2.3.3.1.2. Parts of instruments¶
Data schemas to describe parts, components, or sets of components for building an instrument.
Base Classes¶
- NXactuator
An actuator used to control an external condition.
- NXaperture
A beamline aperture.
- NXattenuator
A device that reduces the intensity of a beam by attenuation.
- NXbeam_stop
A device that blocks the beam completely, usually to protect a detector.
- NXbending_magnet
A bending magnet
- NXcapillary
A capillary lens to focus the X-ray beam.
- NXcircuit
Base class for documenting circuit devices.
- NXcollectioncolumn
Electron collection column of an electron analyzer.
- NXcollimator
A beamline collimator.
- NXcomponent
Base class for components of an instrument - real ones or simulated ones.
- NXcorrector_cs
Base class for a corrector reducing (spherical) aberrations of an electron optical setup.
- NXcrystal
A crystal monochromator or analyzer.
- NXdeflector
Component of an electron analyzer that deflects the paths of electrons. This includes electrostatic and electromagnetic deflectors.
- NXdetector
A detector, detector bank, or multidetector.
- NXdetector_channel
Description and metadata for a single channel from a multi-channel detector.
- NXdetector_group
Logical grouping of detectors. When used, describes a group of detectors.
- NXdetector_module
Geometry and logical description of a detector module. When used, child group to NXdetector.
- NXdisk_chopper
A device blocking the beam in a temporal periodic pattern.
- NXebeam_column
Base class for a set of components providing a controllable electron beam.
- NXelectromagnetic_lens
Base class for an electro-magnetic lens or a compound lens.
- NXelectron_detector
A subclass of NXdetector for detectors that detect electrons.
- NXelectronanalyzer
Basic class for describing an electron analyzer.
- NXem_instrument
Base class for instrument-related details of a real or simulated electron microscope.
- NXem_optical_system
Base class for qualifying an electron optical system.
- NXenergydispersion
Energy dispersion section of an electron analyzer.
- NXfabrication
Details about a component as it is defined by its manufacturer.
- NXfermi_chopper
A Fermi chopper, possibly with curved slits.
- NXfilter
For band pass beam filters.
- NXflipper
A spin flipper.
- NXfresnel_zone_plate
A fresnel zone plate
- NXgrating
A diffraction grating, as could be used in a soft X-ray monochromator
- NXguide
A neutron optical element to direct the path of the beam.
- NXibeam_column
Base class for a set of components equipping an instrument with FIB capabilities.
- NXinsertion_device
An insertion device, as used in a synchrotron light source.
- NXinstrument
Collection of the components of the instrument or beamline.
- NXmanipulator
Base class to describe the use of manipulators and sample stages.
- NXmirror
A beamline mirror or supermirror.
- NXmoderator
A neutron moderator
- NXmonitor
A monitor of incident beam data.
- NXmonochromator
A wavelength defining device.
- NXoptical_lens
Description of an optical lens.
- NXoptical_window
A window of a cryostat, heater, vacuum chamber or a simple glass slide.
- NXpdb
A NeXus transliteration of a PDB file, to be validated only as a PDB
- NXpid_controller
A description of a feedback system in terms of the settings of a proportional-integral-derivative (PID) controller.
- NXpinhole
A simple pinhole.
- NXpolarizer
A spin polarizer.
- NXpositioner
A generic positioner such as a motor or piezo-electric transducer.
- NXpump
Device to reduce an atmosphere to a controlled pressure.
- NXreflections
Reflection data from diffraction experiments
- NXscan_controller
The scan box or scan controller is a component that is used to deflect a
- NXsensor
A sensor used to monitor an external condition
- NXslit
A simple slit.
- NXsource
Radiation source emitting a beam.
- NXspindispersion
Class to describe spin filters in photoemission experiments.
- NXvelocity_selector
A neutron velocity selector
- NXwaveplate
A waveplate or retarder.
- NXxraylens
An X-ray lens, typically at a synchrotron X-ray beam line.
