2.3.3.1.7. Atom Probe Microscopy / Tomography

Introduction

The NXapm application definition uses base classes that describe the acquisition, i.e., the measurement side, the extraction of hits from detector raw data, processing steps to compute mass-to-charge-state ratios from uncorrected time of flight data, the reconstruction, and the ranging, i.e., identification of peaks in the mass-to-charge-state ratio histogram to detect (molecular) ions. The base classes can be useful to generate data artifacts also for field-ion microscopy experiments.

Base Classes

NXapm_charge_state_analysis

Base class to document the parameters, configuration, and results of a processing for recovering

NXapm_event_data

Base class to store state and (meta)data of events over the course of an atom probe experiment.

NXapm_instrument

Base class for instrument-related details of a real or simulated

NXapm_measurement

Base class for collecting a run with a real or a simulated atom probe or field-ion microscope.

NXapm_ranging

Base class for the configuration and results of ranging definitions.

NXapm_reconstruction

Base class for the configuration and results of a reconstruction algorithm.

NXapm_simulation

Base class for simulation of ion extraction from matter via laser and/or voltage

To see a full list of all base classes which NXapm uses, inspect the Groups cited section the NXapm application definition. Consider also the alignment between the design of the atom-probe- and electron-microscopy-specific definitions that is detailed in Electron Microscopy.