.. do NOT edit this file automatically generated by dev_tools.docs.nxdl_index .. index:: ! see: class definitions; contributed definition ! contributed definition .. _contributed.definitions: Contributed Definitions ######################### A description of each NeXus contributed definition is given. NXDL files in the NeXus contributed definitions include propositions from the community for NeXus base classes or application definitions, as well as other NXDL files for long-term archival by NeXus. Consider the contributed definitions as either in *incubation* or a special case not for general use. The :ref:`NIAC` is charged to review any new contributed definitions and provide feedback to the authors before ratification and acceptance as either a base class or application definition. Some contributions are grouped together: :ref:`Optical Spectroscopy ` :ref:`Multi-dimensional Photoemission Spectroscopy ` :ref:`Atomprobe Microscopy ` :ref:`Electron Microscopy ` :ref:`Transport Measurements ` :ref:`Geometry and Microstructures ` and others are simply listed here: :ref:`NXaberration` Quantified aberration coefficient in an aberration_model. :ref:`NXaberration_model` Models for aberrations of electro-magnetic lenses in electron microscopy. :ref:`NXaberration_model_ceos` CEOS definitions/model for aberrations of electro-magnetic lenses. :ref:`NXaberration_model_nion` Nion definitions/model for aberrations of electro-magnetic lenses. :ref:`NXactivity` A planned or unplanned action that has a temporal extension and for some time depends on some entity. :ref:`NXactuator` An actuator used to control an external condition. :ref:`NXamplifier` Base classed definition for amplifier devices. :ref:`NXaperture_em` Base class for an individual aperture for beams in electron microscopy. :ref:`NXbeam_device` Properties of generic beam device in an experimental setup. :ref:`NXbeam_path` A beam path consisting of one or more optical elements. :ref:`NXbeam_splitter` A beam splitter, i.e. a device splitting the light into two or more beams. :ref:`NXbeam_transfer_matrix_table` Contains datastructures of an experimental optical setup (i.e., multiple :ref:`NXbias_spectroscopy` Base classes definition for bias spectroscopy. :ref:`NXcalibration` Subclass of NXprocess to describe post-processing calibrations. :ref:`NXchamber` Base class for a chamber in an instrument that stores real or simulated objects. :ref:`NXchemical_composition` (Chemical) composition of a sample or a set of things. :ref:`NXchemical_process` A planned or unplanned process which results in chemical changes (i.e., changes in the chemical bonds) in a specified material. :ref:`NXcircuit` Application definition for circuit devices. :ref:`NXcollectioncolumn` Subclass of NXelectronanalyser to describe the electron collection :ref:`NXcomponent_em` Base class for components used in an electron microscope. :ref:`NXcontainer` State of a container holding the sample under investigation. :ref:`NXcoordinate_system` Base class to detail a coordinate system (CS). :ref:`NXcoordinate_system_set` Base class to hold different coordinate systems and representation conversions. :ref:`NXcorrector_cs` Corrector for aberrations in an electron microscope. :ref:`NXcrystal_structure` Base class to describe the atomic crystal structure of a phase. :ref:`NXcs_computer` Base class for reporting the description of a computer :ref:`NXcs_filter_boolean_mask` Base class for packing and unpacking booleans. :ref:`NXcs_prng` Computer science description of pseudo-random number generator. :ref:`NXcs_profiling` Computer science description for performance and profiling data of an application. :ref:`NXcs_profiling_event` Computer science description of a profiling event. :ref:`NXcsg` Constructive Solid Geometry base class, using :ref:`NXquadric` and :ref:`NXoff_geometry` :ref:`NXcxi_ptycho` Application definition for a ptychography experiment, compatible with CXI from version 1.6. :ref:`NXdata_mpes` :ref:`NXdata_mpes` describes the plottable data and related dimension scales in photoemission :ref:`NXdata_mpes_detector` :ref:`NXdata_mpes_detector` describes the plottable data and related :ref:`NXdeflector` Deflectors as they are used e.g. in an electron analyser. :ref:`NXdelocalization` Base class of the configuration and results of a delocalization algorithm. :ref:`NXdispersion` A dispersion denoting a sum of different dispersions. :ref:`NXdispersion_function` This describes a dispersion function for a material or layer :ref:`NXdispersion_repeated_parameter` A repeated parameter for a dispersion function :ref:`NXdispersion_single_parameter` A single parameter for a dispersion function :ref:`NXdispersion_table` A dispersion table denoting energy, dielectric function tabulated values. :ref:`NXdispersive_material` NXdispersion :ref:`NXdistortion` Subclass of NXprocess to describe post-processing distortion correction. :ref:`NXebeam_column` Base class for a set of components providing a controllable electron beam. :ref:`NXelectron_level` Electronic level probed in X-ray spectroscopy or resonance experiments. :ref:`NXelectronanalyser` Basic class for describing a electron analyzer. :ref:`NXelectrostatic_kicker` definition for a electrostatic kicker. :ref:`NXellipsometry` This is the application definition describing ellipsometry experiments. :ref:`NXem` Application definition for normalized representation of electron microscopy research. :ref:`NXem_adf` Base class method-specific for annular dark field imaging. :ref:`NXem_conventions` Conventions for rotations and coordinate systems to interpret crystal orientation :ref:`NXem_conventions_ebsd` Base class for method-specific conventions EBSD. :ref:`NXem_correlation` Base class to combine different method-specific data in electron microscopy. :ref:`NXem_ebsd` Base class method-specific for Electron Backscatter Diffraction (EBSD). :ref:`NXem_eds` Base class method-specific for energy-dispersive X-ray spectroscopy (EDS/EDXS). :ref:`NXem_eels` Base class method-specific for Electron Energy Loss Spectroscopy (EELS). :ref:`NXem_img` Base class for method-specific generic imaging. :ref:`NXem_method` Base class to describe specific analysis methods in electron microscopy. :ref:`NXem_msr` Base class for collecting a session with a real electron microscope. :ref:`NXem_sim` Base class for simulating electron microscopy relevant beam-matter interaction. :ref:`NXenergydispersion` Subclass of NXelectronanalyser to describe the energy dispersion section of a :ref:`NXevent_data_apm` Base class to store state and (meta)data of events over the course of an atom probe experiment. :ref:`NXevent_data_apm_set` Base class for a set of :ref:`NXevent_data_apm` instances. :ref:`NXevent_data_em` Base class to store state and (meta)data of events with an electron microscopy. :ref:`NXevent_data_em_set` Base class for a set of :ref:`NXevent_data_em` instances. :ref:`NXfabrication` Details about a component as it is defined by its manufacturer. :ref:`NXfiber` An optical fiber, e.g. glass fiber. :ref:`NXgraph_edge_set` A set of (eventually directed) edges which connect nodes of a graph. :ref:`NXgraph_node_set` A set of nodes representing members of a graph. :ref:`NXgraph_root` An instance of a graph. :ref:`NXhistory` A set of activities that occurred to a physical entity prior/during experiment. :ref:`NXibeam_column` Base class for a set of components equipping an instrument with FIB capabilities. :ref:`NXidentifier` An identifier for a (persistent) resource, e.g., a DOI or orcid. :ref:`NXimage_c_set` Specialized base class container for reporting a set of images in reciprocal space. :ref:`NXimage_r_set` Specialized base class container for reporting a set of images in real space. :ref:`NXimage_r_set_diff` Base class specialized for reporting a cuboidal stack of diffraction pattern. :ref:`NXimage_set` Base class for reporting a set of images. :ref:`NXinteraction_vol_em` Base class for describing the interaction volume of particle-matter interaction. :ref:`NXion` Base class for documenting the set of atoms of a (molecular) ion. :ref:`NXisocontour` Base class for describing isocontouring/phase-fields in Euclidean space. :ref:`NXiv_bias` Application definition for bias devices. :ref:`NXiv_temp` Application definition for temperature-dependent IV curve measurements. :ref:`NXlab_electro_chemo_mechanical_preparation` Grinding and polishing of a sample using abrasives in a wet lab. :ref:`NXlab_sample_mounting` Embedding of a sample in a medium for easing processability. :ref:`NXlens_em` Base class for an electro-magnetic lens or a compound lens. :ref:`NXlens_opt` Description of an optical lens. :ref:`NXlockin` Base classes definition for lock in devices. :ref:`NXmagnetic_kicker` definition for a magnetic kicker. :ref:`NXmanipulator` Extension of NXpositioner to include fields to describe the use of manipulators :ref:`NXmatch_filter` Base class of a filter to select members of a set based on their identifier. :ref:`NXmpes` This is the most general application definition for :ref:`NXmpes_arpes` This is an general application definition for angle-resolved multidimensional :ref:`NXopt_window` A window of a cryostat, heater, vacuum chamber or a simple glass slide. :ref:`NXoptical_spectroscopy` A general application definition of optical spectroscopy elements, which may :ref:`NXoptical_system_em` A container for qualifying an electron optical system. :ref:`NXpeak` Base class for spectral peaks, their functional form, and support (values). :ref:`NXphysical_process` A planned or unplanned process which results in physical changes in a specified material. :ref:`NXpid` Contains the settings of a PID controller. :ref:`NXpolarizer_opt` An optical polarizer. :ref:`NXpositioner_sts` A generic positioner such as a motor or piezo-electric transducer. :ref:`NXprocess_mpes` :ref:`NXprocess_mpes` describes events of data processing, reconstruction, :ref:`NXprogram` Base class to describe a software tool or library. :ref:`NXpulser_apm` Base class for a laser- and/or voltage-pulsing device used in atom probe :ref:`NXpump` Device to reduce an atmosphere (real or simulated) to a controlled pressure. :ref:`NXquadric` definition of a quadric surface. :ref:`NXquadrupole_magnet` definition for a quadrupole magnet. :ref:`NXraman` An application definition for Raman spectrocopy experiments. :ref:`NXreflectron` Base class for a device which reduces ToF differences of ions in ToF experiments. :ref:`NXregion` Geometry and logical description of a region of data in a parent group. When used, it could be a child group to, say, :ref:`NXdetector`. :ref:`NXregistration` Describes image registration procedures. :ref:`NXresolution` Describes the resolution of a physical quantity. :ref:`NXroi` Base class to describe a region-of-interest analyzed. :ref:`NXrotation_set` Base class to detail a set of rotations, orientations, and disorientations. :ref:`NXsample_component_set` Set of sample components and their configuration. :ref:`NXscanbox_em` Scan box and coils which deflect a beam of charged particles in a controlled manner. :ref:`NXsensor_scan` Application definition for a generic scan using sensors. :ref:`NXsensor_sts` A sensor used to monitor an external condition :ref:`NXseparator` definition for an electrostatic separator. :ref:`NXserialized` Metadata to a set of pieces of information of a resource that has been serialized. :ref:`NXsimilarity_grouping` Base class to store results obtained from applying a similarity grouping (clustering) algorithm. :ref:`NXsingle_crystal` Description of a single crystal material or a single crystalline phase in a material. :ref:`NXslip_system_set` Base class for describing a set of crystallographic slip systems. :ref:`NXsnsevent` This is a definition for event data from Spallation Neutron Source (SNS) at ORNL. :ref:`NXsnshisto` This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL. :ref:`NXsolenoid_magnet` definition for a solenoid magnet. :ref:`NXsolid_geometry` the head node for constructively defined geometry :ref:`NXspatial_filter` Base class for a spatial filter for objects within a region-of-interest (ROI). :ref:`NXspectrum_set` Base class container for reporting a set of spectra. :ref:`NXspin_rotator` definition for a spin rotator. :ref:`NXspindispersion` Subclass of NXelectronanalyser to describe the spin filters in photoemission :ref:`NXstage_lab` Base class for a stage (lab) used to hold, orient, and prepare a specimen. :ref:`NXsts` Application definition for temperature-dependent IV curve measurements :ref:`NXsubsampling_filter` Base class of a filter to sample members in a set based on their identifier. :ref:`NXsubstance` A form of matter with a constant, definite chemical composition. :ref:`NXtransmission` Application definition for transmission experiments :ref:`NXunit_cell` Description of a unit cell, i.e., the crystal structure of a single :ref:`NXwaveplate` A waveplate or retarder. :ref:`NXxpcs` X-ray Photon Correlation Spectroscopy (XPCS) data (results). :ref:`NXxps` This is the application definition for X-ray photoelectron spectroscopy. :ref:`NXxrd` NXxrd on top of NXmonopd :ref:`NXxrd_pan` NXxrd_pan is a specialisation of NXxrd with exptra properties .. toctree:: :hidden: em-structure ellipsometry-structure mpes-structure apm-structure transport-structure sts-structure cgms-structure icme-structure sample-prep-structure NXaberration NXaberration_model NXaberration_model_ceos NXaberration_model_nion NXactivity NXactuator NXamplifier NXaperture_em NXapm NXapm_charge_state_analysis NXapm_compositionspace_config NXapm_compositionspace_results NXapm_hit_finding NXapm_msr NXapm_paraprobe_clusterer_config NXapm_paraprobe_clusterer_results NXapm_paraprobe_distancer_config NXapm_paraprobe_distancer_results NXapm_paraprobe_intersector_config NXapm_paraprobe_intersector_results NXapm_paraprobe_nanochem_config NXapm_paraprobe_nanochem_results NXapm_paraprobe_ranger_config NXapm_paraprobe_ranger_results NXapm_paraprobe_selector_config NXapm_paraprobe_selector_results NXapm_paraprobe_spatstat_config NXapm_paraprobe_spatstat_results NXapm_paraprobe_surfacer_config NXapm_paraprobe_surfacer_results NXapm_paraprobe_tessellator_config NXapm_paraprobe_tessellator_results NXapm_paraprobe_tool_common NXapm_paraprobe_tool_config NXapm_paraprobe_tool_results NXapm_paraprobe_transcoder_config NXapm_paraprobe_transcoder_results NXapm_ranging NXapm_reconstruction NXapm_sim NXapm_volt_and_bowl NXbeam_device NXbeam_path NXbeam_splitter NXbeam_transfer_matrix_table NXbias_spectroscopy NXcalibration NXcg_alpha_complex NXcg_cylinder_set NXcg_ellipsoid_set NXcg_face_list_data_structure NXcg_geodesic_mesh NXcg_grid NXcg_half_edge_data_structure NXcg_hexahedron_set NXcg_marching_cubes NXcg_parallelogram_set NXcg_point_set NXcg_polygon_set NXcg_polyhedron_set NXcg_polyline_set NXcg_primitive_set NXcg_roi_set NXcg_sphere_set NXcg_tetrahedron_set NXcg_triangle_set NXcg_triangulated_surface_mesh NXcg_unit_normal_set NXchamber NXchemical_composition NXchemical_process NXcircuit NXcollectioncolumn NXcomponent_em NXcontainer NXcoordinate_system NXcoordinate_system_set NXcorrector_cs NXcrystal_structure NXcs_computer NXcs_filter_boolean_mask NXcs_prng NXcs_profiling NXcs_profiling_event NXcsg NXcxi_ptycho NXdata_mpes NXdata_mpes_detector NXdeflector NXdelocalization NXdispersion NXdispersion_function NXdispersion_repeated_parameter NXdispersion_single_parameter NXdispersion_table NXdispersive_material NXdistortion NXebeam_column NXelectron_level NXelectronanalyser NXelectrostatic_kicker NXellipsometry NXem NXem_adf NXem_conventions NXem_conventions_ebsd NXem_correlation NXem_ebsd NXem_eds NXem_eels NXem_img NXem_method NXem_msr NXem_sim NXenergydispersion NXevent_data_apm NXevent_data_apm_set NXevent_data_em NXevent_data_em_set NXfabrication NXfiber NXgraph_edge_set NXgraph_node_set NXgraph_root NXhistory NXibeam_column NXidentifier NXimage_c_set NXimage_r_set NXimage_r_set_diff NXimage_set NXinteraction_vol_em NXion NXisocontour NXiv_bias NXiv_temp NXlab_electro_chemo_mechanical_preparation NXlab_sample_mounting NXlens_em NXlens_opt NXlockin NXmagnetic_kicker NXmanipulator NXmatch_filter NXmpes NXmpes_arpes NXms NXms_feature_set NXms_ipf NXms_ipf_set NXms_mtex_config NXms_odf NXms_odf_set NXms_pf NXms_pf_set NXms_recon NXms_score_config NXms_score_results NXms_snapshot NXms_snapshot_set NXopt_window NXoptical_spectroscopy NXoptical_system_em NXpeak NXphysical_process NXpid NXpolarizer_opt NXpositioner_sts NXprocess_mpes NXprogram NXpulser_apm NXpump NXquadric NXquadrupole_magnet NXraman NXreflectron NXregion NXregistration NXresolution NXroi NXrotation_set NXsample_component_set NXscanbox_em NXsensor_scan NXsensor_sts NXseparator NXserialized NXsimilarity_grouping NXsingle_crystal NXslip_system_set NXsnsevent NXsnshisto NXsolenoid_magnet NXsolid_geometry NXspatial_filter NXspectrum_set NXspin_rotator NXspindispersion NXstage_lab NXsts NXsubsampling_filter NXsubstance NXtransmission NXunit_cell NXwaveplate NXxpcs NXxps NXxrd NXxrd_pan