2.3.3.3.115. NXem_img¶
Status:
base class, extends NXem_method
Description:
Base class for method-specific generic imaging. ...
Base class for method-specific generic imaging.
In the majority of cases simple d-dimensional regular scan patterns are used to probe a region-of-interest (ROI). Examples can be single point aka spot measurements, line profiles, or (rectangular) surface mappings. The latter pattern is the most frequently used.
For now the base class provides for scans for which the settings, binning, and energy resolution is the same for each scan point.
Symbols:
No symbol table
- Groups cited:
Structure:
imaging_mode: (optional) NX_CHAR
Which imaging mode was used? ...
Which imaging mode was used?
Any of these values:
secondary_electron
backscattered_electron
annular_dark_field
cathodoluminescenceIMAGE_SET: (optional) NXimage_set ⤆
half_angle_interval: (optional) NX_NUMBER (Rank: 1, Dimensions: [2]) {units=NX_ANGLE}
Annulus inner (first value) and outer (second value) half angle.
MICROSTRUCTURE: (optional) NXmicrostructure
A reconstruction of the microstructure or some of its features ...
A reconstruction of the microstructure or some of its features based on image information in the parent class.
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
