2.3.3.2.1. Atom Probe Microscopy / Tomography

Introduction

Set of data schemas to describe the acquisition, i.e. measurement side, the extraction of hits from detector raw data, steps to compute mass-to-charge-state ratios from uncorrected time of flight data, the reconstruction, and the ranging i.e., the identification of peaks in the mass-to-charge-state ratio histogram to detect (molecular) ions. The data schemas are also useful for reporting field-ion microscopy experiments.

Application Definition

Measurements as well as computer simulations of atom probe tomography and field-ion microscopy research are standardized with one application definition:

NXapm

A general application definition with many detailed places for leaving metadata and computational steps described which are commonly used when reporting the measurement of atom probe data including also detector hit data, as well as how to proceed with reconstructing atom positions from these data, and how to store details about definitions made which describe how mass-to-charge-state ratio values are mapped to (molecular) iontypes in a process called ranging.