2.3.3.3.180. NXreflectron¶
Status:
base class, extends NXobject
Description:
Base class for a device which reduces ToF differences of ions in ToF experiments ...
Base class for a device which reduces ToF differences of ions in ToF experiments.
For atom probe the reflectron can be considered an energy compensation device. Such a device can be realized technically for example with a Poschenrieder lens.
Consult the following U.S. patents for further details:
3863068 and 6740872 for the reflectron
8134119 for the curved reflectron
Symbols:
The symbols used in the schema to specify e.g. dimensions of arrays.
p: Number of pulses collected in between start_time and end_time resolved by an instance of NXevent_data_apm.
- Groups cited:
Structure:
status: (optional) NX_CHAR
Status of eventual existence and potential usage of this reflectron. ...
Status of eventual existence and potential usage of this reflectron.
Any of these values:
none|present|usedname: (optional) NX_CHAR
Given name/alias.
description: (optional) NX_CHAR
Free-text field to specify further details about the reflectron. ...
Free-text field to specify further details about the reflectron. The field can be used to inform e. g. if the reflectron is flat or curved.
voltage: (optional) NX_FLOAT {units=NX_VOLTAGE}
The maximum voltage applied to the reflectron, relative to system ground.
FABRICATION: (optional) NXfabrication
TRANSFORMATIONS: (optional) NXtransformations
Affine transformation(s) which detail where the reflectron is located ...
Affine transformation(s) which detail where the reflectron is located relative to e.g. the origin of the specimen space reference coordinate system. This group can also be used for specifying how the reflectron is rotated relative to a given axis in the instrument.
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
