8. Scanning Probe Microscopy

Scientists of the scanning Probe Microscopy community and FAIRmat have worked together to create a bunch of application definitions and related base classes for documenting diverse experiment techniques (STS - Scanning Tunneling Spectroscopy, STM - Scanning Tunneling Microscopy and AFM - Atomic Force Microscopy) in SPM domain.

This is one community under the large umbrella of scanning (probe) microscopy methods. A status report of these efforts will be reported here: Scanning Probe Microscopy.