.. auto-generated by dev_tools.docs.nxdl from the NXDL source contributed_definitions/NXstm.nxdl.xml -- DO NOT EDIT .. index:: ! NXstm (application definition) ! stm (application definition) see: stm (application definition); NXstm .. _NXstm: ===== NXstm ===== **Status**: *application definition* (contribution), extends :ref:`NXspm` **Description**: An application definition to describe Scanning Tunneling Microscopy (STM). **Symbols**: No symbol table **Groups cited**: :ref:`NXcollection`, :ref:`NXentry`, :ref:`NXenvironment`, :ref:`NXinstrument`, :ref:`NXlockin`, :ref:`NXsensor`, :ref:`NXspm_scan_control` .. index:: NXentry (base class); used in application definition, NXinstrument (base class); used in application definition, NXlockin (base class); used in application definition, NXenvironment (base class); used in application definition, NXspm_scan_control (base class); used in application definition, NXsensor (base class); used in application definition, NXcollection (base class); used in application definition **Structure**: .. _/NXstm/ENTRY-group: :bolditalic:`ENTRY`: (required) :ref:`NXentry` :ref:`⤆ ` .. _/NXstm/ENTRY/definition-field: .. index:: definition (field) **definition**: (required) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: Name of the definition that is used for the STM technique. ... Name of the definition that is used for the STM technique. Obligatory value: ``NXstm`` .. _/NXstm/ENTRY/scan_mode-field: .. index:: scan_mode (field) **scan_mode**: (required) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: The mode of the scan that is performed. Two commonly used modes are constan ... The mode of the scan that is performed. Two commonly used modes are constant height mode and constant current mode. Any of these values: ``constant height`` | ``constant current`` .. _/NXstm/ENTRY/experiment_technique-field: .. index:: experiment_technique (field) **experiment_technique**: (required) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: The specific to STM experiment. ... The specific to STM experiment. Obligatory value: ``STM`` .. _/NXstm/ENTRY/INSTRUMENT-group: :bolditalic:`INSTRUMENT`: (required) :ref:`NXinstrument` :ref:`⤆ ` .. _/NXstm/ENTRY/INSTRUMENT/lockin_amplifier-group: **lockin_amplifier**: (required) :ref:`NXlockin` :ref:`⤆ ` .. collapse:: The lock-in amplifier information. The device is being used to extract ... The lock-in amplifier information. The device is being used to extract the very weak signal buried in noisy signals. .. _/NXstm/ENTRY/INSTRUMENT/lockin_amplifier/modulation_signal-field: .. index:: modulation_signal (field) **modulation_signal**: (recommended) :ref:`NX_CHAR ` {units=\ :ref:`NX_UNITLESS `} :ref:`⤆ ` The type of the signal (voltage or current) subject to modulation. .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT-group: :bolditalic:`SCAN_ENVIRONMENT`: (required) :ref:`NXenvironment` :ref:`⤆ ` .. collapse:: The environment information for stm or sts experiment. ... The environment information for stm or sts experiment. Note: At least one field from head_temperature, cryo_bottom_temperature and cryo_shield_temperature must be provided. .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/lockin_status-field: .. index:: lockin_status (field) **lockin_status**: (recommended) :ref:`NX_BOOLEAN ` .. collapse:: The status of the lock-in amplifier. It is well established convention t ... The status of the lock-in amplifier. It is well established convention that for topographic measurements lockin amplifier is turned off state while current scan lockin amplifier is turned on. .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL-group: :bolditalic:`SPM_SCAN_CONTROL`: (required) :ref:`NXspm_scan_control` :ref:`⤆ ` .. collapse:: The scan control information like scan region or phase space, e.g. patte ... The scan control information like scan region or phase space, e.g. pattern of scan (e.g. mesh), scanner speed, etc. .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/head_temperature_sensor-group: **head_temperature_sensor**: (optional) :ref:`NXsensor` :ref:`⤆ ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/head_temperature_sensor .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_bottom_temperature_sensor-group: **cryo_bottom_temperature_sensor**: (optional) :ref:`NXsensor` :ref:`⤆ ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/cryo_bottom_temperature_sensor .. _/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_shield_temperature_sensor-group: **cryo_shield_temperature_sensor**: (optional) :ref:`NXsensor` :ref:`⤆ ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/cryo_shield_temperature_sensor .. _/NXstm/ENTRY/INSTRUMENT/bias_spectroscopy_environment-group: **bias_spectroscopy_environment**: (optional) :ref:`NXenvironment` :ref:`⤆ ` .. collapse:: To explain bias and current behavior (sweep measurement) due to voltage ... To explain bias and current behavior (sweep measurement) due to voltage applied to the sample. .. _/NXstm/ENTRY/reproducibility_indicators-group: **reproducibility_indicators**: (optional) :ref:`NXcollection` :ref:`⤆ ` .. collapse:: The group's concepts hold the link to the related concepts that define the ... The group's concepts hold the link to the related concepts that define the reproducibility of the STM experiment. .. _/NXstm/ENTRY/reproducibility_indicators/current-field: .. index:: current (field) **current**: (optional) :ref:`NX_NUMBER ` .. collapse:: The tunneling current between tip and sample after application of bias vol ... The tunneling current between tip and sample after application of bias voltage. This should be a link to /entry/instrument/current_sensor/current .. _/NXstm/ENTRY/reproducibility_indicators/current_offset-field: .. index:: current_offset (field) **current_offset**: (optional) :ref:`NX_NUMBER ` .. collapse:: The offset in tunneling current between tip and sample after application o ... The offset in tunneling current between tip and sample after application of bias voltage. This should be a link to /entry/instrument/current_sensor/current_offset .. _/NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field: .. index:: modulation_signal_type (field) **modulation_signal_type**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: This is the signal on which the modulation voltage or current will be adde ... This is the signal on which the modulation voltage or current will be added. This should be a link to /entry/instrument/phase_lock_loop/modulation_signal .. _/NXstm/ENTRY/reproducibility_indicators/reference_frequency-field: .. index:: reference_frequency (field) **reference_frequency**: (optional) :ref:`NX_NUMBER ` .. collapse:: The frequency of the sine modulation that is used as a carrier signal of i ... The frequency of the sine modulation that is used as a carrier signal of input signal in lock-in. This should be a link to /entry/instrument/lockin_amplifier/reference_frequency .. _/NXstm/ENTRY/reproducibility_indicators/BIAS_SWEEP-group: **BIAS_SWEEP**: (optional) :ref:`NXspm_scan_control` .. collapse:: Bias sweep measurement in bias spectroscopy. ... Bias sweep measurement in bias spectroscopy. This should be a link to /entry/instrument/bias_spectroscopy_environment/bias_spectroscopy/bias_sweep .. _/NXstm/ENTRY/resolution_indicators-group: **resolution_indicators**: (optional) :ref:`NXcollection` :ref:`⤆ ` .. collapse:: The group's concepts hold the link to the related concepts that define the ... The group's concepts hold the link to the related concepts that define the resolution of the STM experiment. .. _/NXstm/ENTRY/resolution_indicators/head_temperature-field: .. index:: head_temperature (field) **head_temperature**: (optional) :ref:`NX_NUMBER ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/scan_environment/head_temperature .. _/NXstm/ENTRY/resolution_indicators/cryo_bottom_temperature-field: .. index:: cryo_bottom_temperature (field) **cryo_bottom_temperature**: (optional) :ref:`NX_NUMBER ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/scan_environment/cryo_bottom_temperature .. _/NXstm/ENTRY/resolution_indicators/cryo_shield_temperature-field: .. index:: cryo_shield_temperature (field) **cryo_shield_temperature**: (optional) :ref:`NX_NUMBER ` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/scan_environment/cryo_shield_temperature .. _/NXstm/ENTRY/resolution_indicators/modulation_signal_type-field: .. index:: modulation_signal_type (field) **modulation_signal_type**: (optional) :ref:`NX_CHAR ` :ref:`⤆ ` .. collapse:: This is the signal on which the modulation voltage or current will be adde ... This is the signal on which the modulation voltage or current will be added. This should be a link to /entry/instrument/lockin_amplifier/modulation_signal_type .. _/NXstm/ENTRY/resolution_indicators/reference_frequency-field: .. index:: reference_frequency (field) **reference_frequency**: (optional) :ref:`NX_NUMBER ` .. collapse:: The frequency of the sine modulation that is used to modulate the signal i ... The frequency of the sine modulation that is used to modulate the signal in lock-in. This should be a link to /entry/instrument/lockin_amplifier/reference_frequency .. _/NXstm/ENTRY/resolution_indicators/BIAS_SWEEP-group: :bolditalic:`BIAS_SWEEP`: (optional) :ref:`NXspm_scan_control` .. collapse:: This should be a link to ... This should be a link to /entry/instrument/bias_spectroscopy_environment/bias_spectroscopy/bias_sweep Hypertext Anchors ----------------- List of hypertext anchors for all groups, fields, attributes, and links defined in this class. * :ref:`/NXstm/ENTRY-group ` * :ref:`/NXstm/ENTRY/definition-field ` * :ref:`/NXstm/ENTRY/experiment_technique-field ` * :ref:`/NXstm/ENTRY/INSTRUMENT-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/bias_spectroscopy_environment-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/lockin_amplifier-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/lockin_amplifier/modulation_signal-field ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_bottom_temperature_sensor-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_shield_temperature_sensor-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/head_temperature_sensor-group ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/lockin_status-field ` * :ref:`/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL-group ` * :ref:`/NXstm/ENTRY/reproducibility_indicators-group ` * :ref:`/NXstm/ENTRY/reproducibility_indicators/BIAS_SWEEP-group ` * :ref:`/NXstm/ENTRY/reproducibility_indicators/current-field ` * :ref:`/NXstm/ENTRY/reproducibility_indicators/current_offset-field ` * :ref:`/NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field ` * :ref:`/NXstm/ENTRY/reproducibility_indicators/reference_frequency-field ` * :ref:`/NXstm/ENTRY/resolution_indicators-group ` * :ref:`/NXstm/ENTRY/resolution_indicators/BIAS_SWEEP-group ` * :ref:`/NXstm/ENTRY/resolution_indicators/cryo_bottom_temperature-field ` * :ref:`/NXstm/ENTRY/resolution_indicators/cryo_shield_temperature-field ` * :ref:`/NXstm/ENTRY/resolution_indicators/head_temperature-field ` * :ref:`/NXstm/ENTRY/resolution_indicators/modulation_signal_type-field ` * :ref:`/NXstm/ENTRY/resolution_indicators/reference_frequency-field ` * :ref:`/NXstm/ENTRY/scan_mode-field ` **NXDL Source**: https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXstm.nxdl.xml