2.3.3.2.8. Application Definitions

This is the complete list of application definitions:

NXapm

Application definition for real or simulated atom probe and field-ion microscopy experiments.

NXarchive

This is a definition for data to be archived by ICAT (http://www.icatproject.org/).

NXarpes

This is an application definition for angular resolved photo electron spectroscopy.

NXcanSAS

Implementation of the canSAS standard to store reduced small-angle scattering data of any dimension.

NXdirecttof

This is a application definition for raw data from a direct geometry TOF spectrometer

NXellipsometry

This is the application definition describing ellipsometry experiments.

NXem

Application definition for normalized representation of electron microscopy research.

NXfluo

This is an application definition for raw data from an X-ray fluorescence experiment

NXindirecttof

This is a application definition for raw data from an indirect geometry TOF spectrometer

NXiqproc

Application definition for any \(I(Q)\) data.

NXlauetof

This is the application definition for a TOF laue diffractometer

NXmonopd

Monochromatic Neutron and X-Ray Powder diffractometer

NXmpes

This is the most general application definition for

NXmpes_arpes

This is a general application definition for angle-resolved (multidimensional)

NXmx

functional application definition for macromolecular crystallography

NXoptical_spectroscopy

A general application definition of optical spectroscopy elements, which may

NXraman

An application definition for Raman spectroscopy experiments.

NXrefscan

This is an application definition for a monochromatic scanning reflectometer.

NXreftof

This is an application definition for raw data from a TOF reflectometer.

NXsas

Raw, monochromatic 2-D SAS data with an area detector.

NXsastof

raw, 2-D SAS data with an area detector with a time-of-flight source

NXscan

Application definition for a generic scan instrument.

NXspe

NXSPE Inelastic Format. Application definition for NXSPE file format.

NXsqom

This is the application definition for S(Q,OM) processed data.

NXstress

Application definition for stress and strain analysis of crystalline material defined by the EASI-STRESS consortium.

NXstxm

Application definition for a STXM instrument.

NXtas

This is an application definition for a triple axis spectrometer.

NXtofnpd

This is a application definition for raw data from a TOF neutron powder diffractometer

NXtofraw

This is an application definition for raw data from a generic TOF instrument

NXtofsingle

This is a application definition for raw data from a generic TOF instrument

NXtomo

This is the application definition for x-ray or neutron tomography raw data.

NXtomophase

This is the application definition for x-ray or neutron tomography raw data with phase contrast variation at each point.

NXtomoproc

This is an application definition for the final result of a tomography experiment: a 3D construction of some volume of physical properties.

NXxas

This is an application definition for raw data from an X-ray absorption spectroscopy experiment.

NXxasproc

Processed data from XAS. This is energy versus I(incoming)/I(absorbed).

NXxbase

This definition covers the common parts of all monochromatic single crystal raw data application definitions.

NXxeuler

raw data from a four-circle diffractometer with an eulerian cradle, extends NXxbase

NXxkappa

raw data from a kappa geometry (CAD4) single crystal diffractometer, extends NXxbase

NXxlaue

raw data from a single crystal laue camera, extends NXxrot

NXxlaueplate

raw data from a single crystal Laue camera, extends NXxlaue

NXxnb

raw data from a single crystal diffractometer, extends NXxbase

NXxps

This is the application definition for X-ray photoelectron spectroscopy.

NXxrot

raw data from a rotation camera, extends NXxbase