2.3.3.3. Contributed DefinitionsΒΆ
A description of each NeXus contributed definition is given. NXDL files in the NeXus contributed definitions include propositions from the community for NeXus base classes or application definitions, as well as other NXDL files for long-term archival by NeXus. Consider the contributed definitions as either in incubation or a special case not for general use. The NIAC: The NeXus International Advisory Committee is charged to review any new contributed definitions and provide feedback to the authors before ratification and acceptance as either a base class or application definition.
- Some contributions are grouped together:
and others are simply listed here:
- NXaberration
Quantified aberration coefficient in an aberration_model.
- NXactivity
A planned or unplanned action that has a temporal extension and for some time depends on some entity.
- NXactuator
An actuator used to control an external condition.
- NXafm
An application definition to describe atomic force microscopy (AFM) scanning
- NXamplifier
Base classed definition for amplifier devices.
- NXatom_set
Base class for documenting a set of atoms.
- NXbeam_device
Properties of generic beam device in an experimental setup.
- NXbeam_path
A beam path consisting of one or more optical elements.
- NXbeam_splitter
A beam splitter, i.e. a device splitting the light into two or more beams.
- NXbeam_transfer_matrix_table
Contains datastructures of an experimental optical setup (i.e., multiple
- NXbias_spectroscopy
A base class for bias spectroscopy to describe the change in the physical properties
- NXbias_sweep
A base class that defines how the bias voltage sweep is performed in the
- NXcalibration
Subclass of NXprocess to describe post-processing calibrations.
- NXcantilever_spm
A base class to describe the cantilever used in Atomic Force Microscopy (AFM)
- NXchamber
Base class for a chamber in an instrument that stores real or simulated objects.
- NXchemical_composition
(Chemical) composition of a sample or a set of things.
- NXchemical_process
A planned or unplanned process which results in chemical changes (i.e., changes in the chemical bonds) in a specified material.
- NXcircuit
Application definition for circuit devices.
- NXcollectioncolumn
Subclass of NXelectronanalyser to describe the electron collection
- NXcomponent
Base class for components of an instrument - real ones or a simulated ones.
- NXcontainer
State of a container holding the sample under investigation.
- NXcoordinate_system
Base class to detail a coordinate system (CS).
- NXcoordinate_system_set
Base class to hold different coordinate systems and representation conversions.
- NXcorrector_cs
Base class for a corrector reducing (spherical) aberrations in electron microscopy.
- NXcrystal_structure
Base class to describe the atomic crystal structure of a phase.
- NXcs_computer
Base class for reporting the description of a computer
- NXcs_filter_boolean_mask
Base class for packing and unpacking booleans.
- NXcs_prng
Computer science description of pseudo-random number generator.
- NXcs_profiling
Computer science description for performance and profiling data of an application.
- NXcs_profiling_event
Computer science description of a profiling event.
- NXcsg
Constructive Solid Geometry base class, using NXquadric and NXoff_geometry
- NXcxi_ptycho
Application definition for a ptychography experiment, compatible with CXI from version 1.6.
- NXdata_mpes
NXdata_mpes describes the plottable data and related dimension scales in photoemission
- NXdata_mpes_detector
NXdata_mpes_detector describes the plottable data and related
- NXdeflector
Deflectors as they are used e.g. in an electron analyser.
- NXdelocalization
Base class of the configuration and results of a delocalization algorithm.
- NXdispersion
A dispersion denoting a sum of different dispersions.
- NXdispersion_function
This describes a dispersion function for a material or layer
- NXdispersion_repeated_parameter
A repeated parameter for a dispersion function
- NXdispersion_single_parameter
A single parameter for a dispersion function
- NXdispersion_table
A dispersion table denoting energy, dielectric function tabulated values.
- NXdispersive_material
NXdispersion
- NXdistortion
Subclass of NXprocess to describe post-processing distortion correction.
- NXebeam_column
Base class for a set of components providing a controllable electron beam.
- NXelectron_level
Electronic level probed in X-ray spectroscopy or resonance experiments.
- NXelectronanalyser
Basic class for describing a electron analyzer.
- NXelectrostatic_kicker
definition for a electrostatic kicker.
- NXellipsometry
This is the application definition describing ellipsometry experiments.
- NXem
Application definition for normalized representation of electron microscopy research.
- NXem_calorimetry
Application definition for minimal example in-situ calorimetry.
- NXem_correlation
Base class to combine different method-specific data in electron microscopy.
- NXem_ebsd
Base class method-specific for Electron Backscatter Diffraction (EBSD).
- NXem_eds
Base class method-specific for energy-dispersive X-ray spectroscopy (EDS/EDXS).
- NXem_eels
Base class method-specific for Electron Energy Loss Spectroscopy (EELS).
- NXem_img
Base class for method-specific generic imaging.
- NXem_method
Base class to describe specific analysis methods in electron microscopy.
- NXem_msr
Base class for collecting a session with a real electron microscope.
- NXem_sim
Base class for simulating electron microscopy relevant beam-matter interaction.
- NXenergydispersion
Subclass of NXelectronanalyser to describe the energy dispersion section of a
- NXevent_data_apm
Base class to store state and (meta)data of events over the course of an atom probe experiment.
- NXevent_data_apm_set
Base class for a set of NXevent_data_apm instances.
- NXevent_data_em
Base class to store state and (meta)data of events with an electron microscopy.
- NXevent_data_em_set
Base class for a set of NXevent_data_em instances.
- NXfabrication
Details about a component as it is defined by its manufacturer.
- NXfiber
An optical fiber, e.g. glass fiber.
- NXfit
Description of a fit procedure.
- NXfit_background
Description of the background for an NXfit model.
- NXfit_function
This describes a fit function that is used to fit data to any functional form.
- NXfit_parameter
A parameter for a fit function.
- NXgraph_edge_set
A set of (eventually directed) edges which connect nodes of a graph.
- NXgraph_node_set
A set of nodes representing members of a graph.
- NXgraph_root
An instance of a graph.
- NXhistory
A set of activities that occurred to a physical entity prior/during experiment.
- NXibeam_column
Base class for a set of components equipping an instrument with FIB capabilities.
- NXidentifier
An identifier for a (persistent) resource, e.g., a DOI or orcid.
- NXimage_set
Base class for reporting a set of images.
- NXinteraction_vol_em
Base class for describing the interaction volume of particle-matter interaction.
- NXion
Base class for documenting the set of atoms of a (molecular) ion.
- NXisocontour
Base class for describing isocontouring/phase-fields in Euclidean space.
- NXiv_bias
Application definition for bias devices.
- NXiv_temp
Application definition for temperature-dependent IV curve measurements.
- NXlab_electro_chemo_mechanical_preparation
Grinding and polishing of a sample using abrasives in a wet lab.
- NXlab_sample_mounting
Embedding of a sample in a medium for easing processability.
- NXlens_em
Base class for an electro-magnetic lens or a compound lens.
- NXlens_opt
Description of an optical lens.
- NXlockin
A base class definition for a lock-in amplifier.
- NXmagnetic_kicker
definition for a magnetic kicker.
- NXmanipulator
Extension of NXpositioner to include fields to describe the use of manipulators
- NXmatch_filter
Base class of a filter to select members of a set based on their identifier.
- NXmicrostructure
Base class to describe a microstructure, its structural aspects, associated descriptors, properties.
- NXmicrostructure_gragles_config
Application definition for configuring GraGLeS.
- NXmicrostructure_gragles_results
Application definition for documenting results with GraGLeS.
- NXmicrostructure_imm_config
Application definition for the configuration of the legacy (micro)structure generator
- NXmicrostructure_imm_results
Application definition for the results of the legacy (micro)structure generator developed
- NXmicrostructure_ipf
Base class to store an inverse pole figure (IPF) mapping (IPF map).
- NXmicrostructure_kanapy_results
Application definition for the microstructure generator kanapy from ICAMS Bochum.
- NXmicrostructure_mtex_config
Base class to store the configuration when using the MTex/Matlab software.
- NXmicrostructure_odf
Base class to store an orientation distribution function (ODF).
- NXmicrostructure_pf
Base class to store a pole figure (PF) computation.
- NXmicrostructure_score_config
Application definition to configure a simulation with the SCORE model.
- NXmicrostructure_score_results
Application definition for storing results of the SCORE cellular automaton.
- NXmicrostructure_slip_system
Base class for describing a set of crystallographic slip systems.
- NXmpes
This is the most general application definition for
- NXmpes_arpes
This is an general application definition for angle-resolved multidimensional
- NXopt_window
A window of a cryostat, heater, vacuum chamber or a simple glass slide.
- NXoptical_spectroscopy
A general application definition of optical spectroscopy elements, which may
- NXoptical_system_em
A container for qualifying an electron optical system.
- NXpeak
Base class for describing a peak, its functional form, and support values
- NXphysical_process
A planned or unplanned process which results in physical changes in a specified material.
- NXpid
Contains the settings of a PID controller.
- NXpiezo_config_spm
A base class describing piezo actuator settings for scanning probe microscopy.
- NXpiezoelectric_material
Description and properties of the piezoelectric actuator materials.
- NXpolarizer_opt
An optical polarizer.
- NXpositioner_spm
Extending positioner from NXpositioner to maintain a measurement signal through
- NXpositioner_sts
A generic positioner such as a motor or piezo-electric transducer.
- NXprocess_mpes
NXprocess_mpes describes events of data processing, reconstruction,
- NXprogram
Base class to describe a software tool or library.
- NXpulser_apm
Base class for a laser- and/or voltage-pulsing device used in atom probe
- NXpump
Device to reduce an atmosphere (real or simulated) to a controlled pressure.
- NXquadric
definition of a quadric surface.
- NXquadrupole_magnet
definition for a quadrupole magnet.
- NXraman
An application definition for Raman spectrocopy experiments.
- NXrcs
A base class for the Real Time Control System (RCS).
- NXreflectron
Base class for a device which reduces ToF differences of ions in ToF experiments.
- NXregion
Geometry and logical description of a region of data in a parent group. When used, it could be a child group to, say, NXdetector.
- NXregistration
Describes image registration procedures.
- NXresolution
Describes the resolution of a physical quantity.
- NXroi
Base class to describe a region-of-interest analyzed.
- NXrotation_set
Base class to detail a set of rotations, orientations, and disorientations.
- NXsample_component_set
Set of sample components and their configuration.
- NXscan_control
A scan is performed inside an N-dimensional phase space, where each dimension can correspond not only to real space coordinates (x,y) but also to any other parameter. This class contains detailed information about controlling the scan in such a phase space (or its subspace).
- NXscanbox_em
Scan box and coils which deflect a beam of charged particles in a controlled manner.
- NXsensor_scan
Application definition for a generic scan using sensors.
- NXsensor_sts
A sensor used to monitor an external condition
- NXseparator
definition for an electrostatic separator.
- NXserialized
Metadata to a set of pieces of information of a resource that has been serialized.
- NXsimilarity_grouping
Base class to store results obtained from applying a similarity grouping (clustering) algorithm.
- NXsingle_crystal
Description of a single crystal material or a single crystalline phase in a material.
- NXsnsevent
This is a definition for event data from Spallation Neutron Source (SNS) at ORNL.
- NXsnshisto
This is a definition for histogram data from Spallation Neutron Source (SNS) at ORNL.
- NXsolenoid_magnet
definition for a solenoid magnet.
- NXsolid_geometry
the head node for constructively defined geometry
- NXspatial_filter
Base class for a spatial filter for objects within a region-of-interest (ROI).
- NXspectrum_set
Base class container for reporting a set of spectra.
- NXspin_rotator
definition for a spin rotator.
- NXspindispersion
Subclass of NXelectronanalyser to describe the spin filters in photoemission
- NXspm
Scanning Probe Microscopy (SPM) is a branch of microscopy that utilizes a physical probe to scan the surface of
- NXstage_lab
Base class for a stage (lab) used to hold, orient, and prepare a specimen.
- NXstm
An application definition to describe Scanning Tunneling Microscopy (STM).
- NXsts
An application definition to describe Scanning Tunneling Spectroscopy (STS).
- NXsubsampling_filter
Base class of a filter to sample members in a set based on their identifier.
- NXsubstance
A form of matter with a constant, definite chemical composition.
- NXtransmission
Application definition for transmission experiments
- NXunit_cell
Description of a unit cell, i.e., the crystal structure of a single
- NXwaveplate
A waveplate or retarder.
- NXxpcs
X-ray Photon Correlation Spectroscopy (XPCS) data (results).
- NXxps
This is the application definition for X-ray photoelectron spectroscopy.
- NXxrd
NXxrd on top of NXmonopd
- NXxrd_pan
NXxrd_pan is a specialisation of NXxrd with extra properties
