2.3.3.1.8. NXapm_measurement¶
Status:
base class, extends NXobject
Description:
Base class for collecting a run with a real or a simulated atom probe or field-i ...
Base class for collecting a run with a real or a simulated atom probe or field-ion microscope.
The term run is understood as an exact synonym for session, i.e. the usage of a real or simulated tomograph or microscope for a certain amount of time during which one characterizes a single specimen.
Research workflows for experiments and simulations of atom probe and related field-evaporation evolve continuously and become increasingly connected with other methods used for material characterization specifically electron microscopy. A few examples in this direction are:
The majority of atom probe research is performed using the so-called Local Electrode Atom Probe (LEAP) instruments from AMETEK/Cameca. In addition, several research groups have built their own instruments and shared different aspects of the technical specifications and approaches including how these groups apply data processing e.g.:
to name but a few.
Symbols:
No symbol table
- Groups cited:
Structure:
status: (optional) NX_CHAR
A statement whether the measurement completed successfully, or was aborted. ...
A statement whether the measurement completed successfully, or was aborted.
Any of these values:
success|abortedquality: (optional) NX_CHAR
Statement about the quality of the measurement. ...
Statement about the quality of the measurement.
The value can be extracted from the CAnalysis.CResults.fQuality field of a CamecaRoot ROOT file.
APM_INSTRUMENT: (optional) NXapm_instrument
APM_EVENT_DATA: (optional) NXapm_event_data
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
