2.3.3.3.120. NXem_msr

Status:

base class, extends NXem_method

Description:

Base class for collecting a session with a real electron microscope. ...

Base class for collecting a session with a real electron microscope.

For collecting data and experiments which are simulations of an electron microscope use the NXem_sim base class.

Symbols:

No symbol table

Groups cited:

NXchamber, NXdetector, NXebeam_column, NXevent_data_em_set, NXfabrication, NXibeam_column, NXinstrument, NXoptical_system_em, NXpump, NXscanbox_em, NXstage_lab

Structure:

em_lab: (optional) NXinstrument

(Meta)data of the microscope and the lab in which it stands. ...

(Meta)data of the microscope and the lab in which it stands.

This em_lab group differs from potential em_lab groups inside NXevent_data_em instances in that here the more static descriptions are kept while changing, i.e. time-dependent pieces of information are logged, via the em_lab group inside the desired number of instances of NXevent_data_em.

While using an NXevent_data_em instance, users should store only those settings about a component which are relevant to understand the current state of the component. Here, current means for the time interval which the event covers (as it is detailed via start_time and end_time) timestamps.

For example it is not relevant to store in each NXevent_data_em electron_source group again the details of the gun type and the manufacturer but only the high-voltage value and that only if it is different from the value that is specified in the em_lab section for the static settings.

In effect, this defines an information inference hierarchy which starts in an individual NXevent_data_em instance followed by a probing of the static section.

instrument_name: (optional) NX_CHAR

Given name of the microscope at the hosting institution. ...

Given name of the microscope at the hosting institution. This is an alias. Examples could be NionHermes, Titan, JEOL, Gemini, etc.

location: (optional) NX_CHAR

Location of the lab or place where the instrument is installed. ...

Location of the lab or place where the instrument is installed. Using GEOREF is preferred.

FABRICATION: (optional) NXfabrication ⤆

CHAMBER: (optional) NXchamber

EBEAM_COLUMN: (optional) NXebeam_column

IBEAM_COLUMN: (optional) NXibeam_column

OPTICAL_SYSTEM_EM: (optional) NXoptical_system_em

SCANBOX_EM: (optional) NXscanbox_em

DETECTOR: (optional) NXdetector ⤆

Description of the type of the detector. ...

Description of the type of the detector.

Electron microscopes have typically multiple detectors. Different technologies are in use like CCD, scintillator, direct electron, CMOS, or image plate to name but a few.

local_name: (optional) NX_CHAR ⤆

Instrument-specific alias/name

PUMP: (optional) NXpump

STAGE_LAB: (optional) NXstage_lab

EVENT_DATA_EM_SET: (optional) NXevent_data_em_set

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXem_msr.nxdl.xml