2.3.3.3.95. NXem_img¶
Status:
base class (contribution), extends NXprocess
Description:
Base class for method-specific generic imaging with electron microscopes. ...
Base class for method-specific generic imaging with electron microscopes.
In the majority of cases simple d-dimensional regular scan patterns are used to probe regions-of-interest (ROIs). Examples can be single point aka spot measurements, line profiles, or (rectangular) surface mappings. The latter pattern is the most frequently used.
For now the base class provides for scans for which the settings, binning, and energy resolution is the same for each scan point.
Symbols:
No symbol table
- Groups cited:
Structure:
IMAGE: (optional) NXimage
imaging_mode: (optional) NX_CHAR
Which imaging mode was used? ...
Which imaging mode was used?
Any of these values or a custom value (if you use a custom value, also set @custom=True):
secondary_electron
backscattered_electron
annular_dark_field
cathodoluminescencehalf_angle_interval: (optional) NX_NUMBER (Rank: 1, Dimensions: [2]) {units=NX_ANGLE}
Annulus inner (first value) and outer (second value) half angle.
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
