2.3.3.3.212. NXstm¶
Status:
application definition, extends NXspm
Description:
An application definition to describe Scanning Tunneling Microscopy (STM).
Symbols:
No symbol table
- Groups cited:
NXamplifier, NXbias_spectroscopy, NXcalibration, NXentry, NXenvironment, NXinstrument, NXlockin, NXobject, NXpid, NXpiezo_config_spm, NXpositioner_spm, NXscan_control, NXsensor
Structure:
definition: (required) NX_CHAR ⤆
Name of the definition that is used for the application. ...
Name of the definition that is used for the application.
Obligatory value:
NXstm
scan_mode: (required) NX_CHAR ⤆
The mode of the scan that is performed. Two commonly used ones are constant ...
The mode of the scan that is performed. Two commonly used ones are constant height mode and constant current mode.
Any of these values:
constant height
|constant current
experiment_instrument: (required) NXinstrument ⤆
The group explains the instrumentation of the STM experiment such ...
The group explains the instrumentation of the STM experiment such as current sensor, lock-in amplifier etc.
lockin_amplifier: (required) NXlockin ⤆
The lock-in amplifier information. The device is being used to extract ...
The lock-in amplifier information. The device is being used to extract the very weak signal buried in noisy signals.
modulation_signal_type: (optional) NX_CHAR {units=NX_UNITLESS}
The type of the signal (voltage or current) subject fo modulation.
modulation_frequency: (optional) NX_NUMBER
The frequency of the sine modulation that is used to modulate the signal ...
The frequency of the sine modulation that is used to modulate the signal in lock-in.
scan_environment: (required) NXenvironment ⤆
The environment information for stm or sts experiment.
SCAN_CONTROL: (required) NXscan_control ⤆
The scan control information like scan region or phase space, type of sc ...
The scan control information like scan region or phase space, type of scan (e.g. mesh, spiral, etc.), and scan speed, etc.
scan_type: (required) NX_CHAR ⤆
The type of scan like mesh, spiral, etc. For STS experiment, the scan ...
The type of scan like mesh, spiral, etc. For STS experiment, the scan type is usually a single-point scan (trajectory scan).
Any of these values:
mesh
|trajectory
|snake
|spiral
tip_temp_sensor: (optional) NXsensor ⤆
This group stands for the same concept as ...
This group stands for the same concept as /ENTRY[entry]/experiment_instrument/tip_temperature
cryo_temp_sensor: (optional) NXsensor ⤆
This group stands for the same concept as ...
This group stands for the same concept as /ENTRY[entry]/experiment_instrument/cryo_temperature
cryo_shield_temp_sensor: (optional) NXsensor ⤆
This group stands for the same concept as ...
This group stands for the same concept as /ENTRY[entry]/experiment_instrument/cryo_shield_temperature
tip_temp_sensor: (optional) NXsensor ⤆
The temperature of the tip one of the tip.
cryo_temp_sensor: (optional) NXsensor ⤆
The temperature of the cryostat.
cryo_shield_temp_sensor: (optional) NXsensor ⤆
The temperature of the cryo shield.
current_sensor: (required) NXsensor ⤆
The sensor information.
current: (required) NX_NUMBER {units=NX_CURRENT}
The tunneling current between tip and sample after ...
The tunneling current between tip and sample after applying bias voltage.
current_offset: (optional) NX_NUMBER {units=NX_CURRENT}
Offset value of the current measurement.
current_calibration: (optional) NXcalibration
AMPLIFIER: (optional) NXamplifier ⤆
An amplifier information for the input signal (e.g. from tip).
current_gain: (required) NX_NUMBER {units=NX_UNITLESS}
Proportional relationship between the probe output voltage and the act ...
Proportional relationship between the probe output voltage and the actual tunneling current when measuring the tunneling current.
bias_spectroscopy_environment: (optional) NXenvironment ⤆
To explain bias (sweep measurement) voltage applied to the sample.
BIAS_SPECTROSCOPY: (optional) NXbias_spectroscopy ⤆
Setup and scan data for continuous measurement of bias-voltage on the su ...
Setup and scan data for continuous measurement of bias-voltage on the subject of experiment vs tunneling current from probe. Data from from this experiment can also be used to calculate the dI/dV spectra.
piezo_sensor: (required) NXsensor ⤆
The sensor information for the piezo device.
piezo_configuration: (optional) NXpiezo_config_spm ⤆
The piezo configuration information like piezoelectric device calibratio ...
The piezo configuration information like piezoelectric device calibration and material properties.
calibration: (optional) NXcalibration ⤆
Calibration of the piezo device.
2nd_order_correction_N: (optional) NX_NUMBER {units=NX_ANY} ⤆
The N (substring) denotes X and Y directions. The 2nd order piezo ...
The N (substring) denotes X and Y directions. The 2nd order piezo compensate the error for that axis. The following equation shows the interpretation of the 2nd order correction parameters, For the X-piezo: “Ux = 1/cx · X + cxx · X2” with units: “[V] = [V/m] · [m] + [V/m2] · [m2]” where cx is the calibration of the piezo X and cxx is the 2nd order correction. The unit for such the second-order correction is (V/m^2).
calibration_type: (optional) NX_CHAR ⤆
The name of the calibration type, sometimes it is called ...
The name of the calibration type, sometimes it is called e.g active calibration, passive calibration.
calibration_coefficient_N: (optional) NX_NUMBER {units=NX_ANY} ⤆
The calibration coefficient is the ratio of the actual distance move ...
The calibration coefficient is the ratio of the actual distance moved by the piezo to the voltage applied to the piezo. It is also called first-order correction.
drift_N: (optional) NX_NUMBER {units=NX_ANY} ⤆
Set up the settings to enable or disable the drift compensation.
drift_correction_status: (optional) NX_BOOLEAN ⤆
Whether the drift has been corrected in case there is a deviation in ...
Whether the drift has been corrected in case there is a deviation in the drift.
tilt_N: (optional) NX_NUMBER {units=NX_ANGLE} ⤆
The N (substring) denotes X and Y directions, and for both direction ...
The N (substring) denotes X and Y directions, and for both directions tilt needs to be adjusted according to the actual surface.
hv_gain_N: (required) NX_NUMBER ⤆
The N (substring) denotes X or Y or Z. In some systems, ...
The N (substring) denotes X or Y or Z. In some systems, there is an HV gain readout feature. For these systems, the HV gain should be automatically adjusted whenever the gain is changed at the high voltage amplifier.
POSITIONER_SPM: (required) NXpositioner_spm ⤆
The positioner information like the position of the tip, ...
The positioner information like the position of the tip, PID loop feedback etc.
z_controller: (required) NXpid ⤆
The PID controller information for the z-axis.
To indicate the relative tip position z between tip and sample. The ...
To indicate the relative tip position z between tip and sample. The tip position can also be varied when the z_controller is not running.
set_point: (required) NX_NUMBER {units=NX_ANY}
The set point for the z-controller to be fixed and the target value ...
The set point for the z-controller to be fixed and the target value could be height or current.
controller_name: (recommended) NX_CHAR
The name of the controller or channels.
controller_status: (recommended) NX_BOOLEAN ⤆
The status of the controller to say was PID has been used or not.
tip_lift: (optional) NX_NUMBER {units=NX_LENGTH}
If the tip is lifted from the stable point.
switch_off_delay: (optional) NX_CHAR {units=NX_TIME}
The switch-off delay of the controller from its stable point.
reproducibility_indicators: (optional) NXobject ⤆
current: (optional) NX_NUMBER
The tunneling current between tip and sample after application of bias vol ...
The tunneling current between tip and sample after application of bias voltage. link to the target: /ENTRY[entry]/experiment_instrument/current_sensor/current
current_offset: (optional) NX_NUMBER
The tunneling current between tip and sample after application of bias vol ...
The tunneling current between tip and sample after application of bias voltage. link to the target: /ENTRY[entry]/experiment_instrument/current_sensor/current
current_gain: (optional) NX_NUMBER
Proportional relationship between the probe output voltage and the actual ...
Proportional relationship between the probe output voltage and the actual tunneling current when measuring the tunneling current. link to the target: /ENTRY[entry]/experiment_instrument/current_sensor/amplifier/current_gain
modulation_signal_type: (optional) NX_CHAR
This is the signal on which the modulation voltage or current will be adde ...
This is the signal on which the modulation voltage or current will be added. link to the target: /ENTRY[entry]/experiment_instrument/lockin_amplifier/modulation_signal_type
modulation_frequency: (optional) NX_NUMBER
The frequency of the sine modulation that is used to modulate the signal i ...
The frequency of the sine modulation that is used to modulate the signal in lock-in. link to the target: /ENTRY[entry]/experiment_instrument/lockin_amplifier/modulation_frequency
bias_sweep: (optional) NXobject
Link to target: ...
Link to target: /ENTRY[entry]/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY[bias_spectroscopy]/BIAS_SWEEP[bias_sweep]
resolution_indicators: (optional) NXobject ⤆
modulation_signal_type: (optional) NX_CHAR
This is the signal on which the modulation voltage or current will be adde ...
This is the signal on which the modulation voltage or current will be added. link to the target: /ENTRY[entry]/experiment_instrument/lockin_amplifier/modulation_signal_type modulation_signal_type
modulation_frequency: (optional) NX_NUMBER
The frequency of the sine modulation that is used to modulate the signal i ...
The frequency of the sine modulation that is used to modulate the signal in lock-in. link to the target: /ENTRY[entry]/experiment_instrument/lockin_amplifier/modulation_frequency
stm_head_temp: (optional) NXsensor
Link to target: /ENTRY[entry]/experiment_instrument/scan_environment/tip_temp
cryo_bottom_temp: (optional) NXsensor
Link to target: ...
Link to target: /ENTRY[entry]/experiment_instrument/scan_environment/cryo_bottom_temp
cryo_shield_temp: (optional) NXsensor
Link to target: ...
Link to target: /ENTRY[entry]/experiment_instrument/scan_environment/cryo_shield_temperature
bias_sweep: (optional) NXobject
Link to target: ...
Link to target: /ENTRY[entry]/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY[bias_spectroscopy]/BIAS_SWEEP[bias_sweep]
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
/NXstm/ENTRY/experiment_instrument/bias_spectroscopy_environment-group
/NXstm/ENTRY/experiment_instrument/bias_spectroscopy_environment/BIAS_SPECTROSCOPY-group
/NXstm/ENTRY/experiment_instrument/cryo_shield_temp_sensor-group
/NXstm/ENTRY/experiment_instrument/current_sensor/AMPLIFIER-group
/NXstm/ENTRY/experiment_instrument/current_sensor/AMPLIFIER/current_gain-field
/NXstm/ENTRY/experiment_instrument/current_sensor/current-field
/NXstm/ENTRY/experiment_instrument/current_sensor/current_calibration-group
/NXstm/ENTRY/experiment_instrument/current_sensor/current_calibration/coefficients-field
/NXstm/ENTRY/experiment_instrument/current_sensor/current_offset-field
/NXstm/ENTRY/experiment_instrument/lockin_amplifier/modulation_frequency-field
/NXstm/ENTRY/experiment_instrument/lockin_amplifier/modulation_signal_type-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration-group
/NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration-group
/NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/drift_N-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/hv_gain_N-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/piezo_configuration/calibration/tilt_N-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM-group
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller-group
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/controller_name-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/controller_status-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/set_point-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/switch_off_delay-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/tip_lift-field
/NXstm/ENTRY/experiment_instrument/piezo_sensor/POSITIONER_SPM/z_controller/z-field
/NXstm/ENTRY/experiment_instrument/scan_environment/cryo_shield_temp_sensor-group
/NXstm/ENTRY/experiment_instrument/scan_environment/cryo_temp_sensor-group
/NXstm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL-group
/NXstm/ENTRY/experiment_instrument/scan_environment/SCAN_CONTROL/scan_type-field
/NXstm/ENTRY/experiment_instrument/scan_environment/tip_temp_sensor-group
/NXstm/ENTRY/reproducibility_indicators/current_offset-field
/NXstm/ENTRY/reproducibility_indicators/modulation_frequency-field
/NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field
/NXstm/ENTRY/resolution_indicators/modulation_frequency-field
/NXstm/ENTRY/resolution_indicators/modulation_signal_type-field