.. auto-generated by dev_tools.docs.nxdl from the NXDL source contributed_definitions/NXibeam_column.nxdl.xml -- DO NOT EDIT .. index:: ! NXibeam_column (base class) ! ibeam_column (base class) see: ibeam_column (base class); NXibeam_column .. _NXibeam_column: ============== NXibeam_column ============== **Status**: base class, extends :ref:`NXobject` **Description**: .. collapse:: Base class for a set of components equipping an instrument with FIB capabilities ... Base class for a set of components equipping an instrument with FIB capabilities. Focused-ion-beam (FIB) capabilities turn especially scanning electron microscopes into specimen preparation labs. FIB is a material preparation technique whereby portions of the sample are illuminated with a focused ion beam with controlled intensity. The beam is intense enough and with sufficient ion momentum to remove material in a controlled manner. The fact that an electron microscope with FIB capabilities has needs a second gun with own relevant control circuits, focusing lenses, and other components, warrants the definition of an own base class to group these components and distinguish them from the lenses and components for creating and shaping the electron beam. For more details about the relevant physics and application examples consult the literature, for example: * `L. A. Giannuzzi et al. `_ * `E. I. Preiß et al. `_ * `J. F. Ziegler et al. `_ * `J. Lili `_ **Symbols**: No symbol table **Groups cited**: :ref:`NXaperture_em`, :ref:`NXbeam`, :ref:`NXchamber`, :ref:`NXfabrication`, :ref:`NXion`, :ref:`NXlens_em`, :ref:`NXscanbox_em`, :ref:`NXsensor`, :ref:`NXsource`, :ref:`NXtransformations` .. index:: NXchamber (base class); used in base class, NXfabrication (base class); used in base class, NXsource (base class); used in base class, NXion (base class); used in base class, NXtransformations (base class); used in base class, NXaperture_em (base class); used in base class, NXlens_em (base class); used in base class, NXscanbox_em (base class); used in base class, NXsensor (base class); used in base class, NXbeam (base class); used in base class **Structure**: .. _/NXibeam_column/CHAMBER-group: **CHAMBER**: (optional) :ref:`NXchamber` .. _/NXibeam_column/FABRICATION-group: **FABRICATION**: (optional) :ref:`NXfabrication` .. _/NXibeam_column/ion_source-group: **ion_source**: (optional) :ref:`NXsource` The source which creates the ion beam. .. _/NXibeam_column/ion_source/name-field: .. index:: name (field) **name**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` Given name/alias for the ion gun. .. _/NXibeam_column/ion_source/emitter_type-field: .. index:: emitter_type (field) **emitter_type**: (optional) :ref:`NX_CHAR ` .. collapse:: Emitter type used to create the ion beam. ... Emitter type used to create the ion beam. If the emitter type is other, give further details in the description field. Any of these values: ``liquid_metal`` | ``plasma`` | ``gas_field`` | ``other`` .. _/NXibeam_column/ion_source/description-field: .. index:: description (field) **description**: (optional) :ref:`NX_CHAR ` .. collapse:: Ideally, a (globally) unique persistent identifier, link, ... Ideally, a (globally) unique persistent identifier, link, or text to a resource which gives further details. .. _/NXibeam_column/ion_source/flux-field: .. index:: flux (field) **flux**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} Average/nominal flux .. _/NXibeam_column/ion_source/brightness-field: .. index:: brightness (field) **brightness**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} Average/nominal brightness .. _/NXibeam_column/ion_source/current-field: .. index:: current (field) **current**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_CURRENT `} Charge current .. _/NXibeam_column/ion_source/voltage-field: .. index:: voltage (field) **voltage**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_VOLTAGE `} .. collapse:: Ion acceleration voltage upon source exit and ... Ion acceleration voltage upon source exit and entering the vacuum flight path. .. _/NXibeam_column/ion_source/ion_energy_profile-field: .. index:: ion_energy_profile (field) **ion_energy_profile**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ENERGY `} To be defined more specifically. Community suggestions are welcome. .. _/NXibeam_column/ion_source/probe-group: **probe**: (optional) :ref:`NXion` .. collapse:: Which ionized elements or molecular ions form the beam. ... Which ionized elements or molecular ions form the beam. Examples are gallium, helium, neon, argon, krypton, or xenon, O2+. .. _/NXibeam_column/ion_source/TRANSFORMATIONS-group: **TRANSFORMATIONS**: (optional) :ref:`NXtransformations` :ref:`⤆ ` .. collapse:: Collection of axis-based translations and rotations to describe the ... Collection of axis-based translations and rotations to describe the location and geometry of the component in the instrument. .. _/NXibeam_column/APERTURE_EM-group: **APERTURE_EM**: (optional) :ref:`NXaperture_em` .. _/NXibeam_column/LENS_EM-group: **LENS_EM**: (optional) :ref:`NXlens_em` .. _/NXibeam_column/SCANBOX_EM-group: **SCANBOX_EM**: (optional) :ref:`NXscanbox_em` .. _/NXibeam_column/SENSOR-group: **SENSOR**: (optional) :ref:`NXsensor` .. _/NXibeam_column/BEAM-group: **BEAM**: (optional) :ref:`NXbeam` .. collapse:: Individual characterization results for the position, shape, ... Individual characterization results for the position, shape, and characteristics of the ion beam. :ref:`NXtransformations` should be used to specify the location or position at which details about the ion beam are probed. Hypertext Anchors ----------------- List of hypertext anchors for all groups, fields, attributes, and links defined in this class. * :ref:`/NXibeam_column/APERTURE_EM-group ` * :ref:`/NXibeam_column/BEAM-group ` * :ref:`/NXibeam_column/CHAMBER-group ` * :ref:`/NXibeam_column/FABRICATION-group ` * :ref:`/NXibeam_column/ion_source-group ` * :ref:`/NXibeam_column/ion_source/brightness-field ` * :ref:`/NXibeam_column/ion_source/current-field ` * :ref:`/NXibeam_column/ion_source/description-field ` * :ref:`/NXibeam_column/ion_source/emitter_type-field ` * :ref:`/NXibeam_column/ion_source/flux-field ` * :ref:`/NXibeam_column/ion_source/ion_energy_profile-field ` * :ref:`/NXibeam_column/ion_source/name-field ` * :ref:`/NXibeam_column/ion_source/probe-group ` * :ref:`/NXibeam_column/ion_source/TRANSFORMATIONS-group ` * :ref:`/NXibeam_column/ion_source/voltage-field ` * :ref:`/NXibeam_column/LENS_EM-group ` * :ref:`/NXibeam_column/SCANBOX_EM-group ` * :ref:`/NXibeam_column/SENSOR-group ` **NXDL Source**: https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXibeam_column.nxdl.xml