2.3.3.3.93. NXstm¶
Status:
application definition (contribution), extends NXspm
Description:
An application definition to describe Scanning Tunneling Microscopy (STM).
Symbols:
No symbol table
- Groups cited:
NXcollection, NXentry, NXenvironment, NXinstrument, NXlockin, NXsensor, NXspm_scan_control
Structure:
definition: (required) NX_CHAR ⤆
Name of the definition that is used for the STM technique. ...
Name of the definition that is used for the STM technique.
Obligatory value:
NXstm
scan_mode: (required) NX_CHAR ⤆
The mode of the scan that is performed. Two commonly used modes are constan ...
The mode of the scan that is performed. Two commonly used modes are constant height mode and constant current mode.
Any of these values:
constant height
|constant current
experiment_technique: (required) NX_CHAR ⤆
The specific to STM experiment. ...
The specific to STM experiment.
Obligatory value:
STM
INSTRUMENT: (required) NXinstrument ⤆
lockin_amplifier: (required) NXlockin ⤆
The lock-in amplifier information. The device is being used to extract ...
The lock-in amplifier information. The device is being used to extract the very weak signal buried in noisy signals.
modulation_signal: (recommended) NX_CHAR {units=NX_UNITLESS} ⤆
The type of the signal (voltage or current) subject to modulation.
SCAN_ENVIRONMENT: (required) NXenvironment ⤆
The environment information for stm or sts experiment. ...
The environment information for stm or sts experiment.
Note: At least one field from head_temperature, cryo_bottom_temperature and cryo_shield_temperature must be provided.
lockin_status: (recommended) NX_BOOLEAN
The status of the lock-in amplifier. It is well established convention t ...
The status of the lock-in amplifier. It is well established convention that for topographic measurements lockin amplifier is turned off state while current scan lockin amplifier is turned on.
SPM_SCAN_CONTROL: (required) NXspm_scan_control ⤆
The scan control information like scan region or phase space, e.g. patte ...
The scan control information like scan region or phase space, e.g. pattern of scan (e.g. mesh), scanner speed, etc.
head_temperature_sensor: (optional) NXsensor ⤆
This should be a link to ...
This should be a link to /entry/instrument/head_temperature_sensor
cryo_bottom_temperature_sensor: (optional) NXsensor ⤆
This should be a link to ...
This should be a link to /entry/instrument/cryo_bottom_temperature_sensor
cryo_shield_temperature_sensor: (optional) NXsensor ⤆
This should be a link to ...
This should be a link to /entry/instrument/cryo_shield_temperature_sensor
bias_spectroscopy_environment: (optional) NXenvironment ⤆
To explain bias and current behavior (sweep measurement) due to voltage ...
To explain bias and current behavior (sweep measurement) due to voltage applied to the sample.
reproducibility_indicators: (optional) NXcollection ⤆
current: (optional) NX_NUMBER
The tunneling current between tip and sample after application of bias vol ...
The tunneling current between tip and sample after application of bias voltage. This should be a link to /entry/instrument/current_sensor/current
current_offset: (optional) NX_NUMBER
The offset in tunneling current between tip and sample after application o ...
The offset in tunneling current between tip and sample after application of bias voltage. This should be a link to /entry/instrument/current_sensor/current_offset
modulation_signal_type: (optional) NX_CHAR ⤆
This is the signal on which the modulation voltage or current will be adde ...
This is the signal on which the modulation voltage or current will be added. This should be a link to /entry/instrument/phase_lock_loop/modulation_signal
reference_frequency: (optional) NX_NUMBER
The frequency of the sine modulation that is used as a carrier signal of i ...
The frequency of the sine modulation that is used as a carrier signal of input signal in lock-in.
This should be a link to /entry/instrument/lockin_amplifier/reference_frequency
BIAS_SWEEP: (optional) NXspm_scan_control
Bias sweep measurement in bias spectroscopy. ...
Bias sweep measurement in bias spectroscopy. This should be a link to /entry/instrument/bias_spectroscopy_environment/bias_spectroscopy/bias_sweep
resolution_indicators: (optional) NXcollection ⤆
head_temperature: (optional) NX_NUMBER
This should be a link to ...
This should be a link to /entry/instrument/scan_environment/head_temperature
cryo_bottom_temperature: (optional) NX_NUMBER
This should be a link to ...
This should be a link to /entry/instrument/scan_environment/cryo_bottom_temperature
cryo_shield_temperature: (optional) NX_NUMBER
This should be a link to ...
This should be a link to /entry/instrument/scan_environment/cryo_shield_temperature
modulation_signal_type: (optional) NX_CHAR ⤆
This is the signal on which the modulation voltage or current will be adde ...
This is the signal on which the modulation voltage or current will be added. This should be a link to /entry/instrument/lockin_amplifier/modulation_signal_type
reference_frequency: (optional) NX_NUMBER
The frequency of the sine modulation that is used to modulate the signal i ...
The frequency of the sine modulation that is used to modulate the signal in lock-in. This should be a link to /entry/instrument/lockin_amplifier/reference_frequency
BIAS_SWEEP: (optional) NXspm_scan_control
This should be a link to ...
This should be a link to /entry/instrument/bias_spectroscopy_environment/bias_spectroscopy/bias_sweep
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.
/NXstm/ENTRY/INSTRUMENT/lockin_amplifier/modulation_signal-field
/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_bottom_temperature_sensor-group
/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/cryo_shield_temperature_sensor-group
/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/head_temperature_sensor-group
/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/lockin_status-field
/NXstm/ENTRY/INSTRUMENT/SCAN_ENVIRONMENT/SPM_SCAN_CONTROL-group
/NXstm/ENTRY/reproducibility_indicators/current_offset-field
/NXstm/ENTRY/reproducibility_indicators/modulation_signal_type-field
/NXstm/ENTRY/reproducibility_indicators/reference_frequency-field
/NXstm/ENTRY/resolution_indicators/cryo_bottom_temperature-field
/NXstm/ENTRY/resolution_indicators/cryo_shield_temperature-field
/NXstm/ENTRY/resolution_indicators/modulation_signal_type-field
/NXstm/ENTRY/resolution_indicators/reference_frequency-field