2.3.3.3.105. NXinstrument_apm

Status:

base class (contribution), extends NXinstrument

Description:

Base class to document an instrument used for atom probe microscopy. ...

Base class to document an instrument used for atom probe microscopy.

Inheriting from NXinstrument, this base class is designed to offer the same concepts about instrument-centric metadata to be used in two places inside NXapm without demanding that the application definition needs to define the concepts in two places as maintaining this is prone to errors. This base class implements the key design idea behind the NXapm application definition in that we would like to offer a design where all (meta)data which over the course of a measurement remain static can be stored only once and without polluting the application definition with another group with concepts that should be used for storing (meta)data about the instrument during events that happen during the course of the measurement.

This design was inspired by NXem and electron microscopy where typically the instrument is used in sessions and dozens of logical sets of data are collected under not necessarily always the same instrument conditions. We do not want to repeat therefore the static (meta)data, as this is redundant storage by virtue of design. The typical example is an electron microscope where hundreds of images are taken and all static instrument data stored with each image. This makes sense in cases when the image is used as a digital artifact that is exchanged across different software applications or research data management systems but as in NeXus there is either all information bundled into one artifact or there is a coordinating master artifact that references related artifacts there is no point to store hundreds of times that always the same microscope with the same lens setup was used to collect these images.

Symbols:

No symbol table

Groups cited:

NXbeam, NXcollection, NXcomponent, NXdetector, NXfabrication, NXlens_em, NXmanipulator, NXpump, NXsensor, NXsource, NXtransformations

Structure:

type: (optional) NX_CHAR

Which type of instrument. ...

Which type of instrument.

Any of these values or a custom value (if you use a custom value, also set @custom=True):

  • Inspico

  • 3DAP

  • LAWATAP

  • LEAP 3000 Si

  • LEAP 3000X Si

  • LEAP 3000 HR

  • LEAP 3000X HR

  • LEAP 4000 Si

  • LEAP 4000X Si

  • LEAP 4000 HR

  • LEAP 4000X HR

  • LEAP 5000 XS

  • LEAP 5000 XR

  • LEAP 5000 R

  • EIKOS

  • EIKOS-UV

  • LEAP 6000 XR

  • LEAP INVIZO

  • Photonic AP

  • TeraSAT

  • TAPHR

  • Modular AP

  • Titanium APT

  • Extreme UV APT

location: (optional) NX_CHAR

Location of the lab or place where the instrument is installed. Using GEOREF i ...

Location of the lab or place where the instrument is installed. Using GEOREF is preferred.

comment: (optional) NX_CHAR

Free-text field for additional comments.

fabrication: (optional) NXfabrication ⤆

reflectron: (optional) NXcomponent

Device which reduces ToF differences of ions in ToF experiments. ...

Device which reduces ToF differences of ions in ToF experiments.

For atom probe the reflectron can be considered an energy compensation device. Such a device can be realized technically for example with a Poschenrieder lens.

Consult the following U.S. patents for further details:

  • 3863068 and 6740872 for the reflectron

  • 8134119 for the curved reflectron

applied: (optional) NX_BOOLEAN ⤆

Was the reflectron used?

voltage: (optional) NX_FLOAT {units=NX_VOLTAGE}

The maximum voltage applied to the reflectron, relative to system ground.

decelerate_electrode: (optional) NXlens_em

A counter electrode of the LEAP 6000 series atom probes.

local_electrode: (optional) NXlens_em

A local electrode guiding the ion flight path. ...

A local electrode guiding the ion flight path. Also called counter or extraction electrode.

voltage: (optional) NX_FLOAT {units=NX_VOLTAGE}

Acceleration voltage

ion_detector: (optional) NXdetector ⤆

Detector for taking raw time-of-flight and ion/hit impact positions data.

signal_amplitude: (optional) NX_FLOAT (Rank: 1, Dimensions: [p]) {units=NX_CURRENT}

Amplitude of the signal detected on the multi-channel plate (MCP). ...

Amplitude of the signal detected on the multi-channel plate (MCP).

This field should be used for storing the signal amplitude quantity within ATO files. The ATO file format is used primarily by the atom probe groups of the GPM in Rouen, France.

mcp_efficiency: (optional) NX_FLOAT {units=NX_DIMENSIONLESS}

CRunHeader.fMcpEfficiency

mesh_efficiency: (optional) NX_FLOAT {units=NX_DIMENSIONLESS}

CRunHeader.fMeshEfficiency

pulser: (optional) NXcomponent

Laser- and/or voltage-pulsing device to trigger ion removal.

pulse_mode: (optional) NX_CHAR

Detail whereby ion extraction is triggered methodologically. ...

Detail whereby ion extraction is triggered methodologically.

Any of these values or a custom value (if you use a custom value, also set @custom=True): laser | voltage | laser_and_voltage

pulse_frequency: (optional) NX_FLOAT {units=NX_FREQUENCY}

Frequency with which the pulser fire(s).

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

pulse_fraction: (optional) NX_FLOAT {units=NX_DIMENSIONLESS}

Fraction of the pulse_voltage that is applied in addition ...

Fraction of the pulse_voltage that is applied in addition to the standing_voltage at peak voltage of a pulse.

If a standing voltage is applied, this gives nominal pulse fraction (as a function of standing voltage). Otherwise, this field should not be present.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

pulse_voltage: (optional) NX_FLOAT {units=NX_VOLTAGE}

Pulsed voltage, in laser pulsing mode this field can be omitted.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

pulse_number: (optional) NX_UINT {units=NX_UNITLESS}

Absolute number of pulses starting from the beginning of the experiment.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

standing_voltage: (optional) NX_FLOAT {units=NX_VOLTAGE}

Direct current voltage between the specimen and the (local electrode) in ...

Direct current voltage between the specimen and the (local electrode) in the case of local electrode atom probe (LEAP) instrument. Otherwise, the standing voltage applied to the sample, relative to system ground.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

fabrication: (optional) NXfabrication ⤆

SOURCE: (optional) NXsource

Atom probe microscopes use controlled laser, voltage, or a combination of ...

Atom probe microscopes use controlled laser, voltage, or a combination of pulsing strategies to trigger ion extraction via exciting and eventual field evaporation field emission of ion at the specimen surface.

wavelength: (optional) NX_FLOAT {units=NX_WAVELENGTH} ⤆

The wavelength of the radiation emitted by the source.

power: (optional) NX_FLOAT {units=NX_POWER} ⤆

Nominal power of the laser source while illuminating the specimen.

pulse_energy: (optional) NX_FLOAT {units=NX_ENERGY} ⤆

Average energy of the laser at peak of each pulse.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

BEAM: (optional) NXbeam

Details about specific positions along the laser beam ...

Details about specific positions along the laser beam which illuminates the (atom probe) specimen.

incidence_vector: (optional) NX_NUMBER {units=NX_LENGTH}

Track time-dependent settings over the course of the measurement ...

Track time-dependent settings over the course of the measurement how the laser beam shines on the specimen, i.e. the mean vector is parallel to the laser propagation direction.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

pinhole_position: (optional) NX_NUMBER {units=NX_LENGTH}

Track time-dependent settings over the course of the measurement ...

Track time-dependent settings over the course of the measurement where the laser beam exits the focusing optics.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse

spot_position: (optional) NX_NUMBER {units=NX_LENGTH}

Track time-dependent settings over the course of the ...

Track time-dependent settings over the course of the measurement where the laser hits the specimen.

@logged_against: (optional) NX_CHAR

Path to identifier_pulse in an instance of NXevent_data_apm.

TRANSFORMATIONS: (optional) NXtransformations ⤆

Affine transformations which describe the geometry how the ...

Affine transformations which describe the geometry how the laser focusing optics/pinhole-attached coordinate system is defined, how it has to be transformed so that it aligns with the specimen coordinate system.

stage: (optional) NXmanipulator

temperature_sensor: (optional) NXsensor ⤆

value: (optional) NX_FLOAT ⤆

CRunHeader.CAnalysis.fSpecimenTemperature

analysis_chamber: (optional) NXcomponent

flight_path: (optional) NX_FLOAT {units=NX_LENGTH}

The space inside the atom probe along which ions pass nominally ...

The space inside the atom probe along which ions pass nominally when they leave the specimen and travel to the detector.

pressure_sensor: (optional) NXsensor

measurement: (optional) NX_CHAR ⤆

Obligatory value: pressure

value: (optional) NX_FLOAT {units=NX_PRESSURE} ⤆

CRunHeader.CLasHeader.fAnalysisPressure

buffer_chamber: (optional) NXcomponent

load_lock_chamber: (optional) NXcomponent

getter_pump: (optional) NXpump

roughening_pump: (optional) NXpump

turbomolecular_pump: (optional) NXpump

control: (optional) NXcollection ⤆

Relevant quantities during a measurement with a LEAP system as were ...

Relevant quantities during a measurement with a LEAP system as were suggested by T. Blum et al..

evaporation_control: (optional) NX_CHAR

Parameter set typically in the GUI of the control software which ...

Parameter set typically in the GUI of the control software which defines the rules and control loops whereby the pulser and other components of the instrument are controlled during evaporation.

target_detection_rate: (optional) NX_NUMBER {units=NX_ANY}

Control parameter set typically in the GUI relevant to assure that ...

Control parameter set typically in the GUI relevant to assure that the instrument internally controls its settings such to assure a significant yet not too high ion influx on the detector to avoid detection losses.

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXinstrument_apm.nxdl.xml