENT/beamTYPE/incident_polarization-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_polarization-field
- incident_polarization_stokes
- /NXbeam/incident_polarization_stokes-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
- incident_polarization_type
- /NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
- incident_wavelength
- /NXbeam/incident_wavelength-field
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength-field
- incident_wavelength_spectrum
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
- incident_wavelength_spread
- /NXbeam/incident_wavelength_spread-field
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/incident_wavelength_spread-field
- incident_wavelength_weight
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
- incident_wavelength_weights
- /NXbeam/incident_wavelength_weights-field
- /NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
- incoming_beam
- /NXxas/ENTRY/INSTRUMENT/incoming_beam-group
- incubation_time
- /NXmicrostructure_score_config/ENTRY/nucleation/incubation_time-field
- independent_controllers
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
- index_of_refraction
- /NXlens_opt/substrate/index_of_refraction-field
- /NXpolarizer_opt/substrate/index_of_refraction-field
- index_of_refraction_coating
- /NXbeam_splitter/coating/index_of_refraction_coating-field
- /NXlens_opt/COATING/index_of_refraction_coating-field
- /NXpolarizer_opt/COATING/index_of_refraction_coating-field
- /NXwaveplate/coating/index_of_refraction_coating-field
- index_of_refration_substrate
- /NXbeam_splitter/substrate/index_of_refration_substrate-field
- /NXwaveplate/substrate/index_of_refration_substrate-field
- indexing
- /NXem/ENTRY/roiID/ebsd/indexing-group
- /NXem/ENTRY/roiID/eds/indexing-group
- /NXem_correlation/indexing-group
- /NXem_ebsd/indexing-group
- /NXem_eds/indexing-group
- /NXem_eels/indexing-group
- indexing_rate
- /NXem/ENTRY/roiID/ebsd/indexing/indexing_rate-field
- /NXem_ebsd/indexing/indexing_rate-field
- indicators_period
- /NXcircuit/indicators_period-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/indicators_period-field
- /NXsts/ENTRY/resolution_indicators/indicators_period-field
- indices
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/indices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/indices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/indices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/indices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/indices-field
- infection_direction
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/infection_direction-field
- initial_cell_cache
- /NXmicrostructure_score_config/ENTRY/numerics/initial_cell_cache-field
- initial_guess
- /NXapm_compositionspace_config/ENTRY/config/autophase/initial_guess-field
- initial_interface
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface-group
- initial_radius
- /NXapm/ENTRY/specimen/initial_radius-field
- initial_specimen
- /NXapm/ENTRY/atom_probe/initial_specimen-group
- initialization
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/initialization-field
- inner_plot_spacing
- /NXmicrostructure_mtex_config/plotting/inner_plot_spacing-field
- input
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input-group
- /NXdetector/input-field
- /NXiqproc/ENTRY/reduction/input-group
- /NXresolution/response_function/input-field
- /NXsqom/ENTRY/reduction/input-group
- input_dependent
- /NXfit/data/input_dependent-field
- /NXxps/ENTRY/FIT/data/input_dependent-field
- input_grid
- /NXmicrostructure_ipf/input_grid-group
- input_independent
- /NXfit/data/input_independent-field
- /NXxps/ENTRY/FIT/data/input_independent-field
- input_symbol
- /NXcalibration/input_SYMBOL-field
- insertion_device
- /NXinstrument/INSERTION_DEVICE-group
- inside_poly
- /NXmicrostructure_mtex_config/miscellaneous/inside_poly-field
- instrument
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument-group
- /NXapm/ENTRY/measurement/instrument-group
- /NXapm_msr/instrument-group
- /NXarchive/entry/instrument-group
- /NXarpes/ENTRY/INSTRUMENT-group
- /NXcanSAS/ENTRY/INSTRUMENT-group
- /NXdirecttof/entry/INSTRUMENT-group
- /NXellipsometry/ENTRY/INSTRUMENT-group
- /NXentry/INSTRUMENT-group
- /NXevent_data_apm/instrument-group
- /NXfluo/entry/INSTRUMENT-group
- /NXindirecttof/entry/INSTRUMENT-group
- /NXiqproc/ENTRY/instrument-group
- /NXiv_temp/ENTRY/INSTRUMENT-group
- /NXlauetof/entry/instrument-group
- /NXmonopd/entry/INSTRUMENT-group
- /NXmpes/ENTRY/INSTRUMENT-group
- /NXmpes_arpes/ENTRY/INSTRUMENT-group
- /NXmx/ENTRY/INSTRUMENT-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT-group
- /NXraman/ENTRY/INSTRUMENT-group
- /NXrefscan/entry/instrument-group
- /NXreftof/entry/instrument-group
- /NXsas/ENTRY/INSTRUMENT-group
- /NXsastof/ENTRY/instrument-group
- /NXscan/ENTRY/INSTRUMENT-group
- /NXsensor_scan/ENTRY/INSTRUMENT-group
- /NXsnsevent/ENTRY/instrument-group
- /NXsnshisto/ENTRY/instrument-group
- /NXspe/ENTRY/INSTRUMENT-group
- /NXsqom/ENTRY/instrument-group
- /NXsts/ENTRY/INSTRUMENT-group
- /NXstxm/ENTRY/INSTRUMENT-group
- /NXsubentry/INSTRUMENT-group
- /NXtas/entry/INSTRUMENT-group
- /NXtofnpd/entry/INSTRUMENT-group
- /NXtofraw/entry/instrument-group
- /NXtofsingle/entry/INSTRUMENT-group
- /NXtomo/entry/instrument-group
- /NXtomophase/entry/instrument-group
- /NXtomoproc/entry/INSTRUMENT-group
- /NXtransmission/ENTRY/instrument-group
- /NXxas/ENTRY/INSTRUMENT-group
- /NXxbase/entry/instrument-group
- /NXxeuler/entry/instrument-group
- /NXxkappa/entry/instrument-group
- /NXxlaue/entry/instrument-group
- /NXxlaueplate/entry/instrument-group
- /NXxnb/entry/instrument-group
- /NXxpcs/entry/instrument-group
- /NXxps/ENTRY/INSTRUMENT-group
- /NXxrd/ENTRY/INSTRUMENT-group
- /NXxrd_pan/ENTRY/INSTRUMENT-group
- /NXxrot/entry/instrument-group
- instrument_1
- /NXcxi_ptycho/entry_1/instrument_1-group
- instrument_calibration_device
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/instrument_calibration_DEVICE-group
- instrument_name
- /NXapm/ENTRY/measurement/instrument/instrument_name-field
- /NXapm_msr/instrument/instrument_name-field
- /NXem/ENTRY/measurement/em_lab/instrument_name-field
- /NXem_msr/em_lab/instrument_name-field
- int_prf
- /NXreflections/int_prf-field
- int_prf_errors
- /NXreflections/int_prf_errors-field
- int_prf_var
- /NXreflections/int_prf_var-field
- int_sum
- /NXreflections/int_sum-field
- int_sum_errors
- /NXreflections/int_sum_errors-field
- int_sum_var
- /NXreflections/int_sum_var-field
- integral
- /NXmonitor/integral-field
- /NXmonopd/entry/MONITOR/integral-field
- /NXreftof/entry/control/integral-field
- /NXsas/ENTRY/MONITOR/integral-field
- /NXtomophase/entry/control/integral-field
- /NXxbase/entry/control/integral-field
- integral_counts
- /NXtofraw/entry/MONITOR/integral_counts-field
- integral_log
- /NXmonitor/integral_log-group
- integration_time
- /NXbias_spectroscopy/integration_time-field
- /NXiv_bias/integration_time-field
- /NXlockin/integration_time-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/integration_time-field
- /NXsts/ENTRY/resolution_indicators/integration_time-field
- /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/integration_time-field
- intended_use
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE/intended_use-field
- intensity
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/intensity-field
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/intensity-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/intensity-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/intensity-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/intensity-field
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/intensity-field
- /NXem/ENTRY/roiID/eds/indexing/summary/intensity-field
- /NXem_calorimetry/ENTRY/azimuthal_integration/result/intensity-field
- /NXem_calorimetry/ENTRY/background_subtraction/result/intensity-field
- /NXem_eds/indexing/summary/intensity-field
- /NXfit_background/data/intensity-field
- /NXimage_set/image_1d/intensity-field
- /NXimage_set/image_2d/intensity-field
- /NXimage_set/image_3d/intensity-field
- /NXimage_set/stack_1d/intensity-field
- /NXimage_set/stack_2d/intensity-field
- /NXimage_set/stack_3d/intensity-field
- /NXmicrostructure_odf/phi_two_plot/intensity-field
- /NXmicrostructure_pf/pf/intensity-field
- /NXpeak/data/intensity-field
- /NXspectrum_set/spectrum_0d/intensity-field
- /NXspectrum_set/spectrum_1d/intensity-field
- /NXspectrum_set/spectrum_2d/intensity-field
- /NXspectrum_set/spectrum_3d/intensity-field
- /NXspectrum_set/stack_0d/intensity-field
- /NXspectrum_set/stack_2d/intensity-field
- /NXspectrum_set/stack_3d/intensity-field
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/intensity-field
- /NXxps/ENTRY/FIT/peakPEAK/data/intensity-field
- /NXxrd_pan/ENTRY/experiment_result/intensity-field
- /NXxrd_pan/ENTRY/q_data/intensity-field
- interaction_vol_em
- /NXevent_data_em/INTERACTION_VOL_EM-group
- interface
- /NXmicrostructure/interface-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface-group
- interface_identifier
- /NXmicrostructure/quadruple_junction/interface_identifier-field
- /NXmicrostructure/triple_junction/interface_identifier-field
- interface_meshing
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing-group
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing-group
- interior_angle
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/interior_angle-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/interior_angle-field
- /NXcg_polygon_set/interior_angle-field
- /NXcg_triangle_set/interior_angle-field
- interior_atmosphere
- /NXgrating/interior_atmosphere-field
- /NXguide/interior_atmosphere-field
- /NXmirror/interior_atmosphere-field
- interior_cellsid
- /NXcg_alpha_complex/interior_cellsID-group
- interior_tetrahedra
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra-group
- interpolation
- /NXmicrostructure_ipf/interpolation-field
- intersection_detection_method
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/intersection_detection_method-field
- intersection_volume
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/intersection_volume-field
- ion
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION-group
- /NXapm_ranging/peak_identification/ION-group
- /NXchemical_composition/ION-group
- /NXem_eds/indexing/PEAK/ION-group
- ion_detector
- /NXapm/ENTRY/measurement/instrument/ion_detector-group
- /NXapm_msr/instrument/ion_detector-group
- /NXevent_data_apm/instrument/ion_detector-group
- ion_energy_profile
- /NXibeam_column/ion_source/ion_energy_profile-field
- ion_identifier
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/ion_identifier-field
- ion_multiplicity
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/ion_multiplicity-field
- ion_query_nuclide_source
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_source-field
- ion_query_nuclide_target
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_nuclide_target-field
- ion_query_nuclide_vector
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_query_nuclide_vector-field
- ion_query_type_source
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_source-field
- ion_query_type_target
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ion_query_type_target-field
- ion_source
- /NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source-group
- /NXibeam_column/ion_source-group
- ion_type
- /NXatom_set/ion_type-field
- /NXion/ion_type-field
- ion_type_filter
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ion_type_filter-field
- ionid
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID-group
- /NXapm/ENTRY/sample/chemical_composition/ionID-group
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID-group
- iontype_filter
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter-group
- /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter-group
- iontypes
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes-group
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/iontypes-field
- iontypes_randomized
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/iontypes_randomized-field
- iris
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/iris-group
- is_a
- /NXgraph_edge_set/is_a-field
- /NXgraph_node_set/is_a-field
- is_active
- /NXmicrostructure_gragles_config/ENTRY/curvature_driving_force/is_active-field
- /NXmicrostructure_gragles_config/ENTRY/grid_coarsement/is_active-field
- /NXmicrostructure_gragles_config/ENTRY/magnetic_field/is_active-field
- /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/is_active-field
- is_amorphous
- /NXapm/ENTRY/specimen/is_amorphous-field
- is_antipodal
- /NXrotation_set/is_antipodal-field
- is_axis_aligned
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/is_axis_aligned-field
- /NXcg_hexahedron_set/is_axis_aligned-field
- /NXcg_parallelogram_set/is_axis_aligned-field
- is_box
- /NXcg_hexahedron_set/is_box-field
- is_center_of_mass
- /NXcg_primitive_set/is_center_of_mass-field
- is_centrosymmetric
- /NXcrystal_structure/is_centrosymmetric-field
- /NXunit_cell/is_centrosymmetric-field
- is_chiral
- /NXcrystal_structure/is_chiral-field
- /NXunit_cell/is_chiral-field
- is_closed
- /NXcg_primitive_set/is_closed-field
- is_core
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_core-field
- is_cylindrical
- /NXcrystal/is_cylindrical-field
- is_deformed
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_deformed-field
- is_noise
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/is_noise-field
- is_persistent
- /NXapm/ENTRY/USER/identifier/is_persistent-field
- /NXapm/ENTRY/experiment_identifier/is_persistent-field
- /NXapm/ENTRY/sample/identifier/is_persistent-field
- /NXapm/ENTRY/specimen/identifier/is_persistent-field
- /NXapm/ENTRY/specimen/parent_identifier/is_persistent-field
- /NXem/ENTRY/experiment_identifier/is_persistent-field
- /NXem/ENTRY/sample/identifier/is_persistent-field
- /NXem/ENTRY/sample/parent_identifier/is_persistent-field
- /NXem/ENTRY/userID/identifier/is_persistent-field
- /NXidentifier/is_persistent-field
- /NXoptical_spectroscopy/ENTRY/experiment_identifier/is_persistent-field
- is_polycrystalline
- /NXapm/ENTRY/specimen/is_polycrystalline-field
- is_recrystallized
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/is_recrystallized-field
- is_rectangle
- /NXcg_parallelogram_set/is_rectangle-field
- is_specific
- /NXmicrostructure_slip_system/is_specific-field
- is_subgrain
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/is_subgrain-field
- is_watertight
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/is_watertight-field
- iso_surfaceid
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID-group
- isosurfacing
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing-group
- isovalue
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/isovalue-field
- /NXisocontour/isovalue-field
- iteration
- /NXmicrostructure/iteration-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/iteration-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/iteration-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/iteration-field
- iupac_line_candidates
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/iupac_line_candidates-field
- /NXem_eds/indexing/IMAGE_SET/iupac_line_candidates-field
- iupac_line_names
- /NXem_eds/indexing/PEAK/ION/iupac_line_names-field
- iupac_name
- /NXsubstance/iupac_name-field
- jones_quality_factor
- /NXoptical_spectroscopy/ENTRY/derived_parameters/jones_quality_factor-field
- k
- /NXinsertion_device/k-field
- /NXreflections/k-field
- k_alpha_one
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_one-field
- k_alpha_two
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/k_alpha_two-field
- k_d_value
- /NXpid/K_d_value-field
- k_i_value
- /NXpid/K_i_value-field
- k_p_value
- /NXpid/K_p_value-field
- k_t_const
- /NXpid/K_t_const-field
- kappa
- /NXxkappa/entry/name/kappa-link
- /NXxkappa/entry/sample/kappa-field
- kbeta
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/kbeta-field
- kernel_halfwidth
- /NXmicrostructure_odf/configuration/kernel_halfwidth-field
- kernel_mu
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_mu-field
- kernel_name
- /NXmicrostructure_odf/configuration/kernel_name-field
- kernel_sigma
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_sigma-field
- kernel_size
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_size-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_size-field
- kernel_type
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/kernel_type-field
- kernel_variance
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/kernel_variance-field
- kernel_width
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/kernel_width-field
- ki_over_kf_scaling
- /NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
- kinetic_energy
- /NXelectronanalyser/transmission_function/kinetic_energy-field
- /NXenergydispersion/kinetic_energy-field
- /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/kinetic_energy-field
- /NXprocess_mpes/transmission_correction/transmission_function/kinetic_energy-field
- kinetics
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics-group
- kn
- /NXdata_mpes/kN-field
- /NXdata_mpes_detector/kN-field
- kn_calibration
- /NXmpes/ENTRY/PROCESS_MPES/kN_calibration-group
- /NXprocess_mpes/kN_calibration-group
- knn
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn-group
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn-group
- kth
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/kth-field
- /NXmicrostructure_odf/kth_extrema/kth-field
- kth_extrema
- /NXmicrostructure_odf/kth_extrema-group
- l
- /NXreflections/l-field
- label
- /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/label-field
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/label-field
- /NXfit/label-field
- /NXfit_background/label-field
- /NXgraph_edge_set/label-field
- /NXgraph_node_set/label-field
- /NXpeak/label-field
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/label-field
- /NXxps/ENTRY/FIT/label-field
- /NXxps/ENTRY/FIT/peakPEAK/label-field
- lagb_enthalpy
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_enthalpy-field
- lagb_pre_factor
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_pre_factor-field
- lagb_to_hagb_cut
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/lagb_to_hagb_cut-field
- lambda
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
- last_fill
- /NXsource/last_fill-field
- last_process
- /NXcalibration/last_process-field
- /NXdistortion/last_process-field
- /NXregistration/last_process-field
- lateral_focal_point_offset
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/lateral_focal_point_offset-field
- lateral_surface_area
- /NXcg_cylinder_set/lateral_surface_area-field
- lattice_system
- /NXunit_cell/lattice_system-field
- lattice_type
- /NXmicrostructure_slip_system/lattice_type-field
- laue_group
- /NXcrystal_structure/laue_group-field
- /NXunit_cell/laue_group-field
- layer_structure
- /NXoptical_spectroscopy/ENTRY/SAMPLE/layer_structure-field
- layer_thickness
- /NXgrating/layer_thickness-field
- /NXmirror/layer_thickness-field
- layout
- /NXdetector/layout-field
- legend
- /NXmicrostructure_ipf/legend-group
- length
- /NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
- /NXcg_hexahedron_set/length-field
- /NXcg_primitive_set/length-field
- /NXfiber/length-field
- /NXinsertion_device/length-field
- /NXmicrostructure/crystal/length-field
- /NXmicrostructure/interface/length-field
- /NXmicrostructure/triple_junction/length-field
- /NXvelocity_selector/length-field
- lens_diameter
- /NXlens_opt/lens_diameter-field
- lens_em
- /NXcollectioncolumn/LENS_EM-group
- /NXcorrector_cs/LENS_EM-group
- /NXebeam_column/LENS_EM-group
- /NXelectronanalyser/LENS_EM-group
- /NXenergydispersion/LENS_EM-group
- /NXibeam_column/LENS_EM-group
- /NXsource/LENS_EM-group
- /NXspindispersion/LENS_EM-group
- lens_geometry
- /NXxraylens/lens_geometry-field
- lens_length
- /NXxraylens/lens_length-field
- lens_material
- /NXxraylens/lens_material-field
- lens_mode
- /NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
- /NXcollectioncolumn/lens_mode-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/lens_mode-field
- lens_opt
- /NXbeam_path/LENS_OPT-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT-group
- lens_thickness
- /NXxraylens/lens_thickness-field
- lensid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID-group
- level
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/level-group
- /NXprocess_mpes/energy_referencing/level-group
- level_electron_config
- /NXelectron_level/level_electron_config-field
- level_iupac
- /NXelectron_level/level_iupac-field
- lifespan
- /NXbeam_path/SOURCE/lifespan-field
- line_energy
- /NXmicrostructure/triple_junction/line_energy-field
- /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy/line_energy-field
- line_scan
- /NXsts/ENTRY/line_scan-group
- line_time
- /NXscanbox_em/line_time-field
- linear_beam_sample_polarization
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/linear_beam_sample_polarization-field
- lines
- /NXpositioner_sts/lines-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/lines-field
- load_lock_chamber
- /NXapm_msr/instrument/load_lock_chamber-group
- /NXevent_data_apm/instrument/load_lock_chamber-group
- local_electrode
- /NXapm/ENTRY/measurement/instrument/local_electrode-group
- /NXapm_msr/instrument/local_electrode-group
- /NXevent_data_apm/instrument/local_electrode-group
- local_name
- /NXdetector/local_name-field
- /NXem_msr/em_lab/DETECTOR/local_name-field
- location
- /NXapm_msr/instrument/location-field
- /NXem/ENTRY/measurement/em_lab/location-field
- /NXem_msr/em_lab/location-field
- /NXmicrostructure/quadruple_junction/location-field
- /NXmicrostructure/triple_junction/location-field
- /NXmicrostructure_odf/kth_extrema/location-field
- lock_in
- /NXsts/ENTRY/INSTRUMENT/lock_in-group
- lock_in_data_flip_number
- /NXsts/ENTRY/INSTRUMENT/lock_in/lock_in_data_flip_number-field
- lock_in_run
- /NXbias_spectroscopy/lock_in_run-field
- /NXiv_bias/lock_in_run-field
- log
- /NXsnsevent/ENTRY/DASlogs/LOG-group
- /NXsnshisto/ENTRY/DASlogs/LOG-group
- low_pass
- /NXamplifier/low_pass-field
- /NXlockin/low_pass-field
- low_trip_value
- /NXsensor/low_trip_value-field
- /NXsensor_sts/low_trip_value-field
- lower_cap_radii
- /NXcg_cylinder_set/lower_cap_radii-field
- lower_cap_surface_area
- /NXcg_cylinder_set/lower_cap_surface_area-field
- lp
- /NXreflections/lp-field
- lp_filter_cutoff
- /NXlockin/lp_filter_cutoff-field
- lp_filter_order
- /NXlockin/lp_filter_order-field
- lubricant
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
- m_null
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/m_null-field
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm/m_null-field
- m_value
- /NXfilter/m_value-field
- /NXguide/m_value-field
- /NXmirror/m_value-field
- magnetic_field
- /NXarchive/entry/sample/magnetic_field-field
- /NXbending_magnet/magnetic_field-field
- /NXmicrostructure_gragles_config/ENTRY/magnetic_field-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field-group
- /NXsample/magnetic_field-field
- /NXsample/magnetic_field-group
- magnetic_field_env
- /NXsample/magnetic_field_env-group
- magnetic_field_log
- /NXsample/magnetic_field_log-group
- magnetic_wavelength
- /NXinsertion_device/magnetic_wavelength-field
- magnification
- /NXcollectioncolumn/magnification-field
- /NXcorrector_cs/tableauID/magnification-field
- /NXlens_opt/magnification-field
- /NXoptical_system_em/magnification-field
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/magnification-field
- magnitude
- /NXaberration/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_1/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_2/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_3/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_4/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/a_6/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_2/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/b_4/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_0/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_1_2_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_1_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_2_3_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_0/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_2_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_3_4_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_1_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_3_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_4_5_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_0/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_2_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_4_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_a/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/c_5_6_b/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/d_4/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3/magnitude-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5/magnitude-field
- /NXresolution/response_function/magnitude-field
- manipulator
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
- manufacturer
- /NXcapillary/manufacturer-field
- /NXtransmission/ENTRY/instrument/manufacturer-group
- map
- /NXmicrostructure_ipf/map-group
- mapping_mapping
- /NXcalibration/mapping_MAPPING-field
- marching_cubes
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/marching_cubes-group
- mark
- /NXdelocalization/weighting_model/mark-field
- marker
- /NXmicrostructure_mtex_config/plotting/marker-field
- marker_edge_color
- /NXmicrostructure_mtex_config/plotting/marker_edge_color-field
- marker_face_color
- /NXmicrostructure_mtex_config/plotting/marker_face_color-field
- marker_size
- /NXmicrostructure_mtex_config/plotting/marker_size-field
- mask
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/mask-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/mask-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/mask-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/mask-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/mask-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/mask-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/mask-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/mask-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/mask-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_selector_results/ENTRY/roi/window/mask-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/mask-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/mask-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/mask-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/mask-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/mask-field
- /NXapm_paraprobe_tool_results/window/mask-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/mask-field
- /NXcs_filter_boolean_mask/mask-field
- mask_material
- /NXfresnel_zone_plate/mask_material-field
- mask_thickness
- /NXfresnel_zone_plate/mask_thickness-field
- masks
- /NXxpcs/entry/instrument/masks-group
- mass
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass-field
- /NXapm_charge_state_analysis/mass-field
- /NXsample/mass-field
- /NXsample_component/mass-field
- mass_spectrum
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
- /NXapm_ranging/mass_to_charge_distribution/mass_spectrum-group
- mass_to_charge
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_tool_config/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/mass_to_charge-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
- mass_to_charge_conversion
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/mass_to_charge_conversion-group
- mass_to_charge_distribution
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
- /NXapm_ranging/mass_to_charge_distribution-group
- mass_to_charge_range
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/mass_to_charge_range-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/mass_to_charge_range-field
- /NXapm_charge_state_analysis/mass_to_charge_range-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/mass_to_charge_range-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
- /NXatom_set/mass_to_charge_range-field
- /NXion/mass_to_charge_range-field
- match
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/match-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/match-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/match-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/match-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/match-field
- /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/match-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/match-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/match-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/match-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/match-field
- /NXdelocalization/weighting_model/match-field
- /NXmatch_filter/match-field
- match_filter
- /NXapm_paraprobe_tool_config/MATCH_FILTER-group
- material
- /NXaperture/material-field
- /NXbeam_path/window_NUMBER/material-field
- /NXopt_window/ENTRY/material-field
- material_other
- /NXopt_window/ENTRY/material_other-field
- material_phase
- /NXdispersive_material/ENTRY/sample/material_phase-field
- material_phase_comment
- /NXdispersive_material/ENTRY/sample/material_phase_comment-field
- material_properties
- /NXmicrostructure_score_config/ENTRY/material_properties-group
- matrix_elements
- /NXbeam_transfer_matrix_table/matrix_elements-field
- max_delta_x
- /NXmicrostructure_score_config/ENTRY/numerics/max_delta_x-field
- max_frequency
- /NXbeam_path/DISK_CHOPPER/max_frequency-field
- max_gap
- /NXbeam_path/MONOCHROMATOR/SLIT/max_gap-field
- max_iteration
- /NXmicrostructure_score_config/ENTRY/simulation_control/max_iteration-field
- max_physical_capacity
- /NXcs_computer/memory/CIRCUIT/max_physical_capacity-field
- /NXcs_computer/storage/CIRCUIT/max_physical_capacity-field
- max_resident_memory_snapshot
- /NXcs_profiling_event/max_resident_memory_snapshot-field
- max_revolutions
- /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/max_revolutions-field
- max_sew_rate
- /NXiv_bias/max_sew_rate-field
- max_slew_rate
- /NXbias_spectroscopy/max_slew_rate-field
- /NXsts/ENTRY/reproducibility_indicators/max_slew_rate-field
- max_sothree_bandwidth
- /NXmicrostructure_mtex_config/numerics/max_sothree_bandwidth-field
- max_stwo_bandwidth
- /NXmicrostructure_mtex_config/numerics/max_stwo_bandwidth-field
- max_time
- /NXmicrostructure_score_config/ENTRY/simulation_control/max_time-field
- max_value
- /NXfit_parameter/max_value-field
- max_virtual_memory_snapshot
- /NXcs_profiling_event/max_virtual_memory_snapshot-field
- max_x
- /NXmicrostructure_score_config/ENTRY/simulation_control/max_x-field
- maximum_incident_angle
- /NXcapillary/maximum_incident_angle-field
- maximum_number_of_atoms_per_molecular_ion
- /NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
- /NXapm_ranging/maximum_number_of_atoms_per_molecular_ion-field
- maximum_value
- /NXlog/maximum_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
- measure_time
- /NXbeam_path/SOURCE/measure_time-field
- measured_data
- /NXellipsometry/ENTRY/data_collection/measured_data-field
- /NXtransmission/ENTRY/instrument/measured_data-field
- measured_data_errors
- /NXellipsometry/ENTRY/data_collection/measured_data_errors-field
- measurement
- /NXapm/ENTRY/measurement-group
- /NXem/ENTRY/measurement-group
- /NXem/ENTRY/roiID/ebsd/measurement-group
- /NXem_ebsd/measurement-group
- /NXmanipulator/drain_current_amperemeter/measurement-field
- /NXmanipulator/sample_bias_voltmeter/measurement-field
- /NXmanipulator/temperature_sensor/measurement-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/measurement-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/measurement-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/measurement-field
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/measurement-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/measurement-field
- /NXsensor/measurement-field
- /NXsensor_sts/measurement-field
- measurement_data_calibration_type
- /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE-group
- measurement_sensors
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
- measurement_type
- /NXxrd_pan/ENTRY/measurement_type-field
- measurements_period
- /NXcircuit/measurements_period-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/measurements_period-field
- /NXsts/ENTRY/resolution_indicators/measurements_period-field
- melting_temperature
- /NXmicrostructure_score_config/ENTRY/material_properties/melting_temperature-field
- member_count
- /NXsimilarity_grouping/statistics/member_count-field
- memory
- /NXcs_computer/memory-group
- /NXmicrostructure_mtex_config/system/memory-field
- mesh_scan
- /NXsts/ENTRY/mesh_scan-group
- mesh_stateid
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID-group
- method
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/iontype_filter/method-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/iontype_filter/method-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/method-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/iontype_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/decoration_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/iontype_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/iontype_filter/method-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/method-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/iontype_filter/method-field
- /NXapm_paraprobe_selector_config/ENTRY/select/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_selector_config/ENTRY/select/iontype_filter/method-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/iontype_filter/method-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/iontype_filter/method-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing/method-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/hit_multiplicity_filter/method-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/iontype_filter/method-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/method-field
- /NXchemical_process/method-field
- /NXdelocalization/weighting_model/method-field
- /NXem_ebsd/indexing/method-field
- /NXmatch_filter/method-field
- /NXmpes/ENTRY/SAMPLE/history/sample_preparation/method-field
- /NXmpes/ENTRY/method-field
- /NXphysical_process/method-field
- /NXxps/ENTRY/method-field
- /NXxrd_pan/ENTRY/method-field
- methods_advise
- /NXmicrostructure_mtex_config/miscellaneous/methods_advise-field
- microstructureid
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID-group
- /NXmicrostructure_imm_results/ENTRY/microstructureID-group
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID-group
- miller
- /NXcrystal_structure/miller-field
- miller_direction
- /NXmicrostructure_slip_system/miller_direction-field
- miller_indices
- /NXmicrostructure_pf/configuration/miller_indices-field
- miller_plane
- /NXmicrostructure_slip_system/miller_plane-field
- min_abundance
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance-field
- /NXapm_charge_state_analysis/min_abundance-field
- min_abundance_product
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_abundance_product-field
- min_cluster_size
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_cluster_size-field
- min_frequency
- /NXbeam_path/DISK_CHOPPER/min_frequency-field
- min_half_life
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/min_half_life-field
- /NXapm_charge_state_analysis/min_half_life-field
- min_incr_max
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/min_incr_max-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_selector_config/ENTRY/select/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/knn/min_incr_max-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf/min_incr_max-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/evaporation_id_filter/min_incr_max-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/evaporation_id_filter/min_incr_max-field
- /NXapm_ranging/mass_to_charge_distribution/min_incr_max-field
- /NXsubsampling_filter/min_incr_max-field
- min_max_grain
- /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_grain-field
- min_max_subgrain
- /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/min_max_subgrain-field
- min_pts
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/dbscan/min_pts-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/min_pts-field
- min_samples
- /NXapm_compositionspace_config/ENTRY/config/clustering/dbscan/min_samples-field
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/min_samples-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/hdbscan/min_samples-field
- min_value
- /NXfit_parameter/min_value-field
- minimum_value
- /NXlog/minimum_value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/minimum_value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/minimum_value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/minimum_value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/minimum_value-field
- mirror
- /NXbeam_path/MIRROR-group
- /NXinstrument/MIRROR-group
- miscellaneous
- /NXmicrostructure_mtex_config/miscellaneous-group
- misorientation_angle
- /NXrotation_set/misorientation_angle-field
- misorientation_axis
- /NXrotation_set/misorientation_axis-field
- misorientation_quaternion
- /NXrotation_set/misorientation_quaternion-field
- mobility
- /NXmicrostructure/interface/mobility-field
- /NXmicrostructure/quadruple_junction/mobility-field
- /NXmicrostructure/triple_junction/mobility-field
- mobility_weight
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/mobility_weight-field
- mode
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/mode-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/detectorID/mode-field
- /NXfluo/entry/MONITOR/mode-field
- /NXlauetof/entry/control/mode-field
- /NXlens_em/mode-field
- /NXmonitor/mode-field
- /NXmonopd/entry/MONITOR/mode-field
- /NXrefscan/entry/control/mode-field
- /NXreftof/entry/control/mode-field
- /NXsas/ENTRY/MONITOR/mode-field
- /NXsastof/ENTRY/control/mode-field
- /NXsnsevent/ENTRY/MONITOR/mode-field
- /NXsnshisto/ENTRY/MONITOR/mode-field
- /NXsource/mode-field
- /NXspectrum_set/PROCESS/mode-field
- /NXtas/entry/MONITOR/mode-field
- /NXtofnpd/entry/MONITOR/mode-field
- /NXtofraw/entry/MONITOR/mode-field
- /NXtofsingle/entry/MONITOR/mode-field
- /NXxas/ENTRY/DATA/mode-field
- /NXxas/ENTRY/MONITOR/mode-field
- /NXxbase/entry/control/mode-field
- model
- /NXactuator/model-field
- /NXapm/ENTRY/measurement/instrument/fabrication/model-field
- /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/model-field
- /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/model-field
- /NXapm/ENTRY/measurement/instrument/pulser/fabrication/model-field
- /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/model-field
- /NXapm/ENTRY/measurement/instrument/reflectron/fabrication/model-field
- /NXcorrector_cs/tableauID/model-field
- /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/detectorID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/model-field
- /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/model-field
- /NXfabrication/model-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/model-field
- /NXlab_sample_mounting/ENTRY/mounting_machine/model-field
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/model-field
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_mobility/model-field
- /NXmicrostructure_score_config/ENTRY/deformation/model-field
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/model-field
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/model-field
- /NXmicrostructure_score_config/ENTRY/stored_energy_recovery/model-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/device_information/model-field
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/model-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/model-field
- /NXsensor/model-field
- /NXsensor_sts/model-field
- /NXtransmission/ENTRY/acquisition_program/model-field
- model_labels
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/model_labels-field
- model_name
- /NXdispersion/model_name-field
- /NXdispersion_function/model_name-field
- /NXdispersion_table/model_name-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/model_name-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/model_name-field
- /NXdispersive_material/ENTRY/dispersion_x/model_name-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/model_name-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/model_name-field
- /NXdispersive_material/ENTRY/dispersion_y/model_name-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/model_name-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/model_name-field
- /NXdispersive_material/ENTRY/dispersion_z/model_name-field
- moderator
- /NXinstrument/MODERATOR-group
- /NXsnsevent/ENTRY/instrument/moderator-group
- /NXsnshisto/ENTRY/instrument/moderator-group
- modulated_signal_bias
- /NXiv_bias/modulated_signal_bias-field
- modulation_amplitude
- /NXlockin/modulation_amplitude-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/modulation_amplitude-field
- modulation_frequency
- /NXlockin/modulation_frequency-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/modulation_frequency-field
- modulation_signal
- /NXlockin/modulation_signal-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/modulation_signal-field
- /NXsts/ENTRY/resolution_indicators/modulation_signal-field
- modulation_status
- /NXlockin/modulation_status-field
- module_offset
- /NXdetector_module/module_offset-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
- molecular_formula_hill
- /NXmpes/ENTRY/SAMPLE/SUBSTANCE/molecular_formula_hill-field
- /NXsubstance/molecular_formula_hill-field
- molecular_mass
- /NXsubstance/molecular_mass-field
- momentum_resolution
- /NXelectronanalyser/momentum_resolution-group
- monitor
- /NXcxi_ptycho/entry_1/instrument_1/MONITOR-group
- /NXentry/MONITOR-group
- /NXfluo/entry/MONITOR-group
- /NXmonopd/entry/MONITOR-group
- /NXsas/ENTRY/MONITOR-group
- /NXscan/ENTRY/MONITOR-group
- /NXsnsevent/ENTRY/MONITOR-group
- /NXsnshisto/ENTRY/MONITOR-group
- /NXsubentry/MONITOR-group
- /NXtas/entry/MONITOR-group
- /NXtofnpd/entry/MONITOR-group
- /NXtofraw/entry/MONITOR-group
- /NXtofsingle/entry/MONITOR-group
- /NXxas/ENTRY/MONITOR-group
- monochromator
- /NXarpes/ENTRY/INSTRUMENT/monochromator-group
- /NXbeam_path/MONOCHROMATOR-group
- /NXebeam_column/MONOCHROMATOR-group
- /NXfluo/entry/INSTRUMENT/monochromator-group
- /NXibeam_column/MONOCHROMATOR-group
- /NXinstrument/MONOCHROMATOR-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/MONOCHROMATOR-group
- /NXrefscan/entry/instrument/monochromator-group
- /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR-group
- /NXstxm/ENTRY/INSTRUMENT/monochromator-group
- /NXtas/entry/INSTRUMENT/monochromator-group
- /NXxas/ENTRY/INSTRUMENT/monochromator-group
- /NXxbase/entry/instrument/monochromator-group
- monochromatorid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/monochromatorID-group
- mosaic_horizontal
- /NXcrystal/mosaic_horizontal-field
- mosaic_vertical
- /NXcrystal/mosaic_vertical-field
- mosek
- /NXmicrostructure_mtex_config/miscellaneous/mosek-field
- mounting_machine
- /NXlab_sample_mounting/ENTRY/mounting_machine-group
- mounting_method
- /NXlab_sample_mounting/ENTRY/mounting_method-field
- mrp_mass_to_charge
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_mass_to_charge-field
- mrp_value
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/mrp_value-field
- mtex
- /NXmicrostructure_mtex_config/path/mtex-field
- multiple_outputs
- /NXbeam_splitter/multiple_outputs-field
- n_ic_cluster
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/n_ic_cluster-field
- n_max_ic_cluster
- /NXapm_compositionspace_config/ENTRY/config/segmentation/ic_opt/n_max_ic_cluster-field
- n_phases_per_scan_point
- /NXem_ebsd/indexing/n_phases_per_scan_point-field
- naive_discretization
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization-group
- /NXapm_reconstruction/naive_discretization-group
- name
- /NXaberration/name-field
- /NXactuator/name-field
- /NXapm/ENTRY/USER/name-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/name-field
- /NXapm/ENTRY/measurement/instrument/local_electrode/name-field
- /NXapm_compositionspace_results/ENTRY/voxelization/elementID/name-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/name-field
- /NXapm_paraprobe_selector_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/userID/name-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/userID/name-field
- /NXarchive/entry/instrument/SOURCE/name-field
- /NXarchive/entry/instrument/name-field
- /NXarchive/entry/sample/name-field
- /NXarchive/entry/user/name-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXarpes/ENTRY/SAMPLE/name-field
- /NXatom_set/name-field
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/name-field
- /NXcanSAS/ENTRY/PROCESS/name-field
- /NXcanSAS/ENTRY/SAMPLE/name-field
- /NXchamber/name-field
- /NXcomponent/name-field
- /NXcontainer/name-field
- /NXcs_computer/memory/CIRCUIT/name-field
- /NXcs_computer/name-field
- /NXcs_computer/processing/CIRCUIT/name-field
- /NXcs_computer/storage/CIRCUIT/name-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/name-field
- /NXcxi_ptycho/sample_1/name-field
- /NXdeflector/name-field
- /NXdispersion_repeated_parameter/name-field
- /NXdispersion_single_parameter/name-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/name-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/name-field
- /NXebeam_column/electron_source/name-field
- /NXelectronanalyser/name-field
- /NXem/ENTRY/sample/name-field
- /NXem/ENTRY/userID/name-field
- /NXenvironment/name-field
- /NXfit_parameter/name-field
- /NXfluo/entry/INSTRUMENT/SOURCE/name-field
- /NXfluo/entry/SAMPLE/name-field
- /NXibeam_column/ion_source/name-field
- /NXinstrument/name-field
- /NXion/name-field
- /NXiqproc/ENTRY/SAMPLE/name-field
- /NXiqproc/ENTRY/instrument/SOURCE/name-field
- /NXiqproc/ENTRY/instrument/name-field
- /NXiv_temp/ENTRY/SAMPLE/name-field
- /NXlauetof/entry/name-group
- /NXlauetof/entry/sample/name-field
- /NXmanipulator/name-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/name-field
- /NXmonopd/entry/SAMPLE/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/name-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/name-field
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/name-field
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/name-field
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/name-field
- /NXmpes/ENTRY/SAMPLE/name-field
- /NXmpes/ENTRY/USER/name-field
- /NXmx/ENTRY/INSTRUMENT/name-field
- /NXmx/ENTRY/SAMPLE/name-field
- /NXmx/ENTRY/SOURCE/name-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/name-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/name-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/name-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/name-field
- /NXpositioner/name-field
- /NXpositioner_sts/name-field
- /NXpulser_apm/SOURCE/name-field
- /NXreflectron/name-field
- /NXrefscan/entry/instrument/SOURCE/name-field
- /NXrefscan/entry/sample/name-field
- /NXreftof/entry/instrument/name-field
- /NXreftof/entry/sample/name-field
- /NXsample/name-field
- /NXsample_component/name-field
- /NXsas/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXsas/ENTRY/INSTRUMENT/name-field
- /NXsas/ENTRY/SAMPLE/name-field
- /NXsastof/ENTRY/instrument/name-field
- /NXsastof/ENTRY/instrument/source/name-field
- /NXsastof/ENTRY/sample/name-field
- /NXsensor/name-field
- /NXsensor_scan/ENTRY/SAMPLE/name-field
- /NXsensor_scan/ENTRY/USER/name-field
- /NXsensor_sts/name-field
- /NXsnsevent/ENTRY/USER/name-field
- /NXsnsevent/ENTRY/instrument/SNS/name-field
- /NXsnsevent/ENTRY/instrument/name-field
- /NXsnsevent/ENTRY/sample/name-field
- /NXsnshisto/ENTRY/USER/name-field
- /NXsnshisto/ENTRY/instrument/SNS/name-field
- /NXsnshisto/ENTRY/instrument/name-field
- /NXsnshisto/ENTRY/sample/name-field
- /NXsource/name-field
- /NXspe/ENTRY/INSTRUMENT/name-field
- /NXsqom/ENTRY/SAMPLE/name-field
- /NXsqom/ENTRY/instrument/SOURCE/name-field
- /NXsqom/ENTRY/instrument/name-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXsubstance/name-field
- /NXtas/entry/INSTRUMENT/SOURCE/name-field
- /NXtas/entry/SAMPLE/name-field
- /NXtofnpd/entry/SAMPLE/name-field
- /NXtofnpd/entry/user/name-field
- /NXtofraw/entry/SAMPLE/name-field
- /NXtofraw/entry/user/name-field
- /NXtofsingle/entry/SAMPLE/name-field
- /NXtofsingle/entry/user/name-field
- /NXtomo/entry/instrument/SOURCE/name-field
- /NXtomo/entry/sample/name-field
- /NXtomophase/entry/instrument/SOURCE/name-field
- /NXtomophase/entry/sample/name-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/name-field
- /NXtomoproc/entry/SAMPLE/name-field
- /NXtransmission/ENTRY/SAMPLE/name-field
- /NXtransmission/ENTRY/operator/name-field
- /NXuser/name-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/name-field
- /NXxas/ENTRY/SAMPLE/name-field
- /NXxasproc/ENTRY/SAMPLE/name-field
- /NXxbase/entry/instrument/source/name-field
- /NXxbase/entry/sample/name-field
- /NXxeuler/entry/name-group
- /NXxkappa/entry/name-group
- /NXxnb/entry/name-group
- /NXxrot/entry/name-group
- name_spectrum
- /NXellipsometry/ENTRY/data_collection/NAME_spectrum-field
- natural_abundance_product
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/natural_abundance_product-field
- /NXapm_charge_state_analysis/natural_abundance_product-field
- nature
- /NXsnsevent/ENTRY/sample/nature-field
- /NXsnshisto/ENTRY/sample/nature-field
- /NXtofraw/entry/SAMPLE/nature-field
- /NXtofsingle/entry/SAMPLE/nature-field
- next_device
- /NXbeam/next_device-field
- next_set
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set-group
- next_set_feature_to_cluster
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/coprecipitation_analysis/next_set_feature_to_cluster-field
- next_to_current_link
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link-field
- next_to_current_link_type
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation/next_to_current_link_type-field
- node_pair
- /NXgraph_edge_set/node_pair-field
- nodes
- /NXgraph_root/nodes-group
- noise
- /NXsimilarity_grouping/statistics/noise-field
- nominal
- /NXmonitor/nominal-field
- normalization
- /NXapm/ENTRY/sample/chemical_composition/normalization-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/normalization-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/normalization-field
- normals
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/normals-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/normals-field
- /NXcg_unit_normal_set/normals-field
- note
- /NXaperture/NOTE-group
- /NXcanSAS/ENTRY/PROCESS/NOTE-group
- /NXenvironment/NOTE-group
- /NXprocess/NOTE-group
- /NXprocess_mpes/NOTE-group
- /NXresolution/note-group
- /NXxpcs/entry/NOTE-group
- notes
- /NXactivity/notes-group
- /NXchemical_process/notes-group
- /NXentry/notes-group
- /NXhistory/notes-group
- /NXphysical_process/notes-group
- /NXsnsevent/ENTRY/notes-field
- /NXsnshisto/ENTRY/notes-field
- /NXsource/notes-group
- /NXsubentry/notes-group
- nucleation
- /NXmicrostructure_score_config/ENTRY/nucleation-group
- nuclide_hash
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclide_hash-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_hash-field
- /NXapm_charge_state_analysis/nuclide_hash-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_hash-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/nuclide_hash-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_hash-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_hash-field
- /NXatom_set/nuclide_hash-field
- /NXion/nuclide_hash-field
- nuclide_list
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/nuclide_list-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/ionID/nuclide_list-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/ION/nuclide_list-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification/ION/nuclide_list-field
- /NXatom_set/nuclide_list-field
- /NXion/nuclide_list-field
- nuclide_whitelist
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/nuclide_whitelist-field
- nuclides
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/nuclides-field
- /NXapm_charge_state_analysis/nuclides-field
- num
- /NXvelocity_selector/num-field
- num_of_channels
- /NXamplifier/num_of_channels-field
- num_pixel
- /NXbias_spectroscopy/num_pixel-field
- /NXiv_bias/num_pixel-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/num_pixel-field
- /NXsts/ENTRY/resolution_indicators/num_pixel-field
- number
- /NXfermi_chopper/number-field
- number_of_atoms
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_atoms-field
- number_of_boundaries
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/number_of_boundaries-field
- /NXcg_grid/number_of_boundaries-field
- /NXmicrostructure_score_results/ENTRY/discretization/boundary/number_of_boundaries-field
- number_of_bunches
- /NXsource/number_of_bunches-field
- number_of_categorical_labels
- /NXsimilarity_grouping/number_of_categorical_labels-field
- number_of_core
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_core-field
- number_of_crystals
- /NXmicrostructure/crystal/number_of_crystals-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/number_of_crystals-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/number_of_crystals-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_crystals-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_crystals-field
- number_of_cycles
- /NXdetector/number_of_cycles-field
- number_of_demodulator_channels
- /NXlockin/number_of_demodulator_channels-field
- number_of_dld_wires
- /NXapm/ENTRY/atom_probe/hit_finding/number_of_dld_wires-field
- /NXapm_hit_finding/number_of_dld_wires-field
- number_of_domains
- /NXmicrostructure_score_config/ENTRY/solitary_unit/number_of_domains-field
- number_of_edges
- /NXcg_face_list_data_structure/number_of_edges-field
- /NXcg_half_edge_data_structure/number_of_edges-field
- /NXcg_polyhedron_set/number_of_edges-field
- /NXgraph_edge_set/number_of_edges-field
- number_of_faces
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_faces-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_faces-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_faces-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_faces-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/number_of_faces-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_faces-field
- /NXcg_face_list_data_structure/number_of_faces-field
- /NXcg_half_edge_data_structure/number_of_faces-field
- /NXcg_polyhedron_set/number_of_faces-field
- number_of_feature_types
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/number_of_feature_types-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/number_of_feature_types-field
- number_of_features
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_features-field
- number_of_gpus
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_gpus-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_gpus-field
- /NXcs_profiling/number_of_gpus-field
- /NXcs_profiling_event/number_of_gpus-field
- number_of_grains
- /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_grains-field
- /NXmicrostructure_imm_config/ENTRY/roi/number_of_grains-field
- number_of_interfaces
- /NXmicrostructure/interface/number_of_interfaces-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/number_of_interfaces-field
- number_of_ion_types
- /NXapm_ranging/number_of_ion_types-field
- number_of_ions
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window/number_of_ions-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window/number_of_ions-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window/number_of_ions-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window/number_of_ions-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window/number_of_ions-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/number_of_ions-field
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window/number_of_ions-field
- /NXapm_paraprobe_selector_results/ENTRY/roi/window/number_of_ions-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window/number_of_ions-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window/number_of_ions-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window/number_of_ions-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top/number_of_ions-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window/number_of_ions-field
- /NXapm_paraprobe_tool_results/window/number_of_ions-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window/number_of_ions-field
- number_of_iterations
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/number_of_iterations-field
- /NXmicrostructure_gragles_config/ENTRY/simulation_control/number_of_iterations-field
- number_of_junctions
- /NXmicrostructure/quadruple_junction/number_of_junctions-field
- /NXmicrostructure/triple_junction/number_of_junctions-field
- number_of_lenses
- /NXxraylens/number_of_lenses-field
- number_of_noise
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_noise-field
- number_of_numeric_labels
- /NXsimilarity_grouping/number_of_numeric_labels-field
- number_of_objects
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/hit_filter/number_of_objects-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles/number_of_objects-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/bitmask/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear/number_of_objects-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right/number_of_objects-field
- /NXcs_filter_boolean_mask/number_of_objects-field
- number_of_outputs
- /NXcircuit/number_of_outputs-field
- number_of_phases
- /NXmicrostructure/crystal/number_of_phases-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/number_of_phases-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/number_of_phases-field
- number_of_planes
- /NXcrystal_structure/number_of_planes-field
- number_of_processes
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_processes-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_processes-field
- /NXcs_profiling/number_of_processes-field
- /NXcs_profiling_event/number_of_processes-field
- number_of_scan_points
- /NXcrystal_structure/number_of_scan_points-field
- /NXem/ENTRY/roiID/ebsd/indexing/number_of_scan_points-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/number_of_scan_points-field
- /NXem_ebsd/indexing/number_of_scan_points-field
- number_of_solutions
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/number_of_solutions-field
- number_of_subgrains
- /NXmicrostructure_imm_config/ENTRY/roi/number_of_subgrains-field
- number_of_sweeps
- /NXbias_spectroscopy/number_of_sweeps-field
- /NXiv_bias/number_of_sweeps-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/number_of_sweeps-field
- /NXsts/ENTRY/resolution_indicators/number_of_sweeps-field
- number_of_targets
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics/number_of_targets-field
- number_of_tasks
- /NXapm_paraprobe_clusterer_config/ENTRY/number_of_tasks-field
- /NXapm_paraprobe_intersector_config/ENTRY/number_of_tasks-field
- /NXapm_paraprobe_spatstat_config/ENTRY/number_of_tasks-field
- number_of_threads
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/number_of_threads-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/number_of_threads-field
- /NXcs_profiling/number_of_threads-field
- /NXcs_profiling_event/number_of_threads-field
- number_of_total_vertices
- /NXcg_polygon_set/number_of_total_vertices-field
- /NXcg_polyline_set/number_of_total_vertices-field
- number_of_triangle_sets
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/number_of_triangle_sets-field
- number_of_triangles
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid/number_of_triangles-field
- number_of_unique_vertices
- /NXcg_polyline_set/number_of_unique_vertices-field
- /NXcg_triangle_set/number_of_unique_vertices-field
- number_of_vertices
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/number_of_vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/number_of_vertices-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/number_of_vertices-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/number_of_vertices-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/number_of_vertices-field
- /NXcg_face_list_data_structure/number_of_vertices-field
- /NXcg_half_edge_data_structure/number_of_vertices-field
- /NXcg_polyline_set/number_of_vertices-field
- number_sections
- /NXguide/number_sections-field
- numerical_aperture
- /NXfiber/numerical_aperture-field
- /NXlens_opt/numerical_aperture-field
- numerical_label
- /NXsimilarity_grouping/numerical_label-field
- numerical_labels
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/numerical_labels-field
- numerics
- /NXmicrostructure_gragles_config/ENTRY/numerics-group
- /NXmicrostructure_mtex_config/numerics-group
- /NXmicrostructure_score_config/ENTRY/numerics-group
- nxspe_info
- /NXspe/ENTRY/NXSPE_info-group
- obb
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb-group
- objectid
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID-group
- observed_frame
- /NXreflections/observed_frame-field
- observed_frame_errors
- /NXreflections/observed_frame_errors-field
- observed_frame_var
- /NXreflections/observed_frame_var-field
- observed_phi
- /NXreflections/observed_phi-field
- observed_phi_errors
- /NXreflections/observed_phi_errors-field
- observed_phi_var
- /NXreflections/observed_phi_var-field
- observed_px_x
- /NXreflections/observed_px_x-field
- observed_px_x_errors
- /NXreflections/observed_px_x_errors-field
- observed_px_x_var
- /NXreflections/observed_px_x_var-field
- observed_px_y
- /NXreflections/observed_px_y-field
- observed_px_y_errors
- /NXreflections/observed_px_y_errors-field
- observed_px_y_var
- /NXreflections/observed_px_y_var-field
- observed_x
- /NXreflections/observed_x-field
- observed_x_errors
- /NXreflections/observed_x_errors-field
- observed_x_var
- /NXreflections/observed_x_var-field
- observed_y
- /NXreflections/observed_y-field
- observed_y_errors
- /NXreflections/observed_y_errors-field
- observed_y_var
- /NXreflections/observed_y_var-field
- odd_layer_density
- /NXmirror/odd_layer_density-field
- odd_layer_material
- /NXmirror/odd_layer_material-field
- odf
- /NXmicrostructure_mtex_config/path/odf-field
- off_geometry
- /NXbeam_stop/OFF_GEOMETRY-group
- /NXbending_magnet/OFF_GEOMETRY-group
- /NXcollimator/OFF_GEOMETRY-group
- /NXcrystal/OFF_GEOMETRY-group
- /NXdisk_chopper/OFF_GEOMETRY-group
- /NXfermi_chopper/OFF_GEOMETRY-group
- /NXfilter/OFF_GEOMETRY-group
- /NXgrating/OFF_GEOMETRY-group
- /NXguide/OFF_GEOMETRY-group
- /NXinsertion_device/OFF_GEOMETRY-group
- /NXmirror/OFF_GEOMETRY-group
- /NXmoderator/OFF_GEOMETRY-group
- /NXmonitor/OFF_GEOMETRY-group
- /NXmonochromator/OFF_GEOMETRY-group
- /NXsample/OFF_GEOMETRY-group
- /NXsensor/OFF_GEOMETRY-group
- /NXsensor_sts/OFF_GEOMETRY-group
- /NXsolid_geometry/OFF_GEOMETRY-group
- /NXsource/OFF_GEOMETRY-group
- /NXvelocity_selector/OFF_GEOMETRY-group
- /NXxraylens/OFF_GEOMETRY-group
- offset
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/offset-field
- /NXcalibration/offset-field
- /NXcg_alpha_complex/offset-field
- /NXcircuit/offset-field
- /NXdata/offset-field
- /NXiv_bias/offset-field
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/offset-field
- /NXprocess_mpes/energy_referencing/offset-field
- offset_azimuth
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_azimuth-field
- offset_polar
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_polar-field
- offset_tilt
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/offset_tilt-field
- offset_values
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/offset_values-field
- offset_x
- /NXdeflector/offset_x-field
- offset_y
- /NXdeflector/offset_y-field
- omega
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/omega-field
- /NXxrd_pan/ENTRY/experiment_config/omega-group
- /NXxrd_pan/ENTRY/experiment_result/omega-field
- oned_profile
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile-group
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile-group
- open_gl_bug
- /NXmicrostructure_mtex_config/system/open_gl_bug-field
- openloop_amplification
- /NXamplifier/openloop_amplification-field
- operating_system
- /NXcs_computer/operating_system-field
- operation
- /NXcsg/operation-field
- operation_mode
- /NXapm/ENTRY/operation_mode-field
- /NXebeam_column/operation_mode-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/operation_mode-field
- operator
- /NXtransmission/ENTRY/operator-group
- opt_window
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/OPT_WINDOW-group
- optical_loss
- /NXbeam_splitter/optical_loss-field
- optical_system_em
- /NXem_msr/em_lab/OPTICAL_SYSTEM_EM-group
- /NXevent_data_em/em_lab/OPTICAL_SYSTEM_EM-group
- orcid
- /NXsensor_scan/ENTRY/USER/orcid-field
- order_no
- /NXcrystal/order_no-field
- orientation
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/face_normal/orientation-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal/orientation-field
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/orientation-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/ellipsoid_set/orientation-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/ellipsoid_set/orientation-field
- /NXcg_primitive_set/orientation-field
- /NXcg_unit_normal_set/orientation-field
- /NXcontainer/orientation-group
- /NXgeometry/ORIENTATION-group
- /NXmicrostructure_score_config/ENTRY/nucleation/orientation-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
- orientation_angle
- /NXbeam_path/window_NUMBER/orientation_angle-field
- /NXopt_window/ENTRY/orientation_angle-field
- orientation_distribution
- /NXmicrostructure_imm_config/ENTRY/orientation_distribution-group
- orientation_euler
- /NXrotation_set/orientation_euler-field
- orientation_matrix
- /NXcrystal/orientation_matrix-field
- /NXfilter/orientation_matrix-field
- /NXlauetof/entry/sample/orientation_matrix-field
- /NXsample/orientation_matrix-field
- /NXsample_component/orientation_matrix-field
- /NXsingle_crystal/orientation_matrix-field
- /NXtas/entry/SAMPLE/orientation_matrix-field
- /NXxbase/entry/sample/orientation_matrix-field
- orientation_quaternion
- /NXrotation_set/orientation_quaternion-field
- orientation_spread
- /NXmicrostructure/crystal/orientation_spread-field
- origin
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/origin-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/origin-field
- /NXcg_grid/origin-field
- /NXcoordinate_system/origin-field
- /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/origin-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/origin-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/origin-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/origin-field
- /NXem_ebsd/gnomonic_reference_frame/origin-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/origin-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/origin-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/origin-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin-group
- /NXxps/ENTRY/geometries/xps_coordinate_system/origin-field
- original_axis
- /NXcalibration/original_axis-field
- original_centre
- /NXdistortion/original_centre-field
- original_points
- /NXdistortion/original_points-field
- other_material
- /NXbeam_path/window_NUMBER/other_material-field
- other_shape
- /NXbeam_splitter/SHAPE/other_shape-field
- /NXpolarizer_opt/SHAPE/other_shape-field
- other_type
- /NXbeam_splitter/other_type-field
- /NXlens_opt/other_type-field
- /NXwaveplate/other_type-field
- outer_diameter
- /NXfresnel_zone_plate/outer_diameter-field
- outer_plot_spacing
- /NXmicrostructure_mtex_config/plotting/outer_plot_spacing-field
- outermost_zone_width
- /NXfresnel_zone_plate/outermost_zone_width-field
- output
- /NXactuator/OUTPUT-field
- /NXiqproc/ENTRY/reduction/output-group
- /NXsqom/ENTRY/reduction/output-group
- output_cabling
- /NXsts/ENTRY/INSTRUMENT/output_cabling-group
- output_grid
- /NXmicrostructure_ipf/output_grid-group
- output_log
- /NXactuator/OUTPUT_log-group
- output_mode
- /NXcircuit/output_mode-field
- output_name
- /NXcircuit/output_name-field
- output_slew_rate
- /NXcircuit/output_slew_rate-field
- output_value
- /NXcircuit/output_value-field
- overlaps
- /NXreflections/overlaps-field
- p_gain
- /NXpositioner_sts/p_gain-field
- packing_fraction
- /NXcontainer/packing_fraction-field
- pair_separation
- /NXdisk_chopper/pair_separation-field
- parallelogramid
- /NXcg_parallelogram_set/parallelogramID-group
- parallelograms
- /NXcg_parallelogram_set/parallelograms-group
- parameter
- /NXapm/ENTRY/atom_probe/reconstruction/parameter-field
- /NXapm_reconstruction/parameter-field
- /NXem_ebsd/indexing/parameter-group
- parameter_reliability
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/beam_TYPE/parameter_reliability-field
- parameter_units
- /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/parameter_units-field
- /NXdispersion_repeated_parameter/parameter_units-field
- parameters
- /NXentry/PARAMETERS-group
- /NXquadric/parameters-field
- /NXsubentry/PARAMETERS-group
- /NXtomoproc/entry/reconstruction/parameters-group
- /NXxasproc/ENTRY/XAS_data_reduction/parameters-group
- paraprobe
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe-group
- parent
- /NXregion/parent-field
- parent_identifier
- /NXapm/ENTRY/specimen/parent_identifier-group
- /NXem/ENTRY/sample/parent_identifier-group
- parent_mask
- /NXregion/parent_mask-field
- partiality
- /NXreflections/partiality-field
- pass_energy
- /NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field
- /NXenergydispersion/pass_energy-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
- patch_filter
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/patch_filter-group
- patch_identifier
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/patch_identifier-field
- path
- /NXapm/ENTRY/atom_probe/hit_finding/serialized/path-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/path-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/path-field
- /NXapm/ENTRY/atom_probe/ranging/definitions/path-field
- /NXapm/ENTRY/atom_probe/raw_data/serialized/path-field
- /NXapm/ENTRY/atom_probe/reconstruction/config/path-field
- /NXapm/ENTRY/atom_probe/reconstruction/results/path-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/path-field
- /NXapm/ENTRY/serializedID/path-field
- /NXapm_compositionspace_config/ENTRY/config/ranging/path-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/path-field
- /NXapm_compositionspace_results/ENTRY/config/path-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/path-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/path-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/path-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/path-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/path-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/path-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/path-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/path-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/path-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/path-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/path-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/path-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/path-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/path-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/path-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/path-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging/path-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/path-field
- /NXapm_paraprobe_selector_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/path-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/path-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/path-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/path-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/path-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/path-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/path-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/path-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/path-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/config/path-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/path-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/path-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/path-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/config/path-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/path-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/path-field
- /NXem/ENTRY/roiID/ebsd/indexing/source/path-field
- /NXem/ENTRY/roiID/ebsd/measurement/source/path-field
- /NXem/ENTRY/roiID/ebsd/simulation/source/path-field
- /NXem/ENTRY/serializedID/path-field
- /NXem_calorimetry/ENTRY/actuator/path-field
- /NXem_calorimetry/ENTRY/diffraction/path-field
- /NXmicrostructure_gragles_config/ENTRY/discretization/grid/path-field
- /NXmicrostructure_mtex_config/path-group
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd/path-field
- /NXserialized/path-field
- path_length
- /NXsample/path_length-field
- path_length_window
- /NXsample/path_length_window-field
- pattern_center
- /NXem_calorimetry/ENTRY/pattern_center-group
- pattern_centre
- /NXem/ENTRY/roiID/ebsd/pattern_centre-group
- /NXem_ebsd/pattern_centre-group
- pattern_identifier
- /NXem_calorimetry/ENTRY/time_synchronization/pattern_identifier-field
- pca
- /NXapm_compositionspace_config/ENTRY/config/segmentation/pca-group
- /NXapm_compositionspace_results/ENTRY/segmentation/pca-group
- peak
- /NXapm_ranging/peak_search_and_deconvolution/PEAK-group
- /NXem_eds/indexing/PEAK-group
- /NXem_eels/indexing/PEAK-group
- peak_identification
- /NXapm/ENTRY/atom_probe/ranging/peak_identification-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging/peak_identification-group
- /NXapm_ranging/peak_identification-group
- peak_power
- /NXbeam_path/SOURCE/peak_power-field
- /NXsource/peak_power-field
- peak_search
- /NXapm/ENTRY/atom_probe/ranging/peak_search-group
- peak_search_and_deconvolution
- /NXapm_ranging/peak_search_and_deconvolution-group
- peakid
- /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID-group
- peakpeak
- /NXfit/peakPEAK-group
- /NXxps/ENTRY/FIT/peakPEAK-group
- peaks
- /NXem_eds/indexing/IMAGE_SET/PROCESS/peaks-field
- period
- /NXgrating/period-field
- /NXsource/period-field
- pf
- /NXmicrostructure_mtex_config/path/pf-field
- /NXmicrostructure_pf/pf-group
- pf_anno_fun_hdl
- /NXmicrostructure_mtex_config/plotting/pf_anno_fun_hdl-field
- pf_extensions
- /NXmicrostructure_mtex_config/path/pf_extensions-field
- phase
- /NXdisk_chopper/phase-field
- /NXinsertion_device/phase-field
- phase_identifier
- /NXcrystal_structure/phase_identifier-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_identifier-field
- /NXem_ebsd/indexing/phase_identifier-field
- /NXmicrostructure/crystal/phase_identifier-field
- /NXmicrostructure/interface/phase_identifier-field
- /NXmicrostructure/quadruple_junction/phase_identifier-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/phase_identifier-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier-field
- /NXunit_cell/phase_identifier-field
- phase_identifier_offset
- /NXmicrostructure/crystal/phase_identifier_offset-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/phase_identifier_offset-field
- phase_matching
- /NXem_ebsd/indexing/phase_matching-field
- phase_matching_descriptor
- /NXem_ebsd/indexing/phase_matching_descriptor-field
- phase_name
- /NXcrystal_structure/phase_name-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/phase_name-field
- /NXunit_cell/phase_name-field
- phaseid
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID-group
- /NXem_ebsd/indexing/phaseID-group
- phaseplateid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/phaseplateID-group
- phi
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/isosurfacing/phi-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/phi-field
- /NXxeuler/entry/name/phi-link
- /NXxeuler/entry/sample/phi-field
- /NXxkappa/entry/name/phi-link
- /NXxkappa/entry/sample/phi-field
- /NXxrd_pan/ENTRY/experiment_result/phi-field
- phi_two_plot
- /NXmicrostructure_odf/phi_two_plot-group
- physical_form
- /NXmpes/ENTRY/SAMPLE/physical_form-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/physical_form-field
- /NXsample/physical_form-field
- physical_process
- /NXhistory/PHYSICAL_PROCESS-group
- physical_quantity
- /NXactuator/physical_quantity-field
- /NXcalibration/physical_quantity-field
- /NXelectronanalyser/angular_resolution/physical_quantity-field
- /NXelectronanalyser/energy_resolution/physical_quantity-field
- /NXelectronanalyser/momentum_resolution/physical_quantity-field
- /NXelectronanalyser/spatial_resolution/physical_quantity-field
- /NXmanipulator/cryostat/physical_quantity-field
- /NXmanipulator/sample_bias_potentiostat/physical_quantity-field
- /NXmanipulator/sample_heater/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution/physical_quantity-field
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/physical_quantity-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/physical_quantity-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/physical_quantity-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/physical_quantity-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/physical_quantity-field
- /NXprocess_mpes/angularN_calibration/physical_quantity-field
- /NXprocess_mpes/delay_calibration/physical_quantity-field
- /NXprocess_mpes/ellipticity_calibration/physical_quantity-field
- /NXprocess_mpes/energy_calibration/physical_quantity-field
- /NXprocess_mpes/energy_referencing/physical_quantity-field
- /NXprocess_mpes/kN_calibration/physical_quantity-field
- /NXprocess_mpes/polarization_angle_calibration/physical_quantity-field
- /NXprocess_mpes/spatialN_calibration/physical_quantity-field
- /NXresolution/physical_quantity-field
- pid
- /NXactuator/PID-group
- /NXmanipulator/cryostat/PID-group
- /NXmanipulator/sample_bias_potentiostat/PID-group
- /NXmanipulator/sample_heater/PID-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
- piezo_calibration
- /NXpositioner_sts/piezo_calibration-field
- piezo_config
- /NXsts/ENTRY/INSTRUMENT/piezo_config-group
- pinhole
- /NXbeam_path/PINHOLE-group
- pinhole_position
- /NXpulser_apm/SOURCE/BEAM/pinhole_position-field
- pitch
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field
- /NXcanSAS/ENTRY/SAMPLE/pitch-field
- pixel_id
- /NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field
- /NXsnshisto/ENTRY/DATA/pixel_id-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
- pixel_mask
- /NXdetector/pixel_mask-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
- pixel_mask_applied
- /NXdetector/pixel_mask_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
- pixel_time
- /NXscanbox_em/pixel_time-field
- pixel_x
- /NXdata_mpes_detector/pixel_x-field
- pixel_y
- /NXdata_mpes_detector/pixel_y-field
- pixels_line
- /NXpositioner_sts/pixels_line-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/pixels_line-field
- plot
- /NXdispersive_material/ENTRY/dispersion_x/plot-group
- /NXdispersive_material/ENTRY/dispersion_y/plot-group
- /NXdispersive_material/ENTRY/dispersion_z/plot-group
- plotting
- /NXmicrostructure_mtex_config/plotting-group
- point_group
- /NXcrystal_structure/point_group-field
- /NXsample/point_group-field
- /NXsample_component/point_group-field
- /NXunit_cell/point_group-field
- point_identifier
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/point_identifier-field
- point_normal_form
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/initial_interface/point_normal_form-field
- point_set_wrapping
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping-group
- point_setid
- /NXcg_alpha_complex/point_setID-group
- point_to_triangle
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle-group
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle-group
- poison_depth
- /NXmoderator/poison_depth-field
- poison_material
- /NXmoderator/poison_material-field
- polar
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/polar-field
- /NXspe/ENTRY/data/polar-field
- polar_angle
- /NXcrystal/polar_angle-field
- /NXdetector/polar_angle-field
- /NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
- /NXlauetof/entry/instrument/detector/polar_angle-field
- /NXmonopd/entry/DATA/polar_angle-link
- /NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
- /NXreflections/polar_angle-field
- /NXrefscan/entry/data/polar_angle-link
- /NXrefscan/entry/instrument/DETECTOR/polar_angle-field
- /NXreftof/entry/instrument/detector/polar_angle-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
- /NXsastof/ENTRY/instrument/detector/polar_angle-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field
- /NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field
- /NXtas/entry/INSTRUMENT/analyser/polar_angle-field
- /NXtas/entry/SAMPLE/polar_angle-field
- /NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field
- /NXtofraw/entry/instrument/detector/polar_angle-field
- /NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field
- /NXxeuler/entry/instrument/detector/polar_angle-field
- /NXxeuler/entry/name/polar_angle-link
- /NXxkappa/entry/instrument/detector/polar_angle-field
- /NXxkappa/entry/name/polar_angle-link
- /NXxnb/entry/instrument/detector/polar_angle-field
- /NXxnb/entry/name/polar_angle-link
- /NXxrd/ENTRY/DATA/polar_angle-field
- /NXxrd/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
- /NXxrot/entry/instrument/detector/polar_angle-field
- polar_width
- /NXspe/ENTRY/data/polar_width-field
- polarization_angle
- /NXdata_mpes/polarization_angle-field
- /NXdata_mpes_detector/polarization_angle-field
- polarization_angle_calibration
- /NXmpes/ENTRY/PROCESS_MPES/polarization_angle_calibration-group
- /NXprocess_mpes/polarization_angle_calibration-group
- polarizer
- /NXinstrument/POLARIZER-group
- /NXsnsevent/ENTRY/instrument/POLARIZER-group
- /NXsnshisto/ENTRY/instrument/POLARIZER-group
- /NXtransmission/ENTRY/instrument/polarizer-field
- polarizer_angle
- /NXpolarizer_opt/polarizer_angle-field
- polarizer_opt
- /NXbeam_path/POLARIZER_OPT-group
- polarizing
- /NXbeam_splitter/polarizing-field
- poles
- /NXinsertion_device/poles-field
- polfilter_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE-group
- polygon_half_edgeid
- /NXcg_polygon_set/polygon_half_edgeID-group
- polygonid
- /NXcg_polygon_set/polygonID-group
- polygons
- /NXcg_polygon_set/polygons-group
- polyhedra
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra-group
- /NXcg_polyhedron_set/polyhedra-group
- polyhedron
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron-group
- polyhedron_half_edgeid
- /NXcg_polyhedron_set/polyhedron_half_edgeID-group
- polyhedron_set
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/polyhedron_set-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/polyhedron_set-group
- polyhedronid
- /NXcg_polyhedron_set/polyhedronID-group
- polyline_identifier
- /NXmicrostructure/triple_junction/polyline_identifier-field
- polylines
- /NXcg_polyline_set/polylines-field
- position
- /NXapm/ENTRY/atom_probe/ranging/peak_search/peakID/position-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/position-field
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/position-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/position-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/position-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/position-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/position-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/position-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/position-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/position-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/position-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/position-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/position-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/position-field
- /NXapm_paraprobe_tool_config/reconstruction/position-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/position-field
- /NXcg_grid/position-field
- /NXcg_half_edge_data_structure/position-field
- /NXcg_point_set/position-field
- /NXem_calorimetry/ENTRY/pattern_center/result/position-field
- /NXenvironment/position-group
- /NXfit_background/data/position-field
- /NXmicrostructure/quadruple_junction/position-field
- /NXmicrostructure/triple_junction/position-field
- /NXpeak/data/position-field
- /NXpositioner_sts/position-group
- /NXstage_lab/position-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position-group
- /NXxps/ENTRY/FIT/backgroundBACKGROUND/data/position-field
- /NXxps/ENTRY/FIT/peakPEAK/data/position-field
- /NXxps/ENTRY/FIT/peakPEAK/function/position-group
- position_x
- /NXxpcs/entry/sample/position_x-group
- position_y
- /NXxpcs/entry/sample/position_y-group
- position_z
- /NXxpcs/entry/sample/position_z-group
- positioner
- /NXaperture/POSITIONER-group
- /NXinstrument/POSITIONER-group
- /NXmanipulator/POSITIONER-group
- /NXsample/POSITIONER-group
- /NXsnsevent/ENTRY/DASlogs/POSITIONER-group
- /NXsnshisto/ENTRY/DASlogs/POSITIONER-group
- /NXstage_lab/POSITIONER-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner-group
- potentiostat
- /NXmpes/ENTRY/SAMPLE/bias_env/potentiostat-group
- power
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/power-field
- /NXinsertion_device/power-field
- /NXpulser_apm/SOURCE/power-field
- /NXsource/power-field
- /NXxps/ENTRY/INSTRUMENT/sourceTYPE/power-field
- power_loss
- /NXfiber/power_loss-field
- power_spectral_density
- /NXsensor_sts/power_spectral_density-field
- pre_factor
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/pre_factor-field
- pre_sample_flightpath
- /NXentry/pre_sample_flightpath-field
- /NXsubentry/pre_sample_flightpath-field
- /NXtofnpd/entry/pre_sample_flightpath-field
- /NXtofraw/entry/pre_sample_flightpath-field
- /NXtofsingle/entry/pre_sample_flightpath-field
- predicted_frame
- /NXreflections/predicted_frame-field
- predicted_phi
- /NXreflections/predicted_phi-field
- predicted_px_x
- /NXreflections/predicted_px_x-field
- predicted_px_y
- /NXreflections/predicted_px_y-field
- predicted_x
- /NXreflections/predicted_x-field
- predicted_y
- /NXreflections/predicted_y-field
- preparation_date
- /NXapm/ENTRY/specimen/preparation_date-field
- /NXarchive/entry/sample/preparation_date-field
- /NXem/ENTRY/sample/preparation_date-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/preparation_date-field
- /NXsample/preparation_date-field
- preprocessing
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/preprocessing-group
- preset
- /NXfluo/entry/MONITOR/preset-field
- /NXlauetof/entry/control/preset-field
- /NXmonitor/preset-field
- /NXmonopd/entry/MONITOR/preset-field
- /NXrefscan/entry/control/preset-field
- /NXreftof/entry/control/preset-field
- /NXsas/ENTRY/MONITOR/preset-field
- /NXsastof/ENTRY/control/preset-field
- /NXtas/entry/MONITOR/preset-field
- /NXtofnpd/entry/MONITOR/preset-field
- /NXtofraw/entry/MONITOR/preset-field
- /NXtofsingle/entry/MONITOR/preset-field
- /NXxas/ENTRY/MONITOR/preset-field
- /NXxbase/entry/control/preset-field
- pressure
- /NXarchive/entry/sample/pressure-field
- /NXevent_data_apm/instrument/analysis_chamber/pressure-field
- /NXevent_data_apm/instrument/buffer_chamber/pressure-field
- /NXevent_data_apm/instrument/load_lock_chamber/pressure-field
- /NXsample/pressure-field
- /NXsensor_sts/pressure-field
- pressure_gauge
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge-group
- /NXmpes/ENTRY/SAMPLE/gas_pressure_env/pressure_gauge-group
- previous_device
- /NXbeam/previous_device-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/BEAM_DEVICE/previous_device-field
- previous_devices
- /NXbeam_device/previous_devices-field
- previous_source
- /NXsource/previous_source-field
- prf_cc
- /NXreflections/prf_cc-field
- probability_mass
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/knn/probability_mass-field
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf/probability_mass-field
- probe
- /NXarchive/entry/instrument/SOURCE/probe-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field
- /NXebeam_column/electron_source/probe-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/probe-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/ion_source/probe-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/probe-group
- /NXfluo/entry/INSTRUMENT/SOURCE/probe-field
- /NXibeam_column/ion_source/probe-group
- /NXiqproc/ENTRY/instrument/SOURCE/probe-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/probe-field
- /NXoptical_system_em/probe-group
- /NXrefscan/entry/instrument/SOURCE/probe-field
- /NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXsastof/ENTRY/instrument/source/probe-field
- /NXsnsevent/ENTRY/instrument/SNS/probe-field
- /NXsnshisto/ENTRY/instrument/SNS/probe-field
- /NXsource/probe-field
- /NXsqom/ENTRY/instrument/SOURCE/probe-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXtas/entry/INSTRUMENT/SOURCE/probe-field
- /NXtomo/entry/instrument/SOURCE/probe-field
- /NXtomophase/entry/instrument/SOURCE/probe-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field
- /NXxbase/entry/instrument/source/probe-field
- probe_current
- /NXoptical_system_em/probe_current-field
- procedure
- /NXopt_window/ENTRY/window_correction/procedure-field
- process
- /NXcanSAS/ENTRY/PROCESS-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS-group
- /NXem_correlation/PROCESS-group
- /NXem_eds/indexing/IMAGE_SET/PROCESS-group
- /NXem_method/PROCESS-group
- /NXentry/PROCESS-group
- /NXimage_set/PROCESS-group
- /NXinteraction_vol_em/PROCESS-group
- /NXroi/PROCESS-group
- /NXsensor_scan/ENTRY/PROCESS-group
- /NXspectrum_set/PROCESS-group
- /NXsubentry/PROCESS-group
- /NXxpcs/PROCESS-group
- /NXxrd/ENTRY/PROCESS-group
- process_identifier
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/process_identifier-field
- process_mpes
- /NXmpes/ENTRY/PROCESS_MPES-group
- /NXxps/ENTRY/PROCESS_MPES-group
- processing
- /NXcs_computer/processing-group
- processing_reference_frame
- /NXcoordinate_system_set/processing_reference_frame-group
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame-group
- profile
- /NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
- profiling
- /NXapm/ENTRY/profiling-group
- /NXapm_compositionspace_results/ENTRY/profiling-group
- /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_distancer_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_intersector_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_ranger_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_selector_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling-group
- /NXapm_paraprobe_tool_common/profiling-group
- /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling-group
- /NXem/ENTRY/profiling-group
- /NXem_calorimetry/ENTRY/profiling-group
- /NXmicrostructure_gragles_config/ENTRY/profiling-group
- /NXmicrostructure_imm_results/ENTRY/profiling-group
- /NXmicrostructure_kanapy_results/ENTRY/profiling-group
- /NXmicrostructure_score_config/ENTRY/profiling-group
- program
- /NXapm/ENTRY/atom_probe/hit_finding/programID/program-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID/program-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID/program-field
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID/program-field
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID/program-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID/program-field
- /NXapm/ENTRY/atom_probe/ranging/peak_search/programID/program-field
- /NXapm/ENTRY/atom_probe/ranging/programID/program-field
- /NXapm/ENTRY/atom_probe/raw_data/programID/program-field
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID/program-field
- /NXapm/ENTRY/atom_probe/reconstruction/programID/program-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID/program-field
- /NXapm/ENTRY/profiling/programID/program-field
- /NXapm_compositionspace_results/ENTRY/programID/program-field
- /NXapm_hit_finding/PROGRAM-group
- /NXapm_paraprobe_clusterer_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_selector_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_selector_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/programID/program-field
- /NXapm_paraprobe_tool_common/PROGRAM-group
- /NXapm_paraprobe_transcoder_config/ENTRY/common/programID/program-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/programID/program-field
- /NXapm_ranging/PROGRAM-group
- /NXapm_ranging/background_quantification/PROGRAM-group
- /NXapm_ranging/mass_to_charge_distribution/PROGRAM-group
- /NXapm_ranging/peak_identification/PROGRAM-group
- /NXapm_ranging/peak_search_and_deconvolution/PROGRAM-group
- /NXapm_reconstruction/PROGRAM-group
- /NXapm_reconstruction/naive_discretization/PROGRAM-group
- /NXapm_sim/PROGRAM-group
- /NXapm_volt_and_bowl/PROGRAM-group
- /NXarchive/entry/program-field
- /NXcg_marching_cubes/PROGRAM-group
- /NXcomponent/PROGRAM-group
- /NXcs_prng/PROGRAM-group
- /NXellipsometry/ENTRY/data_collection/data_software/program-field
- /NXem/ENTRY/measurement/em_lab/control_programID/program-field
- /NXem/ENTRY/profiling/programID/program-field
- /NXem_calorimetry/ENTRY/azimuthal_integration/programID/program-field
- /NXem_calorimetry/ENTRY/background_subtraction/programID/program-field
- /NXem_calorimetry/ENTRY/distortion_correction/programID/program-field
- /NXem_eds/indexing/PROGRAM-group
- /NXem_eels/indexing/PROGRAM-group
- /NXem_eels/zlp_correction/PROGRAM-group
- /NXem_sim/simulation/PROGRAM-group
- /NXenvironment/program-field
- /NXimage_set/PROCESS/PROGRAM-group
- /NXiqproc/ENTRY/reduction/program-field
- /NXmicrostructure/configuration/PROGRAM-group
- /NXmicrostructure_gragles_config/ENTRY/environment/programID/program-field
- /NXmicrostructure_gragles_results/ENTRY/environment/programID/program-field
- /NXmicrostructure_imm_results/ENTRY/environment/programID/program-field
- /NXmicrostructure_imm_results/ENTRY/program1/program-field
- /NXmicrostructure_kanapy_results/ENTRY/environment/programID/program-field
- /NXmicrostructure_kanapy_results/ENTRY/program1/program-field
- /NXmicrostructure_kanapy_results/ENTRY/program2/program-field
- /NXmicrostructure_score_config/ENTRY/environment/programID/program-field
- /NXmicrostructure_score_results/ENTRY/environment/programID/program-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE/program-field
- /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/program-field
- /NXprocess/program-field
- /NXprocess_mpes/program-field
- /NXprogram/program-field
- /NXsensor_scan/ENTRY/PROCESS/program-field
- /NXspectrum_set/PROCESS/PROGRAM-group
- /NXsqom/ENTRY/reduction/program-field
- /NXtomoproc/entry/reconstruction/program-field
- /NXxasproc/ENTRY/XAS_data_reduction/program-field
- program1
- /NXmicrostructure_gragles_config/ENTRY/program1-group
- /NXmicrostructure_gragles_results/ENTRY/program1-group
- /NXmicrostructure_imm_results/ENTRY/program1-group
- /NXmicrostructure_kanapy_results/ENTRY/program1-group
- /NXmicrostructure_score_config/ENTRY/program1-group
- /NXmicrostructure_score_results/ENTRY/program1-group
- program2
- /NXmicrostructure_kanapy_results/ENTRY/program2-group
- program_name
- /NXentry/program_name-field
- /NXmicrostructure_gragles_config/ENTRY/program1/program_name-field
- /NXmicrostructure_gragles_results/ENTRY/program1/program_name-field
- /NXmicrostructure_score_config/ENTRY/program1/program_name-field
- /NXmicrostructure_score_results/ENTRY/program1/program_name-field
- /NXspe/ENTRY/program_name-field
- /NXsubentry/program_name-field
- programid
- /NXapm/ENTRY/atom_probe/hit_finding/programID-group
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/programID-group
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/programID-group
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/programID-group
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/programID-group
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/programID-group
- /NXapm/ENTRY/atom_probe/ranging/peak_search/programID-group
- /NXapm/ENTRY/atom_probe/ranging/programID-group
- /NXapm/ENTRY/atom_probe/raw_data/programID-group
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/programID-group
- /NXapm/ENTRY/atom_probe/reconstruction/programID-group
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/programID-group
- /NXapm/ENTRY/profiling/programID-group
- /NXapm_compositionspace_results/ENTRY/programID-group
- /NXapm_paraprobe_clusterer_config/ENTRY/common/programID-group
- /NXapm_paraprobe_clusterer_results/ENTRY/common/programID-group
- /NXapm_paraprobe_distancer_config/ENTRY/common/programID-group
- /NXapm_paraprobe_distancer_results/ENTRY/common/programID-group
- /NXapm_paraprobe_intersector_config/ENTRY/common/programID-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/programID-group
- /NXapm_paraprobe_nanochem_config/ENTRY/common/programID-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/programID-group
- /NXapm_paraprobe_ranger_config/ENTRY/common/programID-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/programID-group
- /NXapm_paraprobe_selector_config/ENTRY/common/programID-group
- /NXapm_paraprobe_selector_results/ENTRY/common/programID-group
- /NXapm_paraprobe_spatstat_config/ENTRY/common/programID-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/programID-group
- /NXapm_paraprobe_surfacer_config/ENTRY/common/programID-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/programID-group
- /NXapm_paraprobe_tessellator_config/ENTRY/common/programID-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/programID-group
- /NXapm_paraprobe_transcoder_config/ENTRY/common/programID-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/programID-group
- /NXem/ENTRY/profiling/programID-group
- /NXem_calorimetry/ENTRY/azimuthal_integration/programID-group
- /NXem_calorimetry/ENTRY/background_subtraction/programID-group
- /NXem_calorimetry/ENTRY/distortion_correction/programID-group
- /NXmicrostructure_gragles_config/ENTRY/environment/programID-group
- /NXmicrostructure_gragles_results/ENTRY/environment/programID-group
- /NXmicrostructure_imm_results/ENTRY/environment/programID-group
- /NXmicrostructure_kanapy_results/ENTRY/environment/programID-group
- /NXmicrostructure_score_config/ENTRY/environment/programID-group
- /NXmicrostructure_score_results/ENTRY/environment/programID-group
- projection
- /NXcollectioncolumn/projection-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
- projection_direction
- /NXmicrostructure_ipf/projection_direction-field
- protocol_name
- /NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
- /NXapm_reconstruction/protocol_name-field
- proton_charge
- /NXsnsevent/ENTRY/proton_charge-field
- /NXsnshisto/ENTRY/proton_charge-field
- psi
- /NXspe/ENTRY/NXSPE_info/psi-field
- pulse_delay
- /NXbeam/pulse_delay-field
- pulse_duration
- /NXbeam/pulse_duration-field
- pulse_energy
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE/pulse_energy-field
- /NXbeam/pulse_energy-field
- /NXpulser_apm/SOURCE/pulse_energy-field
- /NXsource/pulse_energy-field
- pulse_fraction
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_fraction-field
- /NXpulser_apm/pulse_fraction-field
- pulse_frequency
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_frequency-field
- /NXpulser_apm/pulse_frequency-field
- pulse_height
- /NXevent_data/pulse_height-field
- pulse_identifier
- /NXevent_data_apm/pulse_identifier-field
- pulse_identifier_offset
- /NXevent_data_apm/pulse_identifier_offset-field
- pulse_mode
- /NXapm/ENTRY/measurement/instrument/pulser/pulse_mode-field
- /NXpulser_apm/pulse_mode-field
- pulse_number
- /NXpulser_apm/pulse_number-field
- pulse_shape
- /NXmoderator/pulse_shape-group
- /NXsource/pulse_shape-group
- pulse_time
- /NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
- pulse_voltage
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/pulse_voltage-field
- /NXpulser_apm/pulse_voltage-field
- pulse_width
- /NXsource/pulse_width-field
- pulser
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser-group
- /NXapm/ENTRY/measurement/instrument/pulser-group
- /NXapm_msr/instrument/pulser-group
- /NXevent_data_apm/instrument/pulser-group
- pump
- /NXem/ENTRY/measurement/em_lab/PUMP-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/PUMP-group
- /NXem_msr/em_lab/PUMP-group
- /NXevent_data_em/em_lab/PUMP-group
- purpose
- /NXbeam_device/purpose-field
- pv_sensor
- /NXpid/pv_sensor-group
- q
- /NXcanSAS/ENTRY/DATA/Q-field
- /NXxrd_pan/ENTRY/q_data/q-field
- q_data
- /NXxrd_pan/ENTRY/q_data-group
- q_norm
- /NXxrd_pan/ENTRY/experiment_result/q_norm-field
- q_parallel
- /NXxrd_pan/ENTRY/experiment_result/q_parallel-field
- /NXxrd_pan/ENTRY/q_data/q_parallel-field
- q_perpendicular
- /NXxrd_pan/ENTRY/experiment_result/q_perpendicular-field
- /NXxrd_pan/ENTRY/q_data/q_perpendicular-field
- qdev
- /NXcanSAS/ENTRY/DATA/Qdev-field
- qh
- /NXtas/entry/DATA/qh-link
- /NXtas/entry/SAMPLE/qh-field
- qk
- /NXtas/entry/DATA/qk-link
- /NXtas/entry/SAMPLE/qk-field
- ql
- /NXtas/entry/DATA/ql-link
- /NXtas/entry/SAMPLE/ql-field
- qmean
- /NXcanSAS/ENTRY/DATA/Qmean-field
- quadric
- /NXsolid_geometry/QUADRIC-group
- quadruple_junction
- /NXmicrostructure/quadruple_junction-group
- qx
- /NXiqproc/ENTRY/DATA/qx-field
- /NXsqom/ENTRY/DATA/qx-field
- qy
- /NXiqproc/ENTRY/DATA/qy-field
- /NXsqom/ENTRY/DATA/qy-field
- qz
- /NXsqom/ENTRY/DATA/qz-field
- r_5
- /NXcorrector_cs/tableauID/r_5-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/r_5-group
- r_slit
- /NXfermi_chopper/r_slit-field
- radiation
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
- radii
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi/cylinder_set/radii-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/cylinder_set/radii-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/cylinder_set/radii-field
- /NXcg_cylinder_set/radii-field
- /NXcg_sphere_set/radii-field
- radius
- /NXcg_cylinder_set/radius-field
- /NXcg_sphere_set/radius-field
- /NXdisk_chopper/radius-field
- /NXenergydispersion/radius-field
- /NXfermi_chopper/radius-field
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/radius-field
- /NXvelocity_selector/radius-field
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/radius-field
- raman_experiment_type
- /NXraman/ENTRY/raman_experiment_type-field
- raman_experiment_type_other
- /NXraman/ENTRY/raman_experiment_type_other-field
- random_forest_classifier
- /NXapm_compositionspace_config/ENTRY/config/autophase/random_forest_classifier-group
- random_number_generator
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator-group
- randomize_iontypes
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/randomize_iontypes-field
- range
- /NXapm_paraprobe_ranger_config/ENTRY/range-group
- /NXmonitor/range-field
- ranging
- /NXapm/ENTRY/atom_probe/ranging-group
- /NXapm_compositionspace_config/ENTRY/config/ranging-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging-group
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging-group
- /NXapm_paraprobe_tool_config/ranging-group
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/ranging-group
- ranging_definitions
- /NXapm_compositionspace_config/ENTRY/config/ranging/ranging_definitions-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/ranging_definitions-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/ranging_definitions-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/ranging_definitions-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/ranging_definitions-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/ranging_definitions-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/ranging_definitions-field
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging/ranging_definitions-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/ranging_definitions-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/ranging_definitions-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/ranging_definitions-field
- /NXapm_paraprobe_tool_config/ranging/ranging_definitions-field
- ratio
- /NXdisk_chopper/ratio-field
- ratio_k_alphatwo_k_alphaone
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/ratio_k_alphatwo_k_alphaone-field
- raw
- /NXdata_mpes_detector/raw-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data/raw-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data/raw-field
- raw_data
- /NXapm/ENTRY/atom_probe/raw_data-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/raw_data-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/detector_TYPE/raw_data-group
- /NXxrd/ENTRY/INSTRUMENT/DETECTOR/raw_data-group
- raw_file
- /NXtomoproc/entry/reconstruction/parameters/raw_file-field
- /NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
- raw_frames
- /NXsnsevent/ENTRY/raw_frames-field
- /NXsnshisto/ENTRY/raw_frames-field
- raw_time_of_flight
- /NXdetector/raw_time_of_flight-field
- raw_tof
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/raw_tof-field
- /NXapm_volt_and_bowl/raw_tof-field
- raw_value
- /NXlog/raw_value-field
- /NXpositioner/raw_value-field
- /NXpositioner_sts/raw_value-field
- rdeform_field
- /NXdistortion/rdeform_field-field
- rdf
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics/rdf-group
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/rdf-group
- read_bfield_current
- /NXseparator/read_Bfield_current-group
- /NXspin_rotator/read_Bfield_current-group
- read_bfield_voltage
- /NXseparator/read_Bfield_voltage-group
- /NXspin_rotator/read_Bfield_voltage-group
- read_current
- /NXelectrostatic_kicker/read_current-group
- /NXmagnetic_kicker/read_current-group
- /NXquadrupole_magnet/read_current-group
- /NXsolenoid_magnet/read_current-group
- read_efield_current
- /NXseparator/read_Efield_current-group
- /NXspin_rotator/read_Efield_current-group
- read_efield_voltage
- /NXseparator/read_Efield_voltage-group
- /NXspin_rotator/read_Efield_voltage-group
- read_voltage
- /NXelectrostatic_kicker/read_voltage-group
- /NXmagnetic_kicker/read_voltage-group
- /NXquadrupole_magnet/read_voltage-group
- /NXsolenoid_magnet/read_voltage-group
- real
- /NXapm/ENTRY/atom_probe/initial_specimen/image_2d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/real-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/real-field
- /NXimage_set/image_1d/real-field
- /NXimage_set/image_2d/real-field
- /NXimage_set/image_3d/real-field
- /NXimage_set/stack_1d/real-field
- /NXimage_set/stack_2d/real-field
- /NXimage_set/stack_3d/real-field
- real_time
- /NXdetector/real_time-field
- realloc_cell_cache
- /NXmicrostructure_score_config/ENTRY/numerics/realloc_cell_cache-field
- reconstructed_positions
- /NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
- /NXapm_reconstruction/reconstructed_positions-field
- reconstruction
- /NXapm/ENTRY/atom_probe/reconstruction-group
- /NXapm_compositionspace_config/ENTRY/config/reconstruction-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction-group
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction-group
- /NXapm_paraprobe_tool_config/reconstruction-group
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction-group
- /NXtomoproc/entry/reconstruction-group
- record_final_z
- /NXbias_spectroscopy/record_final_z-field
- /NXiv_bias/record_final_z-field
- recover_evaporation_id
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/recover_evaporation_id-field
- recrystallization_front
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front-group
- recrystallized_grain_identifier
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/recrystallized_grain_identifier-field
- recrystallized_volume_fraction
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/recrystallized_volume_fraction-field
- rediscretization
- /NXmicrostructure_score_config/ENTRY/solitary_unit/rediscretization-field
- reduction
- /NXiqproc/ENTRY/reduction-group
- /NXsqom/ENTRY/reduction-group
- ref_attenuator
- /NXtransmission/ENTRY/instrument/ref_attenuator-group
- ref_phase_n
- /NXlockin/ref_phase_N-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/ref_phase_N-field
- reference
- /NXcrystal_structure/reference-group
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/reference-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/reference-field
- reference_burgers_magnitude
- /NXmicrostructure_score_config/ENTRY/material_properties/reference_burgers_magnitude-field
- reference_data_link
- /NXbeam_path/window_NUMBER/reference_data_link-field
- /NXellipsometry/ENTRY/data_collection/reference_data_link-field
- /NXopt_window/ENTRY/window_correction/reference_data_link-field
- reference_frames
- /NXoptical_spectroscopy/ENTRY/reference_frames-group
- reference_measurement
- /NXcontainer/reference_measurement-link
- reference_peak
- /NXmpes/ENTRY/PROCESS_MPES/energy_referencing/reference_peak-field
- /NXprocess_mpes/energy_referencing/reference_peak-field
- reference_plane
- /NXbeam/TRANSFORMATIONS/reference_plane-field
- reference_shear_modulus
- /NXmicrostructure_score_config/ENTRY/material_properties/reference_shear_modulus-field
- references
- /NXdispersive_material/ENTRY/REFERENCES-group
- reflectance
- /NXbeam_splitter/reflectance-field
- /NXlens_opt/reflectance-field
- /NXwaveplate/reflectance-field
- reflection
- /NXcrystal/reflection-field
- /NXpolarizer/reflection-field
- /NXpolarizer_opt/reflection-field
- reflection_id
- /NXreflections/reflection_id-field
- reflectivity
- /NXcrystal/reflectivity-group
- /NXguide/reflectivity-group
- /NXmirror/reflectivity-group
- /NXoptical_spectroscopy/ENTRY/derived_parameters/reflectivity-field
- reflectron
- /NXapm/ENTRY/measurement/instrument/reflectron-group
- /NXapm_msr/instrument/REFLECTRON-group
- /NXevent_data_apm/instrument/REFLECTRON-group
- refractive_index
- /NXdispersion_table/refractive_index-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/refractive_index-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/refractive_index-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/refractive_index-field
- region_origin
- /NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
- region_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
- registration
- /NXprocess/REGISTRATION-group
- /NXprocess_mpes/REGISTRATION-group
- regularize_alpha_complex
- /NXcg_alpha_complex/regularize_alpha_complex-field
- relation
- /NXgraph_root/relation-group
- relative_area
- /NXfit/peakPEAK/relative_area-field
- relative_atomic_concentration
- /NXxps/ENTRY/FIT/peakPEAK/relative_atomic_concentration-field
- relative_intensity
- /NXcrystal_structure/relative_intensity-field
- /NXelectronanalyser/transmission_function/relative_intensity-field
- /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function/relative_intensity-field
- /NXprocess_mpes/transmission_correction/transmission_function/relative_intensity-field
- relative_mobility
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/relative_mobility-field
- relative_molecular_mass
- /NXcontainer/relative_molecular_mass-field
- /NXsample/relative_molecular_mass-field
- /NXsample_component/relative_molecular_mass-field
- relative_resolution
- /NXelectronanalyser/energy_resolution/relative_resolution-field
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution/relative_resolution-field
- /NXresolution/relative_resolution-field
- relative_resolution_errors
- /NXresolution/relative_resolution_errors-field
- relative_sensitivity_factor
- /NXfit/peakPEAK/relative_sensitivity_factor-field
- release_date
- /NXarchive/entry/release_date-field
- removal
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
- representation
- /NXdispersion_function/representation-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/representation-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/representation-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/representation-field
- /NXmicrostructure/crystal/representation-field
- /NXmicrostructure/interface/representation-field
- /NXmicrostructure/quadruple_junction/representation-field
- /NXmicrostructure/triple_junction/representation-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/interface/representation-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/representation-field
- reproducibility_indicators
- /NXsts/ENTRY/reproducibility_indicators-group
- requested_pixel_time
- /NXscanbox_em/requested_pixel_time-field
- reset_bias
- /NXbias_spectroscopy/reset_bias-field
- /NXiv_bias/reset_bias-field
- residual
- /NXfit/data/residual-field
- /NXxps/ENTRY/FIT/data/residual-field
- resolution
- /NXelectronanalyser/RESOLUTION-group
- /NXelectronanalyser/angular_resolution/resolution-field
- /NXelectronanalyser/energy_resolution/resolution-field
- /NXelectronanalyser/momentum_resolution/resolution-field
- /NXelectronanalyser/spatial_resolution/resolution-field
- /NXinstrument/RESOLUTION-group
- /NXmicrostructure_odf/configuration/resolution-field
- /NXmicrostructure_odf/sampling/resolution-field
- /NXmicrostructure_pf/configuration/resolution-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/resolution-field
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution/resolution-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/resolution-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/resolution-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/resolution-field
- /NXresolution/resolution-field
- resolution_errors
- /NXelectronanalyser/angular_resolution/resolution_errors-field
- /NXelectronanalyser/energy_resolution/resolution_errors-field
- /NXelectronanalyser/momentum_resolution/resolution_errors-field
- /NXelectronanalyser/spatial_resolution/resolution_errors-field
- /NXresolution/resolution_errors-field
- resolution_formula
- /NXresolution/resolution_formula-field
- resolution_indicators
- /NXsts/ENTRY/resolution_indicators-group
- response_function
- /NXresolution/response_function-group
- response_time
- /NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
- result
- /NXapm_compositionspace_results/ENTRY/autophase/result-group
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result-group
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result-group
- /NXem_calorimetry/ENTRY/azimuthal_integration/result-group
- /NXem_calorimetry/ENTRY/background_subtraction/result-group
- /NXem_calorimetry/ENTRY/distortion_correction/result-group
- /NXem_calorimetry/ENTRY/pattern_center/result-group
- results
- /NXapm/ENTRY/atom_probe/reconstruction/results-group
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/results-field
- retardance
- /NXwaveplate/retardance-field
- retardance_distribution
- /NXwaveplate/retardance_distribution-group
- revision
- /NXarchive/entry/revision-field
- /NXentry/revision-field
- /NXsubentry/revision-field
- revolutions
- /NXellipsometry/ENTRY/INSTRUMENT/rotating_element/revolutions-field
- roi
- /NXapm_paraprobe_selector_results/ENTRY/roi-group
- /NXem/ENTRY/roiID/ebsd/indexing/roi-group
- /NXem_correlation/indexing/roi-group
- /NXem_ebsd/indexing/roi-group
- /NXmicrostructure_imm_config/ENTRY/roi-group
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/roi-group
- roi_cylinder_height
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_height-field
- roi_cylinder_radius
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_cylinder_radius-field
- roi_orientation
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/roi_orientation-field
- roiid
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID-group
- /NXem/ENTRY/roiID-group
- rois_far_from_edge
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge-group
- role
- /NXarchive/entry/user/role-field
- /NXem/ENTRY/userID/role-field
- /NXsnsevent/ENTRY/USER/role-field
- /NXsnshisto/ENTRY/USER/role-field
- /NXuser/role-field
- roll
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field
- /NXcanSAS/ENTRY/SAMPLE/roll-field
- rollett_holm
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/rollett_holm-group
- rotating_element
- /NXellipsometry/ENTRY/INSTRUMENT/rotating_element-group
- rotating_element_type
- /NXellipsometry/ENTRY/INSTRUMENT/rotating_element_type-field
- rotation
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field
- /NXscanbox_em/rotation-field
- /NXstage_lab/rotation-field
- rotation_angle
- /NXmonopd/entry/SAMPLE/rotation_angle-field
- /NXrefscan/entry/data/rotation_angle-link
- /NXrefscan/entry/sample/rotation_angle-field
- /NXreftof/entry/sample/rotation_angle-field
- /NXsample/rotation_angle-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field
- /NXsastof/ENTRY/instrument/detector/rotation_angle-field
- /NXscan/ENTRY/DATA/rotation_angle-link
- /NXscan/ENTRY/SAMPLE/rotation_angle-field
- /NXspe/ENTRY/SAMPLE/rotation_angle-field
- /NXstxm/ENTRY/SAMPLE/rotation_angle-field
- /NXtas/entry/INSTRUMENT/analyser/rotation_angle-field
- /NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field
- /NXtas/entry/SAMPLE/rotation_angle-field
- /NXtomo/entry/data/rotation_angle-link
- /NXtomo/entry/sample/rotation_angle-field
- /NXtomophase/entry/data/rotation_angle-link
- /NXtomophase/entry/sample/rotation_angle-field
- /NXxeuler/entry/name/rotation_angle-link
- /NXxeuler/entry/sample/rotation_angle-field
- /NXxkappa/entry/name/rotation_angle-link
- /NXxkappa/entry/sample/rotation_angle-field
- /NXxnb/entry/name/rotation_angle-link
- /NXxnb/entry/sample/rotation_angle-field
- /NXxrot/entry/name/rotation_angle-link
- /NXxrot/entry/sample/rotation_angle-field
- rotation_angle_step
- /NXxrot/entry/sample/rotation_angle_step-field
- rotation_control
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
- rotation_convention
- /NXcoordinate_system_set/rotation_convention-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_convention-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_convention-field
- rotation_euler
- /NXrotation_set/rotation_euler-field
- rotation_handedness
- /NXcoordinate_system_set/rotation_handedness-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/rotation_handedness-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/rotation_handedness-field
- rotation_quaternion
- /NXrotation_set/rotation_quaternion-field
- rotation_set
- /NXem_ebsd/indexing/rotation_set-group
- /NXsingle_crystal/rotation_set-group
- rotation_speed
- /NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field
- /NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field
- /NXdisk_chopper/rotation_speed-field
- /NXfermi_chopper/rotation_speed-field
- /NXvelocity_selector/rotation_speed-field
- roughening_pump
- /NXapm_msr/instrument/roughening_pump-group
- rt_frequency
- /NXcircuit/rt_frequency-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/rt_frequency-field
- /NXsts/ENTRY/resolution_indicators/rt_frequency-field
- run
- /NXcanSAS/ENTRY/run-field
- run_control
- /NXsensor/run_control-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
- /NXsensor_sts/run_control-field
- run_cycle
- /NXarchive/entry/run_cycle-field
- /NXentry/run_cycle-field
- /NXsubentry/run_cycle-field
- run_number
- /NXapm/ENTRY/run_number-field
- /NXsnsevent/ENTRY/run_number-field
- /NXsnshisto/ENTRY/run_number-field
- /NXtofraw/entry/run_number-field
- s_3
- /NXcorrector_cs/tableauID/s_3-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_3-group
- s_5
- /NXcorrector_cs/tableauID/s_5-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID/s_5-group
- sacrifice_isotopic_uniqueness
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/sacrifice_isotopic_uniqueness-field
- /NXapm_charge_state_analysis/sacrifice_isotopic_uniqueness-field
- sample
- /NXapm/ENTRY/sample-group
- /NXarchive/entry/sample-group
- /NXarpes/ENTRY/SAMPLE-group
- /NXcanSAS/ENTRY/SAMPLE-group
- /NXdispersive_material/ENTRY/sample-group
- /NXellipsometry/ENTRY/SAMPLE-group
- /NXem/ENTRY/sample-group
- /NXem_calorimetry/ENTRY/SAMPLE-group
- /NXentry/SAMPLE-group
- /NXfluo/entry/SAMPLE-group
- /NXiqproc/ENTRY/SAMPLE-group
- /NXiv_temp/ENTRY/SAMPLE-group
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group
- /NXlab_sample_mounting/ENTRY/SAMPLE-group
- /NXlauetof/entry/sample-group
- /NXmonopd/entry/SAMPLE-group
- /NXmpes/ENTRY/SAMPLE-group
- /NXmpes_arpes/ENTRY/SAMPLE-group
- /NXmx/ENTRY/SAMPLE-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE-group
- /NXrefscan/entry/sample-group
- /NXreftof/entry/sample-group
- /NXsas/ENTRY/SAMPLE-group
- /NXsastof/ENTRY/sample-group
- /NXscan/ENTRY/SAMPLE-group
- /NXsensor_scan/ENTRY/SAMPLE-group
- /NXsnsevent/ENTRY/sample-group
- /NXsnshisto/ENTRY/sample-group
- /NXspe/ENTRY/SAMPLE-group
- /NXsqom/ENTRY/SAMPLE-group
- /NXsts/ENTRY/sample-group
- /NXstxm/ENTRY/SAMPLE-group
- /NXsubentry/SAMPLE-group
- /NXtas/entry/SAMPLE-group
- /NXtofnpd/entry/SAMPLE-group
- /NXtofraw/entry/SAMPLE-group
- /NXtofsingle/entry/SAMPLE-group
- /NXtomo/entry/sample-group
- /NXtomophase/entry/instrument/sample-group
- /NXtomophase/entry/sample-group
- /NXtomoproc/entry/SAMPLE-group
- /NXtransmission/ENTRY/SAMPLE-group
- /NXxas/ENTRY/SAMPLE-group
- /NXxasproc/ENTRY/SAMPLE-group
- /NXxbase/entry/sample-group
- /NXxeuler/entry/sample-group
- /NXxkappa/entry/sample-group
- /NXxnb/entry/sample-group
- /NXxpcs/entry/sample-group
- /NXxps/ENTRY/SAMPLE-group
- /NXxrd_pan/ENTRY/SAMPLE-group
- /NXxrot/entry/sample-group
- sample_1
- /NXcxi_ptycho/sample_1-group
- sample_attenuator
- /NXtransmission/ENTRY/instrument/sample_attenuator-group
- sample_azimuth
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_azimuth-field
- sample_bias
- /NXsts/ENTRY/INSTRUMENT/sample_bias-group
- sample_bias_potentiostat
- /NXmanipulator/sample_bias_potentiostat-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat-group
- sample_bias_voltmeter
- /NXmanipulator/sample_bias_voltmeter-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter-group
- sample_component
- /NXsample/SAMPLE_COMPONENT-group
- /NXsample/sample_component-field
- /NXsample_component_set/SAMPLE_COMPONENT-group
- sample_component_set
- /NXsample/SAMPLE_COMPONENT_SET-group
- /NXsample_component/SAMPLE_COMPONENT_SET-group
- /NXsample_component_set/SAMPLE_COMPONENT_SET-group
- sample_cooler
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_cooler-group
- sample_heater
- /NXmanipulator/sample_heater-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater-group
- /NXmpes/ENTRY/SAMPLE/temperature_env/sample_heater-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/sample_heater-group
- sample_id
- /NXarchive/entry/sample/sample_id-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_id-field
- /NXsample/sample_id-field
- /NXsample_component/sample_id-field
- /NXxrd_pan/ENTRY/SAMPLE/sample_id-field
- sample_medium
- /NXoptical_spectroscopy/ENTRY/SAMPLE/ENVIRONMENT/sample_medium-field
- sample_medium_refractive_indices
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_medium_refractive_indices-field
- sample_mode
- /NXxrd_pan/ENTRY/SAMPLE/sample_mode-field
- sample_name
- /NXxrd_pan/ENTRY/SAMPLE/sample_name-field
- sample_normal_polar_angle_of_tilt
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_polar_angle_of_tilt-field
- sample_normal_ref_frame
- /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame-group
- sample_normal_tilt_azimuth_angle
- /NXxps/ENTRY/SAMPLE/transformations/sample_normal_tilt_azimuth_angle-field
- sample_orientation
- /NXoptical_spectroscopy/ENTRY/SAMPLE/sample_orientation-field
- /NXsample/sample_orientation-field
- /NXsample_component/sample_orientation-field
- /NXsingle_crystal/sample_orientation-field
- sample_polar
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_polar-field
- sample_prep_descripton
- /NXsts/ENTRY/sample/sample_prep_descripton-field
- sample_preparation
- /NXmpes/ENTRY/SAMPLE/history/sample_preparation-group
- sample_reference_frame
- /NXcoordinate_system_set/sample_reference_frame-group
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame-group
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame-group
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame-group
- sample_rotation_angle
- /NXxps/ENTRY/SAMPLE/transformations/sample_rotation_angle-field
- sample_stage
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage-group
- sample_symmetry
- /NXrotation_set/sample_symmetry-field
- sample_tilt
- /NXmpes_arpes/ENTRY/SAMPLE/transformations/sample_tilt-field
- sample_x
- /NXstxm/ENTRY/DATA/sample_x-field
- /NXstxm/ENTRY/INSTRUMENT/sample_x-group
- sample_y
- /NXstxm/ENTRY/DATA/sample_y-field
- /NXstxm/ENTRY/INSTRUMENT/sample_y-group
- sample_z
- /NXstxm/ENTRY/INSTRUMENT/sample_z-group
- sampled_fraction
- /NXmonitor/sampled_fraction-field
- sampling
- /NXmicrostructure_gragles_config/ENTRY/sampling-group
- /NXmicrostructure_odf/sampling-group
- /NXmicrostructure_score_config/ENTRY/sampling-group
- saturation_value
- /NXdetector/saturation_value-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
- save_to_file
- /NXmicrostructure_mtex_config/system/save_to_file-field
- scalar_field_grad_suffix
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX-group
- scalar_field_magn_suffix
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX-group
- scale
- /NXregion/scale-field
- scaling
- /NXcalibration/scaling-field
- scaling_factor
- /NXdata/scaling_factor-field
- scan_angle
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_angle-field
- scan_axis
- /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_axis-field
- scan_control
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control-group
- scan_controller
- /NXem/ENTRY/measurement/em_lab/scan_controller-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller-group
- scan_contronller
- /NXpositioner_sts/scan_contronller-field
- scan_direction
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_direction-field
- scan_mode
- /NXxrd_pan/ENTRY/INSTRUMENT/DETECTOR/scan_mode-field
- scan_number
- /NXxpcs/entry/scan_number-field
- scan_offset
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_offset-field
- scan_point_positions
- /NXem_ebsd/indexing/scan_point_positions-field
- scan_range
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/scan_range-field
- scan_schema
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/scan_controller/scan_schema-field
- /NXscanbox_em/scan_schema-field
- scanbox_em
- /NXem_msr/em_lab/SCANBOX_EM-group
- scanfield
- /NXpositioner_sts/scanfield-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/scanfield-field
- scattering_angle
- /NXspindispersion/scattering_angle-field
- scattering_configuration
- /NXraman/ENTRY/INSTRUMENT/scattering_configuration-field
- scattering_cross_section
- /NXattenuator/scattering_cross_section-field
- scattering_energy
- /NXspindispersion/scattering_energy-field
- scattering_length_density
- /NXsample/scattering_length_density-field
- /NXsample_component/scattering_length_density-field
- /NXsample_component_set/scattering_length_density-field
- scattering_vector
- /NXcrystal/scattering_vector-field
- scheme
- /NXcollectioncolumn/scheme-field
- /NXenergydispersion/scheme-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
- sdd
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
- sebald_gottstein
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein-group
- seblock
- /NXspe/ENTRY/SAMPLE/seblock-field
- second_amplifier
- /NXsensor_sts/second_amplifier-group
- seed
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/seed-field
- /NXcs_prng/seed-field
- segment_columns
- /NXcrystal/segment_columns-field
- segment_gap
- /NXcrystal/segment_gap-field
- segment_height
- /NXcrystal/segment_height-field
- segment_rows
- /NXcrystal/segment_rows-field
- segment_thickness
- /NXcrystal/segment_thickness-field
- segment_width
- /NXcrystal/segment_width-field
- segmentation
- /NXapm_compositionspace_config/ENTRY/config/segmentation-group
- /NXapm_compositionspace_results/ENTRY/segmentation-group
- select
- /NXapm_paraprobe_selector_config/ENTRY/select-group
- semi_convergence_angle
- /NXoptical_system_em/semi_convergence_angle-field
- sensitivity_factor
- /NXlockin/sensitivity_factor-field
- sensor
- /NXebeam_column/SENSOR-group
- /NXem/ENTRY/measurement/em_lab/SENSOR-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/SENSOR-group
- /NXenvironment/SENSOR-group
- /NXibeam_column/SENSOR-group
- /NXinstrument/SENSOR-group
- /NXmanipulator/SENSOR-group
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
- /NXstage_lab/SENSOR-group
- sensor_count
- /NXdetector/sensor_count-field
- sensor_material
- /NXdetector/sensor_material-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
- sensor_pixel_size
- /NXdetector/sensor_pixel_size-field
- sensor_pixels
- /NXdetector/sensor_pixels-field
- sensor_size
- /NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
- /NXdetector/sensor_size-field
- sensor_thickness
- /NXdetector/sensor_thickness-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
- sensor_type
- /NXfilter/sensor_type-group
- sensorid
- /NXem/ENTRY/measurement/em_lab/ebeam_column/sensorID-group
- /NXem/ENTRY/measurement/em_lab/ibeam_column/sensorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/sensorID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/sensorID-group
- sequence_index
- /NXapm/ENTRY/atom_probe/hit_finding/sequence_index-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/sequence_index-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/sequence_index-field
- /NXapm/ENTRY/atom_probe/ranging/background_quantification/sequence_index-field
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/sequence_index-field
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/sequence_index-field
- /NXapm/ENTRY/atom_probe/ranging/peak_search/sequence_index-field
- /NXapm/ENTRY/atom_probe/ranging/sequence_index-field
- /NXapm/ENTRY/atom_probe/raw_data/sequence_index-field
- /NXapm/ENTRY/atom_probe/reconstruction/sequence_index-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/sequence_index-field
- /NXapm_compositionspace_results/ENTRY/autophase/sequence_index-field
- /NXapm_compositionspace_results/ENTRY/clustering/sequence_index-field
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/sequence_index-field
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/sequence_index-field
- /NXapm_compositionspace_results/ENTRY/voxelization/sequence_index-field
- /NXem_calorimetry/ENTRY/azimuthal_integration/sequence_index-field
- /NXem_calorimetry/ENTRY/background_subtraction/sequence_index-field
- /NXem_calorimetry/ENTRY/distortion_correction/sequence_index-field
- /NXem_calorimetry/ENTRY/pattern_center/sequence_index-field
- /NXem_calorimetry/ENTRY/time_synchronization/sequence_index-field
- /NXem_correlation/PROCESS/sequence_index-field
- /NXem_method/PROCESS/sequence_index-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field
- /NXnote/sequence_index-field
- /NXprocess/sequence_index-field
- /NXprocess_mpes/sequence_index-field
- /NXroi/PROCESS/sequence_index-field
- sequence_number
- /NXdetector/sequence_number-field
- /NXtomophase/entry/instrument/bright_field/sequence_number-field
- /NXtomophase/entry/instrument/dark_field/sequence_number-field
- /NXtomophase/entry/instrument/sample/sequence_number-field
- serial_number
- /NXdetector/serial_number-field
- /NXfabrication/serial_number-field
- serialized
- /NXapm/ENTRY/atom_probe/hit_finding/serialized-group
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized-group
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized-group
- /NXapm/ENTRY/atom_probe/raw_data/serialized-group
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized-group
- /NXapm_hit_finding/SERIALIZED-group
- /NXapm_ranging/SERIALIZED-group
- /NXapm_reconstruction/SERIALIZED-group
- /NXapm_volt_and_bowl/SERIALIZED-group
- serializedid
- /NXapm/ENTRY/serializedID-group
- /NXem/ENTRY/serializedID-group
- service
- /NXapm/ENTRY/USER/identifier/service-field
- /NXapm/ENTRY/experiment_identifier/service-field
- /NXapm/ENTRY/sample/identifier/service-field
- /NXapm/ENTRY/specimen/identifier/service-field
- /NXapm/ENTRY/specimen/parent_identifier/service-field
- /NXem/ENTRY/experiment_identifier/service-field
- /NXem/ENTRY/sample/identifier/service-field
- /NXem/ENTRY/sample/parent_identifier/service-field
- /NXem/ENTRY/userID/identifier/service-field
- /NXidentifier/service-field
- /NXoptical_spectroscopy/ENTRY/experiment_identifier/service-field
- set_bfield_current
- /NXseparator/set_Bfield_current-field
- /NXspin_rotator/set_Bfield_current-field
- set_current
- /NXelectrostatic_kicker/set_current-field
- /NXmagnetic_kicker/set_current-field
- /NXquadrupole_magnet/set_current-field
- /NXsolenoid_magnet/set_current-field
- set_efield_voltage
- /NXseparator/set_Efield_voltage-field
- /NXspin_rotator/set_Efield_voltage-field
- set_identifier
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/set_identifier-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/set_identifier-field
- set_voltage
- /NXelectrostatic_kicker/set_voltage-field
- /NXmagnetic_kicker/set_voltage-field
- setpoint
- /NXactuator/PID/setpoint-field
- /NXmanipulator/cryostat/PID/setpoint-field
- /NXmanipulator/sample_bias_potentiostat/PID/setpoint-field
- /NXmanipulator/sample_heater/PID/setpoint-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/PID/setpoint-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/PID/setpoint-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/PID/setpoint-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/PID/setpoint-field
- /NXpid/setpoint-field
- /NXpositioner_sts/setpoint-field
- setpoint_log
- /NXactuator/PID/setpoint_log-group
- /NXmanipulator/cryostat/PID/setpoint_log-group
- /NXmanipulator/sample_bias_potentiostat/PID/setpoint_log-group
- /NXmanipulator/sample_heater/PID/setpoint_log-group
- /NXpid/setpoint_log-group
- setpoint_temperature
- /NXevent_data_apm/instrument/stage_lab/setpoint_temperature-field
- settling_time
- /NXbias_spectroscopy/settling_time-field
- /NXiv_bias/settling_time-field
- /NXsts/ENTRY/reproducibility_indicators/settling_time-field
- sgl
- /NXtas/entry/SAMPLE/sgl-field
- sgu
- /NXtas/entry/SAMPLE/sgu-field
- shadowfactor
- /NXcanSAS/ENTRY/DATA/ShadowFactor-field
- shank_angle
- /NXapm/ENTRY/specimen/shank_angle-field
- shape
- /NXaperture/shape-field
- /NXattenuator/shape-group
- /NXbeam_splitter/SHAPE-group
- /NXbeam_splitter/SHAPE/shape-field
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field
- /NXcg_hexahedron_set/shape-field
- /NXcg_polygon_set/shape-field
- /NXcg_primitive_set/shape-field
- /NXcontainer/shape-group
- /NXcrystal/shape-group
- /NXgeometry/SHAPE-group
- /NXgrating/shape-group
- /NXmirror/shape-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/entrance_slit/shape-field
- /NXpolarizer_opt/SHAPE-group
- /NXpolarizer_opt/SHAPE/shape-field
- /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group
- /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field
- /NXsastof/ENTRY/instrument/collimator/geometry/shape-group
- /NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
- /NXshape/shape-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
- shermann_function
- /NXspindispersion/shermann_function-field
- short_name
- /NXactuator/short_name-field
- /NXenvironment/short_name-field
- /NXsensor/short_name-field
- /NXsensor_sts/short_name-field
- short_title
- /NXsample/short_title-field
- shortest_half_life
- /NXapm/ENTRY/atom_probe/ranging/peak_identification/ionID/charge_state_analysis/shortest_half_life-field
- /NXapm_charge_state_analysis/shortest_half_life-field
- show_coordinates
- /NXmicrostructure_mtex_config/plotting/show_coordinates-field
- show_micron_bar
- /NXmicrostructure_mtex_config/plotting/show_micron_bar-field
- sigma_x
- /NXsource/sigma_x-field
- sigma_y
- /NXsource/sigma_y-field
- sign_convention
- /NXcoordinate_system_set/sign_convention-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sign_convention-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sign_convention-field
- sign_valid
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/sign_valid-group
- signal_amplitude
- /NXevent_data_apm/instrument/ion_detector/signal_amplitude-field
- signal_over_noise
- /NXamplifier/signal_over_noise-field
- signals_oversampling
- /NXcircuit/signals_oversampling-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/circuit/signals_oversampling-field
- /NXsts/ENTRY/resolution_indicators/signals_oversampling-field
- signed_distance
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder/rois_far_from_edge/roiID/signed_distance-field
- simulation
- /NXapm/ENTRY/simulation-group
- /NXem/ENTRY/roiID/ebsd/simulation-group
- /NXem/ENTRY/simulation-group
- /NXem_ebsd/simulation-group
- /NXem_sim/simulation-group
- simulation_control
- /NXmicrostructure_gragles_config/ENTRY/simulation_control-group
- /NXmicrostructure_score_config/ENTRY/simulation_control-group
- simulation_identifier
- /NXmicrostructure_gragles_config/ENTRY/simulation_identifier-field
- /NXmicrostructure_gragles_results/ENTRY/simulation_identifier-field
- /NXmicrostructure_score_config/ENTRY/simulation_identifier-field
- /NXmicrostructure_score_results/ENTRY/simulation_identifier-field
- single_crystal
- /NXsample/SINGLE_CRYSTAL-group
- /NXsample_component/SINGLE_CRYSTAL-group
- single_point
- /NXsts/ENTRY/single_point-group
- situation
- /NXarchive/entry/sample/situation-field
- /NXmpes/ENTRY/SAMPLE/situation-field
- /NXmpes_arpes/ENTRY/SAMPLE/situation-field
- /NXsample/situation-field
- size
- /NXaperture/size-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/size-field
- /NXbeam_splitter/SHAPE/size-field
- /NXbeam_stop/size-field
- /NXpolarizer_opt/SHAPE/size-field
- /NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field
- /NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field
- /NXshape/size-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
- sketch
- /NXbeam_splitter/SHAPE/sketch-group
- /NXpolarizer_opt/SHAPE/sketch-group
- slit
- /NXbeam_path/MONOCHROMATOR/SLIT-group
- /NXbeam_path/SLIT-group
- /NXfermi_chopper/slit-field
- /NXtransmission/ENTRY/instrument/DETECTOR/slit-group
- slit_angle
- /NXdisk_chopper/slit_angle-field
- slit_edges
- /NXdisk_chopper/slit_edges-field
- slit_height
- /NXdisk_chopper/slit_height-field
- slit_length
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
- slits
- /NXdisk_chopper/slits-field
- slot
- /NXdetector/slot-field
- slow_axes
- /NXelectronanalyser/slow_axes-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
- slow_pixel_direction
- /NXdetector_module/slow_pixel_direction-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
- smile
- /NXsubstance/smile-field
- sns
- /NXsnsevent/ENTRY/instrument/SNS-group
- /NXsnshisto/ENTRY/instrument/SNS-group
- snsbanking_file_name
- /NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
- /NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
- snsdetector_calibration_id
- /NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field
- /NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
- snsgeometry_file_name
- /NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field
- /NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
- snshistotool
- /NXsnsevent/ENTRY/SNSHistoTool-group
- /NXsnshisto/ENTRY/SNSHistoTool-group
- snsmapping_file_name
- /NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
- /NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
- snstranslation_service
- /NXsnsevent/ENTRY/instrument/SNStranslation_service-field
- /NXsnshisto/ENTRY/instrument/SNStranslation_service-field
- soft_limit_max
- /NXpositioner/soft_limit_max-field
- /NXpositioner_sts/soft_limit_max-field
- soft_limit_min
- /NXpositioner/soft_limit_min-field
- /NXpositioner_sts/soft_limit_min-field
- software
- /NXsts/ENTRY/INSTRUMENT/software-group
- software_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/software_TYPE-group
- solid_angle
- /NXdetector/solid_angle-field
- solitary_unit
- /NXmicrostructure_score_config/ENTRY/solitary_unit-group
- soller_angle
- /NXcollimator/soller_angle-field
- source
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/SOURCE-group
- /NXarchive/entry/instrument/SOURCE-group
- /NXarpes/ENTRY/INSTRUMENT/SOURCE-group
- /NXbeam_path/SOURCE-group
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source-group
- /NXem/ENTRY/roiID/ebsd/indexing/source-group
- /NXem/ENTRY/roiID/ebsd/measurement/source-group
- /NXem/ENTRY/roiID/ebsd/simulation/source-group
- /NXem_ebsd/calibration/source-group
- /NXem_ebsd/indexing/source-group
- /NXem_ebsd/measurement/source-group
- /NXem_ebsd/simulation/source-group
- /NXfluo/entry/INSTRUMENT/SOURCE-group
- /NXimage_set/PROCESS/source-group
- /NXinstrument/SOURCE-group
- /NXiqproc/ENTRY/instrument/SOURCE-group
- /NXmonopd/entry/INSTRUMENT/SOURCE-group
- /NXmx/ENTRY/SOURCE-group
- /NXpulser_apm/SOURCE-group
- /NXrefscan/entry/instrument/SOURCE-group
- /NXsas/ENTRY/INSTRUMENT/SOURCE-group
- /NXsastof/ENTRY/instrument/source-group
- /NXspectrum_set/PROCESS/source-group
- /NXsqom/ENTRY/instrument/SOURCE-group
- /NXstxm/ENTRY/INSTRUMENT/SOURCE-group
- /NXtas/entry/INSTRUMENT/SOURCE-group
- /NXtomo/entry/instrument/SOURCE-group
- /NXtomophase/entry/instrument/SOURCE-group
- /NXtomoproc/entry/INSTRUMENT/SOURCE-group
- /NXtransmission/ENTRY/instrument/SOURCE-group
- /NXxas/ENTRY/INSTRUMENT/SOURCE-group
- /NXxbase/entry/instrument/source-group
- /NXxlaue/entry/instrument/source-group
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE-group
- source_1
- /NXcxi_ptycho/entry_1/instrument_1/source_1-group
- source_distance_x
- /NXbending_magnet/source_distance_x-field
- source_distance_y
- /NXbending_magnet/source_distance_y-field
- source_peak_wavelength
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/source_peak_wavelength-field
- source_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE-group
- sourceid
- /NXapm/ENTRY/measurement/instrument/pulser/sourceID-group
- sourcetype
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE-group
- /NXxps/ENTRY/INSTRUMENT/sourceTYPE-group
- space
- /NXgraph_node_set/space-field
- space_group
- /NXcrystal/space_group-field
- /NXcrystal_structure/space_group-field
- /NXem/ENTRY/roiID/ebsd/indexing/phaseID/space_group-field
- /NXsample/space_group-field
- /NXsample_component/space_group-field
- /NXunit_cell/space_group-field
- spatial_acceptance
- /NXcollectioncolumn/spatial_acceptance-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/spatial_acceptance-field
- spatial_distribution
- /NXmicrostructure_score_config/ENTRY/nucleation/spatial_distribution-field
- spatial_filter
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter-group
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter-group
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter-group
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter-group
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter-group
- /NXapm_paraprobe_tool_config/SPATIAL_FILTER-group
- spatial_resolution
- /NXelectronanalyser/spatial_resolution-group
- spatial_statisticsid
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID-group
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID-group
- spatialn
- /NXdata_mpes/spatialN-field
- /NXdata_mpes_detector/spatialN-field
- spatialn_calibration
- /NXmpes/ENTRY/PROCESS_MPES/spatialN_calibration-group
- /NXprocess_mpes/spatialN_calibration-group
- spatiotemporalid
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID-group
- special_enthalpy
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_enthalpy-field
- special_pre_factor
- /NXmicrostructure_score_config/ENTRY/grain_boundary_mobility/sebald_gottstein/special_pre_factor-field
- specific_polarization_filter_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/polfilter_TYPE/specific_polarization_filter_type-field
- specimen
- /NXapm/ENTRY/specimen-group
- specimen_symmetry_point_group
- /NXmicrostructure_odf/configuration/specimen_symmetry_point_group-field
- /NXmicrostructure_pf/configuration/specimen_symmetry_point_group-field
- spectral_range
- /NXfiber/spectral_range-field
- spectral_resolution
- /NXbeam_path/MONOCHROMATOR/spectral_resolution-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field
- /NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
- spectralfilter_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/spectralfilter_TYPE-group
- spectrometer
- /NXtransmission/ENTRY/instrument/spectrometer-group
- spectrum
- /NXbeam_path/GRATING/spectrum-field
- /NXbeam_path/MONOCHROMATOR/spectrum-field
- /NXbending_magnet/spectrum-group
- /NXinsertion_device/spectrum-group
- /NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
- spectrum_0d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d-group
- /NXspectrum_set/spectrum_0d-group
- spectrum_1d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d-group
- /NXspectrum_set/spectrum_1d-group
- spectrum_2d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d-group
- /NXspectrum_set/spectrum_2d-group
- spectrum_3d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d-group
- /NXspectrum_set/spectrum_3d-group
- spectrum_identifier
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/spectrum_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/spectrum_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/spectrum_identifier-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/spectrum_identifier-field
- /NXspectrum_set/stack_0d/spectrum_identifier-field
- /NXspectrum_set/stack_2d/spectrum_identifier-field
- /NXspectrum_set/stack_3d/spectrum_identifier-field
- spectrum_set
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET-group
- /NXem_eels/indexing/SPECTRUM_SET-group
- /NXem_method/SPECTRUM_SET-group
- /NXevent_data_em/SPECTRUM_SET-group
- speed_backw
- /NXpositioner_sts/speed_backw-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/speed_backw-field
- speed_forw
- /NXpositioner_sts/speed_forw-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/scan_control/positioner/speed_forw-field
- spindispersion
- /NXelectronanalyser/SPINDISPERSION-group
- splitting_ratio
- /NXbeam_splitter/splitting_ratio-field
- spot_position
- /NXpulser_apm/SOURCE/BEAM/spot_position-field
- spwidth
- /NXvelocity_selector/spwidth-field
- stack_0d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d-group
- /NXspectrum_set/stack_0d-group
- stack_1d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d-group
- /NXimage_set/stack_1d-group
- stack_2d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d-group
- /NXimage_set/stack_2d-group
- /NXspectrum_set/stack_2d-group
- stack_3d
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d-group
- /NXimage_set/stack_3d-group
- /NXspectrum_set/stack_3d-group
- stage_lab
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/stage_lab-group
- /NXapm_msr/instrument/stage_lab-group
- /NXem/ENTRY/measurement/em_lab/STAGE_LAB-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/STAGE_LAB-group
- /NXem_msr/em_lab/STAGE_LAB-group
- /NXevent_data_apm/instrument/stage_lab-group
- /NXevent_data_em/em_lab/STAGE_LAB-group
- stage_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type-field
- stage_type_other
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/stage_type_other-field
- standard
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/standard-field
- standing_voltage
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/pulser/standing_voltage-field
- /NXpulser_apm/standing_voltage-field
- start
- /NXregion/start-field
- /NXxrd_pan/ENTRY/experiment_config/omega/start-field
- /NXxrd_pan/ENTRY/experiment_config/two_theta/start-field
- start_time
- /NXactivity/start_time-field
- /NXapm/ENTRY/start_time-field
- /NXapm_compositionspace_results/ENTRY/profiling/start_time-field
- /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_selector_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_tool_common/profiling/start_time-field
- /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/start_time-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/start_time-field
- /NXarchive/entry/start_time-field
- /NXarpes/ENTRY/start_time-field
- /NXchemical_process/start_time-field
- /NXcs_profiling/start_time-field
- /NXcs_profiling_event/start_time-field
- /NXcxi_ptycho/entry_1/start_time-field
- /NXdetector/start_time-field
- /NXdirecttof/entry/start_time-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/start_time-field
- /NXem/ENTRY/start_time-field
- /NXem_calorimetry/ENTRY/profiling/start_time-field
- /NXem_calorimetry/ENTRY/time_synchronization/start_time-field
- /NXentry/start_time-field
- /NXevent_data_apm/start_time-field
- /NXevent_data_em/start_time-field
- /NXfluo/entry/start_time-field
- /NXindirecttof/entry/start_time-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field
- /NXlab_sample_mounting/ENTRY/start_time-field
- /NXmicrostructure_gragles_config/ENTRY/start_time-field
- /NXmicrostructure_gragles_results/ENTRY/start_time-field
- /NXmicrostructure_imm_results/ENTRY/start_time-field
- /NXmicrostructure_kanapy_results/ENTRY/start_time-field
- /NXmicrostructure_score_config/ENTRY/start_time-field
- /NXmicrostructure_score_results/ENTRY/start_time-field
- /NXmonitor/start_time-field
- /NXmonopd/entry/start_time-field
- /NXmpes/ENTRY/SAMPLE/history/sample_preparation/start_time-field
- /NXmpes/ENTRY/start_time-field
- /NXmx/ENTRY/start_time-field
- /NXoptical_spectroscopy/ENTRY/start_time-field
- /NXphysical_process/start_time-field
- /NXrefscan/entry/start_time-field
- /NXreftof/entry/start_time-field
- /NXsas/ENTRY/start_time-field
- /NXsastof/ENTRY/start_time-field
- /NXscan/ENTRY/start_time-field
- /NXsensor_scan/ENTRY/start_time-field
- /NXsnsevent/ENTRY/start_time-field
- /NXsnshisto/ENTRY/start_time-field
- /NXstxm/ENTRY/start_time-field
- /NXsubentry/start_time-field
- /NXtas/entry/start_time-field
- /NXtofnpd/entry/start_time-field
- /NXtofraw/entry/start_time-field
- /NXtofsingle/entry/start_time-field
- /NXtomo/entry/start_time-field
- /NXtomophase/entry/start_time-field
- /NXtransmission/ENTRY/start_time-field
- /NXxas/ENTRY/start_time-field
- /NXxbase/entry/start_time-field
- /NXxpcs/entry/start_time-field
- state
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/state-field
- static_q_list
- /NXxpcs/entry/instrument/masks/static_q_list-field
- static_roi_map
- /NXxpcs/entry/instrument/masks/static_roi_map-field
- statistics
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/statistics-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/statistics-group
- /NXregion/statistics-group
- /NXsimilarity_grouping/statistics-group
- status
- /NXapm/ENTRY/measurement/instrument/reflectron/status-field
- /NXapm/ENTRY/measurement/instrument/status-field
- /NXapm_msr/instrument/status-field
- /NXapm_paraprobe_clusterer_config/ENTRY/common/status-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/status-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/status-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/status-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/status-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/status-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/status-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/status-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/status-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/status-field
- /NXapm_paraprobe_selector_config/ENTRY/common/status-field
- /NXapm_paraprobe_selector_results/ENTRY/common/status-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/status-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/status-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/status-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/status-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/status-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/status-field
- /NXapm_paraprobe_tool_common/status-field
- /NXapm_paraprobe_transcoder_config/ENTRY/common/status-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/status-field
- /NXattenuator/status-field
- /NXbeam_stop/status-field
- /NXem_ebsd/indexing/status-field
- /NXfilter/status-field
- /NXreflectron/status-field
- /NXsts/ENTRY/INSTRUMENT/lock_in/status-field
- step
- /NXxrd_pan/ENTRY/experiment_config/omega/step-field
- /NXxrd_pan/ENTRY/experiment_config/two_theta/step-field
- stepsize
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd/stepsize-field
- stm_head_temp
- /NXsts/ENTRY/INSTRUMENT/stm_head_temp-field
- /NXsts/ENTRY/resolution_indicators/stm_head_temp-field
- stop_on_symmetry_mismatch
- /NXmicrostructure_mtex_config/miscellaneous/stop_on_symmetry_mismatch-field
- stop_time
- /NXdetector/stop_time-field
- storage
- /NXcs_computer/storage-group
- stored_elastic_energy
- /NXmicrostructure_gragles_config/ENTRY/stored_elastic_energy-group
- stored_energy_recovery
- /NXmicrostructure_score_config/ENTRY/stored_energy_recovery-group
- strain
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/strain-field
- strength
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field/strength-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/electrical_field/strength-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/magnetic_field/strength-field
- stress
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress-group
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress/stress-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/stress-field
- stress_field
- /NXarchive/entry/sample/stress_field-field
- /NXsample/stress_field-field
- stride
- /NXregion/stride-field
- structure
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure-group
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure-group
- stxm_scan_type
- /NXstxm/ENTRY/DATA/stxm_scan_type-field
- subentry
- /NXentry/SUBENTRY-group
- subsampling_filter
- /NXapm_paraprobe_tool_config/SUBSAMPLING_FILTER-group
- substance
- /NXmpes/ENTRY/SAMPLE/SUBSTANCE-group
- /NXsample/SUBSTANCE-group
- /NXsample_component/SUBSTANCE-group
- substrate
- /NXbeam_splitter/substrate-group
- /NXlens_opt/substrate-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE/substrate-field
- /NXpolarizer_opt/substrate-group
- /NXwaveplate/substrate-group
- substrate_density
- /NXgrating/substrate_density-field
- /NXmirror/substrate_density-field
- substrate_material
- /NXbeam_splitter/substrate/substrate_material-field
- /NXfilter/substrate_material-field
- /NXgrating/substrate_material-field
- /NXguide/substrate_material-field
- /NXlens_opt/substrate/substrate_material-field
- /NXmirror/substrate_material-field
- /NXpolarizer_opt/substrate/substrate_material-field
- /NXwaveplate/substrate/substrate_material-field
- substrate_roughness
- /NXfilter/substrate_roughness-field
- /NXgrating/substrate_roughness-field
- /NXguide/substrate_roughness-field
- /NXmirror/substrate_roughness-field
- substrate_thickness
- /NXbeam_splitter/substrate/substrate_thickness-field
- /NXfilter/substrate_thickness-field
- /NXgrating/substrate_thickness-field
- /NXguide/substrate_thickness-field
- /NXlens_opt/substrate/substrate_thickness-field
- /NXmirror/substrate_thickness-field
- /NXpolarizer_opt/substrate/substrate_thickness-field
- /NXwaveplate/substrate/substrate_thickness-field
- summary
- /NXem/ENTRY/roiID/eds/indexing/summary-group
- /NXem_eds/indexing/summary-group
- summary_statistics
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics-group
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics-group
- support_membrane_material
- /NXfresnel_zone_plate/support_membrane_material-field
- support_membrane_thickness
- /NXfresnel_zone_plate/support_membrane_thickness-field
- surface
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface-group
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface-group
- /NXapm_paraprobe_tool_config/surface-group
- /NXguide/reflectivity/surface-field
- surface_distance
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance-group
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance-group
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance-group
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance-group
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance-group
- /NXapm_paraprobe_tool_config/surface_distance-group
- surface_energy
- /NXmicrostructure/interface/surface_energy-field
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/surface_energy-field
- surface_meshing
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing-group
- surface_type
- /NXquadric/surface_type-field
- sw_filter_cutoff_frq
- /NXbias_spectroscopy/sw_filter_cutoff_frq-field
- /NXiv_bias/sw_filter_cutoff_frq-field
- sw_filter_order
- /NXbias_spectroscopy/sw_filter_order-field
- sw_filter_type
- /NXbias_spectroscopy/sw_filter_type-field
- /NXiv_bias/sw_filter_type-field
- sw_ilter_order
- /NXiv_bias/sw_ilter_order-field
- sweep_control
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control-group
- sweep_end
- /NXbias_spectroscopy/sweep_end-field
- /NXiv_bias/sweep_end-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/sweep_end-field
- /NXsts/ENTRY/resolution_indicators/sweep_end-field
- sweep_start
- /NXbias_spectroscopy/sweep_start-field
- /NXiv_bias/sweep_start-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/sweep_start-field
- /NXsts/ENTRY/resolution_indicators/sweep_start-field
- switch_off_delay
- /NXpositioner_sts/switch_off_delay-field
- symmetric
- /NXxraylens/symmetric-field
- symmetry
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/symmetry-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/symmetry-field
- /NXcg_grid/symmetry-field
- /NXdistortion/symmetry-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/symmetry-field
- /NXmicrostructure_score_results/ENTRY/discretization/grid/symmetry-field
- sync
- /NXlockin/sync-field
- system
- /NXmicrostructure_gragles_config/ENTRY/sampling/system-field
- /NXmicrostructure_mtex_config/system-group
- t
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
- table
- /NXvelocity_selector/table-field
- tableauid
- /NXcorrector_cs/tableauID-group
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_cs/tableauID-group
- taper
- /NXinsertion_device/taper-field
- target
- /NXspindispersion/target-field
- target_dcom_radius
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_dcom_radius-field
- target_detection_rate
- /NXapm/ENTRY/measurement/event_data_apm_set/event_data_apm/instrument/control/target_detection_rate-field
- /NXevent_data_apm/instrument/control/target_detection_rate-field
- target_edge_length
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_edge_length-field
- target_material
- /NXsource/target_material-field
- target_preparation
- /NXspindispersion/target_preparation-field
- target_preparation_date
- /NXspindispersion/target_preparation_date-field
- target_smoothing_step
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/target_smoothing_step-field
- target_value
- /NXpositioner/target_value-field
- /NXpositioner_sts/target_value-field
- targets
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/targets-field
- tdev
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
- telephone_number
- /NXem/ENTRY/userID/telephone_number-field
- /NXsensor_scan/ENTRY/USER/telephone_number-field
- /NXtransmission/ENTRY/operator/telephone_number-field
- /NXuser/telephone_number-field
- temp_control_type
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE-group
- temperature
- /NXarchive/entry/sample/temperature-field
- /NXarpes/ENTRY/SAMPLE/temperature-field
- /NXcanSAS/ENTRY/SAMPLE/temperature-field
- /NXcrystal/temperature-field
- /NXevent_data_apm/instrument/stage_lab/temperature-field
- /NXfilter/temperature-field
- /NXiv_temp/ENTRY/DATA/temperature-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/temperature-field
- /NXmicrostructure_score_config/ENTRY/time_temperature/temperature-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/temperature-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/temperature-field
- /NXmoderator/temperature-field
- /NXmx/ENTRY/SAMPLE/temperature-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature-group
- /NXsample/temperature-field
- /NXsensor_sts/temperature-field
- /NXsnsevent/ENTRY/instrument/moderator/temperature-field
- /NXsnshisto/ENTRY/instrument/moderator/temperature-field
- /NXspe/ENTRY/SAMPLE/temperature-field
- /NXxbase/entry/sample/temperature-field
- /NXxpcs/entry/sample/temperature-field
- temperature_coefficient
- /NXcrystal/temperature_coefficient-field
- temperature_controller
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
- temperature_env
- /NXmpes/ENTRY/SAMPLE/temperature_env-group
- /NXsample/temperature_env-group
- temperature_log
- /NXcrystal/temperature_log-group
- /NXfilter/temperature_log-group
- /NXmoderator/temperature_log-group
- /NXsample/temperature_log-group
- temperature_nominal
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_nominal-field
- temperature_nominal_other
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_nominal_other-field
- temperature_sensor
- /NXmanipulator/temperature_sensor-group
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor-group
- /NXmpes/ENTRY/SAMPLE/temperature_env/temperature_sensor-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor-group
- /NXoptical_spectroscopy/ENTRY/SAMPLE/temperature/temperature_sensor-group
- temperature_set
- /NXxpcs/entry/sample/temperature_set-field
- tensor
- /NXmicrostructure_mtex_config/path/tensor-field
- term
- /NXcanSAS/ENTRY/PROCESS/term-field
- /NXparameters/term-field
- tessellate
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate-group
- tessellation
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation-group
- tetrahedra
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra-group
- /NXcg_tetrahedron_set/tetrahedra-group
- tetrahedron_half_edgeid
- /NXcg_tetrahedron_set/tetrahedron_half_edgeID-group
- tetrahedronid
- /NXcg_tetrahedron_set/tetrahedronID-group
- text
- /NXdispersive_material/ENTRY/REFERENCES/text-field
- text_interpreter
- /NXmicrostructure_mtex_config/miscellaneous/text_interpreter-field
- theta
- /NXmicrostructure_imm_config/ENTRY/component_analysis/theta-field
- /NXmicrostructure_odf/kth_extrema/theta-field
- thickness
- /NXattenuator/thickness-field
- /NXbeam_path/window_NUMBER/thickness-field
- /NXcanSAS/ENTRY/SAMPLE/thickness-field
- /NXcrystal/thickness-field
- /NXem/ENTRY/sample/thickness-field
- /NXfilter/thickness-field
- /NXflipper/thickness-field
- /NXopt_window/ENTRY/thickness-field
- /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness-field
- /NXsample/thickness-field
- thickness_determination
- /NXoptical_spectroscopy/ENTRY/SAMPLE/thickness_determination-field
- thickness_reduction
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
- thread_identifier
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/thread_identifier-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/grid/thread_identifier-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/recrystallization_front/thread_identifier-field
- threshold_distance
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/threshold_distance-field
- threshold_energy
- /NXdetector/threshold_energy-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
- threshold_proximity
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/threshold_proximity-field
- thumbnail
- /NXentry/thumbnail-group
- /NXsubentry/thumbnail-group
- tilt
- /NXxnb/entry/name/tilt-link
- tilt_1
- /NXstage_lab/tilt_1-field
- tilt_2
- /NXstage_lab/tilt_2-field
- tilt_angle
- /NXcorrector_cs/tableauID/tilt_angle-field
- /NXxnb/entry/instrument/detector/tilt_angle-field
- tilt_correction
- /NXoptical_system_em/tilt_correction-field
- tilt_n
- /NXsts/ENTRY/INSTRUMENT/piezo_config/tilt_N-field
- time
- /NXcg_point_set/time-field
- /NXem_ebsd/measurement/time-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field
- /NXlog/time-field
- /NXmicrostructure/time-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/time-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith/time-field
- /NXmicrostructure_score_config/ENTRY/time_temperature/time-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/time-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/kinetics/time-field
- /NXsnsevent/ENTRY/DASlogs/LOG/time-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
- /NXsnshisto/ENTRY/DASlogs/LOG/time-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
- time_const
- /NXpositioner_sts/time_const-field
- time_control
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time_control-field
- time_of_flight
- /NXdata_mpes_detector/time_of_flight-field
- /NXdetector/time_of_flight-field
- /NXlauetof/entry/control/time_of_flight-field
- /NXlauetof/entry/instrument/detector/time_of_flight-field
- /NXlauetof/entry/name/time_of_flight-link
- /NXmonitor/time_of_flight-field
- /NXreftof/entry/control/time_of_flight-field
- /NXreftof/entry/data/time_of_flight-link
- /NXreftof/entry/instrument/detector/time_of_flight-field
- /NXsastof/ENTRY/control/time_of_flight-field
- /NXsastof/ENTRY/data/time_of_flight-link
- /NXsastof/ENTRY/instrument/detector/time_of_flight-field
- /NXsnsevent/ENTRY/MONITOR/time_of_flight-field
- /NXsnshisto/ENTRY/DATA/time_of_flight-link
- /NXsnshisto/ENTRY/MONITOR/time_of_flight-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field
- /NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field
- /NXtofnpd/entry/MONITOR/time_of_flight-field
- /NXtofnpd/entry/data/time_of_flight-link
- /NXtofraw/entry/MONITOR/time_of_flight-field
- /NXtofraw/entry/data/time_of_flight-link
- /NXtofraw/entry/instrument/detector/time_of_flight-field
- /NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field
- /NXtofsingle/entry/MONITOR/time_of_flight-field
- /NXtofsingle/entry/data/time_of_flight-link
- time_of_flight_adc
- /NXdata_mpes_detector/time_of_flight_adc-field
- time_offset
- /NXcg_point_set/time_offset-field
- time_per_channel
- /NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
- time_points
- /NXtransmission/ENTRY/instrument/time_points-field
- time_slope
- /NXmicrostructure_gragles_config/ENTRY/numerics/time_slope-field
- time_synchronization
- /NXem_calorimetry/ENTRY/time_synchronization-group
- time_temperature
- /NXmicrostructure_score_config/ENTRY/time_temperature-group
- time_zone
- /NXmx/ENTRY/INSTRUMENT/time_zone-field
- timestamp
- /NXcg_point_set/timestamp-field
- timing
- /NXelectrostatic_kicker/timing-field
- /NXmagnetic_kicker/timing-field
- tip_lift
- /NXpositioner_sts/tip_lift-field
- tip_position_z
- /NXpositioner_sts/tip_position_z-field
- title
- /NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/title-field
- /NXapm/ENTRY/atom_probe/reconstruction/naive_discretization/DATA/title-field
- /NXapm_compositionspace_results/ENTRY/autophase/result/title-field
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/result/title-field
- /NXapm_compositionspace_results/ENTRY/segmentation/pca/result/title-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/title-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/title-field
- /NXarchive/entry/title-field
- /NXarpes/ENTRY/title-field
- /NXcanSAS/ENTRY/title-field
- /NXcxi_ptycho/entry_1/title-field
- /NXdata/title-field
- /NXdirecttof/entry/title-field
- /NXellipsometry/ENTRY/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_1d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_2d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/image_3d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_1d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_2d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/stack_3d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_0d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_1d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_2d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/spectrum_3d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_0d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_1d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_2d/title-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/stack_3d/title-field
- /NXem/ENTRY/roiID/ebsd/indexing/roi/title-field
- /NXem/ENTRY/roiID/eds/indexing/IMAGE_SET/image_2d/title-field
- /NXem/ENTRY/roiID/eds/indexing/summary/title-field
- /NXem_calorimetry/ENTRY/azimuthal_integration/result/title-field
- /NXem_calorimetry/ENTRY/background_subtraction/result/title-field
- /NXem_correlation/indexing/roi/title-field
- /NXem_ebsd/indexing/roi/title-field
- /NXentry/title-field
- /NXfluo/entry/title-field
- /NXindirecttof/entry/title-field
- /NXiqproc/ENTRY/title-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/title-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/title-field
- /NXmonopd/entry/title-field
- /NXmpes/ENTRY/title-field
- /NXmx/ENTRY/title-field
- /NXoptical_spectroscopy/ENTRY/title-field
- /NXraman/ENTRY/title-field
- /NXrefscan/entry/title-field
- /NXreftof/entry/title-field
- /NXsas/ENTRY/title-field
- /NXsastof/ENTRY/title-field
- /NXscan/ENTRY/title-field
- /NXsnsevent/ENTRY/title-field
- /NXsnshisto/ENTRY/title-field
- /NXsource/bunch_pattern/title-field
- /NXsqom/ENTRY/title-field
- /NXstxm/ENTRY/title-field
- /NXsubentry/title-field
- /NXtas/entry/title-field
- /NXtofnpd/entry/title-field
- /NXtofraw/entry/title-field
- /NXtofsingle/entry/title-field
- /NXtomo/entry/title-field
- /NXtomophase/entry/title-field
- /NXtomoproc/entry/title-field
- /NXxas/ENTRY/title-field
- /NXxasproc/ENTRY/title-field
- /NXxbase/entry/title-field
- tof_distance
- /NXenergydispersion/tof_distance-field
- tolerance
- /NXpositioner/tolerance-field
- /NXpositioner_sts/tolerance-field
- top_dead_center
- /NXdisk_chopper/top_dead_center-field
- top_up
- /NXsource/top_up-field
- total
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/composition/total-field
- /NXchemical_composition/total-field
- /NXsimilarity_grouping/statistics/total-field
- total_area
- /NXfit/peakPEAK/total_area-field
- /NXpeak/total_area-field
- /NXxps/ENTRY/FIT/peakPEAK/total_area-field
- total_counts
- /NXsnsevent/ENTRY/instrument/DETECTOR/total_counts-field
- /NXsnsevent/ENTRY/total_counts-field
- /NXsnshisto/ENTRY/DATA/total_counts-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/total_counts-field
- /NXsnshisto/ENTRY/total_counts-field
- total_elapsed_time
- /NXapm_compositionspace_results/ENTRY/profiling/total_elapsed_time-field
- /NXapm_paraprobe_clusterer_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_distancer_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_intersector_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_nanochem_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_ranger_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_selector_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_selector_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_spatstat_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_surfacer_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_tessellator_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_tool_common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_transcoder_config/ENTRY/common/profiling/total_elapsed_time-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/profiling/total_elapsed_time-field
- /NXcs_profiling/total_elapsed_time-field
- /NXem_calorimetry/ENTRY/profiling/total_elapsed_time-field
- total_flux
- /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux-field
- total_flux_integrated
- /NXmx/ENTRY/INSTRUMENT/BEAM/total_flux_integrated-field
- total_surface_area
- /NXcg_cylinder_set/total_surface_area-field
- total_uncounted_counts
- /NXsnsevent/ENTRY/total_uncounted_counts-field
- /NXsnshisto/ENTRY/total_uncounted_counts-field
- transcode
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode-group
- transfer_matrix
- /NXbeam_transfer_matrix_table/TRANSFER_MATRIX-field
- transfer_rate
- /NXfiber/transfer_rate-field
- transformations
- /NXactuator/TRANSFORMATIONS-group
- /NXaperture/TRANSFORMATIONS-group
- /NXapm_paraprobe_tool_common/COORDINATE_SYSTEM_SET/COORDINATE_SYSTEM/TRANSFORMATIONS-group
- /NXattenuator/TRANSFORMATIONS-group
- /NXbeam/TRANSFORMATIONS-group
- /NXbeam_device/TRANSFORMATIONS-group
- /NXbeam_path/TRANSFORMATIONS-group
- /NXbeam_stop/TRANSFORMATIONS-group
- /NXbending_magnet/TRANSFORMATIONS-group
- /NXcapillary/TRANSFORMATIONS-group
- /NXcollectioncolumn/TRANSFORMATIONS-group
- /NXcollimator/TRANSFORMATIONS-group
- /NXcomponent/TRANSFORMATIONS-group
- /NXcoordinate_system/TRANSFORMATIONS-group
- /NXcrystal/TRANSFORMATIONS-group
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations-group
- /NXcxi_ptycho/sample_1/transformations-group
- /NXdeflector/TRANSFORMATIONS-group
- /NXdetector/TRANSFORMATIONS-group
- /NXdisk_chopper/TRANSFORMATIONS-group
- /NXebeam_column/electron_source/TRANSFORMATIONS-group
- /NXelectronanalyser/TRANSFORMATIONS-group
- /NXenergydispersion/TRANSFORMATIONS-group
- /NXenvironment/TRANSFORMATIONS-group
- /NXfermi_chopper/TRANSFORMATIONS-group
- /NXfilter/TRANSFORMATIONS-group
- /NXflipper/TRANSFORMATIONS-group
- /NXfresnel_zone_plate/TRANSFORMATIONS-group
- /NXgrating/TRANSFORMATIONS-group
- /NXguide/TRANSFORMATIONS-group
- /NXinsertion_device/TRANSFORMATIONS-group
- /NXmanipulator/TRANSFORMATIONS-group
- /NXmirror/TRANSFORMATIONS-group
- /NXmoderator/TRANSFORMATIONS-group
- /NXmonitor/TRANSFORMATIONS-group
- /NXmonochromator/TRANSFORMATIONS-group
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group
- /NXmpes_arpes/ENTRY/SAMPLE/transformations-group
- /NXmpes_arpes/ENTRY/geometries/arpes_geometry/TRANSFORMATIONS-group
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group
- /NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/sample_stage/transformations-group
- /NXoptical_spectroscopy/ENTRY/reference_frames/beam_ref_frame/TRANSFORMATIONS-group
- /NXoptical_spectroscopy/ENTRY/reference_frames/sample_normal_ref_frame/TRANSFORMATIONS-group
- /NXpinhole/TRANSFORMATIONS-group
- /NXpolarizer/TRANSFORMATIONS-group
- /NXpositioner/TRANSFORMATIONS-group
- /NXpositioner_sts/TRANSFORMATIONS-group
- /NXpulser_apm/SOURCE/TRANSFORMATIONS-group
- /NXreflectron/TRANSFORMATIONS-group
- /NXregistration/TRANSFORMATIONS-group
- /NXsample/TRANSFORMATIONS-group
- /NXsensor/TRANSFORMATIONS-group
- /NXsensor_sts/TRANSFORMATIONS-group
- /NXslit/TRANSFORMATIONS-group
- /NXsource/TRANSFORMATIONS-group
- /NXspindispersion/TRANSFORMATIONS-group
- /NXvelocity_selector/TRANSFORMATIONS-group
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transformations-group
- /NXxps/ENTRY/INSTRUMENT/beamTYPE/transformations-group
- /NXxps/ENTRY/SAMPLE/transformations-group
- /NXxraylens/TRANSFORMATIONS-group
- translation
- /NXcxi_ptycho/data_1/translation-link
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field
- /NXcxi_ptycho/sample_1/geometry_1/translation-link
- /NXgeometry/TRANSLATION-group
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
- transmission
- /NXbeam_splitter/transmission-field
- /NXcanSAS/ENTRY/SAMPLE/transmission-field
- /NXcapillary/transmission-group
- /NXcrystal/transmission-group
- /NXfilter/transmission-group
- /NXlens_opt/transmission-field
- /NXpolarizer_opt/transmission-field
- /NXsample/transmission-group
- /NXsample_component/transmission-group
- transmission_correction
- /NXmpes/ENTRY/PROCESS_MPES/transmission_correction-group
- /NXprocess_mpes/transmission_correction-group
- /NXxps/ENTRY/PROCESS_MPES/transmission_correction-group
- transmission_function
- /NXelectronanalyser/transmission_function-group
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group
- /NXmpes/ENTRY/PROCESS_MPES/transmission_correction/transmission_function-group
- /NXprocess_mpes/transmission_correction/transmission_function-group
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/transmission_function-group
- transmission_spectrum
- /NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
- transmittance
- /NXoptical_spectroscopy/ENTRY/derived_parameters/transmittance-field
- transmitting_material
- /NXcollimator/transmitting_material-field
- /NXfermi_chopper/transmitting_material-field
- triangle_cluster_identifier
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/triangle_cluster_identifier-field
- triangle_identifier
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/triangle_identifier-field
- triangle_meshid
- /NXcg_alpha_complex/triangle_meshID-group
- triangle_set
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set-group
- triangle_setid
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID-group
- /NXcg_alpha_complex/triangle_setID-group
- triangle_soup
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup-group
- triangleid
- /NXcg_triangle_set/triangleID-group
- triangles
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles-group
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles-group
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles-group
- /NXcg_triangle_set/triangles-group
- trigger_dead_time
- /NXdetector/trigger_dead_time-field
- trigger_delay_time
- /NXdetector/trigger_delay_time-field
- trigger_delay_time_set
- /NXdetector/trigger_delay_time_set-field
- trigger_internal_delay_time
- /NXdetector/trigger_internal_delay_time-field
- triple_junction
- /NXmicrostructure/triple_junction-group
- triple_junction_identifier
- /NXmicrostructure/interface/triple_junction_identifier-field
- /NXmicrostructure/quadruple_junction/triple_junction_identifier-field
- triple_line_mobility
- /NXmicrostructure_gragles_config/ENTRY/triple_line_mobility-group
- trunc_species
- /NXapm_compositionspace_config/ENTRY/config/autophase/trunc_species-field
- tunneling_current
- /NXcircuit/tunneling_current-field
- tunneling_resistor
- /NXiv_bias/tunneling_resistor-field
- turbomolecular_pump
- /NXapm_msr/instrument/turbomolecular_pump-group
- twist
- /NXvelocity_selector/twist-field
- two_theta
- /NXxrd_pan/ENTRY/experiment_config/two_theta-group
- /NXxrd_pan/ENTRY/experiment_result/two_theta-field
- two_time_corr_func
- /NXxpcs/entry/twotime/two_time_corr_func-field
- twotheta
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/twotheta-field
- twotime
- /NXxpcs/entry/twotime-group
- type
- /NXactuator/type-field
- /NXapm/ENTRY/atom_probe/hit_finding/serialized/type-field
- /NXapm/ENTRY/atom_probe/hit_spatial_filtering/serialized/type-field
- /NXapm/ENTRY/atom_probe/mass_to_charge_conversion/serialized/type-field
- /NXapm/ENTRY/atom_probe/ranging/definitions/type-field
- /NXapm/ENTRY/atom_probe/raw_data/serialized/type-field
- /NXapm/ENTRY/atom_probe/reconstruction/config/type-field
- /NXapm/ENTRY/atom_probe/reconstruction/results/type-field
- /NXapm/ENTRY/atom_probe/voltage_and_bowl/serialized/type-field
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field
- /NXapm/ENTRY/sample/type-field
- /NXapm/ENTRY/serializedID/type-field
- /NXapm/ENTRY/specimen/type-field
- /NXapm_compositionspace_config/ENTRY/config/ranging/type-field
- /NXapm_compositionspace_config/ENTRY/config/reconstruction/type-field
- /NXapm_compositionspace_results/ENTRY/config/type-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/reconstruction/type-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cameca_to_nexus/results/type-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/ranging/type-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/reconstruction/type-field
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/surface_distance/type-field
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/config/type-field
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/ranging/type-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/reconstruction/type-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/type-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/config/type-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/current_set/featureID/type-field
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID/next_set/featureID/type-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/input/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/ranging/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/reconstruction/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface_distance/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/control_point/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/ranging/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/reconstruction/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature_distance/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/ranging/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/reconstruction/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/type-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface_distance/type-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/ranging/type-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/reconstruction/type-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_selector_config/ENTRY/select/ranging/type-field
- /NXapm_paraprobe_selector_config/ENTRY/select/reconstruction/type-field
- /NXapm_paraprobe_selector_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/feature_distance/type-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/type-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/ranging/type-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/reconstruction/type-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/surface_distance/type-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/ranging/type-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/reconstruction/type-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/type-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/ranging/type-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/reconstruction/type-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/surface_distance/type-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/ranging/type-field
- /NXapm_paraprobe_transcoder_config/ENTRY/transcode/reconstruction/type-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/config/type-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/config/type-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/type-field
- /NXarchive/entry/instrument/SOURCE/type-field
- /NXarchive/entry/sample/type-field
- /NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXattenuator/type-field
- /NXbeam_path/GRATING/type-field
- /NXbeam_path/SOURCE/type-field
- /NXbeam_splitter/type-field
- /NXcapillary/type-field
- /NXcg_alpha_complex/type-field
- /NXcollimator/type-field
- /NXcoordinate_system/type-field
- /NXcrystal/type-field
- /NXcs_computer/memory/CIRCUIT/type-field
- /NXcs_computer/processing/CIRCUIT/type-field
- /NXcs_computer/storage/CIRCUIT/type-field
- /NXcs_prng/type-field
- /NXcxi_ptycho/entry_1/instrument_1/source_1/type-field
- /NXdeflector/type-field
- /NXdetector/type-field
- /NXdisk_chopper/type-field
- /NXellipsometry/ENTRY/INSTRUMENT/focussing_probes/type-field
- /NXem/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/type-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/type-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/type-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/type-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/type-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/type-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/type-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/IMAGE_SET/PROCESS/source/type-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source/type-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/type-field
- /NXem/ENTRY/roiID/ebsd/indexing/source/type-field
- /NXem/ENTRY/roiID/ebsd/measurement/source/type-field
- /NXem/ENTRY/roiID/ebsd/simulation/source/type-field
- /NXem/ENTRY/sample/type-field
- /NXem/ENTRY/serializedID/type-field
- /NXem_calorimetry/ENTRY/actuator/type-field
- /NXem_calorimetry/ENTRY/diffraction/type-field
- /NXenvironment/type-field
- /NXfermi_chopper/type-field
- /NXfiber/type-field
- /NXflipper/type-field
- /NXfluo/entry/INSTRUMENT/SOURCE/type-field
- /NXinsertion_device/type-field
- /NXiqproc/ENTRY/instrument/SOURCE/type-field
- /NXlens_em/type-field
- /NXlens_opt/type-field
- /NXmanipulator/type-field
- /NXmicrostructure_gragles_config/ENTRY/discretization/grid/type-field
- /NXmicrostructure_gragles_config/ENTRY/grain_boundary_energy/type-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field
- /NXmicrostructure_score_config/ENTRY/deformation/ebsd/type-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/type-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/type-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/strain/type-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/stress/type-field
- /NXmirror/type-field
- /NXmoderator/type-field
- /NXmonitor/type-field
- /NXmonopd/entry/INSTRUMENT/SOURCE/type-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/energy_resolution/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/cryostat/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_potentiostat/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_heater/type-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/type-field
- /NXmpes/ENTRY/INSTRUMENT/energy_resolution/type-field
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/type-field
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/type-field
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/angularN_resolution/type-field
- /NXmpes_arpes/ENTRY/INSTRUMENT/angularN_resolution/type-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field
- /NXnote/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/LENS_OPT/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/generic_beam_sample_angle_TYPE/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temp_control_TYPE/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/type-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution/type-field
- /NXpolarizer/type-field
- /NXpolarizer_opt/type-field
- /NXrefscan/entry/instrument/SOURCE/type-field
- /NXresolution/type-field
- /NXsample/type-field
- /NXsas/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXsastof/ENTRY/instrument/source/type-field
- /NXsensor/type-field
- /NXsensor_sts/type-field
- /NXserialized/type-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/type-field
- /NXsnsevent/ENTRY/instrument/SNS/type-field
- /NXsnsevent/ENTRY/instrument/moderator/type-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/type-field
- /NXsnshisto/ENTRY/instrument/SNS/type-field
- /NXsnshisto/ENTRY/instrument/moderator/type-field
- /NXsource/type-field
- /NXspindispersion/type-field
- /NXsqom/ENTRY/instrument/SOURCE/type-field
- /NXsts/ENTRY/type-field
- /NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXtomo/entry/instrument/SOURCE/type-field
- /NXtomophase/entry/instrument/SOURCE/type-field
- /NXtomoproc/entry/INSTRUMENT/SOURCE/type-field
- /NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field
- /NXtransmission/ENTRY/instrument/DETECTOR/type-field
- /NXtransmission/ENTRY/instrument/SOURCE/type-field
- /NXvelocity_selector/type-field
- /NXwaveplate/type-field
- /NXxas/ENTRY/INSTRUMENT/SOURCE/type-field
- /NXxbase/entry/instrument/source/type-field
- type_other
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/type_other-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/source_TYPE/type_other-field
- /NXpolarizer_opt/type_other-field
- /NXsource/type_other-field
- ub_matrix
- /NXsample/ub_matrix-field
- /NXsingle_crystal/ub_matrix-field
- unassigned
- /NXsimilarity_grouping/statistics/unassigned-field
- uncertainty
- /NXaberration/uncertainty-field
- uncertainty_model
- /NXaberration/uncertainty_model-field
- underload_value
- /NXdetector/underload_value-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
- unit_cell
- /NXcrystal/unit_cell-field
- /NXlauetof/entry/sample/unit_cell-field
- /NXsample/unit_cell-field
- /NXsingle_crystal/UNIT_CELL-group
- /NXtas/entry/SAMPLE/unit_cell-field
- /NXxbase/entry/sample/unit_cell-field
- unit_cell_a
- /NXcrystal/unit_cell_a-field
- /NXfilter/unit_cell_a-field
- unit_cell_abc
- /NXsample/unit_cell_abc-field
- /NXsample_component/unit_cell_abc-field
- unit_cell_alpha
- /NXcrystal/unit_cell_alpha-field
- /NXfilter/unit_cell_alpha-field
- unit_cell_alphabetagamma
- /NXsample/unit_cell_alphabetagamma-field
- /NXsample_component/unit_cell_alphabetagamma-field
- unit_cell_b
- /NXcrystal/unit_cell_b-field
- /NXfilter/unit_cell_b-field
- unit_cell_beta
- /NXcrystal/unit_cell_beta-field
- /NXfilter/unit_cell_beta-field
- unit_cell_c
- /NXcrystal/unit_cell_c-field
- /NXfilter/unit_cell_c-field
- unit_cell_class
- /NXsample/unit_cell_class-field
- /NXsample_component/unit_cell_class-field
- unit_cell_gamma
- /NXcrystal/unit_cell_gamma-field
- /NXfilter/unit_cell_gamma-field
- unit_cell_volume
- /NXcrystal/unit_cell_volume-field
- /NXfilter/unit_cell_volume-field
- /NXsample/unit_cell_volume-field
- /NXsample_component/unit_cell_volume-field
- upper_cap_radii
- /NXcg_cylinder_set/upper_cap_radii-field
- upper_cap_surface_area
- /NXcg_cylinder_set/upper_cap_surface_area-field
- url
- /NXcite/url-field
- /NXtransmission/ENTRY/operator/url-field
- usage
- /NXcrystal/usage-field
- use
- /NXapm_compositionspace_config/ENTRY/config/autophase/use-field
- user
- /NXapm/ENTRY/USER-group
- /NXapm_compositionspace_results/ENTRY/USER-group
- /NXapm_paraprobe_tool_common/USER-group
- /NXarchive/entry/user-group
- /NXem_calorimetry/ENTRY/USER-group
- /NXentry/USER-group
- /NXevent_data_em/USER-group
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group
- /NXlab_sample_mounting/ENTRY/USER-group
- /NXmicrostructure_gragles_config/ENTRY/USER-group
- /NXmicrostructure_gragles_results/ENTRY/USER-group
- /NXmicrostructure_imm_results/ENTRY/USER-group
- /NXmicrostructure_kanapy_results/ENTRY/USER-group
- /NXmicrostructure_score_config/ENTRY/USER-group
- /NXmicrostructure_score_results/ENTRY/USER-group
- /NXmpes/ENTRY/USER-group
- /NXoptical_spectroscopy/ENTRY/USER-group
- /NXsensor_scan/ENTRY/USER-group
- /NXsnsevent/ENTRY/USER-group
- /NXsnshisto/ENTRY/USER-group
- /NXsubentry/USER-group
- /NXtofnpd/entry/user-group
- /NXtofraw/entry/user-group
- /NXtofsingle/entry/user-group
- user_defined_roi
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/user_defined_roi-group
- userid
- /NXapm_paraprobe_clusterer_results/ENTRY/common/userID-group
- /NXapm_paraprobe_distancer_results/ENTRY/common/userID-group
- /NXapm_paraprobe_intersector_results/ENTRY/common/userID-group
- /NXapm_paraprobe_nanochem_results/ENTRY/common/userID-group
- /NXapm_paraprobe_ranger_results/ENTRY/common/userID-group
- /NXapm_paraprobe_selector_results/ENTRY/common/userID-group
- /NXapm_paraprobe_spatstat_results/ENTRY/common/userID-group
- /NXapm_paraprobe_surfacer_results/ENTRY/common/userID-group
- /NXapm_paraprobe_tessellator_results/ENTRY/common/userID-group
- /NXapm_paraprobe_transcoder_results/ENTRY/common/userID-group
- /NXem/ENTRY/userID-group
- uuid
- /NXcs_computer/uuid-field
- v_v_spatial_correlation
- /NXapm_paraprobe_intersector_results/ENTRY/v_v_spatial_correlation-group
- v_v_spatial_correlationid
- /NXapm_paraprobe_intersector_config/ENTRY/v_v_spatial_correlationID-group
- value
- /NXdispersion_single_parameter/value-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
- /NXelectrostatic_kicker/read_current/value-field
- /NXelectrostatic_kicker/read_voltage/value-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/apertureID/value-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/lensID/value-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/apertureID/value-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/lensID/value-field
- /NXenvironment/value-field
- /NXfit_parameter/value-field
- /NXlens_em/value-field
- /NXlog/value-field
- /NXmagnetic_kicker/read_current/value-field
- /NXmagnetic_kicker/read_voltage/value-field
- /NXmanipulator/cryostat/PID/setpoint_log/value-field
- /NXmanipulator/drain_current_amperemeter/value-field
- /NXmanipulator/drain_current_amperemeter/value_log/value-field
- /NXmanipulator/sample_bias_potentiostat/PID/setpoint_log/value-field
- /NXmanipulator/sample_bias_voltmeter/value-field
- /NXmanipulator/sample_bias_voltmeter/value_log/value-field
- /NXmanipulator/sample_heater/PID/setpoint_log/value-field
- /NXmanipulator/sample_heater/heater_power_log/value-field
- /NXmanipulator/temperature_sensor/value-field
- /NXmanipulator/temperature_sensor/value_log/value-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/summary_statistics/deformation_gradient/value-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/drain_current_amperemeter/value-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias_voltmeter/value-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/temperature_sensor/value-field
- /NXmpes/ENTRY/INSTRUMENT/flood_gun/current_log/value-field
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value-field
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log/value-field
- /NXmpes/ENTRY/SAMPLE/bias_env/value-field
- /NXmpes/ENTRY/SAMPLE/drain_current_env/value-field
- /NXmpes/ENTRY/SAMPLE/flood_gun_current_env/flood_gun/value-field
- /NXmpes/ENTRY/SAMPLE/gas_pressure_env/value-field
- /NXmpes/ENTRY/SAMPLE/temperature_env/value-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/temperature_sensor/value-field
- /NXorientation/value-field
- /NXpid/pv_sensor/value_log/value-field
- /NXpositioner/value-field
- /NXpositioner_sts/value-field
- /NXquadrupole_magnet/read_current/value-field
- /NXquadrupole_magnet/read_voltage/value-field
- /NXsensor/value-field
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field
- /NXsensor_sts/value-field
- /NXseparator/read_Bfield_current/value-field
- /NXseparator/read_Bfield_voltage/value-field
- /NXseparator/read_Efield_current/value-field
- /NXseparator/read_Efield_voltage/value-field
- /NXsnsevent/ENTRY/DASlogs/LOG/value-field
- /NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
- /NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field
- /NXsnshisto/ENTRY/DASlogs/LOG/value-field
- /NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field
- /NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field
- /NXsolenoid_magnet/read_current/value-field
- /NXsolenoid_magnet/read_voltage/value-field
- /NXspin_rotator/read_Bfield_current/value-field
- /NXspin_rotator/read_Bfield_voltage/value-field
- /NXspin_rotator/read_Efield_current/value-field
- /NXspin_rotator/read_Efield_voltage/value-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/current_sensor/value-field
- /NXxps/ENTRY/FIT/peakPEAK/function/position/value-field
- /NXxps/ENTRY/FIT/peakPEAK/function/width/value-field
- value_deriv1
- /NXsensor/value_deriv1-field
- /NXsensor_sts/value_deriv1-field
- value_deriv1_log
- /NXsensor/value_deriv1_log-group
- /NXsensor_sts/value_deriv1_log-group
- value_deriv2
- /NXsensor/value_deriv2-field
- /NXsensor_sts/value_deriv2-field
- value_deriv2_log
- /NXsensor/value_deriv2_log-group
- /NXsensor_sts/value_deriv2_log-group
- value_log
- /NXmanipulator/drain_current_amperemeter/value_log-group
- /NXmanipulator/sample_bias_voltmeter/value_log-group
- /NXmanipulator/temperature_sensor/value_log-group
- /NXmpes/ENTRY/INSTRUMENT/pressure_gauge/value_log-group
- /NXpid/pv_sensor/value_log-group
- /NXsensor/value_log-group
- /NXsensor_sts/value_log-group
- value_timestamp
- /NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
- value_x
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_x-field
- value_y
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/corrector_ax/value_y-field
- values
- /NXdispersion_function/DISPERSION_REPEATED_PARAMETER/values-field
- /NXdispersion_repeated_parameter/values-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
- variable
- /NXiqproc/ENTRY/DATA/variable-field
- variance_grain
- /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_grain-field
- variance_subgrain
- /NXmicrostructure_imm_config/ENTRY/dislocation_distribution/variance_subgrain-field
- /NXmicrostructure_imm_config/ENTRY/orientation_distribution/variance_subgrain-field
- varied_parameter_link
- /NXellipsometry/ENTRY/data_collection/varied_parameter_link-field
- varphi_one
- /NXmicrostructure_odf/phi_two_plot/varphi_one-field
- varphi_two
- /NXmicrostructure_odf/phi_two_plot/varphi_two-field
- vector
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
- velocity
- /NXpositioner/velocity-field
- /NXpositioner_sts/velocity-field
- velocity_selector
- /NXinstrument/VELOCITY_SELECTOR-group
- /NXmonochromator/VELOCITY_SELECTOR-group
- vendor
- /NXapm/ENTRY/measurement/instrument/fabrication/vendor-field
- /NXapm/ENTRY/measurement/instrument/ion_detector/fabrication/vendor-field
- /NXapm/ENTRY/measurement/instrument/local_electrode/fabrication/vendor-field
- /NXapm/ENTRY/measurement/instrument/pulser/fabrication/vendor-field
- /NXapm/ENTRY/measurement/instrument/pulser/sourceID/fabrication/vendor-field
- /NXapm/ENTRY/measurement/instrument/reflectron/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/STAGE_LAB/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/detectorID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/apertureID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/biprism/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_ax/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/corrector_cs/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/electron_source/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/lensID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/monochromatorID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ebeam_column/phaseplateID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/apertureID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/lensID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/ibeam_column/monochromatorID/fabrication/vendor-field
- /NXem/ENTRY/measurement/em_lab/scan_controller/fabrication/vendor-field
- /NXfabrication/vendor-field
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field
- /NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/device_information/vendor-field
- /NXmpes/ENTRY/INSTRUMENT/sourceTYPE/device_information/vendor-field
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/device_information/vendor-field
- version
- /NXellipsometry/ENTRY/data_collection/data_software/version-field
- /NXiqproc/ENTRY/reduction/version-field
- /NXoptical_spectroscopy/ENTRY/derived_parameters/ANALYSIS_program/version-field
- /NXprocess/version-field
- /NXprocess_mpes/version-field
- /NXsnsevent/ENTRY/SNSHistoTool/version-field
- /NXsnshisto/ENTRY/SNSHistoTool/version-field
- /NXsqom/ENTRY/reduction/version-field
- /NXtomoproc/entry/reconstruction/version-field
- /NXxasproc/ENTRY/XAS_data_reduction/version-field
- vertex_identifier
- /NXcg_face_list_data_structure/vertex_identifier-field
- vertex_identifier_offset
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertex_identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_identifier_offset-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertex_identifier_offset-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertex_identifier_offset-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertex_identifier_offset-field
- /NXcg_face_list_data_structure/vertex_identifier_offset-field
- /NXcg_half_edge_data_structure/vertex_identifier_offset-field
- vertex_incident_half_edge
- /NXcg_half_edge_data_structure/vertex_incident_half_edge-field
- vertex_normal
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertex_normal-group
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal-field
- /NXcg_hexahedron_set/vertex_normal-group
- /NXcg_primitive_set/vertex_normal-group
- vertex_normal_orientation
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertex_normal_orientation-field
- vertex_normals
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertex_normals-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertex_normals-field
- vertices
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/triangle_setID/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/surface/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/surface/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/feature/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/surface/vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/vertices-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/vertices-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/vertices-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/vertices-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/hexahedron_set/hexahedra/vertices-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/polyhedra/vertices-field
- /NXcg_face_list_data_structure/vertices-field
- /NXcg_polyline_set/vertices-field
- /NXcylindrical_geometry/vertices-field
- /NXoff_geometry/vertices-field
- vertices_are_unique
- /NXcg_face_list_data_structure/vertices_are_unique-field
- /NXcg_polyline_set/vertices_are_unique-field
- virtual_pixel_interpolation_applied
- /NXdetector/virtual_pixel_interpolation_applied-field
- /NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
- visualization
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization-group
- voltage
- /NXdeflector/voltage-field
- /NXebeam_column/electron_source/voltage-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/electron_source/voltage-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ebeam_column/monochromatorID/voltage-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/heater/voltage-field
- /NXem/ENTRY/measurement/event_data_em_set/EVENT_DATA_EM/em_lab/ibeam_column/ion_source/voltage-field
- /NXibeam_column/ion_source/voltage-field
- /NXiv_temp/ENTRY/DATA/voltage-field
- /NXlens_em/voltage-field
- /NXreflectron/voltage-field
- /NXsource/voltage-field
- voltage_and_bowl
- /NXapm/ENTRY/atom_probe/voltage_and_bowl-group
- voltage_controller
- /NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
- voltage_energy_range
- /NXelectronanalyser/voltage_energy_range-field
- voltmeter
- /NXmpes/ENTRY/SAMPLE/bias_env/voltmeter-group
- volume
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/volume-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/volume-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/volume-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/volume-field
- /NXatom_set/volume-field
- /NXcg_hexahedron_set/volume-field
- /NXcg_primitive_set/volume-field
- /NXcrystal_structure/volume-field
- /NXion/volume-field
- /NXmicrostructure/crystal/volume-field
- /NXmicrostructure/triple_junction/volume-field
- /NXmicrostructure_gragles_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/crystal/volume-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/crystal/volume-field
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/crystal/volume-field
- /NXunit_cell/volume-field
- volume_fraction
- /NXmicrostructure_odf/kth_extrema/volume_fraction-field
- /NXsample/volume_fraction-field
- /NXsample_component/volume_fraction-field
- /NXsample_component_set/volume_fraction-field
- volumetric_features
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features-group
- voronoi_cells
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells-group
- voxel
- /NXapm_compositionspace_results/ENTRY/clustering/ic_opt/cluster_analysisID/dbscanID/voxel-field
- voxel_identifier
- /NXapm_compositionspace_results/ENTRY/voxelization/cg_grid/voxel_identifier-field
- voxelization
- /NXapm_compositionspace_config/ENTRY/config/voxelization-group
- /NXapm_compositionspace_results/ENTRY/voxelization-group
- wall
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall-group
- wall_contact_bottom
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_bottom-group
- wall_contact_front
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_front-group
- wall_contact_global
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_global-group
- wall_contact_left
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_left-group
- wall_contact_rear
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_rear-group
- wall_contact_right
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_right-group
- wall_contact_top
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/wall_contact_top-group
- warmup
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/random_number_generator/warmup-field
- /NXcs_prng/warmup-field
- wavelength
- /NXapm/ENTRY/measurement/instrument/pulser/sourceID/wavelength-field
- /NXcrystal/wavelength-field
- /NXdetector/efficiency/wavelength-field
- /NXdispersion_table/wavelength-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/wavelength-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/wavelength-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/wavelength-field
- /NXfermi_chopper/wavelength-field
- /NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
- /NXguide/reflectivity/wavelength-field
- /NXmonochromator/wavelength-field
- /NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
- /NXpulser_apm/SOURCE/wavelength-field
- /NXraman/ENTRY/INSTRUMENT/beam_incident/wavelength-field
- /NXrefscan/entry/instrument/monochromator/wavelength-field
- /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field
- /NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field
- /NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field
- /NXsource/wavelength-field
- /NXtransmission/ENTRY/instrument/spectrometer/wavelength-field
- /NXvelocity_selector/wavelength-field
- /NXxbase/entry/instrument/monochromator/wavelength-field
- /NXxlaue/entry/instrument/source/distribution/wavelength-field
- wavelength_calibration
- /NXoptical_spectroscopy/ENTRY/measurement_data_calibration_TYPE/wavelength_calibration-group
- wavelength_dispersion
- /NXmonochromator/wavelength_dispersion-field
- wavelength_error
- /NXmonochromator/wavelength_error-field
- wavelength_errors
- /NXmonochromator/wavelength_errors-field
- wavelength_identifier
- /NXdispersion_function/wavelength_identifier-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_identifier-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_identifier-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_identifier-field
- wavelength_max
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
- /NXdispersion_function/wavelength_max-field
- wavelength_min
- /NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
- /NXdispersion_function/wavelength_min-field
- wavelength_range
- /NXbeam_splitter/wavelength_range-field
- /NXdisk_chopper/wavelength_range-field
- /NXpolarizer_opt/wavelength_range-field
- /NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field
- /NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field
- /NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
- wavelength_range_coating
- /NXbeam_splitter/coating/wavelength_range_coating-field
- /NXwaveplate/coating/wavelength_range_coating-field
- wavelength_resolution
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/wavelength_resolution-group
- wavelength_spread
- /NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field
- /NXvelocity_selector/wavelength_spread-field
- wavelength_unit
- /NXdispersion_function/wavelength_unit-field
- /NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_unit-field
- /NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_unit-field
- /NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_unit-field
- wavelengths
- /NXwaveplate/wavelengths-field
- waveplate
- /NXbeam_path/WAVEPLATE-group
- /NXoptical_spectroscopy/ENTRY/INSTRUMENT/WAVEPLATE-group
- wedge_angle
- /NXbeam_splitter/SHAPE/wedge_angle-field
- /NXpolarizer_opt/SHAPE/wedge_angle-field
- weight
- /NXapm_compositionspace_results/ENTRY/voxelization/elementID/weight-field
- /NXapm_compositionspace_results/ENTRY/voxelization/weight-field
- /NXdelocalization/weighting_model/weight-field
- /NXmicrostructure_odf/sampling/weight-field
- weighting_method
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model/weighting_method-field
- /NXdelocalization/weighting_model/weighting_method-field
- weighting_model
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/weighting_model-group
- /NXdelocalization/weighting_model-group
- weights
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/dbscanID/weights-field
- /NXem_eds/indexing/IMAGE_SET/PROCESS/weights-field
- weinberg_vector
- /NXcg_half_edge_data_structure/weinberg_vector-field
- width
- /NXcg_hexahedron_set/width-field
- /NXcg_primitive_set/width-field
- /NXfermi_chopper/width-field
- /NXvelocity_selector/width-field
- /NXxps/ENTRY/FIT/peakPEAK/function/width-group
- winding_order
- /NXcg_face_list_data_structure/winding_order-field
- /NXoff_geometry/winding_order-field
- window
- /NXapm_paraprobe_clusterer_results/ENTRY/cluster_analysisID/window-group
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window-group
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/window-group
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/window-group
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/window-group
- /NXapm_paraprobe_ranger_results/ENTRY/iontypes/window-group
- /NXapm_paraprobe_selector_results/ENTRY/roi/window-group
- /NXapm_paraprobe_spatstat_results/ENTRY/spatial_statisticsID/window-group
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/window-group
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/window-group
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/window-group
- /NXapm_paraprobe_tool_results/window-group
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/window-group
- window_correction
- /NXopt_window/ENTRY/window_correction-group
- window_effects_corrected
- /NXopt_window/ENTRY/window_effects_corrected-field
- window_effects_type
- /NXopt_window/ENTRY/window_effects_type-field
- window_number
- /NXbeam_path/window_NUMBER-group
- window_triangles
- /NXapm_paraprobe_distancer_results/ENTRY/point_to_triangle/window_triangles-group
- windowing_method
- /NXapm_paraprobe_clusterer_config/ENTRY/cluster_analysisID/spatial_filter/windowing_method-field
- /NXapm_paraprobe_distancer_config/ENTRY/point_to_triangle/spatial_filter/windowing_method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/delocalization/spatial_filter/windowing_method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/interface_meshing/spatial_filter/windowing_method-field
- /NXapm_paraprobe_nanochem_config/ENTRY/oned_profile/spatial_filter/windowing_method-field
- /NXapm_paraprobe_ranger_config/ENTRY/range/spatial_filter/windowing_method-field
- /NXapm_paraprobe_selector_config/ENTRY/select/spatial_filter/windowing_method-field
- /NXapm_paraprobe_spatstat_config/ENTRY/spatial_statisticsID/spatial_filter/windowing_method-field
- /NXapm_paraprobe_surfacer_config/ENTRY/surface_meshing/spatial_filter/windowing_method-field
- /NXapm_paraprobe_tessellator_config/ENTRY/tessellate/spatial_filter/windowing_method-field
- /NXspatial_filter/windowing_method-field
- work_function
- /NXelectronanalyser/work_function-field
- /NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field
- /NXxps/ENTRY/INSTRUMENT/ELECTRONANALYSER/work_function-field
- workflow_step_description
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
- workflow_step_identifier
- /NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_identifier-field
- working_distance
- /NXcapillary/working_distance-field
- /NXcollectioncolumn/working_distance-field
- /NXoptical_system_em/working_distance-field
- x
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/x-field
- /NXbeam_stop/x-field
- /NXcoordinate_system/x-field
- /NXcxi_ptycho/DATA/x-link
- /NXdata/x-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/x-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/x-field
- /NXmicrostructure_score_config/ENTRY/sampling/x-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/x-field
- /NXtomoproc/entry/data/x-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/x-field
- x_alias
- /NXcoordinate_system/x_alias-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_alias-field
- x_axis_direction
- /NXmicrostructure_mtex_config/conventions/x_axis_direction-field
- x_boundary_convention
- /NXem/ENTRY/roiID/ebsd/pattern_centre/x_boundary_convention-field
- /NXem_ebsd/pattern_centre/x_boundary_convention-field
- x_direction
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/x_direction-field
- /NXcoordinate_system/x_direction-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/x_direction-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/x_direction-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/x_direction-field
- /NXem_ebsd/gnomonic_reference_frame/x_direction-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/x_direction-field
- x_gap
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field
- /NXslit/x_gap-field
- x_indices
- /NXcxi_ptycho/DATA/x_indices-field
- x_normalization_direction
- /NXem/ENTRY/roiID/ebsd/pattern_centre/x_normalization_direction-field
- /NXem_ebsd/pattern_centre/x_normalization_direction-field
- x_pixel_offset
- /NXdetector/x_pixel_offset-field
- /NXsnsevent/ENTRY/DATA/x_pixel_offset-link
- /NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field
- /NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field
- /NXsnshisto/ENTRY/DATA/x_pixel_offset-link
- /NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field
- /NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
- x_pixel_size
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field
- /NXdetector/x_pixel_size-field
- /NXlauetof/entry/instrument/detector/x_pixel_size-field
- /NXreftof/entry/instrument/detector/x_pixel_size-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
- /NXsastof/ENTRY/instrument/detector/x_pixel_size-field
- /NXtomo/entry/instrument/detector/x_pixel_size-field
- /NXtomophase/entry/instrument/sample/x_pixel_size-field
- /NXxbase/entry/instrument/detector/x_pixel_size-field
- /NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
- x_position
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_position-field
- /NXcanSAS/ENTRY/SAMPLE/x_position-field
- x_rotation_axis_pixel_position
- /NXtomo/entry/instrument/detector/x_rotation_axis_pixel_position-field
- x_target
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_target-field
- x_translation
- /NXsample/x_translation-field
- /NXtomo/entry/sample/x_translation-field
- /NXtomophase/entry/sample/x_translation-field
- /NXxbase/entry/sample/x_translation-field
- x_value
- /NXmicrostructure_score_results/ENTRY/spatiotemporalID/microstructureID/x_value-field
- xas_data_reduction
- /NXxasproc/ENTRY/XAS_data_reduction-group
- xdmf_cell_identifier
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_cell_identifier-field
- xdmf_cylinder
- /NXapm_paraprobe_nanochem_results/ENTRY/oned_profile/xdmf_cylinder-group
- xdmf_feature_identifier
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_feature_identifier-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_feature_identifier-field
- xdmf_gradient
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_gradient-field
- xdmf_intensity
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_intensity-field
- xdmf_topology
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/bounding_box/hexahedron/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/obb/hexahedra/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/volumetric_features/FEATURE/objectID/polyhedron/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/iso_surfaceID/triangle_soup/triangles/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_topology-field
- /NXapm_paraprobe_nanochem_results/ENTRY/interface_meshing/mesh_stateID/triangles/xdmf_topology-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/interior_tetrahedra/tetrahedra/xdmf_topology-field
- /NXapm_paraprobe_surfacer_results/ENTRY/point_set_wrapping/alpha_complexID/triangle_set/triangles/xdmf_topology-field
- /NXapm_paraprobe_tessellator_results/ENTRY/tessellation/voronoi_cells/xdmf_topology-field
- /NXapm_paraprobe_transcoder_results/ENTRY/atom_probe/reconstruction/visualization/xdmf_topology-field
- xdmf_xyz
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xdmf_xyz-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xdmf_xyz-field
- xpos
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/xpos-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/xpos-field
- xps_coordinate_system
- /NXxps/ENTRY/geometries/xps_coordinate_system-group
- xray_tube_current
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_current-field
- xray_tube_material
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_material-field
- xray_tube_voltage
- /NXxrd_pan/ENTRY/INSTRUMENT/SOURCE/xray_tube_voltage-field
- xraylens
- /NXbeam_path/XRAYLENS-group
- /NXinstrument/XRAYLENS-group
- y
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/y-field
- /NXbeam_stop/y-field
- /NXcoordinate_system/y-field
- /NXcxi_ptycho/DATA/y-link
- /NXdata/y-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/y-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/y-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/y-field
- /NXtomoproc/entry/data/y-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/y-field
- y_alias
- /NXcoordinate_system/y_alias-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_alias-field
- y_boundary_convention
- /NXem/ENTRY/roiID/ebsd/pattern_centre/y_boundary_convention-field
- /NXem_ebsd/pattern_centre/y_boundary_convention-field
- y_control_p_gain
- /NXsts/ENTRY/reproducibility_indicators/y_control_p_gain-field
- y_direction
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/y_direction-field
- /NXcoordinate_system/y_direction-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/y_direction-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/y_direction-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/y_direction-field
- /NXem_ebsd/gnomonic_reference_frame/y_direction-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/y_direction-field
- y_gap
- /NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field
- /NXslit/y_gap-field
- /NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
- y_indices
- /NXcxi_ptycho/DATA/y_indices-field
- y_normalization_direction
- /NXem/ENTRY/roiID/ebsd/pattern_centre/y_normalization_direction-field
- /NXem_ebsd/pattern_centre/y_normalization_direction-field
- y_pixel_offset
- /NXdetector/y_pixel_offset-field
- /NXsnsevent/ENTRY/DATA/y_pixel_offset-link
- /NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field
- /NXsnshisto/ENTRY/DATA/y_pixel_offset-link
- /NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
- y_pixel_size
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
- /NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field
- /NXdetector/y_pixel_size-field
- /NXlauetof/entry/instrument/detector/y_pixel_size-field
- /NXreftof/entry/instrument/detector/y_pixel_size-field
- /NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
- /NXsastof/ENTRY/instrument/detector/y_pixel_size-field
- /NXtomo/entry/instrument/detector/y_pixel_size-field
- /NXtomophase/entry/instrument/sample/y_pixel_size-field
- /NXxbase/entry/instrument/detector/y_pixel_size-field
- /NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
- y_position
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field
- /NXcanSAS/ENTRY/SAMPLE/y_position-field
- y_pred
- /NXapm_compositionspace_results/ENTRY/segmentation/ic_opt/cluster_analysisID/y_pred-field
- y_rotation_axis_pixel_position
- /NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
- y_translation
- /NXtomo/entry/sample/y_translation-field
- /NXtomophase/entry/sample/y_translation-field
- /NXxbase/entry/sample/y_translation-field
- yaw
- /NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field
- /NXcanSAS/ENTRY/SAMPLE/yaw-field
- ypos
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/ypos-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/ypos-field
- z
- /NXapm_paraprobe_clusterer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_distancer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_intersector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_nanochem_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_ranger_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_selector_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_spatstat_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_surfacer_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_tessellator_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXapm_paraprobe_transcoder_results/ENTRY/common/coordinate_system_set/paraprobe/z-field
- /NXcoordinate_system/z-field
- /NXdata/z-field
- /NXmicrostructure_imm_results/ENTRY/microstructureID/grid/structure/z-field
- /NXmicrostructure_kanapy_results/ENTRY/microstructureID/grid/structure/z-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z_controller/z-field
- /NXtomoproc/entry/data/z-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/z-field
- z_alias
- /NXcoordinate_system/z_alias-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_alias-field
- z_avg_time
- /NXbias_spectroscopy/z_avg_time-field
- /NXiv_bias/z_avg_time-field
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/sweep_control/bias_spectroscopy/z_avg_time-field
- /NXsts/ENTRY/resolution_indicators/z_avg_time-field
- z_axis_direction
- /NXmicrostructure_mtex_config/conventions/z_axis_direction-field
- z_ccontroller_hold
- /NXbias_spectroscopy/z_ccontroller_hold-field
- z_control_hold
- /NXsts/ENTRY/reproducibility_indicators/z_control_hold-field
- z_control_i_gain
- /NXsts/ENTRY/reproducibility_indicators/z_control_i_gain-field
- z_control_switchoff_delay
- /NXsts/ENTRY/reproducibility_indicators/z_control_switchoff_delay-field
- z_control_time
- /NXbias_spectroscopy/z_control_time-field
- /NXiv_bias/z_control_time-field
- /NXsts/ENTRY/reproducibility_indicators/z_control_time-field
- z_control_time_const
- /NXsts/ENTRY/reproducibility_indicators/z_control_time_const-field
- z_control_tip_lift
- /NXsts/ENTRY/reproducibility_indicators/z_control_tip_lift-field
- z_controller
- /NXsts/ENTRY/INSTRUMENT/ENVIRONMENT/position/z_controller-group
- z_controller_hold
- /NXiv_bias/z_controller_hold-field
- /NXpositioner_sts/z_controller_hold-field
- z_controller_name
- /NXsts/ENTRY/reproducibility_indicators/z_controller_name-field
- z_controller_setpoint
- /NXsts/ENTRY/reproducibility_indicators/z_controller_setpoint-field
- z_controller_status
- /NXsts/ENTRY/reproducibility_indicators/z_controller_status-field
- z_contronller
- /NXpositioner_sts/z_contronller-field
- z_direction
- /NXapm/ENTRY/coordinate_system_set/COORDINATE_SYSTEM/z_direction-field
- /NXcoordinate_system/z_direction-field
- /NXem/ENTRY/coordinate_system_set/detector_reference_frameID/z_direction-field
- /NXem/ENTRY/coordinate_system_set/processing_reference_frame/z_direction-field
- /NXem/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
- /NXem/ENTRY/roiID/ebsd/gnomonic_reference_frame/z_direction-field
- /NXem_ebsd/gnomonic_reference_frame/z_direction-field
- /NXmicrostructure_gragles_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
- /NXmicrostructure_score_results/ENTRY/coordinate_system_set/sample_reference_frame/z_direction-field
- /NXxps/ENTRY/geometries/xps_coordinate_system/z_direction-field
- z_offset
- /NXbias_spectroscopy/z_offset-field
- /NXiv_bias/z_offset-field
- /NXpositioner_sts/z_offset-field
- /NXsts/ENTRY/reproducibility_indicators/z_offset-field
- z_pixel_offset
- /NXdetector/z_pixel_offset-field
- z_translation
- /NXtomo/entry/sample/z_translation-field
- /NXtomophase/entry/sample/z_translation-field
- zener_smith
- /NXmicrostructure_score_config/ENTRY/dispersoid_drag/zener_smith-group
- zlp_correction
- /NXem_eels/zlp_correction-group
- zone_height
- /NXfresnel_zone_plate/zone_height-field
- zone_material
- /NXfresnel_zone_plate/zone_material-field
- zone_support_material
- /NXfresnel_zone_plate/zone_support_material-field
- zpos
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_grad_SUFFIX/zpos-field
- /NXapm_paraprobe_nanochem_results/ENTRY/delocalizationID/grid/scalar_field_magn_SUFFIX/zpos-field
written: 2024-11-22T13:47:39.690518