2.3.3.3.118. NXem_sim¶
Status:
base class, extends NXem_method
Description:
Base class for simulating electron microscopy relevant beam-matter interaction. ...
Base class for simulating electron microscopy relevant beam-matter interaction.
The concept behind this base class is to keep it as generic as possible that simulations of electron/ion beam interaction with matter can be represented. This base class is envisioned as the twin of the NXem_msr base class.
It is an attempt to test the idea if at some point one might even use the same base class template to describe measurements and computer simulations of electron microscopy. This idea is attractive because the only practical difference between a description of a measurement with a microscope and a computer simulation is that the latter is typically a substantially simplified representation of the real microscope surplus the focus of the research in such cases on specific questions.
Such simplification can be with respect to the optical setup, typically the ignoring of the fact that the electron beam is produced by a complex setup of lenses while in simulations often single Einzel lenses are considered. Dynamics of the environment like temperature fluctuation in a lab, vibrations, users, and multiple detectors are typically either ignored or reduced in complexity and number and coming with idealizations to keep the simulations focused on the specific reason questions and efficiently numerically executable.
Symbols:
No symbol table
- Groups cited:
Structure:
simulation: (optional) NXprocess ⤆
Details about the simulation.
PROGRAM: (optional) NXprogram
CG_GEODESIC_MESH: (optional) NXcg_geodesic_mesh
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
