2.3.3.3.115. NXem_img

Status:

base class, extends NXem_method

Description:

Base class for method-specific generic imaging. ...

Base class for method-specific generic imaging.

In the majority of cases simple d-dimensional regular scan patterns are used to probe a region-of-interest (ROI). Examples can be single point aka spot measurements, line profiles, or (rectangular) surface mappings. The latter pattern is the most frequently used.

For now the base class provides for scans for which the settings, binning, and energy resolution is the same for each scan point.

Symbols:

No symbol table

Groups cited:

NXimage_set

Structure:

imaging_mode: (optional) NX_CHAR

Which imaging mode was used? ...

Which imaging mode was used?

Any of these values:

  • secondary_electron

  • backscattered_electron

  • annular_dark_field

  • cathodoluminescence

IMAGE_SET: (optional) NXimage_set ⤆

half_angle_interval: (optional) NX_NUMBER (Rank: 1, Dimensions: [2]) {units=NX_ANGLE}

Annulus inner (first value) and outer (second value) half angle.

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXem_img.nxdl.xml