2.3.3.3.3. Photoemission & core-level spectroscopy¶
Introduction¶
Set of data storage objects to describe photoemission experiments including x-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), hard x-ray photoelectron spectroscopy (HAXPES), angle-resolved photoemission spectroscopy (ARPES), two-photon photoemission (2PPE) and photoemission electron microscopy (PEEM). Also includes descriptors for advanced specializations, such as spin-resolution, time resolution, near-ambient pressure conditions, dichroism etc.
Application Definitions¶
- NXmpes:
A general application definition with minimalistic metadata requirements, apt to describe all photemission experiments.
- NXmpes_arpes:
An application definition for angle-resolved photoemission spectroscopy (ARPES) experiments.
- NXxps:
An application definition for X-ray/UV photoelectron spectroscopy (XPS/UPS) experiments.
Base Classes¶
- NXelectronanalyzer:
A base class to describe electron kinetic energy analyzers. Contains the collective characteristics of the instrument such as energy resolution, and includes the following classes:
- NXcollectioncolumn:
Base class to describe the set of electronic lenses in the electron collection column (standard, PEEM, momentum-microscope, etc.).
- NXenergydispersion:
Base class to describe the energy dispersion system (hemispherical, time-of-flight, etc.).
- NXspindispersion:
Base class to describe spin filters in photoemission experiments.
- NXelectron_detector:
Specialization of NXdetector to describe electron detectors used in photoemission experiments.
Four base classes (which are subclasses of NXprocess) to describe data (post-)processing:
- NXcalibration:
Base class to describe the 1D calibration of an axis, with a function mapping a raw data scale to a calibrated scale with the same number of points.
- NXdistortion:
Base class to describe the 2D distortion correction of an axis, with a matrix mapping a raw data image to a undistorted image.
- NXregistration:
Base class to describe the rigid transformations that are applied to an image.
- NXfit:
Base class to describe a fit procedure (e.g., peak fitting in XPS). This comes with its own set of base classes:
- NXfit_function:
Base class to describe a fit function that is used to fit data to any functional form.
- NXpeak:
Base class to describe a peak, its functional form, and support values (i.e., the discretization (points) at which the function has been evaluated).
- NXfit_background:
Description of the background for an NXfit model.
Common Base Classes¶
There are three related base classes that are common to other techniques:
- NXmanipulator:
A base class to describe the complex manipulators used in experiments, often with > 4 degrees of freedom, cryogenic cooling, and other advanced features.
- NXlens_em:
A class to describe all types of lenses. Includes electrostatic lenses for electron energy analysers.
- NXdeflector
A class to describe all kinds of deflectors, including electrostatic and magnetostatic deflectors for electron energy analysers.