.. do NOT edit this file
   automatically generated by dev_tools.docs.nxdl_index

.. _AppDef-Complete-Structure:

=======================
Application Definitions
=======================

This is the complete list of application definitions:

:ref:`NXapm`
    Application definition for real or simulated atom probe and field-ion microscopy experiments.

:ref:`NXarchive`
    This is a definition for data to be archived by ICAT (http://www.icatproject.org/).

:ref:`NXarpes`
    This is an application definition for angular resolved photo electron spectroscopy.

:ref:`NXcanSAS`
    Implementation of the canSAS standard to store reduced small-angle scattering data of any dimension.

:ref:`NXdirecttof`
    This is a application definition for raw data from a direct geometry TOF spectrometer

:ref:`NXellipsometry`
    This is the application definition describing ellipsometry experiments.

:ref:`NXem`
    Application definition for normalized representation of electron microscopy research.

:ref:`NXfluo`
    This is an application definition for raw data from an X-ray fluorescence experiment

:ref:`NXindirecttof`
    This is a application definition for raw data from an indirect geometry TOF spectrometer

:ref:`NXiqproc`
    Application definition for any :math:`I(Q)` data.

:ref:`NXlauetof`
    This is the application definition for a TOF laue diffractometer

:ref:`NXmonopd`
    Monochromatic Neutron and X-Ray Powder diffractometer 

:ref:`NXmpes`
    This is the most general application definition for

:ref:`NXmpes_arpes`
    This is a general application definition for angle-resolved (multidimensional)

:ref:`NXmx`
    functional application definition for macromolecular crystallography

:ref:`NXoptical_spectroscopy`
    A general application definition of optical spectroscopy elements, which may

:ref:`NXraman`
    An application definition for Raman spectroscopy experiments.

:ref:`NXrefscan`
    This is an application definition for a monochromatic scanning reflectometer.

:ref:`NXreftof`
    This is an application definition for raw data from a TOF reflectometer.

:ref:`NXsas`
    Raw, monochromatic 2-D SAS data with an area detector.

:ref:`NXsastof`
    raw, 2-D SAS data with an area detector with a time-of-flight source

:ref:`NXscan`
    Application definition for a generic scan instrument.

:ref:`NXspe`
    NXSPE Inelastic Format.  Application definition for NXSPE file format.

:ref:`NXsqom`
    This is the application definition for S(Q,OM) processed data. 

:ref:`NXstress`
    Application definition for stress and strain analysis of crystalline material defined by the `EASI-STRESS consortium <https://easi-stress.eu>`_.

:ref:`NXstxm`
    Application definition for a STXM instrument. 

:ref:`NXtas`
    This is an application definition for a triple axis spectrometer. 

:ref:`NXtofnpd`
    This is a application definition for raw data from a TOF neutron powder diffractometer

:ref:`NXtofraw`
    This is an application definition for raw data from a generic TOF instrument

:ref:`NXtofsingle`
    This is a application definition for raw data from a generic TOF instrument

:ref:`NXtomo`
    This is the application definition for x-ray or neutron tomography raw data. 

:ref:`NXtomophase`
    This is the application definition for x-ray or neutron tomography raw data with phase contrast variation at each point. 

:ref:`NXtomoproc`
    This is an application definition for the final result of a tomography experiment: a 3D construction of some volume of physical properties.

:ref:`NXxas`
    This is an application definition for raw data from an X-ray absorption spectroscopy experiment. 

:ref:`NXxasproc`
    Processed data from XAS. This is energy versus I(incoming)/I(absorbed).

:ref:`NXxbase`
    This definition covers the common parts of all monochromatic single crystal raw data application definitions.

:ref:`NXxeuler`
    raw data from a :index:`four-circle diffractometer` with an :index:`eulerian cradle`, extends :ref:`NXxbase`

:ref:`NXxkappa`
    raw data from a kappa geometry (CAD4) single crystal diffractometer, extends :ref:`NXxbase`

:ref:`NXxlaue`
    raw data from a single crystal laue camera, extends :ref:`NXxrot`

:ref:`NXxlaueplate`
    raw data from a single crystal Laue camera, extends :ref:`NXxlaue`

:ref:`NXxnb`
    raw data from a single crystal diffractometer, extends :ref:`NXxbase`

:ref:`NXxps`
    This is the application definition for X-ray photoelectron spectroscopy.

:ref:`NXxrot`
    raw data from a rotation camera, extends :ref:`NXxbase`