.. do NOT edit this file automatically generated by dev_tools.docs.nxdl_index .. _CC-Complete-Structure: ======================= Contributed Definitions ======================= This is the complete list of contributed definitions: :ref:`NXafm` An application definition to describe atomic force microscopy (AFM). :ref:`NXamplifier` Base classed definition for amplifier devices. :ref:`NXapm_compositionspace_config` Application definition for a configuration of the CompositionSpace tool used in atom probe. :ref:`NXapm_compositionspace_results` Application definition for results of the CompositionSpace tool used in atom probe. :ref:`NXapm_paraprobe_clusterer_config` Application definition for a configuration file of the paraprobe-clusterer tool. :ref:`NXapm_paraprobe_clusterer_results` Application definition for a results file of the paraprobe-clusterer tool. :ref:`NXapm_paraprobe_distancer_config` Application definition for a configuration file of the paraprobe-distancer tool. :ref:`NXapm_paraprobe_distancer_results` Application definition for a results file of the paraprobe-distancer tool. :ref:`NXapm_paraprobe_intersector_config` Application definition for a configuration file of the paraprobe-intersector :ref:`NXapm_paraprobe_intersector_results` Application definition for results files of the paraprobe-intersector tool. :ref:`NXapm_paraprobe_nanochem_config` Application definition for a configuration file of the paraprobe-nanochem tool. :ref:`NXapm_paraprobe_nanochem_results` Application definition for a results file of the paraprobe-nanochem tool. :ref:`NXapm_paraprobe_ranger_config` Application definition for a configuration file of the paraprobe-ranger tool. :ref:`NXapm_paraprobe_ranger_results` Application definition for results files of the paraprobe-ranger tool. :ref:`NXapm_paraprobe_selector_config` Application definition for a configuration file of the paraprobe-selector tool. :ref:`NXapm_paraprobe_selector_results` Application definition for a results file of the paraprobe-selector tool. :ref:`NXapm_paraprobe_spatstat_config` Application definition for a configuration file of the paraprobe-spatstat tool. :ref:`NXapm_paraprobe_spatstat_results` Application definition for a results file of the paraprobe-spatstat tool. :ref:`NXapm_paraprobe_surfacer_config` Application definition for a configuration file of the paraprobe-surfacer tool. :ref:`NXapm_paraprobe_surfacer_results` Application definition for a results file of the paraprobe-surfacer tool. :ref:`NXapm_paraprobe_tessellator_config` Application definition for a configuration file of the paraprobe-tessellator tool. :ref:`NXapm_paraprobe_tessellator_results` Application definition for a results file of the paraprobe-tessellator tool. :ref:`NXapm_paraprobe_tool_common` Base class documenting organizational metadata used by all tools of the :ref:`NXapm_paraprobe_tool_config` Application definition for a (configuration) file of a tool from the paraprobe-toolbox. :ref:`NXapm_paraprobe_tool_parameters` Base class documenting parameters for processing used by all tools of the :ref:`NXapm_paraprobe_tool_process` Base class documenting a processing step within a tool of the paraprobe-toolbox. :ref:`NXapm_paraprobe_tool_results` Application definition for storing processing results of a tool from the paraprobe-toolbox. :ref:`NXbeam_splitter` A beam splitter, i.e. a device splitting the light into two or more beams. :ref:`NXcontainer` State of a container holding the sample under investigation. :ref:`NXcsg` Constructive Solid Geometry (CSG) base class. :ref:`NXcxi_ptycho` Application definition for a ptychography experiment, compatible with CXI from version 1.6. :ref:`NXdelocalization` Base class of the configuration and results of a delocalization algorithm. :ref:`NXdispersion` A dispersion denoting a sum of different dispersions. :ref:`NXdispersion_function` This describes a dispersion function for a material or layer :ref:`NXdispersion_repeated_parameter` A repeated parameter for a dispersion function :ref:`NXdispersion_single_parameter` A single parameter for a dispersion function :ref:`NXdispersion_table` A dispersion table denoting energy, dielectric function tabulated values. :ref:`NXdispersive_material` An application definition for describing a dispersive material. :ref:`NXelectrostatic_kicker` definition for a electrostatic kicker. :ref:`NXem_calorimetry` Application definition for minimal example in-situ calorimetry. :ref:`NXisocontour` Base class for describing isocontouring/phase-fields in Euclidean space. :ref:`NXiv_temp` Application definition for temperature-dependent IV curve measurements. :ref:`NXlockin` A base class definition for a lock-in amplifier. :ref:`NXmagnetic_kicker` Base class for a magnetic kicker. :ref:`NXmatch_filter` Base class of a filter to select members of a set based on their identifier. :ref:`NXmicrostructure` Base class to describe a microstructure, its structural aspects, associated descriptors, properties. :ref:`NXmicrostructure_feature` Base class for documenting structuring features of a microstructure. :ref:`NXmicrostructure_ipf` Base class to store an inverse pole figure (IPF) mapping (IPF map). :ref:`NXmicrostructure_kanapy_results` Application definition for the microstructure generator kanapy from ICAMS Bochum. :ref:`NXmicrostructure_mtex_config` Base class to store the configuration when using the MTex/Matlab software. :ref:`NXmicrostructure_odf` Base class to store an orientation distribution function (ODF). :ref:`NXmicrostructure_pf` Base class to store a pole figure (PF) computation. :ref:`NXmicrostructure_score_config` Application definition to configure a simulation with the SCORE model. :ref:`NXmicrostructure_score_results` Application definition for storing results of the SCORE cellular automata model. :ref:`NXmicrostructure_slip_system` Base class for describing a set of crystallographic slip systems. :ref:`NXoptical_fiber` An optical fiber, e.g. glass fiber. :ref:`NXoptical_polarizer` An optical polarizer. :ref:`NXphase_lock_loop` A base class definition for a phase-locked loop (PLL) used in AFM experiments. :ref:`NXquadric` Definition of a quadric surface. :ref:`NXquadrupole_magnet` definition for a quadrupole magnet. :ref:`NXrcs` A base class for the Real Time Control System (RCS). :ref:`NXregion` Geometry and logical description of a region of data in a parent group. When used, it could be a child group to, say, :ref:`NXdetector`. :ref:`NXsensor_scan` Application definition for a generic scan using sensors. :ref:`NXseparator` definition for an electrostatic separator. :ref:`NXsimilarity_grouping` Base class to store results obtained from applying a similarity grouping (clustering) algorithm. :ref:`NXsnsevent` This is a definition for event data from Spallation Neutron Source (SNS) at ORNL. :ref:`NXsnshisto` This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL. :ref:`NXsolenoid_magnet` definition for a solenoid magnet. :ref:`NXsolid_geometry` The head node for constructively defined geometry. :ref:`NXspatial_filter` Base class for a spatial filter for objects within a region-of-interest (ROI). :ref:`NXspin_rotator` definition for a spin rotator. :ref:`NXspm` Scanning Probe Microscopy (SPM) is a branch of microscopy that utilizes a physical probe to scan the surface of :ref:`NXspm_bias_spectroscopy` A base class for bias spectroscopy to describe the change in the physical properties :ref:`NXspm_cantilever` A base class to describe the cantilever used in Atomic Force Microscopy (AFM). :ref:`NXspm_cantilever_config` This file defines the NXspm_cantilever_config base class, which contains configuration :ref:`NXspm_cantilever_oscillator` In generally speaking a cantilever resembles a leaf-spring which can be treated as a :ref:`NXspm_piezo_config` A base class describing piezo actuator settings for scanning probe microscopy. :ref:`NXspm_piezo_sensor` This piezo sensor group refers to the height (or Z) piezo sensor. :ref:`NXspm_piezoelectric_material` Description and properties of the piezoelectric actuator materials. :ref:`NXspm_positioner` An extension of positioner, used to maintain a measurement signal through :ref:`NXspm_scan_control` A scan is performed inside an N-dimensional phase space, where each dimension can correspond not only to real space coordinates (x,y) but also to any other parameter. This class contains detailed information about controlling the scan in such a phase space (or its subspace). :ref:`NXspm_scan_pattern` Basic base class to define the pattern of a scan in a given scan region. :ref:`NXspm_scan_region` The scan region is the area of phase space or sub-phase space where the scan is :ref:`NXspm_temperature_sensor` The :ref:`NXspm_temperature_sensor` class describes a temperature sensor :ref:`NXstm` An application definition to describe Scanning Tunneling Microscopy (STM). :ref:`NXsts` An application definition to describe Scanning Tunneling Spectroscopy (STS). :ref:`NXsubsampling_filter` Base class of a filter to sample members in a set based on their indices. :ref:`NXsubstance` A form of matter with a constant, definite chemical composition. :ref:`NXtransmission` Application definition for transmission experiments :ref:`NXxpcs` X-ray Photon Correlation Spectroscopy (XPCS) data (results). :ref:`NXxrd` NXxrd on top of NXmonopd :ref:`NXxrd_pan` NXxrd_pan is a specialization of NXxrd with extra properties