.. auto-generated by dev_tools.docs.nxdl from the NXDL source base_classes/NXebeam_column.nxdl.xml -- DO NOT EDIT .. index:: ! NXebeam_column (base class) ! ebeam_column (base class) see: ebeam_column (base class); NXebeam_column .. _NXebeam_column: ============== NXebeam_column ============== **Status**: base class, extends :ref:`NXcomponent` **Description**: .. collapse:: Base class for a set of components providing a controllable electron beam. ... Base class for a set of components providing a controllable electron beam. The idea behind defining :ref:`NXebeam_column` as an own base class vs. adding these concepts in :ref:`NXem_instrument` is that the electron beam generating component might be worthwhile to use also in other types of experiments. **Symbols**: No symbol table **Groups cited**: :ref:`NXactuator`, :ref:`NXaperture`, :ref:`NXbeam`, :ref:`NXcomponent`, :ref:`NXcorrector_cs`, :ref:`NXdeflector`, :ref:`NXelectromagnetic_lens`, :ref:`NXfabrication`, :ref:`NXmonochromator`, :ref:`NXscan_controller`, :ref:`NXsensor`, :ref:`NXsource` .. index:: NXsource (base class); used in base class, NXelectromagnetic_lens (base class); used in base class, NXaperture (base class); used in base class, NXdeflector (base class); used in base class, NXmonochromator (base class); used in base class, NXfabrication (base class); used in base class, NXcorrector_cs (base class); used in base class, NXcomponent (base class); used in base class, NXsensor (base class); used in base class, NXactuator (base class); used in base class, NXbeam (base class); used in base class, NXscan_controller (base class); used in base class **Structure**: .. _/NXebeam_column/operation_mode-field: .. index:: operation_mode (field) **operation_mode**: (optional) :ref:`NX_CHAR ` .. collapse:: Tech-partner, microscope-, and control-software-specific name of the ... Tech-partner, microscope-, and control-software-specific name of the specific operation mode how the ebeam_column and its components are controlled to achieve specific illumination conditions. In many cases the users of an instrument do not or can not be expected to know all intricate spatiotemporal dynamics of their hardware. Instead, they rely on assumptions that the instrument, its control software, and components work as expected to focus on their research questions. For these cases, having a place for documenting the operation_mode is useful in as much as at least some constraints on how the illumination conditions were is documented. .. _/NXebeam_column/electron_source-group: **electron_source**: (optional) :ref:`NXsource` .. collapse:: A physical part of an electron or ion microscope from which ... A physical part of an electron or ion microscope from which the particles that form the beam are emitted. The hardware for an electron source in an electron microscope may contain several components which affect the beam path. This concept is related to term `Source`_ of the EMglossary standard. .. _Source: https://purls.helmholtz-metadaten.de/emg/EMG_00000045 .. _/NXebeam_column/electron_source/voltage-field: .. index:: voltage (field) **voltage**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_VOLTAGE `} .. collapse:: The potential difference between anode and cathode. ... The potential difference between anode and cathode. This concept is related to term `Acceleration Voltage`_ of the EMglossary standard. .. _Acceleration Voltage: https://purls.helmholtz-metadaten.de/emg/EMG_00000004 .. _/NXebeam_column/electron_source/extraction_voltage-field: .. index:: extraction_voltage (field) **extraction_voltage**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_VOLTAGE `} .. collapse:: Voltage which is used to create an electric field that draws particles from ... Voltage which is used to create an electric field that draws particles from the source. This concept is related to term `Extraction Voltage`_ of the EMglossary standard. .. _Extraction Voltage: https://purls.helmholtz-metadaten.de/emg/EMG_00000025 .. _/NXebeam_column/electron_source/emission_current-field: .. index:: emission_current (field) **emission_current**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_CURRENT `} .. collapse:: Electrical current which is released from the source. ... Electrical current which is released from the source. This concept is related to term `Emission Current`_ of the EMglossary standard. .. _Emission Current: https://purls.helmholtz-metadaten.de/emg/EMG_00000025 .. _/NXebeam_column/electron_source/filament_current-field: .. index:: filament_current (field) **filament_current**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_CURRENT `} .. collapse:: Electrical current which flows through the source. ... Electrical current which flows through the source. This concept is related to term `Filament Current`_ of the EMglossary standard. .. _Filament Current: https://purls.helmholtz-metadaten.de/emg/EMG_00000027 .. _/NXebeam_column/electron_source/probe-field: .. index:: probe (field) **probe**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: Type of radiation. ... Type of radiation. Obligatory value: ``electron`` .. _/NXebeam_column/electron_source/emitter_type-field: .. index:: emitter_type (field) **emitter_type**: (optional) :ref:`NX_CHAR ` .. collapse:: Emitter type used to create the beam. ... Emitter type used to create the beam. If the emitter type is other, give further details in the description field. .. _/NXebeam_column/electron_source/emitter_material-field: .. index:: emitter_material (field) **emitter_material**: (optional) :ref:`NX_CHAR ` Material of which the emitter is build, e.g. the filament material. .. _/NXebeam_column/electron_source/lifetime-field: .. index:: lifetime (field) **lifetime**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_TIME `} How long has the source been in operation. .. _/NXebeam_column/ELECTROMAGNETIC_LENS-group: :bolditalic:`ELECTROMAGNETIC_LENS`: (optional) :ref:`NXelectromagnetic_lens` .. _/NXebeam_column/APERTURE-group: :bolditalic:`APERTURE`: (optional) :ref:`NXaperture` .. _/NXebeam_column/DEFLECTOR-group: :bolditalic:`DEFLECTOR`: (optional) :ref:`NXdeflector` .. _/NXebeam_column/blankerID-group: **blanker**\ :bolditalic:`ID`: (optional) :ref:`NXdeflector` .. collapse:: A component for blanking the beam or generating pulsed electron beams. ... A component for blanking the beam or generating pulsed electron beams. See e.g . `I. G. C. Weppelman et al. `_ or `Y. Liao `_ for details. .. _/NXebeam_column/MONOCHROMATOR-group: :bolditalic:`MONOCHROMATOR`: (optional) :ref:`NXmonochromator` .. collapse:: Device to improve energy resolution or chromatic aberration. ... Device to improve energy resolution or chromatic aberration. Examples are Wien, $\textalpha$-, or $\Omega$- energy filter or `cc corrector like `_ .. _/NXebeam_column/MONOCHROMATOR/type-field: .. index:: type (field) **type**: (optional) :ref:`NX_CHAR ` .. collapse:: Qualitative type of the component. ... Qualitative type of the component. Any of these values: * ``wien`` * ``alfa`` * ``omega`` * ``castaing_henry`` * ``gatan_imaging`` * ``sector_analyzer`` .. _/NXebeam_column/MONOCHROMATOR/applied-field: .. index:: applied (field) **applied**: (optional) :ref:`NX_BOOLEAN ` :ref:`⤆ ` Was the corrector used? .. _/NXebeam_column/MONOCHROMATOR/dispersion-field: .. index:: dispersion (field) **dispersion**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} Energy dispersion in e.g. µm/eV. .. _/NXebeam_column/MONOCHROMATOR/voltage-field: .. index:: voltage (field) **voltage**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_VOLTAGE `} Corresponding voltage for that energy dispersion. .. _/NXebeam_column/MONOCHROMATOR/FABRICATION-group: :bolditalic:`FABRICATION`: (optional) :ref:`NXfabrication` :ref:`⤆ ` .. _/NXebeam_column/CORRECTOR_CS-group: :bolditalic:`CORRECTOR_CS`: (optional) :ref:`NXcorrector_cs` .. _/NXebeam_column/corrector_ax-group: **corrector_ax**: (optional) :ref:`NXcomponent` .. collapse:: Component that reshapes an ellipse-shaped electron beam into a circular one. ... Component that reshapes an ellipse-shaped electron beam into a circular one. * `L. Reimer 1998, Springer, 1998 `_ * `M. Tanaka et al., Electron Microscopy Glossary, 2024 `_ Stigmator is an exact synonym. .. _/NXebeam_column/corrector_ax/value_x-field: .. index:: value_x (field) **value_x**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} .. collapse:: Descriptor for the correction strength along the first direction when exact ... Descriptor for the correction strength along the first direction when exact technical details are unknown or not directly controllable as the control software of the microscope does not enable or was not configured to display these values for users. .. _/NXebeam_column/corrector_ax/value_y-field: .. index:: value_y (field) **value_y**: (optional) :ref:`NX_NUMBER ` {units=\ :ref:`NX_ANY `} .. collapse:: Descriptor for the correction strength along the second direction when exact ... Descriptor for the correction strength along the second direction when exact technical details are unknown or not directly controllable as the control software of the microscope does not enable or was not configured to display these values for users. .. _/NXebeam_column/biprismID-group: **biprism**\ :bolditalic:`ID`: (optional) :ref:`NXcomponent` Electron biprism as it is used e.g. for electron holography. .. _/NXebeam_column/phaseplateID-group: **phaseplate**\ :bolditalic:`ID`: (optional) :ref:`NXcomponent` .. collapse:: Device that causes a change in the phase of an electron wave. ... Device that causes a change in the phase of an electron wave. * `M. Malac et al. `_ * `R. R. Schröder et al. `_ .. _/NXebeam_column/phaseplateID/type-field: .. index:: type (field) **type**: (optional) :ref:`NX_CHAR ` .. collapse:: Qualitative type ... Qualitative type Any of these values or a custom value (if you use a custom value, also set @custom=True): ``thin_film`` | ``electrostatic`` .. _/NXebeam_column/SENSOR-group: :bolditalic:`SENSOR`: (optional) :ref:`NXsensor` .. _/NXebeam_column/ACTUATOR-group: :bolditalic:`ACTUATOR`: (optional) :ref:`NXactuator` .. _/NXebeam_column/BEAM-group: :bolditalic:`BEAM`: (optional) :ref:`NXbeam` .. collapse:: Individual characterization results for the position, shape, ... Individual characterization results for the position, shape, and characteristics of the electron beam at a given location. :ref:`NXtransformations` should be used to specify the location or the position at which details about the beam were probed. This concept is related to term `Electron Beam`_ of the EMglossary standard. .. _Electron Beam: https://purls.helmholtz-metadaten.de/emg/EMG_00000021 .. _/NXebeam_column/COMPONENT-group: :bolditalic:`COMPONENT`: (optional) :ref:`NXcomponent` .. _/NXebeam_column/scan_controller-group: **scan_controller**: (optional) :ref:`NXscan_controller` Hypertext Anchors ----------------- List of hypertext anchors for all groups, fields, attributes, and links defined in this class. * :ref:`/NXebeam_column/ACTUATOR-group ` * :ref:`/NXebeam_column/APERTURE-group ` * :ref:`/NXebeam_column/BEAM-group ` * :ref:`/NXebeam_column/biprismID-group ` * :ref:`/NXebeam_column/blankerID-group ` * :ref:`/NXebeam_column/COMPONENT-group ` * :ref:`/NXebeam_column/corrector_ax-group ` * :ref:`/NXebeam_column/corrector_ax/value_x-field ` * :ref:`/NXebeam_column/corrector_ax/value_y-field ` * :ref:`/NXebeam_column/CORRECTOR_CS-group ` * :ref:`/NXebeam_column/DEFLECTOR-group ` * :ref:`/NXebeam_column/ELECTROMAGNETIC_LENS-group ` * :ref:`/NXebeam_column/electron_source-group ` * :ref:`/NXebeam_column/electron_source/emission_current-field ` * :ref:`/NXebeam_column/electron_source/emitter_material-field ` * :ref:`/NXebeam_column/electron_source/emitter_type-field ` * :ref:`/NXebeam_column/electron_source/extraction_voltage-field ` * :ref:`/NXebeam_column/electron_source/filament_current-field ` * :ref:`/NXebeam_column/electron_source/lifetime-field ` * :ref:`/NXebeam_column/electron_source/probe-field ` * :ref:`/NXebeam_column/electron_source/voltage-field ` * :ref:`/NXebeam_column/MONOCHROMATOR-group ` * :ref:`/NXebeam_column/MONOCHROMATOR/applied-field ` * :ref:`/NXebeam_column/MONOCHROMATOR/dispersion-field ` * :ref:`/NXebeam_column/MONOCHROMATOR/FABRICATION-group ` * :ref:`/NXebeam_column/MONOCHROMATOR/type-field ` * :ref:`/NXebeam_column/MONOCHROMATOR/voltage-field ` * :ref:`/NXebeam_column/operation_mode-field ` * :ref:`/NXebeam_column/phaseplateID-group ` * :ref:`/NXebeam_column/phaseplateID/type-field ` * :ref:`/NXebeam_column/scan_controller-group ` * :ref:`/NXebeam_column/SENSOR-group ` **NXDL Source**: https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/base_classes/NXebeam_column.nxdl.xml