2.3.3.3.13. NXafm

Status:

application definition, extends NXspm

Description:

An application definition to describe atomic force microscopy (AFM) scanning ...

An application definition to describe atomic force microscopy (AFM) scanning technique.

Symbols:

No symbol table

Groups cited:

NXcantilever_spm, NXdetector, NXentry, NXenvironment, NXinstrument, NXlockin, NXobject, NXpiezo_config_spm, NXpiezoelectric_material, NXpositioner_spm, NXsensor

Structure:

ENTRY: (required) NXentry ⤆

definition: (required) NX_CHAR ⤆

Name of the definition that is used for the application. ...

Name of the definition that is used for the application.

Obligatory value: NXafm

scan_mode: (required) NX_CHAR ⤆

The mode of the scan. ...

The mode of the scan.

Any of these values:

  • contact mode

  • tapping mode

  • non-contact mode

  • Kelvin probe

  • electric force

experiment_instrument: (required) NXinstrument ⤆

The group explains the core instruments' setup of the AFM experiment as well ...

The group explains the core instruments’ setup of the AFM experiment as well as the environment of the corresponding instruments.

photo_detector: (optional) NXdetector ⤆

Information about the quadrant photodiode deflection detector.

CANTILEVER_SPM: (optional) NXcantilever_spm

The cantilever information. ...

The cantilever information.

Generally speaking, the cantilever resembles a leaf spring, which behaves as a simple harmonic oscillator. When the probe (tip or particle) on the end of the cantilever is close to the surface of the sample, an attractive or repulsive force appears between the cantilever and the sample, deforming the cantilever. The detector (typically a light pointer hitting a quadrant photodiode) measures this deformation and, therefore, the force acting on the cantilever. In a typical AFM scan cantilever moves toward the surface of the sample until a user-defined value of force acting on the cantilever is reached. The measured force is used as an input of a PID feedback loop, and the output of this loop controls the vertical position of the cantilever.

cantilever_oscillator: (optional) NXobject ⤆

When a cantilever is oscillated close to its resonance, this describes t ...

When a cantilever is oscillated close to its resonance, this describes the oscillator properties.

A cantilever can be used in direct contact mode to detect interaction forces or oscillated close to its resonance frequency. Changes in the oscillation amplitude, phase (between oscillated tail and moving tip) or resonance frequency are very sensitive to changes in the interction potential field, giving rise of various measurement modes, such as non-contact or intermittent-contact (tapping) modes.

oscillator_excitation: (optional) NX_NUMBER {units=NX_ANY}

The threshold voltage for oscillator excitation.

phase_lock_loop: (optional) NXlockin ⤆

Phase locked loop for cantilever lock-in device.

amplitude_excitation: (optional) NX_NUMBER {units=NX_ANY}

The reference amplitude (also called drive amplitude) of the cantilever.

scan_environment: (required) NXenvironment ⤆

The environment information.

height_piezo_sensor: (required) NXsensor ⤆

Link to the group ENTRY[entry]/experiment_instrument/height_piezo_sensor.

XY_piezo_sensor: (required) NXsensor ⤆

Link to the group ENTRY[entry]/experiment_instrument/XY_piezo_sensor.

tip_temp_sensor: (required) NXsensor ⤆

Link to the group ENTRY[entry]/experiment_instrument/cantilever_temperature.

height_piezo_sensor: (optional) NXsensor ⤆

The sensor information for the height piezo device.

piezo_configuration: (required) NXpiezo_config_spm

The piezo configuration information like piezoelectric calibration and m ...

The piezo configuration information like piezoelectric calibration and material properties.

piezo_material: (optional) NXpiezoelectric_material ⤆

The material description and properties of the piezoelectric scanner materials.

POSITIONER_SPM: (required) NXpositioner_spm

The positioner information like the position of the tip, the position of ...

The positioner information like the position of the tip, the position of the sample, PID loop feedback etc.

XY_piezo_sensor: (optional) NXsensor ⤆

The sensor information for the xy piezo device.

piezo_configuration: (required) NXpiezo_config_spm

The piezo configuration information like piezoelectric calibration and m ...

The piezo configuration information like piezoelectric calibration and material properties.

piezo_material: (optional) NXpiezoelectric_material ⤆

The material description and properties of the piezoelectric scanner materials.

POSITIONER_SPM: (required) NXpositioner_spm

The positioner information like the position of the end of the cantileve ...

The positioner information like the position of the end of the cantilever, the position of the sample, PID loop feedback etc.

tip_temp_sensor: (optional) NXsensor ⤆

The temperature of the scan environment or tip of the cantilever.

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/FAIRmat-NFDI/nexus_definitions/tree/fairmat/contributed_definitions/NXafm.nxdl.xml