2.3.3.3.11. NXafm

Status:

application definition (contribution), extends NXspm

Description:

An application definition to describe atomic force microscopy (AFM) scanning ...

An application definition to describe atomic force microscopy (AFM) scanning technique.

Symbols:

No symbol table

Groups cited:

NXcantilever_spm, NXcollection, NXcomponent, NXdetector, NXentry, NXenvironment, NXinstrument, NXlockin, NXpiezo_config_spm, NXpiezoelectric_material, NXpositioner_spm, NXpositioner, NXsensor

Structure:

ENTRY: (required) NXentry

definition: (required) NX_CHAR

Name of the definition that is used for the application. ...

Name of the definition that is used for the application.

Obligatory value: NXafm

scan_mode: (required) NX_CHAR

The mode of the scan. ...

The mode of the scan.

Any of these values or a custom value (if you use a custom value, also set @custom=True):

  • contact mode

  • tapping mode

  • non-contact mode

  • Kelvin probe

  • electric force

  • lateral force mode

INSTRUMENT: (required) NXinstrument

The group explains the core instruments' setup of the AFM experiment as well ...

The group explains the core instruments’ setup of the AFM experiment as well as the environment of the corresponding instruments.

photo_detector: (optional) NXdetector

Information about the quadrant photodiode deflection detector.

CANTILEVER_SPM: (optional) NXcantilever_spm

The cantilever information. ...

The cantilever information.

Generally speaking, the cantilever resembles a leaf spring, which behaves as a simple harmonic oscillator. When the probe (tip or particle) on the end of the cantilever is close to the surface of the sample, an attractive or repulsive force appears between the cantilever and the sample, deforming the cantilever. The detector (typically a light pointer hitting a quadrant photodiode) measures this deformation and, therefore, the force acting on the cantilever. In a typical AFM scan cantilever moves toward the surface of the sample until a user-defined value of force acting on the cantilever is reached. The measured force is used as an input of a PID feedback loop, and the output of this loop controls the vertical position of the cantilever.

cantilever_oscillator: (optional) NXcomponent

When a cantilever is oscillated close to its resonance, this describes t ...

When a cantilever is oscillated close to its resonance, this describes the oscillator properties.

A cantilever can be used in direct contact mode to detect interaction forces or oscillated close to its resonance frequency. Changes in the oscillation amplitude, phase (between oscillated tail and moving tip) or resonance frequency are very sensitive to changes in the interaction potential field, giving rise of various measurement modes, such as non-contact or intermittent-contact (tapping) modes.

oscillator_excitation: (optional) NX_NUMBER {units=NX_VOLTAGE}

Oscillator excitation also referred as driving voltage for excitation ...

Oscillator excitation also referred as driving voltage for excitation of cantilever oscillator.

phase_lock_loop: (optional) NXlockin

Phase locked loop for cantilever lock-in device.

amplitude_excitation: (optional) NX_NUMBER {units=NX_ANY}

The reference amplitude (also called drive amplitude) of the cantilever.

cantilever_phase_positioner: (optional) NXpositioner

The phase positioner of the cantilever.

cantilever_amplitude_positioner: (optional) NXpositioner

The amplitude positioner of the cantilever.

cantilever_frequency_positioner: (optional) NXpositioner

The frequency positioner of the cantilever.

scan_environment: (required) NXenvironment

The environment information.

height_piezo_sensor: (required) NXsensor

XY_piezo_sensor: (required) NXsensor

tip_temp_sensor: (required) NXsensor

height_piezo_sensor: (optional) NXsensor

The sensor information for the height piezo device.

piezo_configuration: (required) NXpiezo_config_spm

The piezo configuration information like piezoelectric calibration and m ...

The piezo configuration information like piezoelectric calibration and material properties.

piezo_material: (optional) NXpiezoelectric_material

The material description and properties of the piezoelectric scanner materials.

POSITIONER_SPM: (required) NXpositioner_spm

The positioner information like the position of the tip, the position of ...

The positioner information like the position of the tip, the position of the sample, PID loop feedback etc.

XY_piezo_sensor: (optional) NXsensor

The sensor information for the xy piezo device.

piezo_configuration: (required) NXpiezo_config_spm

The piezo configuration information like piezoelectric calibration and m ...

The piezo configuration information like piezoelectric calibration and material properties.

piezo_material: (optional) NXpiezoelectric_material

The material description and properties of the piezoelectric scanner materials.

POSITIONER_SPM: (required) NXpositioner_spm

The positioner information like the position of the end of the cantileve ...

The positioner information like the position of the end of the cantilever, the position of the sample, PID loop feedback etc.

tip_temp_sensor: (optional) NXsensor

The temperature of the scan environment or tip of the cantilever.

reproducibility_indicators: (optional) NXcollection

cantilever_tip_temp: (optional) NX_NUMBER

cryo_bottom_temp: (optional) NX_NUMBER

cryo_shield_temp: (optional) NX_NUMBER

cantilever_oscillator: (optional) NXcomponent

resolution_indicators: (optional) NXcollection

The group of indicators (links to the existing fields in different groups) that

oscillator_excitation: (optional) NX_NUMBER

amplitude_excitation: (optional) NX_NUMBER

cantilever_tip_temp: (optional) NXsensor

cryo_bottom_temp: (optional) NXsensor

cryo_shield_temp: (optional) NXsensor

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXafm.nxdl.xml